Probe head for coordinate measuring machine

Matuschek , et al. July 2, 2

Patent Grant D685275

U.S. patent number D685,275 [Application Number D/404,518] was granted by the patent office on 2013-07-02 for probe head for coordinate measuring machine. This patent grant is currently assigned to Carl Zeiss Industrielle Messtechnik GmbH. The grantee listed for this patent is Kurt Brenner, Thomas Engel, Walter Jenisch, Walter Matuschek, Christian Siegel, Tobias Woletz. Invention is credited to Kurt Brenner, Thomas Engel, Walter Jenisch, Walter Matuschek, Christian Siegel, Tobias Woletz.


United States Patent D685,275
Matuschek ,   et al. July 2, 2013

Probe head for coordinate measuring machine

Claims

CLAIM The ornamental design for a probe head for coordinate measuring machine, as shown and described.
Inventors: Matuschek; Walter (Aalen, DE), Siegel; Christian (Aalen, DE), Woletz; Tobias (Essingen, DE), Jenisch; Walter (Heidenheim, DE), Brenner; Kurt (Satteldorf, DE), Engel; Thomas (Aalen, DE)
Applicant:
Name City State Country Type

Matuschek; Walter
Siegel; Christian
Woletz; Tobias
Jenisch; Walter
Brenner; Kurt
Engel; Thomas

Aalen
Aalen
Essingen
Heidenheim
Satteldorf
Aalen

N/A
N/A
N/A
N/A
N/A
N/A

DE
DE
DE
DE
DE
DE
Assignee: Carl Zeiss Industrielle Messtechnik GmbH (Oberkochen, DE)
Appl. No.: D/404,518
Filed: October 21, 2011

Foreign Application Priority Data

Apr 29, 2011 [EM] 00185746700010010
Current U.S. Class: D10/74
Current International Class: 1004
Field of Search: ;D10/46,63,74 ;33/359,360,601-640,DIG.3

References Cited [Referenced By]

U.S. Patent Documents
D327854 July 1992 Bennett
5623766 April 1997 Ruck et al.
D472170 March 2003 Reymond
8144340 March 2012 McFarland et al.
8294906 October 2012 Siercks et al.
Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: Harness, Dickey & Pierce, P.L.C.

Description



FIG. 1 is a perspective view of a probe head for coordinate measuring machine embodying our new design;

FIG. 2 is a front elevational view of the probe head for coordinate measuring machine shown in FIG. 1;

FIG. 3 is a rear elevational view of the probe head for coordinate measuring machine shown in FIG. 1;

FIG. 4 is a right end view of the probe head for coordinate measuring machine shown in FIG. 1;

FIG. 5 is a left end view of the probe head for coordinate measuring machine shown in FIG. 1;

FIG. 6 is a top elevational view of the probe head for coordinate measuring machine shown in FIG. 1; and,

FIG. 7 is a bottom elevational view of the probe head for coordinate measuring machine shown in FIG. 1.

* * * * *


uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed