U.S. patent application number 17/174945 was filed with the patent office on 2022-08-18 for real-time management of device maintenance.
The applicant listed for this patent is Hach Company. Invention is credited to Vishnu Vardhanan Rajasekharan, Russell Young.
Application Number | 20220263740 17/174945 |
Document ID | / |
Family ID | 1000005447017 |
Filed Date | 2022-08-18 |
United States Patent
Application |
20220263740 |
Kind Code |
A1 |
Rajasekharan; Vishnu Vardhanan ;
et al. |
August 18, 2022 |
REAL-TIME MANAGEMENT OF DEVICE MAINTENANCE
Abstract
An embodiment provides a method for real-time management of
device maintenance utilizing quality metrics defined based upon
inputs of the device, the method including: receiving inputs
corresponding to a particular device, wherein the particular device
provides measurements of a parameter of a fluid; generating, from
the inputs, quality metrics for and unique to the particular
device; monitoring the particular device while the particular
device is deployed, wherein the monitoring occurs in view of the
quality metrics; and triggering, responsive to detecting
information corresponding to the particular device is violating at
least one of the quality metrics, a notification to a user to
perform an action corresponding to the particular device.
Inventors: |
Rajasekharan; Vishnu Vardhanan;
(Fort Collins, CO) ; Young; Russell; (Fort
Collins, CO) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Hach Company |
Loveland |
CO |
US |
|
|
Family ID: |
1000005447017 |
Appl. No.: |
17/174945 |
Filed: |
February 12, 2021 |
Current U.S.
Class: |
1/1 |
Current CPC
Class: |
G06Q 10/20 20130101;
G01F 1/05 20130101; H04L 41/0681 20130101; H04L 43/065 20130101;
G01F 15/0755 20130101; G01F 23/2962 20130101 |
International
Class: |
H04L 12/26 20060101
H04L012/26; H04L 12/24 20060101 H04L012/24; G06Q 10/00 20060101
G06Q010/00 |
Claims
1. A method for real-time management of device maintenance
utilizing quality metrics defined based upon inputs of the device,
the method comprising: receiving inputs corresponding to a
particular device within a system of a plurality of devices,
wherein the particular device provides measurements of a parameter
of a fluid, wherein the inputs correspond to attributes
corresponding to a performance of the particular device;
generating, from the inputs, quality metrics for and unique to the
particular device, wherein the generating comprises generating
diagnostic aspects for and unique to the particular device, wherein
the diagnostic aspects provide indicators of values corresponding
to the inputs that indicate action with respect to the particular
device is needed, wherein the quality metrics and diagnostic
aspects are generated from performance parameters defined for the
particular device and wherein the performance parameters are based
upon a type of composite index that will be derived from the
measurements provided by the plurality of devices; monitoring the
particular device while the particular device is deployed, wherein
the monitoring occurs in view of the quality metrics, wherein the
monitoring is performed in view of algorithms that trigger
customized maintenance triggers for the particular device developed
from the quality metrics and diagnostic aspects; and triggering,
responsive to detecting information corresponding to the particular
device is violating at least one of the quality metrics, a
notification to a user to perform an action corresponding to the
particular device and the customized maintenance trigger.
2. The method of claim 1, wherein the inputs comprise at least one
of: device attributes, attributes of an environment the particular
device is within, and an application of the particular device.
3. The method of claim 1, wherein the composite index is derived
from the parameter of the fluid measured by the particular device
and other parameters of the fluid measured by other devices within
a device system including the particular device.
4. (canceled)
5. The method of claim 1, wherein the monitoring is further
performed in view of the diagnostic aspects.
6. The method of claim 5, wherein the triggering comprises
triggering the notification based upon a deviation from the
diagnostic aspects.
7. The method of claim 5, comprising validating, responsive to
detecting a deviation from the diagnostic aspects during the
monitoring, a performance of at least one other device in a system
of a plurality of devices including the particular device using the
deviation.
8. The method of claim 1, wherein the monitoring comprises
monitoring outputs of the particular device against the quality
metrics.
9. The method of claim 1, wherein the action comprises at least
one: maintenance of the particular device, calibration of the
particular device, and replacement of a component of the particular
device.
10. The method of claim 1, wherein the particular device is one of
a plurality of devices measuring parameters of the fluid.
