U.S. patent application number 16/027019 was filed with the patent office on 2018-11-15 for method of tuning an nfc antenna.
This patent application is currently assigned to A.K. Stamping Company, Inc.. The applicant listed for this patent is A.K. Stamping Company, Inc.. Invention is credited to Bernard Duetsch, Arthur Kurz.
Application Number | 20180331426 16/027019 |
Document ID | / |
Family ID | 53266083 |
Filed Date | 2018-11-15 |
United States Patent
Application |
20180331426 |
Kind Code |
A1 |
Kurz; Arthur ; et
al. |
November 15, 2018 |
METHOD OF TUNING AN NFC ANTENNA
Abstract
A method for manufacturing and turning a near field
communication antenna is provided. A method for manufacturing and
tuning a near field communication antenna comprising loading one or
more ferrite substrates onto a workstation, loading an antenna
biscuit onto the workstation, the antenna biscuit comprising one or
more interconnected antennas, stamping the antenna biscuit to form
one or more individual antennas, applying the one or more
individual antennas to the one or more ferrite substrates to form
one or more antenna assemblies, and adjusting placement of the one
or more individual antennas relative to the ferrite substrates to
adjust functional properties of the one or more antenna
assemblies.
Inventors: |
Kurz; Arthur; (Mountainside,
NJ) ; Duetsch; Bernard; (Summit, NJ) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
A.K. Stamping Company, Inc. |
Mountainside |
NJ |
US |
|
|
Assignee: |
A.K. Stamping Company, Inc.
Mountainside
NJ
|
Family ID: |
53266083 |
Appl. No.: |
16/027019 |
Filed: |
July 3, 2018 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
15367329 |
Dec 2, 2016 |
10014580 |
|
|
16027019 |
|
|
|
|
14306857 |
Jun 17, 2014 |
9923273 |
|
|
15367329 |
|
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|
|
61910642 |
Dec 2, 2013 |
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Current U.S.
Class: |
1/1 |
Current CPC
Class: |
Y10T 29/53022 20150115;
H01Q 1/38 20130101; H01Q 7/06 20130101; H01Q 1/2291 20130101; H01Q
21/0087 20130101; Y10T 29/49016 20150115; H01Q 7/005 20130101; Y10T
29/53187 20150115 |
International
Class: |
H01Q 7/00 20060101
H01Q007/00; H01Q 1/22 20060101 H01Q001/22; H01Q 21/00 20060101
H01Q021/00; H01Q 1/38 20060101 H01Q001/38; H01Q 7/06 20060101
H01Q007/06 |
Claims
1. A method for manufacturing and tuning a near field communication
antenna comprising: dispensing a glue card onto a pallet; lifting
the glue card from the pallet; applying the glue-side of the glue
card to a first antenna; lifting the glue card with the antenna
adhered thereto; placing the glue card and antenna onto a first
ferrite substrate, the antenna and ferrite substrate forming an
antenna assembly; and measuring one or more functional properties
of the antenna assembly.
2. The method of claim 1, further comprising stamping to form the
first and second antennas.
3. The method of claim 1, further comprising testing the antenna
assembly for compliance and quality control.
4. The method of claim 1, wherein the functional properties include
frequency and inductance.
5. The method of claim 1, further comprising pressing the antenna
assemblies with a rubber stop to solidify contact between the
antenna and the ferrite substrate.
6. The method of claim 1, wherein the pallet is a holding tray
which has a plurality of pockets to retain the glue cards therein.
Description
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This application is a continuation of, and claims the
benefit of priority to, U.S. patent application Ser. No. 15/367,329
filed on Dec. 2, 2016, which is a divisional of, and claims the
benefit of priority to, U.S. patent application Ser. No. 14/306,857
filed on Jun. 17, 2014, which claims priority to U.S. Provisional
Patent Application No. 61/910,642, filed on Dec. 2, 2013, the
entire disclosures of which are expressly incorporated herein by
reference.
BACKGROUND
Field of the Disclosure
[0002] The present disclosure relates to manufacturing and tuning a
near field communication antenna. More specifically, the present
disclosure relates to tuning a near field communication antenna by
adjusting the location of a stamped metal antenna relative to a
ferrite substrate.
Related Art
[0003] Near field communication (NFC) antennas and antenna
assemblies are commonly used in a variety of electronic devices,
and more specifically in smartphones. In such devices, the antenna
is affixed to a ferrite substrate. The antenna can be formed on the
ferrite substrate through a chemical etching process. Ferrite
substrates have porosity which is inconsistent across different
batches of ferrite and which affects certain functional properties
of the antenna assembly, such as inductance.
[0004] What would be desired but has not yet been provided is an
efficient and effective method for tuning or optimizing an antenna
assembly to obtain desired functional properties thereof.
