U.S. patent application number 16/234319 was filed with the patent office on 2019-08-22 for apparatuses having memory strings compared to one another through a sense amplifier.
This patent application is currently assigned to Micron Technology, Inc.. The applicant listed for this patent is Micron Technology, Inc.. Invention is credited to Sangmin Hwang, Tae H. Kim, Si-Woo Lee.
Application Number | 20190259444 16/234319 |
Document ID | / |
Family ID | 67106600 |
Filed Date | 2019-08-22 |
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United States Patent
Application |
20190259444 |
Kind Code |
A1 |
Kim; Tae H. ; et
al. |
August 22, 2019 |
Apparatuses Having Memory Strings Compared to One Another Through a
Sense Amplifier
Abstract
Some embodiments include an apparatus having first and second
comparative bitlines extending horizontally and coupled with a
sense amplifier. First memory cell structures are coupled with the
first comparative bitline. Each of the first memory cell structures
has a first transistor associated with a first capacitor. Second
memory cell structures are coupled with the second comparative
bitline. Each of the second memory cell structures has a second
transistor associated with a second capacitor. Each of the first
capacitors has a container-shaped first node and is vertically
offset from an associated first sister capacitor which is a mirror
image of its associated first capacitor along a horizontal plane.
Each of the second capacitors has a container-shaped first node and
is vertically offset from an associated second sister capacitor
which is a mirror image of its associated second capacitor along
the horizontal plane.
Inventors: |
Kim; Tae H.; (Boise, ID)
; Hwang; Sangmin; (Boise, ID) ; Lee; Si-Woo;
(Boise, ID) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Micron Technology, Inc. |
Boise |
ID |
US |
|
|
Assignee: |
Micron Technology, Inc.
Boise
ID
|
Family ID: |
67106600 |
Appl. No.: |
16/234319 |
Filed: |
December 27, 2018 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
15900403 |
Feb 20, 2018 |
10347322 |
|
|
16234319 |
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Current U.S.
Class: |
1/1 |
Current CPC
Class: |
G11C 11/4091 20130101;
G11C 11/2257 20130101; H01L 27/10805 20130101; G11C 11/2255
20130101; G11C 11/2273 20130101; G11C 11/4097 20130101; G11C 5/025
20130101; G11C 8/14 20130101; G11C 11/403 20130101; G11C 11/221
20130101; G11C 2211/4013 20130101; G11C 11/4085 20130101 |
International
Class: |
G11C 11/4091 20060101
G11C011/4091; G11C 11/22 20060101 G11C011/22; G11C 11/4097 20060101
G11C011/4097 |
Claims
1-27. (canceled)
28. An apparatus comprising: a first bitline extending
horizontally; a second bitline being offset vertically from the
first bitline and extending horizontally in parallel to the first
bitline; a common plate extending horizontally between the first
and second bitlines; a plurality of first memory cell structures
disposed horizontally between the first bitline and the common
plate, each of the plurality of first memory cell structures
including a first access device and a first capacitor coupled in
series between the first bitline and the common plate; a plurality
of second memory cell structures disposed horizontally between the
second bitline and the common plate, each of the plurality of
second memory cell structures including a second access device and
a second capacitor coupled in series between the second bitline and
the common plate; a first sense amplifier coupled to the first
bitline; a second sense amplifier coupled to the second bitline; a
third bitline extending horizontally; a plurality of third memory
cell structures each coupled to the third bitline; a fourth bitline
extending horizontally; and a plurality of fourth memory cell
structures each coupled to the fourth bitline; wherein the first
sense amplifier is further coupled to the third bitline to compare
the first and third bitlines with each other; and wherein the
second sense amplifier is further coupled to the fourth bitline to
compare the third and fourth bitlines with each other.
29-39. (canceled)
Description
TECHNICAL FIELD
[0001] Apparatuses having memory strings which are compared to one
another through a sense amplifier.
BACKGROUND
[0002] Memory is utilized in modern computing architectures for
storing data. One type of memory is Dynamic Random Access Memory
(DRAM). DRAM may provide advantages of structural simplicity, low
cost and high speed in comparison to alternative types of
memory.
[0003] DRAM may utilize memory cells which have one capacitor in
combination with one transistor (so-called 1T-1C memory cells),
with the capacitor being coupled with a source/drain region of the
transistor. An example 1T-1C memory cell 1000 is shown in FIG. 1,
with the transistor labeled T and the capacitor labeled C. The
capacitor has one node coupled with a source/drain region of the
transistor, and has another node coupled with a common plate, CP.
