U.S. patent application number 14/493892 was filed with the patent office on 2016-03-24 for spacer accessory for xrf handheld analyzers.
This patent application is currently assigned to Olympus Scientific Solutions Americas Inc.. The applicant listed for this patent is Ted Michael Shields, Kenneth Lee Smith, JR.. Invention is credited to Ted Michael Shields, Kenneth Lee Smith, JR..
Application Number | 20160084777 14/493892 |
Document ID | / |
Family ID | 55525531 |
Filed Date | 2016-03-24 |
United States Patent
Application |
20160084777 |
Kind Code |
A1 |
Smith, JR.; Kenneth Lee ; et
al. |
March 24, 2016 |
SPACER ACCESSORY FOR XRF HANDHELD ANALYZERS
Abstract
Disclosed is an attachable spacer applied to the front base
plate of a hand-held and self-contained XRF testing device that
holds the face plate at a forwards tilt towards a test sample, and
ensures that only the top rim of the face plate ever touches a test
sample. The resulting triangular gap minimizes contact between the
front plate window and the test surface, prevents the transfer of
heat to the XRF testing device's circuitry, and locks in a fixed
distance between the face plate of the XRF testing device and the
sample being tested.
Inventors: |
Smith, JR.; Kenneth Lee;
(Winchester, MA) ; Shields; Ted Michael;
(Arlington, MA) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Smith, JR.; Kenneth Lee
Shields; Ted Michael |
Winchester
Arlington |
MA
MA |
US
US |
|
|
Assignee: |
Olympus Scientific Solutions
Americas Inc.
Waltham
MA
|
Family ID: |
55525531 |
Appl. No.: |
14/493892 |
Filed: |
September 23, 2014 |
Current U.S.
Class: |
378/45 |
Current CPC
Class: |
G01N 23/223 20130101;
G01N 2223/303 20130101; G01N 2223/301 20130101; G01N 2223/076
20130101 |
International
Class: |
G01N 23/223 20060101
G01N023/223; G01T 7/00 20060101 G01T007/00 |
Claims
1. An X-Ray Florescence (XRF) test system comprises an XRF test
instrument used for testing a test object's responses to X-rays,
the instrument comprising a front face configured to be placed
facing the test object, the front face including a test window
through which the X-rays and its responsive energy is allowed to
pass through, wherein the front face and the window are
substantially in the same plane, the system further comprising at
least one spacer to be attached to or be part of the front face to
create a constant space between the front face and the test object
when the front face is put against the test object.
2. The system of claim 1, wherein the front face including the
window and a base plate, wherein the base plate abuts the window
and in the same plane with the window.
3. The system of claim 2, wherein the spacer is configured to be
attached to the front base plate in a fashion to be removed from or
attached or re-attached over the front base plate.
4. The system of claim 2 wherein the at least one spacer is
configured to be removably attached to the front base plate along
or partially along the circumference of at least one front base
plate.
5. The system of claim 3, wherein the at least one spacer is
configured to be removably attached to the front base plate by
screws along or partially along the circumference of at least one
front base plate.
6. The system of claim 1 wherein the at least one spacer is
configured to be removably attached to the front base plate by
pressure fitting along or partially along the circumference of at
least one front base plate.
7. The system of claim 1, wherein the test instrument further
comprises an X-ray source, an X-ray detector, and a data processor
and memory.
8. The system of claim 7, wherein the data processor and memory
further comprises a calibration module including at least two
calibration modes, of which the first mode corresponds to the
operational status of the instrument without the spacer being
applied onto the front base plate, the second mode corresponding to
the operational status of the instrument with the spacer applied
onto the front base plate.
9. The system of claim 8, wherein the calibration modes correspond
to the calibration values obtained for different numbers and
different kinds of the spacer being attached to the front base
plate.
10. The system of claim 9, wherein the calibration values for a
specific one of the at least one spacer is obtained from
calibration procedures on the XRF instrument with the specific one
of the at least one spacer attached.
