Monitor for x-ray apparatus

Yokoyama , et al. July 24, 2

Patent Grant D664254

U.S. patent number D664,254 [Application Number D/381,288] was granted by the patent office on 2012-07-24 for monitor for x-ray apparatus. This patent grant is currently assigned to Hitachi Medical Corporation. Invention is credited to Atsushi Hibino, Atsushi Ninomiya, Kazuyuki Yanase, Masaru Yokoyama, Takahiro Yurugi.


United States Patent D664,254
Yokoyama ,   et al. July 24, 2012

Monitor for x-ray apparatus

Claims

CLAIM The ornamental design for a monitor for x-ray apparatus, as shown.
Inventors: Yokoyama; Masaru (Tokyo, JP), Ninomiya; Atsushi (Tokyo, JP), Yanase; Kazuyuki (Tokyo, JP), Hibino; Atsushi (Tokyo, JP), Yurugi; Takahiro (Tokyo, JP)
Assignee: Hitachi Medical Corporation (Tokyo, JP)
Appl. No.: D/381,288
Filed: December 17, 2010

Foreign Application Priority Data

Jun 24, 2010 [JP] 2010-15466
Current U.S. Class: D24/158
Current International Class: 2401
Field of Search: ;D24/158-161,185,186 ;378/4,15,17,20,21,23-27,62,68,146,37,195-198

References Cited [Referenced By]

U.S. Patent Documents
D306343 February 1990 Ungar
D412748 August 1999 Nabarro
D465895 November 2002 Pfefferle et al.
D472635 April 2003 Stringer et al.
D492997 July 2004 DiStasio
D611610 March 2010 Fleck et al.
D626235 October 2010 Smith et al.
D626545 November 2010 Bleck et al.
D629523 December 2010 Porter et al.
8000446 August 2011 Van Woezik
2010/0004535 January 2010 Song et al.
Primary Examiner: Doan; Anhdao
Attorney, Agent or Firm: Antonelli, Terry, Stout & Kraus, LLP.

Description



FIG. 1 is a front, top and right side perspective view of a monitor for x-ray apparatus showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear side elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a left side elevational view thereof; and,

FIG. 7 is a right side elevational view thereof.

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