U.S. patent application number 14/281315 was filed with the patent office on 2014-09-11 for methods, devices and kits for peri-critical reflectance spectroscopy.
This patent application is currently assigned to Rare Light, Inc.. The applicant listed for this patent is Rare Light, Inc.. Invention is credited to Robert G. Messerchmidt.
Application Number | 20140252233 14/281315 |
Document ID | / |
Family ID | 41265240 |
Filed Date | 2014-09-11 |
United States Patent
Application |
20140252233 |
Kind Code |
A1 |
Messerchmidt; Robert G. |
September 11, 2014 |
METHODS, DEVICES AND KITS FOR PERI-CRITICAL REFLECTANCE
SPECTROSCOPY
Abstract
Spectroscopy apparatuses oriented to the critical angle of the
sample are described that detecting the spectral characteristics of
a sample wherein the apparatus consists of an electromagnetic
radiation source adapted to excite a sample with electromagnetic
radiation introduced to the sample at an angle of incidence at or
near a critical angle of the sample; a transmitting crystal in
communication with the electromagnetic radiation source and the
sample, the transmitting crystal having a high refractive index
adapted to reflect the electromagnetic radiation internally; a
reflector adapted to introduce the electromagnetic radiation to the
sample at or near an angle of incidence near the critical angle
between the transmitting crystal and sample; and a detector for
detecting the electromagnetic radiation from the sample. Also,
provided herein are methods, systems, and kits incorporating the
peri-critical reflectance spectroscopy apparatus.
Inventors: |
Messerchmidt; Robert G.;
(Los Altos, CA) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Rare Light, Inc. |
Mountain View |
CA |
US |
|
|
Assignee: |
Rare Light, Inc.
Mountain View
CA
|
Family ID: |
41265240 |
Appl. No.: |
14/281315 |
Filed: |
May 19, 2014 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
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12865698 |
Jul 30, 2010 |
8730468 |
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PCT/US09/32706 |
Jan 30, 2009 |
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14281315 |
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61025737 |
Feb 1, 2008 |
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Current U.S.
Class: |
250/338.4 ;
250/339.11 |
Current CPC
Class: |
G01N 21/552 20130101;
G01N 2201/0221 20130101; G01N 21/43 20130101 |
Class at
Publication: |
250/338.4 ;
250/339.11 |
International
Class: |
G01N 21/55 20060101
G01N021/55 |
Claims
1-20. (canceled)
21. A method for detecting the spectral characteristics of a
sample, comprising: placing a sample in proximity to a crystal;
serially introducing electromagnetic radiation from an
electromagnetic radiation source to the crystal at a plurality of
angles such that the electromagnetic radiation intersects a
measurement site of the sample through a crystal at a plurality of
angles of incidence, wherein the angles of incidence are
incrementally changed between each introduction of the
electromagnetic radiation; detecting a reflected electromagnetic
radiation from the sample at the plurality of angles of incidence
with a detector; and generating an angular map of the sample,
wherein the angular map comprises a mapping of reflected
electromagnetic radiation intensity relative to the plurality of
angles of incidence.
22. The method of claim 21, wherein the step of introducing the
electromagnetic radiation comprises introducing the electromagnetic
radiation at a first angle of incidence; and incrementally
increasing the angles of incidence of electromagnetic radiation
delivered to the sample to approach a second angle of
incidence.
23. The method of claim 21, wherein the step of introducing the
electromagnetic radiation comprises introducing the electromagnetic
radiation at a first angle of incidence; and incrementally
decreasing the angles of incidence of electromagnetic radiation
delivered to the sample to approach a second angle of
incidence.
24. The method of claim 21, further comprising the step of
determining a critical angle between the crystal and the
sample.
25. The method of claim 21, further comprising the step of
determining a depth of penetration of an evanescent wave into the
sample at the plurality of angles.
26. The method of claim 25, further comprising the step of
generating a depth spectrum of evanescent wave absorption.
27. The method of claim 21, wherein the step of generating the
angular map further comprises plotting reflected electromagnetic
radiation versus wavelength relative to a mapping of the angles of
incidence.
28. The method of claim 21, further comprising the step of
comparing the reflected electromagnetic radiation to a database of
critical angle measurements.
29. The method of claim 26, further comprising the step of
displaying a detected electromagnetic radiation parameter and one
or more critical angle measurements from the database.
30. The method of claim 21, wherein the step of emitting
electromagnetic radiation from an electromagnetic radiation source
further comprises collimating the electromagnetic radiation to have
a beam divergence of one millidegree or less.
31. The method of claim 21, wherein the step of introducing the
collimated beam further comprises introducing the collimated beam
to the sample through the crystal with an angular resolution of one
millidegree or better.
32. The method of claim 21, further comprising the step of imaging
the reflected electromagnetic radiation onto a detector area less
than 1 mm.sup.2.
33. The method of claim 21, further comprising the step of
modulating the electromagnetic radiation prior to introducing the
electromagnetic radiation to the sample.
34. The method of claim 31, further comprising the step of focusing
the modulated electromagnetic radiation onto a reflector, wherein
the reflector is adapted to introduce the electromagnetic radiation
to the sample.
35. A system comprising: at least one processor; and a
computer-readable medium storing one or more sequences of
instructions which, when executed by the at least one processor,
causes: serially introducing electromagnetic radiation from an
electromagnetic radiation source to a crystal at a plurality of
angles such that the electromagnetic radiation intersects a
measurement site of the sample through a crystal at a plurality of
angles of incidence, wherein the angles of incidence are
incrementally changed between each introduction of the
electromagnetic radiation; detecting a reflected electromagnetic
radiation from the sample at the plurality of angles of incidence
with a detector; and generating an angular map of the sample,
wherein the angular map comprises a mapping of reflected
electromagnetic radiation intensity relative to the plurality of
angles of incidence.
36. The system of claim 35, wherein the instructions that cause
introducing the electromagnetic radiation comprises instructions
that cause introducing the electromagnetic radiation at a first
angle of incidence; and incrementally increasing the angles of
incidence of electromagnetic radiation delivered to the sample to
approach a second angle of incidence.
