U.S. patent number 3,584,225 [Application Number 04/827,117] was granted by the patent office on 1971-06-08 for automatic yarn inspector comprising double integrating means and electronic calibrating means.
This patent grant is currently assigned to Lindly & Company, Inc.. Invention is credited to Howard Charles Londemann, Conrado Willems, Seymout Phillip Zalkin.
United States Patent |
3,584,225 |
Londemann , et al. |
June 8, 1971 |
AUTOMATIC YARN INSPECTOR COMPRISING DOUBLE INTEGRATING MEANS AND
ELECTRONIC CALIBRATING MEANS
Abstract
A detection system for inspecting strands of elongated material
such as yarn, fishing line, sutures, cord, string, thread and the
like while being advanced longitudinally individually or as a
multiplicity in sheet form and for inspecting fabric and web
materials. A lamp provides a beam of light applied to the material
being inspected which impinges on photoresponsive means that
provides voltage signals when defects occur in the material being
inspected. A circuit is provided for generating signals
corresponding to selected ones of the voltage comprising an
integrating circuit receives these corresponding signals and
generates composite signals the amplitude of which depends on the
quantity and amplitude of the corresponding signals produced in
preselected periods of time. Length-adjust means adjust the
quantity of the corresponding signals which will be integrated to
determine the length of the defects which are detected on the
material being inspected.
Inventors: |
Londemann; Howard Charles
(Westbury, NY), Zalkin; Seymout Phillip (New Rochelle,
NY), Willems; Conrado (Bayside, NY) |
Assignee: |
Lindly & Company, Inc.
(Nassau County, NY)
|
Family
ID: |
25248349 |
Appl.
No.: |
04/827,117 |
Filed: |
May 19, 1969 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
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490773 |
Sep 17, 1965 |
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142373 |
Oct 2, 1961 |
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Current U.S.
Class: |
250/559.12;
250/559.45; 28/187; 28/227; 66/163; 356/238.2 |
Current CPC
Class: |
G01N
33/365 (20130101); G01N 21/8915 (20130101); B65H
63/0324 (20130101); B65H 2701/38 (20130101); B65H
2701/31 (20130101) |
Current International
Class: |
G01N
21/89 (20060101); G01N 21/88 (20060101); B65H
63/00 (20060101); B65H 63/032 (20060101); G01n
021/30 (); G01n 021/16 (); D04b 035/12 () |
Field of
Search: |
;250/219 (S)/ ;66/163
;356/238 |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Lawrence; James W.
Assistant Examiner: Grigsby; T. N.
Parent Case Text
This a continuation of our application, Ser. No. 490,773 filed
Sept. 17, 1965 which is a continuation of our application Ser. No.
142,373, filed Oct. 2, 1961 and both of which are now abandoned.
Claims
We claim:
1. A detection system for inspecting strands of elongated material
such as yarn, fishing line, medical sutures, cord, string, thread
and the like while being advanced longitudinally individually or as
a multiplicity in sheet form and for inspecting fabric and web
materials comprising, circuitry having a lamp from which emanates a
beam of light relative to which the material being inspected is
moved transversely thereof and including photoresponsive means on
which said light impinges to provide voltage signals when defects
occur in the material being inspected, first circuit means
connected to respond to said voltage signals for generating
corresponding signals from selected ones of said voltage signals,
second circuit means connected to receive said corresponding
signals in a configuration responsive to said corresponding signals
and including integrating circuit means for generating composite
signals the amplitude of which depends on the quantity and
amplitude of said corresponding signals produced in preselected
periods of time, means responsive to each of said composite signals
generated controlling the movement of said material, in response to
at least some of said composite signals and length-adjust means to
adjust the quantity of said corresponding signals said second
circuit will integrate to determine the length of the defects which
are detected on said material being inspected.
2. In combination an automatic photoelectric inspector apparatus
and an electronic calibrator for inspecting strands of elongated
material, yarn, fishing line, medical sutures, cord, string, thread
and the like while being advanced longitudinally and as a
multiplicity in sheet form and for inspecting fabric and web
materials comprising, a detecting head comprising a source of
light, an optical system cooperative with said light source having
an optical axis for projecting a substantially collimated
inspection beam of light rays across the strand or sheet of strands
to be inspected, means providing at least one guide surface over
which said strand or sheet of strands pass when being inspected
comprising means for disposing said guide surface substantially
parallel to said optical axis, a photoelectric unit having means
disposed for receiving the light beam rays after projection across
said strand or sheet of strands and comprising pulse generating
means to generate discrete pulses representative of discrete
defects detected by the light beam and in response to modulated
light rays causing variations of the amount of light in said beam
due to said defects, control circuitry connected to said pulse
generating means for establishing variable pulse amplitude
effective levels representative of a variable lower limit of
diameters of the defects to be detected, and actuating means
responsive only to pulses within said limit of amplitudes, an
electronic calibrator comprising, means for generating a pulse, a
differentiating circuit connected to receive said pulse and sharpen
it, a monostable vibrator triggered by said pulse connected to
receive said sharpened pulse, a pulse shaping network for shaping
the pulse to a preselected shape, means for applying the output of
said vibrator to said shaping network, and means controllable for
establishing a variable amplitude level for said pulses so that the
amplitude level is indicative of a predetermined value of a
physical variable.
3. In combination an automatic photoelectric inspector apparatus
and an electronic calibrator for inspecting strands of elongated
material, yarn, fishing line, medical sutures, cord, string, thread
and the like while being advanced longitudinally individually and
as a multiplicity in sheet form and for inspecting fabric and web
materials comprising, a detecting head comprising a source of
light, an optical system cooperative with said light source having
an optical axis for projecting a substantially collimated
inspection beam of light rays across the strand or sheet of strands
to be inspected, means providing at least one guide surface over
which said strand or sheet of strands pass when being inspected
comprising means for disposing said guide surface substantially
parallel to said optical axis, a photoelectric unit having means
disposed for receiving the light beam rays after projection across
said strand or sheet of strands and comprising pulse generating
means to generate discrete pulses representative of discrete
defects detected by the light beam and in response to modulated
light rays causing variations of the amount of light in said beam
due to said defects, control circuitry connected to said pulse
generating means for establishing variable pulse amplitude
effective levels representative of a variable lower limit of
diameters of the defects to be detected, and actuating means
responsive only to pulses within said limit of amplitudes, said
electronic calibrator comprising, means comprising an astable
multivibrator for generating a negative pulse, a differentiating
circuit connected to receive said negative pulse and sharpen it, a
monostable vibrator triggered by said pulse connected to receive
said sharpened pulse, a pulse shaping network for shaping the pulse
to a preselected shape, means for applying the output of said
vibrator to said shaping network, and means controllable for
establishing a variable amplitude level for said pulses so that the
amplitude level is indicative of the level of a physical variable.
Description
This invention relates generally to continuous automatic monitor
systems and more particularly to a transistorized photoelectric
yarn inspector.
Photoelectric yarn inspection apparatus having controllable
sensitivity for detecting defects in yarns particularly synthetic
yarns are known. Such apparatus are employed to detect yarn defects
such as strip-backs, fluff balls, filament loops and broken
filaments. Known photoelectric systems comprising a concentrated
light source and a collimating optical system to project a long
narrow beam of light across the yarn fibers, arranged as a "sheet,"
and a photoelectric receiver to receive the light, convert the
light and any variations to electric energy which is transmitted to
an electronic control circuit.
It is a principal object of the present invention to provide an
improves automatic photoelectric yarn inspector employing
transistorized control circuitry and an improved optomechanical
system.
The new and improved optical system, according to the invention,
improves the signal to noise ratio of the system by minimizing the
possibility of stray or ambient light entering the photoelectric
transducer means and substantially precluding light reflected from
the yarn, which is being inspected, in "sheet" form, from affecting
the photoelectric transducer thereby improving sensitivity and
uniformity of sensitivity to defects.
The optical system is mounted in a detecting head of the inspector
and employs a collimating lens at the light source and an objective
lens, a pickup or magnifier lens unit in conjunction with a field
limiting aperture in front of a phototube to exclude stray light
and minimize electronic "noise" caused by tension irregularities of
the yarn being inspected, jumping yarn, yarn twist, and rolling
ends in the yarn sheet so that the phototube responds almost
exclusively to light changes, in the inspection light beam, due to
variations of radiant flux impinging on it which are caused by
actual defects. Rectangular apertures which define the effective
size and shape of the light beam so as to give maximum signal
amplitude and frequency while still maintaining a workable light
level on the phototube, are used at both light sources and receiver
optical units.
The optical system accomplishes its intended purpose by causing the
objective lens to form an image of the filament of a light source
lamp in the plane of a small field-limiting slit or aperture in a
diaphragm placed between the lenses. The greatest part of the
unwanted light is prevented from falling on the phototube by not
being able to pass through this aperture because it does not enter
the objective lens substantially parallel to the optical axis. The
pickup or magnifier lens serves to project an enlarged secondary
image of the primary filament image on the cathode of the
phototube. The purpose of the enlarged image is to prevent
localized saturation of the cathode.
