Process control instrument

Thoeni , et al. July 29, 1

Patent Grant D381590

U.S. patent number D381,590 [Application Number D/054,193] was granted by the patent office on 1997-07-29 for process control instrument. This patent grant is currently assigned to Elsag International N.V.. Invention is credited to Trevor Aland, Stewart Thoeni.


United States Patent D381,590
Thoeni ,   et al. July 29, 1997

Process control instrument

Claims

The ornamental design for a process control instrument, as shown and described.
Inventors: Thoeni; Stewart (Carson City, NV), Aland; Trevor (Reno, NV)
Assignee: Elsag International N.V. (Amsterdam, NL)
Appl. No.: D/054,193
Filed: May 8, 1996

Current U.S. Class: D10/49; D10/75; D13/164
Current International Class: 1004
Field of Search: ;D10/49,50,75 ;D13/164 ;57/264 ;355/208,246 ;364/131,133,138,146,150,162,164,165,187,188,189,468,470,481-487,550-582 ;395/200.02

References Cited [Referenced By]

U.S. Patent Documents
D208492 September 1967 Aldingen
D264449 May 1982 Izaki
D264825 June 1982 Izaki
D269265 June 1983 Bean et al.
D307708 May 1990 Moriyama et al.
5392223 February 1995 Caci
5506767 April 1996 Naylor

Other References

Rosemount Analytical, Model pH/ORP Microprocessor Analyzer -Instruction Manual, Mar. 1995, pp. Cover to 1-5. .
Great Lakes Instruments, Inc., Model P63 pH Analyzer -Manual No. P63, Revision 1-995, pp. Cover, 29, 16 and 17. .
George Fischer -Signet -Measurement Transmitter -Instruction Manual. .
Yokogawa, Model SC200 2-Wire Conductivity Transmitter -Instruction Manual, Aug. 1991, pp. Cover, 4 and 5..

Primary Examiner: Davis; Antoine Duval
Attorney, Agent or Firm: Rickin; Michael M.

Description



FIG. 1 is a front, top and right side perspective view of a process control instrument showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a left side elevational view thereof; and,

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a top plan view thereof; and,

FIG. 8 is a partial view of the bottom thereof showing another pattern for the holes therein, all other portions of this view are identical to those shown in FIG. 6.

* * * * *


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