Analysis instrument
Chan , et al. November 22, 2
U.S. patent number D649,075 [Application Number D/368,944] was granted by the patent office on 2011-11-22 for analysis instrument. Invention is credited to Eric Chan, Takayoshi Hanagata, Jeffrey Miller, Shigeru Gary Natsume, Justin Waldinger.
| United States Patent | D649,075 |
| Chan , et al. | November 22, 2011 |
Analysis instrument
Claims
CLAIM The ornamental design for an analysis instrument, as shown and described.
| Inventors: | Chan; Eric (New York, NY), Natsume; Shigeru Gary (New York, NY), Miller; Jeffrey (New York, NY), Waldinger; Justin (New York, NY), Hanagata; Takayoshi (Newport News, VA) |
|---|---|
| Appl. No.: | D/368,944 |
| Filed: | August 31, 2010 |
| Current U.S. Class: | D10/81 |
| Current International Class: | 1004 |
| Field of Search: | ;D10/78,94 ;D24/216,232,234 ;702/32,19 ;600/300 ;455/569.2 ;324/72.5,110,114,115,149,151A,158F,156,556,133,503,543,555,66,72,754 ;340/653,660,635 ;439/482 ;422/63-83,99,100,58,61,82.05 ;423/43 ;436/164,166,169,605 ;356/246 ;362/119 ;435/14,283.1,287.1,4,970 ;378/46,47,79 ;73/23.41,23.36,61.55,61.56 |
References Cited [Referenced By]
U.S. Patent Documents
| 7603888 | October 2009 | Zilioli |
| 7873143 | January 2011 | Dunham et al. |
Attorney, Agent or Firm: Rothwell, Figg, Ernst & Manbeck, pc
Description
FIG. 1 is a perspective view of an analysis instrument.
FIG. 2 is a front view of an analysis instrument.
FIG. 3 is a rear view of an analysis instrument.
FIG. 4 is a top plan view of an analysis instrument.
FIG. 5 is a bottom plan view of an analysis instrument.
FIG. 6 is a side view of an analysis instrument in which the left and right sides identical.
FIG. 7 is a perspective view of an analysis instrument; and,
FIG. 8 is a perspective view of an analysis instrument.
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