U.S. patent number D664,254 [Application Number D/381,288] was granted by the patent office on 2012-07-24 for monitor for x-ray apparatus.
This patent grant is currently assigned to Hitachi Medical Corporation. Invention is credited to Atsushi Hibino, Atsushi Ninomiya, Kazuyuki Yanase, Masaru Yokoyama, Takahiro Yurugi.
United States Patent |
D664,254 |
Yokoyama , et al. |
July 24, 2012 |
Monitor for x-ray apparatus
Claims
CLAIM The ornamental design for a monitor for x-ray apparatus, as
shown.
Inventors: |
Yokoyama; Masaru (Tokyo,
JP), Ninomiya; Atsushi (Tokyo, JP), Yanase;
Kazuyuki (Tokyo, JP), Hibino; Atsushi (Tokyo,
JP), Yurugi; Takahiro (Tokyo, JP) |
Assignee: |
Hitachi Medical Corporation
(Tokyo, JP)
|
Appl.
No.: |
D/381,288 |
Filed: |
December 17, 2010 |
Foreign Application Priority Data
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|
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Jun 24, 2010 [JP] |
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2010-15466 |
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Current U.S.
Class: |
D24/158 |
Current International
Class: |
2401 |
Field of
Search: |
;D24/158-161,185,186
;378/4,15,17,20,21,23-27,62,68,146,37,195-198 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Antonelli, Terry, Stout &
Kraus, LLP.
Description
FIG. 1 is a front, top and right side perspective view of a monitor
for x-ray apparatus showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear side elevational view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a bottom plan view thereof;
FIG. 6 is a left side elevational view thereof; and,
FIG. 7 is a right side elevational view thereof.
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