U.S. patent application number 15/262820 was filed with the patent office on 2017-03-16 for electrical isolation for a camera in a test and measurement tool.
The applicant listed for this patent is Fluke Corporation. Invention is credited to Clark N. Huber, Paul A. Ringsrud.
Application Number | 20170078544 15/262820 |
Document ID | / |
Family ID | 56943397 |
Filed Date | 2017-03-16 |
United States Patent
Application |
20170078544 |
Kind Code |
A1 |
Ringsrud; Paul A. ; et
al. |
March 16, 2017 |
ELECTRICAL ISOLATION FOR A CAMERA IN A TEST AND MEASUREMENT
TOOL
Abstract
Analysis systems can include both a test and measurement tool
for generating measurement data representative of at least one
parameter of a device under test and an imaging tool for generating
image data representative of a target scene. A processor in
communication with the test and measurement circuit and the imaging
tool can process measurement data and image data. Isolation
circuitry can be configured to provide isolation between the
imaging tool and the test and measurement circuit while permitting
communication between the processor and each of the test and
measurement tool and the imaging tool. A display for presenting
measurement data and/or image data can be electrically isolated
from the test and measurement tool.
Inventors: |
Ringsrud; Paul A.; (Langley,
WA) ; Huber; Clark N.; (Everett, WA) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Fluke Corporation |
Everett |
WA |
US |
|
|
Family ID: |
56943397 |
Appl. No.: |
15/262820 |
Filed: |
September 12, 2016 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
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62219415 |
Sep 16, 2015 |
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Current U.S.
Class: |
1/1 |
Current CPC
Class: |
H04N 5/2252 20130101;
G01R 1/04 20130101; G01R 15/148 20130101; H04N 5/33 20130101; H04N
5/2257 20130101; G01R 15/125 20130101; G01R 15/14 20130101 |
International
Class: |
H04N 5/225 20060101
H04N005/225; G01R 15/14 20060101 G01R015/14; H04N 5/33 20060101
H04N005/33; G01R 15/12 20060101 G01R015/12 |
Claims
1. A system comprising a test and measurement tool comprising a
test and measurement circuit, the test and measurement tool
configured to generate measurement data representative of at least
one parameter of an object under test; an imaging tool configured
to generate image data representative of a target scene; a
processor in communication with the test and measurement tool and
the imaging tool and configured to receive and process measurement
data and image data for display; isolation circuitry configured to
provide galvanic isolation between the imaging tool and the test
and measurement circuit of the test and measurement tool while
permitting communication between the processor and each of the test
and measurement tool and the imaging tool; a display in
communication with the processor and capable of presenting a
display based on the processed measurement data and image data.
2. The system of claim 1, wherein the test and measurement tool and
imaging tool are combined into a single combination tool.
3. The system of claim 2, wherein the combination tool comprises a
power supply configured to provide electrical power to the test and
measurement circuit, the imaging tool, and the processor.
4. The system of claim 3, further comprising a transformer disposed
between the power supply and the test and measurement circuit; and
an isolating communication channel configured to provide
communication between the test and measurement circuit and the
processor while maintaining electrical isolation therebetween;
whereby the test and measurement circuit is electrically isolated
from the power supply, the processor, and the imaging tool via the
transformer and the isolated communication channel.
5. The system of claim 4, wherein the isolating communication
channel comprises an optical isolator.
6. The system of claim 5, wherein the test and measurement circuit
is positioned at least predetermined distance from each of the
power supply, the processor, and the imaging tool, and wherein the
predetermined distance meets IEC 61010 standards.
7. The system of claim 2, wherein the imaging tool is removable
from the combination tool.
8. The system of claim 7, wherein the display is in wireless
communication with the processor, the test and measurement tool,
and/or the imaging tool.
9. The system of claim 1, wherein the imaging tool comprises an
infrared camera module configured to generate infrared image data
representative of the target scene.
10. The system of claim 9, wherein the imaging tool further
comprises a visible light camera module configured to generate
visible light image data representative of the target scene.
11. An analysis system comprising: a high voltage portion
comprising: one or more inputs configured to interface with a
device under test and a test and measurement circuit configured to
interface with the one or more inputs and to receive high voltage
measurement data from the device under test via the one or more
inputs; a low voltage portion electrically isolated from the high
voltage portion, the low voltage portion comprising: an imaging
tool configured to generate image data representative of a target
scene and a display device; an isolating communication interface
configured to facilitate communication between the high voltage
portion and the low voltage portion; and a processor in
communication with the test and measurement circuit, the imaging
tool, the display device, and the isolating communication
interface, the processor being configured to generate display data
for presentation on the display device, the display data including
one or both of image data and measurement data.
12. The analysis system of claim 11, wherein the processor is
positioned in the low voltage portion and communicates with the
test and measurement circuit via the isolating communication
interface.
13. The analysis system of claim 11, wherein the high voltage
portion and the low voltage portion are supported by a single
housing.
