U.S. patent application number 14/014395 was filed with the patent office on 2014-01-02 for capacitance sensing method.
This patent application is currently assigned to Novatek Microelectronics Corp.. The applicant listed for this patent is Novatek Microelectronics Corp.. Invention is credited to Tsen-Wei Chang, Ching-Ho Hung, Ching-Chun Lin, Yi-Liang Lin, Wing-Kai Tang, Jiun-Jie Tsai.
Application Number | 20140002115 14/014395 |
Document ID | / |
Family ID | 44341058 |
Filed Date | 2014-01-02 |
United States Patent
Application |
20140002115 |
Kind Code |
A1 |
Lin; Ching-Chun ; et
al. |
January 2, 2014 |
CAPACITANCE SENSING METHOD
Abstract
A capacitance sensing method is provided. The capacitance
sensing method includes the following steps. During at least one
first period of a sensing period, a capacitance under test is
sensed through a first sensing channel, and a reference capacitance
is sensed through a second sensing channel. During at least one
second period of the sensing period, the reference capacitance is
sensed through the first sensing channel, and the capacitance under
test is sensed through the second sensing channel. A first
difference is generated according to the capacitance under test and
the reference capacitance.
Inventors: |
Lin; Ching-Chun; (New Taipei
City, TW) ; Tang; Wing-Kai; (Hsinchu City, TW)
; Hung; Ching-Ho; (Hsinchu City, TW) ; Chang;
Tsen-Wei; (Taichung City, TW) ; Lin; Yi-Liang;
(Hsinchu County, TW) ; Tsai; Jiun-Jie; (Hsinchu
City, TW) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Novatek Microelectronics Corp. |
Hsinchu |
|
TW |
|
|
Assignee: |
Novatek Microelectronics
Corp.
Hsinchu
TW
|
Family ID: |
44341058 |
Appl. No.: |
14/014395 |
Filed: |
August 30, 2013 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
12983331 |
Jan 3, 2011 |
8547115 |
|
|
14014395 |
|
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Current U.S.
Class: |
324/679 |
Current CPC
Class: |
G01R 27/26 20130101;
G01R 27/2605 20130101 |
Class at
Publication: |
324/679 |
International
Class: |
G01R 27/26 20060101
G01R027/26 |
Foreign Application Data
Date |
Code |
Application Number |
Feb 4, 2010 |
TW |
99103359 |
Claims
1. A capacitance sensing method, comprising: sensing a capacitance
under test through a first sensing channel and sensing a reference
capacitance through a second sensing channel during at least one
first period of a sensing period; sensing the reference capacitance
through the first sensing channel and sensing the capacitance under
test through the second sensing channel during at least one second
period of the sensing period; and generating a first difference
according to the capacitance under test and the reference
capacitance.
2. The capacitance sensing method according to claim 1, wherein the
first sensing channel comprises a first charge-to-voltage
converting unit, the second sensing channel comprises a second
charge-to-voltage converting unit, and the capacitance sensing
method further comprises: converting the capacitance under test
into the voltage under test through the first charge-to-voltage
converting unit and converting the reference capacitance into the
reference voltage through the second charge-to-voltage converting
unit during the first period; and converting the reference
capacitance into the reference voltage through the first
charge-to-voltage converting unit and converting the capacitance
under test into the voltage under test through the second
charge-to-voltage converting unit during the second period, wherein
in the step of generating the first difference, the voltage under
test and the reference voltage are compared to generate the first
difference.
3. The capacitance sensing method according to claim 1, wherein the
first periods and the second periods of the sensing period are
alternately arranged.
4. The capacitance sensing method according to claim 1, wherein the
output of the first sensing channel and the output of the second
sensing channel form a second difference during each of the first
periods and each of the second periods, and in the step of
generating the first difference, the second differences are
integrated and amplified to output the first difference.
Description
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application is a divisional of and claims the priority
benefit of U.S. application Ser. No. 12/983,331 filed on Jan. 3,
2011, now allowed, which claims the priority benefit of Taiwan
application serial no. 99103359, filed on Feb. 4, 2010. The
entirety of each of the above-mentioned patent applications is
hereby incorporated by reference herein and made a part of
specification.
BACKGROUND OF THE INVENTION
[0002] 1. Field of the Invention
[0003] The disclosure generally relates to a sensing method, and
more particularly, to a capacitance sensing method.
[0004] 2. Description of Related Art
[0005] In this information era, reliance on electronic products is
increasing day by day. The electronic products including notebook
computers, mobile phones, personal digital assistants (PDAs),
digital walkmans, and so on are indispensable in our daily lives.
Each of the aforesaid electronic products has an input interface
for a user to input his or her command, such that an internal
system of each of the electronic product spontaneously runs the
command. At this current stage, the most common input interface
includes a keyboard and a mouse.
