Innovative micrometric measuring instrument
Chih June 17, 2
U.S. patent number D476,020 [Application Number D/163,809] was granted by the patent office on 2003-06-17 for innovative micrometric measuring instrument. This patent grant is currently assigned to Hung Fu Group of Companies. Invention is credited to Chiang Chin Chih.
| United States Patent | D476,020 |
| Chih | June 17, 2003 |
Innovative micrometric measuring instrument
Claims
The ornamental design for an innovative micrometric measuring instrument, as shown and described.
| Inventors: | Chih; Chiang Chin (Taipei, TW) |
|---|---|
| Assignee: | Hung Fu Group of Companies
(Taipei, TW) |
| Appl. No.: | D/163,809 |
| Filed: | July 15, 2002 |
| Current U.S. Class: | D16/131; D10/46 |
| Current International Class: | 1606 |
| Field of Search: | ;D16/131 ;D10/46 ;359/392,368,369 |
References Cited [Referenced By]
U.S. Patent Documents
| D359059 | June 1995 | Omi |
| 5694242 | December 1997 | Omi |
Attorney, Agent or Firm: Dennison, Schultz & Dougherty
Description
FIG. 1 is a front elevational view of an innovative micrometric measuring instrument showing my new design;
FIG. 2 is a rear elevational view thereof;
FIG. 3 is a left side elevational view thereof;
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a top plan elevational view thereof;
FIG. 6 is a bottom plan elevational view thereof; and,
FIG. 7 is a top, front and right perspective elevational view thereof.
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