The exclusion of unwanted light and the minimizing of electronic
"noise" along with other features of the yarn inspector, according
to the invention, result in a highly uniform sensitivity of defect
detection from one side to the other of the yarn sheet. This is
especially important where it is desired to detect very small
defects.
A special new light source is used with the improved optical
system. The new light source lamp has a selected pear-shaped clear
glass envelope of blown rather than drawn tubular construction to
minimize striae and other irregularities that affect the uniformity
of the projected light beam. The lamp is mounted on a new
universally adjustable base to allow precise alignment of the lamp
in both vertical and horizontal planes so that it can be readily
and precisely aligned relative to the optical system and to permit
precise positioning of the light projected by the beam relative to
the yarn sheet being inspected.
Another feature of the invention is the use of solid state
electronic components in transistorized control circuits thereby
optimizing reliability of the apparatus due to the inherent
reliability of the long lived components along with optimization in
size, weight and power requirements.
The transistorized circuitry is so designed that circuit boards on
which the circuitry is assembled may be removed from the system by
disconnecting at multiple terminals and returned to the factory,
for example by airmail, where repair can take place and the boards
be quickly returned to the user.
Another feature of the apparatus is the provision of a variable and
extremely well regulated high voltage supply employing a
compensating system which compensates for any change in the output
of the phototransducer during the effective life of the
photomultiplier tube or transducer means. The high voltage from the
high voltage supply itself is well regulated and is ripple free
which, in part, is due to the use of transistors and silicon
diodes. The improved power supply circuitry and compensation system
allows the light source of the apparatus to be operated at less
than 60 percent of its rated voltage capacity thereby greatly
extending the life of the light source as well as protects from
variant ambient conditions such as power line fluctuations.
Still another feature of the invention is an improved frequency
range so that the apparatus can inspect over a very wide range of
yarn speeds. The frequency range is also improved in that the
apparatus is able to detect tapered type defects which may result
in low frequency signals due to their contours.
Other features and advantages of the yarn inspecting apparatus in
accordance with the present invention will be better understood as
described in the following specification and appended claims, in
conjunction with the following drawings, in which:
FIG. 1, is a diagrammatic illustration of an installation for use
of the apparatus or yarn inspector, according to the invention;
FIG. 2, is a front elevation view of the yarn inspector, according
to the invention;
FIG. 3, is an end elevation view of the apparatus shown in FIG.
2;
FIG. 4, is a cross-sectional view taken at line 4-4 of FIG. 2;
FIG. 5, is a cross-sectional view illustrating another embodiment
of the yarn guide and is illustrative of two cylindrical yarn guide
bars, according to the invention;
FIG. 6, is a cross-sectional view of still another embodiment of a
yarn guide and is illustrative of a single yarn guide for guiding
the yarn sheet during inspection;
FIG. 7, is an enlarged elevation view, partly in section, of a
light source unit mounted on a detecting head, according to the
invention;
FIG. 8, is an enlarged elevation view partially in section of an
optomechanical system in the detection head forming a part of a
photoelectric receiver unit;
FIG. 9, is a block diagram of an embodiment of a control unit,
according to the invention;
FIG. 10, is a block diagram of a second embodiment of a control
unit, according to the invention;
FIGS. 11 and 12, are block diagrams of the control unit in FIGS. 9
and 10 respectively provided with defect length detectors capable
of providing another dimension of detection, namely the length of a
defect;
FIGS. 13a and 13b, are diagrams of the electronic circuitry of the
control unit common to all embodiments of the yarn inspector
control unit, according to the invention;
FIGS. 14a and 14b, are a circuit diagram of a dual-level electronic
control unit, according to the invention;
FIG. 15, is a block diagram of a length selector circuit for use
with the control units, according to the invention;
FIG. 16, is a circuit diagram of the length selector circuit shown
in FIG. 15;
FIGS. 17a, 17b, and 17c, are a schematic diagram of the control
unit in FIG. 11;
FIGS. 18a, 18b, 18c and 18d, are a schematic diagram of the control
unit in FIG. 12;
FIGS. 19 and 20, are composite diagrams illustrating how FIGS. 17
and 18 are assembled respectively;
FIG. 21, is a block diagram illustrative of a circuit for carrying
out inspection only by defect length, according to the
invention;
FIG. 22, is a block diagram of a calibrator for use with the
various control units, according to the invention, and illustrated
therewith in FIG. 12; and
FIG. 23, is a circuit diagram of the calibrator of FIG. 22.
Referring to FIGS. 1--8, the automatic yarn inspector, according to
the invention, is intended to inspect and detect defects on a
plurality of yarn fibers. The term yarn includes silk, wool,
cotton, nylon, dacron, terrylene, acetate, viscose, rayon, cupra
acrylic, and other synthetic fibers. The inspection apparatus is
installed, for example, in a mill to inspect yarns 1 delivered by a
creel 2 and in which the yarns are advanced through an eye-board 3
mounted on an eye-board holder 4 and through a reed 5 and are held
down on yarn guides in sheet form by a hard chrome plated holddown
or flattening bar 7. The yarns are advanced longitudinally in
parallel, in sheet form, through the yarn inspector 8 according to
the invention later herein described at length. The sheet of yarn
fibers is advanced through a movable reed 9 selectively actuated by
rack means 10 and the yarn advances over a recoding roller 12 onto
a beam 13. It being understood that the arrangement described above
is simply illustrative of the manner in which the yarn inspector
may be employed and, moreover it is readily apparent to those
skilled in the art that static eliminators 14 may be provided in
the arrangement to reduce static in the yarn sheet.
The yarn inspector 8, according to the invention, comprises a
detecting head 16 mounted as hereinafter described and comprises a
light source unit 19 provided with a new light source lamp 20 and a
photoelectric unit 21 having a photoelectric transducer, for
example a phototube 22, mounted opposite to the light source unit
19. A yarn guide unit or assembly 23 mounted between the light
source unit and the photoelectric unit completes the main units of
the detecting head. The photoelectric unit is connected to an
electronic control unit 24 which is alternatively mounted on a
floor stand 26 or remote from the inspector. A second floor stand
28 is provided for supporting the detecting head. The two stands
26, 28 are provided with threaded screw members 30, 31 respectively
for variably adjusting the height of the detecting head 16 and
making coarse adjustments in leveling it.
The yarn guide assembly 23 is mounted on a tubular member 32
mounted on cross arms 33 supported on shock mounts 34. Different
types of yarn guide bars, hereinafter described, form the assembly
and are positionable in height by means of the adjustably set
adjustment means at opposite ends of the detecting head and each
consisting of a screw 37 and lock nut 38 and an upright internally
threaded member 39 for fine adjustment of the optical alignment of
the guide bars. The fibers move in sheet form over yarn guiding
surfaces, for example flattened guide surfaces 40, 41 of a pair,
FIG. 4, of rods or bars 42, 43 which are held in place and an
assembly by means of a clip 44 and an externally threaded member 45
both of which are embedded along with the bars in electrically
conductive epoxy resin cement 47 in a channel member 48. The
conductive epoxy cement tends to bleed off static charges. The
surfaces 40, 41 are precisely aligned and parallelism along their
entire length is set by axially spaced set screws 49 so that even
in the longest axially extending detecting head there is no part of
the guide surfaces that are more than a few thousandths of an inch
out of parallelism with the optical axis of the equipment
hereinafter described. In order to obtain complete parallelism the
bars 42, 43 are lapped. These bars are preferably conductive. The
surfaces 40, 41 while flattened have the outer boundaries thereof
arcuate so that the greater radius of the surface over which the
yarn runs minimizes any tendency for twist or "backup" in the yarn
and minimizes yarn loops and other irregularities that can cause
false stopping of the yarn inspector as hereinafter explained and
yarn wear is likewise reduced. The length of the guiding surfaces
is sufficient to allow optimum separation of the yarn ends thereby
minimizing "rolling" ends and other difficulties due to crowding of
the ends.
The double-type construction shown in FIG. 4 of the guide bars is
employable for all ordinary yarn inspection applications and the
position of the parallel guiding surfaces are so adjusted that the
yarn sheet crosses through the center of an inspection light beam
59 so that any defects which project upward or downward change the
light falling on the phototube 22 by a minute amount causing an
electric impulse as hereinafter explained.
Preferably, the guide bar assembly is constructed of two parallel
guide bars 52, 53 circular in cross section held in position by a
clip 54 and embedded in epoxy resin 55 in the manner heretofore
described. The bars' upper surfaces are aligned by set screws 56
and held in position by the resin after alignment. The completely
round surfaces thereof permit optimum guide bar wear and reduce the
possibility of yarn damage since war is more evenly distributed
over a greater surface. Moreover, any tendency of the twist to
"backup" is substantially eliminated. In this construction of the
guide bar assembly, FIG. 5, a groove 57 is shown formed between two
guide bars 52, 53 which is sufficiently deep to permit an
inspection light beam 59, formed by the unit 19, to be projected
along the groove, transversely of the yarns 1, so that it is just
underneath the yarn sheet passing over the upper surfaces of the
bars 52, 53. This construction minimizes the problem of false
stopping resulting from yarn looping due to poor tension control,
transfer jerks and backup of a yarn twist which generally cause the
yarn to jump upward and away from the guide rather than into the
light beam. This unit is useful for heavy yarns and tire cord.
