U.S. patent application number 16/473192 was filed with the patent office on 2020-03-19 for raman spectrum inspection apparatus and method of monitoring detection security of the same.
The applicant listed for this patent is Nuctech Company Limited. Invention is credited to Rui Fan, Haihui Liu, Hongqiu Wang, Jianhong Zhang.
Application Number | 20200088645 16/473192 |
Document ID | / |
Family ID | 58944996 |
Filed Date | 2020-03-19 |
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United States Patent
Application |
20200088645 |
Kind Code |
A1 |
Zhang; Jianhong ; et
al. |
March 19, 2020 |
RAMAN SPECTRUM INSPECTION APPARATUS AND METHOD OF MONITORING
DETECTION SECURITY OF THE SAME
Abstract
There are provided a Raman spectrum inspection apparatus (100a)
and a method of monitoring detection security of the same. The
Raman spectrum inspection apparatus (100a) includes: an optical
device (20) configured to guide exciting light (11) to a sample
(30) and collect a light signal from the sample (30); a
spectrometer (40) configured to split the light signal collected by
the optical device (20) so as to generate a Raman spectrum of the
sample (30) which is detected; and a security monitor configured to
monitor a security state of the sample (30) during irradiating of
the exciting light (11) from the laser (10) onto the sample (30),
and to provide a security indicating signal representing whether or
not the sample (30) is damaged due to being irradiated by the
exciting light (11).
Inventors: |
Zhang; Jianhong; (Beijing,
CN) ; Wang; Hongqiu; (Beijing, CN) ; Fan;
Rui; (Beijing, CN) ; Liu; Haihui; (Beijin,
CN) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Nuctech Company Limited |
Beijing |
|
CN |
|
|
Family ID: |
58944996 |
Appl. No.: |
16/473192 |
Filed: |
February 13, 2018 |
PCT Filed: |
February 13, 2018 |
PCT NO: |
PCT/CN2018/076658 |
371 Date: |
June 24, 2019 |
Current U.S.
Class: |
1/1 |
Current CPC
Class: |
G05B 2219/49353
20130101; G01N 2201/06113 20130101; G01J 5/0003 20130101; G01J 3/44
20130101; G01J 3/4412 20130101; G01N 21/01 20130101; G02B 27/141
20130101; G01N 21/65 20130101; G05B 19/4065 20130101; G01N 2201/063
20130101 |
International
Class: |
G01N 21/65 20060101
G01N021/65; G01J 3/44 20060101 G01J003/44 |
Foreign Application Data
Date |
Code |
Application Number |
Dec 26, 2016 |
CN |
201611218116.8 |
Jan 20, 2017 |
CN |
201710042074.5 |
Dec 26, 2017 |
CN |
201711439074.5 |
Claims
1. A Raman spectrum inspection apparatus, comprising: a laser
configured to emit exciting light; an optical device configured to
guide the exciting light to a sample and collect a light signal
from the sample; a spectrometer configured to split the light
signal collected by the optical device so as to generate a Raman
spectrum of the sample which is detected; and a security monitor
configured to monitor a security state of the sample during
irradiating of the exciting light from the laser onto the sample,
and to provide a security indicating signal representing whether or
not the sample is damaged due to being irradiated by the exciting
light.
2. The Raman spectrum inspection apparatus according to claim 1,
wherein the security monitor comprises: a temperature sensor
configured to sense a temperature or a variation of temperature of
the detected sample during irradiating of the exciting light from
the laser onto the sample.
3. The Raman spectrum inspection apparatus according to claim 2,
wherein the security monitor comprises a plurality of said
temperature sensors positioned at different locations with respect
to the sample for sensing the temperature or the variation of
temperature of the sample.
4. The Raman spectrum inspection apparatus according to claim 3,
wherein the temperature sensor comprises a contact type temperature
sensor configured to contact a predetermined position of the sample
and to transmit temperature information of the sample in a wired
way or wirelessly.
5. The Raman spectrum inspection apparatus according to claim 2,
wherein, the light signal comprises a Raman spectrum signal and an
infrared signal, the temperature sensor comprises an infrared
thermometer, the spectrometer and the infrared thermometer are
arranged in a same detector, and a portion of the detector is
configured to detect the infrared signal from the sample during
irradiating of the exciting light from the laser onto the sample,
and another portion of the detector is configured to detect the
Raman spectrum signal from the sample.
6. The Raman spectrum inspection apparatus according to claim 1,
wherein the Raman spectrum inspection apparatus further comprises a
controller configured to send a control signal to the laser so as
to reduce a power of the laser or to turn off the laser if the
security indicating signal provided by the security monitor
indicates that a security of the sample is affected by a detection
performed to the sample.
7. The Raman spectrum inspection apparatus according to claim 2,
wherein the Raman spectrum inspection apparatus further comprises a
controller configured to send a control signal to the laser so as
to reduce a power of the laser or to turn off the laser if the
temperature or variation of temperature of the sample sensed by the
temperature sensor exceeds a threshold.
8. The Raman spectrum inspection apparatus according to claim 1,
wherein the security monitor is further configured to monitor a
surface state of the sample during irradiating of the exciting
light from the laser onto the sample, the surface state indicating
whether or not the sample is damaged due to being irradiated by the
exciting light.
9. The Raman spectrum inspection apparatus according to claim 8,
wherein the security monitor comprises an imaging device for
capturing an image of a surface of the sample.
10. The Raman spectrum inspection apparatus according to claim 9,
wherein the optical device is configured to establish a Raman light
signal collection light path for collecting the light signal from
the sample, and an image capturing light path, which extends from
the sample to the imaging device and is configured for capturing
the image of the surface of the sample, is completely independent
of the Raman light signal collection light path, or at least a
portion of the image capturing light path is coaxial with the Raman
light signal collection light path.
11. The Raman spectrum inspection apparatus according to claim 9,
further comprising: an image processor configured to process an
image obtained by a camera so as to determine a change in gray
scale of the image of the surface of the sample; and a controller
configured to send a control signal to the laser so as to reduce a
power of the laser or to turn off the laser if the change in gray
scale exceeds a threshold.
12. The Raman spectrum inspection apparatus according to claim 8,
wherein the security monitor comprises a smog detector configured
to monitor whether or not a surface of the sample generates smog
during irradiating of the exciting light from the laser onto the
sample, and the Raman spectrum inspection apparatus further
comprises a controller configured to send a control signal to the
laser so as to reduce a power of the laser or to turn off the laser
if it is monitored by the smog detector that the surface of the
sample generates smog.