The common plate may be coupled with any suitable voltage, such as
a voltage within a range of from greater than or equal to ground to
less than or equal to VCC (i.e., ground.ltoreq.CP.ltoreq.VCC). In
some applications, the common plate is at a voltage of about
one-half VCC (i.e., about VCC/2). The transistor has a gate coupled
to a wordline WL (i.e., access line), and has a source/drain region
coupled to a bitline BL (i.e., digit line or sense line). In
operation, an electrical field generated by voltage along the
wordline may gatedly couple the bitline to the capacitor during
read/write operations.
[0004] Another prior art memory cell configuration utilizes two
capacitors in combination with two transistors. Such configuration
may be referred to as a 2T-2C memory cell. A 2T-2C memory cell 1010
is schematically illustrated in FIG. 2. The two transistors of the
memory cell are labeled T1 and T2, and may be referred to as first
and second transistors, respectively. The two capacitors are
labeled C1 and C2, and may be referred to as first and second
capacitors, respectively.
[0005] A source/drain region of the first transistor T1 connects
with a node of the first capacitor C1, and the other source/drain
region of the first transistor T1 connects with a first comparative
bitline BL-T. A gate of the first transistor T1 connects with a
wordline WL. A source/drain region of the second transistor T2
connects with a node of the second capacitor C2, and the other
source/drain region of the second transistor T2 connects with a
second comparative bitline BL-C. A gate of the second transistor T2
connects with the wordline WL. Each of the first and second
capacitors C1 and C2 has a node electrically coupled with a common
plate CP.
[0006] The comparative bitlines BL-T and BL-C extend to a sense
amplifier SA which compares electrical properties (e.g., voltage)
of the two to ascertain a memory state of memory cell 1010. The
bitline BL-T may be referred to as a true bitline, and the bitline
BL-C may be referred to as a complementary bitline. The terms
"true" and "complementary" are arbitrary, and merely indicate that
the bitline values of BL-T and BL-C are to be compared to one
another.
[0007] It would be desirable to develop architectures which
incorporate memory into highly-integrated arrangements in order to
conserve valuable real estate of a semiconductor chip.
BRIEF DESCRIPTION OF THE DRAWINGS
[0008] FIG. 1 is a schematic diagram of a prior art memory cell
having 1 transistor and 1 capacitor.
[0009] FIG. 2 is a schematic diagram of a prior art memory cell
having 2 transistors and 2 capacitors.
[0010] FIG. 3 is a schematic diagram of a region of an example
apparatus.
[0011] FIG. 4 is a diagrammatic cross-sectional view of an example
arrangement of structures which may be utilized in the example
apparatus of FIG. 3.
[0012] FIG. 5 is a schematic diagram of a region of an example
apparatus.
[0013] FIG. 6 is a diagrammatic cross-sectional view of an example
arrangement of structures which may be utilized in the example
apparatus of FIG. 5.
[0014] FIG. 7 is a schematic diagram of a region of an example
apparatus.
[0015] FIG. 8 is a diagrammatic cross-sectional view of an example
arrangement of structures which may be utilized in the example
apparatus of FIG. 7.
[0016] FIG. 9 is a schematic diagram of a region of an example
apparatus.
DETAILED DESCRIPTION OF THE ILLUSTRATED EMBODIMENTS
[0017] Some embodiments include arrangements of memory cell strings
which are to be compared with one another through a sense
amplifier. The memory cell strings may include memory cell
structures having at least one transistor and at least one
capacitor. In some example embodiments, the memory cell structures
may be 1T-1C memory cells. In some example embodiments, the memory
cell structures may be 2T-2C cells. The arrangements may be highly
integrated by having various components vertically-stacked one atop
another. Example configurations are described with reference to
FIGS. 3-9.
[0018] Referring to FIG. 3, an example apparatus (i.e.,
construction, assembly, etc.) 10 includes a first comparative
bitline BL-T which extends horizontally, and which is coupled with
a sense amplifier SA. The apparatus 10 also includes a second
comparative bitline BL-C which extend horizontally, and which is
also coupled with the sense amplifier SA.
[0019] A common plate 12 is vertically between the first and second
comparative bitlines, and extends horizontally.
[0020] First memory cell structures are between the first
comparative bitline BL-T and the common plate 12, with such first
memory cell structures being labeled as Cells 0a . . . na; where
"n" is an integer. The first memory cell structures are
horizontally spaced from one another, and are together arranged in
a first memory cell string 14. The total number of the first memory
cell structures within the memory cell string 14 may be any
suitable number; and in some embodiments may be 64 memory cell
structures, 128 memory cell structures, 256 memory cell structures,
512 memory cell structures, 1024 memory cell structures etc.
Accordingly, the integer "n" of Cells 0a . . . na may be, for
example, 63, 127, 255, 511, 1023, etc.
