U.S. patent number D263,809 [Application Number 06/083,626] was granted by the patent office on 1982-04-13 for micrometer. This patent grant is currently assigned to Mitutoyo Mfg. Co., Ltd.. Invention is credited to Kiyohiro Nakata, Hiroaki Suwa.
United States Patent | D263,809 |
Suwa , et al. | April 13, 1982 |
Inventors: | Suwa; Hiroaki (Hiromachi, JP), Nakata; Kiyohiro (Hiromachi, JP) |
---|---|
Assignee: | Mitutoyo Mfg. Co., Ltd. (Tokyo,
JP) |
Appl. No.: | 06/083,626 |
Filed: | October 11, 1979 |
Current U.S. Class: | D10/73 |
Current International Class: | D1004 |
Field of Search: | ;D10/73 ;33/166 |
D198710 | July 1964 | Hinmelsbach |
D239704 | April 1976 | Morgan |
D253689 | December 1979 | Tanada |
D254655 | April 1980 | Brickwood |
3608201 | September 1971 | Butsch |
4168575 | September 1979 | Sugizaki |
Alina Catalog No. IN-200-2 Instrument Div., p. 7-Diac Micrometer at center.. |
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