13. A method of monitoring a detection security of a Raman spectrum
inspection apparatus, comprising: emitting exciting light by a
laser; guiding the exciting light to a sample and collecting a
light signal from the sample; and monitoring a security state of
the sample during irradiating of the exciting light from the laser
onto the sample, and providing a security indicating signal
representing whether or not the sample is damaged due to being
irradiated by the exciting light.
14. The method according to claim 13, further comprising: sending a
control signal to the laser so as to reduce a power of the laser or
to turn off the laser if the security indicating signal indicates
that a security of the sample is affected by a detection performed
to the sample.
15. The method according to claim 14, wherein the monitoring a
security state of the sample comprises: sensing a temperature or a
variation of temperature of the detected sample during irradiating
of the exciting light from the laser onto the sample; and sending
the control signal to the laser so as to reduce the power of the
laser or to turn off the laser if the sensed temperature or
variation of temperature of the sample exceeds a threshold.
16. The method according to claim 13, wherein an infrared signal
and a Raman spectrum signal from the sample are detected by
different portions of a same detector.
17. The method according to claim 13, wherein the step of
monitoring a security state of the sample comprises: monitoring a
surface state of the sample during irradiating of the exciting
light from the laser onto the sample, the surface state indicating
whether or not the sample is damaged due to being irradiated by the
exciting light.
18. The method according to claim 17, wherein the monitoring a
surface state of the sample comprises obtaining an image of a
surface of the sample.
19. The method according to claim 18, further comprising:
processing the obtained image so as to determine a change in gray
scale of the image of the surface of the sample; and sending a
control signal to the laser so as to reduce a power of the laser or
to turn off the laser if the change in gray scale exceeds a
threshold.
20. The method according to claim 17, wherein the monitoring a
surface state of the sample comprises monitoring whether or not a
surface of the sample generates smog during irradiating of the
exciting light from the laser onto the sample; and the method
further comprises sending a control signal to the laser so as to
reduce a power of the laser or to turn off the laser if it is
monitored that the surface of the sample generates smog.
Description
FIELD OF THE DISCLOSURE
[0001] Embodiments of the present disclosure generally relate to
the field of Raman spectrum detection, and in particular to a Raman
spectrum inspection apparatus and a method for monitoring a
detection security of the Raman spectrum inspection apparatus.
DESCRIPTION OF THE RELATED ART
[0002] Raman spectrum analysis technology is one of non-contact
spectrum analysis technologies based on Raman scattering effects.
It can analyze compositions of substance qualitatively and
quantitatively. Raman spectrum is one of molecular vibration
spectra. It may reflect fingerprint features of molecules for
inspection of substance. The Raman spectrum inspection is a method
for inspecting and recognizing substances by detecting Raman
spectra produced by the Raman scattering effects of an object to be
inspected to an exciting light. The Raman spectrum inspection
method has been broadly used in various fields, such as liquid
security inspection, gem inspection, explosive inspection, drug
inspection, medicine inspection.
[0003] In recent years, Raman spectrum analysis technology has been
widely applied in fields such as inspection of hazardous articles
and recognition of substances. In the field of recognition of
substances, the people often cannot judge properties of the
substances correctly as various substances have different colors
and shapes. The Raman spectrum depends on energy level structure of
molecules of the object to be detected, thus, the Raman spectrum
may be used as "fingerprint" information of substances for
recognizing substances. Therefore, the Raman spectrum analysis
technology has been applied broadly in fields of such as customs,
common security, foods, drugs, environments.
SUMMARY
[0004] In order to solve or at least alleviate one or more problems
existing in prior arts, there are provided a Raman spectrum
inspection apparatus and a method for monitoring a detection
security of the Raman spectrum inspection apparatus, for providing
higher security.
[0005] An embodiment of the present disclosure provides a Raman
spectrum inspection apparatus, comprising:
[0006] a laser configured to emit exciting light;
[0007] an optical device configured to guide the exciting light to
a sample and collect a light signal from the sample;
[0008] a spectrometer configured to split the light signal
collected by the optical device so as to generate a Raman spectrum
of the sample which is detected; and
[0009] a security monitor configured to monitor a security state of
the sample during irradiating of the exciting light from the laser
onto the sample, and to provide a security indicating signal
representing whether or not the sample is damaged due to being
irradiated by the exciting light.
[0010] In an embodiment, the security monitor comprises: a
temperature sensor configured to sense a temperature or a variation
of temperature of the detected sample during irradiating of the
exciting light from the laser onto the sample.
[0011] In an embodiment, the security monitor comprises a plurality
of said temperature sensors positioned at different locations with
respect to the sample for sensing the temperature or the variation
of temperature of the detected sample.
[0012] In an embodiment, the temperature sensor comprises: an
infrared detector configured to detect infrared light emitted from
the sample so as to obtain the temperature or variation of
temperature of the detected sample.
[0013] In an embodiment, the optical device is configured to
establish a Raman light signal collection light path for collecting
the light signal from the sample, and the optical device comprises:
a first beam splitter provided in a Raman light signal collection
light path and arranged to form an infrared radiation branch path
branching from the Raman light signal collection light path so as
to guide infrared light from the sample towards the infrared
detector.
[0014] In an embodiment, the first beam splitter is a short-pass
dichroic beam splitter arranged to reflect the light having a
wavelength greater than a predetermined wavelength towards the
infrared detector while transmitting the light having a wavelength
less than the predetermined wavelength through the short-pass
dichroic beam splitter, the predetermined wavelength being in a
range between 700 nanometers and 300 micrometers.
[0015] In an embodiment, the first beam splitter is arranged to
reflect a part of the light signal from the sample towards the
infrared detector while transmitting another part of the light
signal towards the spectrometer.
[0016] In an embodiment, the optical device further comprises:
[0017] a first convergent lens arranged in the Raman light signal
collection light path and configured to converge the exciting light
to the sample and collect the light signal from the sample;
[0018] a second convergent lens arranged in the Raman light signal
collection light path and configured to converge the collected
light signal to the spectrometer; and
[0019] a second beam splitter arranged in the Raman light signal
collection light path between the first beam splitter and the
second convergent lens, or between the first beam splitter and the
first convergent lens, and arranged to reflect the exciting light
from the laser towards the first convergent lens and transmit at
least a part of the reflected light signal collected by the first
convergent lens from the sample through the second beam splitter to
the second convergent lens.
[0020] In an embodiment, the second beam splitter includes a
long-pass dichroic beam splitter.