[0021] Each of the first memory cell structures (Cells 0a . . . na)
comprises a first transistor 16 associated with a first capacitor
18. The first transistors 16 are proximate the first comparative
bitline BL-T, and the first capacitors 18 are proximate the common
plate 12.
[0022] Each of the first transistors 16 comprises a gate 17, and a
pair of source/drain regions 13 and 15. The source/drain regions 13
and 15 may be referred to as first and second source/drain regions,
respectively. The second source/drain regions 15 are coupled with
the first comparative bitline BL-T.
[0023] Each of the first capacitors 18 has a first node 19 and a
second node 21. The first node 19 of each capacitor 18 is coupled
with the first source/drain region 13 of the transistor 16
associated with the capacitor 18, and the second note 21 is coupled
with the common plate 12.
[0024] The gates 17 of the transistors 16 are coupled with
wordlines 20 which extend to wordline drivers D0a . . . Dna. The
first memory cells (Cells 0a . . . na) are 1T-1C memory cells, and
each of the drivers D0a . . . Dna is independently controlled
relative to the other drivers D0a . . . Dna.
[0025] Second memory cell structures are between the second
comparative bitline BL-C and the common plate 12, with such second
memory cell structures being labeled as Cells 0b . . . nb. The
second memory cell structures are horizontally spaced from one
another, and are together arranged in a second memory cell string
22.
[0026] Each of the second memory cell structures (Cells 0b . . .
nb) comprises a second transistor 24 associated with a second
capacitor 26. The second transistors 24 are proximate the second
comparative bitline BL-C, and the second capacitors 26 are
proximate the common plate 12.
[0027] Each of the second transistors 24 comprises a gate 27, and a
pair of source/drain regions 23 and 25. The source/drain regions 23
and 25 may be referred to as first and second source/drain regions,
respectively. The second source/drain regions 25 are coupled with
the second comparative bitline BL-C.
[0028] Each of the second capacitors 26 has a first node 29 and a
second node 31. The first node 29 of each capacitor 26 is coupled
with the first source/drain region 23 of the transistor 24
associated with the capacitor 26, and the second note 31 is coupled
with the common plate 12.
[0029] The gates 27 of the transistors 24 are coupled with
wordlines 28 which extend to wordline drivers D0b . . . Dnb. The
second memory cells (Cells 0b . . . nb) are 1T-1C memory cells, and
each of the drivers D0b . . . Dnb is independently controlled
relative to the other drivers D0b . . . Dnb.
[0030] The second memory cell string 22 is a complement to the
first memory cell string 14, and such are configured to be compared
to one another through the sense amplifier SA during memory
operations (e.g., operations in which data is read from the
illustrated memory cells of apparatus 10).
[0031] In some embodiments, the apparatus 10 may be considered to
be an example of a folded architecture, with the second comparative
bitline BL-C being arranged to be under the first comparative
bitline BL-T. The architecture may be highly integrated. In some
embodiments, the second memory cell structures 0b . . . nb may be
directly under the first memory cell structures 0a . . . na; as is
diagrammatically illustrated in the cross-sectional view of FIG.
4.
[0032] The apparatus 10 of FIG. 4 comprises the comparative
bitlines BL-T and BL-C as conductive wiring extending along a
horizontal direction. Such conductive wiring may comprise any
suitable electrically conductive composition(s), such as, for
example, one or more of various metals (e.g., titanium, tungsten,
cobalt, nickel, platinum, ruthenium, etc.), metal-containing
compositions (e.g., metal silicide, metal nitride, metal carbide,
etc.), and/or conductively-doped semiconductor materials (e.g.,
conductively-doped silicon, conductively-doped germanium,
etc.).
[0033] The common plate 12 is also conductive wiring extending
along the horizontal direction. Such conductive wiring may comprise
any suitable electrically conductive composition(s), such as, for
example, one or more of various metals (e.g., titanium, tungsten,
cobalt, nickel, platinum, ruthenium, etc.), metal-containing
compositions (e.g., metal silicide, metal nitride, metal carbide,
etc.), and/or conductively-doped semiconductor materials (e.g.,
conductively-doped silicon, conductively-doped germanium,
etc.).
[0034] The first transistors 16 include the gates 17 extending
around semiconductor material pedestals 30, with the gates 17
comprising conductive material in common with the wordlines 20.
Such conductive material may comprise any suitable electrically
conductive composition(s), such as, for example, one or more of
various metals (e.g., titanium, tungsten, cobalt, nickel, platinum,
ruthenium, etc.), metal-containing compositions (e.g., metal
silicide, metal nitride, metal carbide, etc.), and/or
conductively-doped semiconductor materials (e.g.,
conductively-doped silicon, conductively-doped germanium,
etc.).
