U.S. patent application number 16/815398 was filed with the patent office on 2021-01-07 for semiconductor package and manufacturing method thereof.
The applicant listed for this patent is ORIENT SEMICONDUCTOR ELECTRONICS, LIMITED. Invention is credited to YU-CHEN LIN, PEI-JUNG SU, HUI-YEN TSAI, YUEH-MING TUNG, CHIA-MING YANG.
Application Number | 20210005574 16/815398 |
Document ID | / |
Family ID | |
Filed Date | 2021-01-07 |
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United States Patent
Application |
20210005574 |
Kind Code |
A1 |
TUNG; YUEH-MING ; et
al. |
January 7, 2021 |
SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF
Abstract
The present disclosure provides a semiconductor package. The
semiconductor package includes a first substrate, a first die, a
plurality of first electrical contacts, a first encapsulant, a
second substrate, a second die, a third die, a plurality of second
electrical contacts, a second encapsulant and an adhesive layer.
The first die is disposed on a first surface of the first
substrate. The first electrical contacts are disposed on a second
surface of the first substrate and are electrically connected to
the first die. The first encapsulant is formed on the first surface
of the first substrate to enclose the first die. The second and
third dies are disposed on a first surface of the second substrate.
The second electrical contacts are disposed on a second surface of
the second substrate and are electrically connected to the second
and third dies. The second encapsulant is formed on the first
surface of the second substrate to enclose the second and third
dies. The adhesive layer is disposed between the first and second
encapsulants to attach the first encapsulant to the second
encapsulant. The present disclosure further provides a method of
manufacturing the above semiconductor package.
Inventors: |
TUNG; YUEH-MING; (KAOHSIUNG,
TW) ; YANG; CHIA-MING; (KAOHSIUNG, TW) ; TSAI;
HUI-YEN; (KAOHSIUNG, TW) ; LIN; YU-CHEN;
(KAOHSIUNG, TW) ; SU; PEI-JUNG; (KAOHSIUNG,
TW) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
ORIENT SEMICONDUCTOR ELECTRONICS, LIMITED |
KAOHSIUNG |
|
TW |
|
|
Appl. No.: |
16/815398 |
Filed: |
March 11, 2020 |
Current U.S.
Class: |
1/1 |
International
Class: |
H01L 25/065 20060101
H01L025/065; H01L 25/00 20060101 H01L025/00; G06K 19/077 20060101
G06K019/077 |
Foreign Application Data
Date |
Code |
Application Number |
Jul 2, 2019 |
TW |
108123337 |
Claims
1. A semiconductor package, comprising: a first substrate having
opposing first surface and second surface; a first die disposed on
the first surface of the first substrate; a plurality of first
electrical contacts disposed on the second surface of the first
substrate and electrically connected to the first die, the first
electrical contacts being configured to be electrically connected
to a first external circuit; a first encapsulant formed on the
first surface of the first substrate to enclose the first die, the
first encapsulant having a bottom surface; a second substrate
having opposing first surface and second surface; a second die and
a third die both disposed on the first surface of the second
substrate; a plurality of second electrical contacts disposed on
the second surface of the second substrate and electrically
connected to the second die and the third die respectively, the
second electrical contacts being configured to be electrically
connected to a second external circuit; a second encapsulant formed
on the first surface of the second substrate to enclose the second
die and the third die, the second encapsulant having a top surface;
and an adhesive layer formed between the first encapsulant and the
second encapsulant, the adhesive layer being adhered to the bottom
surface of the first encapsulant and the top surface of the second
encapsulant.
2. The semiconductor package as claimed in claim 1, further
comprising: a plurality of first bonding wires enclosed by the
first encapsulant, the first bonding wires electrically connecting
the first die to the first substrate; a plurality of second bonding
wires enclosed by the second encapsulant, the second bonding wires
electrically connecting the second die to the second substrate; and
a plurality of third bonding wires enclosed by the second
encapsulant, the third bonding wires electrically connecting the
third die to the second substrate.
