U.S. patent application number 17/408962 was filed with the patent office on 2021-12-09 for measurement system and method of operating a measurement system.
This patent application is currently assigned to Rohde & Schwarz GmbH & Co. KG. The applicant listed for this patent is Rohde & Schwarz GmbH & Co. KG. Invention is credited to Christian Benisch, Markus Gallhauser, Werner Perndl, Nino Voss.
Application Number | 20210382089 17/408962 |
Document ID | / |
Family ID | 1000005842869 |
Filed Date | 2021-12-09 |
United States Patent
Application |
20210382089 |
Kind Code |
A1 |
Benisch; Christian ; et
al. |
December 9, 2021 |
MEASUREMENT SYSTEM AND METHOD OF OPERATING A MEASUREMENT SYSTEM
Abstract
A measurement system including a measurement device and at least
a first probe unit and a second probe unit is disclosed. The first
probe unit and the second probe unit are each connected to the
measurement device in a signal transmitting manner The measurement
device includes a control circuit. The first probe unit includes an
interface module being configured to receive a user input, to
generate an input data signal based on the received user input, and
to provide the input data signal to the control circuit. The
control circuit is configured to generate and provide a control
signal at least to the second probe unit based on the input data
signal. At least the second probe unit is configured to adjust an
operational parameter based on the control signal, wherein the
operational parameter relates to a measurement parameter to be
measured Moreover, a method for operating a measurement system is
disclosed.
Inventors: |
Benisch; Christian; (Munich,
DE) ; Perndl; Werner; (Munich, DE) ;
Gallhauser; Markus; (Munich, DE) ; Voss; Nino;
(Munich, DE) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Rohde & Schwarz GmbH & Co. KG |
Munich |
|
DE |
|
|
Assignee: |
Rohde & Schwarz GmbH & Co.
KG
Munich
DE
|
Family ID: |
1000005842869 |
Appl. No.: |
17/408962 |
Filed: |
August 23, 2021 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
16276091 |
Feb 14, 2019 |
11125587 |
|
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17408962 |
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Current U.S.
Class: |
1/1 |
Current CPC
Class: |
G01R 13/0272
20130101 |
International
Class: |
G01R 13/02 20060101
G01R013/02 |
Foreign Application Data
Date |
Code |
Application Number |
Mar 13, 2018 |
EP |
18161600.4 |
Claims
1. A measurement system comprising a measurement device and at
least a first probe unit and a second probe unit, the first probe
unit and the second probe unit each being connected to the
measurement device in a signal transmitting manner; the measurement
device comprising a control circuit; the first probe unit
comprising an interface module, the interface module being
configured to receive a user input, the interface module further
being configured to generate an input data signal based on the
received user input, the interface module further being configured
to provide the input data signal to the control circuit; the
control circuit being configured to generate and provide a control
signal at least to the second probe unit based on the input data
signal; and at least the second probe unit being configured to
adjust an operational parameter based on the control signal,
wherein the operational parameter relates to a measurement
parameter to be measured.
2. The measurement system according to claim 1, wherein the
operational parameter is associated with at least one of a power
status of the second probe, a voltage measurement mode of the
second probe, or a current measurement mode of the second
probe.
3. The measurement system according to claim 1, wherein the
operational parameter is associated with at least one of a
magnitude of a voltage to be measured or a magnitude of a current
to be measured.
4. The measurement system according to claim 1, wherein the control
circuit is configured to provide the control signal to the second
probe unit and the measurement device.
5. The measurement system according to claim 4, wherein the
measurement device is configured to adjust an operational parameter
of the measurement device based on the control signal.
6. The measurement system according to claim 5, wherein the
operational parameter of the measurement device is associated with
at least one of a power status of the measurement device, a voltage
resolution of the measurement device, a voltage range of the
measurement device, a current resolution of the measurement device,
or a current range of the measurement device.
7. The measurement system according to claim 1, wherein at least
one of the first and the second probe units comprises a detector
unit being configured to at least one of detect and transmit
electromagnetic signals.
8. The measurement system according to claim 6, wherein the
detector unit comprises a first and a second interface, the first
interface being configured to receive electromagnetic waves and to
provide a measurement signal to the second interface.
