U.S. patent number 3,653,253 [Application Number 05/001,068] was granted by the patent office on 1972-04-04 for aerosol mass concentration spectrometer.
This patent grant is currently assigned to Thermo-Systems, Inc.. Invention is credited to John G. Olin.
United States Patent |
3,653,253 |
Olin |
April 4, 1972 |
**Please see images for:
( Certificate of Correction ) ** |
AEROSOL MASS CONCENTRATION SPECTROMETER
Abstract
An apparatus and method for determining particle or aerosol mass
concentration distribution using a particle sensing element, as a
piezoelectric crystal, for collecting particles to increase the
mass of the element. The particles are force deposited on the
sensing element. The amount of force is sequentially changed to
alter the critical particle size deposited on the sensing element.
The mass of the particles accumulated on the sensing element during
each force period provides information of the particle mass
concentration. The difference between particle mass concentration,
at two successive values of critical particle sizes, provides data
relative to particle mass concentration distribution.
Inventors: |
Olin; John G. (Roseville,
MN) |
Assignee: |
Thermo-Systems, Inc. (St. Paul,
MN)
|
Family
ID: |
21694228 |
Appl.
No.: |
05/001,068 |
Filed: |
January 5, 1970 |
Current U.S.
Class: |
73/24.03;
73/61.75; 310/328; 73/865.5 |
Current CPC
Class: |
G01N
29/036 (20130101); G01N 5/00 (20130101); G01N
2291/0256 (20130101) |
Current International
Class: |
G01N
27/00 (20060101); G01N 5/00 (20060101); G01n
015/02 () |
Field of
Search: |
;73/432PS,61,23,28 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Prince; Louis R.
Assistant Examiner: Roskos; Joseph W.
Claims
The embodiments of the invention in which an exclusive property or
privilege is claimed are defined as follows:
1. An apparatus for measurement of particle mass concentration
distribution of an aerosol comprising: particle sensing means
having a resonant frequency and a particle collection surface for
collecting particles of an aerosol, means to drive and sense the
resonant frequency of the sensing means, means imparting a force
field on the particles for forcing particles into engagement with
the particle collection surface, means for varying the amount of
said force, whereby the variation in the critical size of particles
accumulated on the particle collection surface is related to the
variance of the force, and monitor means to read the sensed
resonant frequency providing information as to the changes in
resonant frequency of the sensing means at each force variation to
determine the particle mass concentration distribution.
2. The apparatus of claim 1 wherein: the means for forcing the
particles into engagement with the particle collection surface is
an impactor having an inlet orifice to direct particles toward the
surface and vacuum pump means connected to the impactor operable to
draw air and particles through the impactor.
3. The apparatus of claim 2 wherein: the means to vary the amount
of force is a valve means located between the impactor and pump,
means to control the flow rate of air and particles, for the valve
means to regulate the flow rate of air and particles through the
orifice.
4. The apparatus of claim 2 wherein: the means to vary the amount
of force is a control means to vary the speed of operation of the
pump means to change the flow rate of air and particles through the
orifice.
5. The apparatus of claim 2 wherein: the means to vary the amount
of force comprise means to change the size of the orifice to alter
the velocity of air and particles moving through the orifice.
6. The apparatus of claim 5 wherein: the means to change the size
of the orifice comprises a slide, and motor means to move the slide
to change the size of the orifice.
7. An apparatus for measurement of particle mass concentration
distribution of an aerosol comprising: particle sensing means
including a piezoelectric crystal having a sensitive particle
collecting surface for collecting particles of an aerosol, means
for forcing particles into engagement with the particle collection
surface, means for varying the amount of said force whereby
variation in the critical size of particles accumulated on the
surface is related to the variance of the force, said means to
sense the mass of particles deposited on the surface including
means to sense the resonant frequency of the crystal, and monitor
means operable to read the changes in the resonant frequency of the
crystal due to changes in the total mass of particles added to said
surface in response to changes in the amount of force used to
deposit particles onto said surface at each force variation
providing information to determine the particle mass concentration
distribution.
8. The apparatus of claim 7 wherein: the means for forcing the
particles into engagement with the particle collection surface is
an impactor having an inlet orifice to direct particles toward the
surface and vacuum pump means connected to the impactor operable to
draw air and particles through the impactor.