11. The system of claim 10, wherein the calibration values for a
specific one of the at least one spacer is calculated by applying
the calibration value of the first mode with a corresponding
calibration factor specific to the specific one of the at least one
spacer.
12. The system of claim 11, wherein the calibration factor is
obtained by comparing the calibration values obtained with and
without the specific one of the at least one spacer applied.
13. The system of claim 8, wherein the spacer calibration modes
encompass the entire or any part of possibilities under which any
and any number of the at least one spacer is applied to the front
base plate.
14. The system of claim 8, wherein the data processor and memory is
configured, during a calibration session, to execute the steps
including: prompting the user whether and how many of the at least
one spacer calibration mode is currently applied, and recommending
which of the at least one spacer calibration mode should be
applied, confirming which of the at least one, or none, of the
spacer calibration mode is being used for the present testing,
selecting the first or the second spacer calibration mode according
to the spacer mode applied, and calibrating and readying the XRF
instrument for testing.
15. The system of claim 14, wherein the steps further including
identifying which kind and how many of the at least one spacer are
applied.
16. The system of claim 14, wherein the steps further including
providing checking and identifying whether the identified spacer is
a good match to the test as tasked.
17. The system of claim 14, wherein the steps further including
prompting the user when the identified spacer application is not a
good match with the test as tasked.
18. A method of providing at least one spacer to be attached to or
to be part of a front face of an XRF instrument used for testing a
test object's responses to X-rays, the instrument comprising a
front face configured to be placed facing the test object, the
front face including a test window through which the X-rays and its
responsive energy is allowed to pass through, wherein the front
face and the window are substantially in the same plane, wherein
the at least one spacer is to create a constant space between the
front face and the test object when the front face is placed
against the test object.
19. The method of claim 18, wherein the front face including the
window and a front base plate, wherein the base plate abuts the
window and in the same plane with the window.
20. The method of claim 19, wherein the spacer is configured to be
attached to the front base plate in a fashion to be removed from or
attached or re-attached over the front base plate.
Description
FIELD OF THE INVENTION
[0001] This invention relates to X-Ray Fluorescence (XRF) portable
instruments configured to inspect, test and analyzing elemental
composition of a test object, more particularly to a spacer
accessory to be attached to the instruments.
BACKGROUND OF THE INVENTION
[0002] There are many non-destructive testing and/or XRF analysis
applications involving complex situations which require thickness
measurement, corrosion inspection and chemical composition analysis
on high temperature test objects. As an example, sulfide corrosion
of oil pipes is a significant cause of leaks and issues for the
refining industry that cause early replacements, unplanned outages,
loss of property, and, in extreme cases, injury to workers.
According to the American Petroleum Institute (API) Recommended
Practice 939-C (Guidelines for Avoiding Sulfidation Corrosion
Failures in Oil Refineries), 1/3 of all high temperature sulfidic
corrosion failures are due to low silicon content in the piping.
The inspection of a pipe's corrosion status, chemical composition
would require conducting XRF analysis on high temperature
pipes.
[0003] Elemental analysis of oil refinery pipes with handheld,
self-contained X-Ray Fluorescence (XRF) devices is a preferred
method to help predict and prevent pipe failures from occurring.
These handheld devices typically have a front plate window whereby
an X-ray is emitted out to a test object, and the responding energy
returning from the test object enters back to a detector in the
device. On regular test objects of which high temperature is not
present, the devices are usually held by operators in such a way
that the front plate touches the surface of the test object.