3. The semiconductor package as claimed in claim 1, wherein the
first die is a subscriber identity module (SIM) die, the second die
being a non-volatile memory die, and the third die being a
controller die.
4. A semiconductor package, comprising: a first substrate having
opposing first surface and second surface; a first die disposed on
the first surface of the first substrate; a plurality of first
electrical contacts disposed on the second surface of the first
substrate and electrically connected to the first die, the first
electrical contacts being configured to be electrically connected
to a first external circuit; a second substrate having opposing
first surface and second surface; a second die and a third die both
disposed on the first surface of the second substrate; a plurality
of second electrical contacts disposed on the second surface of the
second substrate and electrically connected to the second die and
the third die respectively, the second electrical contacts being
configured to be electrically connected to a second external
circuit; a plurality of support members disposed between the first
substrate and the second substrate to maintain a distance between
the first substrate and the second substrate; and an encapsulant
formed between the first substrate and the second substrate to
enclose the first die, the second die, the third die and the
support members.
5. The semiconductor package as claimed in claim 4, further
comprising: a plurality of second bonding wires enclosed by the
encapsulant, the second bonding wires electrically connecting the
second die to the second substrate; and a plurality of third
bonding wires enclosed by the encapsulant, the third bonding wires
electrically connecting the third die to the second substrate.
6. The semiconductor package as claimed in claim 4, wherein the
first die is a subscriber identity module (SIM) die, the second die
being a non-volatile memory die, and the third die being a
controller die.
7. The semiconductor package as claimed in claim 4, wherein the
support members are made of tin.
8. A method of manufacturing a semiconductor package, comprising:
providing a first substrate having opposing first surface and
second surface, wherein a plurality of first electrical contacts is
disposed on the second surface of the first substrate, the first
electrical contacts being configured to be electrically connected
to a first external circuit; disposing a first die on the first
surface of the first substrate and electrically connecting the
first die to the first electrical contacts; forming a plurality of
solder balls on the first surface of the first substrate; providing
a second substrate having opposing first surface and second
surface, wherein a plurality of second electrical contacts is
disposed on the second surface of the second substrate, the second
electrical contacts being configured to be electrically connected
to a second external circuit; disposing a second die and a third
die on the first surface of the second substrate and electrically
connecting the second die and the third die to the second
electrical contacts respectively; melting and then cooling the
solder balls to form a plurality of support members for maintaining
a distance between the first substrate and the second substrate;
and forming an encapsulant between the first substrate and the
second substrate to enclose the first die, the second die, the
third die and the support members.
9. The method as claimed in claim 8, further comprising: disposing
a plurality of second bonding wires to electrically connect the
second die to the second substrate, wherein the second bonding
wires are enclosed by the encapsulant; and disposing a plurality of
third bonding wires to electrically connect the third die to the
second substrate, wherein the third bonding wires are enclosed by
the encapsulant.
10. The method as claimed in claim 8, wherein the first die is a
subscriber identity module (SIM) die, the second die being a
non-volatile memory die, and the third die being a controller die.
Description
RELATED APPLICATION
[0001] The present application is based on and claims priority to
Taiwanese Application Number 108123337, filed Jul. 2, 2019, the
disclosure of which is hereby incorporated by reference herein in
its entirety.
BACKGROUND
1. Technical Field
[0002] This disclosure relates to a semiconductor package and a
manufacturing method thereof, and more particularly relates to a
semiconductor package having a memory card and a SIM card, and a
manufacturing method thereof.
2. Description of the Related Art
[0003] Many existing mobile phones are designed to allow users to
increase data storage capacity themselves by inserting a memory
card. To achieve the above design, the phones each usually have a
slot to receive separate memory and SIM cards which are carried by
a tray. However, it is a little inconvenient for users to carry two
separate cards on their mobile phones.
SUMMARY
[0004] In view of the above, the present disclosure provides a
semiconductor package and a manufacturing method thereof that are
convenient for users to use both memory and SIM cards.