[0006] From the user's aspect, it is sometimes rather inconvenient
to use the conventional input interface including the keyboard and
the mouse. Manufacturers aiming to resolve said issue thus start to
equip the electronic products with touch input interfaces, e.g.
touch pads or touch panels, so as to replace the conditional
keyboards and mice. At present, the users' commands are frequently
given to the electronic products by physical contact or sensing
relationship between users' fingers or styluses and the touch input
interfaces. For instance, a capacitive touch input interface
characterized by a multi-touch sensing function is more
user-friendly than the conventional input interface and thus
gradually becomes more and more popular.
[0007] However, given that the capacitive touch input interface is
applied to a one-end sensing circuit, capacitance of a capacitor
under test is required to be measured and stored as a base line
capacitance before touch sensing. The base line capacitance is
subtracted from the capacitance under test which is measured by the
one-end sensing circuit, and thereby the capacitance variations of
the capacitor under test can be obtained. Meanwhile, a reference
capacitance of the capacitor under test measured by the one-end
sensing circuit has a fixed value so that external noises cannot be
effectively reduced and accordingly the noise-to-signal ratio (NSR)
of the one-end sensing circuit cannot be effectively enhanced.
SUMMARY OF THE DISCLOSURE
[0008] The disclosure is directed to a capacitance sensing method.
By using the capacitance sensing method, the NSR of a capacitance
sensing circuit can be effectively enhanced, and device and wiring
asymmetry in the capacitance sensing circuit is overcome through
capacitor alternation.
[0009] The disclosure provides a capacitance sensing method
including following steps. During at least one first period of a
sensing period, a capacitance under test is sensed through a first
sensing channel, and a reference capacitance is sensed through a
second sensing channel. During at least one second period of the
sensing period, the reference capacitance is sensed through the
first sensing channel, and the capacitance under test is sensed
through the second sensing channel. A first difference is generated
according to the capacitance under test and the reference
capacitance.
[0010] According to an embodiment of the disclosure, the first
sensing channel includes a first charge-to-voltage converting unit,
and the second sensing channel includes a second charge-to-voltage
converting unit. The capacitance sensing method further includes
following steps. During the first period, the capacitance under
test is converted into a voltage under test by the first
charge-to-voltage converting unit, and the reference capacitance is
converted into a reference voltage by the second charge-to-voltage
converting unit. During the second period, the reference
capacitance is converted into the reference voltage by the first
charge-to-voltage converting unit, and the capacitance under test
is converted into the voltage under test by the second
charge-to-voltage converting unit. In the step of generating the
first difference, the voltage under test and the reference voltage
are compared to generate the first difference.
[0011] According to an embodiment of the disclosure, the first
periods and the second periods of the sensing period are
alternately arranged.
[0012] According to an embodiment of the disclosure, the output of
the first sensing channel and the output of the second sensing
channel form a second difference during each of the first periods
and each of the second periods. In the step of generating the first
difference, the second differences are integrated and amplified to
output the first difference.
[0013] As described above, in the embodiments of the disclosure,
the capacitance sensing circuit adopts a reference signal as a
reference for measuring the signal under test such that external
noises are reduced and accordingly the NSR of the capacitance
sensing circuit is effectively enhanced. In addition, during
different periods of the sensing period, the capacitance sensing
circuit senses the capacitance under test and the reference
capacitance through different sensing channels so that device and
wiring asymmetry in the capacitance sensing circuit is
overcome.
[0014] It is to be understood that both the foregoing general
descriptions and the following detailed embodiments are exemplary
and are, together with the accompanying drawings, intended to
provide further explanation of technical features and advantages of
the disclosure.
BRIEF DESCRIPTION OF THE DRAWINGS
[0015] The accompanying drawings are included to provide a further
understanding of the disclosure, and are incorporated in and
constitute a part of this specification. The drawings illustrate
embodiments of the disclosure and, together with the description,
serve to explain the principles of the disclosure.
[0016] FIG. 1 is a block diagram of a touch sensing system
according to an embodiment of the disclosure.
[0017] FIG. 2 is a circuit diagram of the touch input interface
shown in FIG. 1.
[0018] FIG. 3 is a schematic diagram of a capacitance sensing
circuit according to an embodiment of the disclosure.
[0019] FIG. 4 is a timing diagram of a control signal of the
capacitance sensing circuit.
[0020] FIG. 5 is a schematic diagram of a capacitance sensing
circuit according to another embodiment of the disclosure.
[0021] FIG. 6 is a timing diagram of a control signal of the
capacitance sensing circuit.
[0022] FIG. 7 is a flowchart of a capacitance sensing method
according to an embodiment of the disclosure.
DESCRIPTION OF THE EMBODIMENTS
[0023] Reference will now be made in detail to the present
preferred embodiments of the disclosure, examples of which are
illustrated in the accompanying drawings. Wherever possible, the
same reference numbers are used in the drawings and the description
to refer to the same or like parts.
