Specimen collecting and testing device

Description

FIG. 1 is a front elevational view of a specimen collecting and testing device showing my new design;

FIG. 2 is a back elevational view thereof;

FIG. 3 is a right side elevational view thereof, the left side elevational view being a mirror image thereof;

FIG. 4 is a top plan view thereof; and,

FIG. 5 is a bottom plan view thereof.

The broken lines in FIGS. 1 and 2 represent the bounds of the claim and form no part of the claimed design.

Claims

CLAIM The ornamental design for a specimen collecting and testing device, as shown and described.

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Inventors:	Wang; Naishu (San Diego, CA), Zhou; David F. (San Diego, CA), Jin; Wei (Poway, CA)
Assignee:	Alfa Scientific Designs, Inc. (San Diego, CA)
Appl. No.:	D/340,604
Filed:	July 21, 2009

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Current U.S. Class:	D24/223
Current International Class:	2401
Field of Search:	;D24/216,222-226,231,232,169 ;D10/80,81 ;422/99,100,102,56,58,61,68.1,69 ;435/288.1,288.3,289.1

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References Cited [Referenced By]

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U.S. Patent Documents

D328136	July 1992	Hayakawa
D341663	November 1993	Coulter
D342575	December 1993	Ashihara et al.
D369868	May 1996	Nazareth et al.
D391373	February 1998	Shartle
D412990	August 1999	Woolston et al.
5980828	November 1999	McClintock et al.
D483496	December 2003	Kjendlie
D499813	December 2004	Wu
D502263	February 2005	Feller et al.

Primary Examiner: Nelson; T. Chase
Assistant Examiner: Doan; Anhdao
Attorney, Agent or Firm: Charmasson & Buchaca & Leach, LLP