37. The system of claim 35, wherein the instructions that cause
introducing the electromagnetic radiation comprises instructions
that cause introducing the electromagnetic radiation at a first
angle of incidence; and incrementally decreasing the angles of
incidence of electromagnetic radiation delivered to the sample to
approach a second angle of incidence.
38. The system of claim 35, wherein the instructions that cause
generating the angular map further comprises instructions that
cause plotting reflected electromagnetic radiation versus
wavelength relative to a mapping of the angles of incidence.
39. The system of claim 35, further comprising instructions which,
when executed by the at least one processor, causes determining a
depth of penetration of an evanescent wave into the sample at the
plurality of angles.
40. The system of claim 35, further comprising instructions which,
when executed by the at least one processor, causes comparing the
reflected electromagnetic radiation to a database of critical angle
measurements.
Description
CROSS-REFERENCE
[0001] This application claims the benefit of U.S. Provisional
Application No. 61/025,737, filed Feb. 1, 2008, which application
is incorporated herein by reference.
BACKGROUND OF THE INVENTION
[0002] Internal reflection spectroscopy, also known as Attenuated
Total Reflectance (ATR) spectroscopy, has been know for many years,
and is a widely used method of sampling in infrared (IR) and
fluorescence spectroscopy, as well as in other spectroscopies.
Mid-wavelength infrared (MWIR), or intermediate infrared (IIR),
spectroscopy has over the years become a technique of choice when
specificity is of utmost importance. It has historically been a
difficult technique to use for several reasons. First,
absorptivities of many materials are quite high in the
mid-wavelength infrared region of the electromagnetic spectrum
(e.g., from about 3-8 .mu.m) While this is good from the standpoint
of sensitivity, it makes sampling sometimes complex. As a result, a
wide variety of sampling technologies have been developed to help
introduce the sample to the spectrometer in an ideal fashion. A
ubiquitous and problematic sample component is water. In the
near-infrared (NIR) region, using wavelengths from about 800 nm to
2500 nm, another problem that can arise is the fact that the path
length may be too short. One advantage is that near-infrared can
typically penetrate much farther into a sample than mid infrared
radiation.
[0003] One problem faced when using spectroscopy is the fact that
many sample preparations contain water. Water has a very high
absorbance in the mid-infrared. Therefore, in order to measure a
spectrum of water in the classical mid-infrared region of 4000-400
cm .sup.-1, the path length must be limited to less than a few 10 s
of microns. ATR can provide this very small path length needed. In
other situations however, the path length of ATR is too small for
ideal sampling. This can be the main problem when trying to make
measurements through mammalian skin or other biological tissue, or
when the desired spectral information is from a deeper depth and
not adjacent the surface of the mammalian skin.
[0004] Attenuated Total Reflectance (ATR) is often indicated in
difficult sampling situations. The spectroscopic usefulness of the
effect was first noticed in the 1960s by Fahrenfort and is
predictable from basic optical physics. Basically, when light
propagates through a medium of high refractive index and approaches
an interface with a material of lower refractive index, a
transmission and a reflection will occur. The relative strengths of
these transmissions and reflections are governed by the Fresnel
equations:
r .perp. .ident. E r E i = n 1 .mu. 1 cos .theta. - n 2 .mu. 2 cos
.theta. ' n 1 .mu. 1 cos .theta. + n 2 .mu. 2 cos .theta. ' ( 1 ) t
.ident. E t E i = 2 n 1 .mu. 1 cos .theta. n 1 .mu. 1 cos .theta. +
n 2 .mu. 2 cos .theta. ' ( 2 ) r || .ident. E r E i = n 2 .mu. 2
cos .theta. - n 1 .mu. 1 cos .theta. ' n 1 .mu. 1 cos .theta. ' + n
2 .mu. 2 cos .theta. ( 3 ) t || .ident. E t E i = .mu. 1 n 1 .mu. 1
cos .theta. ' + n 2 .mu. 2 cos .theta. ( 4 ) ##EQU00001##
The Fresnel equations give the ratio of the reflected and
transmitted electric field amplitude to initial electric field for
electromagnetic radiation incident on a dielectric.
[0005] In general, when a wave reaches a boundary between two
different dielectric constants, part of the wave is reflected and
part is transmitted, with the sum of the energies in these two
waves equal to that of the original wave. Examination of these
equations reveals that when the light is traversing through a high
index medium and approaching an interface with a low index medium,
the reflected component can be total, with no light being
transmitted. The angle at which this occurs is called the critical
angle and is defined by the following equation (5):
.theta. C = sin - 1 ( n 2 n 1 ) ( 5 ) ##EQU00002##
[0006] The reflected component has an angle of reflection equal and
opposite to the angle of incidence upon the interface. Above the
critical angle, all light is reflected. Below the critical angle,
some light would transmit through the interface according to the
above Fresnel equations. A device operating in this mode would use
light that refracts according to Snell's Law (equation (6)):
n.sub.1 sin .theta.=n.sub.2 sin .theta.' (6)
[0007] As previously stated, above the critical angle reflection is
total. Fahrenfort first noticed that upon total reflection, a
standing, or evanescent, wave is set up at the interface between
high and low index. The wave has an exponentially decaying
intensity into the rarer (lower index) medium. If an absorbing
substance is placed in the vicinity of this evanescent (standing)
wave, which extends a distance into the rarer medium, it can absorb
portions of the light in specific wavelengths corresponding to the
absorption properties of the material. In this way, the total
reflection is said to be "frustrated" by the absorption of the
sample. The returning light at the detector then is evaluated to
determine the missing energy. It follows that this mode can be used
to obtain an infrared spectrum of a material in contact with the
high index medium through which the light is traveling. The
strength of this interaction can be predicted through several
equations developed by Harrick. First, the depth of penetration is
defined as the 1/e point of the exponential decay of the evanescent
(standing) wave (equation (7)):
d p = .lamda. / n 1 2 .pi. ( sin 2 .theta. - ( n 2 n 1 ) 2 ) 1 2 (
7 ) ##EQU00003##
where n.sub.2 is the sample refractive index and n.sub.1 is the
crystal refractive index. The depth of penetration is defined as
the point at which the strength of the evanescent wave electric
vector decays to a value of 1/e (where e is Euler's number) from
its original strength. Quick calculations are often done using the
depth of penetration to characterize the strength of signal that
will be obtained with ATR. The quick calculations may be less
accurate but are suitable for providing a guide. A more accurate
equation for the point where the evanescent wave electric vector
decays was derived by Harrick, namely the effective thickness or
effective depth, d.sub.e.
