U.S. patent application number 15/626587 was filed with the patent office on 2018-12-20 for electro-optic phase modulator and method of manufacturing the same.
The applicant listed for this patent is TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.. Invention is credited to HUAN-NENG CHEN, LAN-CHOU CHO, CHEWN-PU JOU, FENG WEI KUO.
Application Number | 20180364501 15/626587 |
Document ID | / |
Family ID | 64658061 |
Filed Date | 2018-12-20 |
United States Patent
Application |
20180364501 |
Kind Code |
A1 |
JOU; CHEWN-PU ; et
al. |
December 20, 2018 |
ELECTRO-OPTIC PHASE MODULATOR AND METHOD OF MANUFACTURING THE
SAME
Abstract
An electro-optic (EO) phase modulator is disclosed. The EO phase
modulator includes: an insulating layer; a central optical
waveguide over the insulating layer; a first region having a first
type doping adjacent to a first sidewall of the central optical
waveguide; a second region having a second type doping opposite to
the first type doping adjacent to a second sidewall of the central
optical waveguide opposite to the first sidewall; and a first
dielectric layer passing through the central optical waveguide from
a top surface of the central optical waveguide to a bottom surface
of the central optical waveguide. A method of manufacturing the
same is disclosed as well.
Inventors: |
JOU; CHEWN-PU; (HSINCHU
CITY, TW) ; CHEN; HUAN-NENG; (TAICHUNG CITY, TW)
; CHO; LAN-CHOU; (HSINCHU CITY, TW) ; KUO; FENG
WEI; (HSINCHU COUNTY, TW) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD. |
HSINCHU |
|
TW |
|
|
Family ID: |
64658061 |
Appl. No.: |
15/626587 |
Filed: |
June 19, 2017 |
Current U.S.
Class: |
1/1 |
Current CPC
Class: |
G02F 1/025 20130101;
G02F 1/015 20130101 |
International
Class: |
G02F 1/025 20060101
G02F001/025 |
Claims
1. An electro-optic (EO) phase modulator, comprising: an insulating
layer; a central optical waveguide over the insulating layer, the
central optical waveguide including a first undoped region, a
second undoped region and a third undoped region; a first region
having a first type doping adjacent to a first sidewall of the
central optical waveguide; a second region having a second type
doping opposite to the first type doping adjacent to a second
sidewall of the central optical waveguide opposite to the first
sidewall; a first dielectric layer passing through the central
optical waveguide from a top surface of the central optical
waveguide to a bottom surface of the central optical waveguide; and
a second dielectric layer passing through the central optical
waveguide from the top surface of the central optical waveguide to
the bottom surface of the central optical waveguide; wherein the
first dielectric layer is between and directly interfacing the
first undoped region and the second undoped region; and the second
dielectric layer is between and directly interfacing the second
undoped region and the third undoped region.
2. The EO phase modulator of claim 1, wherein the first dielectric
layer is disposed between the first sidewall and a vertical center
line of the central optical waveguide.
3. The EO phase modulator of claim 2, wherein the first undoped
region is separated from the second undoped region by the first
dielectric layer, and the second undoped region is separated from
the third undoped region by the second dielectric layer.
4. The EO phase modulator of claim 3, wherein a doping
concentration of the first region and the second region is higher
than the first undoped region, the second undoped region and the
third undoped region.
5. The EO phase modulator of claim 1, wherein the first region and
the second region have a thickness in a range from about 10% to
about 80% of a thickness of the central optical waveguide.
6. The EO phase modulator of claim 1, wherein the first dielectric
layer and the second dielectric layer include a high-k dielectric
material.
7. The EO phase modulator of claim 6, wherein the high-k dielectric
material includes zirconium dioxide (ZrO.sub.2), aluminum oxide
(Al.sub.2O.sub.3), hafnium oxide (HfO.sub.x), Hafnium silicate
(HfSiO.sub.x), zirconium titanate (ZrTiO.sub.x), tantalum oxide
(TaO.sub.x), a laminated layer of
ZrO.sub.2--Al.sub.2O.sub.3--ZrO.sub.2 (ZAZ), strontium titanate
(SrTiO.sub.3), barium titanate (BaTiO.sub.3), barium strontium
titanate (BaSrTiO.sub.3, BST), or lead zirconate titanate
(PbZrTiO.sub.3, PZT).