9. The measurement system according to claim 7, wherein the second
interface is configured to generate a processed measurement signal
based on the measurement signal.
10. The measurement system according to claim 8, wherein a
frequency of the processed measurement signal is lower than a
frequency of the received electromagnetic waves.
11. The measurement system according to claim 1, wherein the
control signal is also forwarded to the first probe unit.
12. The measurement system according to claim 1, wherein the
control signal comprises at least one control command selected from
the group of: switch on at least one of the first probe unit, the
second probe unit and the measurement device; switch off at least
one of the first probe unit, the second probe unit and the
measurement device; transmit data to at least one of the first
probe unit, the second probe unit and the measurement device; and
adjust a trigger condition.
13. The measurement system according to claim 1, wherein the first
probe unit comprises a monitoring unit being connected to the
measurement device in a signal transmitting manner
14. The measurement system according to claim 12, the monitoring
unit being configured to indicate a status of at least one of the
probe units.
15. The measurement system according to claim 12, the monitoring
unit being configured to indicate a representation of the control
signal.
16. A method of operating a measurement system, the measurement
system comprising a measurement device and at least a first probe
unit and a second probe unit, wherein the measurement device
comprises a control circuit, and wherein the first probe unit
comprises an interface module, the method comprising: receiving a
user input via the interface module of the first probe unit;
generating an input data signal based on the user input by the
interface module of the first probe unit; forwarding the input data
signal to the control circuit; generating a control signal based on
the input data signal by the control circuit; and adjusting at
least one operational parameter of the second probe unit based on
the control signal, wherein the operational parameter relates to a
measurement parameter to be measured.
17. The method of claim 16, wherein the operational parameter is
associated with at least one of a power status of the second probe,
a voltage measurement mode of the second probe, or a current
measurement mode of the second probe.
18. The method of claim 16, wherein the operational parameter is
associated with at least one of a magnitude of a voltage to be
measured or a magnitude of a current to be measured.
19. The method of claim 16, wherein an operational parameter of the
measurement device is adjusted based on the control signal.
20. The method of claim 19, wherein the operational parameter of
the measurement device is associated with at least one of a power
status of the measurement device, a voltage resolution of the
measurement device, a voltage range of the measurement device, a
current resolution of the measurement device, or a current range of
the measurement device.
Description
CROSS-REFERENCES TO RELATED APPLICATIONS
[0001] This application is a continuation-in-part of U.S.
Application Ser. No. 16/276091, filed on Feb. 14, 2019, which takes
priority from European Application No. 18161600.4, filed Mar. 13,
2018, the disclosures of which are incorporated herein in their
entirety.
FIELD OF THE DISCLOSURE
[0002] The present disclosure concerns a measurement system as well
as a method of operating a measurement system.
BACKGROUND
[0003] For certain measurements, several measurement probes may be
connected to a main measurement device, wherein the probes may be
located at a certain distance from the main measurement device.
[0004] In prior art measurement systems, operational parameters of
the measurement system are adjusted via a graphical user interface
at the main measurement device. Therefore, the operator or rather
the user of the measurement system always has to operate the main
measurement device for adjusting the operational parameters. Thus,
it is not possible for the user to adjust the operational
parameters of the measurement system when he is not near to the
main measurement device. This can cause various difficulties when
configuring the probes, in particular a functional interaction
between the probes. Particularly, the installation and setup of the
measurement system may be time-consuming.
[0005] Therefore, the object is to provide a measurement system as
well as a method of operating a measurement system, which improve
the disadvantages of the state of the art.
SUMMARY
[0006] According to the present disclosure, the problem is solved
by a measurement system comprising a measurement device and at
least a first probe unit and a second probe unit. The first probe
unit and the second probe unit each are connected to the
measurement device in a signal transmitting manner The measurement
device comprises a control circuit. The first probe unit comprises
an interface, such as an interface module. The interface module is
configured to receive a user input and to generate an input data
signal based on the received user input. The interface module
further is configured to provide the input data signal to the
control circuit. The control circuit is configured to generate and
provide a control signal at least to the second probe unit based on
the input data signal. At least the second probe unit is configured
to adjust an operational parameter based on the control signal,
wherein the operational parameter relates to a measurement
parameter to be measured
[0007] Accordingly, a user input received via the first probe unit
is processed by the control circuit of the measurement device to
provide a control signal to at least the second probe unit.
