Ergonomic electronic thermometer

Description

FIG. 1 is a front perspective view of an ergonomic electronic thermometer.

FIG. 2 is a front elevational view thereof.

FIG. 3 is a rear elevational view thereof.

FIG. 4 is a left side elevational view thereof.

FIG. 5 is a right side elevational view thereof.

FIG. 6 is a top plan view thereof, with a probe, probe cord, and probe cover container shown in phantom in the preceding views removed for clarity; and,

FIG. 7 is a bottom plan view thereof.

Portions of the views shown in phantom form no part of the design.

Claims

CLAIM The ornamental design for a ergonomic electronic thermometer, as shown and described.

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Inventors:	Sisk; Ricky A. (Washington, MO), Breitweiser; Kenneth M. (Brighton, IL), Gierer; Joseph T. (Glen Carbon, IL), Kimsey; Scott (St. Peters, MO)
Assignee:	Sherwood Services AG (CH)
Family ID:	37648993
Appl. No.:	D/241,955
Filed:	November 3, 2005

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Current U.S. Class:	D10/57
Current CPC Class:	G01K1/02 20130101; G01K13/20 20210101
Current International Class:	1004
Field of Search:	;D10/57 ;374/1-210 ;128/639,662,663,670,687,711,736 ;364/557,418

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References Cited [Referenced By]

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U.S. Patent Documents

3729998	May 1973	Mueller et al.
3893058	July 1975	Keith
3915003	October 1975	Adams
4008614	February 1977	Turner et al.
4112762	September 1978	Turner et al.
4183248	January 1980	West
5473629	December 1995	Muramoto
D395609	June 1998	Knieriem et al.
D400808	November 1998	Schwan
6000846	December 1999	Gregory et al.
D448314	September 2001	Chen
6293700	September 2001	Lund et al.
6383144	May 2002	Mooney et al.
6501384	December 2002	Chapman et al.
6839651	January 2005	Lantz et al.
2002/0003832	January 2002	Siefert
2003/0023398	January 2003	Lantz et al.
2003/0176810	September 2003	Maahs et al.
2003/0214999	November 2003	Chapman et al.
2004/0071182	April 2004	Quinn et al.
2004/0071188	April 2004	Knieriem et al.
2004/0105487	June 2004	Chen
2004/0146087	July 2004	Penney et al.
2005/0083994	April 2005	Wawro et al.
2006/0072645	April 2006	Quinn et al.

Foreign Patent Documents

	6-241914		Sep 1994		JP

Primary Examiner: Davis; Antoine D.