U.S. patent number 10,483,066 [Application Number 15/618,381] was granted by the patent office on 2019-11-19 for fault circuit interrupter device.
This patent grant is currently assigned to Leviton Manufacturing Co., Inc.. The grantee listed for this patent is Leviton Manufacturing Co., Inc.. Invention is credited to Kurt Dykema, Michael Kamor, James Porter.
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United States Patent |
10,483,066 |
Kamor , et al. |
November 19, 2019 |
Fault circuit interrupter device
Abstract
In one embodiment, there is a fault interrupter device
comprising at least one sensor comprising at least one first
transformer having at least one outer region forming an outer
periphery and at least one inner hollow region. There is also at
least one second transformer that is disposed in the inner hollow
region of the at least one first transformer. The transformers can
be substantially circular in configuration, and more particularly,
ring shaped. In another embodiment there is a rotatable latch which
is used to selectively connect and disconnect a set of separable
contacts to selectively disconnect power from the line side to the
load side. The rotatable latch is in one embodiment coupled to a
reset button. In at least one embodiment there is a slider which is
configured to selectively prevent the manual tripping of the
device.
Inventors: |
Kamor; Michael (North
Massapequa, NY), Porter; James (Farmingdale, NY), Dykema;
Kurt (Holland, MI) |
Applicant: |
Name |
City |
State |
Country |
Type |
Leviton Manufacturing Co., Inc. |
Melville |
NY |
US |
|
|
Assignee: |
Leviton Manufacturing Co., Inc.
(Melville, NY)
|
Family
ID: |
41507696 |
Appl.
No.: |
15/618,381 |
Filed: |
June 9, 2017 |
Prior Publication Data
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Document
Identifier |
Publication Date |
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US 20170323752 A1 |
Nov 9, 2017 |
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Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
Issue Date |
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14666628 |
Mar 24, 2015 |
9679731 |
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14031756 |
Jun 9, 2015 |
9053886 |
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12986016 |
Nov 19, 2013 |
8587914 |
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PCT/US2009/049840 |
Jul 7, 2009 |
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61078753 |
Jul 7, 2008 |
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61080205 |
Jul 11, 2008 |
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Current U.S.
Class: |
1/1 |
Current CPC
Class: |
H01H
71/10 (20130101); H01H 71/02 (20130101); H01H
73/00 (20130101); H01H 71/66 (20130101); H01H
71/04 (20130101); H01H 73/12 (20130101); H01H
71/125 (20130101); H01H 83/144 (20130101) |
Current International
Class: |
H01H
71/10 (20060101); H01H 71/66 (20060101); H01H
71/04 (20060101); H01H 71/02 (20060101); H01H
73/12 (20060101); H01H 73/00 (20060101); H01H
71/12 (20060101); H01H 83/14 (20060101) |
References Cited
[Referenced By]
U.S. Patent Documents
Primary Examiner: Bauer; Scott
Attorney, Agent or Firm: Carter, DeLuca & Farrell
LLP
Parent Case Text
CROSS REFERENCE TO RELATED APPLICATIONS
This application is a continuation of U.S. patent application Ser.
No. 14/666,628, filed Mar. 24, 2015, now U.S. Pat. No. 9,679,731,
which is a continuation of U.S. patent application Ser. No.
14/031,756, filed on Sep. 19, 2013, now U.S. Pat. No. 9,053,886,
which is a divisional application of U.S. patent application Ser.
No. 12/986,016, filed on Jan. 6, 2011, now U.S. Pat. No. 8,587,914,
which is a continuation application of International Application
Serial No. PCT/US2009/049840, filed on Jul. 7, 2009, wherein the
international application is a non-provisional application and
hereby claims priority from U.S. Provisional Patent Application
Ser. No. 61/078,753 to Dykema et al filed on Jul. 7, 2008, and
provisional application Ser. No. 61/080,205 to Michael Kamor filed
on Jul. 11, 2008 wherein the disclosure of all of these
applications are hereby incorporated herein by reference in their
entirety.
Claims
What is claimed is:
1. A circuit interrupting device comprising: a. a first pair of
electrical conductors including a phase conductor and a neutral
conductor, the first pair of electrical conductors adapted to
electrically connect to a source of electric current; b. a second
pair of electrical conductors including a phase conductor and a
neutral conductor; c. a third pair of electrical conductors
including a phase conductor and a neutral conductor, the third pair
of electrical conductors adapted to electrically connect to at
least one user accessible receptacle, wherein the first, second,
and third pairs of electrical conductors are capable of being
electrically isolated from each other; d. a reset button; e. a
single latch rotatable between a reset position wherein electrical
continuity is provided between the respective phase and neutral
conductors of the first pair of electrical conductors and at least
one of the second and third pairs of electrical conductors, and a
trip position wherein at least one of the phase or neutral
electrical conductors of each of the first, second, and third pairs
of electrical conductors are electrically isolated from one
another, the single latch being physically coupled to the reset
button in both the reset position and the trip position; and f. a
circuit interrupter configured to engage the single latch upon the
occurrence of a fault to cause the single latch to rotate from the
reset position to the trip position.
2. The circuit interrupting device of claim 1, wherein the single
latch is disposed between the phase conductors and the neutral
conductors.
3. The circuit interrupting device of claim 2, wherein when the
reset button is depressed by a user, the reset button causes the
single latch to establish electrical continuity between the phase
and neutral conductors of the first pair of electrical conductors
and the corresponding phase and neutral conductors of at least one
of the second and third pairs of electrical conductors upon release
of the reset button by the user.
4. The circuit interrupting device of claim 3, wherein when the
reset button is depressed, the circuit interrupter is configured to
energize upon successful completion of a test cycle and enable the
single latch to establish electrical continuity between the phase
and neutral conductors of the first pair of electrical conductors
and the corresponding phase and neutral conductors of at least one
of the second and third pairs of electrical conductors.
5. The circuit interrupting device of claim 1 further comprising a
first sensor and a second sensor, the first sensor circumscribing
an inner region, wherein the second sensor is at least partially
nested within the inner region circumscribed by the first sensor,
and wherein at least one of the first and second sensors is
electrically coupled to the circuit interrupter.
6. The circuit interrupting device of claim 1 further comprising a
lifter and a latch plate, wherein in the reset position the single
latch is engaged with the latch plate and the latch plate is
engaged with the lifter and in the trip position the single latch,
the latch plate, and the lifter are disengaged.
7. The circuit interrupting device of claim 6, wherein in the reset
position, the lifter is configured to engage the first pair of
electrical conductors to provide electrical continuity between the
phase and neutral conductors of the first pair of electrical
conductors and the corresponding phase and neutral conductors of at
least one of the second and third pairs of electrical
conductors.
8. A circuit interrupting device comprising: a. a housing; b. a
reset button at least partially in the housing; c. a first pair of
electrical conductors including a phase conductor and a neutral
conductor, the first pair of electrical conductors adapted to
electrically connect to a source of electric current; d. a second
pair of electrical conductors including a phase conductor and a
neutral conductor; e. a third pair of electrical conductors
including a phase conductor and a neutral conductor and positioned
to electrically connect to at least one user accessible receptacle,
wherein the first, second, and third pairs of electrical conductors
are capable of being electrically isolated from each other; f. a
latch physically coupled to a central portion of the reset button
and having a reset position in which electrical continuity is
provided between the phase and neutral conductors of the first pair
of electrical conductors and the corresponding phase and neutral
conductors of at least one of the second and third pairs of
electrical conductors, and a trip position in which the first,
second, and third pairs of electrical conductors are electrically
isolated from one another, the latch being physically coupled to
the central portion of the rest button in both the reset position
and the trip position; and g. a circuit interrupter configured to
be energized upon the occurrence of a fault to engage the latch and
cause the latch to rotate from the reset position to the trip
position.
9. The circuit interrupting device of claim 8 further comprising a
trip slider having a non-electrical trip indicator in the
housing.
10. The circuit interrupting device of claim 9 further comprising a
test button, the test button causing the first, second, and third
pairs of electrical conductors to become electrically isolated from
one another upon the test button being depressed by a user, wherein
the trip slider is configured to be movable to a second position
from a first position upon actuation by the test button, wherein
the trip slider is moved to the second position by rotational
movement of the latch.
11. The circuit interrupting device of claim 10, wherein the trip
slider comprises at least one ramp surface, the trip slider
positioned relative to the test button when in the first position
such that the test button interfaces with the ramp surface upon
actuation of the test button, causing the trip slider to move to
the second position.
12. The circuit interrupting device of claim 10, wherein the trip
slider in the trip position inhibits actuation of the test
button.
13. The circuit interrupting device of claim 8 further comprising a
lifter, wherein the latch engages the lifter in the reset position
and disengages from the lifter in the trip position.
14. The circuit interrupting device of claim 8, wherein the circuit
interrupter includes a solenoid and a plunger.
15. The circuit interrupting device of claim 8, wherein the first
pair of electrical conductors are line conductors, the second pair
of electrical conductors are load conductors, and the third pair of
electrical conductors are face conductors, and wherein the housing
includes a front face, and wherein the first, second, and third
pairs of electrical conductors are positioned at different
distances with respect to the front face when in a first position,
and wherein at least two of the first, second, and third pairs of
electrical conductors are positioned at a substantially same
distance with respect to the front face when in a second
position.