11. A system for real-time management of device maintenance
utilizing quality metrics defined based upon inputs of the device,
the system comprising: a particular device; a memory storing
instructions executable by a processor to: receive inputs
corresponding to a particular device within a system of a plurality
of devices, wherein the particular device provides measurements of
a parameter of a fluid, wherein the inputs correspond to attributes
corresponding to a performance of the particular device; generate,
from the inputs, quality metrics for and unique to the particular
device, wherein the generating comprises generating diagnostic
aspects for and unique to the particular device, wherein the
diagnostic aspects provide indicators of values corresponding to
the inputs that indicate action with respect to the particular
device is needed, wherein the quality metrics and diagnostic
aspects are generated from performance parameters defined for the
particular device and wherein the performance parameters are based
upon a type of composite index that will be derived from the
measurements provided by the plurality of devices; monitor the
particular device while the particular device is deployed, wherein
the monitoring occurs in view of the quality metrics, wherein the
monitoring is performed in view of algorithms that trigger
customized maintenance triggers for the particular device developed
from the quality metrics and diagnostic aspects; and trigger,
responsive to detecting information corresponding to the particular
device is violating at least one of the quality metrics, a
notification to a user to perform an action corresponding to the
particular device and the customized maintenance trigger.
12. The system of claim 11, wherein the inputs comprise at least
one of: device attributes, attributes of an environment the
particular device is within, and an application of the particular
device.
13. The system of claim 11, wherein the composite index is derived
from the parameter of the fluid measured by the particular device
and other parameters of the fluid measured by other devices within
a device system including the particular device.
14. (canceled)
15. The system of claim 11, wherein the monitoring is further
performed in view of the diagnostic aspects.
16. The system of claim 15, wherein the triggering comprises
triggering the notification based upon a deviation from the
diagnostic aspects.
17. The system of claim 15, comprising validating, responsive to
detecting a deviation from the diagnostic aspects during the
monitoring, a performance of at least one other device in a system
of a plurality of devices including the particular device using the
deviation.
18. The system of claim 11, wherein the monitoring comprises
monitoring outputs of the particular device against the quality
metrics.
19. The system of claim 11, wherein the action comprises at least
one: maintenance of the particular device, calibration of the
particular device, and replacement of a component of the particular
device.
20. A system for real-time management of device maintenance
utilizing quality metrics defined based upon inputs of the device,
the system comprising: a plurality of devices that measure
parameters of a fluid; a memory storing instructions executable by
a processor to: receive inputs corresponding to a particular device
within a system of a plurality of devices, wherein the particular
device provides measurements of a parameter of a fluid, wherein the
inputs correspond to attributes corresponding to a performance of
the particular device; generate, from the inputs, quality metrics
for and unique to the particular device, wherein the generating
comprises generating diagnostic aspects for and unique to the
particular device, wherein the diagnostic aspects provide
indicators of values corresponding to the inputs that indicate
action with respect to the particular device is needed, wherein the
quality metrics and diagnostic aspects are generated from
performance parameters defined for the particular device and
wherein the performance parameters are based upon a type of
composite index that will be derived from the measurements provided
by the plurality of devices; monitor the particular device while
the particular device is deployed, wherein the monitoring occurs in
view of the quality metrics, wherein the monitoring is performed in
view of algorithms that trigger customized maintenance triggers for
the particular device developed from the quality metrics and
diagnostic aspects; and trigger, responsive to detecting
information corresponding to the particular device is violating at
least one of the quality metrics, a notification to a user to
perform an action corresponding to the particular device and the
customized maintenance trigger.
Description
FIELD
[0001] This application relates generally to fluid parameter
measurements, and, more particularly, to real-time management of
device maintenance of devices measuring fluid parameters.
BACKGROUND
[0002] Ensuring water quality is critical in a number of industries
such as pharmaceuticals and other manufacturing fields.
Additionally, ensuring water quality is critical to the health and
well-being of humans, animals, and plants which are reliant on the
water for survival. To determine the water quality devices are
deployed that measure different parameters of the water. Similarly,
devices can be deployed to measure different parameters of any
fluid. Since different devices may measure different parameters,
the measurement data from each of the devices is combined in order
to determine the overall quality or other multi-parameter
measurements or values.