While the groove 57 is shown in the embodiment in FIG. 5 it will be
understood that this type of groove can be used in the embodiment
in FIG. 4 in which case the beam would not intersect the yarn sheet
1 as illustrated.
A third embodiment of the guide bar assembly of the invention makes
use of a single guide bar 62 in which only one guide surface is
located just below the light beam. The bar 62 is held in position
by holding members 64, 65 which adjustably hold the bar under
control of a threaded screw 67 and permit selective rotation
thereof to prevent grooving of the guide surfaces by excessive
wear. Threaded screws disposed axially of the bar such as an adjust
screw 68 provide a fine axial level adjustment of the bar 62. This
particular construction is preferable for heavy yarns, as for
example, tire cord. The yarn sheet in such constructions is outside
of the light beam which is directly above the sheet so that large
defects upon passing over the guide are pushed upward into the beam
for detection and actuation of the apparatus as hereinafter
described.
In the various embodiments of the yarn guide assemblies the bars
are made of conductive or nonconductive ceramic or satin-finished
chrome plate or flame coated ceramic or hard metal. Ceramic guide
bars are preferably used when abrasive yarns, for example nylon,
are being inspected. The same guide bars are employed in inspecting
multifilament and spun yarns, thread, cord, fishing line, medical
sutures and the like.
While the yarn inspector or monitor has been described as
applicable to the inspection of yarn ends arranged in sheet form it
is to be understood that the monitor is applicable to detection of
defects in single ends. In single and inspection the guide, not
shown, is constructed in known manner.
LIGHT SOURCE UNIT
The detecting head light source unit 19 comprises a lamp 20 which
has a pear-shaped envelope which has been blown thereby resulting
in minimum distortion of the luminous flux emitted therefrom. The
light bulb is held in a mount or base 70 fixed to a casting 71
fixed to the tubular member 32 and has a vertical or preferably
horizontal filament 72 positionable relative to the optical axis of
an optical system of the inspection apparatus hereinafter
described. The lamp base permits optimum alignment of the bulb
filament 72, which may be a horizontal or vertical filament, in the
optical axis of an optical system of the inspection apparatus. The
radiated flux enters a collimating lens unit of the optical system
comprising a tubular member 74 in which a diaphragm 75 provided
with an aperture 77 is disposed substantially adjacent one end of
the tube. A beam-forming or collimating lens 78 for rendering the
luminous flux rays parallel is disposed axially spaced from the
aperture 77. The parallel light rays pass outwardly of the tube 74
through an aperture 79 preferably rectangular provided in a
diaphragm 80 which is held in position by an externally threaded
bushing 82. The rays then pass outwardly of the light source unit
through a window 82 in a housing 85 for the unit. The light rays
are projected as the beam 59 across the yarn sheet formed by the
yarns 1. It will be remembered that the light beam 59 is positioned
with respect to the yarn sheet in accordance with the type of yarn
being inspected and the yarn guide bar arrangement being employed
in the unit during the inspection function as heretofore
described.
The lamp mount 70 comprises a lamp base member 88 having a threaded
flange portion 89 bearing on a threaded pivot 90. Threaded pivot 90
is seated in an unthreaded groove in 92 so that it can rotate
without moving axially. It is prevented from moving axially by
having a groove (not shown) around its periphery which is engaged
by a pin (not shown) held in 92. The flange portion 89 is held in
position bearing on the pivot by a threaded screw 91 threaded into
a member 92 and having a spring 95 peripherally thereof bearing on
the portion 89. Another threaded screw, not shown, is disposed on
the opposite side of the base member 88 and is threaded into the
fixed member 92. The head of this second screw bears on the portion
89 so that by axially adjusting this second screw the member 88 is
pivoted relative to the pivot 90 so the filament 72 can, therefore,
be positioned precisely in a horizontal plane. The threaded pivot
90 provides vertical adjustment of the bulb 20 so that the filament
72 can be readily accurately positioned relative to the optical
axis of the optical system of the inspector.
PHOTOELECTRIC UNIT
The light beam is received in the photoelectric unit 21 where it
enters a light-impervious housing 98 through a window 99 and passes
through the rest of the optical system comprising an objective or
condensing lens 103 and a magnifying lens system of two lenses 100,
101, coaxially mounted in a tubular element 105 and impinges on the
cathode of the photomultiplier tube or transducer means 22.
The tubular element 105, in which is mounted the magnifying system,
has an internally threaded bushing 106 disposed on an externally
threaded bushing 107 adjustably set axially internally of the
bushing 106. The bushing 107 has axially spaced therein the pair of
magnifying lenses 100, 101. A diaphragm 110 is disposed in the
bushing 106 axially spaced from the magnifying lenses and is
provided with a small slit or aperture 111. The diaphragm is held
in place coaxially with the two magnifying lens internally of the
bushing 106 by a keeper 113. The bushing 106 and diaphragm (not
shown) is biased in a direction away from the opening 99 by a
blackened spring 115 which also serves to eliminate stray
reflections from the internal walls 105 and which is seated on a
shoulder 116 of the tube 105 and held in axial position by a set
screw 117. At the opposite end of the tube is disposed the
objective lens 103 which is held in position in the tube 105 by an
externally threaded bushing 118 axially adjustable in the tube. A
diaphragm 119 is staked in position in a cap 121 at the starting
end of the tube and is provided with a relatively large rectangular
aperture 123, preferably of the same size and shape as 79, through
which the light beam passes. The lens unit and the photomultiplier
tube or photoelectric transducer are removably mounted on a casting
125 removably fixed to the tubular member 32 by cap screws 126 as
shown.
An image of the filament 72 is formed in the plane of the slit 111.
The greatest portion of undesired light is unable to pass through
this very small slit so that as a result substantially only the
modulated light rays of the beam pass through the slit. The
magnifying lenses 100 and 101 project an enlarged second image of
the filament on the cathode of the photomultiplier tube 22. On the
passage of a defect the effect of the optical system is to cause a
substantially uniform dimming of the illuminated area formed on the
transducer cathode which improves the life, the sensitivity and
uniformity of sensitivity response of the photomultiplier. It is
apparent that the housing or cover 98 forms a light-tight
compartment in which the lens unit and the tube are mounted to form
the photoelectric unit of the detecting head and ambient unwanted
light is eliminated from the system.
CONTROL UNITS IN GENERAL
The photomultiplier 22 is connected to the control system or unit
24 which comprises circuitry to obtain optimum sensitivity and
accuracy of the yarn inspector with well regulated circuitry of
utmost ability later described in detail, in FIGS. 9--22. A power
supply 130 in the control unit is connected to a line voltage with
a lead 131 and transforms the line voltage to a DC filtered output
applied to a transistorized lamp voltage regulator circuit 133
which applies a low level voltage to the light source lamp 20 and a
collector voltage regulator 135 whose output is connected to
collectors of the transistorized lamp voltage regulator 133 and to
collectors of emitter follower circuits in a compensator 137 which
has a high voltage supply and oscillator circuit 138 and the
phototransducer or photoelectric tube 22 connected in a
self-compensating loop herein later described. The voltage
regulator circuit 135 has a well regulated ripple-free output for
use as supply to the high voltage compensating circuit 137 which
functions essentially as a feedback regulator and applies an output
to the high voltage supply and oscillator circuit 138 which
supplies its output to the phototube 22 and to emitter followers in
the compensator which make it possible to obtain extreme stability.
The outputs of the phototube 22, the compensator 137, and the
regulator 135 are applied to an amplifier 140.
The overall theory of operation of operation of the automatic
inspector is as follows:
A very small change in the amount of light impinging on the face of
the photomultiplier tube 22, due to variations in the beam 59 due
to yarn defects, will produce an electrical pulse. The pulse is
amplified by the amplifier 140 and used to operate an output relay
142 to open or close a circuit such as a stop motion, a motor or a
light and can stop the warper or beam 13. Each part of the circuit
required to accomplish the above has been precisely engineered in
the control units, later herein described at length, for the yarn
inspector permitting high and low sensitivity control which enables
the user to easily adjust the unit to detect defects larger than
any desired minimum size from a single broken filament to large
fluff balls.
The circuitry, FIG. 9, of the above-described block diagram is that
of an embodiment of a single level control unit usable in an
application which it is desired either to detect and count or
detect, count and stop a warper only for defects over one certain
size. The control unit according to the invention, is made in five
embodiments thereof; single level, dual level, single level with
length selector, dual level with length selector, and a length
selector arrangement. These different control units are used
separately with the detecting head depending on the inspecting to
be done. In order to simplify the drawings the circuitry common to
the various types of control units have the same reference
numbers.
The dual level control unit, FIG. 10, is used for those
applications where it is desired to detect yarn defects on two
different sensitivity levels as later herein described. The dual
level control unit is particularly applicable to situations where
all defects are counted, both major and minor, but the warper is
made to stop only for major defects which are then later removed
from the yarn. The purpose of the count of minor defects is to
establish quality control information and this type of electronic
control unit is particularly applicable to yarn inspection
production functions.