Therefore, a user may control the second probe unit (which is
possibly located a certain distance away from the first probe)
without having to walk to the second probe or to the measurements
device. This way, configuring the probe units, for example a
functional interaction between the probe units, is greatly
simplified for the user. Of course, the first probe unit may also
be controlled via the interface module, such that a user can
control the first probe unit and the second probe unit while
standing at the first probe unit.
[0008] Moreover, the second probe unit may also comprise an
interface, such as an interface module, being configured similar to
the interface module of the first probe unit, such that a user may
control all probe units while standing at either one of them.
[0009] Generally, the probe units are formed separately from each
other. Hence, the measurement system comprises at least two
separately formed probe units.
[0010] In addition, the measurement device may be established
separately with respect to the probe units so that the measurement
system comprises at least two separately formed probe units as well
as one separately formed measurement device.
[0011] The first probe unit may be configured to perform analog or
digital signal processing. The measurement device may be an
oscilloscope, a logic analyzer and/or any other measurement device
suitable for a particular measurement at hand. Moreover, the probe
units may be connected to the measurement device either tethered or
wirelessly or both.
[0012] According to an aspect, the operational parameter is
associated with at least one of a power status of the second probe
unit, a voltage measurement mode of the second probe unit, or a
current measurement mode of the second probe unit. Thus, the second
probe unit may be switched on or off by the control signal in
response to the user input received by the interface module of the
first probe unit. Alternatively or additionally, the second probe
unit may be set to a voltage measurement mode and/or to a current
measurement mode of the control signal in response to the user
input received by the interface module of the first probe unit.
[0013] Alternatively or additionally, the operational parameters
may comprise one or more selected from the group of: an operational
status (e.g. "on" or "off"), a measurement activity status, a
frequency to be measured and a bandwidth of a frequency band to be
measured. If the control signal is also provided to the first probe
unit and/or the measurement device, the first probe unit and/or the
measurement device may also be configured to adjust an operational
parameter. Accordingly, the operational parameter may relate to a
measurement parameter, namely a parameter to be measured.
[0014] In an embodiment, the operational parameter is associated
with at least one of a magnitude of a voltage to be measured or a
magnitude of a current to be measured. Thus, an operational range
of the second probe unit may be adapted by the control signal, such
that different signals having different magnitudes of voltage
and/or current can be measured. For example, the second probe unit
may be adapted from measuring voltages in the order of millivolts
to measuring voltages in the order of volts.
[0015] According to one aspect, the control circuit is configured
to provide the control signal to the second probe unit and the
measurement device. This way, the user may control both the second
probe unit and the measurement device while standing at the first
probe unit without leaving the first probe unit.
[0016] In some embodiments, the measurement device is configured to
adjust an operational parameter of the measurement device based on
the control signal. Therefore, a user may control the measurement
device (which is possible located a certain distance away from the
first probe unit) without having to walk to the measurement device.
This way, configuring the measurement device is greatly simplified
for the user.
[0017] The operational parameter of the measurement device may be
associated with at least one of a power status of the measurement
device, a voltage resolution of the measurement device, a voltage
range of the measurement device, a current resolution of the
measurement device, or a current range of the measurement device.
Accordingly, internal settings of the measurement device can be
adapted by the user by operating the first probe unit, i.e.,
without having to operate the measurement device itself.
[0018] The measurement device may be configured to store the input
data signal and/or visualize the input data signal via a graphical
user interface.
[0019] In a further aspect, at least one of the first and the
second probe units comprises a detector unit being configured to at
least one of detect and transmit electromagnetic signals. In
particular, the detector unit is configured to detect and/or
transmit electromagnetic signals such as radio frequency (RF)
signals. For example, the detector unit may comprise an antenna, in
particular a tapered slot (Vivaldi) antenna.
[0020] In another embodiment of the present disclosure, the
detector unit comprises a first and a second interface, the first
interface being configured to receive electromagnetic waves and to
provide a measurement signal to the second interface. The first
interface may be an interface for receiving radio frequency
signals.