[0035] The gates 17 are spaced from the semiconductor material
pedestals 30 by insulative material 32 (which may be referred to as
gate dielectric material). The insulative material 32 may comprise
any suitable composition or combination of compositions; and in
some embodiments may comprise, consist essentially of, or consist
of silicon dioxide.
[0036] The semiconductor material of the pedestals 30 may comprise
any suitable composition or combination of compositions; and in
some embodiments may comprise one or more of silicon, germanium,
III/V semiconductor materials (e.g., gallium phosphide),
semiconductor oxides, etc.
[0037] The source/drain regions 13 and 15 are formed within the
semiconductor material of the pedestals 30. In some embodiments,
the source/drain regions may be n-type regions associated with NMOS
devices; and in other embodiments may be p-type regions associated
with PMOS devices. Channel regions (not labeled) would be within
the semiconductor material pedestals 30 along the gate dielectric
material 32, and between the source/drain regions 13 and 15.
[0038] The capacitors 18 comprise the first nodes 19 configured as
downwardly-opening container structures, and comprise the second
nodes 21 extending upwardly into the downwardly-opening container
structures. The nodes 19 and 21 may comprise any suitable
electrically conductive composition(s), such as, for example, one
or more of various metals (e.g., titanium, tungsten, cobalt,
nickel, platinum, ruthenium, etc.), metal-containing compositions
(e.g., metal silicide, metal nitride, metal carbide, etc.), and/or
conductively-doped semiconductor materials (e.g.,
conductively-doped silicon, conductively-doped germanium,
etc.).
[0039] Insulative material 34 (which may be called capacitor
dielectric material) is between the first and second nodes 19 and
21. The insulative material 34 may comprise any suitable
composition (e.g., non-ferroelectric material, ferroelectric
material and magnetic material) or combination of compositions. In
some embodiments, the insulative material 34 may comprise
non-ferroelectric material; and may, for example, comprise, consist
essentially of, or consist of one or more of silicon dioxide,
silicon nitride, aluminum oxide, hafnium oxide, zirconium oxide,
etc. In some embodiments, the insulative material 34 may comprise
ferroelectric material. For instance, the insulative material 34
may comprise, consist essentially of, or consist of one or more
materials selected from the group consisting of transition metal
oxide, zirconium, zirconium oxide, hafnium, hafnium oxide, lead
zirconium titanate, tantalum oxide, and barium strontium titanate;
and having dopant therein which comprises one or more of silicon,
aluminum, lanthanum, yttrium, erbium, calcium, magnesium, niobium,
strontium, and a rare earth element.
[0040] The second transistors 24 include the gates 27 extending
around semiconductor material pedestals 36, with the gates 27
comprising conductive material in common with the wordlines 28.
Such conductive material may comprise any suitable electrically
conductive composition(s), such as, for example, one or more of
various metals (e.g., titanium, tungsten, cobalt, nickel, platinum,
ruthenium, etc.), metal-containing compositions (e.g., metal
silicide, metal nitride, metal carbide, etc.), and/or
conductively-doped semiconductor materials (e.g.,
conductively-doped silicon, conductively-doped germanium,
etc.).
[0041] The gates 27 are spaced from the semiconductor material
pedestals 36 by insulative material 38 (which may be referred to as
gate dielectric material). The insulative material 38 may comprise
any suitable composition or combination of compositions; and in
some embodiments may comprise, consist essentially of, or consist
of silicon dioxide.
[0042] The semiconductor material of the pedestals 36 may comprise
any suitable composition or combination of compositions; and in
some embodiments may comprise one or more of silicon, germanium,
III/V semiconductor materials (e.g., gallium phosphide),
semiconductor oxides, etc.
[0043] The source/drain regions 23 and 25 are formed within the
semiconductor material of the pedestals 36. In some embodiments,
the source/drain regions may be n-type regions associated with NMOS
devices; and in other embodiments may be p-type regions associated
with PMOS devices. Channel regions (not labeled) would be within
the semiconductor material pedestals 36 along the gate dielectric
material 38, and between the source/drain regions 23 and 25.
[0044] The capacitors 26 comprise the first nodes 29 configured as
upwardly-opening container structures, and comprise the second
nodes 31 extending downwardly into the upwardly-opening container
structures. The nodes 29 and 31 may comprise any suitable
electrically conductive composition(s), such as, for example, one
or more of various metals (e.g., titanium, tungsten, cobalt,
nickel, platinum, ruthenium, etc.), metal-containing compositions
(e.g., metal silicide, metal nitride, metal carbide, etc.), and/or
conductively-doped semiconductor materials (e.g.,
conductively-doped silicon, conductively-doped germanium,
etc.).