9. The apparatus of claim 8 wherein: the means to vary the amount
of force is a valve means located between the impactor and pump
means to control the flow of air and particles, and control means
for the valve means to regulate the flow rate of air and particles
through the orifice.
10. The apparatus of claim 8 wherein: the means to vary the amount
of force is a control means to vary the speed of operation of the
pump means to change the flow rate of air and particles through the
orifice.
11. The apparatus of claim 8 wherein: the means to vary the amount
of force comprise means to change the size of the orifice to alter
the velocity of air and particles moving through the orifice.
12. The apparatus of claim 11 wherein: the means to change the size
of the orifice comprises a slide, and motor means to move the slide
to change the size of the orifice.
13. The apparatus of claim 7 wherein: the means for forcing the
particles into engagement with the particle collection surface is
an impactor having a first chamber and a second chamber spaced from
the first chamber, passage means connecting the first chamber with
the second chamber, first means for introducing particles and air
into the first chamber, second means for introducing clean air into
the first chamber, said particle collection surface located in
axial alignment with the discharge end of the passage means, and
means to withdraw air from the second chamber, whereby the
particles introduced into the first chamber are drawn through the
passage means and an annular sheath of clean air surrounds the
particles in the passage means, said particles as they move in the
passage means being surrounded with a moving annular sheath of
clean air.
14. The apparatus of claim 13 wherein: the first means is a tubular
member extended into the first chamber in axial alignment with the
passage means, said tubular member having a sonic orifice for the
particles and ambient air.
15. The apparatus of claim 13 wherein: the means to vary the amount
of force is a valve located between the second chamber and means to
withdraw air from the second chamber, and control means for the
valve to regulate the flow rate of ambient air and particles and
clean air through the passage means.
16. An apparatus for measurement of particle mass concentration
distribution comprising: particle sensing means having a particle
collection surface for collecting particles, means to sense the
mass of particles deposited on the particle collection surface,
means for forcing particles into engagement with the particle
collection surface, means for varying the amount of said force,
whereby a variation in the critical size of particles accumulated
on the surface is related to the variance of the force, and monitor
means to read the sensed mass of particles at each force variation
providing information to determine the particle mass concentration
distribution, said means for forcing the particle into engagement
with the particle collection surface is an impactor having a first
chamber and a second chamber spaced from the first chamber, passage
means connecting the first chamber with the second chamber, first
means for introducing particles and air into the first chamber,
second means for introducing clean air into the first chamber, said
particle collection surface located in the second chamber in axial
alignment with the discharge end of the passage means, and means to
withdrawn air from the second chamber, whereby the particles
introduced into the first chamber are drawn through the passage
means and an annular sheath of clean air surrounds the particles in
the passage means, said particles as they move in the passage means
being surrounded with a moving sheath of clean air.
17. The apparatus of claim 16 wherein: the first means is a tubular
member extended into the first chamber in axial alignment with the
passage means, said tubular member having a sonic orifice for the
particles and ambient air.
18. The apparatus of claim 16 wherein: the means to vary the amount
of force is a valve located between the second chamber and means to
withdraw air from the second chamber, and control means for the
valve to regulate the flow rate of ambient air and particles and
clean air through the passage means.
19. A method of measurement of particle mass concentration
distribution of an aerosol comprising: force depositing particles
of an aerosol directly onto a sensitive particle collection surface
of a particle sensing means having a resonant frequency with a
force sufficient to place the particles in contact with the
particle collection surface, driving the particle sensing means at
its resonant frequency, sequentially varying the force acting on
the particles to change the critical particle size deposited on the
surface, and monitoring the resonant frequency change of the
particle sensing means during the depositing of particles on the
particle collection surface of each force variation to provide
information to determine the particle mass concentration
distribution.
20. The method of claim 19 wherein: the force is sequentially
increased to decrease the critical particle size deposited on the
surface.
21. The method of claim 19 wherein: the particles are force
deposited with a jet of air directed toward the sensitive particle
collection surface and varying the velocity of the jet of air to
change the critical particle size deposited on the particle
collection surface.
22. The method of claim 19 wherein: the particles are enclosed in a
sheath of clean air during the time they are directed toward the
particle collection surface.