8. The EO phase modulator of claim 1, further comprising a
waveguide cladding layer blanket covering the top surface, a
portion of the first sidewall, and a portion of the second sidewall
of the central optical waveguide.
9. The EO phase modulator of claim 1, further comprising: a first
electrical contact over the first region; and a second electrical
contact over the second region.
10. (canceled)
11. The EO phase modulator of claim 1, wherein the second
dielectric layer is parallel to the first dielectric layer.
12. An electro-optic (EO) phase modulator, comprising: an
insulating layer; a first intrinsic region over the insulating
layer; a second intrinsic region over the insulating layer; a third
intrinsic region over the insulating layer; a first vertical
dielectric layer over the insulating layer, wherein the first
vertical dielectric layer includes a first sidewall and a second
sidewall opposite to the first sidewall of the first vertical
dielectric layer, and the first intrinsic region is directly
interfacing the first sidewall of the first vertical dielectric
layer and the second intrinsic region is directly interfacing the
second sidewall of the first vertical dielectric layer; a second
vertical dielectric layer over the insulating layer, wherein the
second vertical dielectric layer includes a first sidewall and a
second sidewall opposite to the first sidewall of the second
vertical dielectric layer, and the second intrinsic region is
adjacent to directly interfacing the first sidewall of the second
vertical dielectric layer and the third intrinsic region is
adjacent to directly interfacing the second sidewall of the second
vertical dielectric layer; a first region having a first type
doping adjacent to the first intrinsic region; and a second region
having a second type doping opposite to the first type doping
adjacent to the third intrinsic region; wherein the first intrinsic
region, the second intrinsic region and the third intrinsic region
are undoped.
13. The EO phase modulator of claim 12, further comprising a
substrate below the insulating layer.
14. The EO phase modulator of claim 12, wherein a doping
concentration of the first region and the second region is higher
than the first intrinsic region, the second intrinsic region and
the third intrinsic region.
15. The EO phase modulator of claim 12, wherein the first region
and the second region have a thickness in a range from about 1/3 to
about 2/3 of a thickness of first intrinsic region, the second
intrinsic region and the third intrinsic region.
16. The EO phase modulator of claim 12, wherein a width of the
first vertical dielectric layer and the second vertical dielectric
layer is in a range of about 2 nm to about 10 nm.
17. The EO phase modulator of claim 12, further comprising a
cladding dielectric layer at least covering a top surface of the
first intrinsic region, a top surface of the second intrinsic
region and a top surface of the third intrinsic region.
18. The EO phase modulator of claim 17, wherein the cladding
dielectric layer has a lower effective refractive index than the
first intrinsic region, the second intrinsic region and the third
intrinsic region.
19. The EO phase modulator of claim 12, further comprising: a first
electrical contact over the first region; and a second electrical
contact over the second region.
20. A method of manufacturing an electro-optic (EO) phase
modulator, comprising: providing a silicon substrate over an
insulator; removing a portion of the silicon substrate to form a
protrusion feature including a central optical waveguide region and
a first thin slab layer and a second thin slab layer at two sides
of the central optical waveguide region, wherein the central
optical waveguide region is undoped; forming a first trench in the
central optical waveguide region to expose a portion of the
insulator; forming a second trench in the central optical waveguide
region to expose a portion of the insulator; filling the first
trench and the second trench with a dielectric material directly
interfacing the undoped central optical waveguide region; defining
a first region having a first type doping at the first thin slab
layer; and defining a second region having a second type doping
opposite to the first type doping at the second thin slab
layer.
21. The EO phase modulator of claim 2, wherein the second
dielectric layer is disposed between the second sidewall and the
vertical center line of the central optical waveguide.