[0008] An additional complication arises if the sample is thin
compared to the 1/e point of the evanescent wave. The effective
thickness calculation results in a number that can be used in
Beer's Law calculations, and is closely related to the path length
in a transmission measurement made at normal incidence. There are
now three refractive indices to worry about: n.sub.1, the index of
the crystal, n.sub.2, the index of the thin layer of sample, and
n.sub.3, the index of whatever is beyond the sample, usually air.
Also, since the geometry is usually not near-normal, the
calculation must be done for three orthogonal axes. Finally, the
measurement is polarization dependent and should be calculated for
two orthogonal polarizations. For purposes of this discussion, the
thin layer is assumed to by isotropic and the polarization is
deemed to be random. So the effective depth equation, for thin
layers of sample where the sample layer thickness is much less than
the depth of penetration, is as follows:
d e = 1 cos .theta. n 2 n 1 d p 2 E 02 r 2 ( exp ( - 2 z i d p ) -
exp ( - 2 z f d p ) ) ( 8 ) ##EQU00004##
where the z values are the initial and final z-dimension positions
of the film relative to the surface of the ATR prism. The E term is
the square of the strength of the electric vector in medium 2 E is
proportional to light intensity. For polarized incident light
E.sub.02,.parallel..sup.r2=E.sub.02,x.sup.r2+E.sub.02,z.sup.r2
(9)
and
E.sub.02,.perp..sup.r2=E.sub.02,y.sup.r2 (10)
and this results in
d.sub.e,.parallel.=d.sub.ex+d.sub.ez (11)
and
d.sub.e,.perp.=d.sub.ey (12)
and
d.sub.e,random=(d.sub.e,.perp.+d.sub.e,.parallel.)/2 (13)
[0009] The three orthogonal electric field components are
calculated from Fresnel's equations:
E 0 x , 2 r = 2 cos .theta. ( sin 2 .theta. - n 31 2 ) 1 / 2 ( 1 -
n 31 2 ) 1 / 2 [ ( 1 + n 31 2 ) sin 2 .theta. - n 31 2 ] 1 / 2 ( 14
) E 0 z , 2 r = 2 cos .theta.sin .theta. n 31 2 ( 1 - n 31 2 ) 1 /
2 [ ( 1 + n 31 2 ) sin 2 .theta. - n 31 2 ] 1 / 2 and ( 15 ) E 0 y
, 2 r = 2 cos .theta. ( 1 - n 31 2 ) 1 / 2 ( 16 ) ##EQU00005##
[0010] In the equations immediately above, a thin film
approximation is used, in order to greatly simplify the calculation
of the field strength. As previously mentioned, Harrick proposed
this approximation. The requirement to use this approximation is
that the film must be very thin relative to the depth of
penetration if the sample were infinitely thick. The depth of
penetration for a thick film at 6 .mu.m measuring wavelength would
be 2.32 .mu.m. A monolayer of anthrax spores, for example, would
have a thickness of approximately 0.4 .mu.m, so the thin film
approximation is valid for early detection and identification of
anthrax spores deposited onto an ATR prism. The values used in the
above equations are as follows: n.sub.1=2.2, n.sub.2=1.5,
n.sub.3=1.0, .theta.=45.degree., z.sub.i=0. and z.sub.f=0.4 .mu.m.
Calculated values for the field strength are as follows:
E.sub.0x,2.sup.r=1.37, E.sub.0z,2.sup.r=0.79, and
E.sub.0y,2.sup.r=1.60. Calculated effective path for each vector
are d.sub.ex.sup.iso=0.45 .mu.m, d.sub.ey.sup.iso=0.62 .mu.m,
d.sub.ez.sup.iso=0.15 .mu.m, d.sub.e,.parallel..sup.iso=0.60 .mu.m,
d.sub.e,.perp..sup.iso=0.62 .mu.m, and d .sub.e,random.sup.iso=0.61
.mu.m. The final value for effective thickness is therefore 0.61
.mu.m.
[0011] A single reflection through the ATR system modeled here
would give rise to a signal (at 6 .mu.m wavelength) that is
comparable to a layer of spores measured in transmission that is
0.6 .mu.m thick, assuming a spore monolayer with a thickness of 0.4
.mu.m. So the ATR technique, even in a single reflection, gives
rise to a spectrum with 1.5.times. the strength of a transmission
measurement. This figure can be increased dramatically by using
multiple reflections, making ATR infrared an excellent identifier
of biological warfare agents such as anthrax.
[0012] Other concepts relating to ATR spectroscopy are disclosed
in, for example, U.S. Pat. No. 6,908,773 to Li et al. for ATR-FTIR
Metal Surface Cleanliness Monitoring; U.S. Pat. No. 7,218,270 to
Tamburino for ATR Trajectory Tracking System (A-Track); U.S. Pat.
No. 6,841,792 to Bynum et al. for ATR Crystal Device; U.S. Pat. No.
6,493,080 to Boese for ATR Measuring Cell for FTIR Spectroscopy;
U.S. Pat. No. 6,362,144 to Berman et al. for Cleaning System for
Infrared ATR Glucose Measurement System (II); U.S. Pat. No.
6,141,100 to Burka et al. for Imaging ATR Spectrometer; U.S. Pat.
No. 6,430,424 to Berman et al. for Infrared ATR Glucose Measurement
System Utilizing a Single Surface of Skin.