The single level control unit with a length selector, FIG. 11,
hereafter described adds another dimension of detection, namely the
length of the defect, to the single level control unit illustrated
in FIG. 9. This unit can either detect and count or detect, or
count and stop a warper for defects over one certain size or
diameter and one certain length.
The fourth type or model of the control unit, FIG. 12, according to
the invention, provides for dual level sensitivity with a length
selector which provides an additional dimension of detection,
namely the length of the defect. By means of this unit both major
and minor defects may be detected on a basis of not only the size
but also the length. This allows the user of yarn inspector to
allow knots and short defects to pass by undetected yet to catch
longer defects which may be smaller in size. Detection of filament
loops, slack filaments and long, tapering defects are conditions
easily detected by this type of unit hereinafter described.
Each of the four above-mentioned different types of control units
have types of controls equipped with high and low sensitivity
controls, as hereinafter described, which enable the user to easily
adjust the unit to detect defects larger than almost any desired
minimum size from single broken filaments to large fluff balls. It
being understood that the dual level units are equipped with two
sets of controls. Moreover, all of the series of control units are
equipped with fail-safe protection and indicating lights, as later
described, so that any failure of the lamp or tube system will
automatically stop the warper 13 and indicate the failure by means
of a light on the control unit 24.
In addition, each unit is provided with a receptacle in which can
be plugged a small auxiliary electronic calibrator, FIGS. 22 and
23, and sensitivity checking device hereinafter described. This is
automatically actuated each time the warper stops for any reason
whatsoever and indicates whether or not the yarn inspector is
performing properly at the sensitivity for which it was set.
Failure of this unit to operate properly at the present sensitivity
is indicated by a light in the panel of the auxiliary unit and the
user of this auxiliary unit in conjunction with the fail-safe built
into the control unit itself guarantees complete protection against
malfunction of the yarn inspector.
The fifth unit is a circuit, FIG. 21, for carrying out inspection
only by defect length. Defects over one certain length are detected
and counted or if desired the apparatus can detect, count and stop
a machine when defects over one certain length are sensed.
A low frequency cutoff switch arrangement on the panel of each of
the four first-mentioned control units, as hereinafter described,
provides three degrees of selection of the low frequency response
cutoff point enabling the user to choose the optimum low frequency
cutoff point to get best performance from the yarn inspector for
given types of yarn defects and conditions. It will be understood
that in the length selector low frequency cutoff switch is not
utilized. The low frequency cutoff arrangement permits a
minimization of "false stops" due to faulty tension control in the
yarn plucking originating in the pirn static and other conditions.
Moreover, at the same time it permits the catching of long,
gradually tapered defects which cause low frequency signals that
may be difficult to distinguish from electronic "noise" resulting
from external factors.
Referring now to the circuitry to be found in each of the various
series of control units, according to the invention, and described
in detail in FIGS. 13a and 13b; these two FIGS. illustrate in
detail the circuitry of the various blocks of the block diagram of
FIG. 9 which illustrates the circuit of the single level control
unit version or embodiment of the control unit. This basic
circuitry is common to each of the embodiments of the control unit
except the length selector.
POWER SUPPLY
A power supply 130, for both the lamp voltage regulator 133 and the
voltage regulator 135 which functions as a collector voltage
regulator, is provided with a lead 131 and an on-off switch 146 for
connecting the control unit 24 to a source of line voltage, not
shown. The desired voltage is obtained by transforming the line
voltage, which may be 115--230 volts, 50--60 c.p.s. by a
transformer 149 which has two secondary output windings 150, 151
for applying power to the collector voltage regulator 135 and the
lamp voltage regulator 133 respectively. A power pilot light 154 is
connected as shown to indicate when the switch 146 is on the on
condition.
The output voltage of winding 150 is applied to a silicon bridge
rectifier 157 and a DC filtered output of this circuit is taken out
at DC terminals 158, 159 and applied as collector voltage in the
volt regulator circuit 135 as hereinafter explained. A voltage
doubler consisting of a pair of diodes 161, 162 and a pair of
capacitors 165, 166 is connected to the regulator circuit 135. The
other secondary winding 151 of the transformer 149 is fed into a
silicon bridge rectifier 173 and a DC filtered output is taken out
at DC terminals 174, 175 and applied to the lamp voltage regulator
circuit 133 along two leads 176, 177.
VOLTAGE REGULATOR CIRCUIT
The regulator circuit 135 is a series transistor regulator. This
circuit is a feedback regulator using a zener diode as a reference
element. Two transistors 180, 181 are connected to act as the
control element as a zener diode 182 connected across the regulator
is the reference element. A power transistor 183 is connected to
the rectifier 157 as a series element to absorb voltage variation
and functions as an emitter follower whose base is held at a fixed
voltage and, therefore, the emitter voltage is constant. The well
regulated output voltage is ripple-free and is fed out of leads
184, 185 and is controlled by adjustment of a potentiometer
186.
A reference voltage from the zener diode 182 maintains the emitter
of the control transistor 180 at a constant voltage. The collector
voltage of the control transistor then changes inversely with the
voltage change on the base and this change is fed to the base of
the transistor 181, which functions as an emitter follower. A zener
diode 192 is connected in the regulator circuit to maintain a
constant voltage drop from the voltage double circuit to the
emitter of the emitter follower transistor 181. The change at the
emitter of this transistor is directly coupled to the power
transistor 183.
The output from the emitter of the power transistor 183 is a well
regulated, ripple free output for use as a transistor collector
supply applied to the compensator 137 by leads 184, 185 as shown
and applied to the lamp voltage regulator 133 by a lead 195 as a
reference voltage.
LAMP REGULATOR CIRCUIT
The lamp power supply or lamp regulator circuit 133 is
substantially similar to the regulator circuit 135. A control
transistor 198 in cascade with a buffer transistor 200 jointly
function substantially similar to the control element transistors
180, 181 of the voltage regulator circuit. A series transistor 203
is series with the power supply rectifier 173 provides a well
regulated output voltage along an output lead 204 connected to a
base pin A for providing a steady lamp voltage to the lamp 20. In
order to maintain the lamp voltage at a desired level a
potentiometer 206 connected to the base of the control transistor
198 is provided.
In the lamp regulator circuit a reference voltage is not obtained
by use of a zener diode in the manner of the voltage regulator
circuit. Instead, the regulated output of the voltage regulator
circuit is used as a reference voltage and applied along the lead
195 and a voltage divider network as shown. In order to protect the
unit a protective resistor 208 is utilized to prevent damage if the
lamp accidentally shorts. This resistor is in series with the lamp
regulator circuit 133 so that if a short occurs the current will be
limited.
PHOTOELECTRIC TRANSDUCER
The photoelectric transducer used in the yarn inspector, according
to the invention, is the photomultiplier 22. It operates on the
following principle:
As the light from the beam 59 strikes the photosensitive cathode
210 electrons are emitted. These electrons are drawn with high
velocity to a more positively charged dynode. When they strike the
dynode more electrons are dislodged resulting in secondary emission
and they are attracted with high velocity to a still more
positively charged dynode. This procedure occurs in all ten stages
of the photomultiplier tube, until a comparatively large current is
built up for a given amount of light incident on the photocathode
210. In normal operation, as a photomultiplier is used its
sensitivity decreases. This is in great part overcome by use of the
novel voltage compensating circuit 137 to be described in detail
later.
The phototube has a shield 211 of magnetic material to protect the
electron beam from any stray magnetic field. The shield is
connected to the cathode 210 with a resistance 212 to protect the
electron beam from any stray electrostatic field. The output of the
photoelectric transducer, therefore, substantially corresponds to
the light impinging on it cathode. The shield has an aperture, not
shown, through which the rays of the beam 59 enter and impinge on
the cathode.
In order to simplify the drawings the photomultiplier and lamp 20
bases are shown schematically on a common base 215 with pins as
indicated. The various pin connections are as shown and later
explained.
AMPLIFIER CIRCUIT
The output of the photomultiplier, in the form of a pulse when a
variation in light occurs due to a beam change caused by a yarn
defect varying the amount of light impinging on the
photomultiplier, is fed into a transistor emitter follower 219 in
the detecting head in order to minimize extraneous noise. This is
accomplished by lowering the output impedance of the detecting
head. A biased diode 220 protects the transistor 219 from
overvoltage damage. The pulse is then applied through pin G to the
base of a transistor 221 connected as an emitter follower in the
compensator 137. From the emitter of this transistor 221 the signal
goes along a lead 223 to a rotary switch 225 which is operable to a
position 226 when a calibrator unit, hereinafter described,
connectable to the control unit at a plug 227 is to be used with
the yarn inspector and is operable to a position 228 when the
calibrator is not in circuit. The signal then goes to a "High-Low"
sensitivity control switch 230. Sensitivity to the defects being
detected is adjusted by a sensitivity adjust potentiometer 233. On
a "High" position 234 of the switch it is possible to catch a
single filament without reaching the maximum position of the
sensitivity control. On a "Low" position 235 a series resistor 236
decreases the signal thus permitting finer adjustments whether
small or large defects are being detected.
