Testing apparatus

Laverack , et al. February 19, 2

Patent Grant D676569

U.S. patent number D676,569 [Application Number D/400,903] was granted by the patent office on 2013-02-19 for testing apparatus. This patent grant is currently assigned to SPD Swiss Precision Diagnostics GmbH. The grantee listed for this patent is Paul Laverack, Richard Luxton. Invention is credited to Paul Laverack, Richard Luxton.


United States Patent D676,569
Laverack ,   et al. February 19, 2013

Testing apparatus

Claims

CLAIM The ornamental design for a testing apparatus, as shown and described.
Inventors: Laverack; Paul (Milton Keynes, GB), Luxton; Richard (Leighton Buzzard, GB)
Applicant:
Name City State Country Type

Laverack; Paul
Luxton; Richard

Milton Keynes
Leighton Buzzard

N/A
N/A

GB
GB
Assignee: SPD Swiss Precision Diagnostics GmbH (Geneva, CH)
Appl. No.: D/400,903
Filed: September 2, 2011

Foreign Application Priority Data

Mar 3, 2011 [EM] 001830217-0006
Current U.S. Class: D24/223
Current International Class: 2401
Field of Search: ;D24/216-217,219,222-226,227,231,232,107,169,186 ;D10/81 ;422/400-404,408,430,68.1,69,500 ;435/287.1,287.3,287.4,288.1,288.3,288.7,806

References Cited [Referenced By]

U.S. Patent Documents
D390667 February 1998 Nazareth
D412990 August 1999 Woolston et al.
D439985 April 2001 Sanner
D523964 June 2006 Phelan et al.
D531735 November 2006 Lee et al.
D537168 February 2007 Sigel et al.
D537531 February 2007 Sigel et al.
D557815 December 2007 Lee et al.

Other References

US. Appl. No. 29/400,901, filed Sep. 2, 2011, Laverack et al. cited by applicant .
U.S. Appl. No. 29/400,902, filed Sep. 2, 2011, Laverack et al. cited by applicant.

Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Haynes and Boone, LLP

Description



This application is related to (1) U.S. Design patent application Ser. No. 29/400,901, filed Sep. 2, 2011; and (2) U.S. Design patent application Ser. No. 29/400,902, filed Sep. 2, 2011, the entire disclosures of which are incorporated herein by reference.

FIG. 1 is a perspective view of a testing apparatus showing our new design;

FIG. 2 is another perspective view thereof;

FIG. 3 is a front elevational view thereof, the rear elevational view thereof being a mirror image of the front elevational view;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a top plan view thereof; and,

FIG. 7 is a bottom plan view thereof.

* * * * *


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