16. A circuit interrupting device comprising: a. a first pair of
electrical conductors including a phase conductor and a neutral
conductor, the first pair of electrical conductors adapted to
electrically connect to a source of electric current; b. a second
pair of electrical conductors including a phase conductor and a
neutral conductor; c. a third pair of electrical conductors
including a phase conductor and a neutral conductor and positioned
to electrically connect to at least one user accessible receptacle,
wherein the first, second, and third pairs of electrical conductors
are capable of being electrically isolated from each other; d. a
first set of contacts and a second set of contacts coupled to one
of the first, second and third pairs of electrical conductors; e. a
reset button; f. a latch disposed between the first set of contacts
and the second set of contacts, the latch rotatable between a reset
position in which electrical continuity is provided between the
phase and neutral conductors of the first pair of electrical
conductors and the corresponding phase and neutral conductors of at
least one of the second and third pairs of electrical conductors,
and a trip position in which the first, second, and third pairs of
electrical conductors are electrically isolated from one another,
the latch being physically coupled to the reset button in both the
reset position and the trip position; and g. a circuit interrupter
configured to be energized upon the occurrence of a fault to engage
the latch and cause the latch to rotate from the reset position to
the trip position.
17. The circuit interrupting device of claim 16, wherein the first
pair of electrical conductors are line conductors, the second pair
of electrical conductors are load conductors, and the third pair of
electrical conductors are face conductors.
18. The circuit interrupting device of claim 16 further comprising:
a. a test button; and b. a trip slider movable to a second position
from a first position upon actuation by the test button, wherein
the second position of the trip slider causes the latch to rotate
to the trip position.
19. The circuit interrupting device of claim 16 further comprising
a first sensor and a second sensor, the first sensor circumscribing
an inner region, wherein the second sensor is at least partially
nested within the inner region circumscribed by the first sensor,
and wherein at least one of the first and second sensors is
electrically coupled to the circuit interrupter.
20. The circuit interrupting device of claim 19, wherein at least
one of the first and second sensors is a differential transformer,
and wherein the other of the first and second sensors is a grounded
neutral transformer.
21. The circuit interrupting device of claim 16 further comprising
a lifter, wherein the latch engages the lifter in the reset
position and disengages from the lifter in the trip position.
Description
BACKGROUND
Electrical devices such as fault circuit interrupters are typically
installed into a wall box. Wall boxes which can also be called
electrical boxes are typically installed within a wall and are
attached to a portion of the wall structure, such as vertically or
horizontally extending framing members.
Typically, the depth of the wall box is constrained by the depth of
the wall and/or the depth of the wall's framing members. Electrical
wiring is typically fed into a region of the wall box for
electrical connections to/from the electrical device(s) resulting
in a portion of the wall box's volume/depth being utilized by this
wiring, while the remaining volume/depth of the wall box is
utilized by an installed electrical device. Since normal
installation of electrical devices is typically constrained by the
distance in which they may extend beyond the finished wall surface,
the greater the depth of the housing of the electrical device, the
harder it is to fit an electrical device within the constraints
posed by the electrical wall box and the finished wall surface.
Wall boxes are typically configured to receive two electrical
connections, one for line and the other for load, each containing a
hot/phase wire, a neutral wire and a ground wire, for a total of
five or even six wires being fed/connected into the wall box.
In many cases, circuit interrupters are incorporated into single
gang electrical devices such as duplex receptacles, a switch or
combination switch receptacles.
Single gang electrical enclosures, such as a single gang wall
boxes, are generally enclosures that are configured to house
electrical devices of particular heights, widths and depths. In
many cases, single gang metallic boxes can vary in height from
27/8'' to 37/8'' and in width from 1 13/16'' to 2'', while single
gang non-metallic boxes can vary in height from 2 15/16'' to 3
9/16'' and in width from 2'' to 2 1/16''. Therefore, for purposes
of this disclosure, a standard single gang box would have a width
of up to 21/2 inches. A non standard single gang box would have a
width of even larger dimensions up to the minimum classification
for a double gang box, and any appropriate height such as up to
approximately 37/8''. It is noted that the width of a double gang
box is 3 13/16 inches according to NEMA standards. See NEMA
Standards Publication OS 1-2003 pp. 68, Jul. 23, 2003.
Due to the space restraints, and because of the complexity of
electrical designs of fault circuit interrupter designs in general
(i.e., circuit interrupters typically include a number of
electrical components), circuit interrupter designs based upon the
present state of the art do not allow for much reduction in the
depth of the device.
SUMMARY
One embodiment relates to a fault interrupter device having at
least two nested transformers or sensors wherein the second
transformer is disposed at least partially in an inner hollow
region of a first transformer.
In this case, in at least one embodiment there is a device
comprising at least one first transformer having at least one outer
region forming an outer periphery and at least one inner hollow
region. There is also at least one second transformer that is
disposed in the inner hollow region of the at least one first
transformer. In at least one embodiment, the transformers can
include at least one of a differential transformer and a
grounded/neutral transformer.
In addition, another embodiment can also relate to a process for
reducing a depth of a fault circuit interrupter device. The process
includes the steps of positioning at least one transformer inside
of another transformer; such that these transformers are positioned
on substantially the same plane. Alternatively, each of the
transformers or sensors can be positioned on planes that are offset
from one another wherein the transformers or sensors are not
necessarily entirely nested, one within the other.
Thus, one of the benefits of this design is a fault circuit
interrupter having a reduced depth while still leaving additional
room for wiring the device in a wall box, and for additional wiring
components such as wire connectors.
In addition, in at least one embodiment there is a fault
interrupter device for selectively disconnecting power between a
line side and a load side. In this case, the interrupter device
comprises a housing, and a fault detection circuit disposed in the
housing and for determining the presence of a fault. In addition
coupled to the fault detection circuit and disposed in the housing
is an interrupting mechanism. The interrupting mechanism is
configured to disconnect power between the line side and the load
side when the fault detection circuit determines the presence of a
fault. With this embodiment, the interrupting mechanism comprises a
set of interruptible contacts. The interrupting mechanism can
include a rotatable latch.
There is also a reset mechanism disposed in the housing comprising
at least one rotatable latch. The reset mechanism is for
selectively connecting the set of separable contacts together to
connect the line side with the load side.
In addition, in one embodiment there is a lock for selectively
locking the manual tripping of interruptible contacts.
In another embodiment, there is a non-electric indicator disposed
in the housing, the non-electric indicator being configured to
indicate at least two different positions of the contacts.
Alternatively, there can be an electric indicator provided as
well.
BRIEF DESCRIPTION OF THE DRAWINGS
Other objects and features of the present invention will become
apparent from the following detailed description considered in
connection with the accompanying drawings. It is to be understood,
however, that the drawings are designed as an illustration only and
not as a definition of the limits of the invention.
In the drawings, wherein similar reference characters denote
similar elements throughout the several views:
FIG. 1A is a simplified schematic block diagram of a circuit
incorporating nested transformers;
FIG. 1B is a first view three dimensional view of a circumferential
plane bisecting a transformer;
FIG. 1C is a second three-dimensional view of a circumferential
plane bisecting a second transformer wherein that plane is offset
from the plane shown in FIG. 1B;
FIG. 1D is a third view of a plane bisecting both transformers;
FIG. 1E is another schematic block diagram of a circuit
incorporating nested transformers;
FIG. 2A is a side cross-sectional view of a fault interrupter
having non nested transformers; FIG. 2B is a cross sectional view
of a fault interrupter having nested transformers;
FIG. 3A is a front perspective cross sectional view of a fault
interrupter having non-nested transformers;
FIG. 3B is a front perspective cross-sectional view of a fault
interrupter having nested transformers;
FIG. 4A is a front cross-sectional exploded view of a fault
interrupter having non nested transformers;
FIG. 4B is a front cross-sectional exploded view of a fault
interrupter having nested transformers;
FIG. 5 A is a top view of a housing for the nested transformers;
FIG. 5B is a bottom view of a housing for the nested
transformers;
FIG. 6A is a top perspective view of a housing for nested
transformers;
FIG. 6B is a first side view of the housing of FIG. 5A;
FIG. 6C is a second opposite side view of the housing of FIG.
5A;
FIG. 7A is a side view of the housing of FIG. 5A coupled to a
circuit board; FIG. 7B is an end view of the housing of FIG. 5A
coupled to the circuit board;
FIG. 7C is a top view of the housing of FIG. 5A coupled to the
circuit board;
FIG. 7D is a bottom view of the housing of FIG. 5A coupled to the
circuit board; FIG. 7E is a top view of a second embodiment of the
circuit board coupled to the housing of FIG. 5A;
FIG. 7F is a bottom view of the embodiment shown in FIG. 7E;
FIG. 7G is a side view of another embodiment including a different
circuit board;
FIG. 7H is a top view of the embodiment shown in FIG. 7G;
FIG. 7I is a side view of the embodiment shown in FIG. 7G;
FIG. 7J is a bottom view of the embodiment shown in FIG. 7G and
opposite the side view of FIG. 7H;
FIG. 8 is a top view of two transformers in a circular shape;
FIG. 9A is a top view of the two transformers in an oval shape;
FIG. 9B is a top view of the two transformers in a substantially
square shape;
FIG. 10A is a drawing showing the exploded perspective view of a
portion of a circuit interrupting device;
FIG. 10B is a perspective view of an assembled version of the
device shown in FIG. 10A;
FIG. 11 is a perspective view of a test arm shown in FIG. 10A;
FIG. 12A is a first perspective view of an actuator shown in FIG.