[0013] An often overlooked benefit of the ATR sampling mode for
detecting and classifying samples, however, is the immunity to the
effects of scatter. Harrick notes that the ATR mode, unlike
transmission or regular reflectance, removes the effect of light
scatter. Even if a sample is granular in nature, a situation that
normally would give rise to light scattering, the ATR spectrum will
maintain a flat baseline. This means that different preparations of
the same sample can be more similar to each other, and therefore
easier to classify in the same group. If there exists real chemical
differences between two samples, the differences are more easily
discerned because the sample morphology, preparation, and packing
are removed as variables. An advantage of ATR, often overlooked, is
its immunity to the effects of scatter. A "perfect" infrared
spectrum would contain only information related to the molecular
structure of the sample. Sampling artifacts almost always are
superimposed on this pure spectrum. However ATR can remove some of
the differences due to sample scatter, improving the ability to
identify and classify a sample. This can be a huge advantage in the
area of tissue spectroscopy.
[0014] An interesting recurring theme in the spectroscopy
literature is the admonition to stay away from the critical angle
(Internal Reflection Spectroscopy: Theory and Applications, Francis
M. Mirabella, CRC Press, 1993) because spectral distortions will
result. This was noted early on in the seminal book by Harrick, and
has been repeated many times since. The basis for this warning is
seen in the depth of penetration equations listed above. As the
angle of incidence gets smaller and approaches the critical angle,
the depth of penetration of the evanescent wave into the rarer
medium gets larger and larger, up until the critical angle, at
which point the total internal reflection condition no longer
holds. Below the critical angle, internal reflectance turns into
the much more common and much less useful external reflectance.
External reflectance is also governed by the laws of Fresnel
reflection, but the resulting reflection is no longer total. In
external reflection, it is not possible to couple a large
efficiency of energy back into the ATR prism and subsequently to
the detector.
[0015] For many samples, it would be desirable to have a large
depth of penetration into the sample. This could be achieved by
introducing electromagnetic energy very close to a critical angle
for the sample. In most spectrometers, the light beam has a
significant angular dispersion, in order to fill the detector and
obtain high signal-to-noise ratio (SNR). However, because there is
much angular dispersion, as the critical angle is approached, a
portion of the beam starts to exceed the critical angle, while
another portion of the beam is still at an angle that is well away
from the critical angle. In addition, in most samples there is
dispersion in the refractive index across the spectral region of
interest, and so the critical angle is different for different
wavelengths. So these factors require the average angle to often be
several degrees away from the critical angle.
[0016] It can be readily seen that the depth of penetration into
the rarer medium can actually become quite large. There are many
applications in which a larger depth of penetration would be
desirable. The non- invasive measurement of body constituents is
amongst these. The teaching, repeated many times in the literature,
is that ATR can not have a large path length and can not have a
large depth of penetration, because distortions of the spectrum
occur near the critical angle. This problem could be overcome by
the use of a highly collimated beam of light. Light sources are now
available that can be highly collimated, yet still contain
excellent amounts of energy. Many lasers such as quantum cascade
lasers and light emitting diode (LED) sources are now available
that can be highly collimated and still contain large amounts of
energy. But this is not a complete solution to the problem.
[0017] Another problem that needs to be overcome is the fact that
most samples themselves exhibit wavelength dispersion in their
refractive index. If useful spectroscopic information about a
sample is desired, whether by fluorescence, near infrared,
terahertz, or some other spectroscopy, the signal should be
collected over some range of wavelengths. It will almost certainly
be true that over the wavelength range of interest, the critical
angle will vary with wavelength. The critical angle will even
change within the same sample depending on various characteristics
of the sample, such as the sample morphology or the physical state
of the sample. Therefore it is very difficult, if not impossible to
know, a priori, where the critical angle will lie, for a given
sample at a given wavelength. What is needed is an added dimension
to the ATR measurement, namely that of a mapping of not only
intensity versus wavelength, but of intensity versus wavelength
versus angle of incidence and/or reflection.
[0018] An ATR sampler can be designed that allows for multiple
reflections. Multiple reflections thereby multiply the strength of
the infrared spectrum. The number of reflections can be adjusted to
arrive at an optimum effective path length to give the highest
possible signal-to-noise ratio. The apparatuses and methods
described here provides for measurements that are at least one, and
probably two, orders of magnitude more sensitive than making the
measurement in a transmission mode or a traditional ATR mode. In
order to successfully map the angular space of interest, it would
be desirable to cross over the critical angle and also collect data
below the critical angle. This data could be useful in determining
a true critical angle for each wavelength.
SUMMARY OF THE INVENTION
[0019] An aspect of the invention is directed to an apparatus for
detecting the spectral characteristics of a sample. The apparatus
comprises an electromagnetic radiation source adapted to excite a
sample with electromagnetic radiation; a crystal or prism in
communication with the electromagnetic radiation source and the
sample, the crystal or prism having a high refractive index adapted
to reflect the electromagnetic radiation; a reflector adapted to
introduce the electromagnetic radiation to the sample at an angle
of incidence at or near a critical angle between the crystal or
prism and the sample; and a detector for detecting an
electromagnetic radiation from the sample. Additionally the
components of the apparatus can be configured to be contained
within a housing. Suitable detectors for the apparatus include, but
are not limited to, a single element detector, such as a mercury
telluride detector, a linear array detector, and a 2-dimensional
array detector. The electromagnetic radiation source can be adapted
to deliver an electromagnetic radiation to the sample at an angle
of incidence which is at or below the critical angle. In other
configurations, the electromagnetic radiation delivered to the
sample can be delivered such that it approaches and passes the
critical angle. In other configurations, the radiation is delivered
at an angle at or above the critical angle. This radiation can also
be adjusted to be delivered in such a way that it approaches and
passes the critical angle. Data processors can also be provided
that are in communication with the detector. The data processors
can be configured such that the data processor receives information
from any of the components of the system and then generates a
critical angle map of the sample from one or more electromagnetic
radiation detections received by the detector from the sample.
Suitable electromagnetic radiation sources include, for example, a
quantum cascade laser. In some configurations, the apparatus is
adapted to collimate the radiation. The apparatuses are
configurable to be housed in an area less than 1 cubic foot in
volume, less than 125 cubic inches in volume, and less than 8 cubic
inches in volume. Suitable configurations are also adapted to be
handheld. In other configurations, a display screen is provided.