From the sensitivity control the signal must pass a rotary
frequency cutoff switch 237 which places various capacitors 238,
239, 240 in the circuit, thereby permitting a choice of frequency
response. When the frequency cutoff switch is on a "Low" position
242 an extremely flat frequency response is obtained. On a "Medium"
position 243 and a "High" position 244 the low frequency response
is decreased so that maximum sensitivity and minimum noise is
obtained. As the noise due to yarn vibration, 60 c.p.s. pickup and
most other noises are under, for example, 200 c.p.s. in frequency,
the choice of capacitors allowed by the "frequency cutoff" switch
237 permits discrimination against the noise. As the signal
frequency is normally not less, for example, than 500 c.p.s., and
most often about, for example, 1000 c.p.s., any position of the
switch scarcely affects it. On a "Medium" and "High" position a
slight loss in signal occurs but this is not more than 5 percent
and 10 percent respectively.
After the signal, in the form of a positive pulse, goes through the
emitter follower 221 the "High-Low" switch 230, the sensitivity
adjust 233 and the "Frequency Cutoff" switch 237 it is fed through
two transistor amplifiers 249, 250. These transistors have a great
deal of negative feedback for maximum stability and constant gain.
A biased diode 251 couples the output of the output amplifying
transistor 250 to the base of another amplifier transistor 253. The
coupling diode 251 helps to get rid of all unwanted negative signal
noise and most of the unwanted positive noise, while passing most
of the wanted positive signal. The transistor amplifier 253
amplifies the signal and inverts it so that a comparatively large
negative triggering pulse is applied to the base of a transistor
255 connected to a transistor 257, in a monostable multivibrator
configuration.
The monostable multivibrator circuit is triggered by the negative
pulse from the collector of the transistor amplifier 253 described
above. Once the multivibrator is triggered the pulse amplitude and
duration are determined by the parameters of the multivibrators.
The input pulse itself is merely the triggering factor. The action
of the multivibrator is as follows:
When a negative pulse of sufficient amplitude is fed into the base
of the multivibrator transistor 255 it causes the transistor to
conduct heavily. This increase of current through a resistance 260
will decrease the voltage at the collector of the transistor 255
which will in turn appear as a positive pulse at the base of the
output transistor 257. This positive pulse is sufficient to cutoff
the output transistor 257 deenergizing the output or control relay
142 momentarily opening a contact 262. The opening of the contact
262 deenergizes a stop motion relay 263 which has its operating
coil in the circuit of the contact 262 and which either opens or
closes a stop motion circuit comprising a receptacle 264 to which
the warper is connected. A separate set of contacts 265 on the
control relay 142 operate a counter 267 for counting the defects
and a signal lamp 268 connected to a receptacle 269 as shown. The
time the relay 142 is deenergized is a function of the values of
the resistances 260, a resistance 271 and a capacitor 272 and not a
function of the input pulse. When the resistances 260, 271 and
capacitor 272 allow the circuit to regain equilibrium the
multivibrator is again ready to receive a triggering pulse.
Thus, it will be seen that a positive pulse from the phototube is
adjusted to the correct sensitivity; passed through the frequency
selector; amplified and fed through the noise limiting diode; and
as a noise free negative pulse, used to trigger the input of the
monostable multivibrator; and finally the pulse operates the output
or control relay 142 connected in the collector of the
multivibrator output transistor 257.
FAIL-SAFE
As indicated heretofore fail-safe protection is provided in the
yarn inspector, according to the invention, and operated as
follows:
A fail-safe relay 280 is provided, FIG. 13b, in the control unit
and is normally in an "on" condition. If the yarn inspector is not
turned "on"; or if a fuse blows; or if the line cord is not plugged
in the socket; or if the collector voltage in the regulator 135
decreases, the relay 280 does not "Pull in" and thus opens the
energizing circuit to the stop motion relay 263 and the receptacle
264 to which the warper is connected and prohibits the warper 13
from running and in opening the fail-safe circuit turns off a
fail-safe indicator light 282 on a front panel 285 of the control
unit 24 and in series with a resistance 284 that may be connected
in series therewith. The fail-safe relay 280 obtains its "on"
current through a transistor 286 in the circuit of the relay coil
287. This transistor conducts due to the voltage applied to its
base. This voltage is obtained from the output of the phototube 22
along a lead 289 and through transistor 221. Should this voltage
decrease for any reason, as for example, if the lamp voltage
circuit fails; the lamp burns out; the phototube is nearly dead;
the high voltage circuit fails; transistor 221 or transistor 286
burns out; the compensator circuit fails; the relay will fail to
pull in. This also will keep the energizing circuits to the stop
motion relay open and prohibit the warper from running and turns
off the fail-safe light 282.
HIGH VOLTAGE COMPENSATING CIRCUIT
The high voltage compensating circuit 137 is essentially a feedback
regulator, not unlike the collector voltage regulator 135 and lamp
voltage regulator 133 described previously. The output from the
photomultiplier 22 is directly coupled from the pin G, to the
emitter follower transistor 221, which is connected to two other
emitter follower transistors 292, 293 which together with the
transistor 221 form a feedback circuit. The correct voltage is
obtained from a potentiometer 295 and directly coupled into the
base of a compensator control transistor 297. The emitter of this
control transistor is held at a constant reference voltage by a
zener diode 298. The collector of the control transistor 297 is
connected to the base of a series transistor 299 in the
compensating circuit.
From the foregoing it can be seen that the output voltage of the
compensator circuit is dependent on the input voltage to the base
of the control transistor 297. This input voltage in turn depends
on the output voltage of the photomultiplier 22. If the output
voltage of the tube decreases with time the input voltage to the
control transistor 297 will also decrease. Since the emitter of the
control transistor is held at a constant reference voltage by the
diode 298 the collector output thereof will increase, whereby the
output of the series transistor 299 will increase and compensation
for loss of output voltage of the tube 22 take place. It will be
remembered that the collector voltage to the transistors in the
compensating circuit 137 is provided from the regulator 135 along
its output leads 184, 185.
HIGH VOLTAGE OSCILLATOR CIRCUIT
The output from the compensating circuit series transistor 299 is
fed by a lead 304 into the collector of an oscillator transistor
305 in the high voltage supply and oscillator circuit 138. The
output of this oscillator has a preselected frequency, for example
a frequency of about 7500 c.p.s., and is transformed to a high
voltage by a transformer 306. This high AC voltage is directly
dependent on the collector voltage at the oscillator transistor
305. This means that, depending on the output of the
photomultiplier 22 the oscillator output voltage will vary, for
example, from 200 volts to 400 volts.
The transformer output voltage is applied to a half-wave voltage
doubler rectifier circuit comprising an input capacitor 308 and a
pair of silicon rectifiers 311, 312. This enables obtaining a minus
DC voltage, for example 280 volts to minus 550 volts DC across each
of the rectifiers, or a minus DC voltage for example, 550 to 1000
volts D.C., across a capacitor 315a. The theory of the voltage
doubler is that the input capacitor 308 to the junction 313 of the
two silicon rectifiers 311, 312 charges to the peak supply voltage
so that the voltage fluctuates between zero and twice the peak
supply voltage. The output capacitor 315a, holds the voltage to
twice the peak input voltage, accordingly, the term "doubler"
describes the rectifier circuit. After elimination of AC ripple or
filtering by the capacitor 315a, 315b and a resistor 317 the DC or
(B-) voltage from the rectifier circuit is applied to the
photomultiplier tube along a lead 318 to the base pin E to which
the cathode 210 is connected. The output of the photomultiplier is
dependent on the DC voltage applied. Therefore, as the phototube
decays the action of the compensating circuit, the oscillator and
the half-wave voltage doubler circuit combine to increase the
supply voltage in order to maintain the phototube output the same
at all times and throughout the life of the tube.
The detecting head is provided with a sensitive microammeter 320 in
series with a resistance 321 for visually indicating the output of
the photomultiplier tube 22 which, as indicated heretofore, must be
a steady state current and constantly held steady. In order to
maintain a count on the defects the pulse counter 267, for example
a four digit "Veeder Root" counter, provides visual indication of
the counts and is under control of the control relay 142.
As mentioned heretofore the stop motion circuit and receptacle 264
connect the inspector to the warper in order to stop the warper
under control of the stop motion relay 263. The alternating current
receptacle 269 is connected in and out of circuit with line voltage
applied under control of the relay contact 265.
The above-described circuitry, as mentioned heretofore, is that of
a single level control unit and is also the circuitry of each of
the other embodiments of the control unit hereafter described,
except the length selector, which are primarily modifications of
the basic single level control unit.
DUAL LEVEL ELECTRONIC CONTROL UNIT
The dual level electronic control unit, FIGS. 10, 14a, 14b,
according to the invention, includes a second amplifier 325,
receptive of the output of a compensator 137' and in parallel with
an amplifier 140' which functions similarly to the amplifier 140.
