Micrometer
Suwa , et al. April 13, 1
U.S. patent number D263,809 [Application Number 06/083,626] was granted by the patent office on 1982-04-13 for micrometer. This patent grant is currently assigned to Mitutoyo Mfg. Co., Ltd.. Invention is credited to Kiyohiro Nakata, Hiroaki Suwa.
| United States Patent | D263,809 |
| Suwa , et al. | April 13, 1982 |
Micrometer
Claims
The ornamental design for a micrometer, substantially as shown and described.
| Inventors: | Suwa; Hiroaki (Hiromachi, JP), Nakata; Kiyohiro (Hiromachi, JP) |
|---|---|
| Assignee: | Mitutoyo Mfg. Co., Ltd. (Tokyo,
JP) |
| Appl. No.: | 06/083,626 |
| Filed: | October 11, 1979 |
| Current U.S. Class: | D10/73 |
| Current International Class: | D1004 |
| Field of Search: | ;D10/73 ;33/166 |
References Cited [Referenced By]
U.S. Patent Documents
| D198710 | July 1964 | Hinmelsbach |
| D239704 | April 1976 | Morgan |
| D253689 | December 1979 | Tanada |
| D254655 | April 1980 | Brickwood |
| 3608201 | September 1971 | Butsch |
| 4168575 | September 1979 | Sugizaki |
Other References
|
Alina Catalog No. IN-200-2 Instrument Div., p. 7-Diac Micrometer at center.. |
Primary Examiner: Holtje; Nelson C.
Attorney, Agent or Firm: Koda and Androlia
Description
FIG. 1 is a perspective view of a micrometer showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a left-side elevational view thereof;
FIG. 6 is a right-side elevational view thereof; and
FIG. 7 is a bottom plan view thereof.
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