10A;
FIG. 12B is a second perspective view of the actuator;
FIG. 12C is a perspective view of the actuator having windings;
FIG. 13A is a front perspective view of a lifter showing a latch
plate which can be inserted inside;
FIG. 13B is an opposite side bottom perspective view of the
lifter;
FIG. 13C is a top view of the lifter showing cross sectional
cut-out lines A-A and B-B
FIG. 13D is a side view of the lifter;
FIG. 13E is a side cross-sectional view of the lifter taken along
the line A-A;
FIG. 13F is a side cross-sectional view of the lifter taken along
the line B-B;
FIG. 14A is a top perspective view of a front face;
FIG. 14B is a top perspective view of a bottom face of the middle
housing;
FIG. 14C is a bottom view of the middle housing;
FIG. 14D is a top perspective view of the middle housing;
FIG. 15A is a top perspective view of a test button;
FIG. 15B is a bottom perspective view of a test button;
FIG. 15C is a side view of a test button;
FIG. 15D is a side perspective view of the test button having a
spring;
FIG. 16A is a top perspective view of a latch clasp;
FIG. 16B is a side perspective view of a latch;
FIG. 16C is a side perspective view of the latch coupled to the
latch clasp;
FIG. 16D is a bottom perspective view of the latch clasp coupled to
a reset button;
FIG. 16E is a side view of the latch coupled to the reset
button;
FIG. 17A is a top perspective view of a trip slider;
FIG. 17B is a bottom perspective view of a trip slider;
FIG. 17C is another top perspective view of a trip slider;
FIG. 17D is a side view of a trip slider;
FIG. 17E is a top view of a trip slider;
FIG. 17F is a side cross-sectional view of a trip slider taken
along the line A-A in FIG. 17E;
FIG. 17G is a bottom view of the trip slider;
FIG. 18A is a perspective view of a latch, a trip slider and a
latch plate positioned adjacent to each other;
FIG. 18B is a side perspective view of a latch plate and a
latch;
FIG. 19A is a top perspective view of a test button and a trip
slider positioned adjacent to each other wherein the trip slider is
in a non-reset position;
FIG. 19B is a top perspective view of a test button and a trip
slider positioned adjacent to each other wherein the trip slider is
in a reset position;
FIGS. 20A-20E are the various positions for the mechanism of
operation;
FIG. 21A is a side view of one embodiment of the device with the
contacts in an unlatched position;
FIG. 21B is a side view of the device shown in FIG. 21 A with the
contacts in an intermediate position;
FIG. 21C is a side view of the device shown in FIG. 21A with the
contacts in a latched position;
FIG. 22A is a graphical representation of the contacts in an
unlatched position;
FIG. 22B is a graphical representation of the contacts in a latched
position;
FIG. 23A is a perspective view of the assembly being inserted into
a back housing;
FIG. 23B is a perspective view of the middle housing being coupled
to the slider;
FIG. 23C is a perspective view of the middle housing being coupled
to the back housing;
FIG. 23D is a perspective view of the strap being coupled to the
assembly of components shown in FIG. 23C;
FIG. 23E is a perspective view of the reset spring being inserted
into the assembly shown in FIG. 23D;
FIG. 23F is a perspective view of the reset button assembly being
inserted into the reset spring;
FIG. 23G is a perspective view of the reset button being coupled to
the plunger;
FIG. 23H is a perspective view of the test button being inserted
into the front cover; and
FIG. 23I is a perspective view of the front cover being coupled to
the remaining assembly.
DETAILED DESCRIPTION
In the past, fault circuit interrupters have been designed with
transformers or sensors having similar dimensions wherein these
transformers are stacked one adjacent to the other such as one on
top of the other. The stacking of these transformers requires
sufficient depth in the housing of the electrical device to
accommodate these stacked transformers or sensors.
Therefore, to reduce this depth, FIG. 1A shows a schematic block
diagram of a fault circuit interrupter having nested transformers
or sensors such as transformers 20 and 40 in a nested
configuration. In a nesting configuration, at least one transformer
or sensor is disposed at least partially within the other
transformer's interior volume. In one embodiment, the transformers'
circumferential planes 20a, 40a (See FIGS. 1B and 1C) and radial
planes 20b (See FIG. 1D) are substantially aligned, or
substantially coincide with one another. In other embodiments the
transformers may still be at least partially nested (e.g., one
transformer being at least partially disposed within the other
transformer's interior volume) but positioned such that one or both
of the transformers' circumferential and/or radial planes are
offset from one another. For example, FIGS. 1B and 1C show
circumferential planes 40a and 20a which each bisect transformers
40 and 20 respectively. In addition, if FIGS. 1B and 1C are taken
as a single view, this view shows circumferential planes 40a and
20a which are offset from each other. When the two planes are in
alignment (i.e. coplanar) or substantial alignment then transformer
40 is essentially nested inside of transformer 20.
For example, if we consider that each of the transformers assumes
the form of a solid of revolution which results from the rotation
of a plane two-dimensional shape about an axis of revolution, then
we can define a vertical plane that is aligned with and passes
through the axis of revolution of the volume, i.e., radial plane
20b, and another plane that is perpendicular to the radial plane
and which intersects, or passes through, a point on the surface of
the plane two dimensional shape (e.g., the two dimensional shape's
centroid), i.e., circumferential planes 20a, 40a. Then nested
transformers may have substantially aligned radial planes but have
their circumferential planes offset from one another by a distance.
Similarly, the transformers may be nested but yet have neither
plane aligned or may have substantially aligned circumferential
planes while having offset radial planes. Therefore, in one
embodiment where each of the transformers' radial and
circumferential planes are in alignment with one another, the
transformers are arranged concentrically. It should be noted that
the transformers do not have to take the form of a solid of
revolution but may also include forms as depicted, e.g., in FIGS.
9A and 9B (discussed below).
The embodiment shown in FIG. 1A comprises transformer(s) sensor(s)
15, a line interrupting circuit 345, which is associated with a
line interrupting mechanism, a fault detector or fault detection
circuit 340, and a reset circuit, which is associated with a reset
mechanism. Essentially the line interrupting mechanism can comprise
any one of a fault sensor 340, which can be essentially a
transformer, an actuator such as solenoid 341, a plunger 342, and
interruptible contacts 343. Other optional features for this line
interrupting mechanism can include a test button, a reset button,
and a latch for selectively latching or unlatching the contacts.
Essentially the term latch, or latched indicates that the line side
contacts are in electrical communication with the load side
contacts and/or the face side contacts. When the device is reset
this means that the contacts are in a latched position. The term
tripped, or unlatched indicates that the line side contacts and/or
the face side contacts are not in electrical communication with
each other. When the device is in a tripped state, the contacts are
unlatched. The actuator as described above can also be referred to
as an electro-mechanical actuator because it is a solenoid.
Transformer(s)/Sensor(s) 15 can be one or more transformers and are
configured to monitor a power line for any faults such as ground
faults, arc faults, leakage currents, residual currents, immersion
fault, shield leakage, overcurrent, undercurrent, overvoltage,
undervoltage, line frequency, noise, spike, surge, and/or any other
electrical fault conditions. In at least one embodiment shown in
FIG. 1A, transformer or sensor 15 is any type of sensor configured
to detect one or more of these electrical fault conditions.
Examples of these sensors include arc fault sensors, ground fault
sensors, appliance leakage sensors, leakage current sensors,
residual current sensors, shield leakage sensors, overcurrent
sensors, undercurrent sensors, overvoltage sensors, undervoltage
sensors, line frequency sensors, noise sensors, spike sensors,
surge sensors, and immersion detection sensors. In this embodiment,
transformer or sensor 15 comprises sensors or transformers 20 and
40 shown in a nested configuration. Essentially, the nested
transformers can be used with any known fault circuit
configuration.
In at least one embodiment, sensor or transformer 40 is a
differential transformer, while sensor or transformer 20 is a
grounded neutral transformer.
However, in this embodiment there is a fault circuit having a line
end 239 having a phase line 2341 terminating at contact 234, and a
neutral line 2381 terminating at contact 238. In addition, there is
a load terminal end 200 having a phase line 2361 and a neutral line
2101 each terminating at respective contacts 236 and 210. Contacts
210, 234, 236 and 238 can be in the form of screw terminals for
receiving a set of wires fed from a wall. Each of these
transformers 20 and 40 is configured to connect to a switching
mechanism including a fault detector circuit 340 which can be in
the form of an integrated circuit such as a LM 1851 fault detection
circuit manufactured by National Semiconductor.RTM.. While fault
detector circuit 340 disclosed in this embodiment an integrated
circuit, other types of fault detector circuits could be used such
as microcontrollers, or microprocessors, such as a PIC
microcontroller manufactured by Microchip.RTM.. Fault detector
circuit 340 is coupled to and in communication with transformer(s)
sensor(s) 15 and is configured to read signals from transformer(s)
sensor(s) 15 to determine the presence of a fault. This
determination is based upon a set of predetermined conditions for
reading a fault. If fault detector circuit 340 determines the
presence of a fault, it provides a signal output from fault
detector circuit 340 to the line interrupting circuit. Line
interrupting circuit 345 is coupled to fault detector circuit 340
and comprises at least one line interrupting mechanism including an
actuator such as a solenoid 341, including a plunger 342 which is
configured to selectively unlatch a plurality of contacts 343 which
selectively connect and disconnect power from line contacts 234,
and 238 with load contacts 210 and 236, and face contacts 281 and
282 (See FIG. 1E).
