Tape measure
Lee April 22, 2
U.S. patent number D567,122 [Application Number D/282,019] was granted by the patent office on 2008-04-22 for tape measure. Invention is credited to Shih-Lin Lee.
| United States Patent | D567,122 |
| Lee | April 22, 2008 |
Tape measure
Claims
CLAIM The ornamental design for a tape measure, as shown and described.
| Inventors: | Lee; Shih-Lin (Taipei, TW) |
|---|---|
| Appl. No.: | D/282,019 |
| Filed: | July 10, 2007 |
| Current U.S. Class: | D10/72 |
| Current International Class: | 1004 |
| Field of Search: | ;D10/72 ;33/668,755-771 ;242/292,381.1,381.2,381.3,381.4,381.5,381.6 |
References Cited [Referenced By]
U.S. Patent Documents
| 4687155 | August 1987 | Burton |
| 6382547 | May 2002 | Yang |
| D503638 | April 2005 | Lin |
| D504836 | May 2005 | Wang |
Attorney, Agent or Firm: Chow; Ming Sinorica, LLC
Description
FIG. 1 is a front right perspective view of a tape measure showing my new design;
FIG. 2 is a front perspective view thereof;
FIG. 3 is a rear perspective view thereof;
FIG. 4 is a left side elevation view thereof;
FIG. 5 is a right side elevation view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
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