U.S. patent application number 14/955185 was filed with the patent office on 2017-06-01 for testing apparatus usable in switchgear cabinet.
This patent application is currently assigned to EATON CORPORATION. The applicant listed for this patent is EATON CORPORATION. Invention is credited to Timothy Fair, Daniel Edward Hrncir.
Application Number | 20170153270 14/955185 |
Document ID | / |
Family ID | 58778211 |
Filed Date | 2017-06-01 |
United States Patent
Application |
20170153270 |
Kind Code |
A1 |
Fair; Timothy ; et
al. |
June 1, 2017 |
Testing Apparatus Usable In Switchgear Cabinet
Abstract
A test apparatus that is usable with a switchgear cabinet is
structured to mimic the operation of a circuit interruption device
being received in the interior of the switchgear cabinet by
providing a number of structures such as an engagement wall that
engages a shutter assembly and moves it from a deployed state to an
undeployed state. The engagement wall in the test apparatus has a
number of openings formed therein that permit a number of
electrical conductors and the relevant portions of the shutter
assembly to be viewed from the exterior of the switchgear
cabinet.
Inventors: |
Fair; Timothy; (Boiling
Springs, SC) ; Hrncir; Daniel Edward; (Arden,
NC) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
EATON CORPORATION |
Cleveland |
OH |
US |
|
|
Assignee: |
EATON CORPORATION
Cleveland
OH
|
Family ID: |
58778211 |
Appl. No.: |
14/955185 |
Filed: |
December 1, 2015 |
Current U.S.
Class: |
1/1 |
Current CPC
Class: |
H02B 11/00 20130101;
G01R 31/327 20130101; G01R 1/04 20130101; H02B 3/00 20130101; H02B
1/306 20130101; G01R 31/3275 20130101 |
International
Class: |
G01R 1/04 20060101
G01R001/04; G01R 31/327 20060101 G01R031/327; H02B 1/30 20060101
H02B001/30 |
Claims
1. A test apparatus that is usable with a switchgear cabinet, the
switchgear cabinet having an interior and having an access port
through which a circuit interruption device is receivable into the
interior from the exterior of the cabinet, the switchgear cabinet
having a number of electrical conductors and a shutter assembly
that are situated within the interior, the shutter assembly being
operable to move the shutter assembly between a deployed state and
an undeployed state responsive to the shutter assembly being
engaged by the circuit interruption device, the shutter assembly in
the deployed state being in a condition covering the number of
electrical conductors and resisting the number of electrical
conductors from being visually observed through the access port
from a location situated at an exterior of the switchgear cabinet,
the shutter assembly in the undeployed state being in another
condition uncovering the number of electrical conductors, the test
apparatus comprising: a frame that comprises at least a first wall
having a number of openings formed therein, the frame being movable
between a first position disengaged from the shutter assembly and a
second position received at least partially in the interior and
engaged with the shutter assembly to move the shutter assembly
between the deployed state and the undeployed state and to thereby
move the shutter assembly between the condition covering the number
of electrical conductors and the another condition uncovering the
number of electrical conductors, the number of openings in the
second position at least partially overlying the number of
electrical conductors and permitting the electrical conductors to
be visually observed through the number of openings and through the
access port from a location situated at the exterior of the
switchgear cabinet.
2. The test apparatus of claim 1 wherein the frame further
comprises a base and a drive mechanism, the drive mechanism and the
at least first wall being situated on the base, the drive mechanism
being engageable with a corresponding structure on the switchgear
cabinet and being operable to move the frame toward the second
position.
3. The test apparatus of claim 2 wherein the drive mechanism
comprises an aim that is movable with respect to the base between a
disengaged position and an engaged position, the shutter assembly
being in the deployed state in the disengaged position of the arm,
the frame being in the second position in the engaged position of
the aim.
4. The test apparatus of claim 3 wherein the drive mechanism
further comprises a lock that is movable between a locked position
and an unlocked position, the lock in the locked position retaining
the arm in the disengaged position, the lock in the unlocked
position permitting the arm to move between the disengaged and
engaged positions.
