Sample analysis cuvette

Description

FIG. 1 is a front view of a first embodiment of a sample analysis cuvette showing our new design, the rear view being essentially identical thereto;

FIG. 2 is a top plan view of the embodiment of FIG. 1;

FIG. 3 is a right side view of the embodiment of FIG. 1, the left side view being essentially identical thereto;

FIG. 4 is a bottom plan view of the embodiment of FIG. 1;

FIG. 5 is an elevated perspective view of the embodiment of FIG. 1;

FIG. 6 is a front view of a second embodiment of a sample analysis cuvette showing our new design, the rear view being essentially identical thereto;

FIG. 7 is a top plan view of the embodiment of FIG. 6;

FIG. 8 is a right side view of the embodiment of FIG. 6, the left side view being essentially identical thereto;

FIG. 9 is a bottom plan view of the embodiment of FIG. 6; and,

FIG. 10 is an elevated perspective view of the embodiment of FIG. 6.

Claims

The ornamental design for a sample analysis cuvette, as shown and described .

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Inventors:	Kurosaki; Tsuyoshi (Kakogawa, JP), Nakagawa; Masayuki (Hyogo-ken, JP)
Assignee:	TOA Medical Electronics Co., Ltd. (Kobe, JP)
Appl. No.:	D/035,242
Filed:	February 23, 1995

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Foreign Application Priority Data

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Aug 31, 1994 [JP]			6-26390
Aug 31, 1994 [JP]			6-26391

Current U.S. Class:	D24/224
Current International Class:	2402
Field of Search:	;D24/224,223 ;422/104,58,102,61,100 ;356/246 ;435/296,297,295 ;436/177

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References Cited [Referenced By]

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U.S. Patent Documents

D342793	December 1993	Balmer
D344138	February 1994	Nagata
3814522	June 1974	Clark et al.
4427634	January 1984	Truglio
4528187	July 1985	Truglio
5120503	June 1992	Hinckley et al.

Primary Examiner: Zarfas; Louis S.
Assistant Examiner: Simmons; I.
Attorney, Agent or Firm: Cohen, Pontani, Lieberman, Pavane