[0045] Insulative material 40 (which may be referred to as
capacitor dielectric material) is between the first and second
nodes 29 and 31. The insulative material 40 may comprise any
suitable composition (e.g., non-ferroelectric material,
ferroelectric material and magnetic material) or combination of
compositions. In some embodiments, the insulative material 40 may
comprise non-ferroelectric material; and may, for example,
comprise, consist essentially of, or consist of one or more of
silicon dioxide, silicon nitride, aluminum oxide, hafnium oxide,
zirconium oxide, etc. In some embodiments, the insulative material
40 may comprise ferroelectric material. For instance, the
insulative material 40 may comprise, consist essentially of, or
consist of one or more materials selected from the group consisting
of transition metal oxide, zirconium, zirconium oxide, hafnium,
hafnium oxide, lead zirconium titanate, tantalum oxide, and barium
strontium titanate; and having dopant therein which comprises one
or more of silicon, aluminum, lanthanum, yttrium, erbium, calcium,
magnesium, niobium, strontium, and a rare earth element.
[0046] In some embodiments, the memory cells of the second string
22 may comprise identical compositions as the memory cells of the
first string 14, and may be mirror images of such memory cells
reflected across a horizontal plane 42 extending along the center
of the common plate 12. For instance, the Cell Oa may be a mirror
image of the Cell 0b. In some embodiments, at least the second
capacitors 26 of the second memory string 22 are mirror images of
the first capacitors 18 reflected across the horizontal plane 42
along the center of the common plate 12. In such embodiments, each
of the first capacitors 18 within the first memory cell string 14
may be considered to be vertically offset from a sister capacitor
26 within the second memory cell string 22. For instance, the
capacitor 18 within Cell Oa is vertically offset from a sister
capacitor 26 within Cell 0b. In the embodiment of FIG. 4, the
sister capacitors are within a second memory cell string 22 which
is a complement to the first memory cell string 14, with the first
memory cell string 14 and its complement memory cell string 22
being compared through the sense amplifier SA.
[0047] FIG. 4 shows a base 44 under the comparative bitline BL-C.
The base 44 may comprise semiconductor material; and may, for
example, comprise, consist essentially of, or consist of
monocrystalline silicon. The base 44 may be referred to as a
semiconductor substrate. The term "semiconductor substrate" means
any construction comprising semiconductive material, including, but
not limited to, bulk semiconductive materials such as a
semiconductive wafer (either alone or in assemblies comprising
other materials), and semiconductive material layers (either alone
or in assemblies comprising other materials). The term "substrate"
refers to any supporting structure, including, but not limited to,
the semiconductor substrates described above. In some applications,
the base 44 may correspond to a semiconductor substrate containing
one or more materials associated with integrated circuit
fabrication. Such materials may include, for example, one or more
of refractory metal materials, barrier materials, diffusion
materials, insulator materials, etc.
[0048] A gap is provided between the comparative bitline BL-C and
base 44 to indicate that there may be other structures, components,
etc., provided between the base 44 and the comparative bitline
BL-C.
[0049] FIG. 5 shows another example apparatus 10a. The apparatus
10a has the comparative bitline BL-T extending to a first sense
amplifier SAL The comparative bitline BL-C also extends to the
first sense amplifier SA1, and is horizontally offset relative to
the comparative bitline BL-T. In some embodiments, the comparative
bitline BL-T may be referred to as a first comparative bitline 46.
Such comparative bitline is over a second comparative bitline 48.
The second comparative bitline extends horizontally to a second
sense amplifier SA2. The comparative bitline BL-C may be referred
to as a third comparative bitline 50 which is coupled with the
first sense amplifier SAL A fourth comparative bitline 52 is
horizontally offset relative to the second comparative bitline 48,
and is coupled with the second sense amplifier SA2. A fifth
comparative bitline 54 is vertically displaced relative to the
third comparative bitline 50, and extends to a third sense
amplifier SA3. A sixth comparative bitline 56 is horizontally
displaced relative to the fifth comparative bitline 54, is also
coupled with the third sense amplifier SA3. A seventh comparative
bitline 58 is vertically displaced relative to the second
comparative bitline 56, and an eighth comparative bitline 60 is
vertically displaced relative to the fourth comparative bitline
52.
[0050] The vertically-displaced bitlines 46/48 together form a
first pair of vertically-displaced bitlines having a common plate
12 between them. Similarly, the bitlines 50/54 together form a
second pair of vertically-displaced bitlines having a common plate
12 between them, the bitlines 52/60 together form a third pair of
vertically-displaced bitlines having a common plate 12 between
them, and the bitlines 56/58 together form a fourth pair of
vertically-displaced bitlines having a common plate 12 between
them.