Description
BACKGROUND
[0001] Metal interconnections are expected to become a bottleneck
of performance of electronic systems as transistors continue to
scale to smaller sizes. Optical interconnections, implemented at
different levels ranging from rack-to-rack down to chip-to-chip and
intra-chip interconnections could enable low power dissipation, low
latencies and high bandwidths. The realization of such small scale
optical interconnections relies on the ability to integrate
micro-optical devices with the microelectronics chip. The silicon
low-loss waveguides, amplifiers and lasers advance this integrative
goal, but a silicon electro-optic modulator with high performance
for chip-scale integration is needed.
BRIEF DESCRIPTION OF THE DRAWINGS
[0002] Aspects of the present disclosure are best understood from
the following detailed description when read with the accompanying
figures. It is noted that, in accordance with the standard practice
in the industry, various features are not drawn to scale.
Specifically, dimensions of the various features may he arbitrarily
increased or reduced for clarity of discussion.
[0003] FIG. 1 is a cross-sectional view of an electro-optic (EO)
phase modulator in accordance with an exemplary embodiment of the
present disclosure;
[0004] FIGS. 2-8 are cross-sectional views of the electro-optic
phase modulator illustrated in FIG. 1 at different stages of a
manufacturing process, in accordance with some embodiments of the
present disclosure;
[0005] FIG. 9 is a cross-sectional view of an electro-optic (EO)
phase modulator in accordance with another embodiment of the
present disclosure;
[0006] FIG. 10 is a cross-sectional view of an electro-optic (EO)
phase modulator in accordance with still another embodiment of the
present disclosure; and
[0007] FIG. 11 is a cross-sectional view of charge distribution in
the electro-optic phase modulator illustrated in FIG. 10 in an
operation.
DETAILED DESCRIPTION
[0008] The following disclosure provides many different
embodiments, or examples, for implementing different features of
the provided subject matter. Specific examples of components and
arrangements are described below to simplify the present
disclosure. These are, of course, merely examples and are not
intended to be limiting. For example, the formation of a first
feature over or on a second feature in the description that follows
may include embodiments in which the first and second features are
formed in direct contact, and may also include embodiments in which
additional features may be formed between the first and second
features, such that the first and second features may not be in
direct contact. In addition, the present disclosure may repeat
reference numerals or letters in the various examples. This
repetition is for the purpose of simplicity and clarity and does
not in itself dictate a relationship between the various
embodiments and configurations discussed.
[0009] Further, spatially relative terms, such as "beneath,"
"below," "lower," "above," "upper" and the like, may he used herein
for ease of description to describe one element or feature's
relationship to another element or feature as illustrated in the
figures. The spatially relative terms are intended to encompass
different orientations of the device in use or operation in
addition to the orientation depicted in the figures. The apparatus
may be otherwise oriented (rotated 90 degrees or at other
orientations) and the spatially relative descriptors used herein
may likewise be interpreted accordingly.
[0010] Notwithstanding that the numerical ranges and parameters
setting forth the broad scope of the disclosure are approximations,
the numerical values set forth in the specific examples are
reported as precisely as possible. Any numerical value, however,
inherently contains certain errors necessarily resulting from the
standard deviation found in the respective testing measurements.
Also, as used herein, the term "about" generally means within 10%,
5%, 1%, or 0.5% of a given value or range. Alternatively, the term
"about" means within an acceptable standard error of the mean when
considered by one of ordinary skill in the art. Other than in the
operating or working examples, or unless otherwise expressly
specified, all of the numerical ranges, amounts, values and
percentages such as those for quantities of materials, durations of
times, temperatures, operating conditions, ratios of amounts, and
the likes thereof disclosed herein should be understood as modified
in all instances by the term "about." Accordingly, unless indicated
to the contrary, the numerical parameters set forth in the present
disclosure and attached claims are approximations that can vary as
desired. At the very least, each numerical parameter should at
least be construed in light of the number of reported significant
digits and by applying ordinary rounding techniques. Ranges can be
expressed herein as from one endpoint to another endpoint or
between two endpoints. All ranges disclosed herein are inclusive of
the endpoints, unless specified otherwise.