5. The test apparatus of claim 3 wherein the arm is pivotable with
respect to the base between the disengaged and engaged
positions.
6. The test apparatus of claim 1 wherein the switchgear cabinet
comprises a support that is movable between an extended position
and a retracted position, the support in the retracted position
being situated within the interior, the support in the extended
position protruding from the interior through the access port to
the exterior of the switchgear cabinet, the support being
structured to receive thereon the circuit interruption device and
to move the circuit interruption device between an uninstalled
position when the support is in the extended position and an
installed position when the support is in the retracted position,
and wherein the frame further comprises a lug apparatus that is
receivable on the support and is structured to permit the frame to
be carried by the support between the extended and retracted
positions to move the frame between the first and second positions.
Description
BACKGROUND
[0001] Field
[0002] The disclosed and claimed concept relates generally to
electrical interruption equipment and, more particularly, to a
testing apparatus that is usable with a switchgear cabinet.
[0003] Related Art
[0004] Circuit interruption equipment is well known in the relevant
art for use in interrupting the flow of current in a protected
portion of an electrical circuit. Numerous types of such circuit
interruption devices exist and can include circuit breakers, vacuum
interrupters, and numerous other types of devices known for such
purposes.
[0005] One type of circuit interruption system is a withdrawable
circuit interruption system such as is depicted generally in FIGS.
1-7. Such a system employs a switchgear cabinet 6 and a circuit
interruption device 10 that is mountable thereon and removable
therefrom. The switchgear cabinet 6 has an interior 12 within which
the circuit interruption device 10 is receivable through an access
port 16 of the switchgear cabinet 6. The switchgear cabinet 6 has a
number of electrical conductors 22 within the interior 12 that are
covered by a shutter assembly 24 to protect personnel in the
vicinity of the switchgear cabinet 6 from contact with the
electrical conductors 22 in situations when the circuit
interruption device 10 is removed from the interior 12 of the
switchgear cabinet 6. As employed herein, the expression "a number
of" and variations thereof shall refer broadly to any non-zero
quantity, including a quantity of one. As can be seen in FIGS. 1-2
and 4-6, the shutter assembly 24 includes a first plate 28 having a
plurality of first holes 30 formed therein, a second plate 34
(FIGS. 2 and 4-5) having a plurality of second holes 36 (FIG. 5)
formed therein, a pair of abutments 40A and 40B affixed to the
first plate 28, and an engagement apparatus 42 that is connected
with the first and second plates 28 and 34. The engagement
apparatus 42 is depicted in FIGS. 4-5 as including a push bar 46
and a pair of links 48A and 48B that extend between the push bar 46
and the first and second plates 28 and 34. The first and second
plates 28 and 34 are cooperable with channels formed in the walls
of the switchgear cabinet 6 to move the shutter assembly 24 between
a deployed state, such as is depicted in FIGS. 1-2 and 4, and an
undeployed state, such as is depicted in FIGS. 5-6. The shutter
assembly 24 is spring biased toward the deployed state in which the
first and second holes 30 and 36 are offset from one another such
that the first and second plates 28 and 34 together form a shield
between the electrical conductors 22 and the interior 12 of the
switchgear cabinet 6.
[0006] When the circuit interruption device 10 is removed from the
interior 12, the shutter assembly 24 is therefore in the deployed
state and covers the electrical conductors 22.
[0007] As is best shown in FIG. 1, the switchgear cabinet 6 has a
support 52 that is movably situated within the interior 12 and that
is movable between an extended position such as is depicted in FIG.
1 wherein a portion of the support 52 protrudes from the interior
12 into the exterior 8 of the switchgear cabinet 6 and a number of
retracted positions 52 wherein the support 52 is situated within
the interior 12. The support 52 includes a pair of telescoping
rails 56A and 56B, and the circuit interruption device 10 includes
a number of lugs 58 foamed on an exterior surface of its housing.