[0021] According to a further aspect, the second interface is
configured to generate a processed measurement signal based on the
measurement signal. In other words, the second interface converts
the measurement signal provided by the first interface to a signal
suitable for the measurement device. Accordingly, the second
interface may be configured to generate an analog processed
measurement signal and/or a digital processed measurement signal,
depending on the kind of signal the measurement device is
configured to process.
[0022] In another aspect, a frequency of the processed measurement
signal is lower than a frequency of the received electromagnetic
waves. Put another way, the processed measurement signal is
down-converted from the measurement signal provided by the first
interface.
[0023] The control signal may also be forwarded to the first probe
unit. Thus, both probe units may be controlled by the user while
standing at the first probe unit.
[0024] In a certain embodiment of the present disclosure, the
control signal comprises at least one control command selected from
the group of: switch on at least one of the first probe unit, the
second probe unit and the measurement device; switch off at least
one of the first probe unit, the second probe unit and the
measurement device; transmit data to at least one of the first
probe unit, the second probe unit and the measurement device; and
adjust a trigger condition.
[0025] According to one aspect, the first probe unit comprises a
monitoring unit comprised of one or more circuits. The monitoring
unit is connected to the measurement device in a signal
transmitting manner Via the monitoring unit, operational parameters
of the measurement system may be indicated to the user. The
monitoring unit may indicate the operational parameters
graphically, e.g., via a display, or by means of one or more status
lights. Alternatively or additionally, the operational parameters
may also be indicated acoustically, e.g., with predefined acoustic
patterns
[0026] According to another aspect, the monitoring unit is
configured to indicate a status of at least one of the probe units.
Thus, the user is informed about the status (e.g., "on" or "off")
of the probe units without walking to the measurement device or
other probe units.
[0027] In another embodiment of the present disclosure, the
monitoring unit is configured to indicate a representation of the
control signal. For example, the monitoring unit displays a
representation of possible control commands, in particular in the
form of a list or a drop-down menu. This way, configuring the probe
units and/or the measurement device is facilitated.
[0028] According to one embodiment, the measurement system, in
particular the control circuit, is configured to provide the
control signal to the second probe unit and the measurement
device.
[0029] According to another embodiment, the measurement system, in
particular the control circuit, is configured to provide the
control signal only to the second probe unit.
[0030] According to the present disclosure, the problem is also
solved by a method of operating a measurement system, in particular
a measurement system as described above, wherein the measurement
system comprises a measurement device and at least a first probe
unit and a second probe unit. The measurement device comprises a
control circuit. The first probe unit comprises an interface, such
as an interface module. In an embodiment, the method comprises the
following steps:
[0031] receiving a user input via interface module of the first
probe unit;
[0032] generating an input data signal based on the user input by
the interface module of the first probe unit;
[0033] forwarding the input data signal to the control circuit;
[0034] generating a control signal based on the input data signal
by the control circuit; and
[0035] adjusting at least one operational parameter of the second
probe unit based on the control signal, wherein the operational
parameter relates to a measurement parameter to be measured.
[0036] Of course, also operational parameters of the first probe
unit and/or the measurement device may be adjusted. With regards to
the advantages, reference is made to the explanations given
above.
[0037] As mentioned above, the control signal is generated by the
control circuit, which is integrated in the measurement device so
that the control signal is generated by the measurement device.
[0038] Moreover, the second probe unit or rather the second probe
unit and the measurement device may be set appropriately by the
control signal.
[0039] According to an aspect, the operational parameter is
associated with at least one of a power status of the second probe
unit, a voltage measurement mode of the second probe unit, or a
current measurement mode of the second probe unit. Thus, the second
probe unit may be switched on or off by the control signal in
response to the user input received by the interface module of the
first probe unit. Alternatively or additionally, the second probe
unit may be set to a voltage measurement mode and/or to a current
measurement mode by the control signal in response to the user
input received by the interface module of the first probe unit.