[0021] In an embodiment, the optical device further comprises a
long pass optical filter or a notch optical filter arranged in the
Raman light signal collection light path, located downstream of the
first beam splitter and configured to filter out Rayleigh light of
the light signal having passed through the first beam splitter.
[0022] In an embodiment, the optical device further comprises a
long pass optical filter or a notch optical filter arranged in the
Raman light signal collection light path, located between the
sample and the spectrometer and configured to filter out Rayleigh
light from the light signal.
[0023] In an embodiment, the light signal comprises a Raman
spectrum signal and an infrared signal, the spectrometer and the
infrared detector are arranged in a same detector, a portion of the
detector is configured to detect the infrared signal from the
sample during irradiating of the exciting light from the laser onto
the sample, and another portion of the detector is configured to
detect the Raman spectrum signal from the sample.
[0024] In an embodiment, the optical device is configured to
establish:
[0025] a Raman light signal collection light path for collecting
the light signal from the sample; and
[0026] an infrared light collection light path configured for
collecting the infrared light from the sample, the infrared light
collection light path being separated from the Raman light signal
collection light path, or at least a portion of the infrared light
collection light path being coaxial with the Raman light signal
collection light path.
[0027] In an embodiment, at least a portion of an exciting light
path from the laser to the sample is coaxial with at least one of
the Raman light signal collection light path and the infrared light
collection light path, or the exciting light path is offset from
the Raman light signal collection light path or from the infrared
light collection light path.
[0028] In an embodiment, the Raman spectrum inspection apparatus
further comprises a controller configured to send a control signal
to the laser so as to reduce the power of the laser or to turn off
the laser if the security indicating signal provided by the
security monitor indicates that the security of the sample is
affected by the detection performed to the sample.
[0029] In an embodiment, the Raman spectrum inspection apparatus
comprises a controller configured to send a control signal to the
laser so as to reduce the power of the laser or to turn off the
laser if the temperature or variation of temperature of the sample
sensed by the temperature sensor exceeds a threshold.
[0030] In an embodiment, the Raman spectrum inspection apparatus
further comprises a controller configured to receive a detection
result from the infrared detector, and to send a control signal to
the laser so as to reduce the power of the laser or to turn off the
laser if radiation energy of the infrared light detected by the
infrared detector exceeds a predetermined threshold.
[0031] In an embodiment, the optical device is integrated in an
optical fiber probe, and the exciting light emitted by the laser is
guided into the optical fiber probe by an importing optical fiber,
and the optical fiber probe transmits the collected Raman light
signal to the spectrometer by a collection optical fiber.
[0032] In an embodiment, the security monitor is further configured
to monitor a surface state of the sample during irradiating of the
exciting light from the laser onto the sample, the surface state
indicating whether or not the sample is damaged due to being
irradiated by the exciting light.
[0033] In an embodiment, the security monitor comprises an imaging
device for capturing an image of a surface of the sample.
[0034] In an embodiment, the optical device is configured to
establish a Raman light signal collection light path for collecting
the light signal from the sample, and an image capturing light
path, which extends from the sample to the imaging device and is
configured for capturing the image of the surface of the sample, is
completely independent of the Raman light signal collection light
path, or at least a portion of the image capturing light path is
coaxial with the Raman light signal collection light path.
[0035] In an embodiment, the Raman spectrum inspection apparatus
further comprises:
[0036] an image processor configured to process an image obtained
by a camera so as to determine a change in gray scale of the image
of the surface of the sample; and
[0037] a controller configured to send a control signal to the
laser so as to reduce the power of the laser or to turn off the
laser if the change in gray scale exceeds a threshold.
[0038] In an embodiment, the security monitor includes a smog
detector configured to monitor whether or not the surface of the
sample generates smog during irradiating of the exciting light from
the laser onto the sample, and the Raman spectrum inspection
apparatus further comprises a controller configured to send a
control signal to the laser so as to reduce the power of the laser
or to turn off the laser if it is monitored by the smog detector
that the surface of the sample generates smog.
[0039] In an embodiment, the temperature sensor includes a contact
type temperature sensor or a non-contact type temperature sensor,
wherein the contact type temperature sensor is configured to
contact a predetermined position of the sample and to transmit
temperature information of the sample in a wired way or
wirelessly.
[0040] An embodiment of the present disclosure provides a method of
monitoring a detection security of a Raman spectrum inspection
apparatus, comprising:
[0041] emitting exciting light by a laser;
[0042] guiding the exciting light to a sample and collecting a
light signal from the sample; and
[0043] monitoring a security state of the sample during irradiating
of the exciting light from the laser onto the sample, and providing
a security indicating signal representing whether or not the sample
is damaged due to being irradiated by the exciting light.
[0044] In an embodiment, the method further comprises sending a
control signal to the laser so as to reduce the power of the laser
or to turn off the laser if the security indicating signal
indicates that the security of the sample is affected by the
detection performed to the sample.
[0045] In an embodiment, the monitoring a security state of the
sample comprises:
[0046] sensing a temperature or a variation of temperature of the
detected sample during irradiating of the exciting light from the
laser onto the sample; and
[0047] sending a control signal to the laser so as to reduce the
power of the laser or to turn off the laser if the sensed
temperature or variation of temperature of the sample exceeds a
threshold.
[0048] In an embodiment, the sensing a temperature or a variation
of temperature of the detected sample comprises:
[0049] detecting, by the infrared detector, radiation energy of the
infrared light emitted from the sample so as to monitor the
temperature or variation of temperature of the sample.
[0050] In an embodiment, the method further comprises:
[0051] sending a control signal to the laser so as to reduce the
power of the laser or turn off the laser if the radiation energy of
the infrared light detected by the infrared detector exceeds a
predetermined threshold.
[0052] In an embodiment, the method of monitoring the detection
security further comprises:
[0053] turning off the laser after the laser emits the exciting
light for a predetermined time period, and determining the security
of the detected sample according to a variation of temperature of
the sample irradiated by the exciting light during the
predetermined time period.
[0054] In an embodiment, the method further comprises establishing
a Raman light signal collection light path from the sample to the
spectrometer, so as to collect the light signal from the
sample.
[0055] In an embodiment, the method further comprises:
[0056] forming, by using a first beam splitter arranged in the
Raman light signal collection light path, an infrared radiation
branch path branching from the Raman light signal collection light
path, so as to guide an infrared component of the light from the
sample to the infrared detector; or
[0057] collecting an infrared component of the light from the
sample by the infrared detector through a light path separated from
the Raman light signal collection light path.