23. The method of claim 19 wherein: the particles are force
deposited with a jet of air directed toward the particle collection
surface, and surrounding said jet of air with a sheath of clean air
to confine and accelerate the particles, and varying said velocity
of the jet of air to change the critical particle size deposited on
the particle collection surface.
24. The method of claim 19 wherein: the force is sequentially
decreased to increase the critical particle size deposited on the
surface.
25. A method of measurement of particle mass concentration
distribution of an aerosol comprising: force depositing particles
of an aerosol directly onto a sensitive electrode of a
piezoelectric crystal, sequentially varying the force acting on the
particles to change the critical particle size deposited on the
electrode, driving the crystal and sensing the resonant frequency
of the crystal at each force to provide information on the particle
mass concentration at each force, whereby the difference in the
particle mass concentration between two successive values of
critical particle sizes provides data relative to particle mass
concentration distribution.
26. The method of claim 25 wherein: the force is sequentially
increased to decrease the critical particle size deposited on the
electrode.
27. The method of claim 25 wherein: the particles are force
deposited on the electrode with a jet of air directed toward the
electrode and varying the velocity of the jet of air to change the
critical particle size deposited on the electrode.
28. The method of claim 25 wherein: the particles are enclosed in a
sheath of clean air during the time they are directed toward the
electrode.
29. The method of claim 25 wherein: the particles are force
deposited with a jet of air directed toward the electrode, and
surrounding said jet of air with a sheath of clean air to confine
and accelerate the particles, and varying said velocity of the jet
of air to change the critical particle size deposited on the
particle collection surface.
30. The method of claim 25 wherein: the force is sequentially
decreased to increase the particle size deposited on the
electrode.
31. An apparatus for measurement of particle mass concentration
distribution of an aerosol comprising: particle sensing means
having at least a first sensing device and a second sensing device,
each of said sensing devices having a resonant frequency and a
particle collection surface for collecting particles of an aerosol,
means to drive and sense the resonant frequency of the sensing
devices, means imparting a force field on the particles for forcing
particles into contact with at least one of the particle collection
surfaces, means for varying the amount of said force, whereby
variation in the critical size of particles accumulated on the
particle collection surface is related to the variance of the
force, and monitor means to read the sensed resonant frequency
providing information as to changes in resonant frequency of the
sensing devices at each force variation to determine the particle
mass concentration distribution.
Description
BACKGROUND OF INVENTION
The mass concentration of particles in air is a difficult parameter
to measure. The traditional method of measurement is the
high-volume filtration technique. A large volume of particles is
sucked through a filter until enough particles are collected so
that they can be detected by weighing the loaded and unloaded
filter on a balance. This method is subject to numerous errors,
takes a relatively long period of time, requires manual handling
and weighing, and cannot be automated easily. The filtering method
does not provide a means for obtaining information as to the mass
concentration distribution of the aerosol.
The standard method of obtaining particle mass concentration
distribution is to use a cascade impactor with several single-stage
impactors operating in series. Each successive impactor has a
smaller jet size to achieve particle classification. The particle
samples from each of the impactors are weighed separately to
determine aerosol mass concentration distribution.
An apparatus for measurement of particulate mass force deposited on
a surface of a sensing means is described in U.S. Pat. No.
3,561,253. A force field in this apparatus is used to impinge the
particles on the sensitive surface of the sensing means. The
particles which contact the surface of the sensing means strongly
adhere to that surface and hence add to the mass of the sensing
means. A frequency sensing circuit is used to determine the change
in the resonant frequency of the sensing means caused by the mass
of the particles on the surface of the sensing means. The signal,
representative of the change in frequency, is related to the mass
of particles collected on the sensing surface. This apparatus can
obtain an in situ, transduced measurement of the mass concentration
of the particles with very high time resolution. The invention in
the present application utilizes the force collecting principle
disclosed in copending application Ser. No. 810,659 to obtain
particle mass concentration distribution.
SUMMARY OF INVENTION
The invention relates to an apparatus and method for determining in
situ the particle mass concentration distribution in a relatively
short period of time. The apparatus has a particle sensing means
with a sensitive particle collection surface. The particles forced
into engagement with the collection surface are deposited on the
surface to increase the mass of the sensing means. The apparatus
includes means to alter the force and thereby change the critical
particle size deposited on the surface. The mass of deposited
particles is monitored for each change in the force to provide
information usable to determine the particle mass concentration
distribution.
