U.S. patent number 3,696,738 [Application Number 05/112,245] was granted by the patent office on 1972-10-10 for silk screen stencil apparatus and method.
This patent grant is currently assigned to Joseph E. Podgor, Inc.. Invention is credited to Howard R. Walker.
United States Patent |
3,696,738 |
Walker |
October 10, 1972 |
SILK SCREEN STENCIL APPARATUS AND METHOD
Abstract
Apparatus and method for silk screening a microscopic pattern on
a stencil into precise registration with reference indicia
previously incorporated upon a substrate. System includes an
optical comparator with a reticle which magnifies the images and
after superimposing a reference point in the test pattern with the
reticle insures precise registration of a reference point on the
substrate with respect to patterns imprinted thereafter.
Inventors: |
Walker; Howard R. (Aldan,
PA) |
Assignee: |
Joseph E. Podgor, Inc.
(Pennsauken, NJ)
|
Family
ID: |
22342849 |
Appl.
No.: |
05/112,245 |
Filed: |
February 3, 1971 |
Current U.S.
Class: |
101/38.1;
374/E5.003; 101/DIG.36; 101/126; 33/18.2; 101/115; 101/129 |
Current CPC
Class: |
G01K
5/025 (20130101); G02B 21/0016 (20130101); Y10S
101/36 (20130101) |
Current International
Class: |
G02B
21/00 (20060101); G01K 5/00 (20060101); G01K
5/02 (20060101); B41f 017/08 (); B41f 015/00 () |
Field of
Search: |
;101/114,115,129,216,35,38
;33/18R,18B,2R,2B,2C,2D,21R,21C,21D,27R,35 ;73/1R,1F,339R |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Pulfrey; Robert E.
Assistant Examiner: Eickholt; Eugene H.
Claims
What is claimed is:
1. A method for silk screening a microscopic pattern on a stencil
into precise registration with a reference indicia previously
incorporated upon a substrate comprising the steps of (1) mounting
the substrate in a jig such that one dimension of the reference
indicia is in substantial alignment with a corresponding dimension
of the pattern on the silk screen stencil, (2) imprinting a test
pattern on the substrate by lowering the stencil into contact with
the surface thereof and drawing the squeegee across the pattern,
(3) using a magnifying optical comparator having a reticle therein,
superimposing a reference point transferred during the test silk
screening of the substrate with the reticle of the optical
comparator, and (4) orienting subsequent substrates within the jig
so that a predetermined point in the reference indicia on the
substrate is superimposed as an image upon the reticle.
2. Apparatus for silk screening a microscopic pattern upon a
substrate in precise registration with reference indicia thereon,
comprising: a silk screen including a stencil pattern, a jig for
supporting the substrate such that one dimensional axis of the
reference indicia is in alignment with a corresponding dimensional
axis of the stencil pattern, an optical magnifying device mounted
with respect to said jig so as to project an image of the area
circumjacent the reference indicia, a reticle in said optical
magnifying device including means for adjusting said reticle along
an axis perpendicular to the first mentioned axis of the reference
indicia, said jig including means to orient said substrate along a
second axis perpendicular to the first mentioned axis, and means
for moving said silk screen stencil with respect to said jig so as
to imprint the substrate with the pattern, whereby orienting the
reticle with respect to an image of a reference point within a test
pattern imprinted upon a first substrate and then orienting
subsequent substrates such that the image of the reference indicia
thereon is superimposed upon said reticle will insure precise
registration of patterns imprinted on such subsequent
substrates.
3. The apparatus of claim 3 wherein said optical magnifying device
constitutes an optical comparator.
4. The apparatus of claim 4 wherein said substrates are cylindrical
tubes, and said jig comprises a pair of adjacently mounted parallel
rollers.
Description
This invention relates to silk screen stencil apparatus, and more
particularly relates to a method and apparatus in which the indicia
to be imprinted is microscopic or macroscopic in character and must
be transferred to the substrate with extreme precision and
accuracy.
In the manufacture of miniature components or articles with very
fine information, such as printed circuit boards, integrated and
microcircuit chips, and even precision thermometry apparatus, it is
frequently necessary to apply macroscopic or microscopic indicia in
exact registration with other marks, symbols or geometry previously
incorporated on the substrate component. The present invention is
directed to the alignment of the silk screen stencil with respect
to the underlying substrate such that the printed indicia may be
transferred at high production rates into precise registration with
minute reference points already incorporated on the substrate. The
present invention relies on an optical comparator or projecting
microscope for magnifying the indicia and orienting the existing
reference characters or symbols with respect to the silk screen
stencil such that the transfer of printed indicia may be
accomplished with great speed and accuracy.
It is therefore an object of this invention to provide a silk
screen apparatus and method for permitting transfer of miniature
patterns and information into exact, precise registration with
reference indicia on underlying substrates at high speed.