The display screen can be adapted and configured to display
information useful to a user including, for example, the critical
angle map. The data processor can be adapted to generate a full map
of reflected light intensity versus wavelength versus a mapping of
the angle of incidence from the detected electromagnetic radiation.
Moreover, in some aspects, a drive mechanism can be provided. The
drive mechanism can be adapted to pivot the crystal or prism about
an axis. A cooler can also be provided. A cooler would be useful
for cooling the detector. Additionally one or more filters can be
provided and one or more lenses can be provided. Lenses can be
configured to image the electromagnetic radiation onto a detector
less that 1 mm squared.
[0020] Another aspect of the invention is directed to a method for
detecting the spectral characteristics of a sample. The method
comprises, for example, placing a sample in proximity to a crystal
or prism; emitting an electromagnetic radiation from an
electromagnetic radiation source through the crystal or prism;
introducing the electromagnetic radiation to the sample through the
crystal or prism at an angle of incidence at or near a critical
angle of the sample; and detecting an electromagnetic radiation
from the sample. Additionally, the method can include the steps of
introducing the electromagnetic radiation at an angle of incidence
below the critical angle; and increasing the angle of incidence of
the electromagnetic radiation incrementally whereby the angle of
incidence approaches and passes the critical angle. In some aspects
of the method, the method can include the steps of introducing the
electromagnetic radiation at an angle of incidence above the
critical angle; and decreasing the angle of incidence of the
electromagnetic radiation incrementally whereby the angle of
incidence approaches and passes the critical angle. Additionally,
the method can comprise or more steps of generating a full map of
reflected light intensity versus wavelength versus a mapping of the
angle of incidence; displaying a generated map; comparing the
detected electromagnetic radiation to a database of critical angle
measurements; displaying a detected electromagnetic radiation
parameter and one or more critical angle measurements from the
database; filtering the electromagnetic radiation; pivoting the
crystal or prism about an axis; cooling the detector; and imaging
the electromagnetic radiation onto a detector area less than 1
mm.sup.2.
[0021] Still another aspect of the invention is directed to a
system for detecting the spectral characteristics of a sample. The
system comprises, for example, an electromagnetic radiation source;
a crystal or prism in communication with the electromagnetic
radiation source and the sample, the crystal or prism having a high
refractive index adapted to reflect the electromagnetic radiation
internally; and a detector for detecting an electromagnetic
radiation from the sample. Additionally the components of the
system can be configured to be contained within a housing. Suitable
detectors for the system include, but are not limited to, a single
element detector, such as a mercury telluride detector, a linear
array detector, and a 2-dimensional array detector. The
electromagnetic radiation source can be adapted to deliver an
electromagnetic radiation to the sample at an angle of incidence
which is at or below the critical angle. In other configurations,
the electromagnetic radiation delivered to the sample can be
delivered such that it approaches and passes the critical angle. In
other configurations, the radiation is delivered at an angle at or
above the critical angle. This radiation can also be adjusted to be
delivered in such a way that it approaches and passes the critical
angle. Data processors can also be provided that are in
communication with the detector. The data processors can be
configured such that the data processor receives information from
any of the components of the system and then generates a critical
angle map of the sample from one or more electromagnetic radiation
detections received by the detector from the sample. Suitable
electromagnetic radiation sources include, for example, a quantum
cascade laser. In some configurations, the system is adapted to
collimate the radiation. The systems are configurable to be housed
in an area less than 1 cubic foot in volume, less than 125 cubic
inches in volume, and less than 8 cubic inches in volume. Suitable
configurations are also adapted to be handheld. In other
configurations, a display screen is provided. The display screen
can be adapted and configured to display information useful to a
user including, for example, the critical angle map. The data
processor can be adapted to generate a full map of reflected light
intensity versus wavelength versus a mapping of the angle of
incidence from the detected electromagnetic radiation. Moreover, in
some aspects, a drive mechanism can be provided. The drive
mechanism can be adapted to pivot the crystal or prism about an
axis. A cooler can also be provided. A cooler would be useful for
cooling the detector. Additionally one or more filters can be
provided and one or more lenses can be provided. Lenses can be
configured to image the electromagnetic radiation onto a detector
less that 1 mm squared.
[0022] Kits are also contemplated as an aspect of the invention.
Suitable kits for detecting the spectral characteristics of a
sample, include, for example, an electromagnetic radiation source;
and a crystal or prism in communication with the electromagnetic
radiation source and the sample, the crystal or prism having a high
refractive index adapted to reflect the reflect the electromagnetic
radiation. The kits can also include other components, including,
but not limited to one or more detectors, filters and/or
lenses.
Incorporation by Reference
[0023] All publications, patents and patent applications mentioned
in this specification are herein incorporated by reference to the
same extent as if each individual publication, patent or patent
application was specifically and individually indicated to be
incorporated by reference.
BRIEF DESCRIPTION OF THE DRAWINGS
[0024] The novel features of the invention are set forth with
particularity in the appended claims. A better understanding of the
features and advantages of the present invention will be obtained
by reference to the following detailed description that sets forth
illustrative embodiments, in which the principles of the invention
are utilized, and the accompanying drawings of which:
[0025] FIG. 1 is a graph showing the correlation between incident
angle and the depth of penetration;
[0026] FIG. 2 is an illustration of a peri-critical reflectance
spectroscopy system;
[0027] FIG. 3 is an illustration of a peri-critical reflectance
spectroscopy system;
[0028] FIG. 4 is an illustration of a peri-critical reflectance
spectroscopy system showing imaging capability;
[0029] FIG. 5 is graph illustrating different effects achievable by
changing an angle of incidence during spectroscopy;
[0030] FIG. 6 is an illustration of another peri-critical
reflectance spectroscopy system wherein multiple reflections are
achievable;
[0031] FIG. 7 illustrates a mechanism for changing an angle in a
peri-critical reflectance spectroscopy system;
[0032] FIG. 8 illustrates a 45 degree prism moving through various
angles of incidence; and
[0033] FIG. 9 illustrates an overview of a complete sampling system
for spectroscopy.