The lugs 58 are receivable on the rails 56A and 56B, such as when
the support 52 is in the extended position shown in FIG. 1, wherein
the shutter assembly is in its deployed state. As the rails 56A and
56B are telescoped into the interior 12 with the circuit
interruption device 10 situated thereon, the circuit interruption
device 10 is advanced farther into and along the interior 12 and
begins to approach the shutter assembly 24, as is indicated
generally in FIG. 2 wherein the circuit interruption device 10 has
not yet made physical contact with the shutter assembly 24.
[0008] The circuit interruption device 10 includes a drive system
54 that is depicted generally in FIG. 3 and that includes a pin 60
that is situated on a pivotable crank 62. The pin 60 is receivable
in a notch 63 that is formed in a structure 64 of the switchgear
cabinet 6 that is disposed within the interior 12 of the switchgear
cabinet 6.
[0009] As the crank 62 is pivoted (in the clockwise direction from
the perspective of FIGS. 3 and 7), the pin 60 is received in the
notch 63, and the circuit interruption device 10 is advanced
farther into the interior 12 to a point where the circuit
interruption device 10 physically engages the abutments 40A and 40B
and the push bar 46. Further advancement of the circuit
interruption device 10 into the interior 12 causes the shutter
assembly 24 to be corresponding advanced toward the electrical
conductors 22 and to move the shutter assembly 24 from its deployed
state to its undeployed state that is depicted generally in FIGS. 5
and 6. In the undeployed state, the first and second holes 30 and
36 are aligned with one another to thereby uncover the electrical
conductors 22 and to permit finger clusters or other connection
structures on the advancing face of the circuit interruption device
10 to be electrically engaged with the electrical conductors 22. It
thus can be understood that by advancing the circuit interruption
device 10 into the interior 12 by operating the drive system 54 to
engage the pin 60 in the notch 63 and to simultaneously engage the
advancing wall of the circuit interruption device 10 with the
shutter assembly 24, the bias of the shutter assembly 24 is
overcome, and the shutter assembly 24 is translated farther into
the interior 12 while moving the shutter assembly 24 from the
deployed state to the undeployed state and simultaneously receiving
the electrical conductors 22 in the aligned first and second holes
30 and 36. Such a condition is depicted generally in FIG. 6.
[0010] While such circuit interruption systems have been generally
effective for their intended purposes, they have not been without
limitation. For instance, since the shutter assembly 24 is caused
by the advancing circuit interruption device 10 to simultaneously
move toward the electrical conductors 22 while translating the
first and second plates 28 and 34 with respect to one another to
move from its deployed state to its undeployed state, the proper
operation of the components relies upon the shutter assembly 24 and
the electrical conductors 22 being situated in pre-established
positions with respect to one another. However, it is understood
that potential limitations with the manufacturing process and
damage that may be sustained by the switchgear cabinet 6 during
transportation to its final location may result in improper
positioning of the electrical conductors 22 or the shutter assembly
24 or both. Such misalignment can be a problem because it can
inhibit the circuit interruption device 10 from electrically
engaging the electrical conductors 22 and because an attempt to
receive the circuit interruption device 10 into the interior 12 can
cause the shutter assembly 24 to engage the electrical conductors
22 themselves and thereby cause damage. Additionally or
alternatively, such misalignment cannot be observed from the
exterior 18 of the switchgear cabinet 6 because of the visually
obstructive presence of the circuit interruption device 10. As is
understood from an arrow 65 that is depicted in FIGS. 2 and 6, the
circuit interruption device 10 itself obstructs a view from the
exterior 18 of the shutter assembly 24 in its undeployed state.
Improvements therefore would be desirable.
SUMMARY
[0011] An improved test apparatus 4 that is usable with the
switchgear cabinet 6 meets these and other shortcomings known in
the relevant art. The test apparatus 4 is structured to mimic the
operation of the circuit interruption device 10 being received in
the interior 12 of the switchgear cabinet 10 by providing a number
of structures such as an engagement wall 78 that engages the
shutter assembly 24 and moves it from its deployed state to its
undeployed state. The engagement wall 78 in the test apparatus has
a number of openings 86 formed therein that permit the electrical
conductors 22 and the relevant portions of the shutter assembly 24
to be viewed from the exterior 18 of the switchgear cabinet 6.
