Electrical test instrument
Ikeda , et al. December 17, 2
U.S. patent number D467,190 [Application Number D/141,875] was granted by the patent office on 2002-12-17 for electrical test instrument. This patent grant is currently assigned to Fluke Corporation. Invention is credited to John K. Ikeda, Duncan N. Kearsley.
| United States Patent | D467,190 |
| Ikeda , et al. | December 17, 2002 |
Electrical test instrument
Claims
The ornamental design for an electrical test instrument, as shown and described.
| Inventors: | Ikeda; John K. (Seattle, WA), Kearsley; Duncan N. (Stanwood, WA) |
|---|---|
| Assignee: | Fluke Corporation (Everett,
WA) |
| Appl. No.: | D/141,875 |
| Filed: | May 14, 2001 |
| Current U.S. Class: | D10/79 |
| Current International Class: | 1004 |
| Field of Search: | ;D10/79 ;324/99D,115-117,126-130,142,143,149,156,158F,158P |
References Cited [Referenced By]
U.S. Patent Documents
| D399150 | October 1998 | Fisher |
| D401172 | November 1998 | Kuramoto |
| D440892 | April 2001 | Kuramoto |
| D450002 | November 2001 | Chang |
| D452659 | January 2002 | Harju et al. |
Description
FIG. 1 is a perspective view of a first embodiment of an electrical test instrument showing our new design;
FIG. 2 is a front elevation view thereof;
FIG. 3 is a right side elevation view thereof;
FIG. 4 is a rear elevation view thereof;
FIG. 5 is a left side elevation view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom plan view thereof.
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