U.S. patent number D607,512 [Application Number D/331,374] was granted by the patent office on 2010-01-05 for dual-tip marker.
This patent grant is currently assigned to Beifa Group Co., Ltd.. Invention is credited to Zhiming Qiu, Yuemin Shi.
United States Patent |
D607,512 |
Qiu , et al. |
January 5, 2010 |
Dual-tip marker
Claims
CLAIM The ornamental design for a dual-tip marker, as shown and
described.
Inventors: |
Qiu; Zhiming (Ningbo,
CN), Shi; Yuemin (Ningbo, CN) |
Assignee: |
Beifa Group Co., Ltd. (Ningbo,
CN)
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Appl.
No.: |
D/331,374 |
Filed: |
January 23, 2009 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
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29277078 |
Feb 13, 2007 |
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Foreign Application Priority Data
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Aug 15, 2006 [CN] |
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2006 3 0136397 |
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Current U.S.
Class: |
D19/117; D19/916;
D19/917 |
Current International
Class: |
1906 |
Field of
Search: |
;D19/35,36,41-51,53-57
;24/11F,11P,11R ;401/52,99,100,104-109,192,195,196 |
References Cited
[Referenced By]
U.S. Patent Documents
Foreign Patent Documents
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000341144-0001 |
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May 2005 |
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EM |
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000675590-0003 |
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Feb 2007 |
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EM |
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3000754 |
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Jan 2002 |
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GB |
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Primary Examiner: Albert; Elizabeth A
Attorney, Agent or Firm: Christensen O'Connor Johnson
Kindness PLLC
Description
FIG. 1 is a left side elevation view of a dual-tip marker showing
our new design;
FIG. 2 is a front elevation view thereof;
FIG. 3 is a right side elevation view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is an exploded right side elevation view thereof;
FIG. 6 is a bottom plan view thereof; and,
FIG. 7 is a top plan view thereof.
The broken line on the top in FIG. 7 is included for the purpose of
illustrating environment and forms no part of the claimed
design.
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