Another object of this invention is to provide an apparatus and
method for magnifying and optically orienting microscopic and/or
macroscopic patterns on a silk screen stencil with respect to
pre-existing reference indicia on the surface of underlying
substrates.
Other objects of this invention are to provide an improved device
and method of the character described which is easily and
economically produced, which is sturdy in construction, and both
highly efficient and effective in operation.
With the above and related objects in view, this invention consists
of the details of construction and combination of parts as will be
more fully understood from the following detailed description when
read in conjunction with the accompanying drawing in which:
FIG. 1 is a front perspective view, and partly in section, of a
silk screen optical registration device embodying this
invention.
FIG. 2 is a sectional view taken substantially along lines 2--2 of
FIG. 1, but with the silk screen stencil lowered into contact with
the underlying substrate component.
Referring now in greater detail to the drawing in which similar
reference characters refer to similar parts, there is shown a silk
screen stencil apparatus, generally designated as A, which employs
an optical comparator, generally designated as B, for accurately
aligning a minute pattern on the stencil with respect to reference
indicia already existing on an underlying substrate, in this case a
thermometer, generally designated as C.
The stencil apparatus A is generally conventional and comprises a
screen 12 which is mounted above a base plate 14 by means of a
supporting frame (not shown). The screen 12 by way of example has a
pattern 16 of transversely extending stripes arranged
longitudinally and spaced with respect to each other, including
pertinent reference numerals and symbols adjacent major stripes.
Means (not shown) is adapted to reciprocate the screen 12
vertically into contact with the underlying thermometer substrate
C. A print squeegee 18 is suspended above the silk screen 12 and is
adapted also to be vertically reciprocated by a support linkage
(not shown) into contact with the upper surface of the screen. In
the present illustration, the squeegee 18 is oriented directly over
the thermometer C and in alignment therewith after adjustable
horizontal positioning. Thus, when the screen 12 is lowered into
contact with the thermometer C and then moved to the left, as shown
in FIGS. 1 and 2, the squeegee 18 forces ink spread on the upper
surface of the screen through the open pores thereof defined by the
pattern 16 upon the thermometer substrate therebelow.
The optical comparator B is also essentially conventional and
includes a pair of substantially tubular frame members 20 and 22
oriented at right angles to each other. Objective lenses 24 and 26
direct a collimated beam of rays upon a pentaprism or pentamirror
28 which then bends the beam through a right angle. Lens 30 then
focuses the ray image upon a ground glass plate 34 after the beam
is deflected through another right angle by a front surface mirror
at the rear of the upper tubular member 22 but which is not shown.
A reticle or cross hair 32 is utilized for superimposing an image
from the target or object upon a predetermined portion of the
ground glass plate 34. The comparator B is supported on the base
plate 14 in any suitable manner and is adjustable to accommodate
the orientation of the thermometer in appropriate disposition. A
lamp 38 is also mounted on the surface of the base plate 14 and
illuminates both the surface of the thermometer as well as the
ground glass plate 34.
The thermometer C has a reference symbol or cross 40 etched or
scribed at a predetermined position thereon, as an example, in a
position determined by its mercury level or volume during filling.
The thermometer C is laid in a jig D which constitutes a pair of
adjacent rollers 42 and 44 arranged side by side in suitable end
bearings 46 and 48. The axis defined by the line bisecting the
longitudinal axes of the rollers 42 and 44 is aligned with the
pattern 16 and the squeegee 18 axes during the preliminary set-up
operations.
In order to align the reference cross 40 on the thermometer C with
respect to the pattern 16 on the stencil 12, the thermometer is
laid in a nominal position within the rollers 42 and 44 and a test
printing made by lowering the stencil 12 and the squeegee 18 and
then drawing the screen 12 to the left while in contact with the
thermometer C. As the ink is pressed through the pattern 12, the
thermometer is rolled in its jig D. A reference point 16A in the
pattern is imprinted on the thermometer along with the remainder of
the indicia. The comparator is then adjusted until the image 32' of
its reticle crosshairs 34 exactly bisects the image 16A' which has
just been printed on the thermometer and focussed upon the ground
glass plate 34. The optical comparator is now collimated and trued
with respect to the pattern. Thereafter, the next thermometer C is
placed in the jig D such that the image 40' of the cross 40 is
exactly superimposed upon the image 32' of the crosshair 32.
Longitudinal and rotational registration of the stencil pattern 16
upon the thermometer C is now assured. Precise transfer of the
pattern 16 is obtained by laying the thermometer C in its jig D and
manipulating the image of its reference cross 40 longitudinally and
rotatably until its image is exactly superimposed upon the
crosshair 32 of the optical comparator. When the screen 12 is
lowered into contact with the thermometer with the squeegee 16 in
contact with the screen, drawing the screen to the left results in
a perfect transfer.
Although this invention has been described in considerable detail,
such description is intended as being illustrative rather than
limiting since the invention may be variously embodied, and the
scope of the invention is to be determined as claimed.
* * * * *