DETAILED DESCRIPTION OF THE INVENTION
[0034] This invention therefore is directed toward the creation of
devices and systems that generate a critical angle map of a sample
in addition to a spectral absorption map. The invention provides an
added dimension to the ATR measurement, by providing mapping of not
only intensity versus wavelength, but of intensity versus
wavelength versus angle of incidence and/or intensity versus
wavelength versus angle of incidence reflection. The devices and
systems can be configured such that one or more elements or
components are formed integrally to achieve a desired
physiological, operational or functional result such that the
components complete the device. This can be achieved by one or more
elements being integrally formed as a single piece or being formed
to act in a unified manner The region around the critical angle is
a peri-critical region. Techniques useful to probe the
peri-critical region include peri-critical reflectance spectroscopy
(PR).
[0035] Samples include, but are not limited to biological warfare
agent detection, non-invasive transcutaneous detection of glucose,
ethanol, cancel cells, and other medically relevant constituents,
biomarkers, drug components for new drug discovery, detection of
explosives and other harmful chemical agents, early detection of
infectious diseases, detection of trace chemical or biological
contaminants in drinking water, illegal drug detection, determining
the quality of industrial chemicals during production including
biofuels such as biodiesel and bioethanol, determining the progress
of reactions taking place in bioreactors, in vitro detecting and
quantifying constituents of blood such as glucose and creatinine
The maps are generatable with high angular resolution near the
critical angle for each wavelength. In most instances, the angular
resolution is at least a millidegree or better.
I. DEVICES AND METHODS
[0036] A peri-critical reflectance spectroscopy apparatus or
system, is adapted to provide a source of electromagnetic radiation
which can be introduced into a sample, such as those described
above. The electromagnetic radiation can be modulated, for example,
by an interferometer prior to contacting the sample. The modulated
radiation can also be focused by a lens onto a reflective surface,
such as a mirror, which then reflects the light into an ATR prism.
Furthermore, in some instances, the mirror can be adjusted so that
the electromagnetic radiation is introduced to the sample through a
range of angles which encompasses a target critical angle. In other
words, the electromagnetic radiation is introduced at an angle less
than the critical angle and is swept in increments through the
critical angle to an angle greater than the critical angle. The
mirror can be adjusted to change the angle at which the
electromagnetic radiation enters the sample. Alternatively the
electromagnetic radiation can be introduced directly to the ATR
prism. The electromagnetic radiation, once inside the ATR prism
then comes into contact with the sample. The electromagnetic
radiation then exits the prism and is detected by a detector and
processed by a data processing system.
[0037] The critical angle information obtained using the systems
and devices described herein is another dimension of information,
which is not now obtained with existing technology. A complete map
of a sample would therefore be a full map of reflected light
intensity versus wavelength versus a mapping of the angle of
incidence, at angles that approach and then in fact somewhat cross
over, the critical angle. An angular resolution of a few
millidegrees (a few microradians) is necessary, because, as
illustrated in FIG. 1, the depth of penetration is very sensitive
to the angle of incidence around the critical angle. Additionally,
a processor can be used with the apparatus to analyze the critical
angle data. Once an angular map of the sample is generated by, for
example, scanning the sample, the actual angle of the critical
angle for the each wavelength can be determined. A spectrum at each
wavelength at a constant effective depth can then be plotted.
[0038] FIG. 2 is an illustration of a peri-critical reflectance
spectroscopy system. A power source adapted and configured to
provide power to a source 108 for electromagnetic radiation or
light is adapted to deliver a light beam to an interferometer 116,
which separates the beam of light into two or more beams, such as
by means of reflection, and thereafter brings the rays together to
produce interference. Suitable power sources include, but are not
limited to, batteries. As will be appreciated by those skilled in
the art, the system can be contained within a suitably designed
housing or the components can be configured such that the
components function as a housing. The resulting beam 110 then
passes through a lens 150, after which it comes in contact with a
mirror 130. The mirror reflects the resultant beam 112 through a
prism 140 and towards a sample 102. A reflected second beam 114
passes back through the prism 140 where it is received by a
multi-element detector 160. The detector can be adapted and
configured to resolve an angle of incidence for the pixels to
achieve a resolution of a millidegree or better. The resolved
pixels are then analyzed using a suitable data processing device or
computer. The analysis can include, for example, comparing the data
against a library of data to determine a variance of the detected
signal to a known sample. Additionally, the system can include a
display, such as a liquid crystal display (LCD), adapted to provide
a display to a user of the full map of reflected light intensity
versus wavelength versus a mapping of the angle of incidence. As
will be appreciated by those skilled in the art, connectivity can
also be provided which enables the system to sent the information
to a printer, or a network. Connectivity can be, for example,
wirelessly via the internet as well as via suitable connection
ports.
[0039] As will be appreciated by those skilled in the art, it is
not always necessary to measure each angle discretely. The
peri-critical reflectance spectroscopy apparatus or system can be
constructed as shown in FIG. 3. In FIG. 3, the spectroscopy
apparatus 100 is set-up such that the electromagnetic radiation is
introduced by a beam 110 to a sample 102 using a mirror 130, such
as a tilt/shift mirror having a 0.001 degree resolution. The beam
110 can be delivered to the sample 102 after being passed through a
spatial filter 120. Passing the beam 110 through the filter 120 can
result in a beam divergence, typically 0.001 degree. After passing
through the filter 120, the divergence beam 122 comes in contact
with a tilt shift mirror 130 which deflects the beam through a
peri-critical reflectance (PR) crystal 140 into the sample 102.
Suitable samples can, for example, have a same area as low as 1-10
mm in diameter. After the beam comes in contact with the same, a
resulting beam 112 is reflected. The resultant beam 112 can then
pass back through the PR crystal 140 to contact a second tilt/shift
mirror 130' which transmits the resultant beam 112 through a lens
150 and into a small area single element mercury cadmium telluride
(MCT) detector 160.