BRIEF SUMMARY
[0003] One embodiment provides a method for real-time management of
device maintenance utilizing quality metrics defined based upon
inputs of the device, the method including: receiving inputs
corresponding to a particular device, wherein the particular device
provides measurements of a parameter of a fluid; generating, from
the inputs, quality metrics for and unique to the particular
device; monitoring the particular device while the particular
device is deployed, wherein the monitoring occurs in view of the
quality metrics; and triggering, responsive to detecting
information corresponding to the particular device is violating at
least one of the quality metrics, a notification to a user to
perform an action corresponding to the particular device
[0004] Another embodiment provides a system for real-time
management of device maintenance utilizing quality metrics defined
based upon inputs of the device, the system including: a particular
device; a memory storing instructions executable by a processor to:
receive inputs corresponding to a particular device, wherein the
particular device provides measurements of a parameter of a fluid;
generate, from the inputs, quality metrics for and unique to the
particular device; monitor the particular device while the
particular device is deployed, wherein the monitoring occurs in
view of the quality metrics; and trigger, responsive to detecting
information corresponding to the particular device is violating at
least one of the quality metrics, a notification to a user to
perform an action corresponding to the particular device.
[0005] A further embodiment provides a system for real-time
management of device maintenance utilizing quality metrics defined
based upon inputs of the device, the system including: a plurality
of devices that measure parameters of a fluid; a memory storing
instructions executable by a processor to: receive inputs
corresponding to a particular device of the plurality of devices,
wherein the particular device provides measurements of one of the
parameters of a fluid; generate, from the inputs, quality metrics
for and unique to the particular device; monitor the particular
device while the particular device is deployed, wherein the
monitoring occurs in view of the quality metrics; and trigger,
responsive to detecting information corresponding to the particular
device is violating at least one of the quality metrics, a
notification to a user to perform an action corresponding to the
particular device.
[0006] The foregoing is a summary and thus may contain
simplifications, generalizations, and omissions of detail;
consequently, those skilled in the art will appreciate that the
summary is illustrative only and is not intended to be in any way
limiting.
[0007] For a better understanding of the embodiments, together with
other and further features and advantages thereof, reference is
made to the following description, taken in conjunction with the
accompanying drawings. The scope of the invention will be pointed
out in the appended claims.
BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS
[0008] FIG. 1 illustrates an example method for real-time
management of device maintenance utilizing quality metrics defined
based upon inputs of the device.
[0009] FIG. 2 illustrates an example of computer circuitry.
DETAILED DESCRIPTION
[0010] It will be readily understood that the components of the
embodiments, as generally described and illustrated in the figures
herein, may be arranged and designed in a wide variety of different
configurations in addition to the described example embodiments.
Thus, the following more detailed description of the example
embodiments, as represented in the figures, is not intended to
limit the scope of the embodiments, as claimed, but is merely
representative of example embodiments.
[0011] Reference throughout this specification to "one embodiment"
or "an embodiment" (or the like) means that a particular feature,
structure, or characteristic described in connection with the
embodiment is included in at least one embodiment. Thus, the
appearance of the phrases "in one embodiment" or "in an embodiment"
or the like in various places throughout this specification are not
necessarily all referring to the same embodiment.
[0012] Furthermore, the described features, structures, or
characteristics may be combined in any suitable manner in one or
more embodiments. In the following description, numerous specific
details are provided to give a thorough understanding of
embodiments. One skilled in the relevant art will recognize,
however, that the various embodiments can be practiced without one
or more of the specific details, or with other methods, components,
materials, et cetera. In other instances, well known structures,
materials, or operations are not shown or described in detail to
avoid obfuscation.
[0013] Traditionally, even though multiple devices may be providing
measurement data for parameters of the same fluid, these devices
are not generally connected together within a system. Rather, each
of the devices provides the measurement data to a central device
and the device aggregates the measurement data from all the devices
to provide the desired overall multi-parameter measurement data.
Additionally, customers must maintain, clean, and calibrate each of
the devices under different protocols which is cumbersome to
maintain. The maintenance and calibration protocols are time-based,
meaning the protocols indicate that maintenance should be performed
at specific time intervals. Since different factors may result in
different operating conditions for and degradation of devices, even
of the same type, the time-based approach results in some devices
being over-maintained and some devices being under-maintained. This
results in higher costs and also compromises performance of the
devices, thereby resulting in measurement data that is compromised
and unreliable.