In terms of a method of measurement of particle mass concentration
distribution, the invention consists of force depositing particles
onto a sensitive particle collection surface, as an electrode on a
piezoelectric crystal. This force is sequentially varied, in a
step-by-step procedure, to change the critical particle size
deposited on the surface. The mass of the particles deposited at
each force level is sensed to provide information of the particle
mass concentration, whereby the difference in the particle mass
concentration between two successive values of critical particle
size provides data relative to particle mass concentration
distribution.
In the Drawings
FIG. 1 is a diagrammatic view, partly sectioned, of the apparatus
for measurement of particle mass concentration distribution;
FIG. 2 is a top plan view of the impactor in the apparatus of FIG.
1;
FIG. 3 is a plan view of a piezoelectric crystal used in the
microbalance shown in FIG. 1;
FIG. 4 is a block diagram of a piezoelectric particle
microbalance;
FIG. 5 is a block diagram of a modified apparatus for measurement
of particle mass concentration distribution;
FIG. 6 is a diagrammatic view, partly sectioned, of another
modification of the apparatus for measurement of particle mass
concentration distribution.
FIG. 7 is a top plan view of the impactor and motor used to move
the orifice slide to vary the size of the orifice;
FIG. 8 is a longitudinal view, partly sectioned, of the apparatus
of the invention having a low pressure impactor;
FIG. 9 is a top plan view of the impactor of FIG. 8;
FIG. 10 is a schematic graph showing the operation of the apparatus
with stepped velocity in separate time intervals; and
FIG. 11 is a schematic graph showing particle mass concentration as
a function of particle size with stepped velocity.
Referring to the drawings, there is shown in FIG. 1 a schematic
view of an apparatus for determining a particle mass concentration
distribution for particles in the size range of approximately 0.5
to 10 microns. The term particles includes aerosols, particulates,
mists, fogs, dusts and the like. Apparatus 14 comprises an ambient
pressure impactor, indicated generally at 15, having a variable
particle impaction parameter. Impactor 15 operates in conjunction
with a piezoelectric particle microbalance 16 to measure particle
mass at each impaction parameter and thus directly measure particle
mass concentration at each parameter. The change in the particle
mass concentration between the parameters provides data directly
related to the particle mass concentration distribution. A vacuum
pump 17 is connected through an outlet tube 18 with the impactor
15. The pump 17 is operable to continuously draw air and particles
through the impactor and discharge the air and free particles
through the outlet 19. A speed control 21, connected to the pump
17, operates to vary the speed of the pump which will change the
vacuum force established by the pump. The speed control 21 can be
an adjustable automatic speed unit which will program the operation
of the pump for predetermined periods of time so that the flow rate
of the particles through the impactor 15 is changed in a
step-by-step fashion.
The impactor 15 has a cylindrical housing 22 with a central upright
chamber 23. The chamber 23 is closed with a cover 24 attached to
the housing 22 with fasteners 26, as bolts or the like. The center
of the cover has a general funnel-shaped circular orifice 27 for
directing a jet of air and particles into the chamber 23.
The piezoelectric particle microbalance 16 has a first primary
quartz crystal 28 supported in the chamber 23 directly below the
outlet end of orifice 27. A pair of supports 29 mount the crystal
28 on the housing 22. Located below crystal 28 is a second
reference quartz crystal 31. Supports 32 mount the reference
crystal 31 on the housing 22. As shown in FIG. 3, crystal 28 has an
electrode 33 in the center portion of the crystal. The electrode 33
is a thin, metallic film which is an electrically driven portion of
the surface of the crystal. The electrode can be a metal, such as
silver, gold, nickel, aluminum or platinum. The electrode can be
evaporated or sputtered on the surfaces of the crystal. Electrode
33 can be any suitable shape, as circular, rectangular, and the
like with a flat, convex or irregular outer surface. The edges of
the electrode 33 may be beveled. The lower side of crystal 28 has a
similar electrode. Also, reference crystal 31 has similar
electrodes on its opposite sides.