Line interrupting circuit 345 can also include a silicon controller
rectifier SCR 150 (See FIG. 1E) which is used to selectively
activate actuator or solenoid 341.
FIG. 1E shows a more particular embodiment 260 of the electrical
device shown in FIG. 1A which shows that transformer(s) sensor 15
comprises at least one of transformer/sensor 20, or
transformer/sensor 40, and additional circuitry including diode D2,
resistor R3, capacitors C6, C7 and C8 coupled to transformer 20,
and other additional circuitry including capacitors C3, C9 are
coupled between sensor or transformer 40 and fault detector circuit
340.
Examples of non nested type fault circuit configurations can be
found in greater detail in U.S. Pat. No. 6,246,558 to Disalvo et
al. issued on Jun. 12, 2001 and U.S. Pat. No. 6,864,766 to DiSalvo
et al which issued on Mar. 8, 2005 wherein the disclosures of both
of these patents are hereby incorporated herein by reference in
their entirety.
These two transformers, inner transformer 40 and outer transformer
20 can be configured such that inner transformer 40 is nested
either partially, substantially, or entirely inside of outer
transformer 20. Partial nesting is such that at least 1% of the
depth of inner transformer 40 is nested inside of outer transformer
20. Substantial nesting results in that at least 51% of the depth
of inner transformer 40 is nested inside of outer transformer 20.
If transformer 40 is entirely nested inside of outer transformer 20
then 100% of the depth of inner transformer is nested within the
depth of outer transformer 20. The depth of each transformer can be
defined in relation to the direction taken along the center axis of
the ring shaped transformer in a direction transverse to the radius
of each transformer. From this perspective, even though the sensors
or transformers are nested, one inside of the other, the sensors or
transformers can also be aligned on different planes, such that a
center axis or plane of a first transformer which is formed
transverse to an axis formed along radius line of this transformer
is on a different plane than a center axis or center plane of a
second transformer which is also formed transverse to an axis
formed along a radius line of the second transformer. This is seen
from FIG. 4B as shown by bisecting lines 20b and 40b wherein if the
transformers are on a different plane, bisecting line 20b is on a
different level or plane than bisecting line 40b. In the case where
the inner transformer 40 has a greater depth than the outer
transformer, the outer transformer can be "nested" around the inner
transformer such that with partial nesting between 1% and 51% of
the depth of the outer transformer 20 overlaps with the depth of
the inner transformer 40, while substantial nesting occurs when
between 51% and 99% of the depth of the outer transformer 20
overlaps with the depth of the inner transformer 40. In addition,
in this case, outer transformer 20 can be entirely nested when its
entire depth overlaps with the depth of the inner transformer
40.
The electrical components shown in FIGS. 1A and 1E can be housed
inside a housing such as the housings shown in either FIG. 2A or 2B
and can be associated with the line interrupting mechanism, and
reset mechanism associated with FIGS. 10A-23I. FIGS. 10A-23I can
also have different circuitry not related to the circuitry shown in
FIGS. 1A and 1E. With the design of FIGS. 10A-23I, contacts 343
(See FIG. 1E) include line side neutral contacts 601 and 602, line
side phase contacts 611, and 612, load side neutral contact 701,
and load side phase contact 702, as well as face side neutral
contact 721, and face side phase contact 722. Contacts 601, 602,
611, 612, 701, and 702 are shown in FIG. 1OA as bridged contacts.
That is, when these contacts are latched, these bridged contacts
form three conductive paths in a connection region that are in
electrical communication with each other. In at least one
embodiment, the bridged contacts are on substantially the same
plane. When these contacts are latched, power is provided from the
line side 239 to the load side 200 and to the face side 280. When
contacts 601, 602, 611, and 612 move away from contacts 701, 721,
702, and 722, power is removed from load side 200 and face side
280.
FIG. 2A is a cross sectional view of the current state of the art
comprising an assembled stacked prior art version of a set of
transformers (i.e., non-nested). As depicted, these transformers
are designed to rest one on top of the other such that transformer
41 rests on top of transformer 40. These transformers are disposed
inside of an outer housing 30 which is comprised of a first part of
an outer housing 32, a second part of a housing 34, and a third
part of an outer housing 36. The first part of the outer housing 32
forms a backing or back cover, the third part of outer housing
forms a front section or front cover while the second part of the
outer housing 34 forms a divider or middle housing, dividing the
opening or cavity for receiving plug prongs, 14, 16, and 18 from an
inner housing 47 for housing transformers 40 and 41.
Additionally, as seen in FIG. 2A, conductors 43 are disposed inside
of outer housing 30 and extend into the inner housing or
transformer bracket 47. These conductors are phase or neutral
conductors and extend out to a position outside of the housing to
form means for attaching to a line side wire. For example, there is
also a side contact 51 (See FIG. 4A) connected to conductor 43,
which is configured to form a power contact for contacting a power
line.
There is a magnetic shield 49 (See FIG. 4A) disposed inside of this
outer housing wherein this magnetic shield 49 is designed to
increase the sensitivity of the differential transformer. This
magnetic shield could be coupled to circuit board 45, which rests
inside of the first part of the outer housing 32. The device 5,
shown in FIG. 2A is shown by way of example as installed in a wall
box such as a single gang wall box 39, which is installed adjacent
to a wall such as wall 39a.
FIG. 2B shows an improved version of a device 10 which has nested
transformers 20 and 40. This cross-sectional view includes a view
of plug 12 having prongs 14 and 18 along with ground prong 16
inserted into the device. There is an outer housing 31 having a
first housing part 33, a second housing part 35, and a third
housing part 37. First housing part 33 forms a backing or back
cover, second housing part 35 forms a divider or middle housing,
while third housing part 37 forms a front cover. As can be seen in
this view, second or inner transformer 40 is nested inside of an
inner volume, or inner hole region, of outer transformer 20. These
transformers 20 and 40 rest above a circuit board 26 and are housed
inside of a housing 24 which is configured to provide a housing for
two nested transformers. In addition, a plurality of conductors 22
extend up from circuit board 26, around housing 24 so that these
conductors can contact outer contacts such as contacts 234 and 238
at line terminal end 239 (See FIG. 1A). While the inner transformer
20 and outer transformer 40 can be any one of a differential
transformer or a grounded/neutral transformer in at least one
embodiment, the inner transformer 40 is a differential transformer,
while the outer transformer 20 is a grounded/neutral transformer.
The device 10 is shown by way of example as being installed in a
wall box such as a single gang wall box 39. Thus, in this case, if
the device is installed into a single gang wall box, a substantial
portion of the device would extend behind a wall, such as a drywall
or plasterboard wall 39a.
FIGS. 3A and 3B show a front perspective cross-sectional view of
the respective configurations shown in FIGS. 2A and 2B. FIG. 3A is
the prior art view while FIG. 3B is the design associated with at
least one embodiment of the invention. These views show the
dimensional difference between housing 30 of device 9, and housing
31 of device 10. In this case, a depth d1 is shown for device 9
which includes the entire distance from a back face of back cover
32 to a front face of front cover 36. In addition depth d2 is shown
extending from a back face of back cover 33 to a front face of
front cover 37 of housing 31. The size difference between these two
housings, or differences in depths d1 and d2 is approximately
similar to the height dimension of a transformer and its associated
windings. (See FIG. 8). Thus, the design of device 10 with depth d2
is shallower than the design of device 9 with depth d1. This is
because the two transformers 20 and 40 are nested, one inside of
the other, with the outer housing depths being configured
accordingly. Thus, once these transformers are nested, one way to
shorten the depth would be to shorten the depth of front cover 37
relative to the depth of the front cover 36 in device 9. Another
way to shorten the depth would be to shorten the depth of back
cover 33 relative to back cover 32 in device 9. Still another way
would be to shorten the depths of both front cover 37 and back
cover 33 of device 10 relative to front cover 36 and back cover 32
of device 9. However, since a receptacle (e.g., a duplex
receptacle) must be configured to receive plug prongs/blades as
defined by relevant electric standards and/or governmental agency
codes, adjustability of the depth of the device is practically
limited by the depth of such prongs/blades.
FIGS. 4A and 4B are different views of the designs shown in FIGS.
2A and 2B and 3A and 3B. For example, FIG. 4A is an exploded cross
sectional view of the prior art device 9. However, FIG. 4B is the
exploded cross-sectional view of the device according to one
embodiment of the invention. In this view, there is shown housing
24, which is the interior or inner housing for housing transformers
20 and 40. The space saving design which was shown in FIGS. 2B and
3B, can also be seen as saving space via housings 24 and 47. For
example, housing 24 has a depth of d3 which as can be seen is less
than depth d4 of housing 47. This is because housing 24 is designed
to accommodate approximately the distance of the depth of a single
ring or transformer. However, as shown with device 9, housing 47
has a depth d4 which is configured to accommodate at least two
transformers such as transformers 40 and 41 stacked one on top of
the other. Therefore, the reduced space required for housing 24,
vs. housing 47 allows for a shallower type device such as a device
with less depth. In addition, this view also shows electrical
conductors 25 which are coupled to circuit board 26, by extending
across a surface of circuit board 26, opposite the surface of
circuit board 26 which receives transformers 20 and 40. On the
surface of circuit board 26 that receives transformers 20 and 40,
is a magnetic shield 29 which in many cases is actually a metal
part. Its function is to increase the sensitivity of the
differential transformer. It fits over a structure having geometry
on transformer housing 24 in the form of connector 246 (See FIGS.