[0040] A peri-critical reflectance (PR) spectroscopy instrument
configured as shown in FIG. 3 can include a spatial filter 120 of
variable size that allows the infrared (IR) beam having one or more
wavelengths from 750 nm to 1000 .mu.m to be collimated to a desired
angular resolution. The resulting collimated beam has nearly
parallel rays. As a result of collimating, a beam divergence of 1
millidegree is achievable. Launch mirrors 130, 130' can then be
configurable such that the mirrors can tilt and shift to vary the
angle of incidence on the sample. For example, the angle can be
varied in order to cross over a critical angle for all wavelengths.
A lens 150 can then be configured to image the spatial filter onto
a very small detector area 162. Suitable areas include areas less
than 1 mm.sup.2, less than 0.01 mm.sup.2, and more preferably less
than 0.001 mm.sup.2 The small area detector enables sensitivity
improvement in systems that are limited by detector noise that
usually dominate during experiments in the mid-infrared
spectroscopy range.
[0041] The system can also be adapted and configured such that the
mirror remains stationary relative to the sample. In such cases an
electromagnetic radiation source with a less collimated beam of
energy can be used. Instead of sweeping the beam through a range of
angles, the angular measurements can be made using a multiplicity
of detectors (arrays) in such a manner such that each detector
pixel element senses a progressively smaller (or larger) angle,
such angle to include the critical angle at all wavelengths of
interest. This detector array is deployed after the sample and
needs to be only a linear array of detector elements. Since it is
often not possible to know beforehand what the critical angle will
be at all of the wavelengths of interest, a detector containing a
large number of pixels can be used. Otherwise, as previously
described, the entire critical angle space could be mapped by
sweeping the beam through different segments or portions of the
total critical angle space in need of mapping.
[0042] In some instances the detector 160 can be cooled if desired
for better sensitivity. Cooling is achievable using a suitable
cooling apparatus, means for cooling, or material. For example,
cooling with liquid nitrogen may, in some instances, improve
sensitivity of the detector. Cooling typically involves decreasing
the temperature of the detector semiconductor material to the
temperature of liquid nitrogen and most preferably to the
temperature of liquid helium.
[0043] The beam generated by the system may be an output beam of a
Fourier Transform Infrared (FTIR) spectrometer. However, as will be
appreciated by those skilled in the art, a beam from a single or
series of quantum cascade (QC) lasers may also be used. In some
instances, selection of a beam type or source can improve the
portability of the devices or systems. Thus, for example, a system
less than 1 cubic foot in volume can be transported easily, and a
system less than 125 cubic inches in volume can be handheld, and a
system less than 8 cubic inches in volume may be concealed and
hidden from view. This scalability of size provides significant
advantages. Moreover, QC lasers can be highly collimated.
[0044] Alternative to using a multi-element detector, the angle of
incidence of the beam may be changed manually and successive scans
made. The input and the output angle may be changed together in
order to obtain a complete map of the spectral data at the entire
range of angle of incidences.
[0045] The angles interrogated should extend both above and below
the expected critical angle. This is because the critical angle
varies as a function of wavelength. The goal is to re-create a
spectrum as a constant and known degree of closeness to the
critical angle, or constant effective depth. In this manner,
spectral distortions normally associated with working too close to
the critical angle are completely obviated. It is now possible to
collect undistorted spectra, while working very close to the
critical angle. This allows the ATR method to have longer path
length and deeper penetration into the rarer medium (the sample
under test) than is possible using conventional methods. This will
be particularly important in non-invasive biological measurements
and many other measurements such as: detection of low levels of
biological warfare agents.
[0046] Turning to FIG. 4, an illustration of a peri-critical
reflectance spectroscopy system is provided showing imaging
capability. In this embodiment, the crystal 140/sample 102 surface
is imaged onto an Array MCT detector 160 instead of the spatial
filter, as illustrated above. The previous single element detector
is replaced with a one- or two-dimensional detector array, as
desired. A two-dimensional detector array can be adapted and
configured to collect hyperspectral data with one dimension of
wavelength, 2 dimensions of image and the further one dimension of
angle of incidence. Each of these dimensions can, as will be
appreciated by those skilled in the art, have thousands of data
points. The depth of profiling capability of this system and
technique allows for the creation of a three-dimensional spatial
profile of a sample volume with spectral information at each
spatial position. The multiple detectors have the effect of
reducing the time needed to collect a data set, directly in
proportion to the number of detector elements. Additionally a
sample 102 area of 1-10 mm in diameter can be used.
[0047] FIG. 5 is graph illustrating different effects achievable by
changing an angle of incidence during spectroscopy. Light rays are
launched with a high index, or dense medium. Well below the
critical angle (sub-critical), light refracts at the crystal/sample
interface and then mostly transmits into the sample itself as a
propagating wave. If the sample is scattering, then diffuse
reflectance (DR) is the result. Well above the critical angle
(super critical) light reflects totally and a weak standing or
evanescent wave is set up in the rare medium (sample). As a result,
no light waves propagate in the sample. The characteristics of the
resulting sample spectrum is consistent with attenuated total
reflectance (ATR) Immediately in the vicinity of the critical angle
(peri-critical), light becomes very sensitive to angle. At the
crystal/sample interface, three things happen: light reflects at
the negative critical angle, a strong evanescent wave is set-up in
the sample, and a traveling wave propagates in a direction parallel
to the crystal sample interface plane. This effect benefits
peri-critical reflectance (PR) spectroscopy. By resolving angles
accurately, to a millidegree, it is possible to map the
peri-critical region for all wavelengths and refractive indices
present in the given sample and crystal. The reflected PR beam
contains strong information about the sample and from deeper depths
into the sample than is possible by ATR.
[0048] Turning now to FIG. 6, an illustration of another
peri-critical reflectance spectroscopy system wherein multiple
reflections are achievable is provided. A beam 110 from an
electromagnetic radiation source passes through a negative lens 152
and hits a first mirror 132. The beam 110 is deflected from the
first mirror 132, forming a resultant beam 112. The resultant beam
112 then hits a second mirror 134 and forms a second resultant beam
114, which comes in contact with a peri-critical reflectance
crystal or prism 140. The second resultant beam passes through the
PR crystal from which it is then passes through a negative lens
154. Multiple reflections are achieved which are all at or near the
critical angle. A precision drive (not shown), or any suitable
means to move or rotate the platform, causes a platform to rotate
or move. The platform carries first mirror 132, second mirror 134,
and the PR crystal 140. The drive enables, for example, the
platform to pivot around a pivot point 144 situated at or near an
exit face 146 of the crystal 142. The negative lenses 152, 154
allow the instrument to be used in the sample compartment of many
FTIR spectrometers that have a focusing beam near the center of the
sample compartment. An example of a suitable FTIR device would be
any Thermo Nicolet FTIR (Thermo Fisher Scientific, Waltham Mass.).