[0040] Alternatively or additionally, the operational parameters
may comprise one or more selected from the group of: an operational
status (e.g. "on" or "off"), a measurement activity status, a
frequency to be measured and a bandwidth of a frequency band to be
measured. If the control signal is also provided to the first probe
unit and/or the measurement device, the first probe unit and/or the
measurement device may also be configured to adjust an operational
parameter. Accordingly, the operational parameter may relate to a
measurement parameter, namely a parameter to be measured.
[0041] In an embodiment, the operational parameter is associated
with at least one of a magnitude of a voltage to be measured or a
magnitude of a current to be measured. Thus, an operational range
of the second probe unit may be adapted by the control signal, such
that different signals having different magnitudes of voltage
and/or current can be measured. For example, the second probe unit
may be adapted from measuring voltages in the order of millivolts
to measuring voltages in the order of volts.
[0042] In an embodiment, an operational parameter of the
measurement device is adjusted based on the control signal.
Therefore, a user may control the measurement device (which is
possibly located a certain distance away from the first probe unit)
without having to walk to the measurement device. This way,
configuring the measurement device is greatly simplified for the
user.
[0043] In a further embodiment, the operational parameter of the
measurement device is associated with at least one of a power
status of the measurement device, a voltage resolution of the
measurement device, a voltage range of the measurement device, a
current resolution of the measurement device, or a current range of
the measurement device. Accordingly, internal settings of the
measurement device can be adapted by the user by operating the
first probe unit, i.e., without having to operate the measurement
device itself.
DESCRIPTION OF THE DRAWINGS
[0044] The foregoing aspects and many of the attendant advantages
of the claimed subject matter will become more readily appreciated
as the same become better understood by reference to the following
detailed description, when taken in conjunction with the
accompanying drawings, wherein:
[0045] FIG. 1 shows a measurement system according to a first
embodiment of a measurement system according to the present
disclosure;
[0046] FIG. 2 shows a measurement system according to another
embodiment of a measurement system according to the present
disclosure; and
[0047] FIG. 3 shows a schematic flow chart of a representative
method for operating a measurement system according to an
embodiment of the present disclosure.
DETAILED DESCRIPTION
[0048] The detailed description set forth below in connection with
the appended drawings, where like numerals reference like elements,
is intended as a description of various embodiments of the
disclosed subject matter and is not intended to represent the only
embodiments. Each embodiment described in this disclosure is
provided merely as an example or illustration and should not be
construed as preferred or advantageous over other embodiments. The
illustrative examples provided herein are not intended to be
exhaustive or to limit the claimed subject matter to the precise
forms disclosed.
[0049] FIG. 1 shows a measurement system 10 comprising a first
probe unit 12, a second probe unit 14 and a measurement device 16
which are separately formed from each other. The measurement system
10 may also comprise additional probe units.
[0050] The measurement device 16 may be an oscilloscope, a logic
analyzer and/or any other measurement device suitable for a
particular measurement at hand.
[0051] The first probe unit 12 and the second probe unit 14 are
connected to the measurement device 16 in a signal transmitting
manner (indicated by the dashed arrows in FIGS. 1 and 2), which may
be tethered or wireless.
[0052] The first probe unit 12 and the second probe unit 14 unit
can each be configured to perform any kind of measurements. In the
example shown in FIGS. 1 and 2, the first probe unit 12 and the
second probe unit 14 comprise detector units 18, 20 that are each
configured to detect and/or transmit electromagnetic signals, for
example radio frequency signals. In some embodiments, the detector
units 18, 20 are configured as tapered slot (Vivaldi) antennas.
[0053] At least one of the detector units 18, 20 may comprise a
first interface and a second interface, wherein the first interface
is configured to receive electromagnetic waves and to provide a
measurement signal to the second interface.
[0054] The second interface is configured to process the
measurement signal provided by the first interface. The second
interface provides a processed measurement signal based on the
measurement signal forwarded by the first interface, wherein the
processed measurement signal may be an analog or a digital
signal.
[0055] In other words, the second interface converts the
measurement signal provided by the first interface to a signal
suitable for the measurement device 16. Accordingly, the second
interface may be configured to generate an analog processed
measurement signal and/or a digital processed measurement signal,
depending on the kind of signal the measurement device 16 is
configured to process.