SUMMARY
[0005] The present disclosure relates to a method for tuning an NFC
(near field communication) antenna. More specifically, the
disclosure relates to a method for tuning and/or optimizing an NFC
antenna assembly by adjusting/modifying the placement of a stamped
metal antenna relative to a ferrite substrate. The placement could
be performed by a robotic system and the method could utilize an
adaptive and/or manual feedback system.
BRIEF DESCRIPTION OF THE DRAWINGS
[0006] The features of the disclosure will be apparent from the
following Detailed Description, taken in connection with the
accompanying drawings, in which:
[0007] FIG. 1 is a diagram showing a series of stations workflow
for manufacturing and tuning an NFC antenna;
[0008] FIG. 2 is a flowchart showing steps for manufacturing and
tuning an NFC antenna;
[0009] FIG. 3 is a flowchart showing steps for applying an antenna
to a ferrite substrate;
[0010] FIG. 4 is a view of a pallet used in optimizing an NFC
antenna;
[0011] FIG. 5 is a view of ferrite being applied to the pallet of
FIG. 4;
[0012] FIG. 6 is a view of a biscuit being applied to the pallet of
FIG. 4;
[0013] FIG. 7 is a view of the pallet with the ferrite and biscuit
applied thereto;
[0014] FIG. 8 is a view of a stamping station;
[0015] FIG. 9 is a view of a scrap removal station;
[0016] FIG. 10 is a view of the pallet with singulated
antennas;
[0017] FIG. 11 is a view of a labeling machine used at an antenna
application and tuning station;
[0018] FIG. 12a is a view of glue cards on a holding tray at the
antenna application and tuning station;
[0019] FIG. 12b is a close-up view of FIG. 12a;
[0020] FIG. 13 is a view of the holding tray and pallet at the
antenna application and tuning station;
[0021] FIG. 14 is a view of a press station; and
[0022] FIG. 15 is a view of a test station.
DETAILED DESCRIPTION
[0023] The present disclosure relates to a method for tuning an NFC
(near field communication) antenna, as discussed in detail below in
connection with the figures.
[0024] FIG. 1 is a diagram showing a series of stations 20 (e.g.,
assembly line) for manufacturing and tuning an NFC antenna. The
line begins at a ferrite station 22, where one or more ferrite
substrates are loaded onto a workstation (e.g., movable or
stationary), such as a pallet. At antenna station 24, an antenna
biscuit having one or more antennas (e.g., metal antennas) is
loaded onto the pallet. The plurality of antennas are
interconnected with one another and/or a frame to form the biscuit.
At the stamping station 26, the individual antennas are separated
from one another and from their supports (e.g., singulated). At the
scrap removal station 28, the leftover scraps of the biscuit from
the stamping station 26 are removed from the pallet.
[0025] At the coil and contacts station 30, coil and contacts for a
wireless charger are added and the coil is laser soldered to the
contacts. At the antenna application and tuning station 34, the one
or more individual (e.g., singulated) antennas are each applied to
one or more ferrite substrates respectively. At the press station
36, the position of the antenna relative to the ferrite is pressed
to ensure and further solidify a solid contact between each of the
antennas and ferrite substrates. At the visual inspection station
38, an individual and/or a computer system (e.g., with artificial
intelligence) visually inspects the antennas applied to the ferrite
(e.g., for any obvious defects). At the test station 40, the
individual antennas are tested (e.g., manually or automatically)
for compliance and quality control to ensure that they meet the
desired specifications. Any antennas found to be defective or
deficient are separated and put aside for further analysis.
[0026] Many of the foregoing stations are interchangeable so that
they could be performed in a variety of orders (e.g., the ferrite
station could be after the antenna station, etc.). Further, some
stations could be combined into one station (e.g., the ferrite
station and antenna station could be combined into a loading
station), or a single station could be separated into multiple
stations (e.g., the coil and contacts station could be separated
into a coil and contacts loading station and a laser solder
station). Additionally, some of the foregoing stations could be
omitted completely (e.g., coil and contacts station, etc.).
[0027] FIG. 2 is a flowchart 50 showing steps for manufacturing and
tuning an NFC antenna. In step 52, a pallet and/or paddle are
loaded onto a track. The track allows the pallet and paddle to move
(e.g., manually or automatically) between stations. The stations
are described above with reference to FIG. 1. Although a track is
disclosed specifically, any suitable movement between stations
could be utilized. In step 54, one or more ferrite substrates is
loaded onto a pallet (e.g., manually or automatically), such as by
using guidepins on the pallet. In step 56, a vacuum is applied to
the pallet to facilitate removal of a liner for the ferrite. The
vacuum keeps each ferrite substrate in place relative to the pallet
while the liner is removed. Once the liner is removed, the vacuum
is released in step 57.