6B, 6C) and will be part of the transformer bracket subassembly;
i.e. it does not attach directly to the circuit board 26. Magnetic
shield 29 can be made from any suitable material such that it
provides a magnetic shield and is configured to be coupled to
circuit board 26 and to also house transformers 20 and 40
concentrically on circuit board 26. On the side of the circuit
board opposite the transformers 20 and 40, there is an electrical
conduit 27 which is configured to provide power between circuit
board 26 and contacts such as contact 25 which is representative of
contacts 234, 238, 236, or 210 (See FIG. 1A). Circuit board 26 can
be powered by conductors 25 or 27 wherein conductor 27 provides
power to conductor 23.
Housing 24 is shown in greater detail in FIGS. 5A, 5B, 6A, 6B, and
6C. For example, housing 24 includes a first surface 241, and a
center hole or opening 242 in first surface 241. There is a
connector 246 which extends through hole 242, wherein connector 246
has a flared end to contact first surface 241 and secure housing 24
to a circuit board. For example, FIG. 5B shows an underside of the
housing with an inner recessed region 247 forming a ring shaped
interior region shown opposite first surface 241. This underside
region is a recessed region that is substantially ring shaped and
is bounded by first surface 241, connector 246 in a center region,
and outer side walls 248 (See FIGS. 6A-6C). In addition, with this
view, contact pins 243a, 243b, 244a and 244b are coupled to housing
24 wherein in this region, housing 24 is shown as extending across
a width w1, wherein this width is designed to fit on a circuit
board such as circuit board 26. In addition, this underside shows
an open region having a width w2 which has an opening sufficient to
receive at least two nested transformers housed inside.
FIG. 6A shows a top perspective view of housing 24, which shows
surface 241, side walls 248, and connector 246. In addition, this
view also shows extending element 245 which forms a back wall for
plunger, and forms a barrier between transformers/sensors 20 and 40
and the plunger.
In addition, FIGS. 6B and 6C show connector 246 extending through
the depth of this housing.
FIGS. 7A, 7B, 7C, and 7D show the connection of housing 24 to
circuit board 26 with connector 246 extending through to circuit
board 26. With this design, circuit board 26 includes notched or
recessed regions 261 and 262 which form cut outs to receive
contacts or terminals such as terminals 249 (See FIG. 7E) to
electrically connect the device to a power line. In this case,
disposed on circuit board 26, are contacts 263, 264, 265 and 266,
wherein contacts 263 and 264 are disposed adjacent to recessed
region 261, while contacts 265 and 266 are disposed adjacent to
recessed region 262. These contacts have to be positioned in and
adjacent to recessed regions 261 and 262 because housing 24 has a
greater length L1 (FIG. 5A) than the other housing 47 of the design
of FIG. 2A. This is because transformer 20 is configured as larger
than transformer 40.
Thus, for all of these components to fit on the circuit board,
housing 24 has a base width w3 which is defined by the outer
regions of side walls 248, and an inner width w1 which is defined
by the outer edges of arms holding pins 243a and 244b (FIG. 5B), so
that this portion of housing 24 can fit between outside conductors
25 and terminal screws 249.
FIGS. 7E and 7F show an alternative embodiment of a circuit board
26a which does not have indents in the circuit board but rather non
indented regions 261a and 262a. Rather, the indented regions 247a
and 247b are positioned in housing 24 and are configured to allow
terminal screws or contact pins 249 to insert therein. Therefore,
these indented regions 247a and 247b are configured to allow the
terminal screws 249 to be screwed into the housing. These terminal
screws are used to form terminal contacts such as contacts 234 and
238 and 210 and 236 (See FIG. 1A) for connecting to electrical
lines.
FIGS. 7G-7J disclose a series of different views of another
embodiment including a transformer housing 24 coupled to a circuit
board 26b. Circuit board 26b is different from circuit board 26 in
that it has a cut-out region allowing at least a portion of
transformer housing 24 to be positioned in this cut out region of
circuit board 26b such that at least a portion of transformer
housing 24 occupies this cut out region. This positioning of
transformer housing 24 within the cut-out region of circuit board
26 allows for a further depth reduction of the device. While
transformer housing 24 is mechanically coupled to circuit board 26b
in any known manner such as via a mechanical fastening or an
adhesive, contacts 243a, 243b, 244a, and 244b are electrically
coupled to circuit board 26b via respective lines 253a, 253b, 254a,
and 254b.
Indented regions 247a and 247b shown in FIGS. 7C, and 7E, are
formed by housing 24 to allow terminal screws 249 to be inserted
into the outer housing 31 and to allow terminal screws to intrude
into outer housing 31. Because sensor housing 24 extends into the
region where terminal screws 249 intrude, sensor housing is
dimensioned so as to provide indented regions 247a, and 247b to
receive these terminal screws 249.
FIG. 8 shows a first embodiment of a sensor comprising transformers
20 and 40 having associated coils 20c and 40c formed by windings of
a wire such as a copper wire. Transformer 20 is ring shaped and has
an inner radius 2Oi which defines an inner hollow region bounded by
an inner ring for receiving transformer 40. Transformer 20 also
includes an outer radius 2Oo which defines the outer boundary for
this transformer. In addition, transformer 40 has an outer radius
4Oo which defines the outer boundary for this transformer and which
is smaller than the inner radius 2Oi of transformer 20. Because
inner radius 2Oi is larger than outer radius 4Oo this allows for
the nesting of transformer 40 inside of transformer 20 in the
hollow region of transformer 20. This nesting occurs when
transformer 40 enters this inner hollow region bounded by inner
radius 4Oi.
Transformer 40 also has an inner radius 4Oi which crosses a hollow
region for receiving other parts. While only a few coils or
windings are shown, essentially, the coils wrapped around these
transformers would extend entirely around the transformer.
Transformer 20 has a different number of windings than transformer
40. For example, transformer 20 (neutral transformer) can have a
little more than 100 windings, while transformer 40 (differential)
can have approximately 800 windings. To keep the resistance of the
windings substantially the same, depending on the size of the
transformer, the size of the wire diameter must be changed when the
size of the transformer is changed. Therefore, in one embodiment
transformer 20 is made larger than transformer 40, therefore, the
wire diameter of the windings of this transformer are increased
relative to the wire diameter of the windings of a transformer such
as a grounded neutral transformer which is sized similar to
transformer 40. However, because transformer 20 is larger than
transformer 40, more copper wire is used for transformer 20 than
for transformer 40. In addition, as shown in this view, there is a
magnetic shield 29 disposed inside of an inner region of
transformer 40. Furthermore, there is also an additional insulating
ring 302 comprising an intermediate ring disposed between the coils
of 40c of transformer 40 and the coils 20c of transformer 20 so
that these coils are electrically and mechanically isolated from
each other while still being magnetically coupled to each other.
Insulating ring 302 can be in the form of a RTV insulator or any
other type of dielectric barrier such as rubber, plastic, plant
fiber, or ceramic. While in this embodiment, the size of the outer
transformer is shown as increased to form an inner region to
accommodate a standard sized inner transformer such as a
differential transformer, it is also possible to start with an
existing sized outer transformer in the form of a grounded neutral
transformer with a reduced sized differential transformer being
disposed inside the outer transformer.
While transformers 20 and 40 as shown in FIG. 8 are substantially
circular, FIG. 9A shows another embodiment of the transformers
which show transformers 310 and 312 which are substantially oval.
As shown, transformer 312 is nested inside of transformer 310.
These transformers 312 and 310 are shaped differently but also work
substantially similar to transformers 20 and 40 as well.
Alternatively, FIG. 9B shows another set of transformers which are
substantially square shaped with transformer 324 being nested or
disposed inside of a hollow region of transformer 320.
There is also a process for reducing the depth of a fault circuit
interrupter device. In this case, the process starts with a first
step which includes positioning at least one transformer at least
partially inside of another transformer to form a nesting
configuration. Next, in a second step, these two nested
transformers are electrically coupled to a circuit board. These
nested transformers are electrically coupled to the circuit board
via lines as shown by schematic electrical diagram in FIG. 1. Next,
in another step, a transformer housing such as transformer housing
24 is coupled to the circuit board 26 so as to house these two
transformers adjacent to the circuit board. The dimensions of this
transformer housing are configured so that it can house two
different transformers in a nested configuration while still
fitting on a standard circuit board for fault circuit interrupters.
This means that the housing would have a particular recess width w1
to couple to a circuit board while still having a sufficient
opening width w3 to fit at least two transformers therein. Next, in
the next step the outer housing can be configured such that it has
reduced depth due to the depth savings by nesting the two
transformers. Thus, this design would result in improved space
savings by nesting two transformers together, rather than stacking
these two transformers one on top of the other.