[0012] Accordingly, an aspect of the disclosed and claimed concept
is to provide an improved test apparatus that is usable with a
switchgear cabinet and which permits the operation of a shutter
assembly in moving between deployed and undeployed states to be
observed from the exterior of the switchgear cabinet.
[0013] Another aspect of the disclosed and claimed concept is to
provide an improved test apparatus that is usable with a switchgear
cabinet in place of a circuit interruption device and that permits
the operation of a shutter assembly that otherwise would be blocked
from view by a circuit interruption device to instead be observable
from the exterior of the switchgear cabinet.
[0014] Accordingly, an aspect of the disclosed and claimed concept
is to provide an improved test apparatus that is usable with a
switchgear cabinet, the switchgear cabinet having an interior and
having an access port through which a circuit interruption device
is receivable into the interior from the exterior of the cabinet,
the switchgear cabinet having a number of electrical conductors and
a shutter assembly that are situated within the interior, the
shutter assembly being operable to move the shutter assembly
between a deployed state and an undeployed state responsive to the
shutter assembly being engaged by the circuit interruption device,
the shutter assembly in the deployed state being in a condition
covering the number of electrical conductors and resisting the
number of electrical conductors from being visually observed
through the access port from a location situated at an exterior of
the switchgear cabinet, the shutter assembly in the undeployed
state being in another condition uncovering the number of
electrical conductors. The test apparatus can be generally stated
as including a frame that can be generally stated as including at
least a first wall having a number of openings formed therein, the
frame being movable between a first position disengaged from the
mechanism and a second position received at least partially in the
interior and engaged with the mechanism to move the shutter
assembly between the deployed state and the undeployed state and to
thereby move the shutter assembly between the condition covering
the number of electrical conductors and the another condition
uncovering the number of electrical conductors, the number of
openings in the second position at least partially overlying the
number of electrical conductors and permitting the electrical
conductors to be visually observed through the number of openings
and through the access port from a location situated at the
exterior of the switchgear cabinet.
BRIEF DESCRIPTION OF THE DRAWINGS
[0015] A further understanding of the disclosed and claimed concept
can be gained from the following Description when read in
conjunction with the accompanying drawings in which:
[0016] FIG. 1 is a depiction of a circuit interruption device
situated on a support of a switchgear cabinet with the support
being in an extended position and with a shutter assembly of the
switchgear cabinet being in a deployed state;
[0017] FIG. 2 is a view similar to FIG. 1, except depicting the
circuit interruption device at least partially received in an
interior of the switchgear cabinet and depicting for reasons of
clarity a portion of the support having been removed;
[0018] FIG. 3 is a sectional view as taken along line 3-3 of FIG.
2;
[0019] FIG. 4 is a depiction of the shutter assembly of FIG. 1 in
the deployed state;
[0020] FIG. 5 is a view similar to FIG. 4, except depicting the
shutter assembly in an undeployed state;
[0021] FIG. 6 is a view similar to FIG. 2, except depicting the
circuit interruption device fully advanced into the interior and
depicting the shutter assembly in the undeployed state of FIG. 5
and with a number of electrical conductors of the switchgear
cabinet being received through a plurality of aligned first and
second holes formed in the shutter assembly;
[0022] FIG. 7 is a sectional view as taken along line 7-7 of FIG.
6;
[0023] FIG. 8 is another view of the switchgear cabinet of FIG. 1,
except additionally depicting an improved test apparatus in
accordance with the disclosed and claimed concept being spaced from
the support;
[0024] FIG. 9 is a view similar to FIG. 8, except depicting the
test apparatus received on the support of the switchgear
cabinet;
[0025] FIG. 10 is a view similar to FIG. 9, except depicting the
test apparatus at least partially situated in the interior of the
switchgear cabinet and depicting for reasons of clarity a portion
of the support having been removed;
[0026] FIG. 11 is a sectional view as taken along line 11-11 of
FIG. 10;
[0027] FIG. 12 is an enlarged view of the indicated portion of FIG.
