U.S. patent number 3,845,659 [Application Number 05/263,653] was granted by the patent office on 1974-11-05 for microtome having electro-mechanical knife controlling means.
This patent grant is currently assigned to LKB-Produkter AB. Invention is credited to Eskil Rautio, Per Wikefeldt.
United States Patent |
3,845,659 |
Wikefeldt , et al. |
November 5, 1974 |
MICROTOME HAVING ELECTRO-MECHANICAL KNIFE CONTROLLING MEANS
Abstract
An apparatus for cutting microtome specimen sections employs
electro-mechanical transducer means connected to the specimen
holder, or the knife, to generate an electrical signal during the
cutting which indicates the uniformity, or any variations in the
uniformity of the thickness of the section.
Inventors: |
Wikefeldt; Per (Spanga,
SW), Rautio; Eskil (Spanga, SW) |
Assignee: |
LKB-Produkter AB (Bromma,
SW)
|
Family
ID: |
20274095 |
Appl.
No.: |
05/263,653 |
Filed: |
June 16, 1972 |
Foreign Application Priority Data
|
|
|
|
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Jun 30, 1971 [SW] |
|
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8447/71 |
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Current U.S.
Class: |
73/862.06;
83/915.5; 73/DIG.4 |
Current CPC
Class: |
G01L
1/16 (20130101); B23Q 17/0976 (20130101); G01B
7/06 (20130101); Y10S 73/04 (20130101) |
Current International
Class: |
G01B
7/02 (20060101); B23Q 17/09 (20060101); G01B
7/06 (20060101); G01L 1/16 (20060101); G01l
005/00 () |
Field of
Search: |
;73/104,133,78,DIG.4
;83/915.5 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Ruehl; Charles A.
Claims
We claim:
1. In a microtome means of the type comprising two assemblies, and
means for moving one of said assemblies with respect to the other
of said two assemblies, one of said assemblies including support
means for a specimen to be sectioned, the other of the assemblies
including support means for a knife for sectioning said specimen,
one of said support means including two piezoelectric crystals, one
of the crystals being mounted to absorb compressive force during
said relative movement, the other of said crystals being mounted to
absorb tractive force during said relative movement, electrical
current integrating means and circuit means connecting said
piezoelectric crystals with said integrating means in electrical
opposition to each other, said integrating means generating a
signal indicating the total charge generated by said crystals
resulting from said relative movement while sectioning a
specimen.
2. The invention defined in claim 1, wherein said support means
including said piezoelectric crystals includes a specimen arm for
supporting a specimen block.
3. The invention defined in claim 1, wherein said electrical
current integrating means comprises amplifier means having a high
negative internal amplification.
4. The invention defined in claim 3, wherein said electrical
current integrating means also includes capacitor means connected
between the input of said amplifier means.
Description
The present invention refers to a method for indicating the
thickness and its variations of sections cut in a microtome from a
specimen block. The invention also refers to a method for
generating variations of the thickness of a section cut from a
specimen in a microtome.
When cutting ultrathin sections (<1.000 A) to be used for
studies in an electron microscope it sometimes turns out from these
studies that the sections are provided with disturbing parallel
lines formed by variations of the thickness of the section. These
lines might be obtained even if external vibration sources are
eliminated, and the variations are thus a product of the sectioning
itself. The lines, which are perpendicular to the cutting direction
are usually called "chatter." The distance between the lines is as
a rule in the order of 5.000 A and they are thus not possible to
detect in a light microscope but are discovered only when the
section is studied in the electron microscope. The process of
eliminating these lines, for instance by varying the angle between
the knife edge and the specimen is thus very time consuming.
It is an object of the present invention to provide a method by
means of which the generation of chatter could be indicated at the
sectioning whereby it will be possible to carry out the necessary
adjustments to eliminate the variations of thickness without
studying the sections in an electron microscope. The
characteristics of the method will appear from the characterizing
part of claim 1.
Another problem within the ultramicrotomy consists in determining
the distance between different elements in a section when studied
in the electron microscope. This determination of distances within
the section have hitherto generally been made by distributing small
latex balls of well defined diameter over the section so as to
obtain a surface scale reference. The drawback of this method
consists therein that the structure of the section is often
compressed in the direction of cutting and thus the surface scale
reference will refer to the compressed section and no exact
information will be obtained as to the original distances in the
structure of the specimen. It is another object of the present
invention to provide a method for performing a distance
determination referring to the original specimen. The
characteristics of this method will appear from the characterizing
part of claim 3.
The invention will now be explained in detail, reference being made
to the enclosed drawing in which:
FIG. 1 shows an embodiment of an apparatus for carrying out the
method according to the invention and
FIGS. 2 and 3 illustrate the indicating signals obtained from
cutting with and without chatter respectively.
