U.S. patent number D395,242 [Application Number D/067,663] was granted by the patent office on 1998-06-16 for analog multi-meter.
This patent grant is currently assigned to Hioki Denki Kabushiki Kaisha. Invention is credited to Kouichi Tanaka, Hideto Yamakoshi, Yoshio Yanagawa.
United States Patent |
D395,242 |
Yamakoshi , et al. |
June 16, 1998 |
Analog multi-meter
Claims
The ornamental design for an analog multi-meter, as shown and
described.
Inventors: |
Yamakoshi; Hideto (Ueda,
JP), Tanaka; Kouichi (Ueda, JP), Yanagawa;
Yoshio (Ueda, JP) |
Assignee: |
Hioki Denki Kabushiki Kaisha
(Ueda, JP)
|
Appl.
No.: |
D/067,663 |
Filed: |
March 6, 1997 |
Foreign Application Priority Data
Current U.S.
Class: |
D10/78 |
Current International
Class: |
1004 |
Field of
Search: |
;D10/78 ;324/110,115
;340/635,686,687,693 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Kanesaka & Takeuchi
Description
FIG. 1 is a perspective view of an analog multi-meter, with the
scale omitted, showing our new design;
FIG. 2 is a front view thereof;
FIG. 3 is a right side view thereof;
FIG. 4 is a left side view thereof;
FIG. 5 is a rear view thereof;
FIG. 6 is a top plan view thereof; and,
FIG. 7 is a bottom view thereof.
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