The negative lenses collimate the beam, allowing angular resolution
of the resulting collimated beam. Beam divergence, can further be
limited by the J-stop (Jacquinot stop or field stop) inside the
spectrometer, usually near the source. The beam divergence of the
electromagnetic or IR beam is determined by an angular measurement
of an increase in beam diameter over a distance from the source, or
optical aperture.
[0049] As illustrated in FIG. 7, a mechanism for changing an angle
in a peri-critical reflectance spectroscopy system can be achieved.
A 45 degree prism 142 made of a high index crystal, such as zinc
selenide (ZnSe), can be used. The beam is launched in and out of
the bottom face 142' of the prism 142 such that a first beam 110
enters the bottom face 142' of the crystal and a second beam 110'
departs the bottom face 142' of the crystal parallel or
substantially parallel to the first beam 110. The internal
reflections of the beam occur at two facets of the prism following
the path illustrated by the dashed line. Thus the incoming first
beam 110 perpendicularly enters the bottom face 142' of the
crystal, hits a facet of the prism where it is deflected at an
angle of 90 degrees. The deflected beam then hits a second facet
within the prism where it is deflected a second time at an angle of
90 degrees. The second deflected beam 110' then exits
perpendicularly through the bottom face 142' of the crystal such
that the incoming first beam 110 and departing second beam 110' are
substantially parallel. The prism can be tilted about a pivot point
144. As a result of tilting the prism 142.sup.T around the pivot
point, the angle of incidence on one facet increases while the
angle of incidence on the other facet decreases. The sample under
test can be adjacent to, or adhered to, one facet or the other of
the prism. The input and output beams remain parallel to each other
as the prism tilts. The ability to tilt the crystal while retaining
parallel beams minimizes a need for realignment where there is an
angle change.
[0050] Turning now to FIG. 8, a 45 degree prism shown on a top line
moving through five separate sample angles of incidence (A-E). The
prism retains the parallel beams as shown in the bottom line and as
described above. Thus, an angular range of up to 10 degrees or more
can be useful in PR spectroscopy.
[0051] FIG. 9 illustrates an overview of a complete sampling system
for spectroscopy. The sampling system employs the previously
described 45 degree prism. In this configuration, a pivot point is
found that makes the input and output beams remain stationary
during crystal tilting. As will be appreciated by those skilled in
the art, the crystal is depicted with long facet and a short
facet.
II. KITS
[0052] Kits are also contemplated as an aspect of the invention.
Suitable kits for detecting the spectral characteristics of a
sample, include, for example, an electromagnetic radiation source;
and a crystal in communication with the electromagnetic radiation
source and the sample, the crystal having a high refractive index
adapted to reflect the reflect the electromagnetic radiation. The
kits can also include other components, including, but not limited
to one or more detectors, filters and/or lenses.
III. EXAMPLES
Example 1
Determining Blood Glucose Levels
[0053] The devices and methods described above can be uses to
detect levels of glucose. The skin surface of a patient can be
placed in proximity to the system. Thereafter, the skin is radiated
with an electromagnetic radiation beam through the transmitting
crystal. A beam is reflected back out and through the crystal. The
return beam carries with it information indicating the blood
glucose level in the user. The return beam can be analyzed using a
suitable word processor to provide, for example, a full map of
reflected light intensity versus wavelength versus a mapping of the
angle of incidence. This information can be correlated with other
biological parameter information. Additional the map can be
displayed on and LCD and/or communicated to a network.
Example 2
Non-Contact Inspection of Materials
[0054] Another application is in the area of non-contact
inspection. Normally with ATR, it is essential to create a very
intimate optical contact between the ATR crystal and the specimen
under test. Without this intimate contact, an intermediate layer,
usually air, must be considered in the refractive index and depth
calculations. With powders and other irregular samples, it is often
impossible to remove all of the air space. As a result, the
measurement is often unstable from one measurement to the next. The
other reason for intimate optical contact is that since the depth
of penetration is so small in ATR, the goal is to get the specimen
as close to the crystal as possible, where the evanescent field is
the strongest. With the present invention, it is possible to make
the depth of penetration much larger. Therefore we can get very
good spectra even when the specimen is not in physical contact with
the ATR crystal. The problem of instability in the region of the
evanescent field is thereby avoided. An excellent application of
this is in the area of non-contact inspection of materials,
especially when the material is moving, for instance on a
production line. A particular application in the non-contact
inspection field would be the examination of pharmaceutical tablets
on a production line.
REFERENCES
[0055] J. Fahrenfort, Spectrochim. Acta 17, 698 (1961).
[0056] Harrick, N. J., Internal Reflection Spectroscopy, New York:
Wiley Interscience, 1967.
[0057] Fringeli U P, Goette J, Reiter G, Siam M, and Baurecht D
(1998) Structural Investigations of Oriented Membrane Assemblies by
FTIR-ATR Spectroscopy. In Proceedings of the 11.sup.th
International Conference on Fourier Transform Spectroscopy.
[0058] Messerschmidt R G, Multiple Internal Reflectance
Spectroscopy System, U.S. Pat. No. 4,730,882 (1988).
[0059] While preferred embodiments of the present invention have
been shown and described herein, it will be obvious to those
skilled in the art that such embodiments are provided by way of
example only. Numerous variations, changes, and substitutions will
now occur to those skilled in the art without departing from the
invention. It should be understood that various alternatives to the
embodiments of the invention described herein may be employed in
practicing the invention. It is intended that the following claims
define the scope of the invention and that methods and structures
within the scope of these claims and their equivalents be covered
thereby.
* * * * *