RF electrode for a process tube of semiconductor manufacturing apparatus

Ishii , et al. March 18, 2

Patent Grant D564462

U.S. patent number D564,462 [Application Number D/260,830] was granted by the patent office on 2008-03-18 for rf electrode for a process tube of semiconductor manufacturing apparatus. This patent grant is currently assigned to Tokyo Electron Limited. Invention is credited to Katsutoshi Ishii, Hiroyuki Matsuura.


United States Patent D564,462
Ishii ,   et al. March 18, 2008

RF electrode for a process tube of semiconductor manufacturing apparatus

Claims

CLAIM The ornamental design for a RF electrode for a process tube of semiconductor manufacturing apparatus, as shown and described.
Inventors: Ishii; Katsutoshi (Tokyo, JP), Matsuura; Hiroyuki (Tokyo, JP)
Assignee: Tokyo Electron Limited (Tokyo-To, JP)
Appl. No.: D/260,830
Filed: June 2, 2006

Foreign Application Priority Data

Dec 27, 2005 [JP] 2005-038333
Current U.S. Class: D13/182
Current International Class: 1303
Field of Search: ;D13/199,182,181,180,165,166 ;D24/187,170,144,233 ;205/98,256,272,284,292,336,375,399,400,528,576,588,708,730,143,148,732,733,737,738,739 ;385/40 ;314/34

References Cited [Referenced By]

U.S. Patent Documents
2481079 September 1949 Casey
3323954 June 1967 Goorissen
D320446 October 1991 Grossi et al.
D436138 January 2001 Chiasson
6277260 August 2001 Kaufman et al.
Primary Examiner: Spear; Robert M.
Assistant Examiner: Dworzecka; Anna K
Attorney, Agent or Firm: Smith, Gambrell & Russell, LLP

Description



FIG. 1 is a front view of a RF electrode for a process tube of semiconductor manufacturing apparatus showing our new design;

FIG. 2 is a back view thereof;

FIG. 3 is a plan view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is an enlarged sectional view taken along with line VI--VI of FIG. 1;

FIG. 7 is an enlarged sectional view taken along with line VII--VII of FIG. 1;

FIG. 8 is a perspective view as seen from the front side thereof;

FIG. 9 is a reference drawing showing a state of use of a RF electrode; and,

FIG. 10 is a reference drawing showing a state of use of a RF electrode.

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