Cover for quality control testing of an iontophoretic sampling system

Liu March 13, 2

Patent Grant D438807

U.S. patent number D438,807 [Application Number D/120,567] was granted by the patent office on 2001-03-13 for cover for quality control testing of an iontophoretic sampling system. This patent grant is currently assigned to Cygnus, Inc.. Invention is credited to David M. Liu.


United States Patent D438,807
Liu March 13, 2001

Cover for quality control testing of an iontophoretic sampling system

Claims

The ornamental design for a cover for quality control testing of an iontophoretic sampling system, as shown and described.
Inventors: Liu; David M. (Los Altos, CA)
Assignee: Cygnus, Inc. (Redwood City, CA)
Appl. No.: D/120,567
Filed: March 20, 2000

Related U.S. Patent Documents

Application Number Filing Date Patent Number Issue Date
428587 Oct 27, 1999

Current U.S. Class: D10/81; D24/216
Current International Class: 1004
Field of Search: ;D10/46,81 ;D24/216,225,232 ;128/632,635,639,640 ;600/345,346,347,348,365,309,354,355,357,372,382,384,396,397 ;604/20 ;204/153.12

References Cited [Referenced By]

U.S. Patent Documents
D355493 February 1995 Gropper et al.
D427320 June 2000 Clawson
Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: McClung; Barbara G. Robins & Associates

Description



FIG. 1 is a perspective view of the cover for quality control testing of an iontophoretic sampling system showing the new design.

FIG. 2 is a top plan view of the cover for quality control testing of an iontophoretic sampling system.

FIG. 3 is a bottom plan view of the cover for quality control testing of an iontophoretic sampling system.

FIG. 4 is a side elevation view of the cover for quality control testing of an iontophoretic sampling system; and,

FIG. 5 is an end elevation view of the cover for quality control testing of an iontophoretic sampling system.

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