[0011] FIG. 1 is a cross-sectional view of an electro-optic (EO)
phase modulator 100 in accordance with an exemplary embodiment of
the present disclosure. The electro-optic phase modulator 100
serves as a basis for an analog optical modulator. As shown in FIG.
1, the exemplary electro-optic (EO) waveguide structure 100 may
include a silicon substrate 101 and an insulating layer 102 (also
referred to as a buried oxide or BOX layer) disposed over the
silicon substrate 101. A silicon layer, including an n-doped region
108, a first intrinsic (single crystal) region 104_1, a second
intrinsic region 104_2, and a p-doped region 110, is disposed over
the insulating layer 102. The silicon layer, including the n-doped
region 108, the first intrinsic region 104_1, the second intrinsic
region 104_2, and the p-doped region 110, may be altogether
referred to as a silicon-on-insulator (SOI) layer. The first
intrinsic region 104_1 forms a first "plate" of the electro-optic
phase modulator 100, and the second intrinsic region 104_2 forms a
second "plate" of the electro-optic phase modulator 100.
[0012] The first intrinsic region 104_1 and the second intrinsic
region 104_2 disposed between the n-doped region 108 and the
p-doped region 110 are arranged to be an central optical waveguide
of the electro-optic phase modulator 100 and serve as a conduit for
guiding light into/out of the page in the view of FIG. 1 along a Z
axis. In particular, the structure of the first intrinsic region
104_1 and the second intrinsic region 104_2 between the n-doped
region 108 and the p-doped region 110 forms a PIN diode modulator
and is arranged to vary the refractive index in the central optical
waveguide according to the free carrier dispersion effect as will
he discussed in detail below. Generally, the first intrinsic region
104_1 and the second intrinsic region 104_2. are rectangular
structures. However, in some embodiments, the first intrinsic
region 104_1 and the second intrinsic region 104_2 may have other
geometry structures, such as cylindrical structures. Light rays are
predominantly confined in the first intrinsic region 104_1 and the
second intrinsic region 104_2 by internal reflection. The first
intrinsic region 104_1 and the second intrinsic region 104_2 may be
undoped or lightly doped compared to the n-doped region 108 and the
p-doped region 110, which are heavily doped with n-type dopants and
p-type dopants, respectively.
[0013] A thin dielectric layer 106 is disposed between the first
intrinsic region 104_1 and the second intrinsic region 104_2. The
thin dielectric layer 106 is configured to completely separate the
first intrinsic region 104_1 and the second intrinsic region 104_2.
In other words, the thin dielectric layer 106 passes through the
central optical waveguide of the electro-optic phase modulator 100
from a top surface to a bottom surface of the central optical
waveguide. As a result, the thin dielectric layer 106 defines a
boundary between the first intrinsic region 104_1 and the second
intrinsic region 104_2. In some embodiments, the thin dielectric
layer 106 is disposed along a vertical center line of the central
optical waveguide of the electro-optic phase modulator 100.
Consequently, the first intrinsic region 104_1 is substantially
equal to the second intrinsic region 104_2 in width. However, this
is not a limitation of the present disclosure. in some embodiments,
the width of the first intrinsic region 104_1 may be greater or
smaller than the width of the second intrinsic region 104_2.
[0014] A thickness H1 of the first intrinsic region 104_1 along a Y
axis as shown in FIG. 1, a thickness H2 of the second intrinsic
region 104_2 along the Y axis, and a thickness 113 of the thin
dielectric layer 106 along the Y axis are each larger than a
thickness H4 of the n-doped region 108 along the Y axis and also a
thickness H5 of the p-doped region 110 along the Y axis. In the
exemplary embodiments, the thickness HI of the first intrinsic
region 104_1, the thickness 112 of the second intrinsic region
104_2, and the thickness H3 of the thin dielectric layer 106 are
substantially equal. In the exemplary embodiments, the thickness H4
of the n-doped region 108 and the thickness H5 of the p-doped
region 110 are substantially equal. However, in some embodiments,
the thickness H3 of the thin dielectric layer 106 may be greater
than the thickness H1 of the first intrinsic region 104_1 and/or
the thickness H2 of the second intrinsic region 104_2. In some
embodiments, the thickness H4 of the n-doped region 108 may be
larger or smaller than the thickness 115 of the p-doped region
110.