Referring now to FIG. 1 reference SH denotes the specimen arm in a
microtome, the specimen being provided with a specimen block S.
When cutting the specimen block, which for instance might consist
of an organic specimen embedded in plastics, the specimen arm is
brought downwards in the direction of the arrow towards a knife K,
which cuts a section from the block. The means used for feeding the
specimen arm and for handling the sections are well known per se
and are not shown in FIG. 1. The specimen block arm is further
provided with two piezoelectrical sensors P1 and P2 respectively
which form part of the specimen arm. When the specimen arm at
sectioning is brought downwards towards the knife, the vertical
forces from the knife will then give rise to a tractive force on
the lower sensor and a compressive force on the upper sensor. The
sum of the tractive force on the lower sensor and the compressive
force on the upper sensor will then constitute a measure of the
transversal force which effects the specimen. The outputs of the
electrical sensors are then connected in opposition so as to obtain
a voltage between the inputs I1 and I2 respectively of an
operational amplifier A corresponding to this force. The amplifier
A is an operational amplifier having a high input impedance and a
high negative internal amplification. The amplifier is further
provided with a feed back path including a capacitor C connected
between one output U1 of the amplifier and the input I1. The
remaining input and output terminals I2 and U2 respectively are
connected to ground.
The hitherto described apparatus works as follows, when the sensors
are subject to a tractive or compressive force, a charge Q will be
generated in the sensor and transferred to the capacitor C. The
voltage across the capacitor will then be =Q/C and this voltage
will also be obtained between the output connections U1 and U2
since the feed back path of an amplifier having the above defined
properties will imply that the two inputs will be kept at
substantially the same potential.
The piezoelectric material of the sensors is choosen so as to make
the charge Q as big as possible for a given force. The advantage of
measuring the charge generated from the sensors instead of
measuring the generated voltage is that the capacitor C will act as
a memory element, i.e., if the sensors are subject to a constant
force for a certain period of time, the output signal will be
constant during this time. If the output voltages between the
terminals of the sensors is measured, the measuring signal will at
a constant force decrease due to leak currents. It is further
possible to prove that when measuring the charge generated the
sensitivity will be independent of the length and cross sectional
area of the sensors. The sensors could thus be made thin and have a
large cross sectional area which is essential for not effecting the
elastic properties of the microtome.
In FIG. 2 there is shown to the left a section S1 which has been
cut in the direction of the arrow from the specimen block S in FIG.
1. The thickness of the section is denoted .delta.. In the right of
the figure there is shown the output signal V obtained from the
output terminals U1 and U2 during the cutting. This output signal
will thus be lineary decreasing during the cutting, due to the
decreasing width of the section. Experiment further indicates that
the cutting force and thus the amplitude of this output signal will
within certain limits be lineary related to the thickness of the
section. The apparatus according to FIG. 1 could thus after
calibration be used for determining the thickness of the
sections.
In FIG. 3 there is shown to the left another section S2 cut from
the specimen block, this section being provided with the parallel
lines discussed above, i.e., the thickness of the section varies
along the direction of cutting as indicated on the section surface.
To the right in FIG. 3 there is shown the corresponding output
signal from the apparatus according to FIG. 1. As appears from this
diagram the output signal will vary as the thickness of the section
varies and one could thus detect if the section is provided with
chatter. Adjustments to eliminate the chatter, for instance
variation of the knife angle .alpha. could thus be made without
studying the section in an electron microscope.
By using the method according to the invention one could thus by
measuring the cutting forces determine the thickness of the section
as well as variations of this thickness along the cutting circuit.
Provisions could then be made immediately to eliminate possible
defects which means that time could be saved and the risk of
consuming valuable specimens without obtaining any sections useable
for electron microscopy studies is eliminated.
The apparatus in FIG. 1 could also be used for generating
variations of the thickness of the sections to be used for the
scale reference determination as discussed above. If namely both
sensors P1 and P2 are connected in series and an alternating
voltage of determined frequency is supplied to the terminals I1 and
I2 one will obtain variations of the thickness of the sections for
instance as shown in FIG. 3. If the frequency of the alternating
voltage and the vertical velocity of the arm SH are known one will
obtain parallel lines having a well defined distance. Such a
section could then be used as a scale reference for subsequent
sections in the electron microscope. One will thus obtain an
automatic compensation for the compression in the cutting direction
which is normally obtained in the sections, as the distance between
the lines will be compressed to a corresponding extent. The scale
reference will thus be related to the specimen before cutting. It
should also be noted that the method is simpler and less expensive
than the scale determination using latex balls described above.
It should also be noted that the cutting force determining
apparatus according to FIG. 1 also could be used for measuring such
variations of the cutting forces which derive from other defects of
the cutting process, e.g., due to defects in the embedding of the
specimen in the specimen block.
* * * * *