[0004] However when the test object is of high temperature during
an XRF operation, existing XRF device designs present problems as
to how the operator can hold the handheld so that the front plate
window can be placed in relation to the test object in the
desirable manner. First, if the front-plate window touches the
surface of the test object being tested, the front plate window
might sustain damage or too much heat is trapped between the front
plate and the test object. And high temperature oil pipes might
contaminate the window, invalidating the result. Therefore some gap
between the front plate window and the testing surface is
desirable. Second, if the gap between the front-plate and the
sample is too great, not enough X-ray energized energy from the
sample is captured during the test for the analyzer, and the result
is too faint to be accurate. Lastly, if the gap between the
front-plate window and the sample being tested wobbles and is
inconsistent, the air from the varying gaps attenuates the X-Rays
inconsistently (more so for lighter elements such as silicon), and
distorts the test results of the sample.
[0005] U.S. Pat. No. 7,939,450 B2 discloses an apparatus and method
for processing a substrate with silicon to control spaces between
the layers, and eliminate damage to transistor structures. While
this method optimally automates the placement of layer spacing (and
prevents the transfer of heat from the material), the solution does
not solve the risk of potential damage to a front plate window.
[0006] U.S. Pat. No. 2012/0294418 A1 discloses a method of using a
goniometer in order to rotate a testing sample to a precise angular
position for XRF analysis. This solution though does not minimize
the risk of contamination of the front-plate, nor does it allow an
air flow that creates a gap which prevents heat from being
transferred from the sample to the XRF analyzer.
[0007] U.S. Pat No. 2014/0204377 A1 discloses an auto-calibration,
auto-clean, and auto-focus functionality for spectroscopic
instruments (including XRF test devices) from a controller that
configures motors to move an optics stage and a laser, in order to
protect a front plate window. However, this solution is heavily
dependent on software operation, and does not have the practicality
of a simpler mechanical solution.
[0008] An inexpensive, easy to set up solution that can save the
display window of an XRF device from abrasion and contamination,
yet maintain a close and steady distance from a sample being
tested, would be of great economic and ergonomic value. It would
speed up XRF testing, reduce equipment replacement on a portable
XRF testing device, and retain a higher percentage of valid test
samples.
SUMMARY OF THE INVENTION
[0009] Disclosed is an attachable and removable spacer applied to
the front base plate of a hand-held and self-contained XRF testing
device that holds the face plate at a forwards slight tilt towards
a test sample. The usage of such spacer allows only the top rim of
the face plate and the spacer touch a test sample. The resulting
triangular gap minimizes contact between the front plate window and
the test surface, prevents the transfer of heat from the test
object to the analyzer, and maintains a fixed distance between the
face plate of the XRF testing device and the sample being
tested.
BRIEF DESCRIPTION OF THE OF THE DRAWINGS
[0010] FIG. 1 is a schematic of an XRF instrument with a removable
spacer ready to be attached the base plate of the XRF instrument
according to the present disclosure.
[0011] FIGS. 2a and 2b are schematics of the XRF instrument with
the removable spacer attached on the base plate.
[0012] FIGS. 3a and 3b are flowcharts of the process for operating
the XRF instrument accommodating the application of the spacer.
[0013] FIGS. 4a, 4b, and 4c are views of the spacer design in top
and cross sectional views.
DETAILED DESCRIPTION OF THE INVENTION
[0014] The preferred embodiment of an XRF instrument creating a
consistent space between the front window and the test object is
herein presented by referring to FIGS. 1-4d.
[0015] Referring to FIG. 1, a conceptual view of an XRF instrument
10 is configured to couple with a spacer 6, one at a time during
operation. The XRF instrument further optionally includes an X-ray
source 12, a detector 16, a data processor and memory 8, a display
14, and a front plate window 5 largely in the same way as
conventional XRF instruments.
[0016] A front base plate 4 is devised as in conventional XRF
instruments. An important novel aspect of the solution herein
presented includes the employment of spacer 6, with which any
number can be attached over front base plate 4 according to the
present invention.