Referring to FIG. 4, piezoelectric particle microbalance 16 has a
primary oscillator circuit 34 electrically coupled to the
electrodes on crystal 28. In a similar manner, a reference
oscillator circuit 36 is electrically coupled to the electrodes on
the crystal 31. The oscillator circuits 34 and 36 are identical and
are connected to a mixer circuit 37 operable to subtract the
signals from the two oscillator circuits producing an information
signal indicative of the particle mass concentration collected on
the electrode 33 of the primary crystal 28. A power supply 38 is
connected to the oscillator circuits 34 and 36 and the mixer
circuit 37.
The piezoelectric particle microbalance 16 detects, with high
sensitivity, the mass of aerosol particles which are force field
deposited on the electrode 33 on the primary quartz crystal 28. The
fundamental property of the quartz crystal is that the crystal
forces the electronic oscillator circuit to oscillate at one of the
resonant mechanical frequencies of the quartz crystal. The resonant
frequency of the oscillating quartz crystal decreases with an
increase in the foreign mass deposited on the electrically driven
electrode 33. When particles are deposited on the electrode of the
quartz crystal, the resonant frequency of the crystal decreases in
response to the incremental mass of particle deposition. Type AT
quartz crystals can be used in the piezoelectric particle
microbalance. Type AT crystals vibrate in the thickness-shear mode,
whereby the frequency of vibration is independent of the elastic
properties of thin layers of particles on the crystal surface. The
quartz crystal microbalance is an effective transducer for
obtaining in situ measurements of the particle mass concentration
of air pollution aerosols with a very high time resolution. The
time resolution depends on the ambient particle mass concentration.
If high, then the time resolution is high.
The impactor, through the orifice 27, directs the air and particles
toward the sensitive electrode 33 on the crystal surface. The
particles must adhere to the electrode surface with enough force to
counteract the inertia forces which tend to dislodge the particles
from the surface. The balance of attractive forces and inertial
forces results in a maximum size particle that can be accurately
sensed by the piezoelectric particle microbalance. The attractive
force acting on the particle is a combination of forces, as Van der
Waals molecular forces, electrostatic forces, and surface-tension
forces. These forces vary with the size and type of particle, the
type of surface, and humidity. The attractive force is related to
the size of the particle. Coatings, as glycerin, vacuum grease, and
the like, can be applied to the electrode 33 to enhance the
adhesion of the particles. Particles greater than the maximum
particle size have inertial forces greater than adhesion forces.
These particles slip past the electrode 33 and their mass is not
measured with 100 percent efficiency.
The piezoelectric microbalance measures the total mass of all
particles with a size greater than a so-called "critical" particle
size and less than the maximum particle size. The "maximum"
particle size is determined by the slippage past the electrode 33.
The "critical" particle size is determined by impaction physics.
Impaction theory shows that this critical particle size decreases
as the aerosol impactor velocity increases or as the more general
parameter, the impaction parameter, increases. The flow rate
through the impactor orifice 27 can be changed to alter the
impactor jet velocity. By starting at a high velocity and
decreasing it monotonically and step-wise to zero, the microbalance
will successively measure the total mass of all particles with a
size above successively increasing values of the critical particle
size. The difference in the particle mass concentration between two
successive values of critical particle sizes provides data relative
to particle mass concentration distribution. The apparatus in FIG.
1 varies the flow rate of the air and particles through the
impactor by varying the rpm of of the pump 17.
FIG. 5 shows another means of varying the flow rate of the air and
particles through the impactor. The instrument shown in FIG. 5, and
indicated generally at 39, has an impactor 41 joined with a
piezoelectric particle microbalance 42. Impactor 41 and
microbalance 42 can be identical to the impactor 15 and
microbalance 16 shown in FIGS. 1 and 4. A valve 43 is connected in
the outlet 44 of the impactor for varying the flow rate of air and
particles through the impactor. A control 46 is operatively
connected to the valve to change the position of the valve. The
control can be an automatic control which operates in sequential
time intervals to program or index the valve to different locations
to change the flow rate of air and particles through the impactor.
A change in the flow rate of air and particles changes the velocity
of the particles impinging on the primary crystal of the
microbalance. This change in velocity changes the critical particle
size that adheres to the electrode surface. A constant speed vacuum
pump 47, coupled to valve 43, operates to provide a continuous
vacuum force on the valve.