The output of the second amplifier is delivered to a second output
relay 327 functioning in a manner similar to the output relay 142'
which corresponds to the relay 142. It will be understood that in
FIGS. 14a, 14b the component patts 130'--142' and others
corresponding to the single level control unit parts of FIGS. 13a
and 13b bear corresponding reference numerals thereto except they
are primed in order to simplify the disclosure.
The second amplifier 325 is constructed similar to the amplifier
140 heretofore fully described. This means that the inspector dual
level electronic control unit has two sets of controls that permit
settings on the inspector to detect yarn defects on two different
sensitivity levels. The dual level inspector or system is usable to
count all defects, both major and minor. The system is provided
with a major defect counter 267' operably connected to a relay 142'
comparable to the relay 142 in the single level electronic control
unit heretofore described and connected to a stop motion relay 263'
controlling an output receptacle 264' which controls the warper 13.
The warper is under control of the amplifier 140' which detects the
major defects and the warper is made to stop only for major defects
which are then removed from the yarn.
The counting of defects at two sensitivity levels are set on the
control unit as heretofore described with respect to the single
level unit. The dual level control unit is provided with
mechanically interconnected switches 350, 351 connected to the two
control relays for connecting control relay 142' and a minor defect
counter 356 to the system. These switches are operable to an off
position in which the apparatus only counts defects, a second
position in which the stop motion relay 263' operates when a major
defect is detected and in which the minor defect counter simply
counts. The switches are operable to a third position in which the
switches 350, 351, set the apparatus for stop-motion operation in
response to sensing of minor defects and the major defects are only
counted. The switches are operable to a fourth position in which
both counters are in circuit and both minor and major defects are
counted and the stop motion relay 263' is rendered effective by
either major or minor defects detected. As indicated heretofore the
major defect control relay 142' can control the stopping of the
warper 13 and the minor counter 356 can be used in counting minor
defects. In this type of operation the purpose of the minor defect
count is generally to establish quality control information. This
type of electronic control unit is ordinarily used by yarn
producers.
The second amplifier 325 receives the positive pulse generated by
the transducer 22 through a frequency cutoff switch 324 after
passing through a sensitivity control 363, a "High-Low" switch 361
and two mechanically interconnected switches 225' corresponding to
the switch 225 for placing in circuit a receptacle 227' to which a
calibrator unit, hereinafter described, is connected to the system.
The switches 225' are operable to positions in which the receptacle
227' is isolated or otherwise pins thereof placed in circuit with
either of the amplifiers 140' or 325 so the output of the
calibrator can be applied to either of the amplifiers for
calibration thereof as hereinafter described.
After passing through the "High-Low" switch 361 and through a
frequency cutoff switch 364, comparable to the switches 237 and
237' and capable of connecting frequency response control
capacitors in circuit as shown, the signal is applied to two
transistor amplifiers 365, 366. These transistors have a great deal
of negative feedback for maximum stability and constant gain. A
biased diode 368 couples the output of the amplifying transistor
366 to the base of another amplifier transistor 369. The coupling
diode 368 helps to get rid of all unwanted negative signal noise
and most of the unwanted positive noise while passing most of the
wanted positive signal. The last-mentioned transistor amplifier
amplifies the signal and inverts it so that a comparative large
negative triggering impulse is applied to the base of a transistor
370 which is the input transistor of the monostable multivibrator
formed in conjunction with another transistor 371.
The monostable multivibrator circuit is triggered as heretofore
described with respect to the amplifier 140. Once a multivibrator
is triggered the pulse amplitude and duration are determined by the
time constants of the multivibrator. The action of the
multivibrator is as heretofore described.
As indicated heretofore fail-safe protection is provided in the
yarn inspector in the dual level electronic control unit
arrangement. A fail-safe relay 280' is provided in the dual level
control unit comparable to the relay 280 heretofore described. The
relay 280' obtains its "on" current through a transistor 286' and
the control relay 327 obtains its "on" current from a circuit 371
in the circuit of the respective relay coils. The transistor 286'
conducts due to the voltage applied to the base thereof. Should
this voltage decrease for any reason, for example for the reasons
described with respect to the single level control unit, the
fail-safe relay 280' will prohibit the warper from running and turn
off a fail-safe light 282' in series with a resistance 284' which
may or may not be used.
The dual level control unit is provided with an ACO connector 268'
and an AC receptacle 269' connected to the power supply 130'
through a lead 378 and to the major counter 267' as shown so that a
signal is applied thereto only when major defects are being
detected. The unit is connected to the regulator 135' through a
lead 379 and to the compensator 137' through a lead 380.
LENGTH SELECTOR AMPLIFIER
As stated heretofore the length selector amplifier provides
detection of defects according to their length and diameter. The
length selector will first be described as to its mode of operation
and then described as applied to the single level and dual level
control units. The mode of operation of the length selector is as
follows:
The length selector 400 comprises, FIGS. 15 and 16, an input
sensitivity control 405 to which the output signal, comprising
pulses, of the photomultiplier is applied. From the sensitivity
control the signal, FIG. 15, is applied to an amplifier 406 and
then to a biased diode 408 to produce a comparatively noise-free
signal. This signal is fed into a saturated amplifier 409 that will
saturate so that the output is essentially constant over an
extremely wide range of inputs. From this amplifier the signal is
applied to an indicating circuit 410 which causes a neon indicator
light 413 to blink in the event the signal and/or noise is large
and over a predetermined limit. The signal from the saturated
amplifier is also applied to a storing and a first integrating
circuit 415 where it is integrated and is substantially applied to
an emitter follower and amplifier 417 and fed into another emitter
follower and integrating network 419. The output at this point is a
direct function of defect length, rather than defect amplitude. The
output is adjustable, by a length adjust circuit 420 as hereinafter
explained, so that any length defect, for example up to ten or
twelve inches in length may be discriminated against. In operation
this means the equipment may be set to detect any length of defect,
for example from one-half inch and over. The maximum length the
inspector will discriminate against is about ten to twelve inches
depending on the warping speed.
The signal is applied from the length adjust circuit to a
transistor monostable multivibrator 422 triggered by the signal and
which permits a control relay 425 to function.
The output of the photomultiplier 22, for example, is fed, FIG.
13a, 13b, into the base of the emitter follower transistor 219 and
then to the emitter follower transistor 221. From the emitter of
the transistor 221 the signal is applied, FIG. 16, to the input
sensitivity control 405 which is in the form of a potentiometer and
permits a given amount of signal and noise to be fed to the base of
a transistor 406 connected as an amplifier. From the collector of
the transistor 406 the signal and associated noise is applied to a
biased diode 408 which eliminates all of the positive signal and
noise, most of the negative noise and some of the negative signal.
This is accomplished by varying a noise adjust control or
potentiometer 457 which varies the amount of bias it and a pair of
resistances 358, 359, permit to be applied to the biased diode 408
thereby controlling the amount of noise passed through this
circuit. Thus, the noise that passes through the biased diode 408
will be too small to affect the rest of the circuit. The signal
then goes to the base of a transistor 409, which forms the
saturated amplifier, and is amplified until saturation occurs, so
that all defects over the size chosen by the setting of the input
sensitivity control 405 and the noise adjust control 457 will
produce the same pulse amplitude at the output, the collector of
the amplifier 409. It will be understood that the saturated
amplifier is connected with biasing resistances and a feedback
loop, as shown. These pulses of constant amplitude, with any small
amount of noise remaining, goes to a diode 462 which acts as a DC
restorer, and to a .01 capacitor 464 which is the pulse storer of
the circuit 415.
The signal and noise is also applied to the base of a transistor
467 which is capacitance coupled by a capacitor 468 to a second
transistor 469 which jointly therewith forms the indicating circuit
410 which controls the noise indicator lamp 413. When the signal
and/or noise is large enough the pair of transistors in the
indicating circuit will allow the noise indicator lamp to blink.
From the pulse storer 464 a modified pulse is fed into the first
integrating circuit 415 which comprises a pair of resistances 471,
472 and a capacitor 473. The integrating circuit and the pulse
width (length of defect), which is adjusted as hereafter explained,
determine the amplitude of the input to the base of an emitter
follower transistor 475 connected to buffer the integrating circuit
from an amplifier transistor 476 which has a low impedance input
and which together with the buffer form the circuit 417. After the
amplifier 476 the remainder of the length selector circuitry is
directly coupled since the signal at this point is a DC pulse.
Three transistors 480, 481, 482 are connected directly coupled to
the amplifier as emitter followers. The second integrating circuit
419 consists of a resistor 485 and a capacitor 486 further refines
the pulse. The length of the defect selection desired is obtained
from a length selector potentiometer 490 connected to the emitter
of the emitter follower transistor 481. At this point, the length
of the defect is directly related to the output voltage.
Accordingly, the higher the setting of the length selector
potentiometer, the smaller the defect length the yarn inspector
will detect; the lower the setting, the longer the defect length
detected.