[0005] In the first embodiment, the semiconductor package of the
present disclosure includes a first substrate, a second substrate,
a first die, a second die, a third die, a plurality of first
electrical contacts, a plurality of second electrical contacts, a
first encapsulant, a second encapsulant and an adhesive layer. The
first and second substrates each have opposing first surface and
second surface. The first die is disposed on the first surface of
the first substrate. The second die and the third die are disposed
on the first surface of the second substrate. The first electrical
contacts are disposed on the second surface of the first substrate
and electrically connected to the first die. The first electrical
contacts are to be electrically connected to a first external
circuit. The second electrical contacts are disposed on the second
surface of the second substrate and electrically connected to the
second die and the third die respectively. The second electrical
contacts are to be electrically connected to a second external
circuit. The first encapsulant is formed on the first surface of
the first substrate to enclose the first die, wherein the first
encapsulant has a bottom surface. The second encapsulant is formed
on the first surface of the second substrate to enclose the second
die and the third die, wherein the second encapsulant has a top
surface. The adhesive layer is formed between the first encapsulant
and the second encapsulant, and adhered to the bottom surface of
the first encapsulant and the top surface of the second
encapsulant.
[0006] In the second embodiment, the semiconductor package of the
present disclosure includes a first substrate, a second substrate,
a first die, a second die, a third die, a plurality of first
electrical contacts, a plurality of second electrical contacts, a
plurality of support members and an encapsulant. The first and
second substrates each have opposing first surface and second
surface. The first die is disposed on the first surface of the
first substrate. The second die and the third die are disposed on
the first surface of the second substrate. The first electrical
contacts are disposed on the second surface of the first substrate
and electrically connected to the first die. The first electrical
contacts are to be electrically connected to a first external
circuit. The second electrical contacts are disposed on the second
surface of the second substrate and electrically connected to the
second die and the third die respectively. The second electrical
contacts are to be electrically connected to a second external
circuit. The support members are disposed between the first
substrate and the second substrate to maintain a distance between
the first substrate and the second substrate. The encapsulant is
formed between the first substrate and the second substrate to
enclose the first die, the second die, the third die and the
support members.
[0007] The method of manufacturing a semiconductor package
comprises: providing a first substrate having opposing first
surface and second surface, wherein a plurality of first electrical
contacts is disposed on the second surface of the first substrate,
the first electrical contacts being configured to be electrically
connected to a first external circuit; disposing a first die on the
first surface of the first substrate and electrically connecting
the first die to the first electrical contacts; forming a plurality
of solder balls on the first surface of the first substrate;
providing a second substrate having opposing first surface and
second surface, wherein a plurality of second electrical contacts
is disposed on the second surface of the second substrate, the
second electrical contacts being configured to be electrically
connected to a second external circuit; disposing a second die and
a third die on the first surface of the second substrate and
electrically connecting the second die and the third die to the
second electrical contacts respectively; melting and then cooling
the solder balls to form a plurality of support members for
maintaining a distance between the first substrate and the second
substrate; and forming an encapsulant between the first substrate
and the second substrate to enclose the first die, the second die,
the third die and the support members.
[0008] According to the semiconductor package of the present
disclosure, a memory card and a SIM card are integrated together in
a package. A user may flip the package as required and insert it
into a slot of a mobile phone such that the gold fingers on the
upper or lower surface of the package contact the gold fingers in
the phone respectively to change the use of the SIM card or memory
card.
[0009] The foregoing, as well as additional objects, features and
advantages of the disclosure will be more readily apparent from the
following detailed description, which proceeds with reference to
the accompanying drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
[0010] Aspects of the present disclosure are best understood from
the following detailed description when read with the accompanying
figures. It is noted that, in accordance with the standard practice
in the industry, various features are not drawn to scale. In fact,
the dimensions of the various features may be arbitrarily increased
or reduced for clarity of discussion.
[0011] FIG. 1 is a schematic diagram of the semiconductor package
according to the first embodiment of the present disclosure.