Another method of programming the flow rate through the impactor
consists of several valves of choked orifices in parallel, each
operated with a separate solenoid valve. This battery of parallel
choked orifices replaces the single valve 43 in FIG. 5. The control
46 of FIG. 5 can be designed to sequentially operate the solenoids,
either individually or in combination to yield the desired
programmed flow rate.
Referring to FIGS. 6 and 7, there is shown another modification of
the apparatus for measurement of particle mass concentration
distribution, indicated generally at 48. The apparatus has an
impactor 49 operatively joined with a piezoelectric particle
microbalance 51. A constant speed pump 52 is connected to an outlet
53 of the impactor 49 to provide for a flow of air and particles
through the impactor 49.
Impactor 49 has a housing 54 having a chamber 56. The top of the
chamber is closed with a cover 57 having a central V-shaped orifice
58. The size of the orifice is varied with a movable slide 59
positioned in a slot 60 in the cover 57. The slide 59 is controlled
by a motor 61 having a rotatable drive member 62. A rod 63 connects
the slide 59 with the member 62 so that upon operation of the
motor, it will control the position of the slide 59 and thereby
regulate the size of the orifice 58. The motor 61 is programmed or
sequentially controlled with a motor control 64. The motor control
64 can be an automatic device which will sequentially operate the
motor for predetermined periods of time so that the size of the
orifice 58 will be changed in predetermined steps. Motor 61 can be
a programmed precision stepping motor.
Located within chamber 56 is primary quartz crystal 66 and
reference quartz crystal 67 of the piezoelectric particle
microbalance 51. Primary quartz crystal 66 has a sensitive
electrode 68 on the top surface thereof in axial alignment with the
orifice 58. In sue, as the slide 59 is moved to vary the size of
the orifice 58, the exposure area of the electrode 68 is changed so
that the particles are distributed over the surface of the
electrode 68. The distribution of particle mass on the crystal
electrode surface is important. If large amounts of mass are placed
on a small portion of the electrode, several secondary modes of
vibration are induced, causing instability in the fundamental
thickness-shear mode of vibration used to transduce particle mass.
Also, particles many layers away from the vibrating electrode
surface may not be measured since they may not stick together
firmly enough.
The constant speed pump 52 operates to impart a constant vacuum
force in chamber 56. By varying the size of the orifice 58, the
impact velocity of the particles on the piezoelectric crystal is
changed. This change in velocity changes the critical particle size
of particles deposited on the electrode surface.
Referring to FIG. 8, there is shown a low-pressure impaction
instrument, indicated generally at 69, for determining particle
size concentration of particles of from approximately 0.05 to 5
microns. Most important air-pollution particles have little mass
below 0.05 microns making the instrument 69 effective in obtaining
particle mass concentration distribution over the lower end of the
total size range of air-pollution particles.
The instrument 69 has an impactor, indicated generally at 71,
operatively coupled to a piezoelectric particle microbalance 72. A
flow control valve 73, as a precision micrometer valve, is
connected to an outlet tube 74 of the impactor to vary the flow
rate of air and particles through the impactor. A control 76
sequentially operates the valve 73. Control 76 can be programmed to
sequentially step the valve over a period of time. A constant speed
vacuum pump 77, connected to the valve 73, operates to establish a
constant vacuum force on the valve 73. Other means of varying the
impactor parameter can be used, as in the impactor of FIG. 1.
The impactor 71 has a housing 78 with a first upper chamber 79 and
a second lower chamber 81. A longitudinal axial bore 82, through
the midportion of the housing 78, provides a passageway between the
chamber 79 and the chamber 81.
Extended longitudinally into the chamber 79 is a first tube 83
having a central passageway and an end 86 spaced a short distance
from the open end of the bore 82. The end 86 has a small sonic
orifice 87 for directing air and particles into the bore 82. As
shown in FIGS. 8 and 9, the opposite end of the tube 83 projects
through the top housing wall and is open to the outside
environment.