14. The analysis system of claim 13, wherein all components located
in the high voltage portion are separated from all components in
the low voltage portion by at least a predetermined distance and/or
an insulating material, wherein the predetermined distance meets
IEC 61010 standards.
15. The analysis system of claim 13, wherein the housing includes
an insulating outer layer surrounding at least the high voltage
portion.
16. The system of claim 13, wherein the imaging tool is removable
from the housing.
17. The analysis system of claim 11, wherein the low voltage
portion further comprises a power supply, and wherein the system
further comprises a transformer in communication with the power
supply and configured to provide electrical power to the high
voltage portion.
18. The analysis system of claim 11, further comprising memory in
communication with the processor, the memory being configured to
store image data from the imaging tool and/or measurement data from
the test and measurement circuit.
19. The analysis system of claim 11, wherein the low voltage
portion further comprises a user interface in communication with
the processor.
20. A combination tool comprising: a test and measurement circuit
comprising one or more inputs configured to interface with a device
under test; an imaging tool electrically isolated from the test and
measurement circuit and comprising at least one camera module
configured to generate image data representative of a target scene;
a processor in communication with the test and measurement circuit
and the imaging tool; and a display electrically isolated from the
test and measurement circuit and in communication with the
processor, the display being configured to present a display based
measurement data and/or image data received by the processor.
21. The combination tool of claim 20, wherein the test and
measurement circuit, the imaging tool, and the display are
supported by a single housing.
Description
CROSS-REFERENCES
[0001] This application claims the benefit of U.S. Provisional
Application No. 62/219,415, filed Sep. 16, 2015, the content of
which is hereby incorporated by reference in its entirety.
TECHNICAL FIELD
[0002] This disclosure generally relates to electrical test tools
capable of withstanding high voltages and associated imaging
tools.
BACKGROUND
[0003] Various information regarding parameters of system
components may be useful in analyzing individual component's
performance, operating conditions, lifespan, and other various
aspects. Some such information includes measureable quantities,
such as a current, voltage, power, impedance, vibration, and the
like. Analysis of components of a system may provide insight into
ways the system may be improved, for example, by repairing or
replacing faulty or otherwise non-optimal components. Various test
and measurement tools are capable of performing such measurements,
and are often used in analyzing such components.
[0004] In some instances, when analyzing electrical equipment,
dangerously high voltages may at times be present in various parts
of the circuit in the analysis instrument. Standards and practices
exist to protect users from being exposed to these voltages, such
as solid insulation between any potentially high voltage portions
and the user.
[0005] In some examples, additional information may be helpful in
analyzing such components. For example, imaging techniques, such as
infrared imaging, may provide useful additional information.
Infrared imagery of a system or components thereof can provide
thermal patterns of the scene, highlighting temperature
abnormalities in system components. Such imagery may be useful in
diagnosing similar or different issues that may be detected or
otherwise analyzed using standard test and measurement tools as
discussed above.
[0006] Since the advent of thermal imaging applications in
electrical environments, there has been a need to keep the operator
at a safe distance from the electrical circuits under observation.
In some situations, companies have developed optical windows for
switch gear cabinets, enabling physical isolation from the high
voltage, but allowing optical measurements.
[0007] In the event that a user is performing both imaging and
other analysis (e.g., electrical measurement analysis), instances
may occur in which the imaging apparatus is exposed to or proximate
potentially high voltage environments. Thus, additional safety
measures may be necessary for protecting the user from exposure to
potentially dangerous signals via the imaging apparatus.
SUMMARY
[0008] Aspects of this disclosure are directed toward systems and
methods for providing combined test and measurement analysis and
imaging analysis while providing adequate safety to a user.
Embodiments in this disclosure include systems comprising a test
and measurement tool comprising a test and measurement circuit and
being configured to generate measurement data representative of at
least one parameter of an object under test. A system can further
include an imaging tool configured to generate image data
representative of a target scene. In various embodiments, the
imaging tool can include an infrared (IR) imaging tool and/or a
visible light (VL) imaging tool.
[0009] Systems can include a processor in communication with the
test and measurement tool and the imaging tool. The processor can
be configured to receive and process measurement data and image
data, such as for presentation on a display. Systems can include
isolation circuitry configured to provide isolation between the
imaging tool and the test and measurement circuit of the test and
measurement tool. The isolation circuitry can permit communication
between the processor and each of the test and measurement tool and
the imaging tool. Thus, during operation, even if dangerous high
voltages are present at the test and measurement circuit in the
test and measurement tool, the imaging tool is electrically
isolated from the test and measurement circuit and does not present
a shock risk to the operator.
[0010] In various embodiments, the test and measurement tool and
the imaging tool can be combined into a combination tool. In some
such combination tools, imaging tools can be removably or fixedly
attached to the test and measurement tool. One or more power
supplies can provide electrical power to the test and measurement
circuit, the imaging tool, and the processor. In some embodiments,
a transformer can be present between the power supply and the test
and measurement circuit to maintain electrical isolation between
the test and measurement circuit and other components. Similarly,
in some embodiments, an isolating communication channel can be
configured to provide communication between the test and
measurement circuit and the processor.