[0017] An immediate exemplary usage of such an embodiment is to
affix spacer 6 to front base plate 4 in semi-removable fashion,
such as using screws. During operation, the instrument is held by
an operator at handle 20, with one edge of the front plate 22 and
part of spaces 6 come into contact with the surface of the test
object. With spacer 6 attached to base plate 5, a consistent
distance between front plate window 5 and the testing sample is
formed. This is particularly important for elements with lower
atomic numbers such as samples of silicon. At the meanwhile, the
gap between testing surface and front plate window 5 created by
space 6 decrease the heat trapped under the front plate window 5
and front base plate 4, creating a significant benefit avoiding
excess heat to be transferred into the instrument.
[0018] Reference is still made to FIG. 1. Spacer 6 is preferably
attached over front base plate 4 by using a removable attaching
means. Accordingly, spacer 6 is shown to be configured to be
attached to front base plate 4 using two screws. Alternatively,
spacer 6 can be attached by removably attaching means, which should
be within the scope of the present disclosure.
[0019] Alternatively, any number of spacers 6 can be used depending
on the application. For low atomic numbers of test samples, large
air attenuation is not desirable. Therefore, no additional spacer 6
is needed for such situation. It should be appreciated that the
usage of any number of, and any combination of any kinds of
spacers, collectively numerated as 6 in FIGS. 1 and 2 should be
determined by the testing specifics, and the usage of all such
should be within the scope of the present disclosure.
[0020] Further as shown in FIG. 1 and FIG. 2a, in this preferred
embodiment, the screw holes on spacer 6 are of the same size as,
and aligned with, the existing screw holes of front base plate 4.
In this way, spacer 6 shares the same set of screws as the existing
front base plate 4. This is to simplify the design modification and
the operation of adding and/or removing spacer 6.
[0021] Referring to FIG. 2a, XRF instrument 10 is conceptually
shown when spacer 6 is attached onto front base plate 4.
[0022] Referring to FIG. 2b, with spacer 6 attached, the only
contact points are A on the rim of instrument 10 and B on spacer 6.
The gap in a shape of triangle ABC creates a space to avoid direct
contamination of window 5. The minimum contacting surface helps
avoid heat from test object 7 being directly conducted into
instrument 10.
[0023] Alternatively, any other removably attaching means of spacer
6 is within the scope of the present disclosure. Such attaching
means may include the usage of latch, pressure fitting, etc.
[0024] It should be noted that the preferred material of space 6
would be of low thermal conductance so that heat from the test
object is not easily conducted into the instrument. Materials
suitable for spacer 6 include ceramic, which is a primary material
of choice.
[0025] Reference is now primarily made to FIG. 3a with continued
reference to FIG. 1. FIG. 3 is a flowchart showing an operational
procedure related to the usage of the embodiment shown in FIG.
1.
[0026] In order to accommodate the usage of a plurality of
removable spacers according to the present invention, XRF
instrument 10 is preferably devised with a plurality of
corresponding calibration modes, factory-preloaded onto data
processor and memory 8, according the factory calibration when
corresponding spacer is used.
[0027] It should be noted that the different calibration modes for
different types of removable spacers 6 can be either designed in a
new XRF instrument, or achieved by modifying an existing
calibration module or functional block residing on the processor of
an existing XRF product. The modified calibration module is shown
in FIG. 1 as 8a. It can also alternatively be calibrated in a field
operation or in a manufacturing set up, all of which should be
within the scope of the present invention.
[0028] Continuing with FIG. 3a, the method of calibrating an XRF
instrument for a specific spacer is commonly known. Different
calibration modes can be achieved in manufacturing settings for
different types of the spacers.
[0029] Alternatively, if the thickness of the spacers is
substantially homogenous and standardized, one can populate the
values of different calibration modes by calculating the
energy-dependent effect on the spectrum caused by the corresponding
spacer. One can conduct sufficient number of calibration runs for a
specific spacer, which yields a calibration factor for the spacer
by comparing to the energy reading of the same XRF instrument
without the spacer applied on the same set of samples.
[0030] Another note on the calibration modes is that it is
preferable to prepare all possible calibration modes with
corresponding calibration values for all possible combinations of
using, or without using, any and any number of spacers provided
with the instrument. The calibration values are stored in data
processor and memory 8.
