Stress:strain materials testing instrument

Description

FIG. 1 is a front elevation view of a stress:strain material testing instrument showing our new design;

FIGS. 2 and 3 are side elevation views thereof;

FIG. 4 is a sectional view, taken at 4--4 of FIG. 1 and enlarged;

FIG. 5 is a perspective view, slightly enlarged;

FIG. 6 is a bottom plan view;

FIG. 7 is a top plan view, slightly enlarged; and,

FIG. 8 is a back elevation view.

Claims

The ornamental design for a stress:strain materials testing instrument, as shown.

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Inventors:	Kellstedt, Jr.; Charles W. (Sudbury, MA), Lieblein; Joel (Sudbury, MA), Mahoney, III; Richard J. (Mansfield, MA), Martin; Paulo A. (Fall River, MA), Mead; Graham E. (Buckinghamshire, GB2), Pulsifer; Ronald K. (Pembroke, MA), Scanlon; David W. (Rehoboth, MA)
Assignee:	Instron Corporation (Canton, MA)
Appl. No.:	D/006,028
Filed:	March 18, 1993

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Current U.S. Class:	D10/83; D10/46
Field of Search:	;73/794-798,781,822,825,826,818,865.9,834,855-860 ;D10/46,75,83 ;D15/138

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References Cited [Referenced By]

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U.S. Patent Documents

D163929	July 1951	Baum
D201342	June 1965	Adams
D250514	December 1978	Etchison
3982572	September 1976	Kortendick
4196635	April 1980	Zuber et al.
4478086	October 1984	Gram

Primary Examiner: Douglas; Alan P.
Assistant Examiner: Davis; Antoine D.