[0011] In some examples, the test and measurement circuit is
physically separated from one or more other components, for
example, to prevent or minimize the risk of arcing between the test
and measurement circuit and such components. In some embodiments,
the test and measurement circuit is positioned at least a
predetermined distance from each of a power supply, a processor,
and an imaging tool. The predetermined distance can be such that
the distance meets IEC 61010 standards. For example, in some
embodiments, the predetermined distance can be the minimum distance
required by IEC 61010 based on a maximum voltage rating of the test
and measurement circuit.
[0012] The details of one or more examples are set forth in the
accompanying drawings and the description below. Other features,
objects, and advantages will be apparent from the description and
drawings, and from the claims.
BRIEF DESCRIPTION OF DRAWINGS
[0013] FIGS. 1A and 1B provide front and back views of an exemplary
system including a test and measurement tool and an imaging
tool.
[0014] FIG. 2 is an exemplary schematic diagram of a test and
measurement tool comprising a variety of components.
[0015] FIG. 3 shows an example block diagram of an imaging tool
configured for receiving electromagnetic radiation according to
some exemplary systems.
[0016] FIG. 4 is an exemplary schematic system diagram showing
electrical isolation in a test and measurement tool communicating
with an imaging tool.
DETAILED DESCRIPTION
[0017] Aspects of the disclosure generally relate to systems and
methods providing electrical isolation between portions of imaging
tools and test and measurement tools, in some instances, when the
imaging tool(s) and test and measurement tool(s) are integrated
into a single combination tool. Test and measurement tools can be
generally capable of determining at least one parameter of a device
under test. Exemplary test and measurement tools can include, but
are not limited to, digital multimeters, current measurement tools,
power quality tools, vibration tools, portable oscilloscope tools,
laser alignment tools, ultrasonic test tools, insulation resistance
testers, multi-function electrical test tools, single-function
electrical test tools, contact temperature measurement tools,
humidity measurement tools, air-flow measurement tools, air
temperature measurement tools, air quality and particulate
measurement tools, and the like. In some embodiments, one or more
such test and measurement tools can produce and/or measure an
electrical signal that is unsafe for the operator of the test and
measurement tool without proper protection.
[0018] One or more imaging devices can be integrated with or
otherwise attached or attachable to a test and measurement tool
such as described in U.S. patent application Ser. No. 14/855,884
entitled "TEST AND MEASUREMENT SYSTEM WITH REMOVABLE IMAGING TOOL,"
now published as U.S. Patent Publication No. 2016/0080666, or U.S.
patent application Ser. No. 14,855/844 entitled "METHOD OF
ATTACHING CAMERA OR IMAGING SENSOR TO TEST AND MEASUREMENT TOOLS,"
now published as U.S. Patent Publication No. 2016/0076936, each of
which was filed Sep. 16, 2015, is assigned to the assignee of the
instant application, and is hereby incorporated by reference in its
entirety. In various examples, the imaging tool interfacing with a
test and measurement tool can be sensitive to any of a variety of
wavelengths. Exemplary imaging components can include sensors which
can detect visible, near infrared (NIR), short-wavelength infrared
(SWIR), long wavelength infrared (LWIR), terahertz (THz),
ultraviolet (UV), X-Ray or other wavelengths. In some embodiments,
the imaging component can include one or more imaging sensors, for
example, infrared (IR) and visible light (VL) cameras.
[0019] FIGS. 1A and 1B provide front and back views of an exemplary
system including a test and measurement tool and an imaging tool.
The embodiment of FIGS. 1A and 1B includes a test and measurement
tool 100 and an imaging tool 110 combined into a single combination
tool 120. In the illustrated embodiment, test and measurement tool
100 includes a back surface 102 through which the imaging tool 110
receives radiation from a target scene.
[0020] In some examples, imaging tool 110 can include a plurality
of sensing components. For example, imaging tool 110 may include
one or both of an infrared (IR) camera and a visible light (VL)
camera. It will be appreciated that various imaging tools such as
110 can include any combination of appropriate sensors capable of
detecting a variety of wavelengths.
[0021] In the example of FIGS. 1A and 1B, imaging tool 110 is
integrated into test and measurement tool 100. That is, the system
of FIG. 1 shows a combination tool 120 having integral test and
measurement tool 100 and imaging tool 110. Imaging tool 110
includes a camera capable of detecting radiation in one or more
ranges of wavelengths. As described, imaging tool 110 may include a
plurality of cameras for detecting radiation in different
wavelength spectrums. In some examples, the imaging tool may
include a plurality of sensor arrays, each sensor array sensitive
to a different range of wavelengths. Some such embodiments include
optics for separating light incident to imaging tool and
substantially directing light within certain wavelength ranges to
corresponding sensor arrays.