[0015] The thickness H1 of the first intrinsic region 104_1 and/or
the thickness H2 of the second intrinsic region 104_2 may be in a
range from about 10 nanometers (nm) to about 10 micrometers (um).
In order to minimize absorption losses, the thickness H4 of the
n-doped region 108 and/or the thickness H5 of the p-doped region
110 may be in a range from about 10% to about 80% of the thickness
H1 of the first intrinsic region 104_1, the thickness H2 of the
second intrinsic region 104_2, and/or the thickness H3 of the thin
dielectric layer 106. In some embodiments, the thickness 114 of the
n-doped region 108 and/or the thickness H5 of the p-doped region
110 may be in a range from about 1/3 to about 2/3 of the thickness
of the first intrinsic region 104_1, the thickness H2 of the second
intrinsic region 1042, and/or the thickness H3 of the thin
dielectric layer 106. A width W1 across the first intrinsic region
104_1, the thin dielectric layer 106 and the second intrinsic
region 104_2 along an X axis perpendicular to the Y axis as shown
in FIG. 1 may be in a range from about 100 nm to about 30 um.
[0016] The thin dielectric layer 106 may have a thickness W2 in a
range of about 2 nm to about 10 nm. The thin dielectric layer 106
may include low-temperature (e.g., 210.degree. C.) high-k
dielectric material such as zirconium dioxide (ZrO.sub.2), aluminum
oxide (AlO.sub.3), hafnium oxide (HfO.sub.x), Hafnium silicate
(HfSiO.sub.x), zirconium titanate (ZrTiO.sub.x), tantalum oxide
(TaO.sub.x), a laminated layer of
ZrO.sub.2--Al.sub.2O.sub.3--ZrO.sub.2 (ZAZ, having dielectric
constant (k) of about 13.6), etc. In some embodiments, the thin
dielectric layer 106 may include strontium titanate (SrTiO.sub.3
having dielectric constant (k) of about 83 to about 100) or barium
titanate (BaTiO.sub.3, having dielectric constant (k) of about
500). In some embodiments, the thin dielectric layer 106 may
include barium strontium titanate (BaSrTiO.sub.3, BST), lead
zirconate titanate (PbZrTiO.sub.3, PZT).
[0017] A first electrical contact 112 is disposed on the n-doped
region 108; and a second electrical contact 114 is disposed on the
p-doped region 110, where the application of a modulating
electrical signal therebetween will modify the optical
characteristics (e.g., refractive index) of the electro-optic phase
modulator 100 and thus affect the properties of a propagating
optical signal. The heavily-doped n-doped region 108 and the
heavily-doped p-doped region 110 underneath the first electrical
contact 112 and the second electrical contact 114, respectively,
are able to lower the contact resistance.
[0018] In operation, the first electrical contacts 112 and the
second electrical contacts 114 are coupled to a first voltage
supply V1 and a second voltage supply V2, respectively, so as to
forward bias the diode and thereby inject free carriers into the
central optical waveguide, i.e. the first intrinsic region 104_1
and the second intrinsic region 104_2. The increase in free
carriers changes the refractive index of the silicon and can
therefore be used to achieve phase modulation of light transmitting
through the waveguide. However, some of the free carriers in the
first intrinsic region 104_1 and the second intrinsic region 104_2
may spread laterally away from the central optical waveguide to the
n-doped region 108 and the p-doped region 110. This leads to a
leakage current component that increases the necessary dc power in
order to obtain the targeted carrier concentration (refractive
index change) in the central optical waveguide. The thin dielectric
layer 106 between the first intrinsic region 104_1 and the second
intrinsic region 1042 helps to electrically disconnect a path
directly from the n-doped region 108 to the p-doped region 110,
therefore achieving the purpose of suppressing the leakage current.