[0056] The processed measurement signal may be down-converted from
the measurement signal, i.e. a frequency of the processed
measurement signal may be lower than a frequency of the received
electromagnetic waves.
[0057] The processed measurement signal can then be forwarded to
the measurement device 16, in particular by the second
interface.
[0058] In the embodiment shown in FIG. 1, the measurement device 16
comprises a control circuit 22, while in the embodiment shown in
FIG. 2 the first probe unit 12 comprises the control circuit
22.
[0059] An interface module 24 is provided at the first probe unit
12. Via the interface module 24, a user may input data and/or
commands The interface module 24 is configured to generate an input
data signal based on the data and/or commands input by the
user.
[0060] Of course, a second interface module may be provided at the
second probe unit 14, which may be configured in a similar manner
as the interface module 24.
[0061] A representative method of operating the measurement system
10 is described below with reference to FIG. 3. Generally, the
method may be applied to both embodiments shown in FIG. 1 and FIG.
2.
[0062] First, a user input is received via the first probe unit 12
(step S1), for example via the interface module 24.
[0063] Based on the user input, the input data signal is generated
via the interface module 24 (step S2) and forwarded to the control
circuit 22.
[0064] In the embodiment shown in FIG. 1, the input data signal is
forwarded to the measurement device 16 by the interface module 24.
The measurement device 16 may store the input data signal and/or
visualize the input data signal via a graphical user interface
25.
[0065] In the embodiment shown in FIG. 2, the input data signal is
processed internally since the control circuit 22 is integrated in
the first probe unit 12. Irrespective of the integration of the
control circuit 22, the control circuit 22 generates a control
signal based on the input data signal (step S3). The control signal
may comprise at least one control command selected from the group
of: switch on at least one of the first probe unit 12, the second
probe unit 14 and the measurement device 16; switch off at least
one of the first probe unit 12, the second probe unit 14 and the
measurement device 16; transmit data to at least one of the first
probe unit 12, the second probe unit 14 and the measurement device
16; and adjust a trigger condition. The control signal is then
forwarded at least to the second probe unit 14 (step S4).
[0066] Additionally, the control signal may also be forwarded to
the measurement device 16 and the first probe unit 12 as shown in
the embodiment of FIG. 2 since the control circuit 22 is integrated
in the first probe unit 12.
[0067] In some embodiments, when the control circuit 22 is
comprised in the first probe unit 12, the measurement device 16 may
just forward the control signal to the second probe unit 14. Hence,
the first probe unit 12 only controls the second probe unit 14.
[0068] As indicated above, the control signal may also control the
second probe unit 14 and the measurement device 16.
[0069] Based on the control signal, at least one operational
parameter of the second probe unit 14 and/or the first probe unit
12 and/or the measurement device 16 is adjusted (step S5).
[0070] To summarize, at least one operational parameter of the
measurement system 10, more specifically an operational parameter
of the second probe unit 14, the first probe unit 12 and/or the
measurement device 16, is adjusted based on an input issued by a
user at the first probe unit 12 (or at any other probe unit).
[0071] The operational parameters may comprise one or more selected
from the group of: an operational status (e.g. "on" or "off"), a
measurement activity status, and a measurement parameter such as a
frequency to be measured and a bandwidth of a frequency band to be
measured. Alternatively or additionally, the operational parameter
may be associated with a voltage measurement mode of the second
probe unit 14 or a current measurement mode of the second probe
unit.
[0072] Thus, the second probe unit 14 may be switched on or off by
the control signal in response to the user input received by the
interface module 24 of the first probe unit 12. Alternatively or
additionally, the second probe unit 14 may be set to a voltage
measurement mode and/or to a current measurement mode by the
control signal in response to the user input received by the
interface module 24 of the first probe unit 12.
[0073] Alternatively or additionally, the operational parameter may
be associated with at least one of a magnitude of a voltage to be
measured or a magnitude of a current to be measured. Thus, an
operational range of the second probe unit 14 may be adapted by the
control signal, such that different signals having different
magnitudes of voltage and/or current can be measured. For example,
the second probe unit may be adapted from measuring voltages in the
order of millivolts to measuring voltages in the order of
volts.