The output from the potentiometer 490, which is a part of the
circuit 420, is fed into transistor 482 and then to the base of
input transistor 492 of the monostable multivibrator 422 which
jointly with an output transistor 493 capacitance coupled thereto
by a capacitor 495 forms the multivibrator. This output is a
comparatively large negative signal and since the monostable
multivibrator circuit is identical to that of the single and dual
level yarn inspector electronic control units heretofore described
the input to the base of the output transistor 493 will cut that
transistor off, permitting the control relay 425 to operate. The
relay is provided with contacts which can be connected to a stop
motion circuit, a counter, and a fail-safe circuit, and as
hereafter described with respect to the two basic types of control
units.
SINGLE LEVEL WITH LENGTH SELECTOR
As indicated heretofore the invention provides electronic control
units which include an additional dimension of detection, namely,
the length of the defect. An embodiment of a single level
electronic control unit with a length selector, FIGS. 11, 17a, 17b,
and 17c, having the additional dimension of detection can detect
defects as to amplitude, as heretofore described and as to length.
This unit enables the user to allow knots and short defects to pass
by undetected, yet to catch longer defects which may be smaller in
size or amplitude. The unit is used for detection, for example
filament loops, slack filaments and long tapering defects.
In a single level electronic control unit with a length selector,
FIG. 11, the circuitry is the same as described with respect to the
single level control unit with the exception of the fact that a
length selector amplifier 400 and output relay 425, described with
respect to FIG. 16, are added thereto. In order to simplify the
description and drawings, the same reference numerals applied to
the single level control unit and to the description of the length
selector, FIG. 16, are used in the description of the two combined
into a single level with length selector unit. Thus, the power
supply 130 having a line input 131 is connected to the voltage
regulator 135 and to the lamp voltage regulator 133. The lamp
voltage regulator supplies power to the lamp 20 and the voltage
regulator 135 to the compensator 137, as heretofore described. The
loop circuit between the high voltage supply and oscillator circuit
138 and a photoelectric transducer 22 and the compensator 137 is
provided. The amplifier 140 is connected to the output or control
relay 142 and a stop-motion relay 263 is provided. The output relay
425 of the length selector is likewise connected to the stop-motion
relay, as hereafter described.
The details of the circuitry of the amplifier 140 in conjunction
with the length selector amplifier 400 and the manner in which they
are connected is illustrated in FIGS. 17a, 17b, and 17c. It being
understood that the circuitry of the blocks illustrated in FIG. 11,
is the same as heretofore described except to the extent that will
be described hereafter with respect to FIG. 17. The length selector
amplifier 400 when used in conjunction with the single level
selector is illustrated in detail in FIGS. 17b and 17c wherein the
reference numerals corresponding to the discussion with respect to
FIG. 16 are employed. The length selector amplifier circuits are
the same and the indicating circuit 410 is connected in the same
manner as heretofore described except that the light 413, acting as
a noise indicator, is illustrated as being connected on the front
panel of the control unit. The input sensitivity adjust 405, the
noise adjust 457 and the length selector 490 are likewise
illustrated as being mounted on the front panel 285 of the control
unit and are thus illustrated as being disposed in the unit or on
the panel. A half-wave rectifier power supply 500 connected to the
power supply through leads 501 is provided for receiving an AC
input and rectifying it and applying it to the indicating device
through connections to the noise indicating circuit 410.
The unit is provided with the control relay 142 and the fail-safe
280 which control a supply of a signal to the receptacle 269, and
ACO connector 268 and the fail-safe lamp 282, as heretofore
described. The control relay 142 and the output relay 425 of the
length selector control the stop-motion relay 263 which controls
the stop-motion output receptacle 264. The fail-safe relay is
likewise connected to the stop-motion relay for carrying out
stop-motion, as heretofore described, with respect to the single
level control unit.
The control unit is provided with the "High-Low" sensitivity
control switch 230, the sensitivity adjust potentiometer 233 and
the frequency cutoff switch 237. Since in this unit both a single
level amplifier and a length selector amplifier are used provision
is made for connection of two external calibrators for calibrating
the amplifiers through the plug or receptacle 227. However, the
rotary switch 225 illustrated in FIG. 13 in the single level unit
is replaced by a two pole three-throw rotary switch 505, 506. The
input sensitivity adjust 405 of the length selector amplifier is
connected to the rotary switch pole 506. This switch is operable to
three positions: a first position in which the plug 227 for the
calibrators is out of circuit with the unit and the output of the
transducer is applied to the yarn inspector amplifier 140 and to
the input sensitivity adjust 405 of the length selector amplifier
through the switch connections 505, 506. A second position in which
a yarn inspector calibrator, hereafter described, for the amplifier
140 can be connected to this amplifier for calibration thereof, and
a third position in which a length selector calibrator, not shown,
for the length selector amplifier is connected thereto for
calibrating this last-mentioned amplifier. The switch 505, 506 is
illustrated in its first position.
The unit is provided with the major defect counter 267 comparable
to the counter in the single level control unit and an additional
counter 507 for counting the defects detected as to length is
connected to the control relay 425 and the major defect counter,
and the control relays 142, 425 as illustrated. In order to provide
for selection of the operation to be carried out by the control
unit a four pole four-throw switch 510 is provided. The switch is
operable to four positions comprising a first position in which the
stop motion relay is inoperable. In the second position the
apparatus is set so that the stop motion relay is inoperable when
an amplitude defect is detected only in which case the apparatus
functions comparable to the single level unit. In the third
position the additional dimension of sensing by length is
established and the apparatus functions to detect defects solely by
length and allows the warper to stop for these defects. The switch
is operable to a fourth position in which case the unit operates to
detect both as to amplitude and length and carry out stop motion in
response to long tapering defects and those of a selected diameter
or amplitude.
The amplifiers are connected to the compensator through lead 517
and to the transducer output through lead 517. An amplifier input
test point 520 is provided.
DUAL LEVEL WITH LENGTH SELECTOR
Another embodiment of the electronic control unit, FIGS. 12, 18a,
18b, 18c and 18d, according to the invention, is substantially the
same as the dual level arrangement, heretofore described, but
includes an additional dimension of detection, namely the length of
the defect. In this control unit the length selector is combined
with the dual level arrangement in a manner comparable to the
combination with the single level arrangement heretofore described.
By means of the dual level with length selector control unit both
major and minor defects may be detected on the same basis of not
only size but also length. This unit enables the user to allow
knots and short defects to pass by undetected, yet to catch longer
defects which may be smaller in size. The unit is used for
detection, for example of filament loops, slack filaments and long
tapering defects. Thus, the dual level control unit which provides
detection for defects only, according to the diameter or amplitude,
is modified in the arrangement to detect also by length of
defect.
The electronic unit, according to this arrangement, includes the
basic circuitry heretofore described with respect to the dual level
control unit and the length selector heretofore described and
illustrated in FIG. 16. In this unit as heretofore in FIG. 12, the
block diagram of the circuitry includes all of the blocks
illustrated in FIG. 10. A third amplifier comprising the length
selector amplifier 400 is connected to the compensator 137' and in
parallel with the amplifiers 140' and 325. The length selector
amplifier has its output delivered to the third output relay 425 to
control devices, as heretofore explained with respect to relays
142' and 327.
It will be understood and remembered that in order to simplify the
drawings and discussion the components of this electronic unit have
the reference numerals of the dual level control unit and the
length selector heretofore described.
The block diagram in FIG. 12 illustrates the use of a YI (yarn
inspector) calibrator and length selector calibrator 900 as
attached to the dual level control unit with length selector. The
YI calibrator is used to calibrate the amplifiers 140, 325 of the
unit and is described in detail hereinafter. The length selector
calibrator 900 is used to calibrate the length selector amplifier
400 and is not described herein.
The detailed circuitry of the manner in which the length selector
amplifier 400 is connected to the dual level control unit to form a
dual level with length selector control unit as illustrated in
FIGS. 18a-.about.d. The three amplifiers are connected to the
compensator 137' through a lead 552. The unit comprises dual level
adjustments heretofore described with respect to the dual level
control unit. Thus, the unit comprises the "High-Low" sensitivity
switch 230' connected to receive the transducer output as hereafter
described, the sensitivity adjust potentiometer 233' and the
frequency cutoff rotary switch 237' all of which are connected to
the NO. 1 amplifier 140'.
The second level adjustment means connected to the No. 2 amplifier
325 comprise the "High-Low" sensitivity switch 361', the
sensitivity potentiometer 363', and frequency cutoff rotary switch
364 functioning as heretofore explained with respect to the dual
level unit. The calibrator switch 350 illustrated with reference to
the dual level unit is modified in this embodiment and its
functions are carried out by a three pole-four-throw calibrator
switch 555 operable to four positions. In a first position, the
position illustrated in the drawing, the external calibrator plug
227' is not connected to the control unit and the transducer output
is applied to the sensitivity adjustment means of both amplifiers.
In this first position the transducer output is also applied
through the switch to the length selector sensitivity adjust 405.
This adjust is mounted on the front panel of the unit.