[0028] In step 58, an antenna biscuit having one or more antennas
is loaded onto the pallet. In step 60, the antennas are separated
from the biscuit into individual antennas. Biscuit scraps (e.g.,
from the biscuit frame) are removed from the pallet (e.g., by
vacuum). In step 64, coil and contacts for a wireless charger could
be added to the pallet, each of the antennas, and/or each of the
ferrite substrate. In step 66, the coil is soldered to the contacts
for the wireless charger.
[0029] In step 68, discussed in more detail below, the antenna is
applied to the ferrite and the location of the antenna relative to
the ferrite is adjusted. In step 70, the antenna is re-pressed to
ensure that the antenna assembly has set and to further solidify
the contact between the antennas and the ferrite substrates. In
step 72, the antennas are tested for quality control. In step 74,
the antennas that passed the quality control test are separated
from those that failed.
[0030] FIG. 3 is a flowchart showing steps for applying an NFC
antenna to ferrite, such as by using a labeling machine. In step
80, the label machine (or operator) dispenses one or more glue
cards onto a holding pallet, preferably such that the glue-side is
facing down. In step 82, a robot arm of the labeling machine picks
up the glue cards, preferably from the top of the card (e.g., by
suction). In step 84, the robot arm holding all of the glue cards
then lowers/places the glue cards onto the antennas, such that each
antenna adheres to the glue-side of the glue card. In this way,
when the robot arm lifts up the glue card again, the antenna is
lifted as well. In step 86, the robot arm then lowers/places the
antenna and glue card onto the ferrite. In step 88, prior to
lifting the robot arm up, the system and/or user adjusts the
position of the antenna relative to the ferrite. Adjusting the
position of the antenna relative to the ferrite provides
adjustments in the functional properties of the antenna assembly,
such as those related to frequency and inductance.
[0031] FIGS. 4-15 are views of manufacturing and tuning an NFC
antenna using the stations described above. FIGS. 4-7 are views
showing a pallet being set up with ferrite substrates and an
antenna biscuit. More specifically, FIG. 4 is a view of a pallet
100 and paddle 106. As shown, the pallet 100 includes a ferrite
substrate area 102 and a paddle area 104 for the paddle 106, which
receives one or more antennas. FIG. 5 is a view of a liner 107 of
ferrite substrates 108 being applied to the pallet 100 at the
ferrite loading station 22 (discussed above). The ferrite substrate
area 102 could include guidepins for facilitating the loading of
ferrite 108 onto the pallet. Once loaded, a vacuum could be applied
to the pallet so that the ferrite substrates 108 are secured
relative to the pallet 100 for ferrite liner removal. In addition
to (or instead of) the vacuum, magnets could be provided in the
pallet 100 to secure the relative position of the ferrite
substrates 108. Once secured, the liner 107 is removed from the
ferrite substrates 108 without altering the position of the ferrite
substrate 108 relative to the pallet 100. FIG. 6 is a view of an
antenna biscuit 110 being applied to the paddle 106 on pallet 100
at the antenna loading station 24. The biscuit 110 has a plurality
of antennas 112 interconnected with one another (e.g., by a frame).
FIG. 7 is a view of a pallet 100 with the ferrite substrates 108
and antenna biscuit 110 (with a plurality of antennas 112) applied
to the pallet 100 at the antenna loading station 24.
[0032] FIGS. 8-10 are views related to stamping and separating
antennas of the antenna biscuit. More specifically, FIG. 8 is a
view of a stamping station 26. As shown, the station 26 includes a
stamping press 114 and a robotic system 116 having a robotic arm
118. The robotic system 116 is controllable and programmable from
control system 120. The robotic arm 118 picks up and moves the
paddle from the pallet 100 to the stamping press 114, where the
antenna biscuit 110 is stamped and the antennas 112 are separated
from one another and from the biscuit.
[0033] FIG. 9 is a view of a scrap removal station 28. At the scrap
removal station 28, the singulated antennas and ferrite substrates
are secured in place on the pallet by magnets within the pallet. A
robotic arm 122 at the scrap removal station 28 includes a vacuum
with ports on the underside of the robotic arm 122 to pick up and
dispose the frame of the antenna biscuit. The remaining scraps can
then be blown off the end effector by a user and/or robotic system.
FIG. 10 is a view of a pallet 100 with singulated antennas 112
after the scraps have been removed.
[0034] FIGS. 11-13 are views of the antenna application and tuning
station 34. More specifically, FIG. 11 is a view of a labeling
machine 124 used at the antenna application and tuning station 34.
The labeling machine 124 dispenses glue cards as described below.
Any suitable machine or labeling machine capable of dispensing the
glue cards could be used.
