Housing for test and measurement instruments

Description

The ornamental design disclosed in this application is for a housing for test and measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like. The housing has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, side surfaces having a curved top edges, and a top surface having curved surfaces adjacent to the curved top edges of the side surfaces that transition to a substantially flat surface extending from the front face to the rear surface, and protrusions extending over the corners of the rectangular front face and extending partially along top, bottom and sides surfaces of the housing. Each protrusion has at least a first channel formed on the top surface, the bottom surface and the side surfaces. A recessed handle is flush with the top surface and a portion of the rear surface.

FIG. 1 is a perspective view of a housing for test and measurement instruments;

FIG. 2 is a front elevation view of the housing for test and measurement instruments;

FIG. 3 is a left side elevation view of the housing for test and measurement instruments;

FIG. 4 is a right side elevation view of the housing for test and measurement instruments;

FIG. 5 is a top plan view of the housing for test and measurement instruments;

FIG. 6 is a bottom plan view of the housing for test and measurement instruments; and,

FIG. 7 is a rear elevation view of the housing for test and measurement instruments.

Claims

The ornamental design of a housing for test and measurement instruments, as shown and described.

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Inventors:	Wrisley; Jerry L. (Beaverton, OR), McGrath; James H. (Aloha, OR), Kreitzer; Robert R. (Tigard, OR), Martin; Jim L. (Tigard, OR)
Assignee:	Tektronix, Inc. (Beaverton, OR)
Appl. No.:	D/204,621
Filed:	April 30, 2004

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Current U.S. Class:	D10/76
Current International Class:	1004
Field of Search:	;D10/76,78,80 ;324/102,112,121R ;340/734,747,798 ;354/487

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References Cited [Referenced By]

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U.S. Patent Documents

D413823	September 1999	Dobyns et al.
D420607	February 2000	Wrisley
D460371	July 2002	Wrisley et al.
D460703	July 2002	Wrisley et al.
6437552	August 2002	Sekel et al.
D472171	March 2003	Wrisley et al.

Primary Examiner: Davis; Antoine D.
Attorney, Agent or Firm: Bucher; William K.