[0031] The calibration modes is preferably made in a form of an
executable functional code associated with corresponding
calibration values store in , and as a module herein named
calibration module 8a shown in FIG. 1. The calibration procedure
preferably includes steps as follows.
[0032] Continuing with FIG. 3a, in step 302, the user starts
testing by starting a calibration check with a calibration mode
mostly used for a previous session of testing, i.e. for a light
element or heavy atomic element. "Cal check" is commonly referred
in XRF as shooting a sample of a known elemental composition.
[0033] In step 304, calibration module 8a checks from a calibration
shot on a calibration sample to determine whether the spacer is
applied, and to determine automatically what kind of spacer is
applied on front base plate 4. Alternatively, when the known kind
of element for testing (example: Si) is provided to the instrument,
module 8a can be configured to determine if spacer 6 is the right
match for such testing, noting that a lower atomic number needs a
thinner spacer. Alternative step 304 can be that calibration module
8a only checks if spacer 6 is applied or not, and prompts the user
to check if spacer 6 is the intended kind of spacer to be
attached.
[0034] It can be understood by those skilled in the art that after
the calibration check is initiated at step 302, the energy reading
on the known sample can indicate if spacer 6 is applied. And by
comparing the known calibration factors stored in the instrument,
optionally the calibration module 8a can yield what kind of spacer
is presently attached to the front base plate.
[0035] Continuing with FIG. 3a, in step 306, calibration module 8a
prompts the user via display 14 whether spacer 6 is applied, what
kind of spacer is applied on front base plate 4, and whether to
change or remove spacer 6, or alternatively change the calibration
mode.
[0036] In step 308, module 8a further checks which spacer (or no
spacer) is chosen by the user. If a specific spacer is chosen, the
procedure moves onto step 312. If no spacer is chosen, the
procedure moves onto step 310. In step 412, a specific calibration
mode suited for the chosen spacer is chosen by calibration module
8a, and executed by XRF instrument 10. Alternatively, the user can
also choose the calibration mode via display 14.
[0037] In step 310, if the user determines not to use any spacer
and remove the same, the existing calibration mode for front base
plate 4 without spacer 6 is executed to calibrate instrument 10. In
step 312, XRF instrument 10 is ready for testing, which occurs in
step 314.
[0038] Reference is now made to FIG. 3b with continued reference to
FIG. 1, where alternatively a user can calibrate XRF instrument 10
manually. In step 301, the user starts a "cal check" test. In step
303, if it is needed to choose a cal mode for spacer. If the user
knows a spacer is attached, the user enters "yes". Otherwise the
user enters "No", and the procedure moves onto step 305a. Upon
choosing "yes", in step 305 the user enters a calibration mode
corresponding to the specifically know spacer that is attached. In
step 307, the chosen cal mode corresponding to the spacer is
executed. The instrument is then ready for testing with the
specific spacer on in step 309.
[0039] Reference is now made to FIGS. 4a, 4b and 4c, and
continuously to FIG. 1, where more details of the preferred
embodiment of spacer 6 are provided. Referring to FIG. 4a, which is
a top view of spacer 6, screw holes 24 are preferably aligned with
those of front base plate 4. The size, contour and shape of spacer
6 should also be very close to the corresponding part of front base
plate 4. Cross-sectional views FIGS. 4b and 4c also exhibit the
screw holes and the design of spacer 6. The thickness of spacer 6
exhibited in FIGS. 4b and 4c is exemplary and variations in
thickness are within the scope of the present disclosure.
[0040] In addition to screws used in FIGS. 4a, 4b and 4c, it should
be understood by those skilled in the art that other means can be
used instead to attach and re-attach spacer 6 onto front base plate
4 of XRF instrument 10 (as well as their associated usage of
corresponding calibration modes), and should all be within the
scope of the present disclosure.
* * * * *