[0035] FIG. 12a is a view of glue cards 130 on a holding tray 126
at the antenna application and tuning station 34. FIG. 12b is a
close-up view of FIG. 12a. As shown, the glue cards 130 are
distributed by the label machine glue-side down onto receiving
pockets 128 on the holding tray 126 (e.g., by blowing the glue
cards 130 onto the holding tray 126). The receiving pockets 128
retain the glue cards on the holding tray 126. The receiving
pockets preferably have a lip 129 so that only the outer border of
the glue card 130 contacts any portion of the holding tray 126,
which protects the glue on the glue card 130.
[0036] FIG. 13 is a view of the holding tray 126 and pallet 100 at
the label station 34. As shown, the label station 34 could handle a
plurality of glue cards and antennas at one time. A robotic arm 132
of a robotic system includes suction ports on an underside of the
robotic arm 132. The robotic arm 132 lowers onto the holding tray
126 and picks up the glue cards from the holding tray 126 using the
suction ports. The holding tray 126 could move between several
positions, such as a position to receive glue cards from the label
machine, and a position to provide the robotic arm with access to
the glue cards.
[0037] The robotic arm 132 lifts the glue cards from the holding
tray 126 and positions the glue cards over the antennas 112. The
robotic arm 132 lowers the glue cards onto the antennas 112,
thereby adhering the antennas 112 to the glue cards. The robotic
arm 132 then lifts the antennas 112 secured to the glue cards and
positions the antennas 112 and glue cards over the ferrite
substrates 108. Once the antennas 112 are in a desired position
relative to the ferrite substrates 108, the antennas 112 are
lowered onto the ferrite substrates 108. The robotic arm 132
positions the antennas 112 before the antennas 112 contact the
ferrite substrates 108. The robotic arm 132 can shift the antennas
112 relative to the ferrite substrates 108 (e.g., by nanometers)
before adhering the antennas 112 to the ferrite 108. Such movement
could be side-to-side, for example, to tune and adjust functional
properties of the final antenna assembly (e.g., frequency,
inductance) to compensate for changes in ferrite porosity among
different ferrite batches. Changing the inductance changes the
frequency of the antenna assembly because there is a correlation
between the two properties.
[0038] The antenna assembly can then be optimized by measuring the
inductance for changes in the position of the antenna 112 relative
to the ferrite substrate 108. More specifically, the antenna
assembly is optimized by applying the antenna 112 in a specific
position relative to a ferrite substrate 108 for a particular
ferrite batch, and testing the functional properties of that
particular assembly. The position of the antenna 112 relative to
the ferrite substrate 108 is recalibrated based on the results of
the tests, and then retested (although alternatively a different
antenna and a different ferrite substrate from the same ferrite
batch could be used). Recalibration and retesting continues until
the functional properties of the antenna assembly have been
optimized for a particular ferrite batch, and then that particular
position is applied to all antenna assemblies for the particular
ferrite batch (ferrite substrates 108 in each ferrite batch usually
have the same, or very similar, properties). This optimization
procedure is repeated for each ferrite batch, because the
properties of ferrite substrates 108 vary between different ferrite
batches. The antenna assemblies are then monitored and tested (as
described below) to ensure that each has the desired optimized
functional properties, and the system can be recalibrated if a
problem arises. An adaptive feedback system could also be employed
to make positioning adjustments.
[0039] FIG. 14 is a view of the press station 38. As shown, the
press lifts the pallet 100 containing the antenna assemblies off of
the track until the pallet 100 and antenna assemblies come into
contact with a stop underneath a ceiling 134, such as a rubber or
other stop. The pressure between the press station ceiling 134 and
the pallet further secures and solidifies the antenna assembly
connections.
[0040] FIG. 15 is a view of the test station 40. As shown, the test
station 40 includes a robotic arm 138 which lifts the antenna
assemblies from the pallet and places them on a testing apparatus
139. The plurality of antenna assemblies are then tested (e.g.,
impedance, inductance, resistance, etc.) by the testing bed 139 to
ensure quality control. The test bed 139 includes probes to test
for inductance or other functional properties. Additionally, while
the antenna assemblies are tested a printer head could print
identifying information (e.g., code) onto the antenna assemblies.
If all of the antenna assemblies pass the test they are placed in
compartments 142 of a compliant container 140. If any one of the
antenna assemblies fail the test, all of the antenna assemblies of
that batch are placed in compartments 146 of a non-compliant
container 144. Those placed in the non-compliant container 144 can
then be re-tested to find the specific non-compliant antenna
assembly. However, the system could also differentiate which
specific antenna assembly of a batch failed the test and place only
that specific antenna assembly in the non-compliant container
144.
[0041] Having thus described the invention in detail, it is to be
understood that the foregoing description is not intended to limit
the spirit or scope thereof. It will be understood that the
embodiments of the present invention described herein are merely
exemplary and that a person skilled in the art may make any
variations and modification without departing from the spirit and
scope of the invention. All such variations and modifications,
including those discussed above, are intended to be included within
the scope of the invention.
* * * * *