Analysis apparatus

Sevel February 1, 2

Patent Grant D631968

U.S. patent number D631,968 [Application Number D/351,666] was granted by the patent office on 2011-02-01 for analysis apparatus. This patent grant is currently assigned to Atonomics A/S. Invention is credited to Mai-Britt Sevel.


United States Patent D631,968
Sevel February 1, 2011

Analysis apparatus

Claims

CLAIM The ornamental design for an analysis apparatus, as shown and described.
Inventors: Sevel; Mai-Britt (Copenhagen, DK)
Assignee: Atonomics A/S (DK)
Appl. No.: D/351,666
Filed: December 9, 2009

Foreign Application Priority Data

Jun 12, 2009 [EM] 001545773
Current U.S. Class: D24/169; D24/186; D10/81
Current International Class: 2401
Field of Search: ;D10/81 ;324/72.5,556,133,149,503,543,555,66,72,754 ;340/635 ;362/119 ;D24/169,186 ;435/14,283.1,287.1,4,970 ;702/19

References Cited [Referenced By]

U.S. Patent Documents
D381749 July 1997 Lawrence et al.
D399959 October 1998 Prokop et al.
D399960 October 1998 Prokop et al.
D402369 December 1998 Prokop et al.
D418602 January 2000 Prokop et al.
D424956 May 2000 von Buelow et al.
D508565 August 2005 Nephin et al.
D549827 August 2007 Maeno et al.
D601257 September 2009 Berlinger et al.
D607569 January 2010 Yukikado et al.
Primary Examiner: Davis; Antoine D
Attorney, Agent or Firm: St. Onge Steward Johnston & Reens LLC

Description



FIG. 1 is a rear elevation view of a first embodiment of an analysis apparatus in accordance with the new design;

FIG. 2 is a bottom plan view thereof;

FIG. 3 is a front elevation view thereof;

FIG. 4 is a front and right side perspective view thereof;

FIG. 5 is a right side elevation view; the left side elevation view being a mirror image thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a rear elevation view of a second embodiment of an analysis apparatus in accordance with the new design;

FIG. 8 is a bottom plan view thereof;

FIG. 9 is a front elevation view thereof;

FIG. 10 is a front and right side perspective view thereof;

FIG. 11 is a right side elevation view; the left side elevation view being a mirror image thereof;

FIG. 12 is a top plan view thereof;

FIG. 13 is a rear elevation view of a third embodiment of an analysis apparatus in accordance with the new design;

FIG. 14 is a bottom plan view thereof;

FIG. 15 is a front elevation view thereof;

FIG. 16 is a front and right side perspective view thereof;

FIG. 17 is a right side elevation view; the left side elevation view being a mirror image thereof;

FIG. 18 is a top plan view thereof;

FIG. 19 is a rear elevation view of a fourth embodiment of an analysis apparatus in accordance with the new design;

FIG. 20 is a bottom plan view thereof;

FIG. 21 is a front elevation view thereof;

FIG. 22 is a front and right side perspective view thereof;

FIG. 23 is a right side elevation view; the left side elevation view being a mirror image thereof; and,

FIG. 24 is a top plan view thereof.

The broken line showing of structural features is included for the purpose of illustrating non-claimed subject matter and forms no part of the claimed design.

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