[0012] FIG. 2 is a schematic diagram of the semiconductor package
according to the second embodiment of the present disclosure.
[0013] FIGS. 3 to 7 illustrate the method of manufacturing the
semiconductor package of FIG. 2.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT
[0014] The following disclosure provides many different
embodiments, or examples, for implementing different features of
the disclosure. Specific examples of components and arrangements
are described below to simplify the present disclosure. These are,
of course, merely examples and are not intended to be limiting. For
example, the formation of a first feature over or on a second
feature in the description that follows may include embodiments in
which the first and second features are formed in direct contact,
and may also include embodiments in which additional features may
be formed between the first and second features, such that the
first and second features may not be in direct contact. In
addition, the present disclosure may repeat reference numerals
and/or letters in the various examples. This repetition is for the
purpose of simplicity and clarity and does not in itself dictate a
relationship between the various embodiments and/or configurations
discussed.
[0015] Further, spatial relative terms, such as "beneath." "below,"
"lower," "above," "upper" and the like, may be used herein for ease
of description to describe one element or feature's relationship to
another element(s) or feature(s) as illustrated in the figures. The
spatial relative terms are intended to encompass different
orientations of the device in use or operation in addition to the
orientation depicted in the figures. The apparatus may be otherwise
oriented (rotated 90 degrees or at other orientations) and the
spatial relative descriptors used herein may likewise be
interpreted accordingly.
[0016] Referring to FIG. 1, the semiconductor package according to
the first embodiment of the present disclosure includes a first
substrate 110. The first substrate 110 may be a single-layer or
multi-layer circuit board, but is not limited thereto. The first
substrate 110 has opposing first surface 111 and second surface
112, and the first surface 111 and the second surface 112 are
located on different planes. For example, the first surface 111 is
a bottom surface and the second surface 112 is a top surface, but
is not limited thereto. The first surface 111 is provided with a
first die 130 thereon and the first die 130 may be a subscriber
identity module (SIM) die, but is not limited thereto. The first
die 130 has opposing first surface and second surface. The first
surface of the first die 130 is attached to the first surface 111
of the first substrate 110 through an adhesive layer. The second
surface of the first die 130 is an active surface. The first
substrate 110 is further provided with a plurality of first bonding
wires 140. One end of each of the first bonding wires 140 is
connected to the active surface of the first die 130 and the other
end is connected to the first surface 111 of the first substrate
110. Therefore, the first die 130 is electrically connected to the
first substrate 110 through the first bonding wires 140. In
addition to the above embodiment, the first die 130 may also be
disposed on the first surface 111 of the first substrate 110 in a
flip-chip manner. More specifically, a plurality of solder balls is
provided on the active surface of the first die 130. The active
surface of the first die 130 is positioned to face the first
surface 111 of the first substrate 110. The solder balls are then
melted by a reflow process to electrically connect the active
surface of the first die 130 to the first substrate 110. Since the
flip-chip technology is conventional, it will not be further
explained.
[0017] The first surface 111 of the first substrate 110 is further
provided with a first encapsulant 160. The first encapsulant 160
encloses the first die 130 and the first bonding wires 140. The
first encapsulant 160 has a flat bottom surface, but is not limited
thereto. The first encapsulant 160 may also have a rugged bottom
surface. The second surface 112 of the first substrate 110 is
provided with a plurality of first electrical contacts 150, and the
first electrical contacts 150 may be gold fingers. The first
electrical contacts 150 are electrically connected to the first die
130 by the traces on the first substrate 110 and the first bonding
wires 140. The first die 130 may be electrically connected to an
external circuit through the first electrical contacts 150 on the
first substrate 110.
[0018] The semiconductor package according to the first embodiment
of the present disclosure further includes a second substrate 210.