[0014] Accordingly, an embodiment provides a system and method for
real-time management of device maintenance utilizing quality
metrics defined based upon inputs from the device and from its
environment. Instead of relying on a time-based approach, the
described system and method can generate quality metrics and, in
some cases, diagnostic aspects for each device within a system. The
devices in the system may work together to each provide parameter
measurements that can then be used to determine an overall value or
index. Using the quality metrics and/or diagnostic aspects, the
system can monitor each of the devices in view of the quality
metrics generated for that device. The monitoring occurs while the
device is deployed, so any detection of violations of the quality
metrics or deviations from the diagnostic aspects occurs in
real-time. If a violation or deviation is detected, the system can
send a notification to a user that a corrective action needs to be
taken with respect to the device. For example, the system may
indicate that the device needs maintenance, calibration, component
replacement, or the like.
[0015] Accordingly, the system provides maintenance indications
on-demand instead of relying on time-based techniques. The
on-demand or real-time maintenance indications provide a system
that results in devices that are maintained when necessary as
opposed to under-maintained or over-maintained as found in
conventional systems. Additionally, since devices are not being
maintained when maintenance is not needed, costs and labor
associated with maintenance are reduced. Additionally, since the
devices are properly maintained the measurement data being provided
by the devices is more accurate and is not compromised as in
conventional systems. Since the confidence in the measurement data
from each of the devices is higher, the confidence in
values/information derived or based upon multi-parameter
measurement data is also higher. Thus, the system provides a more
cost effective technique that results in better quality measurement
data and better quality overall multi-parameter measurement
information as compared with conventional techniques.
[0016] The illustrated example embodiments will be best understood
by reference to the figures. The following description is intended
only by way of example, and simply illustrates certain example
embodiments.
[0017] FIG. 1 illustrates an example method for real-time
management of device maintenance utilizing quality metrics defined
based upon inputs of the device. At 101 the system may receive
inputs from sensors, analyzers, or other instruments or devices in
a multi-parameter system. The system can then process these inputs
to correlate the inputs to a particular device at 102. Thus, at 103
the system receives inputs corresponding to a particular device
(e.g., probe, sensor, measurement equipment, etc.). Alternatively,
if the device is not in a multi-parameter system, the system may
simply receive inputs from the device at 103 and may not perform
steps 101 or 102.
[0018] The described system and method provides quality metrics,
diagnostic aspects, and monitoring for each device individually and
unique from other devices that may be deployed within a system or
in the same fluid. Some example quality metrics include relative
standard deviation, light transmittance percentage at the interface
of the sample and measuring material, difference in flow rates,
difference in temperature, difference in pressure, difference in
color, light source intensity, relational dependence between
interdependent parameters, impedance across the transducer,
resistance across the junction/frit in a reference electrode, and
the like. Accordingly, the inputs received at 103 are unique for
each device. However, some input values may be the same across
multiple devices. The device, referred to as a particular device,
provides measurements of parameters of a fluid, for example, water,
effluent, influent, or the like. Some example parameters may
include pH, alkalinity, hardness, conductivity, free chlorine,
total chlorine, total dissolved solids, and/or the like. While a
single device may measure a single parameter, to get an overall
picture of a fluid, multiple devices may be deployed within the
fluid, with at least some of the devices measuring different
parameters within the fluid. Accordingly, the particular device may
be one of a plurality of devices within a system providing
measurement data regarding parameters of the fluid.
[0019] The inputs received at 103 provide an indication or
identification of different attributes that may affect the
performance, degradation, measurement values, or the like of the
particular device. Thus, the inputs may include inputs identifying
attributes of the device, inputs identifying operating conditions
or attributes of an environment of the device, inputs identifying
an application of the device, and/or the like. Examples of inputs
identifying attributes of the device include, but are not limited
to, make and model of the device, calibration status, length of
deployment, time of last service, different components within the
device, parameter being measured by the device, sensitivity of the
device, and/or the like. Examples of inputs identifying operating
conditions or attributes of an environment of the device include,
but are not limited to, environmental temperature, fluid
temperature, causticity of the fluid, fluid volume, geographical
features, weather information, and/or the like. Examples inputs
identifying an application of the device include, but are not
limited to, identification of a multi-parameter value or composite
index that is utilizing the measurement data of the device,
function of the overall system (e.g., treatment facility,
distribution facility, manufacturing facility, etc.), function of
the fluid (e.g., effluent, influent, potable water, etc.), and/or
the like.