[0058] In an embodiment, an infrared signal and a Raman spectrum
signal from the sample are detected by different portions of a same
detector respectively.
[0059] In an embodiment, the monitoring a security state of the
sample comprises: monitoring a surface state of the sample during
irradiating of the exciting light from the laser onto the sample,
the surface state indicating whether or not the sample is damaged
due to being irradiated by the exciting light.
[0060] In an embodiment, the monitoring a surface state of the
sample comprises obtaining an image of the surface of the
sample.
[0061] In an embodiment, the method further comprises:
[0062] processing the obtained image so as to determine a change in
gray scale of the image of the surface of the sample; and
[0063] sending a control signal to the laser so as to reduce the
power of the laser or to turn off the laser if the change in gray
scale exceeds a threshold.
[0064] In an embodiment, the monitoring a surface state of the
sample comprises monitoring whether or not the surface of the
sample generates smog during irradiating of the exciting light from
the laser onto the sample, and the method further comprises sending
a control signal to the laser so as to reduce the power of the
laser or to turn off the laser if it is monitored that the surface
of the sample generates smog.
[0065] With the Raman spectrum inspection apparatus and the method
of monitoring a detection security of the Raman spectrum inspection
apparatus in the above embodiments, it is possible to prevent
security problem caused by over-heat damage of the sample due to
the irradiating of the exciting light during the Raman spectrum
inspection.
BRIEF DESCRIPTION OF THE DRAWINGS
[0066] In order that the present disclosure can be understood
better, embodiments of the present disclosure will be described
below with reference to the following drawings:
[0067] FIG. 1 is a schematic diagram showing an arrangement of a
Raman spectrum inspection apparatus according to an embodiment of
the present disclosure;
[0068] FIG. 2 is a schematic diagram showing an arrangement of a
Raman spectrum inspection apparatus according to another embodiment
of the present disclosure;
[0069] FIG. 3 is a schematic diagram showing an arrangement of a
Raman spectrum inspection apparatus according to a further
embodiment of the present disclosure;
[0070] FIG. 4 is a schematic diagram showing an arrangement of a
Raman spectrum inspection apparatus according to a yet further
embodiment of the present disclosure;
[0071] FIG. 5 is a schematic diagram showing an arrangement of a
Raman spectrum inspection apparatus according to a still further
embodiment of the present disclosure;
[0072] FIG. 6 is a flow chart of a method of monitoring a detection
security of a Raman spectrum inspection apparatus according to an
embodiment of the present disclosure;
[0073] FIG. 7 is a schematic diagram showing an arrangement of a
Raman spectrum inspection apparatus according to a yet still
further embodiment of the present disclosure.
[0074] FIG. 8 is a schematic diagram showing an arrangement of a
Raman spectrum inspection apparatus according to a yet still
further embodiment of the present disclosure;
[0075] FIG. 9 is a schematic diagram showing an arrangement of a
Raman spectrum inspection apparatus according to a yet still
further embodiment of the present disclosure;
[0076] FIG. 10 is a schematic diagram showing an arrangement of a
Raman spectrum inspection apparatus according to a yet still
further embodiment of the present disclosure; and
[0077] FIG. 11 is a schematic diagram showing an arrangement of a
Raman spectrum inspection apparatus according to a yet still
further embodiment of the present disclosure.
[0078] Not all circuits or structures of the embodiments are shown
in the drawings. Same reference numerals represent same or similar
components or features throughout all of the drawings.
DETAILED DESCRIPTION OF THE EMBODIMENTS
[0079] Technical solutions of the present disclosure will be
described hereinafter in more detail by the way of embodiments with
reference to the attached drawings. The same or similar reference
numerals refer to the same or similar elements throughout the
description. The explanation to the embodiments of the present
disclosure with reference to the attached drawings is intended to
interpret the general concept of the present disclosure, rather
than being construed as limiting the present disclosure.
[0080] In accordance with a general concept of the present
disclosure, it provides a Raman spectrum inspection apparatus
comprising: a laser configured to emit exciting light; an optical
device configured to guide the exciting light to a sample and
collect a light signal from the sample; a spectrometer configured
to split the light signal collected by the optical device so as to
generate a Raman spectrum of the detected sample; and a security
monitor configured to monitor a security state of the sample during
irradiating of the exciting light from the laser onto the sample,
and to provide a security indicating signal representing whether or
not the sample is damaged due to being irradiated by the exciting
light. Thereby, it is possible to prevent security problem caused
by over-heat damage of the sample due to the irradiating of the
exciting light during the Raman spectrum inspection.
[0081] In addition, in the following detailed description, for
purposes of explanation, numerous specific details are set forth in
order to provide a thorough understanding of the disclosed
embodiments. It will be apparent, however, that one or more
embodiments may be practiced without these specific details. In
other instances, well-known structures and devices are
schematically shown in order to simplify the drawings.
[0082] FIG. 1 is a schematic diagram showing a structure of the
Raman spectrum inspection apparatus 100a according to an exemplary
embodiment of the present disclosure. The Raman spectrum inspection
apparatus 100a includes a laser 10 configured to emit an exciting
light 11; an optical device or assembly 20 configured to guide the
exciting light 11 to a sample 30 and collect a light signal from
the sample 30; a spectrometer 40 configured to split the light
signal collected by the optical device to generate Raman spectrum
of the sample 30. As an example, the Raman spectrum of the sample
30 generated by the spectrometer 40 may be compared with the Raman
spectra of the known substances to determine the composition of the
sample 30. The comparing may be implemented for example by a
computer or a processor.
[0083] During the Raman inspection, security accident may typically
refer to that heat absorption of sample causes temperature rise
during irradiating of the exciting light onto the sample, and
thereby it may result in ablation, even ignition and explosion
phenomenon of the detected object. In the embodiments of the
present disclosure, the Raman spectrum inspection apparatus further
comprises or is provided with a security monitor configured to
monitor a security state of the sample 30 during irradiating of the
exciting light 11 from the laser 10 onto the sample 30. In an
example, the security monitor may provide a security indicating
signal representing whether or not the sample is damaged due to
being irradiated by the exciting light.
[0084] In some examples, as described below, the Raman spectrum
inspection apparatus may further comprise a controller (see for
example FIG. 5), which is configured to send a control signal to
the laser so as to reduce the power of the laser or to turn off the
laser if the security indicating signal provided by the security
monitor indicates that the security of the sample is affected by
the detection performed to the sample.