The utilization of the above low-temperature k dielectric material
is advantageous to reduce the leakage current.
[0019] In some embodiments, a dielectric layer 116 is formed over
the first intrinsic region 104_1, the second intrinsic region
104_2, the thin dielectric layer 106 and a portion of the n-doped
region 108 and the p-doped region 110. In particular, the
dielectric layer 116 is conformally formed to blanket cover at
least the top surface, a portion of a left sidewall and a portion
of a right sidewall of the central optical waveguide as shown in
FIG. 1. The dielectric layer 116 serves as a waveguide cladding
layer, exhibiting a lower effective refractive index than the first
intrinsic region 104_1 and the second intrinsic region 104_2. With
the dielectric layer 116, the effective refractive index decreases
away from the central optical waveguide and thus provides
substantial vertical and horizontal optical signal confinement
within the electro-optic phase modulator 100.
[0020] FIGS. 2-8 are cross sectional views of the electro-optic
phase modulator 100 illustrated in FIG. 1 at different stages of a
manufacturing process, in accordance with some embodiments of the
present disclosure, Like elements in FIGS. 2-7 are designated with
the same reference numbers for ease of understanding. After the
different stages in FIGS. 2-7, the electro-optic phase modulator
100 has the cross-sectional view in FIG. 1. Although FIGS. 2-7 are
described, it will be appreciated that the structures disclosed in
FIG. 1 are not limited to the manufacturing process shown in FIGS.
2-7. While the exemplary manufacturing process is illustrated and
described herein as a series of acts or events, it will be
appreciated that the illustrated ordering of such acts or events
are not to be interpreted in a limiting sense. For example, some
acts may occur in different orders and/or concurrently with other
acts or events apart from those illustrated and/or described
herein. In addition, not all illustrated acts may be required to
implement one or more aspects or embodiments of the description
herein. Further, one or more of the acts depicted herein may be
carried out in one or more separate acts and/or phases.
[0021] FIG. 2 shows a cross-sectional view of a silicon on
insulator (SOI) structure that has been wafer bonded to a silicon
substrate. In accordance with exemplary embodiments of this
disclosure, FIG. 2 includes a silicon substrate 101 having a
selected first surface orientation and a doping level. Overlaying
the substrate 101 is a buried oxide layer, BOX, 102. The BOX 102
may have a thickness between about 10 to 200 nm, preferably about
50 nm. Overlaying the BOX 102 is a SOI silicon substrate 104 having
a selected second surface orientation and a doping level.
Alternative embodiments not illustrated include alternative
substrates such as Ge, GaAs, GaAlAs, InP, or GaN. The selected
second surface orientation may be different from the selected first
surface orientation, and the doping level of the SOI silicon
substrate 104 may be different from the doping level of the
substrate 101. However, this is not a limitation of the present
disclosure. In some embodiments, the selected second surface
orientation may he substantially the same as the selected first
surface orientation, and the doping level of the SOL silicon
substrate 104 may be substantially equal to the doping level of the
substrate 101.
[0022] Next, a portion of the SOL silicon substrate 104 is removed,
forming a protrusion feature as illustrated in FIG. 3. The
protrusion feature may be defined using lithography followed by
reactive ion plasma etching (RIE). The protrusion feature of the
SOL silicon substrate 104 includes a central optical waveguide
region A, a first thin slab layer B and a second thin slab layer C
at opposite sides of the central optical waveguide. A thickness of
the first thin slab layer B and/or a thickness of the second thin
slab layer C may be in a range from about 10% to about 80% of a
thickness of the central optical waveguide region A. In some
embodiments, the thickness of the first thin slab layer B and/or
the thickness of the second thin slab layer C may be in a range
from about 1/3 to about 2/3 of the thickness of the central optical
waveguide region A.