The device described above can be used with an actuating mechanism
disclosed in FIGS. 10A-23I. For example FIG. 1OA discloses an
exploded perspective view of the activating mechanism which
includes a circuit board 26 as disclosed above. In addition, there
is an actuator or solenoid 341 coupled to circuit board 26 via
pins. An auxiliary test arm 401 is coupled to solenoid 341 above
contact pins 402 and 403 which are coupled to circuit board 26.
Auxiliary test arm 401 is comprised of a leaf spring made of for
example a bendable metal such as copper. When auxiliary test arm
401 is pressed down by a lifter under influence by a reset button
(not shown) the contact between test arm 401 and contact pins 402
and 403 forms a closed circuit which allows for the testing of a
fault circuit interrupter such as fault circuit 340 and solenoid
341. A pin or plunger 484 is insertable into solenoid 341 such that
it is selectively activated by solenoid 341 when the coil on
solenoid 341 receives power.
While many different types of springs are described herein, such as
springs or arms 401, test spring 457, (FIG. 15C) reset spring 471
(FIG. 16E), plunger spring 485 (FIG. 10A), and trip slider spring
499a (FIG. 17E), different substitutable springs can be used in
place of the springs shown. For example, when referring to a
spring, any suitable spring can be used such as a compression
spring, a helical spring, a leaf spring, a torsion spring, a
Belleville spring, or any other type spring known in the art.
A load movable arm support 420 is positioned above auxiliary test
arm 401 and is used to support load arm conductors 703 and 704 via
arms 422 and 423. In addition, arms 425 and 426 support line arm
conductors 610 and 600. Support 420 has an insulating tab section
421 which can be coupled over solenoid 341 to insulate the windings
of solenoid 341 from the remaining components. In addition,
disposed adjacent to solenoid 341 on circuit board 26 is
transformer housing 24. Lifter assembly 430 is slidable between
load movable arm support 420 and housing 24 and is substantially
positioned between line neutral movable assembly 600, line phase
movable assembly 610 and load movable assembly 700. In this case,
line neutral movable assembly 600 has at one end bridged contacts
in the form of contacts 601 and 602 which are positioned on a
substantially similar or the same plane, and which are configured
to selectively couple to load movable assembly 700. Load movable
assembly 700 includes load neutral movable contact 701, and movable
conductor 703, and load phase movable contact 702 and load movable
conductor 704. All of these assemblies are in the form of metal
conductors which act as leaf springs and which can be brought into
selective contact with each other via the movement of lifter 430.
There are also face contacts (not shown) which are stationary
contacts coupled to middle housing 437 (See FIG. 14D) which are for
example coupled to face terminals 281, and 282 in the embodiment
shown in FIG. 1E. Similarly, while the embodiment shown in FIG. 10B
is not limited to the configuration of the embodiment shown in FIG.
1E, FIG. 1E shows an example of the electrical configuration
between these contacts via contacts 343. Thus, the contacts 601 and
602 are connected to the line side neutral contact 238, while
contacts 611 and 612 are shown connected to line side phase contact
234. With the embodiment shown in FIGS. 1OA and 1OB, when lifter
430 is acted on by a spring 471 of reset button 480, (FIG. 16E) it
pushes up conductors 600 and 610 to first contact load movable
conductors 703 and 704 and then push these load movable assemblies
700 further, so that contacts 601 and 612 next contact face
contacts 721 and 722 which are positioned in a stationary manner in
middle housing 437. (FIG. 14D) This movement is described in
greater detail in FIGS. 21A, 21B, 21C, 22A, and 22B.
FIG. 10B shows a perspective view of the device forming an
assembled body 400. Assembled body 400 is assembled by first
inserting pins 402 and 403 (See FIG. 10A) into circuit board 26.
Next, solenoid 341 is placed into circuit board 26. Once solenoid
341 is coupled to circuit board 26, test arm 401 is coupled to
solenoid 341 by inserting tab 411 into an associated hole on tab
347 (See FIGS. 11 and 12A). Next, load movable support 420 is
placed on top of solenoid 341, such that tab 421 covers the
windings of solenoid 341 to provide a shield. Next, plunger spring
485 is positioned inside of hole 349 on solenoid 341. Once plunger
spring 485 is positioned inside of solenoid 341, plunger 484 is
placed inside of solenoid 341 as well. Next, plunger 484 is pressed
inside of solenoid 341 to compress plunger spring 485 and allow
room for inner housing or transformer housing 24 to be coupled to
circuit board 26. Next, lifter assembly 430 is placed on board 26
between transformer housing 24 and solenoid 341. In this case,
lifter 430 should be orientated so that the open part of a latch
plate 500 (See FIG. 18B) is facing solenoid 341. Next, line movable
arms 600 are inserted into transformer housing 24 such that a
section of these arms 603 and 613 extend through a center region of
housing 24. Next, load movable assembly 700 is coupled to circuit
board 26 and to load movable support 420. Next, a metal oxide
varistor (not shown) is coupled to transformer housing 24 and then
coupled to circuit board 26. Next, the line and load terminal
assemblies (See FIG. 10B) is coupled to circuit board 26 to form
assembly 400 shown in FIG. 1OB.
FIG. 11 is a top perspective view of a test arm 401 including a
locating section 410 which comprises a locating cut out 413 and a
locating tab 411. There are arms or wings 412 and 414 coupled to
the locating section 410 which extend out in an L-shaped manner.
There are also stiffening extrusions 416 and 418 disposed in each
of these wings 412 and 414. Locating section 410 is configured to
selectively couple to an associated tab 347 on solenoid 341 shown
in FIG. 12A.
FIG. 12A discloses a side perspective view of a one actuator or
solenoid 341. In this view there is a connection tab 347 which is
used to receive tab 411 of locating section 413, this view also
discloses this device having an inner tube section for carrying a
plunger 484 (See FIG. 16D) and a plunger spring such as plunger
spring 485 as shown in FIG. 20A. FIG. 12B shows a back end support
block 348 coupled to solenoid 341. FIG. 12C discloses windings 345
which wind around the body solenoid 341 thereby forming an
actuator, wherein these windings begin and end at posts 346a and
346b. Posts 346a and 346b are coupled to circuit board 26 to form
an electrical connection. FIG. 13A discloses a top perspective view
of a lifter 430 while FIG. 13B discloses an opposite perspective on
a perspective view of lifter 430. Lifter 430 has a bobbin side 432
and an angled face 439 on this bobbin side 432. (See FIG. 13F) In
addition, disclosed adjacent to lifter 430 is a latch plate 500
(See FIG. 18B). Lifter 430 has arms 434 and 438 as well as cutouts
440 and 441. Cut outs 440 and 441 are configured to receive
different components such as either a latch plate 500 or plunger
484. For example, the plunger 484 is configured to extend through
cut out or hole 440 while the latch is configured to extend through
hole 441. This lifter 430 located between load movable support 420
and housing 24 and is configured to move up and down depending on
whether it is actuated by a reset button 480 and the latch, such
that the latch would extend through the hole 441 and have catch
arms or latch tabs 476 (See FIG. 16B) which catch latch plate 500
inside of lifter 430 and lift this lifter up. The lifting of this
lifter would lift arms 434 and 438 up, lifting conductors 600 and
601 up to form a closed circuit with load conductor assembly 700 to
form a closed circuit with contacts 280 and 200.
FIG. 14A shows the top perspective view of a front cover 443 having
a test button opening 444 and a reset button opening 445. In this
embodiment, there is also an optional window or cut out 443a which
is used to allow visual tracking of trip slider 490. In addition,
FIG. 14B discloses a bottom perspective view of the middle plate
437 or housing having a trip slider cavity 446 and a guide wall 447
disposed adjacent to cavity 446. There is also a snap 448 for
coupling to the trip slider to allow the trip slider 490 (See FIG.
17A) to be assembled into the housing, and a cut out 449 for the
latch 470 (See FIG. 16B). There is also a cut out 442 for the test
button-ramp as well. FIG. 14C also shows these features as well.
FIG. 14D shows an opposite side view of this middle plate as well,
which show tabs 437a which are used to couple and to support a
spring such as reset spring 471.
FIG. 15A shows a top perspective view of a test button 450 having
arms 452 and 456 having locking tabs each having a lead which is
designed to allow this device to snap into the face cover 443,
through opening 444. There is also a center arm 454 having a
double-sided ramp including ramps 455a and 455b. FIGS. 15B and 15C
also show some of these features. The ramps are for interacting
with the ramp 494 on trip slider 490 (See FIG. 17E) to cause trip
slider 490 to move axially in a direction transverse to the
direction of the movement of the test button.
