Measurement instrument

Graef , et al. February 1, 2

Patent Grant D501414

U.S. patent number D501,414 [Application Number D/191,579] was granted by the patent office on 2005-02-01 for measurement instrument. This patent grant is currently assigned to LeCroy Corporation. Invention is credited to David Graef, Satoshi Hayasaka, Norio Shimomura, Phil Stearns.


United States Patent D501,414
Graef ,   et al. February 1, 2005

Measurement instrument

Claims

The ornamental design for the "measurement instrument," as shown.
Inventors: Graef; David (Campbell Hall, NY), Stearns; Phil (Colorado Springs, CO), Shimomura; Norio (Tokyo, JP), Hayasaka; Satoshi (Tokyo, JP)
Assignee: LeCroy Corporation (Chestnut Ridge, NY)
Appl. No.: D/191,579
Filed: October 9, 2003

Current U.S. Class: D10/76
Current International Class: 1004
Field of Search: ;D10/76 ;702/189,65,125,66-68 ;324/555 ;345/440,175,173,440.1

References Cited [Referenced By]

U.S. Patent Documents
6720776 April 2004 Anderson et al.
2001/0001850 May 2001 Miller
2003/0191591 October 2003 Iiyoshi et al.
2003/0204342 October 2003 Law et al.
Primary Examiner: Davis; Antoine D.
Attorney, Agent or Firm: Frommer Lawrence & Haug LLP Frommer; William S.

Description



FIG. 1 is a front elevational view of a first embodiment of the measurement instrument showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a rear elevational view thereof; and,

FIG. 6 is a bottom plan view thereof.

The broken line showing is for illustrative purposes only and forms no part of the claimed design.

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