The second substrate 210 may be a single-layer or multi-layer
circuit board, but is not limited thereto. The second substrate 210
has opposing first surface 211 and second surface 212, and the
first surface 211 and the second surface 212 are located on
different planes. For example, the first surface 211 is a top
surface and the second surface 212 is a bottom surface, but is not
limited thereto. The first surface 211 is provided with a plurality
of dies including a second die 232 and a third die 233. The second
die 232 may be a non-volatile memory die, such as a flash memory
die, but is not limited thereto. The third die 233 may be a
controller die, but is not limited thereto. The second die 232 and
the third die 233 each have opposing first surface and second
surface. The first surface of the second die 232 is attached to the
first surface 211 of the second substrate 210 through an adhesive
layer. The second surface of the second die 232 is an active
surface. The first surface of the third die 233 is attached to the
first surface 211 of the second substrate 210 through an adhesive
layer. The second surface of the third die 233 is an active
surface. The second substrate 210 is further provided with a
plurality of second bonding wires 242 and a plurality of third
bonding wires 243. One end of each of the second bonding wires 242
is connected to the active surface of the second die 232 and the
other end is connected to the first surface 211 of the second
substrate 210. One end of each of the third bonding wires 243 is
connected to the active surface of the third die 233 and the other
end is connected to the first surface 211 of the second substrate
210. Therefore, the second die 232 is electrically connected to the
second substrate 210 through the second bonding wires 242 and the
third die 233 is electrically connected to the second substrate 210
through the third bonding wires 243. In addition to the above
embodiment, the second die 232 and/or third die 233 may also be
disposed on the first surface 211 of the second substrate 210 in a
flip-chip manner.
[0019] The first surface 211 of the second substrate 210 is further
provided with a second encapsulant 260. The second encapsulant 260
encloses the second die 232, third die 233, second bonding wires
242 and third bonding wires 243. The second encapsulant 260 has a
flat top surface, but is not limited thereto. The second
encapsulant 260 may also have a rugged top surface. The second
surface 212 of the second substrate 210 is provided with a
plurality of second electrical contacts 250, and the second
electrical contacts 250 may be gold fingers. The second electrical
contacts 250 are electrically connected to the second die 232 by
the traces on the second substrate 210 and the second bonding wires
242. The second electrical contacts 250 are electrically connected
to the third die 233 by the traces on the second substrate 210 and
the third bonding wires 243. The second die 232 and the third die
233 may be electrically connected to an external circuit through
the second electrical contacts 250 on the second substrate 210. The
first encapsulant 160 is fixed above the second encapsulant 260.
Further, an adhesive layer 190 is disposed between the first
encapsulant 160 and the second encapsulant 260. The adhesive layer
190 is adhered to the bottom surface of the first encapsulant 160
and the top surface of the second encapsulant 260. That is, the
bottom surface of the first encapsulant 160 is bonded to the top
surface of the second encapsulant 260 through the adhesive layer
190.
[0020] The semiconductor package according to the first embodiment
of the present disclosure actually includes a first package and a
second package that may operate independently, wherein the first
package is fixed above the second package. The first package
includes the first substrate 110, the first die 130, the first
bonding wires 140, and the first electrical contacts 150. The
second package includes the second substrate 210, the second die
232, the third die 233, the second bonding wires 242, the third
bonding wires 243, and the second electrical contacts 250.
[0021] Referring to FIG. 2, the semiconductor package according to
the second embodiment of the present disclosure also includes the
first substrate 110, the second substrate 210, the first die 130,
the second die 232, the third die 233, the second bonding wires
242, and the third bonding wires 243 in the semiconductor package
according to the first embodiment of the present disclosure. In
these figures identical reference numerals have been used when
designating substantially identical elements that are common to the
figures. In comparison with the first embodiment, the first die 130
in this embodiment is disposed on the first surface 111 of the
first substrate 110. The second die 232 and the third die 233 are
disposed on the first surface 211 of the second substrate 210, and
electrically connected to the second substrate 210 through the
second bonding wires 242 and the third bonding wires 243
respectively. The first die 130 may be electrically connected to an
external circuit through the first electrical contacts 150 on the
second surface 112 of the first substrate 110. The second die 232
and the third die 233 may be electrically connected to an external
circuit through the second electrical contacts 250 on the second
surface 212 of the second substrate 210.