[0023] Next, a trench 105 is made through the SOI silicon substrate
104, exposing the buried oxide layer 102 as shown in FIG. 4. The
SOI silicon substrate 104 is therefore divided into a first SOI
region 104_1 and a second 501 region 104_2. The trench 105 is then
filled with a suitable dielectric material 106 such as
low-temperature (e.g., 210.degree. C.) high-k dielectric material,
as shown in FIG. 5. The low-temperature high-k dielectric material
may include zirconium dioxide (ZrO.sub.2), aluminum oxide
(Al.sub.2O.sub.3), hafnium oxide (HfO.sub.x), Hafnium silicate
(HfSiO.sub.x), zirconium titanate (ZrTiO.sub.x), tantalum oxide
(TaO.sub.x), a laminated layer of
ZrO.sub.2--Al.sub.2O.sub.3--ZrO.sub.2 (ZAZ, having dielectric
constant (k) of about 13.6), etc. In some embodiments, the thin
dielectric layer 106 may include strontium titanate (SrTiO.sub.3
having dielectric constant (k) of about 83 to about 100) or barium
titanate (BaTiO.sub.3, having dielectric constant (k) of about
500). In some embodiments, the thin dielectric layer 106 may
include barium strontium titanate (BaSrTiO.sub.3, BST), lead
zirconate titanate (PbZrTiO.sub.3, PZT).
[0024] As shown in FIG. 6, the n-doped region 108 and the p-doped
region 110 may be defined using photolithography, and doping may be
accomplished by ion implantation. After ion implantation, a silicon
oxide layer 116 may be deposited onto the first SOL region 104_1,
the second SOI region 104_2, the thin dielectric layer 106, the
n-doped region 108 and the p-doped region 110 using for instance
plasma enhanced chemical vapor deposition, as shown in FIG. 7.
Next, as shown in FIG. 8, recesses are then opened into the silicon
oxide layer 116 using photolithography and plasma etching for
depositing the metal contacts, i.e. the first electrical contact 11
and the second electrical contact 114. The resulting structure is
shown in FIG. 1.
[0025] FIG. 9 is a cross-sectional view of an electro-optic (EO)
phase modulator 200 in accordance with another embodiment of the
present disclosure. Referring to FIG. 9, the n-doped region 108 and
the p-doped region 110 are disposed away from the central optical
waveguide region A in order to minimize absorption losses. For
example, the n-doped region 108 and the p-doped region 110 are
formed approximately 1 .mu.m away from the central optical
waveguide region A.
[0026] FIG. 10 is a cross-sectional view of an electro-optic (EO)
phase modulator 300 in accordance with still another embodiment of
the present disclosure. Referring to FIG. 10, the central optical
waveguide of the electro-optic phase modulator 300 are divided into
three regions, i.e. the first intrinsic region 104_1, the second
intrinsic region 104_2 and a third intrinsic region 104_3, by a
first thin dielectric layer 106_1 and a second thin dielectric
layer 106_2. The first thin dielectric layer 106_1 is disposed in
parallel to the second thin dielectric layer 106_2 according to
some embodiments of the present disclosure. In order to maintain
the leakage suppression performance, a width W3 of the first thin
dielectric layer 106_1 and a width W4 of the second thin dielectric
layer 106_2 may have a summation substantially equals to the width
W2 of the thin dielectric layer 106 of the electro-optic phase
modulator 100 of FIG. 1 in accordance with a preferred embodiment.
However, this is not a limitation of the present disclosure. In
some embodiments, the summation of the width W3 of the first thin
dielectric layer 106_1 and the width W4 of the second thin
dielectric layer 106_2 may be smaller or greater than the width W2
of the thin dielectric layer 106 of the electro-optic phase
modulator 100 of FIG. 1.
[0027] The width W1 of the central optical waveguide of the
electro-optic phase modulator 300 may he substantially equal to
that of the electro-optic phase modulator 100, However, the total
amount of induced charges in operation of the electro-optic phase
modulator 300 may be doubled compared to the electro-optic phase
modulator 100 as will be discussed in detail below. In some
embodiments, the central optical waveguide of the electro-optic
phase modulator may be divided into more than three regions by more
than two thin dielectric layers. In principle, the more numbers of
the divisions of the central optical waveguide, the more effective
the electro-optic phase modulator in creating phase and/or
amplitude changes.