[0085] Exemplarily, in the detection by using the exciting light to
irradiate the sample, the security state of the sample may be
represented by a temperature, a variation of temperature or a
surface state of the sample. In some embodiments, the security
monitor comprises a temperature sensor configured to sense a
temperature or a variation of temperature of the detected sample
during irradiating of the exciting light from the laser onto the
sample. The controller may send a control signal to the laser so as
to take corresponding measures, for example, to reduce the power of
the laser or to turn off the laser in order to ensure detection
security, if the temperature or variation of temperature of the
sample sensed by the temperature sensor exceeds a threshold. In
other embodiments, the temperature may be monitored after allowing
the exciting light to irradiate for a short time before the Raman
inspection, and the detection security of the sample is determined
based on the variation of temperature, then the emitting of the
exciting light is controlled accordingly.
[0086] The temperature sensor may include a contact type
temperature sensor or non-contact type temperature sensor. The
contact type temperature sensor may contact a predetermined
position of the sample (for example, may be located near a position
of the sample onto which the exciting light is irradiated, or may
be located at a front face, a side face or a rear face of the
sample), and sense a temperature of the surface or interior of the
sample irradiated by the exciting light. The contact type
temperature sensor may transmit temperature information in a wired
way or wirelessly to the system.
[0087] As an example of the non-contact type temperature sensor, as
shown in FIG. 1, an infrared detector 50 may be adopted as an
infrared thermometer to detect the infrared light 31 emitted by the
sample 30, so as to monitor the temperature or variation of
temperature of the sample 30, since the radiation energy of the
infrared light typically increases as the temperature of the sample
rises. The variation of temperature of the sample 30 can be found
by monitoring the radiation energy of the infrared light and then
the emission of the laser may be controlled timely, so as to avoid
security accident.
[0088] It will be understood that various forms of temperature
sensors may be used as the security monitor to monitor the
temperature or the variation of temperature of the detected sample,
and the infrared detector 50 will be described below as an example
of the temperature sensor.
[0089] FIG. 2 shows an arrangement of a Raman spectrum inspection
apparatus 100b according to an embodiment of the present
disclosure. In an example, as shown in FIG. 2, the optical device
20 may form or establish a Raman light signal collection light path
21 configured to collect a light signal, including Raman light
component, from the sample 30. A first beam splitter 22 is provided
in the Raman light signal collection light path 21. The first beam
splitter 22 is arranged to form an infrared radiation branch 23
branching from the Raman light signal collection light path 21, to
guide the infrared light from the sample 30 towards the infrared
detector 50. The first beam splitter 22 can extract the infrared
light emitted from the sample 30 from the Raman light signal
collection light path 21, thus it may detect the infrared light
while preventing the Raman light signal from being affected to the
largest extent. As an example, the first beam splitter 22 may guide
(e.g., reflect) the infrared light in a response waveband of the
infrared detector to the infrared detector to the largest extent
while preventing the Raman light signal (generally in a range of
0-3000 cm.sup.-1 (wave number) from being affected as far as
possible. Certainly, it may also process the infrared light in the
infrared radiation branch 23, for example, select waveband of the
infrared light, or converge the infrared light, if required.
[0090] In the above example, the light path along which the
infrared light travels and the light path along which the Raman
scattering light travels are same or coaxial at their beginning
ends (at the ends close to the sample 30, that is, a light path
from the sample to the first beam splitter). The infrared light
collected by this way can better exhibit actual temperature of the
sample 30.
[0091] As an example, the first beam splitter 22 may be a short
pass dichroic beam splitter arranged to reflect a light having a
wavelength greater than a predetermined wavelength towards the
infrared detector 50 while transmitting the light having a
wavelength less than the predetermined wavelength through the short
pass dichroic beam splitter. For example, the predetermined
wavelength may be in a range of 700 nanometers to 300 micrometers,
for example, between 900 nanometers and 1500 nanometers, for
example, the predetermined wavelength may be arranged as 1200
nanometers. However, the predetermined wavelength of the short pass
dichroic beam splitter is not limited to this range in the
embodiments of the present disclosure. Typically, the wavelength
range of the Raman spectrum for the spectrometer in the Raman
spectrum inspection apparatus is from 550 nanometers to 1100
nanometers. The light having the wavelength less than the
predetermined wavelength may be transmitted through the short pass
dichroic beam splitter (for example, the transmissivity may be 90%
or more), which will substantially have no influence on the Raman
spectrum inspection. Meanwhile, the light having the wavelength
greater than the predetermined wavelength can be transmitted along
the infrared radiation branch to the infrared detector 50.
Correspondingly, the infrared light will be received and analyzed
by the infrared detector. A typical response waveband of the
infrared detector may for example be 1500 nanometers to 3000
nanometers. However, the embodiments of the present disclosure are
not limited to this, and the predetermined wavelength may be set
according to the specific detector.
[0092] Although the short pass dichroic beam splitter is taken as
an example to describe the first beam splitter 22 in the above
example, it is not intended to limit embodiments of the present
disclosure. Alternatively, the first beam splitter 22 may be
implemented by any other wavelength selection beam splitting
components known in the art.
[0093] In the embodiments of the present disclosure, the first beam
splitter may also for example be implemented by a conventional beam
splitter. As an example, the first beam splitter may be arranged to
reflect a part of the light signal from the sample towards the
infrared detector while transmitting the other part of the light
signal from the sample towards the spectrometer. It may also
achieve the signal light collecting function and the temperature
monitoring function.
[0094] In an example, in the exemplified Raman spectrum inspection
apparatus 100b shown in FIG. 2, a first convergent lens 24, a
second convergent lens 41 and a second beam splitter 25 may also be
provided in the Raman light signal collection light path 21. The
first convergent lens 24 is configured to converge the exciting
light 11 to the sample 30 and collect a light signal from the
sample 30. The second convergent lens 41 is configured to converge
the collected light signal to the spectrometer 40. The second beam
splitter 25 is arranged between the first convergent lens 24 and
the first beam splitter 22 in the Raman light signal collection
light path 21 and arranged to reflect the exciting light 11 from
the laser 10 towards the first convergent lens 24 and transmit at
least a part of the reflected light collected by the first
convergent lens 24 from the sample 30 through the second beam
splitter 25 to the first beam splitter 22 or the second convergent
lens 41. In this example, the part of the light path along which
the exciting light 11 is guided to the sample 30 and the part of
the Raman light signal collection light path 21 between the second
beam splitter 25 and the sample 30 coincide or are coaxial with
each other. In the light path, the first beam splitter 22 is
located downstream of the second beam splitter 25, which may avoid
disturbance to the front end of the light path.