[0022] However, the first die 130 in this embodiment is disposed on
the first substrate 110 in a flip-chip manner. A plurality of
support members 380 is disposed between the first substrate 110 and
the second substrate 210 to maintain a distance between the first
substrate 110 and the second substrate 210. An encapsulant 390 is
further provided between the first substrate 110 and the second
substrate 210 to enclose the first die 130, the second die 232, the
third die 233, the second bonding wires 242, the third bonding
wires 243, and the support members 380. The support members 380 may
be made of metal, such as tin, but is not limited thereto. The
support members 380 may also be made of a non-metal material. When
the support members 380 are made of metal, they may be used as
conductive traces for electrically connecting the first substrate
110 and the second substrate 210. In addition to the above
embodiments, the first die 130 may also be electrically connected
to the first substrate 110 through a plurality of bonding wires,
and the second die 232 and/or the third die 233 may also be
disposed on the first surface 211 of the second substrate 210 in a
flip-chip manner.
[0023] FIGS. 3 to 7 show a method of manufacturing the
semiconductor package of FIG. 2. Referring to FIG. 3, a first
substrate 110 is provided. The first substrate 110 has opposing
first surface 111 and second surface 112. A plurality of first dies
130 is disposed on the first surface 111 of the first substrate 110
in a flip-chip manner, but is not limited thereto, so that the
first dies 130 are electrically connected to the first substrate
110. A plurality of solder balls 180 is formed on the first surface
111 of the first substrate 110. A plurality of first electrical
contacts 150 is formed on the second surface 112 of the first
substrate 110. The first electrical contacts 150 may be
electrically connected to the first dies 130, respectively.
[0024] Referring to FIG. 4, the first substrate 110 is then cut
such that the divided parts of the first substrate 110 each is
provided with one of the first dies 130, a plurality of the solder
balls 180 and a plurality of the first electrical contacts 150.
[0025] Referring to FIG. 5, a second substrate 210 is provided. The
second substrate 210 has opposing first surface 211 and second
surface 212. A plurality of second dies 232 and a plurality of
third dies 233 are attached to the first surface 211 of the second
substrate 210 respectively through an adhesive layer. A plurality
of second bonding wires 242 and a plurality of third bonding wires
243 are provided on the second substrate 210 so that the second
dies 232 and the third dies 233 are electrically connected to the
second substrate 210 through the second bonding wires 242 and the
third bonding wires 243 respectively. A plurality of second
electrical contacts 250 are formed on the second surface 212 of the
second substrate 210 so that the second dies 232 and the third dies
233 may be electrically connected to external circuits through the
second electrical contacts 250 respectively.
[0026] Referring to FIG. 6, the solder balls 180 on the divided
parts of the first substrate 110 are heated and melted through a
reflow process to bond to the first surface 211 of the second
substrate 210. After cooling, the solder balls 180 are formed into
a plurality of support members 380 for maintaining a distance
between the first substrate 110 and the second substrate 210. An
encapsulant 390 is then formed between the first substrate 110 and
the second substrate 210 to enclose the first dies 130, the second
dies 232, the third dies 233, the second bonding wires 242, the
third bonding wires 243, and the support members 380.
[0027] Referring to FIG. 7, the encapsulant 390 and the second
substrate 210 are divided to form a plurality of semiconductor
packages of FIG. 2.
[0028] According to the semiconductor package of the present
disclosure, a memory card and a SIM card are integrated together in
a package. A user may flip the package as required and insert it
into a slot of a mobile phone such that the gold fingers on the
upper or lower surface of the package contact the gold fingers in
the phone respectively to change the use of the SIM card or memory
card.
[0029] Although the preferred embodiments of the disclosure have
been disclosed for illustrative purposes, those skilled in the art
will appreciate that various modifications, additions and
substitutions are possible, without departing from the scope and
spirit of the disclosure as disclosed in the accompanying
claims.
* * * * *