Specimen preparing apparatus

Description

FIG. 1 is a perspective view of the top, front and right side of a specimen preparing apparatus showing our new design;

FIG. 2 is a front view thereof;

FIG. 3 is a rear view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a right side view thereof; and,

FIG. 8 is a perspective reference view with the lid in open condition thereof.

The broken lines shown in the interior of specimen preparing apparatus in FIG. 8 are included for the purpose of illustrating a portion of the specimen preparing apparatus that forms no part of the claimed design.

Claims

CLAIM The ornamental design for a specimen preparing apparatus, as shown and described.

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Inventors:	Tsukuda; Masabumi (Chiba, JP), Kijima; Yukimitsu (Chiba, JP)
Assignee:	Seiko Instruments Inc. (Chiba, JP)
Appl. No.:	D/309,948
Filed:	November 19, 2008

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Foreign Application Priority Data

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May 20, 2008 [JP]			2008-012551

Current U.S. Class:	D24/234
Current International Class:	2402
Field of Search:	;D24/107-109,156,186,231-232,234 ;D10/81 ;422/50,63,68.1,73,81 ;435/283.1

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References Cited [Referenced By]

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U.S. Patent Documents

D245352	August 1977	Moran
D319307	August 1991	Sakagami et al.
D320073	September 1991	Sakagami et al.
D320443	October 1991	Yokoyama et al.
D333007	February 1993	LaBarbera
D338962	August 1993	Ikegami et al.
D346027	April 1994	Kobayashi
D349861	August 1994	Kanewske et al.
D369564	May 1996	Whitby et al.
D404816	January 1999	Tsuan
D410080	May 1999	Heidsiek et al.
D512155	November 2005	Matsumoto

Primary Examiner: Nelson; T. Chase
Assistant Examiner: Cavanna; Mark
Attorney, Agent or Firm: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.