[0022] The combination tool 120 of FIGS. 1A and 1B may be
configured to generate image data and measurement data
substantially simultaneously. In some examples, combination tool
120 includes a display 108 capable of presenting one or more of
image data, measurement data, or other information. Additionally or
alternatively, any one or more of the test and measurement tool
100, imaging tool 110, and combination tool 120 can communicate one
or more of measurement data, image data, or combined measurement
and image data to any other system component. In some examples,
such data may be communicated to an external device, as described
in U.S. patent application Ser. No. 14/855,989, filed Sep. 16,
2015, entitled "DISPLAY OF IMAGES FROM AN IMAGING TOOL EMBEDDED OR
ATTACHED TO A TEST AND MEASUREMENT TOOL," now published as U.S.
Patent Publication No. 2016/0076937, which is assigned to the
assignee of the instant application, and which is hereby
incorporated by reference in its entirety.
[0023] In the front view of FIG. 1A, the tool 120 includes inputs
130, for example, for receiving one or more accessories (e.g., test
leads). The one or more accessories can be used for interfacing
with an object under test for generating measurement data
representative of at least one parameter of a device under test. In
some embodiments, test and measurement tool 100 in combination tool
120 may perform a plurality of different measurement functions via
inputs 130. In some embodiments, the measurement function is
selectable, for example, via a user interface 150. Interface 150
can include one or more elements by which a user can interact with
the tool 120, such as a selection knob 152 or buttons 154, or other
interface elements such as a touchscreen, switches, and the
like.
[0024] Combination tool 120 includes a display 108. Display 108 can
be used to present various information to the user. In some
examples, display 108 can be configured to present measurement data
generated by the test and measurement tool 100. Additionally or
alternatively, the display 108 can be configured to present image
data generated by imaging tool 110. In some embodiments, a
combination of measurement data and image data can be presented on
the display 108 for presentation to a user.
[0025] FIG. 2 is an exemplary schematic diagram of a test and
measurement tool comprising a variety of components. In the
illustrated example, the test and measurement tool 200 may include
one or power supplies 230 for providing electrical power to any of
a variety of system components for performing a variety of tasks,
such a performing one or more primary functions. In some
embodiments, the one or more power supplies 230 may include one or
more batteries. Additionally or alternatively, the test and
measurement tool 200 may be capable of running on AC power, e.g.,
from a standard wall receptacle. In some such embodiments, one or
more batteries of the test and measurement tool 200 may be charged
while the tool 200 is operating on or otherwise plugged into an AC
power source.
[0026] The test and measurement tool may include one or more inputs
220 configured to interface with an object under test for
performing a measurement of a parameter thereof In various
examples, the one or more inputs 220 may include any appropriate
input for performing a measurement of a parameter of a device under
test. The one or more inputs 220 may provide a signal indicative
the parameter of the object under test to any combination of
electronics 222 and a processor 224 for further processing of the
signal. In some examples, the test and measurement tool 200
includes a memory 226 for storing information indicative of one or
more parameters of a device under test. In some embodiments, one or
both of processor 224 and memory 226 may be integrated into
electronics 222.
[0027] In some embodiments, test and measurement tool 200 may
include an interface 228 for interacting with a user. In some
examples, interface 228 may include one or more controls for
receiving user inputs. Controls may include, for example, buttons,
switches, knobs, touch screens, etc. In some embodiments, a user
may initiate a measurement or other test and measurement tool 200
function using controls. Additionally or alternatively, the
interface may include a display for communicating information to a
user. For example, the display may present a user with selectable
options, such as various functions selectable by the user via
controls. Additionally or alternatively, the display may be
configured to present the results of one or more measurements
performed by the test and measurement tool for observation by a
user. In some examples, a display is capable of presenting textual
measurement information (e.g., letters, numbers, etc.), but is not
capable of displaying image information, such as described
elsewhere herein. Additionally or alternatively, in some
embodiments, power supply 230 is not capable of supporting a
continuous image display without severely depleting the available
power supply. Thus, in some examples, presentation of image data
via interface 228 may be impossible or impractical.
[0028] In some examples, interface 228 may provide an interface
with additional equipment. For example, in some embodiments,
interface 228 can provide a communication interface between the
test and measurement tool 200 and an imaging tool (e.g., 110) or an
external device (e.g., smartphone, tablet, etc.). In various
embodiments, interface 228 can be used to export received
measurement data, such as from inputs 220, or a processed result,
for example, from processor 224.
[0029] FIG. 3 shows an example block diagram of an imaging tool
configured for receiving electromagnetic radiation according to
some exemplary systems. In the illustrated embodiment, imaging tool
310 includes optics 340, a sensor array 342, electronics 344, one
or more processors 346, memory units 348, input/output devices 350,
and a power supply 352.
[0030] The optics 340 can include optics for focusing, deflecting,
and/or reflecting electromagnetic radiation from a target object
onto the sensor array 342. In some examples, the sensor array 342
may include an infrared sensor array sensitive to infrared
radiation. An imaging tool including such an infrared sensor array
may be used to make non-contact temperature measurements.