10;
[0028] FIG. 13 is a view similar to FIG. 10, except depicting the
test apparatus fully advanced along the interior of the switchgear
cabinet and depicting the shutter assembly in the same undeployed
state as is depicted in FIG. 5 with the electrical conductors being
received through aligned first and second holes of the shutter
assembly; and
[0029] FIG. 14 is a sectional view as taken along line 14-14 of
FIG. 13.
[0030] Similar numerals refer to similar parts throughout the
specification.
DESCRIPTION
[0031] An improved test apparatus 4 in accordance with the
disclosed and claimed concept is depicted in FIGS. 8-14. The test
apparatus 4 is usable with the switchgear cabinet 6 that is
depicted in FIGS. 1-7, for example, and advantageously permits the
operation of the shutter assembly 24 and its physical interaction
with the electrical conductors 22 to be observed from the exterior
18 of the switchgear cabinet 6. In effect, the test apparatus 4 is
configured to take the place of the circuit interruption device 10
which, for the reasons set forth above, obstructs a view of the
shutter assembly 24 and the electrical conductors 22 from the
exterior through the access port 16. As will be set forth in
greater detail below, the test apparatus 4 advantageously engages
the shutter assembly 24 in the same fashion as would the circuit
interruption device 10, except that the test apparatus 4 is
advantageously configured to not obstruct the shutter assembly 24
and the electrical conductors 22 and rather advantageously permits
them and their operation to be observed from the exterior 18 of the
switchgear cabinet 6.
[0032] As can be understood from FIGS. 8 and 9, the test apparatus
4 can be said to include a frame 66 that includes a base 70 and a
wall apparatus 72. The test apparatus 4 further includes a drive
mechanism 76 that is situated on the base 70 and that is cooperable
with the structure 64 of the switchgear cabinet 6 to permit the
test apparatus 4 to be advanced into the interior 12 and to operate
the shutter assembly 24 between the deployed and undeployed states
in a fashion similar to the way in which the drive system 54 of the
circuit interruption device 10 advanced it to cause the change in
state of the shutter assembly 24.
[0033] The wall apparatus 72 is situated on the base 70 and
includes an engagement wall 78 and a pair of sidewalls 82A and 82B.
The engagement wall 78 has a plurality of openings 86 formed
therein which can be said to overlie the electrical conductors 22
and the aligned first and second holes 30 and 36 when the test
apparatus 4 is fully advanced into the switchgear cabinet 6 and has
engaged the shutter assembly 24 and moved it to its undeployed
state.
[0034] The wall apparatus 72 further includes a lug apparatus 88
that includes a pair of lugs 90A and 90B that are situated on the
sidewalls 82A and 82B, respectively. The lugs 90A and 90B are
receivable on the rails 56A and 56B, respectively, of the support
52 and thus support the test apparatus 4 on the support 52 during
movement of the support 52 between the extended and retracted
positions, such as is depicted in FIGS. 8-10 and 13. It is noted
that the rail 56A is removed from FIGS. 10 and 13 for reasons of
clarity. The lugs 90A and 90B are mirror images of one another, as
are the rails 56A and 56B.
[0035] The drive mechanism 76 includes an arm 92 that is pivotably
situated on the base 70 and further includes a lock 94 that is
depicted in FIG. 12 as including a plunger that is movable between
a locked position that is depicted in solid lines and an unlocked
position that is depicted in dashed lines in FIG. 12. The plunger
95 in the locked position is received in a receptacle 96 (FIG. 13),
and in so doing the lock 94 retains the arm 92 in a disengaged
position such as is depicted generally in FIGS. 8-12. As can be
understood from FIGS. 11 and 14, the drive mechanism 76 further
includes a crank 97 that is mechanically connected with and
operated by the arm 92 and that is pivotable with respect to the
base 70. The crank 97 is pivotable to move a pin 98 of the drive
mechanism 76 that is situated on the free end of the crank 97
between a first position disengaged from the notch 63 formed on the
structure 64 and a second position engaged with the notch 63. When
the lock 94 is in the locked position of FIGS. 8-10 and 12, the
plunger 95 is received in the receptacle 96, and the pin 98 remains
in a condition unreceived in the notch 63. However, when the
plunger 95 is moved to the unlocked position that is depicted in
dashed lines in FIG. 12, the plunger 95 is withdrawn from the
receptacle 96, and the arm 92 can be pivoted with respect to the
base 70 from the disengaged position that is depicted generally in
FIGS. 8-12 to an engaged position that is depicted generally in
FIGS. 13-14. In the depicted exemplary embodiment, the plunger 95
is spring-biased toward the locked position that is depicted in
solid lines.