[0020] At 104 the system generates quality metrics for and unique
to the particular device from the inputs received at 103. Quality
metrics may identify thresholds, ranges, or other indicators of
values that may be received from the device that indicate a desired
performance of the device. The system may also generate diagnostic
aspects for and unique to the particular device. Diagnostic aspects
identify different thresholds, ranges, or other indicators of
values that may be received from the device that indicate action
should be taken with respect to the device. Generation of the
quality metrics and/or diagnostic aspects are defined and generated
based upon the application of the particular device and a type of
composite index or overall value that will be derived from
individual parameters being measured by each of the devices within
a system.
[0021] Specifically, the system identifies or defines performance
parameters for each device based upon the application and a type of
composite index or overall value that will be derived from the
individual parameters. The performance parameters may also be
based, at least in part, on some of the inputs received at 103. For
example, a sensitivity of the device may define how accurate the
measurements of the device are, thereby affecting the performance
parameters of the device. Once the performance parameters are
defined, the system can generate the quality metrics and/or
diagnostic aspects. In generating the quality metrics and/or
diagnostic aspects, the system aggregates the inputs received at
103 to identify factors from the inputs that will affect the
performance of the device. For example, environmental condition may
affect how quickly a device degrades. As another example, if the
device is within a caustic environment, the device may degrade more
quickly than the same type of device in a non-caustic environment.
As another example, the experience of the operator in handing the
instrument may affect how the instrument performs or how often the
device needs calibrated. As a final, non-limiting example, the age
of a device may affect how quickly the device needs calibrated. The
identified factors are used to generate the quality metrics and/or
diagnostic aspects.
[0022] Once the quality metrics and/or diagnostic aspects are
generated, the system develops algorithms that trigger customized
maintenance triggers for each device. Thus, at 105 the system
monitors the device while the device is deployed. While monitoring
the device, the system compares different information or outputs
provided by the device, information from the environment of the
device, or the like, against the quality metrics and/or diagnostic
aspects. Accordingly, the monitoring occurs in view of the quality
metrics and/or diagnostic aspects. As an example, the system may
receive electrical information from a sensor within the device.
This electrical information may be compared against the quality
metric and/or diagnostic aspect while the device is deployed. As
another example, the system may receive indications of
environmental conditions that can be compared against the quality
metric and/or diagnostic aspect. An environmental condition, for
example, temperature, violating the quality metric and/or deviating
from the diagnostic aspect would indicate additional action may
need to be taken.
[0023] Accordingly, at 106, the system determines if the
information of the device, environmental conditions, or the like,
is indicating a violation of the quality metrics and/or a deviation
from the diagnostic aspects. The indication may be that the values
or output being received is outside a threshold, range, or other
parameter as compared to the corresponding quality metric and/or
diagnostic aspect. If there is no violation or deviation detected
at 106, the system may continue to monitor the device in view of
the quality metrics and/or diagnostic aspects at 105.
[0024] If, on the other hand, a violation or deviation is detected
at 106, the system will trigger a notification to a user to perform
an action corresponding to the particular device at 107. In other
words, responsive to detecting that the information corresponding
to the particular device is violating at least one of the quality
metrics and/or is deviating from at least one of the diagnostic
aspects, the system may trigger a notification of the same to the
user. The notification may be any type of notification (e.g.,
pop-up window, transmission of a message to another device, alert
on the device or a central device receiving information from the
device itself, transmission to print a document, etc.) and may be
presented on the device itself, a second device, or the like. The
notification may indicate that the user needs to perform a
particular action with respect to the device in order to bring it
into compliance with the quality metric and/or diagnostic aspect.
The action may be a corrective action for example, device
maintenance, device calibration, component replacement, or the
like.