[0031] In such embodiments, the infrared sensor array 342 can
include one or more thermal detectors such as microbolometers or
thermopiles, or could be composed of photon detectors such as
photodiodes or phototransistors, or other thermal or photon
detection device. In some examples, an infrared sensor array may
include a single detector, for instance, for determining a spot
temperature within a target scene. Alternatively, an infrared
sensor array may comprise a plurality of such detectors for
acquiring at least one of a spot temperature (e.g., via an average
value of sensor array sensors) and a two-dimensional infrared
image.
[0032] One having ordinary skill in the art will recognize that
various sensor arrays (e.g. photon sensor arrays) can be used, and
can be used in combination with one or more infrared sensor arrays.
In some examples, the sensor array is fixed within the imaging tool
310 to provide a more durable device having fewer moving and
moveable parts. In various examples, the size and positioning of
the detector depends on the characteristics of the optical system
(e.g., the relationship between optics 340 and sensor array 342).
In some embodiments, the detector is generally circular having a
diameter of 0.5 mm to 3 mm. However detectors of any size and shape
should be considered within the scope of the invention. The
detector produces a signal as a function of the radiation or other
scene data imaged thereupon. These signals can be processed by
known methods to indicate a temperature or other metric indicated
via the received radiation.
[0033] A person having ordinary skill in the art will recognize
that many materials and materials technologies may be suitable for
use in an infrared sensor array. In some examples, the infrared
sensor array 342 responds to infrared radiation ranging from
approximately 0.7 microns to approximately 30 microns and can have
a peak sensitivity within this range. The electronics 344 receive
the output signals from the sensor array 342 and pass them to the
processor 346 for analysis.
[0034] When an infrared sensor assembly is used, the processor 346
can be used to run infrared thermometer applications including, but
not limited to, deciding if the target object sufficiently fills
the field of view, and averaging output signals for a period of
time to reduce the impact of noisy measurements on the accuracy of
the measured temperature. In the case of alternative sensor arrays
(e.g., sensitive to one or more of visible light, ultraviolet
light, X-rays, etc.), the processor 346 may be used to run
corresponding imaging applications.
[0035] Memory 348 can include but is not limited to, RAM, ROM, and
any combination of volatile and non-volatile memory. A power supply
352 can include, but is not limited to, a battery, a parasitic
energy system (e.g., an inductive system), and components for
directly receiving AC power. The power supply 352 can provide power
to the sensor array 342, electronics 344, processor 346, memory
348, and/or input/output devices 350. An input/output device 350
can include, but is not limited to, triggers to start and stop the
image capture, visual displays, speakers, and communication devices
that operate through wired or wireless communications.
[0036] For instance, in some examples, the input/output device 350
of the imaging tool 310 can include a display capable of displaying
an image produced from data conveyed or captured by one or more
sensor arrays 342. In some examples, the display can be further
configured to show other data, for instance, data from the test and
measurement tool (e.g., via communication port 104) or other
external sources. Additionally or alternatively, input/output
device 350 may be capable of one or more of receiving measurement
data from a measurement tool and communicating at least one of
image data and received measurement data to an external device,
such as a tablet, smartphone, computer, etc.
[0037] In some embodiments, the functionality of one or more
components of one or both of the test and measurement tool 200 or
imaging tool 310 can be shared between the components. For example,
in some embodiments, a combination tool comprising a test and
measurement tool and an imaging tool can include a processor
capable of performing the processing functions of processor 224 and
processor 346. Additionally or alternatively, a single memory in a
combination tool can be capable of performing the functions of
memory 226 and memory 348. Similarly, such a combination tool can
include a single power supply, interface, or the like. In general,
combination tools having both a test and measurement tool and an
imaging tool can share any of a variety of components configured to
interface with both the test and measurement tool and the imaging
too.
[0038] As described elsewhere herein, in some examples, an imaging
tool can be removably attached to a test and measurement tool to
form a combination tool. In some such examples, one or both of the
imaging tool and the test and measurement tool can include various
components, such as a processor, memory, interface, display, and
the like. Wired and/or wireless communication between the imaging
tool and test and measurement tool can be used to communicate
measurement data and/or image data between the tools. Several such
configurations are described in U.S. patent application Ser. No.
14/855,884, which is incorporated by reference. Similarly, one or
both of imaging tool and test and measurement tool can be in
communication with an external device. The external device may
include components such as memory, a processor, and/or a display.
In various embodiments, such components can be used in addition to
similar components in the test and measurement tool and/or the
imaging tool, or can replace the functionality of such components.
For instance, in some examples, image data and/or measurement data
can be communicated to an external device for processing and/or
display. Some such configurations are described in U.S. patent
application Ser. No. 14/855,989, which is incorporated by
reference.