[0036] When the arm 92 is pivoted from the disengaged position
depicted generally in FIGS. 10-11 to the engaged position depicted
generally in FIGS. 13-14, the engagement of the pin 98 with the
notch 63 formed in the structure 64 causes the engagement wall 78
and the base 70 to engage the abutments 40A and 40B and the push
bar 46 in a fashion similar to the way in which the circuit
interruption device 10 engages the abutments 40A and 40B and the
push bar 46 when it is situated on the support 52 and is being
advanced along the interior 12. That is, the engagement wall 78
mechanically engages the abutments 40A and 40B, and the base 70
mechanically engages the push bar 46, and such mechanical
engagement between the structures of the test apparatus 4 and the
corresponding engaged structures of the shutter assembly 24 causes
the shutter assembly 24 to be moved to its undeployed state. As
mentioned elsewhere herein, the first and second holes 30 and 36
become aligned with one another and the electrical conductors are
received through the aligned pairs of first and second holes 30 and
36 in the undeployed state of the shutter assembly 24. Since the
openings 86 formed in the engagement wall 78 are aligned with the
electrical conductors 22 and the aligned first and second holes 30
and 36, the operation of the shutter assembly 24 in moving between
the deployed and undeployed states can be observed through the
openings 86 from the exterior 18 of the switchgear cabinet 6 and
through the access port 16. The interplay between the shutter
assembly 24 and the electrical conductors 22 can likewise be
observed. That is, the shutter assembly 24 can be visually observed
moving between the deployed and undeployed states, and the
electrical conductors 22 can be observed being received in the
aligned pairs of first and second holes 30 and 36, and this can be
observed through the openings 86 from the exterior 18 of the
switchgear cabinet 6 and through the access port 16.
[0037] It thus can be seen that the test apparatus 4 with its
openings 86 formed therein advantageously permits the shutter
assembly 24 and the electrical conductors 22 to be observed from
the exterior 18 of the switchgear cabinet 6, which enables problems
with the switchgear cabinet 6 to be identified prior to the circuit
interruption device 10 being racked into the interior 12, thereby
avoiding greater damage to the switchgear cabinet 6. Additionally,
the proper functioning of the shutter assembly 24 and its proper
cooperation with the electrical conductors 22 can likewise be
observed, which advantageously reduces the risk to nearby personnel
due to possible electrical shorts within the interior 12 such as
might be occasioned by switching the circuit interruption device 10
to its ON condition or by simply racking the circuit interruption
device 10 into the interior 12 if the shutter assembly 24 or the
electrical conductors 22 were not working or cooperating properly.
The improved test apparatus 4 is inexpensive to manufacture and
functions in the same way as the circuit interruption device 10
being received in the interior 12 and becoming engaged with the
shutter assembly 24. The test apparatus 4 thus advantageously
provides a low cost system for checking the operation of the
switchgear cabinet 6. Other advantageous will be apparent.
[0038] While specific embodiments of the disclosed concept have
been described in detail, it will be appreciated by those skilled
in the art that various modifications and alternatives to those
details could be developed in light of the overall teachings of the
disclosure. Accordingly, the particular arrangements disclosed are
meant to be illustrative only and not limiting as to the scope of
the disclosed concept which is to be given the full breadth of the
claims appended and any and all equivalents thereof.
* * * * *