FIG. 16A discloses a top perspective view of a latch clasp 460
having a bearing surface 463 for receiving a latch 470. There is
also a latch tab 462 coupled to bearing surface 463. Latch clasp
460 also includes tabs 466 for coupling to reset button 480 in arms
482 of reset button 480. FIG. 16B discloses a front perspective
view of a latch 470 having a clasp cutout hole 474, a body section
472, and coupling tabs or latch tabs 476, for coupling to an
associated lifter via a latch plate 500 (See FIG. 1B). There are
also extending arms 478 forming a latch shoulder and a plunger cut
out 479. FIG. 16C shows latch clasp 460 coupled to latch 470 in a
manner to allow latch 470 to swing in a rotatable manner while
resting in bearing surface 463. FIG. 16D shows a bottom perspective
view of latch 470, coupled to latch clasp 460, with the latch clasp
being coupled to reset button 480 and shows a plunger 484 having a
notch section 488 forming a narrower section to receive shoulder
478 wherein the shaft of this plunger 484 in the notch section is
configured to fit into the opening 479 of latch 470 so that when a
plunger 484 moves axially it would control the rotational movement
of latch 470. Plunger 484 has a plunger head 487 and two beveled
regions 486a and 486b configured to allow latch 470 to slide into a
locking region 488 bounded by these beveled regions 486a and 486b
when reset button 480 is inserted into the housing. FIG. 16E is a
side view of the latch 470 coupled to the reset button 480 showing
the range of rotational motion via the arrow.
FIG. 17A-17G disclose a trip slider 490 which has a body section
492, a test button window 496 a latch window 498, a first ramp 491,
and a second test button ramp 494. Trip slider 490 functions as
both an indicator and a lock. The lock functionality of trip slider
490 is that this trip slider 490 is capable of moving from a first
position to a second position, to selectively prevent the movement
of test button 450 (See FIG. 15A) from a first position to a second
position. Test button 450 has an associated test button spring 457
(See FIG. 15D), which biases test button 450 in the first position
pressed away from trip slider 490. However, when test button 450 is
pressed by a user, it moves from the first position to the second
position wherein in the second position, test button 450
selectively unlatches these contacts by moving trip slider 490 to
act on latch 470 to unlatch these contacts. In this case the first
position of test button 450 is the position biased by spring 457,
the second position of test button 450 is the position attained by
test button 450 which is sufficient to cause the unlatching of the
contacts.
However, the geometry and functionality of test button 450 along
with the geometry and functionality of trip slider 490 allow trip
slider 490 to selectively act as a lock, preventing test button 450
from reaching the second position (see the discussion below
regarding FIGS. 20A-20E). For example, trip slider 490 has a second
test button ramp 494 which is the test button ramp that the test
button will act upon. First ramp 491 is provided for clearance and
does not influence the movement of the trip slider. Alternate views
of this trip slider are shown in FIGS. 17B-17G as well. Second test
button ramp 494 is configured to accept complementary ramps 455a
and 455b on test button 450 to cause the slider to move (when the
device is reset and the test button is depressed) by pressing
interface or angled surface 455a or 455b on test button 450 down on
a corresponding interface or angled surface 494 on trip slider 490
to form a connection interface. With test button 450 pressing down
on trip slider 490, it moves in an axial direction perpendicular to
the pressed in movement of the test button for an axial to axial
translation movement. With a latch 470 extending through latch
window 498, the axial to axial translation movement causes a
rotational movement of this latch 470 about a connection with latch
clasp 460 to cause the latch to move, resulting in latch tabs 476
moving from a first position coupled to a latch plate 500 (See FIG.
18A) to a second position free from latch plate 500.
There is also a spring boss 499 coupled to the trip slider 490 to
retain a trip slider spring (See FIG. 20B). Thus, when trip slider
490 is moved via the test button, spring 499a biases the trip
slider 490 back to its original position when the test button is
released. Ramps 455a and 455b are complementary so that with this
design, test button 450 can be orientated in any one of two
different directions.
Trip slider 490 can also function as an indicator, wherein an
indication surface 492a of body 492 comprises an indicator which
can be seen by a user outside of the housing. In at least one
embodiment the indicator comprises the body surface of trip slider
490. In another embodiment, the indicator comprises a particular
coloring indication of body surface 492. In another embodiment,
indicator 492a comprises a reflective coating or surface. In
another embodiment, the indicator comprises indicia. In each case,
indicator 492a is useful in indicating to a user the position of
the trip slider thereby indicating to the user whether the device
is in a reset position or in a tripped position.
FIG. 18A shows the coupling reset button 480 to latch 470 wherein
latch 470 is positioned adjacent to latch plate 500. Latch arms 476
are positioned adjacent to a back edge 505 (FIG. 18B) in a cut out
region 503 of latch plate 500. Latch plate 500 includes a body
section having this cut-out region 503, wherein this body section
has arms or tabs 507 which are used to catch corresponding tabs 476
to cause reset button 480 which is coupled to compression spring
471 (See FIG. 16E) to pull latch plate 500 closer to trip slider
490 thereby pulling on lifter 430 which causes a lifting of contact
arms. Latch plate 500 includes tabs 502 and arms 506 whereby this
latch plate 500 is used to couple to the inside of a lifter as
shown in FIG. 13E.
FIGS. 19A and 19B show the interaction between test button 450 and
trip slider 490. FIG. 19A shows trip slider 490 in a non-reset
position whereby a surface on body 492 of trip slider 490 blocks a
movement of test button 450 thereby preventing the testing of the
device when it is not reset. FIG. 19B shows the positioning of trip
slider 490 whereby the test button can move into the test button
hole 496 of slider 490, to allow for a testing of the device. Due
to the configuration and or geometry of the slider 490 and the test
button, this device prevents the testing of the device when it is
not in a position to first be reset.
During reset, reset button 480 is pushed down, wherein the bottom
surface of latch tab 476 then pushes down on the latch plate tabs
507 which in turn pushes the lifter 430 and corresponding arms 434
and 438 down against arm 401 by pressing down on wings 412 and 414.
This pressing down motion causes the device to run through a test
procedure, which if successful, causes the plunger to be pulled
back into solenoid 341. However, if the test results are
unsuccessful, then the device remains in lockout mode. This causes
the plunger which has a notched section coupled to plunger cut out
479 causing latch 470 to move in a rotational manner, away from the
back edge 505 (See FIG. 18B) and then the latch tabs 476 will move
underneath catches or tabs 507 so that the top surface of latch
tabs 476 become coupled with the latch plate causing reset button
480 having a spring to lift, or move lifter 430 to close the
circuit.
As lifter 430 moves to close the circuit, angled face 439 on bobbin
side 432 acts against ramp 497 on trip slider 490 so that it moves
the trip slider 490 from the position shown in FIG. 19A to the
position shown in FIG. 19B. In this case, it is the movement of the
lifter 430 that moves the trip slider 490 into a position so that
the trip slider window 496 can be engaged by the test button
450.
FIGS. 20A-20E show the progression of the mechanism of operation.
This progression shows the operation of a circuit interrupting
mechanism formed by at least one of a test button 450, actuator or
solenoid 341, fault circuit 340, SCR 150 (See FIG. 1E), latch 470,
latch plate 500, lifter 430, and interrupting contacts such as
contacts 343 or contact assemblies 600, 700 and contacts 721, and
722 and trip slider 490. This progression also shows the operation
of a reset mechanism comprising at least one of a reset button 480,
a reset spring 471, latch 470, latch plate 500, and lifter 430.
Because the reset mechanism incorporating a reset lockout feature
cannot be reset without first passing a test cycle, the reset
mechanism can also include fault circuit 340, actuator 341, and SCR
150.
For example, in this progression, there is shown in FIG. 20A, when
the device is tripped i.e. no electrical power to the load, the
tabs 476 of latch 470 are positioned substantially between surface
501 (See FIG. 18B) on latch plate 500 and trip slider 490. Plunger
484 is under the influence of plunger spring 485 within solenoid
341 and holds latch 470 against back edge 505 of latch plate 500
(See FIG. 18B). Latch plate 500 has tabs 507 so that in this
position these tabs 507 block latch tabs 476 from moving below
surface 501, because tabs 507 contact tabs 476, blocking latch
470's movement below surface 501. In this position, trip slider 490
is positioned in a locking position to provide a locking feature.
This locking feature is present when the contacts are in an
unlatched or tripped state. Trip slider 490 is configured to move
between at least three positions. The first position is the
position of the trip slider biased by trip slider spring 499a when
the contacts are in an unlatched state (See FIGS. 19A, and 20A).
The second position, is the position of the trip slider 490 which
is biased by the spring, and not biased by the test button when the
contacts are in a latched state (See FIG. 20D). The third position
is the position of the trip slider when the trip slider is acted on
by test button 450 to cause the unlatching of the contacts as shown
in FIG. 20E.
FIG. 20B shows that when a user presses down on reset button 480,
reset spring 471 becomes compressed. As reset button 480 reaches
the end of its travel range, bottom surface of tabs 476 press on
top surface 501 of latch plate 500 pressing latch plate 500 and
lifter 430 down (See also FIG. 18B). In this position, lifter arms
434 and 438 (See FIG. 13D) press against test contact arms 401, in
particular the extrusions 416 and 418 (See FIG. 11), so that wings
412 and 414 are pushed onto contacts 402 and 403 (See FIG. 10A) on
a circuit board 26 to cause a test cycle. In this case, a test
cycle can be any known test cycle but in this embodiment is a
ground fault test cycle caused by a current imbalance. With the
completion of a successful test cycle, solenoid 341 energizes which
moves plunger 484 toward the center of the solenoid's magnetic
field which is a center point taken along the length of the
windings. The movement of plunger 484 pushes against plunger spring
485 and pulls latch 470, causing it to rotate, to allow the latch
tabs 476 to move away from tabs 507 allowing these tabs to pass
underneath the latch tabs 507 of latch plate 500 due to the
downward pressure of the reset button 480.