[0039] In some embodiments, a test and measurement tool may be
capable of measuring high voltages. Accordingly, in some instances,
such high voltages (or other potentially dangerous and/or damaging
signals) may at times be present within circuitry (e.g.,
electronics 222) of the test and measurement tool. Standards and
practices exist to protect users of typical test and measurement
tools from being exposed to such high voltages. For example, one or
both of solid state insulation and sufficient spacing between
potentially high voltage portions of a test and measurement tool
and location physically accessible to a user may provide protective
electrical isolation to an operator.
[0040] For example, IEC 61010 standard for CAT III 1000V rated
products requires approximately 16 millimeters spacing from
components on which at high voltage could be present. Similarly,
IEC 61010 can require different spacing for different voltage
ratings. For instance, CAT IV 600V rated products can require
approximately 14.3 millimeters spacing between components. In some
examples, the amount of spacing required can be reduced when solid
materials (e.g., electrically insulating materials) are disposed
between the potentially high voltage components and a user, such as
an insulating casing of a test tool. In some examples, an
electrically insulating casing of a test tool provides sufficient
insulation between a user and potentially high voltage components
internal to the test tool. In some embodiments, seams in the
insulating casing are positioned that, when tracing a path through
the seams, the path length from the outer surface of the casing to
any potentially high voltage component meets the required distance
standard.
[0041] However, when an imaging tool is incorporated (e.g.,
built-in, removably attached, etc.) into a test and measurement
tool capable of performing such high-voltage measurements, the
imaging tool may provide a weak point in the protective insulating
properties of the test and measurement tool. For example,
insulating casings used in test tools are often too opaque to allow
radiation of desired wavelengths to pass therethrough. Accordingly,
in some such embodiments, the imaging tool at least cannot be fully
surrounded by such an insulating material. Thus, an imaging tool
that is in close proximity with or in communication with a
potentially high voltage portion of a test and measurement tool, or
is in communication with a common component (e.g., a processor,
memory, etc.), may include components at dangerously high
voltages.
[0042] FIG. 4 is an exemplary schematic system diagram showing
electrical isolation in a test and measurement tool communicating
with an imaging tool. In the illustrated embodiment, the test and
measurement tool 400 includes a test and measurement circuit 418
including inputs 420 for interfacing with a device under test.
Inputs 420 may effectively couple the device under test with the
test and measurement circuit 418. For example, inputs 420 may
receive test leads attached to a piece of high-voltage equipment.
In some examples, the test and measurement circuit 418 may be
capable of receiving the voltage from the inputs 420 and generate a
signal representative of the voltage across a portion of the
high-voltage equipment.
[0043] In the illustrated example, the test and measurement circuit
418 is in communication with a common computing platform 422 via an
isolating communication channel 434. The common computing platform
422 can include a processor 424 and memory 426. In some examples,
memory 426 includes instructions for causing the processor 424 to
execute various tasks. For instance, in an exemplary configuration,
the memory 426 can include instructions to processor 424 for
receiving and processing data from the test and measurement circuit
418.
[0044] The common computing platform 422 of FIG. 4 is further in
communication with an imaging tool 410. In such embodiments, the
imaging tool 410 can be capable of communicating received image
data to the common computing platform 422. The memory 426 of the
common computing platform 422 can include instructions for
processing received image data via the processor 424. In some
examples, imaging tool 410 can be similar to any one or more or the
exemplary imaging tools shown or described in FIGS. 3-8 of U.S.
patent application Ser. No. 14,855/844, which is incorporated by
reference, though it will be appreciated that other imaging tool
configurations are possible.
[0045] The system shown in FIG. 4 includes a display 404 in
communication with the common computing platform 422. The display
404 can be capable of presenting one or both of image data and
measurement data. For example, the common computing platform 422
can be configured to process received image data for presentation
on the display 404. Similarly, the common computing platform 422
can be configured to process received measurement data for
presentation on the display 404. In some examples, the common
computing platform 422 can receive image data from the imaging tool
410 and measurement data from the test and measurement circuit 418
substantially simultaneously. In some such examples, the processor
424 can combine the received measurement data and image data for
presentation of the combined data to a user via the display
404.
[0046] As shown, the test and measurement tool 400 can include an
interface 428 capable of interfacing with a user. In some examples,
a user may initiate one or more tasks to be carried out by the test
and measurement tool 400 via the interface 428, such as acquiring
measurement data using the test and measurement circuit 418. In the
event of an imaging tool 410 in communication with the test and
measurement tool 100, a user may additionally or alternatively
initiate the capturing of image data via imaging tool 410 via
interface 428. In various examples, a user may select a variety of
options via the interface 428, such as a type of measurement data
to acquire, which information to present on the display 404, how
information is presented (e.g., image data palettization schemes,
etc.), and the like. The interface 428 can include, for example,
one or more buttons, knobs, touchscreens, or any other appropriate
interface.
[0047] The illustrated test and measurement tool 400 includes a
power supply 430 configured to provide electrical power to one or
more system components. In the illustrated embodiment, the power
supply 430 provides electrical power to operate the common
computing platform 422. Power supply 430 is also configured to
power the test and measurement circuit 418 via a transformer 432.