[0051] Between each pair of vertically-displaced bitlines is a top
memory cell string having memory cell structures labeled as Cells
0a . . . na, and a bottom memory cell string of memory cell
structures labeled as Cells 0b . . . nb; with each of the memory
cell structures comprising a capacitor and a transistor in a
configuration analogous to that described above with reference to
FIG. 3. The transistors and capacitors are not separately labeled
in FIG. 5 in order to simplify the drawing, but it is to be
understood that such capacitors and transistors may have
configurations analogous to those discussed above with reference to
FIG. 3.
[0052] Wordline drivers are not shown in FIG. 5 in order to
simplify the drawing; but it is to be understood that each of the
transistors of the memory cells of FIG. 5 may have its gate coupled
with a wordline driver in a configuration analogous to that
described above with reference to FIG. 3 (with example wordline
drivers of FIG. 3 being D0a . . . Dna and D0b . . . Dnb).
[0053] The Cells 0a . . . na along the first comparative bitline 46
may be referred to as first memory cell structures which are
horizontally spaced from one another, and which are together
arranged in a first memory cell string labeled as String 1.
Similarly, the Cells 0b . . . nb along the second comparative
bitline 48 may be referred to as second memory cell structures
which are together arranged in a second memory cell string labeled
as String 2.
[0054] The Cells 0a . . . na along the third comparative bitline 50
may be referred to as third memory cell structures which are
together arranged in a complement to the first memory cell string,
and which is labeled as String 1 complement; with String 1 and its
complement being configured to be compared to another through the
first sense amplifier SA1.
[0055] The Cells 0a . . . na along the fourth comparative bitline
52 may be referred to as fourth memory cell structures which are
together arranged in a complement to the second memory cell string,
and which is labeled as String 2 complement; with String 2 and its
complement being configured to be compared to another through the
second sense amplifier SA2.
[0056] The Cells 0b . . . nb along the fifth comparative bitline 54
are arranged in a memory cell string (String 3), and the Cells 0a .
. . na along the sixth comparative bitline 56 are arranged in a
complement to such memory cell string (labeled as String 3
complement); with String 3 and its complement being configured to
be compared to another through the third sense amplifier SA3.
[0057] The Cells 0b . . . nb along the seventh comparative bitline
58 are configured as a fourth memory cell string (String 4) which
may be compared with a complement to the fourth string (not shown
in FIG. 5); and the Cells 0b . . . nb along the eighth comparative
bitline 60 are configured as a fifth memory cell string (String 5)
which may be compared with a complement to the fifth string (not
shown in FIG. 5).
[0058] In some embodiments, the apparatus 10a may be considered to
be an example of an open architecture, with the second comparative
bitline BL-C being arranged to be horizontally offset relative to
the first comparative bitline BL-T with which it is compared. The
open architecture may be highly integrated in a manner analogous to
that described above with reference to the folded architecture of
FIG. 4. For instance, FIG. 6 shows a region of the apparatus 10a
comprising the paired vertically-stacked bitlines 46/48.
[0059] The illustrated region of apparatus 10a is identical to the
region of the apparatus 10 shown in FIG. 4 in many respects. The
various regions of the transistors and capacitors of FIG. 6 are not
labeled, but it is to be understood that such regions may be
identical to analogous regions shown in the embodiment of FIG. 4.
The apparatus 10a of FIG. 6 differs from the apparatus 10 of FIG. 4
in that the comparative bitlines 46 and 48 of FIG. 6 are not
coupled to the same sense amplifier. Instead, the comparative
bitline 46 is coupled to the first sense amplifier SA1, while the
comparative bitline 48 is coupled to the second sense amplifier
SA2. Accordingly, the memory cell string associated with the lower
comparative bitline 48 (String 2) is not a complement to the memory
cell string associate with the upper comparative bitline 46 (String
1) in that such strings are not compared to one another through a
sense amplifier. Regardless, capacitors within the lower memory
cell string (String 2) may be considered to be sister capacitors
relative to capacitors in the upper memory cell string (String 1)
in that they are mirror images of the capacitors in the upper
memory cell string along the plane 42. For instance, a capacitor
within the memory cell Oa is labeled as 62, and a capacitor within
the memory cell 0b is labeled as 64; and such capacitors may be
referred to as being sister capacitors in that they may be mirror
images of one another across the plane 42.
[0060] The upper memory cell string labeled as String 1 may be
considered to be paired with the lower memory cell string labeled
as String 2, in that capacitors along the upper memory cell string
share the common plate 12 with the capacitors along the lower
memory cell string. Accordingly, the vertically-displaced bitlines
46/48 may be considered to be arranged in a paired structure.