[0025] Based upon the output information and/or identifying which
quality metric and/or diagnostic aspect is being violated or
deviated from, the system may identify which of the corrective
actions should be taken. For example, deviation from one quality
metric may indicate that maintenance needs to be performed, while
deviation from a different quality metric may indicate that a
component of the device needs to be replaced. Additionally, the
system may perform other functions if a violation or deviation is
detected. For example, the system may validate the performance of
other devices within the system based upon detecting a deviation
from a diagnostic aspect by one device within the system. Thus, the
maintenance, calibration, validation, verification of protocols,
and the like, are implemented at 108.
[0026] The system also provides that a user of the system can
provide input to the system to modify how quality metrics are
generated, how frequently monitoring occurs, when notifications are
triggered, and the like. For example, one user, depending on the
application, may have a higher risk tolerance and so may want wider
quality metric tolerances, less frequent monitoring, and/or more
flexibility regarding when notifications are triggered as opposed
to a user having a lower risk tolerance. Thus, the described system
optimizes cost and performance of devices while still maintaining
an accuracy of the devices via maintenance (e.g., maintenance,
calibration, component replacement, etc.) using an on-demand or
condition/event-based maintenance notification as opposed to a
time-based maintenance schedule.
[0027] Some overall examples of the full system including the
device, auxiliary diagnostic measurements, inputs, quality metrics,
and actions, are provided as follows. These examples illustrate use
cases where internal information from the device, external
information from the process, and metadata from the environment are
used to provide real-time, on-demand maintenance of a
multiparameter system to increase the performance of the devices
while reducing the overhead the results from unnecessary time-based
maintenance as found in current systems. As one example, the
multiparameter system is an optical system having the following
devices: spectrophotometric probes and analyzers. In this example,
the parameters that are measured are turbidity, UV 254, color,
Total organic carbon, Dissolved organic carbon, and chemical oxygen
demand. Auxiliary diagnostic measurements that are incorporated in
the devices include flow, temperature, pressure, and auxiliary
light transmittance. In this example system, the quality metrics
and inputs with threshold values are relative standard deviation
having a threshold value of 0.1 to 5% depending on the application
(e.g., 0.1% of filtered final effluent, 5% in water reuse
applications, etc.), light transmittance percentage at the
interface of the sample and measuring material having a threshold
value of less than 5% of the typical value, difference in flow
rates having a threshold value of +/-5% of the typical values,
difference in temperature having a threshold value of +/-5% of the
typical values, difference in pressure having a threshold value of
+/-5% of the typical values, difference in color having a threshold
value of +/-5% of the typical values, light source intensity having
a threshold value of +/-5% of the typical values, relational
dependence between interdependent parameters (e.g., turbidity and
UV/Vis transmittance) having a threshold value of +/-5% direct
correlation. In the event that the quality metrics or inputs do not
meet the threshold values and the performance metrics of the system
are met, then mitigation actions may be implemented. For example,
in the event that the relative standard deviation fail to meet the
threshold values, instrument calibration may need to be performed,
electrical and/or optical component validation and/or replacement
may need to be performed, or the like. As another example, if the
light transmittance percentage does not meet the threshold values,
mitigation actions may include cleaning of the sample/sensing
system interface, a physical and chemical cleaning system needs to
be implemented, or the like. Other example mitigation actions based
upon the different quality metrics/inputs not meeting threshold
values may include checking for blockages, checking for leakages in
the measuring device, temperature compensation and thermistor
performance needs to be checked, dilution or concentration
protocols may need to be implemented, amplification or attenuation
of the light source, replacement of the light source, checking the
light source, signal transduction, calibration and invocation of
maintenance protocols, or the like.
[0028] As another example, the multiparameter system is an
electrochemical system with the following devices: ion selective
probes, potentiometric devices, and voltammetric devices that
measure pH, oxidation reduction potential, ammonia, and nitrate
parameters, amperometric devices that measures the chlorine
parameter, and alternative current devices that measure the
conductivity parameter. These devices may also provide the
auxiliary diagnostic measurements including secondary measuring
systems to determine impedance, resistance, volume, level, flow,
pressure, and temperature. The quality metrics/inputs and
corresponding threshold values may include impedance across the
transducer having a threshold value of +/-5% of the typical values,
resistance across the junction/frit in the reference electrode
having a threshold value of +/-5% of the typical values, volume and
level of inner fill solution having a threshold value of +/-5% of
the typical values, difference in flow rates having a threshold
value of +/-5% of the typical values, difference in temperature
having a threshold value of +/-5% of the typical values, difference
in pressure having a threshold value of +/-5% of the typical
values, and relational dependence between pH and conductivity
having a threshold value of the lower of the pH and the higher of
the conductivity. Example mitigation actions may include checking
for any fluid leakage through the transducer, checking the fluid
flux across the reference electrode junction, chemically cleaning
the junction or replacing the junction, checking for blockages or
leakages in the measuring devices, temperature compensation and
thermistor performance needing checked, calibration of the pH and
conductivity and invocation of the maintenance protocols, and the
like.