[0028] FIG. 11 is a cross-sectional view of charge distribution in
the electro-optic phase modulator 300 in an operation. Referring to
FIG. 11, the electro-optic phase modulator 300 is forward biased
when the first voltage supply V1 is 0 V and the second voltage
supply V2 is -1.6 V. The different shades of the first intrinsic
region 104_1, the second intrinsic region 104_2 and a third
intrinsic region 104_3 represent different levels of charge
density. In particular, the charge density is higher when the color
is darker. As shown in FIG. 11, two depletion regions are formed in
the second intrinsic region 104_2 and a third intrinsic region
104_3. Accordingly, the charge variation is presented in the second
intrinsic region 104_2 and a third intrinsic region 104_3. In other
words, the area of region associated with charge variation is more
than that of the electro-optic phase modulator 200. Therefore, the
electro-optic phase modulator 300 is more effective in creating
phase and/or amplitude changes than the electro-optic phase
modulator 100.
[0029] Some embodiment of the present disclosure provides an
electro-optic (EO) phase modulator. The EO phase modulator
includes: an insulating layer; a central optical waveguide over the
insulating layer; a first region having a first type doping
adjacent to a first sidewall of the central optical waveguide; a
second region having a second type doping opposite to the first
type doping adjacent to a second sidewall of the central optical
waveguide opposite to the first sidewall; and a first dielectric
layer passing through the central optical waveguide from a top
surface of the central optical waveguide to a bottom surface of the
central optical waveguide.
[0030] Some embodiment of the present disclosure provides an
electro-optic (EO) phase modulator. The EO phase modulator
includes: an insulating layer; a first intrinsic region over the
insulating layer; a second intrinsic region over the insulating
layer; a vertical dielectric layer over the insulating layer,
wherein the vertical dielectric layer includes a first sidewall and
a second sidewall opposite to the first sidewall, and the first
intrinsic region is adjacent to the first sidewall and the second
intrinsic region is adjacent to the second sidewall; a first region
having a first type doping adjacent to the first intrinsic region;
and a second region having a second type doping opposite to the
first type doping adjacent to the second intrinsic region.
[0031] Some embodiment of the present disclosure provides a method
of manufacturing an electro-optic (EO) phase modulator. The method
includes: providing a silicon substrate over an insulator; removing
a portion of the silicon substrate to form a protrusion feature
including a central optical waveguide region and a first thin slab
layer and a second thin slab layer at two sides of the central
optical waveguide region; forming a trench in the central optical
waveguide region to expose a portion of the insulator; filling the
trench with a dielectric material; defining a first region having a
first type doping at the first thin slab layer; and defining a
second region having a second type doping opposite to the first
type doping at the second thin slab layer.
[0032] The foregoing outlines features of several embodiments so
that those skilled in the art may better understand the aspects of
the present disclosure. Those skilled in the art should appreciate
that they may readily use the present disclosure as a basis for
designing or modifying other operations and structures for carrying
out the same purposes and/or achieving the same advantages of the
embodiments introduced herein. Those skilled in the art should also
realize that such equivalent constructions do not depart from the
spirit and scope of the present disclosure, and that they may make
various changes, substitutions, and alterations herein without
departing from the spirit and scope of the present disclosure.
[0033] Moreover, the scope of the present application is not
intended to be limited to the particular embodiments of the
process, machine, manufacture, composition of matter, means,
methods and steps described in the specification. As one of
ordinary skill in the art will readily appreciate from the
disclosure of the present invention, processes, machines,
manufacture, compositions of matter, means, methods, or steps,
presently existing or later to be developed, that perform
substantially the same function or achieve substantially the same
result as the corresponding embodiments described herein may he
utilized according to the present invention. Accordingly, the
appended claims are intended to include within their scope such
processes, machines, manufacture, compositions of matter, means,
methods, or steps.
* * * * *