[0095] As an example, the positions of the first beam splitter 22
and the second beam splitter 25 in FIG. 2 may be exchanged. For
example, as shown in FIG. 7, in the Raman spectrum inspection
apparatus 100b', the second beam splitter 25 is located between the
first beam splitter 22 and the second convergent lens 41 in the
Raman light signal collection light path 21.
[0096] As an example, the second beam splitter 25 may be a long
pass dichroic beam splitter, that is, it only permits the light
having the wavelength greater than a certain threshold to be
transmitted through it while blocking the light having the
wavelength less than the threshold. It has an advantage of reducing
Rayleigh scattering light from the sample 30. While producing the
Raman scattering light, the sample 30 may often produce the
Rayleigh scattering light which has a wavelength less than that of
the Raman scattering light. The threshold of the long pass dichroic
beam splitter may be set to reduce, even eliminate the Rayleigh
scattering light having shorter wavelength, to enhance the signal
noise ratio of the Raman light signal. The specific threshold of
the long pass dichroic beam splitter may be selected as required in
practical measurement. In the embodiments of the present
disclosure, the second beam splitter 25 is not limited to the long
pass dichroic beam splitter, for example, the second beam splitter
25 may be implemented by any other beam splitting components known
in the art.
[0097] In an example, as shown in FIG. 5, in order to better
suppress the Rayleigh scattering light, a Raman spectrum inspection
apparatus 100e may be further provided with a long pass optical
filter or a notch optical filter 26 arranged downstream of the
first beam splitter in the Raman light signal collection light path
21 and configured to filter out the Rayleigh scattering light in
the light signal passing through the first beam splitter 22. In the
embodiments of the present disclosure, however, it is not intended
to limit the position of the long pass optical filter or notch
optical filter 26 in the Raman light signal collection light path
21, it may be arranged at any position between the sample and the
spectrometer as long as it can serve for removing the Rayleigh
scattering light of the light signal in the collection light path.
For example, the long pass optical filter or notch optical filter
may be located upstream of the first beam splitter as a variant to
the embodiment shown in FIG. 5, or the long pass optical filter or
notch optical filter 26 may also be provided between the first beam
splitter and the second beam splitter. In the latter case, the
light signal in the collection light path may pass through the
first convergent lens, the second beam splitter, the long pass
optical filter or notch optical filter, the first beam splitter,
the second convergent lens and the spectrometer successively.
Certainly, the embodiments of the present disclosure are not
limited to this, for example, no long pass optical filters or notch
optical filters 26 may be provided.
[0098] In another example, as shown in FIG. 3 and FIG. 4, the
optical device 20' may further form or establish: a Raman light
signal collection light path 21 configured to collect the Raman
light signal from the sample; and an infrared light collection
light path 23' configured to collect the infrared light from the
sample 30. In contrast to the infrared radiation branch 23 in the
examples shown in FIG. 1 and FIG. 2, the infrared light collection
light path 23' is independent of or separated completely from the
Raman light signal collection light path 21. In this way, the
original light path structure of the Raman spectrum inspection
apparatus may be remained as far as possible. The infrared detector
50 may be arranged at any position close to the sample 30 as long
as the intensity of the infrared signal may satisfy the detection
requirements of the infrared detector 50.
[0099] The exemplified Raman spectrum inspection apparatus 100c
shown in FIG. 3 is same as the exemplified Raman spectrum
inspection apparatus 100d shown in FIG. 4 except the following
structure: in FIG. 3, the part of the light path along which the
exciting light 11 is guided to the sample 30 (i.e., the exciting
light path) and the part of the Raman light signal collection light
path 21 between the second beam splitter 25 and the sample 30
coincide or are coaxial with each other, while in FIG. 4, the light
path along which the exciting light 11 is guided to the sample 30
is separated completely from the Raman light signal collection
light path 21 (or in other words, "the exciting light 11 is
irradiated off-axis or offset to the sample 30"). In the example
shown in FIG. 4, the second beam splitter 25 is not a necessary
element. The presentation of it in FIG. 4 is only intended to
compare the example of FIG. 4 with the example of FIG. 3.
[0100] In the embodiments shown in FIG. 1 and FIG. 4, as an
example, the exciting light may be redirected by some optical
elements (such as a reflector) before it is irradiated to the
sample 30, such that the exciting light can be guided conveniently
and correctly to the sample 30.
[0101] As shown in FIG. 5, in an example, the Raman spectrum
inspection apparatus 100e may further include a controller 60. The
controller 60 is configured to receive the detection results of the
infrared detector 50 and send a control signal to the laser 10. The
controller 60 may be configured to reduce the power of the laser 10
or turn off the laser 10 when the radiation energy of the infrared
light detected by the infrared detector 50 exceeds a predetermined
threshold. As an example, there is a correspondence relation
between the temperature of the sample 30 and the radiation energy
of the infrared light emitted by the sample 30, thus the
predetermined threshold of the radiation energy of the infrared
light set in the controller 60 may correspond to a temperature
value not greater than the maximum permissible temperature of the
sample 30, so as to prevent the sample 30 from being destroyed due
to high temperature. The controller 60 may be implemented by
components such as an integrated circuit, a signal processor, a
computer or the like.
[0102] As an example, the optical device 20 may be integrated in an
optical fiber probe 70. The exciting light 11 emitted by the laser
10 may be guided into the optical fiber probe 70 by an importing
optical fiber 71. The optical fiber probe 70 transmits the
collected Raman light signal to the spectrometer 40 by a collection
optical fiber 72. Certainly, the optical device 20 may also be
constructed by separate optical elements. However, the optical
fiber probe 70 may improve stability of the system.
[0103] As an example, the exciting light may also pass through a
collimating lens 27 and a narrow band optical filter 28 before
arriving at the second beam splitter 25 or the first convergent
lens 24. The collimating lens 27 may convert the exciting light
into a substantially parallel light beam to improve directivity and
optical efficiency. The narrow band optical filter 28 may remove
disturbance to enhance the signal to noise ratio of the exciting
light in a desired waveband. As an example, in order to fold the
light path, one or more deflecting mirrors 29 may also be arranged.
As an example, in order that the Raman light signal can better be
coupled into the spectrometer 40, the second convergent lens 41 may
further be arranged upstream of the collection optical fiber
72.
