U.S. patent number D438,807 [Application Number D/120,567] was granted by the patent office on 2001-03-13 for cover for quality control testing of an iontophoretic sampling system.
This patent grant is currently assigned to Cygnus, Inc.. Invention is credited to David M. Liu.
United States Patent |
D438,807 |
Liu |
March 13, 2001 |
Cover for quality control testing of an iontophoretic sampling
system
Claims
The ornamental design for a cover for quality control testing of an
iontophoretic sampling system, as shown and described.
Inventors: |
Liu; David M. (Los Altos,
CA) |
Assignee: |
Cygnus, Inc. (Redwood City,
CA)
|
Appl.
No.: |
D/120,567 |
Filed: |
March 20, 2000 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
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428587 |
Oct 27, 1999 |
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Current U.S.
Class: |
D10/81;
D24/216 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/46,81
;D24/216,225,232 ;128/632,635,639,640
;600/345,346,347,348,365,309,354,355,357,372,382,384,396,397
;604/20 ;204/153.12 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: McClung; Barbara G. Robins &
Associates
Description
FIG. 1 is a perspective view of the cover for quality control
testing of an iontophoretic sampling system showing the new
design.
FIG. 2 is a top plan view of the cover for quality control testing
of an iontophoretic sampling system.
FIG. 3 is a bottom plan view of the cover for quality control
testing of an iontophoretic sampling system.
FIG. 4 is a side elevation view of the cover for quality control
testing of an iontophoretic sampling system; and,
FIG. 5 is an end elevation view of the cover for quality control
testing of an iontophoretic sampling system.
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