Measurement instrument

Description

FIG. 1 is a front elevational view of a first embodiment of the measurement instrument showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a rear elevational view thereof; and,

FIG. 6 is a bottom plan view thereof.

The broken line shown in FIG. 3 is for illustrative purposes only and forms no part of the claimed design.

Claims

The ornamental design for the "measurement instrument," as shown.

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Inventors:	Graef; David (Campbell Hall, NY), Stearns; Phil (Colorado Springs, CO), Shimomura; Norio (Tokyo, JP), Hayasaka; Satoshi (Tokyo, JP)
Assignee:	LeCroy Corporation (Chestnut Ridge, NY)
Appl. No.:	D/191,576
Filed:	October 9, 2003

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Current U.S. Class:	D10/76
Current International Class:	1004
Field of Search:	;D10/76 ;702/189,65,125,66-68 ;324/555 ;345/440,175,173,440.1

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References Cited [Referenced By]

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U.S. Patent Documents

D282351	January 1986	Nord et al.
4766425	August 1988	Tallman et al.
4818931	April 1989	Naegeli et al.
4821030	April 1989	Batson et al.
4823283	April 1989	Diehm et al.
5003249	March 1991	Bird
D335093	April 1993	Holmen et al.
5250935	October 1993	Jonker et al.
D377319	January 1997	Amano et al.
D423383	April 2000	Fernandez et al.
6195617	February 2001	Miller
6311138	October 2001	Miller
6720776	April 2004	Anderson et al.
2001/0001850	May 2001	Miller
2003/0062906	April 2003	Anderson
2003/0191591	October 2003	Iiyoshi et al.
2003/0204342	October 2003	Law et al.

Primary Examiner: Davis; Antoine D.
Attorney, Agent or Firm: Frommer Lawrence & Haug LLP Frommer; William S.