It will be remembered that provision is made for calibrating the
three amplifiers of the unit and external calibrator units are
connectable to the unit through the plug 227'. Accordingly, in the
second position an output of the yarn inspector calibrator, to be
hereinafter described, is applied to the No. 1 amplifier 140' and
in its third position the output is applied to the No. 2 amplifier
325 for calibrating it. In its fourth position the output of the
length selector calibrator 900 is applied to the length selector
amplifier 400. It is to be understood that the unit functions to
detect defects only in the first position of the calibrator switch
555 illustrated and that in the other positions the warper is
stopped and the unit is receiving inputs from the calibrator
simulating defects in order to calibrate the unit.
The unit is provided with the fail-safe relay 280' controlling the
fail-safe lamp 282' and the ACO connector 268' and the AC signal
receptacle 269' are controlled as described above. An DC input
through leads 559 is applied to a half-wave rectification circuit
560 providing a DC supply to the indicating circuit 410 of the
length selector.
Each of the amplifiers has its respective control or output relays
142', 327 and 425. The stop-motion relay 263' in this unit controls
the stop-motion output receptacle 264'. The stop-motion relay can
be actuated by the fail-safe relay 280' or any one of the control
relays 142', 327 and 425 when the control unit is set to operate
and detect defects to which the control relays respond as hereafter
explained.
This unit can detect major and minor defects sensed and detected as
to their amplitude and long tapering defects. Provision is made for
counting these defects in counters 267', 356 and 563 respectively.
A switching arrangement, switches 565, 566, 567, is provided for
allowing various combinations of the control relays to permit
detection of defects in various combinations of amplitudes and
lengths and to provide stop-motion control in response to these
various combinations.
Accordingly, when the switch 565 is on its "on" position warper
stop-motion control is under the control of the control relay 142'
associated with the No. 1 amplifier detecting major defects. It
being understood that the other switches 566, 567, are in an "off"
position as illustrated in this case. With the switch 566 only in
an "on" position the control relay 327 controls the stop-motion
relay 263' and warper stop-motion is in response to minor defects
or defects of a lesser amplitude. With only the third switch 567 in
an "on" position the stop-motion relay is under the control of the
length selector control relay 425 and warper stop-motion is in
response to long tapering defects of a predetermined length
adjustably set in the length selector as described in detail
heretofore.
It is apparent that either one of the switches 565, 566 can be set
on an "on" condition with the third switch 567 on an "on" condition
in which case stop-motion control is carried out in response to
defects of a given amplitude and in response to defects of a given
length. Moreover, each type of defect is counted regardless of the
combination set for warper stop-motion control.
LENGTH SELECTOR CONTROL UNIT
According to the invention the control unit can be constructed to
carry out warper stop-motion control in response only to the length
of defects. In such a construction the control unit, FIG. 21,
comprises a power supply 630 having a line input 631 provides power
to a voltage regulator 635 and a lamp voltage regulator 633
connected to a lamp 20. The voltage regulator 635 is connected to a
compensator 637. The output of the regulator 635 is provided to the
length selector amplifier 400 and an output relay 425 controls the
stop motion relay 263. The same loop is provided between the
compensator 637 and a high voltage supply and oscillator circuit
638 and the phototube 22.
In this arrangement the circuitry corresponding to each of the
blocks is that of the basic circuitry heretofore described with
respect to the other control units. This control unit will respond
solely to the length of defect established by the length
selector.
CALIBRATOR
Each type of control unit is provided with a receptacle 227, 227',
as heretofore mentioned, into which can be plugged an auxiliary
electronic calibrator and sensitivity checking device 700. This
device, FIGS. 22 and 23, is automatically actuated every time the
warper stops for any reason whatever and it indicates whether or
not the yarn inspector is performing properly at the sensitivity
for which is was set. Failure of the electronic control unit to
operate properly at the present sensitivity is indicated by a light
282, 282'. This device in conjunction with the fail-safe built into
the individual control units guarantees complete protection against
malfunction of the yarn inspector. In order to simplify the
drawings the calibrator 700 is shown connected only in the control
unit shown in FIG. 12, however, the calibrator is usable with the
other electronic units disclosed.
The electronic calibrator 700 produces pulses of a predetermined
size to simulate the defects seen by the phototube in the detecting
head. It should be remembered, that the calibrator 700 is
calibrating (and/or monitoring as will be described later), the
electronic control unit only and not the detecting head of the yarn
inspector. The standard calibrator has a plurality for example ten,
simulated defect sizes that may be chosen merely by turning a
precise selection switch later described. These standard sizes are,
for example, 1 percent, 2 percent, 3 percent, 4 percent, 6 percent,
8 percent, 10 percent, 12 percent, 15 percent, and 20 percent,
other sizes may be obtained. All of the above sizes are obtained by
use of 1 percent resistors, using extremely stable multivibrator
circuits, and voltage regulator zener diodes. However, taking all
possible errors into account, including mill conditions, the
simulated defect sizes may be off by as much as 10 percent from the
actual size defect. Therefore, a 1 percent simulated defect may
actually be 0.9 percent. A 20 percent defect may actually be only
18 percent. The output of the calibrator has been designed to
remain constant over an extremely long period of time. The
calibrator functions as follows:
A power supply 704 connectable to line voltage and having a zener
diode regulated output provides the voltage for the calibrator.
This supply has a switch 706 to apply line voltage to an isolation
stepdown transformer 707 having its secondary output connected to a
full wave bridge rectification circuit 709. A pilot light 710
indicates in the usual manner when the device is on. A Pi-type
filter comprising a pair of capacitors 711, 712 and a resistor 713
reduces the AC ripple from the rectifier to a negligible amount. In
order to maintain the output voltage constant, a zener diode
regulator 715 is connected across the output. This constant supply
voltage is supplied to the rest of the calibrator circuit.
The calibrator proper comprises an astable multivibrator 717 formed
by a pair of transistors 718, 719. This multivibrator has a
positive feedback built into the circuit so that the transistors
will oscillate at a value or free-running frequency determined by
the circuit time constant which is determined by combinations of a
plurality of capacitors 720, 721, 723 and a plurality of resistors
725--728 whose values are so chosen that a preselected pulse width,
for example, of about 0.2 seconds, and preselected repetition rate,
or frequency for example of 0.5 seconds, is thus obtained. The
output from the astable multivibrator is fed into a differentiating
circuit 730 comprising a resistor 732 and a capacitor 733. This
circuit "sharpens" the pulse from the astable multivibrator so that
it can be used to fire a monostable multivibrator 735 and not have
any further influence upon this monostable multivibrator.
A pair of transistors 737, 738 are connected as the monostable
multivibrator configuration. The sharpened negative pulse upon
leaving the differentiating circuit 730 causes the multivibrator
input transistor 737 to conduct heavily which in turn produces a
pulse of a given size and width depending only on the monostable
multivibrator time constants. These time constants are determined
by a combination of resistances 740, 741 and a capacitor 742. The
frequency or repetition rate of the pulse from the monostable
multivibrator is dependent upon the repetition rate of the astable
multivibrator which supplies the triggering pulse. It has been
found that to best simulate actual mill conditions a somewhat
rounded pulse is best, for example a pulse of 0.001 seconds every
half second.
The output of the monostable multivibrator is applied to a pulse
shaping network 750 consisting of a diode 751, a resistor 752 and a
capacitor 753. This network forms the desired pulse shape. The
pulse from the shaping network is applied to the base of an emitter
follower transistor 757 to the output of which is connected a zener
diode voltage regulator 760, therefore, whatever the input to the
base of the transistor 757 over a selected level, for example, 3.9
volts the output is maintained at the selected level. The
calibrator is provided with a precision switching arrangement
comprising a potentiometer 762 and a rotary switch 763 for placing
in circuit a plurality of series resistances 765 each of a selected
value for controllably establishing a pulse simulating any defect
size that may be obtained or detected by the yarn inspector. A
switch 767 provides a bypass for a resistance 768 also providing
greater precision adjustment.
The switch is connected to a calibrator relay 769. When the
calibrator is connected from a receptacle, for example the
receptacle 227, connections are established through the five pin
base socket 789 so that if the calibrator is plugged into a yarn
inspector electronic control unit and left in it will be
automatically placed in circuit by the calibrator relay 769 when
the warper is stopped and will not operate while the warper is
operating. A receptacle 780 is shortened when the warper is running
and open when it is stopped to allow the predetermined calibrator
output signal to enter the control unit and this checks or
calibrates the control unit. Plug connections 788, 789 are provided
for connecting the unit to various models of the control units and
a plug connection 790 is provided for connection to a length
calibrator, not shown. Thus, in dependence upon the setting of the
switch 763 a predetermined signal will automatically be fed into
the yarn inspector causing the fail-safe light on the front panel
of the control unit to blink. If this blinking occurs, the
amplifier of the control unit is working correctly, if no blinking
occurs then there has been a loss in output in the amplifier and it
should be corrected. Thus, the calibrator can be used to calibrate
the yarn inspector and to continuously, if left plugged into the
control unit, check the sensitivity level.
While preferred embodiments of the yarn inspector, according to the
invention, have been shown and described it will be understood that
many modifications and changes can be made within the true spirit
and scope of the invention.
* * * * *