[0029] While various other circuits, circuitry or components may be
utilized in information handling devices, with regard to an
instrument for alkalinity measurement according to any one of the
various embodiments described herein, an example is illustrated in
FIG. 2. Device circuitry 10' may include a measurement system on a
chip design found, for example, a particular computing platform
(e.g., mobile computing, desktop computing, etc.) Software and
processor(s) are combined in a single chip 11'. Processors comprise
internal arithmetic units, registers, cache memory, busses, I/O
ports, etc., as is well known in the art. Internal busses and the
like depend on different vendors, but essentially all the
peripheral devices (12') may attach to a single chip 11'. The
circuitry 10' combines the processor, memory control, and I/O
controller hub all into a single chip 11'. Also, systems 10' of
this type do not typically use SATA or PCI or LPC. Common
interfaces, for example, include SDIO and I2C.
[0030] There are power management chip(s) 13', e.g., a battery
management unit, BMU, which manage power as supplied, for example,
via a rechargeable battery 14', which may be recharged by a
connection to a power source (not shown). In at least one design, a
single chip, such as 11', is used to supply BIOS like functionality
and DRAM memory.
[0031] System 10' typically includes one or more of a WWAN
transceiver 15' and a WLAN transceiver 16' for connecting to
various networks, such as telecommunications networks and wireless
Internet devices, e.g., access points. Additionally, devices 12'
are commonly included, e.g., a transmit and receive antenna,
oscillators, PLLs, etc. System 10' includes input/output devices
17' for data input and display/rendering (e.g., a computing
location located away from the single beam system that is easily
accessible by a user). System 10' also typically includes various
memory devices, for example flash memory 18' and SDRAM 19'.
[0032] It can be appreciated from the foregoing that electronic
components of one or more systems or devices may include, but are
not limited to, at least one processing unit, a memory, and a
communication bus or communication means that couples various
components including the memory to the processing unit(s). A system
or device may include or have access to a variety of device
readable media. System memory may include device readable storage
media in the form of volatile and/or nonvolatile memory such as
read only memory (ROM) and/or random access memory (RAM). By way of
example, and not limitation, system memory may also include an
operating system, application programs, other program modules, and
program data.
[0033] Embodiments may be implemented as an instrument, system,
method or program product. Accordingly, an embodiment may take the
form of an entirely hardware embodiment, or an embodiment including
software (including firmware, resident software, micro-code, etc.)
that may all generally be referred to herein as a "circuit,"
"module" or "system." Furthermore, embodiments may take the form of
a program product embodied in at least one device readable medium
having device readable program code embodied thereon.
[0034] A combination of device readable storage medium(s) may be
utilized. In the context of this document, a device readable
storage medium ("storage medium") may be any tangible, non-signal
medium that can contain or store a program comprised of program
code configured for use by or in connection with an instruction
execution system, apparatus, or device. For the purpose of this
disclosure, a storage medium or device is to be construed as
non-transitory, i.e., not inclusive of signals or propagating
media.
[0035] This disclosure has been presented for purposes of
illustration and description but is not intended to be exhaustive
or limiting. Many modifications and variations will be apparent to
those of ordinary skill in the art. The embodiments were chosen and
described in order to explain principles and practical application,
and to enable others of ordinary skill in the art to understand the
disclosure for various embodiments with various modifications as
are suited to the particular use contemplated.
[0036] Thus, although illustrative example embodiments have been
described herein with reference to the accompanying figures, it is
to be understood that this description is not limiting and that
various other changes and modifications may be affected therein by
one skilled in the art without departing from the scope or spirit
of the disclosure.
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