U.S. patent number D498,850 [Application Number D/171,847] was granted by the patent office on 2004-11-23 for specimen testing device.
This patent grant is currently assigned to Daiichi Pure Chemicals Co., Ltd.. Invention is credited to Naomi Ukon.
United States Patent |
D498,850 |
Ukon |
November 23, 2004 |
Specimen testing device
Claims
The ornamental design for a specimen testing device, as shown and
described.
Inventors: |
Ukon; Naomi (Tokyo,
JP) |
Assignee: |
Daiichi Pure Chemicals Co.,
Ltd. (Tokyo, JP)
|
Appl.
No.: |
D/171,847 |
Filed: |
December 2, 2002 |
Foreign Application Priority Data
|
|
|
|
|
Jun 10, 2002 [JP] |
|
|
2002-015406 |
|
Current U.S.
Class: |
D24/223; D24/216;
D24/225 |
Current International
Class: |
2401 |
Field of
Search: |
;D24/225,216,223 ;D10/81
;422/55,56,61,68.1,69 ;435/687.2,287.3,806,810,970,975
;436/65,510,814,906 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Simmons; Ian
Attorney, Agent or Firm: Hollander Law Firm, P.L.C.
Description
FIG. 1 is top plan view of a specimen testing device showing my new
design;
FIG. 2 is a bottom plan view thereof;
FIG. 3 is a front elevational view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a right side elevational view thereof, the left side
elevational view being identical thereto; and,
FIG. 6 is a top perspective view thereof.
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