Power supply 430 may include one or more batteries or other
portable charge storage device. In some embodiments, power supply
430 may include an AC power source, such as a plug for receiving AC
power from a standard wall receptacle. Additionally or
alternatively to providing power to the common computing platform
422 and the test and measurement circuit 418, in some embodiments,
power supply 430 may provide electrical power to one or both of the
imaging tool 410 and display 404.
[0048] As discussed elsewhere herein, electrically isolating
portions of the test and measurement circuit 418 from the user may
provide desired or even required safety for the user. In the
illustrated embodiment, isolating communication channel 434 enables
communication between the test and measurement circuit 418 and the
common computing platform 422 without providing an electrically
conductive path therebetween. Exemplary isolating communication
channels 434 may be capable of two-way communication and can
include any one or more of optical isolators, wireless
communication devices (e.g., RF, Bluetooth, etc.), magnetic
communication components, and/or other known isolating
communication components. Similarly, in the illustrated embodiment,
transformer 432 provides electrical power to the test and
measurement circuit 418 from the power supply 430 without providing
an electrically conductive path therebetween.
[0049] In some examples, transformer 432 provides galvanic
isolation between the test and measurement circuit 418 and other
portions of the test and measurement tool 400. In some embodiments,
the transformer is designed to meet requirements of IEC 61010 for
1000V CAT III isolation. Accordingly, the test and measurement
circuit 418 may receive electrical power from the power supply of
the test and measurement tool 400 and communicate with the common
computing platform 422 while remaining electrically isolated from
such components. Such isolation can provide the necessary isolation
between possible high-voltage components connected to the test and
measurement circuit 418 via inputs 420 and a user operating the
test and measurement tool 400.
[0050] As shown in the embodiment of FIG. 4, a distance D separates
the test and measurement circuit 418 from other electrical
components that are electrically isolated therefrom, such as the
common computing platform 422. The physical separation (D) between
the test and measurement circuit 418, which may be electrically
coupled to, for example, a high voltage object under test via
inputs 420, can provide a measure of electrical isolation between
such components. For example, inadequate physical separation
between a high voltage element in the test and measurement circuit
418 and a component electrically isolated therefrom, such as the
common computing platform 422, may lead to arcing between such
components despite the electrical isolation therebetween. Arcing
can pose a risk to the user and the equipment. Adequate physical
separation between the test and measurement circuit 418 and other
components may reduce the risk of arcing.
[0051] The distance D for reducing the risk of arcing may depend on
the maximum voltage (or other signal) intended for measurement by
the test and measurement circuit. For example, in some embodiments,
for 1000V CAT III isolation, the distance, D, may be approximately
16 millimeters or greater to prevent arcing. In some examples, a
minimum value for the distance D is dictated by safety standards.
For instance, in some embodiments, the distance D is based on the
IEC 61010 safety standards. In some such examples, the actual
distance D can be dependent on the voltage rating of the tool
combined with the IEC 61010 standard. In some examples, a minimum
distance D for meeting one or more safety requirements can depend
on materials between the high and low voltage areas. For instance,
a solid insulator between the common computing platform 422 and the
test and measurement circuit 418 may reduce the minimum distance D
therebetween required to meet certain safety standards.
[0052] The electrical isolation between the test and measurement
circuit 418 and the common computing platform 422 allows the
imaging tool 410 to communicate directly with the common computing
platform 422 while remaining isolated from the test and measurement
circuit 418. The imaging tool 410, being electrically isolated from
the test and measurement circuit 418 (even if the imaging tool 410
and test and measurement tool 400 are integrated into a combination
tool), can communicate with the common computing platform 422 via
any known methods without exposing a user to a potentially
dangerous high voltage or other signal. Accordingly, there are no
limitations (e.g., resolution, image data size, image framerate,
etc.) placed on the communication between the imaging tool 410 and
the common computing platform 422 due to the risk of dangerous
signals in the test and measurement circuit 418.
[0053] The system of FIG. 4 shows an exemplary arrangement of a
variety of components. It will be appreciated that several
alternative configurations are possible. For example, while shown
as being within the test and measurement tool 400 in the embodiment
of FIG. 4, it will be appreciated that the common computing
platform 422 may be external to the test and measurement tool 400.
For example, common computing platform 422 or portions thereof may
be located within the imaging tool 410 or in an external device in
communication with one or both of the test and measurement tool 400
and the imaging tool 410, such as a smartphone, tablet, computer,
and the like. Communication between the common computing platform
422 and various components, such as the imaging tool 410 or the
isolating communication channel 434 may be provided by one or both
of wired or wireless communication channels.
[0054] As described elsewhere herein, the imaging tool 410 may be
separate, separable, or integrated into the test and measurement
tool 400. Additionally or alternatively, while shown separately
from the test and measurement tool 400 and imaging tool 410, the
display may be integrated into test and measurement tool 400, the
imaging tool 410, a combination tool, or may be a standalone
component in wired or wireless communication with the common
computing platform 422.