[0104] In addition, it is noted that although only one infrared
detector is shown in illustrated embodiments, the present
disclosure is not limited to this. In other embodiments, a
multi-point detection mode may be applied so that a plurality of
temperature sensors (e.g., infrared detectors) are arranged at
different positions relative to the sample to more accurately and
timely detect the temperature or variation of temperature of the
sample. For example, some temperature sensors are located near the
sample (for example, located at a side face or rear face of the
sample) or in contact with the sample, while other temperature
sensors (e.g., infrared detectors) are located relatively far away
from the sample, and different sensors may be activated according
to specific requirements (e.g., size, shape, position, etc.) of the
sample to be detected.
[0105] The positions of the infrared detectors or temperature
sensors are not limited to those in the above examples, for
example, they may be arranged near the spectrometer. FIG. 8 shows
an arrangement of a Raman spectrum inspection apparatus according
to an exemplary embodiment of the present disclosure. As shown in
the Figure, in the Raman spectrum inspection apparatus, an infrared
spectrometer is used as the infrared detector, the infrared
detector and the spectrometer for detecting the Raman spectrum may
be integrated together or provided closely in a same detector, for
example in the detector 45 shown in FIG. 8, such that a portion
(e.g., a detection unit or pixel point)of the detector 45 is
configured to detect an infrared signal emitted from the sample 30
during irradiation of the exciting light from the laser onto the
sample, while another portion of the detector is configured to
detect a Raman spectrum signal from the sample 30, thereby enabling
detection of the Raman spectrum and detection of the infrared light
at close positions. The beam splitter 25, which is arranged in the
Raman light signal collection light path 21, is configured to
reflect the exciting light 11 from the laser 10 towards the first
convergent lens 24 and transmit at least a part of the reflected
light, which is collected by the first convergent lens 24 from the
sample 30, through the beam splitter 25, to the detector 45.
Optionally, as described above, the light path of the exciting
light 11 may be partly coaxial with the Raman light signal
collection light path 21, or may be completely separated
(independent of), off-axis or offset from the Raman light signal
collection light path 21.
[0106] It will be understood that the detector 45 described herein
may include an array consisted of a plurality of detector elements
or units, where a portion of the detector elements or units of the
array are used for detecting the infrared signal emitted from the
sample, and another portion of the detector elements or units of
the array are used for detecting the Raman spectrum signal from the
sample. Further, in other embodiments, the detector(s) for
detecting the Raman spectrum signal from the sample and the
detector(s) or sensor(s) for detecting the infrared signal from the
sample may be located at substantially the same orientation with
respect to the sample, for example, there may be provided at least
two independent or separate detectors arranged adjacent to each
other or side by side, and they may be positioned symmetrically
with respect to the Raman light signal collection light path so as
to detect the Raman spectrum signal and the infrared signal from
the sample respectively.
[0107] In some embodiments of the present disclosure, the security
monitor may monitor a surface state of the sample during
irradiating of the exciting light from the laser onto the sample,
the surface state indicating whether or not the sample is damaged
due to being irradiated by the exciting light. The sample will
generally generate smog together with slight surface damage (for
example, a change in color gray scale or a pit) or ablation before
or during burning due to irradiation of the exciting light, and
monitoring of these surface states may monitor the security of
detection of the sample.
[0108] In the embodiment shown in FIG. 9, the security monitor
comprises an imaging device 80 for capturing an image of a surface
of the sample 30, for example, a camera. The imaging device 80 may
be arranged near or around the sample 30 to be detected, so as to
obtain the image of the surface, onto which the exciting light
irradiates, of the sample 30 during the irradiating of the exciting
light onto the sample. Exemplarily, during detection of the sample
by the Raman spectrum inspection apparatus, the image of the
surface of the sample to be detected may be captured by the imaging
device in real time, or may be captured discontinuously or
periodically at a certain time interval.
[0109] The surface state, such as color or gray scale or variation
thereof, surface pits and the like, of the detected sample may be
viewed or identified based on the obtained image, images which are
obtained at different time may be compared to each other so that
the surface state of the sample is determined. In an embodiment, as
shown in FIG. 9, the Raman spectrum inspection apparatus further
comprises an image processor 90 and a controller 60, the image
processor 90 is configured to process an image obtained by the
imaging device 80 so as to determine a change in gray scale of the
image of the surface of the sample irradiated by the exciting
light. It may be determined that the surface of the sample is
damaged or burned if the change in gray scale exceeds a threshold,
thereby the controller 60 sends a control signal to the laser 10 so
as to reduce the power of the laser or to turn off the laser,
ensuring detection security.
[0110] In the embodiment shown in FIG. 10, the imaging device may
be in form of a CCD device 81, and a beam splitter 22' may be
provided in the Raman light signal collection light path 21 to
guide a part of the light from the sample 30 along a light path 82
towards the CCD device 81. A convergent lens 83 may be provided in
the light path 82 so that the image of the irradiated surface of
the sample 30 may be obtained more accurately by the CCD device
81.
[0111] In some examples, the light path, which extends from the
sample 30 to the imaging device and is arranged for obtaining the
image of the surface of the sample irradiated by the exciting
light, may be completely independent of or separated from the Raman
light signal collection light path, as shown in FIG. 9; or, at
least a portion of the light path 82, which extends from the sample
30 to the CCD device 81 and is arranged for obtaining the image of
the surface of the sample irradiated by the exciting light, may be
coaxial with the Raman light signal collection light path 21, as
shown in FIG. 10.
[0112] In another exemplary embodiment of the present disclosure,
as shown in FIG. 11, the security monitor for monitoring the
surface state of the sample may include a smog detector 86
configured to monitor whether or not the surface of the sample 30
generates smog during irradiating of the exciting light 11 from the
laser 10 onto the sample 30. Exemplarily, the smog detector may be
positioned at an appropriate distance from the sample so as to be
able to timely and accurately detect whether or not the surface of
the sample 30 generates smog. The controller 60 will send a control
signal to the laser 10 so as to reduce the power of the laser or to
turn off the laser if it is monitored by the smog detector 86 that
the surface of the sample 30 generates smog.
[0113] It will be understood that although different arrangements
for monitoring the security state of the sample are illustrated in
the shown embodiments, such as the temperature sensor (e.g., an
infrared detector), the imaging device, the smog detector and the
like, the present disclosure is not limited to those. In other
embodiments, other appropriate security monitoring arrangements may
also be adopted. Further, a multi-point detection mode may be
applied so that a plurality of temperature sensors (e.g., infrared
detectors), imaging devices, smog detectors or a combination
thereof are arranged at different positions relative to the sample
to more accurately and timely monitor the security state of the
sample during the inspection.