After this progression shown in FIG. 20C, as shown in FIG. 20C,
plunger 484 is influenced by spring 485 in solenoid 341 and forces
latch 470 to rotate and push latch 470 against the back edge 505
FIG. 18B of latch plate 500. This arrangement traps latch 470
underneath latch plate 500 by forcing latch tabs 476 between latch
plate 500, in particular latch tabs 507 and the back of the
housing. The user then releases the reset button assembly, and the
force stored in the reset button assembly including that of reset
spring 471 causes lifter 430 to move with reset button 480. As
lifter 430 rises, or in this case, moves towards the front face of
the housing, the angled face 439 (See FIG. 13F) of lifter 430
pushes against ramp 497 of trip slider 490, (See FIG. 17F) forcing
trip slider 490 to compress trip slider spring 499a. The
repositioning of trip slider 490 allows trip slider window 496 to
line up with the test button 450 particularly with arm 454 of the
test button 450. The interface between ramps 439 and 497 creates an
axial to axial translation causing movement of the slider 490 to be
transverse to a movement of lifter 430.
FIG. 20D shows the device in a reset position. In addition, in this
position, trip slider window 496 is positioned adjacent to test
button 450, thereby allowing test button 450 including any one of
ramps 455a or 455b (depending on orientation) to act on trip slider
490, in particular, trip slider ramp 494. Trip slider spring 499a
remains at least partially compressed by front edge or angled face
439 of lifter 430 pressing against ramp 497.
As shown in FIG. 20E, when the test button 450 is depressed, it can
insert into trip slider window 496 to act against ramp 494 to cause
trip slider 490 to move. As test button 450 is depressed, it forces
trip slider 490 to compress trip slider spring 499a. Eventually,
trip slider 490 moves a sufficient amount so that it acts against
latch 470. Trip slider 490 forces latch 470 to rotate and disengage
tabs 476 on latch 470 from the underside of latch plate 500
particularly tabs 507, thereby releasing latch 470 from latch plate
500 allowing lifter 430 to move away from the back face, thereby
mechanically tripping the mechanism. Upon release of the test
button 450, the trip slider 490 and test button 450 move back into
position shown in FIG. 20A, which is an unlatched position allowing
for future resetting of the device.
FIG. 21A-21C show the different settings for the contacts which is
also shown in FIGS. 22A and 22B. FIGS. 21A-21C show one half of the
view of these contacts, with this configuration being the same for
the opposite side. These contacts are associated with three
different sets of conductors, a line side conductor, a load side
conductor and a face conductor. Contacts 601, 602 and 611, and 612
are coupled to the first or line side conductors 600 and 610
respectively. Contacts 701, and 702 are coupled to second or load
side conductors 703 and 704 respectively. Contacts 721 and 722 are
coupled to third or load face side conductors 521 and 523 (See FIG.
23D). In this case, contact 601 is a line side movable arm face
neutral contact, contact 602 is a line side movable arm load
neutral contact, contact 611 is a line side movable arm face phase
contact, contact 612 is a line side movable arm load phase contact,
contact 701 is a load neutral arm contact, contact 702 is a load
phase arm contact, contact 721 is a face neutral terminal contact,
while contact 722 is a face phase terminal contact.
For example, FIG. 22A shows one side of the unlatched position or
first spatial arrangement of contacts 601, 602, 701, and 721,
wherein contacts 611 and 612 connected to conductor 610 are shown
positioned resting on load movable arm support 420, particularly on
support 425. In this case, conductor 704 which is coupled to
contact 702 is in an unmoved, and unlatched state, while contact
722 is positioned in a stationary position inside of intermediate
or middle housing 35, or 437. In this unlatched state, the contacts
and thereby their associated conductors are positioned on three
different planes 730, 731, and 732 as shown in FIG. 22A. In this
case, the first plane 732 is the position of the line side
contacts. The second plane 731 is the position of the load slide
contacts, while the third plane 730 is the position of the face
side contacts.
In FIG. 22B, lifter 430 is moved into a second intermediate
position, thereby moving conductor 610 into a second position so
that contact 612 contacts contact 722. In this intermediate state,
power is provided from the line side to the load side but it is not
provided to the face terminals because contact 602 is not in
contact with contact 701. This position forms the second spatial
arrangement of these contacts. Next, in FIG. 21C, lifter 430 is
moved into the third position, wherein all of the contacts are
latched together such that there is a single plane of contact 733
between line side contacts 601, 602, 611 and 612, load side
contacts 701, and 702, and face side contacts 721, and 722 as shown
in FIG. 22B. Thus, the first conductor forming the line side
conductor, the second conductor forming the load side conductor,
and the third conductor comprising the load side face conductor are
all on the same plane in this position. This closed or latched
position forms the third spatial arrangement for these contacts. In
this case, each conductor which has associated set of contacts each
has a phase side contact or set of contacts and a neutral side
contact or set of contacts. Thus, contacts 601, 602 can be neutral
side contacts, while contacts 611 and 612 can be phase side
contacts or vice versa if connected differently. Thus if contacts
601, and 602 are neutral side contacts, then contacts 701, and 721
are neutral side contacts as well, while contacts 702 and 722 are
phase side contacts which are configured to be in contact with
phase side contacts 611 and 612. In this case as shown in FIGS. 22A
and 22B, the contacts from the first conductor including contacts
601, and 602, are capable of contacting the contacts 721, and 701
of the second conductor, while contacts 611 and 612 are capable of
contacting the contacts 702, and 722 of the third conductor.
However, in the unlatched condition, the contacts 701, and 702 of
the second conductor, and the contacts 721, and 722 of the third
conductor are positioned offset from each other.
FIGS. 23A-23I show an example of the steps for the progression of
assembly of the device shown in FIGS. 1-20E. For example, as shown
in FIG. 23A in step 1, the assembly 400 shown in FIG. 1OB is
inserted into a back housing such as housing 33. Next, as shown in
FIG. 23B, trip slider spring 499a is coupled to trip slider 490.
Next, trip slider 490 is coupled to middle housing 437, in
particular, snapped into snap 448 which allows trip slider 490 to
move in a channel in middle housing 437.
Next, as shown in FIG. 23C, and in step 3, this middle housing
assembly comprising middle housing 437, trip slider 490 and trip
slider spring 499a is placed onto back housing 33, and adjacent to
the assembly 400. Next, in step 4 and as shown in FIG. 23D, strap
520 including face phase conductor 521, and face neutral conductor
523 are coupled to middle housing 437. Next, in step 5 and as shown
in FIG. 23E, reset spring 471 is coupled to this assembly,
particularly to spring holder 437a in middle housing 437. Next, in
step 6, the reset button assembly including reset button 480, latch
clasp 460 and latch 470 are placed through the center of reset
spring 471. This reset button assembly must be placed such that
latch 470 engages plunger 484 and latchplate 500 as shown in FIG.
23G. Next, in step 7, and as shown in FIG. 23H, test button 450
including test button spring 457 is placed into the face cover. The
test button is then inserted into the test button opening 444 in
front face cover 37 or 443.
Finally, in step 8 and as shown in FIG. 23I front cover 37 or 443
is then placed onto the assembly and then secured to this
assembly.
As stated above, any one of the embodiments shown in FIGS. 1-9 may
be used in combination with any one of the embodiments shown in
FIGS. 10A-23I. Alternatively, the embodiments shown in FIGS. 1-9
may be used separate from the embodiments shown in FIGS. 10A-23I.
Furthermore, the embodiments shown in FIGS. 10A-23I may be used
separate from the embodiments shown in FIGS. 1-9 as well.
Some of the benefits of the above embodiments are that because
there are nested transformers such as shown in the embodiments of
FIGS. 1-9, the depth of the housing can be reduced thereby allowing
for greater room in a wallbox to wire or connect wires to the
device.
In addition, with the embodiments shown in FIGS. 10A-23I, one
benefit is that because the latch has a momentum force which is
placed on a latch such as latch 470 opposite its axis of rotation,
this increases the mechanical advantage a device would have in
rotating latch 470 against frictional forces. In addition, with
this design, because of a rotating latch, rather than a translating
latch plate, this reduces the amount of frictional surface which
would be formed when moving the latch, to either open or latch the
contacts. An additional benefit is that because there is a
mechanical advantage in actuating or rotating latch 470 at an end
opposite its axis of rotation, this results in an easier latching
and unlatching of this latch. Therefore, due to the increased ease
of motion, a smaller solenoid can be used to selectively latch and
unlatch latch 470 from latch plate 500. Therefore, because a
smaller solenoid can be used, the depth of the device can be
further reduced.
Furthermore, the addition of a trip slider such as trip slider 490
creates a device which can provide indication status for the state
of the device as well. For example, trip slider 490 can include an
indicator such as a colored surface which when used in conjunction
with a translucent section or cut out 443a on the front cover or in
conjunction with a translucent test button, this colored surface
allows a user to track the position of the trip slider from a
latched position to an unlatched position. In addition, because of
the incorporation of this trip slider 490, this disables the
function of test button 450 thereby presenting a mechanical means
for preventing the testing and resetting the device.
Accordingly, while only a few embodiments of the present invention
have been shown and described, it is obvious that many changes and
modifications may be made thereunto without departing from the
spirit and scope of the invention.
* * * * *