Analogously, the other vertically-displaced bitlines 50/54, 56/58
and 52/60 of FIG. 5 may be considered to be arranged in similar
paired structures. The memory cells within such paired structures
may comprise sister capacitors of the type described with reference
to FIG. 6 as the sister capacitors 62/64.
[0061] The memory cell configurations described above have only a
single transistor and a single capacitor (i.e., are 1T-1C memory
cell configurations). In other embodiments, analogous arrangements
to those described above may be utilized with 2T-2C memory cell
configurations.
[0062] FIG. 7 shows an apparatus 10b having a folded configuration
analogous to that described above with reference to FIG. 3, but in
which the gates of vertically-stacked transistors are coupled with
one another to thereby form 2T-2C memory cell structures of Cells 0
. . . n. The gates of the transistors are coupled with wordlines 66
which extend to wordline drivers D0 . . . Dn.
[0063] The common plate 12 of the folded configuration of FIG. 3 is
replaced with a plurality of plates 68 which are coupled with plate
drivers PLO . . . PLn. Each of the plate drivers may be
independently operated relative to all of the others. In some
embodiments, the capacitors of the memory cell structures may
comprise ferroelectric material. Each of the memory cell structures
may be operated (i.e., read to/written from) by providing
appropriate electrical stimulus to the gates through the drivers D0
. . . Dn, to the plates 68 through the drivers PLO . . . PLn,
and/or to one or both of the comparative bitlines BL-T and
BL-C.
[0064] The architecture of FIG. 7 may be highly integrated in a
manner analogous to that described above with reference to FIG. 4.
For instance, FIG. 8 shows a region of the apparatus 10b comprising
structures analogous those described above with reference to FIG.
4. The various regions of the transistors and capacitors of FIG. 8
are not labeled, but it is to be understood that such regions may
be identical to analogous regions shown in the embodiment of FIG.
4.
[0065] In some embodiments, the 2T-2C memory configurations may be
utilized in open arrangements somewhat analogous to the open
arrangement described above with reference to FIG. 5. For instance,
FIG. 9 shows an apparatus 10c having 2T-2C memory cell
configurations provided in an open arrangement.
[0066] The assemblies and structures discussed above may be
utilized within integrated circuits (with the term "integrated
circuit" meaning an electronic circuit supported by a semiconductor
substrate); and may be incorporated into electronic systems. Such
electronic systems may be used in, for example, memory modules,
device drivers, power modules, communication modems, processor
modules, and application-specific modules, and may include
multilayer, multichip modules. The electronic systems may be any of
a broad range of systems, such as, for example, cameras, wireless
devices, displays, chip sets, set top boxes, games, lighting,
vehicles, clocks, televisions, cell phones, personal computers,
automobiles, industrial control systems, aircraft, etc.
[0067] Unless specified otherwise, the various materials,
substances, compositions, etc. described herein may be formed with
any suitable methodologies, either now known or yet to be
developed, including, for example, atomic layer deposition (ALD),
chemical vapor deposition (CVD), physical vapor deposition (PVD),
etc.
[0068] The terms "dielectric" and "insulative" may be utilized to
describe materials having insulative electrical properties. The
terms are considered synonymous in this disclosure. The utilization
of the term "dielectric" in some instances, and the term
"insulative" (or "electrically insulative") in other instances, may
be to provide language variation within this disclosure to simplify
antecedent basis within the claims that follow, and is not utilized
to indicate any significant chemical or electrical differences.
[0069] The particular orientation of the various embodiments in the
drawings is for illustrative purposes only, and the embodiments may
be rotated relative to the shown orientations in some applications.
The descriptions provided herein, and the claims that follow,
pertain to any structures that have the described relationships
between various features, regardless of whether the structures are
in the particular orientation of the drawings, or are rotated
relative to such orientation.
[0070] The cross-sectional views of the accompanying illustrations
only show features within the planes of the cross-sections, and do
not show materials behind the planes of the cross-sections, unless
indicated otherwise, in order to simplify the drawings.
[0071] When a structure is referred to above as being "on",
"adjacent" or "against" another structure, it can be directly on
the other structure or intervening structures may also be present.
In contrast, when a structure is referred to as being "directly
on", "directly adjacent" or "directly against" another structure,
there are no intervening structures present.
[0072] Structures (e.g., layers, materials, etc.) may be referred
to as "extending vertically" to indicate that the structures
generally extend upwardly from an underlying base (e.g.,
substrate). The vertically-extending structures may extend
substantially orthogonally relative to an upper surface of the
base, or not.