[0055] In some examples, various electrical isolation components
may be positioned elsewhere in the system. For instance, in some
embodiments, the common computing platform 422 may be in electrical
communication with the test and measurement circuit 418. Isolating
components (e.g., transformer 432, isolating communication channel
434, etc.) may be used to provide communication between the imaging
tool 410 and the common computing platform 422 so that the imaging
tool remains electrically isolated from any potential high voltages
present at the test and measurement circuit 418. In some examples,
isolation between a potentially high-voltage area and other system
components may be selected so that the lowest data rate and lowest
power consumption portions of the circuitry are isolated.
[0056] In some embodiments, power supply 430 may be used to provide
electrical power to any variety of system components. For examples,
in a combination tool having integrated imaging tool 410, test and
measurement tool 400, and display 404, power supply 430 may provide
electrical power for each component. Isolating components such as
transformer 432 may be used to maintain electrical isolation
between, for example, the test and measurement circuit 418 and
other system components while still using a common power supply
430. In other embodiments, one or more system components (e.g.,
display 404, imaging tool 410, test and measurement circuit 418,
etc.) may include its own dedicated power supply, such as one or
more batteries or other portable charge storage technology.
[0057] In some embodiments, the display 404 may be located in any
one or more of imaging tool 410, test and measurement tool 400, and
in an external device, such as a smartphone, tablet, computer, etc.
In some examples, display 404 may be a standalone display in
communication with the imaging tool 410 and test and measurement
tool 400 for receiving image data and measurement data therefrom,
respectively. In some examples, a system (e.g., the test and
measurement tool 400, imaging tool 410, or other component) may
include a wireless communication link 440 for communicating data to
the display 404 (e.g., a standalone display or in an external
device).
[0058] In various embodiments, the wireless communication link 440
can be used for communicating data to or receiving data from any
one or more of other imaging and/or test and measurement tools
(e.g., tool-to-tool communication), external devices (e.g.,
smartphones, tablets, computers, etc.), audio devices, or other
appropriate devices. Various wireless communication methods can be
possible, such as Zigbee communication, for example, for
tool-to-tool communication), or WiFi communication. WiFi
communication can provide communication with external device such
as phone, tablet, computer, etc. or a local area network (LAN) hub
which can communicate with cloud-based communication nodes or
serves, such as described, for example, in U.S. Patent Publication
No. 20140278259, corresponding to U.S. patent application Ser. No.
14/214,600, filed Mar. 14, 2014, and entitled "CAPTURE AND
ASSOCIATION OF MEASUREMENT DATA," and U.S. Patent Publication No.
20140270546, corresponding to U.S. patent application Ser. No.
14/214,624, filed Mar. 14, 2014, and entitled "UNIFIED DATA
COLLECTION AND REPORTING INTERFACE FOR EQUIPMENT," each of which is
assigned to the assignee of the instant application, and is hereby
incorporated by reference in its entirety.
[0059] In general, as discussed, a processor, such as processor 424
in the common computing platform 422, can be used to generate a
display for presentation to a user based on received image and
measurement data. Processed or unprocessed information may be
communicated to the location of display 404, where the information
can be presented to a user.
[0060] In some embodiments, electrical isolation between the
imaging tool 410 and the test and measurement circuit 418 prevents
the imaging tool 410 from developing a dangerously high voltage.
That is, in some such examples, the imaging tool 410 does not
provide a significant safety risk to a user even if the test and
measurement circuit 418 is at a high voltage. Additional safety
precautions such as those described in, for example, U.S.
Provisional Application No. 62/219,415, which is incorporated by
reference, and Attorney Docket number 56581.158.1, entitled
"SYSTEMS AND METHODS FOR PLACING AN IMAGING TOOL IN A TEST AND
MEASUREMENT TOOL," which is filed concurrently herewith, is
assigned to the assignee of the instant application, and is
incorporated herein by reference in its entirety, can be used to
protect the user of possible dangerous electrical signals from the
test and measurement circuit from harming the user via the imaging
tool. In fact, in some embodiments, imaging tool may protrude from
the test and measurement tool.
[0061] An electrically isolated imaging tool such as 410 in FIG. 4
may be removably attached to the test and measurement tool 400,
such as described, for example, in U.S. patent application Ser. No.
14/855,884, which is incorporated by reference. Additionally or
alternatively, an isolated imaging tool may include a movable
imaging element (e.g., a sensor array) as described in U.S. patent
application Ser. No. 14,855/844, which is incorporated by
reference. In various embodiments, imaging tool 410 can be
integrally embedded in test and measurement tool 400, removably
attachable to the test and measurement tool 400, and/or protrude
from the test and measurement tool. In general, electrical
isolation between the imaging tool 410 and the test and measurement
circuit 418 can protect the user of potentially dangerous signals
(e.g., voltage) present in the test and measurement circuit
418.
[0062] Various examples have been described. These and other
examples are within the scope of the following claims.
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