A second tube 88, mounted on the housing 78, extends into the
chamber 79 to introduce clean air into the chamber. The second tube
has a passage 89 and an end 91. A small sonic orifice 92, in end
91, limits the amount of air flow into the chamber 79. Mounted on
the outer end of tube 88 is an absolute filter 93. Filter 93 can
have a removable filter element which can be replaced to insure
clean air flow into the chamber 79. Located adjacent the filter 73
is a flow meter 94 operable to calibrate the sonic orifice 92. The
same flow meter can be connected to first tube 83 to calibrate
sonic orifice 87.
The piezoelectric particle microbalance 72 has a primary quartz
crystal 96 and a reference quartz crystal 97 positioned in chamber
81. Primary quartz crystal 96 has a sensitive electrode 98 located
below the open end of the bore 82. The static pressure in chamber
81 is monitored with a static pressure gauge 99.
In use, the constant speed vacuum pump 77 is operable to withdraw
air through the impactor 71 and control valve 73. The air and
particles flow through the passage 84 in the tube 83 and through
the sonic orifice into the accelerating passage 82. The clean air
in the chamber 79 forms an annular sheet or cylinder of air around
the particle jet issuing from the sonic orifice 86. The clean air
sheet pinches the particle jet into the core or center portion of
the accelerating passage 82, thus keeping the particles away from
the walls of the passage 82. Furthermore, since the clean air sheet
pinches the particles inwardly, the particles have a velocity which
is very close to the center line velocity of the developing air
velocity profile. This uniformity of particle impaction velocity
greatly improves the sharpness of the particle size cutoff.
Both the impaction velocity and Cunningham slip coefficient are
varied simultaneously by varying the pressure in impaction chamber
81. This pressure is varied with the valve 73. The critical
particle size decreases as pressure decreases because as the
pressure decreases both velocity and Cunningham slip coefficient
increase.
By starting at a high value of velocity and decreasing it
monotonically and step-wise to zero, both the ambient pressure
impactors and the low-pressure impactor will successively measure
the total mass of all particles with a size above the successively
increasing value of critical particle size. The difference in
particle mass concentration between the successive values of
critical particle size provides data relative to particle mass
concentration distribution.
The operation of the piezoelectric particle mass concentration
spectrometer is schematically shown in the graphs of FIGS. 10 and
11. The impactor velocity, graph 10A, is decreased in equal time
steps over the sampling period. Any variable in the impaction
parameter, as impaction velocity, jet size, or Cunningham slip
coefficient, can be varied. Graph 10B shows the stepped increase in
critical particle size as the impaction velocity decreases. The
change in the frequency of the primary piezoelectric crystal is
shown in graph 10C. The cause of the frequency change, particle
cumulative mass concentration, is shown in graph 10D. the
oscillating frequency of the primary piezoelectric crystal
decreases linearly with the particle mass addition to the
crystal.
FIG. 11 shows the particle distribution at each stepped velocity as
a function of particle size. Graph 11A illustrates particle
cumulative mass concentration distribution of all particles with
sizes greater than the critical particle size at each velocity. The
difference in the particle mass concentration distribution between
the successive values of critical particle size provides the
particle mass concentration distribution, as shown in graph
11B.
Automation of the impactors to maximize the long-term unattended
operating time requires an automatic means for crystal cleaning,
indexing, or movement relative to the impactor jet. Crystal
cleaning is necessary because an excessively heavy particle
deposition on the crystal surface will cause the crystal to cease
oscillating stably. The crystal can be cleaned by driving it at a
very high current causing the particles to dislodge from the
surface. The loosened particles are then blown away with a jet of
clean air from a pressurized reservoir, pump, or other clean air
source. The crystal can alternatively be cleaned with cleaning
liquid, as alcohol, or a clean gas, as air, directed at the surface
of the crystal to wash or blast away the deposited particles. After
cleaning, the crystal is left to dry before being used again.
An electric heater can be incorporated into the impactors to raise
the temperature of the crystals from the ambient conditions. By
observing the loss of particle mass as the crystal is being heated,
information concerning the volatility of the collected particles
can be obtained. For example, if the particles are observed to
evaporate quickly near the sublimation point of dry ice or the
boiling point of water, it can be inferred that CO.sub.2 or water
is present in particulate form.
While there have been shown and described preferred embodiments of
the invention, it is to be understood that various changes,
omissions and substitutions can be made by those skilled in the art
without departing from the scope of the invention.
* * * * *