[0073] Some embodiments include an apparatus having a first
comparative bitline extending horizontally and which is coupled
with a sense amplifier, and a second comparative bitline extending
horizontally and which is coupled with the sense amplifier. First
memory cell structures are coupled with the first comparative
bitline. The first memory cell structures are horizontally spaced
from one another and are together arranged in a first memory cell
string. Each of the first memory cell structures has a first
transistor associated with a first capacitor. The first transistors
are proximate the first comparative bitline. Second memory cell
structures are coupled with the second comparative bitline. The
second memory cell structures are horizontally spaced from one
another and are together arranged in a second memory cell string
which is a complement to the first memory cell string. Each of the
second memory cell structures has a second transistor associated
with a second capacitor. The second transistors are proximate the
second comparative bitline. Each of the first capacitors has a
container-shaped first node and is vertically offset from an
associated first sister capacitor which is a mirror image of its
associated first capacitor along a horizontal plane between the
first capacitor and the first sister capacitor. Each of the second
capacitors has a container-shaped first node and is vertically
offset from an associated second sister capacitor which is a mirror
image of its associated second capacitor along a horizontal plane
between the second capacitor and the second sister capacitor. The
first memory cell string and its complement are configured to be
compared through the sense amplifier.
[0074] Some embodiments include an apparatus having a first
comparative bitline extending horizontally and which is coupled
with a sense amplifier, and having a second comparative bitline
under the first comparative bitline, extending horizontally, and
which is coupled with the sense amplifier. A common plate is
between the first and second comparative bitlines and extends
horizontally. First memory cell structures are between the first
comparative bitline and the common plate. The first memory cell
structures are horizontally spaced from one another and are
together arranged in a first memory cell string. Each of the first
memory cell structures has a first transistor associated with a
first capacitor. The first transistors are proximate the first
comparative bitline. The first capacitors are proximate the common
plate. Each of the first capacitors has a first node coupled with a
source/drain region of its associated first transistor, and has a
second node coupled with the common plate. Second memory cell
structures are between the second comparative bitline and the
common plate. The second memory cell structures are horizontally
spaced from one another and are together arranged in a second
memory cell string which is a complement to the first memory cell
string. Each of the second memory cell structures has a second
transistor associated with a second capacitor. The second
transistors are proximate the second comparative bitline. The
second capacitors are proximate the common plate. Each of the
second capacitors has a first node coupled with a source/drain
region of its associated second transistor, and has a second node
coupled with the common plate. The first memory cell string and its
complement are configured to be compared through the sense
amplifier.
[0075] Some embodiments include an apparatus having a first
comparative bitline extending horizontally and which is coupled
with a first sense amplifier; having a second comparative bitline
under the first comparative bitline, extending horizontally, and
which is coupled with a second sense amplifier which is different
from the first sense amplifier; having a third comparative bitline
extending horizontally and which is coupled with the first sense
amplifier; and having a fourth comparative bitline extending
horizontally and which is coupled with the second sense amplifier.
A common plate is between the first and second comparative bitlines
and extends horizontally. First memory cell structures are between
the first comparative bitline and the common plate. The first
memory cell structures are horizontally spaced from one another and
are together arranged in a first memory cell string. Each of the
first memory cell structures has a first transistor associated with
a first capacitor. The first transistors are proximate the first
comparative bitline. The first capacitors are proximate the common
plate. Each of the first capacitors has a first node coupled with a
source/drain region of its associated first transistor, and has a
second node coupled with the common plate. Second memory cell
structures are between the second comparative bitline and the
common plate. The second memory cell structures are horizontally
spaced from one another and are together arranged in a second
memory cell string. Each of the second memory cell structures has a
second transistor associated with a second capacitor. The second
transistors are proximate the second comparative bitline. The
second capacitors are proximate the common plate. Each of the
second capacitors has a first node coupled with a source/drain
region of its associated second transistor, and has a second node
coupled with the common plate. Third memory cell structures are
along the third comparative bitline. The third memory cell
structures are horizontally spaced from one another and are
together arranged in a complement to the first memory cell string.
The first memory cell string and its complement are configured to
be compared to one another through the first sense amplifier.
Fourth memory cell structures are along the fourth comparative
bitline. The fourth memory cell structures are horizontally spaced
from one another and are together being arranged in a complement to
the second memory cell string. The second memory cell string and
its complement are configured to be compared to one another through
the second sense amplifier.
[0076] In compliance with the statute, the subject matter disclosed
herein has been described in language more or less specific as to
structural and methodical features. It is to be understood,
however, that the claims are not limited to the specific features
shown and described, since the means herein disclosed comprise
example embodiments. The claims are thus to be afforded full scope
as literally worded, and to be appropriately interpreted in
accordance with the doctrine of equivalents.
* * * * *