[0074] Of course, the operational parameters of the first probe
unit 12 may be adapted analogously to the operational parameters of
the second probe unit 14.
[0075] Alternatively or additionally, the operational parameters
may be associated with at least one of a power status of the
measurement device 16, a voltage resolution of the measurement
device 16, a voltage range of the measurement device 16, a current
resolution of the measurement device 16, or a current range of the
measurement device 16. Accordingly, internal settings of the
measurement device 16 can be adapted by the user by operating the
first probe unit 12 or more precisely the interface module 24 of
the first probe unit 12.
[0076] The first probe unit 12 may comprise a monitoring unit 26
comprising one or more circuits. The monitoring unit 26 is
connected to the measurement device 16 and/or the second probe unit
14 in a signal transmitting manner (i.e., tethered or
wireless).
[0077] The monitoring unit 26 may indicate a status and/or other
operational parameters of at least one of the probe units 12, 14.
The monitoring unit 26 may also indicate the status and/or other
operational parameters of the measurement device 16.
[0078] In some embodiments, the monitoring unit 26 indicates the
status and/or other operational parameters graphically, e.g., via a
display, or by one or more status lights. Alternatively or
additionally, the status and/or operational parameters may also be
indicated acoustically, e.g., with predefined acoustic
patterns.
[0079] Moreover, the monitoring unit 26 may be configured to
indicate a representation of the control signal, for example
graphically, by one or more status lights and/or acoustically as
described above.
[0080] It should be understood that the control circuit 22 may
include, in some embodiments, logic for implementing the
technologies and methodologies described herein. This logic of the
control circuit 22 can be carried out in either hardware or
software, or a combination of hardware and software. In an example,
the functionality of the control circuit 22 could be implemented by
special purpose hardware-based computer systems or circuits, etc.,
or combinations of special purpose hardware and computer
instructions. In some embodiments, the control circuit 22 includes
one or more computing devices such as a processor (e.g., a
microprocessor), a central processing unit (CPU), a digital signal
processor (DSP), an application-specific integrated circuit (ASIC),
a field-programmable gate array (FPGA), or the like, or any
combinations thereof, and can include discrete digital or analog
circuit elements or electronics, or combinations thereof.
[0081] In an embodiment, the control circuit 22 includes a
microprocessor and a memory storing logic modules and/or
instructions. In an embodiment, the control circuit 22 includes one
or more ASICs having a plurality of predefined logic components. In
an embodiment, the control circuit 22 includes one or more FPGA
having a plurality of programmable logic components. In an
embodiment, the control circuit 22 includes combinations of
circuits and computer program products having software or firmware
instructions stored on one or more computer readable memories that
work together to cause a device to perform one or more
methodologies or technologies described herein. In an embodiment,
the control circuit 22 includes hardware circuits (e.g.,
implementations in analog circuitry, implementations in digital
circuitry, and the like, and combinations thereof) for carrying out
the functionality described herein.
[0082] The present application may also reference quantities and
numbers. Unless specifically stated, such quantities and numbers
are not to be considered restrictive, but exemplary of the possible
quantities or numbers associated with the present application. Also
in this regard, the present application may use the term
"plurality" to reference a quantity or number. In this regard, the
term "plurality" is meant to be any number that is more than one,
for example, two, three, four, five, etc. The terms "about,"
"approximately," "near," etc., mean plus or minus 5% of the stated
value. For the purposes of the present disclosure, the phrase "at
least one of A, B, and C," for example, means (A), (B), (C), (A and
B), (A and C), (B and C), or (A, B, and C), including all further
possible permutations when greater than three elements are
listed.
[0083] The principles, representative embodiments, and modes of
operation of the present disclosure have been described in the
foregoing description. However, aspects of the present disclosure
which are intended to be protected are not to be construed as
limited to the particular embodiments disclosed. Further, the
embodiments described herein are to be regarded as illustrative
rather than restrictive. It will be appreciated that variations and
changes may be made by others, and equivalents employed, without
departing from the spirit of the present disclosure. Accordingly,
it is expressly intended that all such variations, changes, and
equivalents fall within the spirit and scope of the present
disclosure, as claimed.
* * * * *