[0114] An embodiment of the present disclosure also provides a
method 200 of monitoring a detection security of a Raman spectrum
inspection apparatus. As shown in FIG. 6, the method 200 may
include:
[0115] Step S10: emitting an exciting light by a laser;
[0116] Step S20: guiding the exciting light to a sample and
collecting a Raman light signal from the sample; and
[0117] Step S30: monitoring a security state of the sample during
irradiating of the exciting light from the laser onto the sample,
and providing a security indicating signal representing whether or
not the sample is damaged due to being irradiated by the exciting
light.
[0118] In some embodiments, the step S30 may comprise sensing a
temperature or a variation of temperature of the detected sample
during irradiating of the exciting light from the laser onto the
sample. Exemplarily, radiation energy of infrared light emitted
from the sample may be detected by an infrared detector to monitor
the temperature or the variation of temperature of the sample. The
method may be used to monitor the temperature or variation of
temperature of the sample when the Raman spectrum inspection
apparatus works.
[0119] In other embodiments, the step S30 may comprise monitoring a
surface state of the sample during irradiating of the exciting
light from the laser onto the sample, the surface state indicating
whether or not the sample is damaged due to being irradiated by the
exciting light. Exemplarily, during irradiating of the exciting
light from the laser onto the sample, the image of the surface of
the sample irradiated by the exciting light may be obtained, and
the obtained image is processed so as to determine a change in gray
scale of the image of the surface of the sample. Alternatively or
additionally, it may monitor whether or not the surface of the
sample generates smog during irradiating of the exciting light from
the laser onto the sample, so as to monitor the surface state of
the sample.
[0120] As an example, the method 200 may further comprise:
[0121] Step S40: sending a control signal to the laser so as to
reduce the power of the laser or to turn off the laser if the
security indicating signal indicates that the security of the
sample is affected by the detection performed to the sample. In
some embodiments, when the sensed temperature or variation of
temperature of the sample exceeds a threshold (for example, when
the temperature of the sample is higher than a predetermined
threshold), a control signal is sent to the laser to reduce the
power of the laser or to turn off the laser. Exemplarily, if a
radiation energy of the infrared light detected by the infrared
detector exceeds a predetermined threshold, a control signal is
sent to the laser to reduce the power of the laser or to turn off
the laser. In other embodiments, if the determined change in gray
scale of the surface of the sample exceeds a threshold, and/or if
it is monitored that the surface of the sample generates smog, a
control signal is sent to the laser to reduce the power of the
laser or to turn off the laser.
[0122] The step S40 may be used to monitor whether or not the
temperature of the sample is greater than the predetermined
threshold (the predetermined threshold may for example be 80
Celsius degrees, 100 Celsius degrees, 150 Celsius degrees, or the
like, and may be determined depending on the sample 30) in
real-time when the Raman spectrum inspection apparatus works, so as
to ensure security of the detection operation.
[0123] As an example, the monitoring method 200 may further
include:
[0124] Step S50: turning off the laser after the laser emits the
exciting light for a predetermined period, and determining security
of the sample according to variation of temperature of the sample
irradiated by the exciting light within the predetermined
period.
[0125] The step S50 may be used to estimate security of the
detection before the Raman spectrum detection operation is
practically carried out. The predetermined period may for example
be 0.5 second, 1 second, 3 seconds, or the like. If it is estimated
that the temperature of the sample may be too high, Raman
inspection parameters (for example laser power, position of the
sample, or the like) may be controlled deliberately, so as to avoid
security risk in the practical inspection.
[0126] In the embodiments of the present disclosure, any one of the
step S40 and step S50 may be used separately, or they may be used
in combination. The dashed parts in FIG. 6 represent optional
steps.
[0127] In the embodiments of the present disclosure, the security
state of the sample may be monitored in real time during the Raman
inspection; or, by emitting exciting light for a short time before
the Raman inspection, it may be determined whether or not the
applied exciting light would damage the sample so as to judge the
detection security of the sample, then parameters (e.g., power of
the laser) for the Raman inspection may be controlled accordingly
to ensure detection security.
[0128] The above description has explained various embodiments of
the above Raman spectrum inspection apparatus and monitoring method
thereof by schematic diagrams, flow charts and/or examples. In case
that the schematic diagrams, flow charts and/or examples each
include one or more functions and/or operations, the skilled person
in the art should understand that each function and/or operation in
such schematic diagrams, flow charts and/or examples may be
implemented separately and/or collectively by various structures,
hardware, software, firmware or any combination of them in
essential. In an embodiment, some parts of the subject of the
embodiment of the present disclosure may be implemented by
Application Specific Integrated Circuits (ASIC), Field Programmable
Gate Arrays (FPGA), Digital Signal Processors (DSP) or other
integrated forms. However, the skilled person in the art should
understand that some aspects of the embodiments disclosed herein
may be implemented equally in the integrated circuit entirely or
partly, implemented as one or more computer programs running on one
or more computers (for example, implemented as one or more programs
running on one or more computer systems), implemented as one or
more programs running on one or more processors (for example,
implemented as one or more programs running on one or more
microprocessors), implemented as firmware, or implemented as any
combination of the above methods in essential. From the present
disclosure, the skilled person in the art has capability of
designing circuits and/or writing software and/or firmware codes.
Furthermore, the skilled person in the art will appreciate that the
mechanism of the subject of the present disclosure may be delivered
as various forms of program products, and the exemplified
embodiments of the subject of the present disclosure may be
applicable independent of the specific types of the signal carrying
media that perform the delivery in practice. Examples of the signal
carrying media include, but not limited to: recordable media, such
as a floppy disc, a hard disk drive, an optical disc (CD, DVD), a
digital magnetic tape, a computer memory or the like; and
transmission media such as digital and/or analogue communication
media (for example, an optical fiber cable, a wave guide, a wired
communication link, a wireless communication link or the like).
[0129] All of the above embodiments of the present disclosure may
be combined freely to form other embodiments unless there are
technical obstacles or contradictions. All of these other
embodiments fall within the protection scope of the present
disclosure.
[0130] Although the present disclosure has been explained with
reference to the drawings, the embodiments shown in the drawings
are only illustrative, instead of limiting the present disclosure.
Scales in the drawings are only illustrative, instead of limiting
the present disclosure.
[0131] Although some embodiments of the general inventive concept
are illustrated and explained, it would be appreciated by those
skilled in the art that modifications and variations may be made in
these embodiments without departing from the principles and spirit
of the general inventive concept of the present disclosure, the
scope of which is defined in the appended claims and their
equivalents.
* * * * *