U.S. patent number D523,153 [Application Number D/219,642] was granted by the patent office on 2006-06-13 for main part for immunity analysis machine.
This patent grant is currently assigned to Hitachi High-Technologies Corporation. Invention is credited to Takuya Akashi, Mitsuru Onuma, Susumu Sakairi, Koichi Suzuki, Shiho Tanaka.
United States Patent |
D523,153 |
Akashi , et al. |
June 13, 2006 |
Main part for immunity analysis machine
Claims
CLAIM We claim the ornamental design for a main part for immunity
analysis machine, as shown.
Inventors: |
Akashi; Takuya (Musashino,
JP), Onuma; Mitsuru (Tokyo, JP), Sakairi;
Susumu (Hitachinaka, JP), Tanaka; Shiho
(Hitachinaka, JP), Suzuki; Koichi (Hitachinaka,
JP) |
Assignee: |
Hitachi High-Technologies
Corporation (Tokyo, JP)
|
Appl.
No.: |
D/219,642 |
Filed: |
December 21, 2004 |
Foreign Application Priority Data
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|
|
|
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Jul 23, 2004 [JP] |
|
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2004-022102 |
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Current U.S.
Class: |
D24/232;
D10/81 |
Current International
Class: |
2402 |
Field of
Search: |
;D10/81 ;D24/232-234
;198/468.3,468.11 ;356/445,448 ;366/218
;422/56-58,63-98,100,105,55,59-62 ;424/94.61 ;435/85.1,28
;702/22 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine D.
Attorney, Agent or Firm: Antonelli, Terry, Stout and Kraus,
LLP
Description
FIG. 1 is a front, top and right side perspective view of a main
part for immunity analysis machine showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a top plan elevational view thereof;
FIG. 7 is a bottom plan elevational view thereof;
FIG. 8 is a front, top and right side perspective view thereof with
the covers opened; and,
FIG. 9 is a front, top and right side perspective view thereof in
using condition with a monitor.
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