[0024] In a capacitive touch input interface, capacitance of a
sensing capacitor is determined on whether a position of the
sensing capacitor correspondingly on the touch input interface is
touched. When the position of the sensing capacitor correspondingly
on the touch input interface is touched, capacitance variation is
induced by the touch object accordingly, such that a capacitance
under test is generated by the touch object and the sensing
capacitor.
[0025] According to the embodiments of the disclosure, except for
the aforesaid capacitance under test, other capacitances of sensing
capacitors can serve as reference values for measuring the
capacitance under test. Hence, after the capacitance under test and
the reference capacitance are compared, the touch position of the
touch object correspondingly on the touch input interface can be
determined
[0026] In the embodiments provided hereinafter, a touch panel
exemplarily acts as the touch input interface, while people having
ordinary skill in the art are aware that the touch panel does not
pose a limitation on the touch input interface of the disclosure.
Meanwhile, the disclosure is not limited to the touch input
interface. Any input interface capable of sensing capacitance
variations does not depart from the protection scope of the
disclosure.
[0027] FIG. 1 is a block diagram of a touch sensing system
according to an embodiment of the disclosure. Referring to FIG. 1,
in the present embodiment, the touch sensing system 100 includes a
capacitance sensing apparatus 110, a touch input interface 120, and
a control unit 130. The touch input interface 120 may be a touch
panel of a display or any touch pad with a touch sensing function.
The touch input interface 120 includes a plurality of sensing
capacitors for outputting a plurality of signal under tests
Y.sub.1-Y.sub.p.
[0028] FIG. 2 is a circuit diagram of the touch input interface 120
shown in FIG. 1. Referring to both FIG. 1 and FIG. 2, in the
present embodiment, the capacitances of the sensing capacitors are
determined according to whether the corresponding positions of the
sensing capacitors on the touch input interface 120 are touched.
Taking the sensing capacitor C(n) as an example, when the
corresponding position of the sensing capacitor C(n) on the touch
input interface is touched, the touch object produces a
corresponding capacitance variation AC. Then, a capacitance under
test C(n)+.DELTA.C is formed by the sensing capacitor C(n) and the
capacitance variation AC, and a signal under test Y.sub.n is output
through a corresponding sensing line 124. Next, the capacitance
sensing apparatus 110 senses the variation of the capacitance under
test C(n)+.DELTA.C. After that, the control unit 130 determines the
corresponding position of the capacitance under test on the touch
input interface 120 according to the variation. Namely, the control
unit 130 determines the touch position on the touch input interface
120 according to the variation.
[0029] It should be noted that in the present embodiment, besides
the capacitance under test C(n)+.DELTA.C, the capacitances of other
sensing capacitors can be served as reference signals for measuring
the capacitance under test, so that external noises are reduced and
the noise-to-signal ratio (NSR) of the capacitance sensing
apparatus 110 is enhanced.
[0030] To be specific, taking a mutual capacitance touch sensing
system as an example, when the system is in operation, the sensing
capacitances on the touch input interface 120 receives driving
signals X.sub.1-X.sub.q from a driving unit (not shown) through a
corresponding driving line and generates the sensing signals
Y.sub.1-Y.sub.p on the corresponding sensing line, wherein p and q
are respectively a positive integer, 1<p, and 1<q. For
example, while driving, the driving signal X.sub.m supplied to the
driving line 122 is transmitted to the sensing line 124 crossing
the driving line 122 through the sensing capacitor C(n) so that a
signal under test Y.sub.n is generated on the sensing line 124,
wherein n and m are respectively a positive integer,
1.ltoreq.n.ltoreq.p, and 1.ltoreq.m.ltoreq.q.
[0031] Thus, when the system is in operation, the capacitance
sensing apparatus 110 can obtain a capacitance distribution of the
sensing capacitors C(1)-C(p) by supplying the driving signal
X.sub.m to the driving line 122.
[0032] Thereby, when the touch object (for example, a finger or a
stylus) approaches or touches the corresponding position of the
sensing capacitor C(n) on the touch input interface 120, a
corresponding capacitance variation .DELTA.C is produced, and
accordingly the capacitance distribution is changed. Thereafter,
the touch sensing system 100 determines the corresponding position
of the capacitance under test C(n)+.DELTA.C on the touch input
interface 120 through the capacitance sensing apparatus 110 and the
control unit 130.
[0033] In the present embodiment, the capacitance sensing apparatus
110 includes a signal selecting unit 112 and a signal sensing unit
114. The control unit 130 includes an analog-to-digital converter
(ADC) 132 and a controller 134.
[0034] The signal selecting unit 112 receives the sensing signals
Y.sub.1-Y.sub.p and selects at least one signal under test and at
least one reference signal from the sensing signals
Y.sub.1-Y.sub.p. Next, the signal selecting unit 112 transmits the
signal under test and reference signal which are selected to the
signal sensing unit 114 to perform a difference comparison.
[0035] For example, during a sensing period, the signal selecting
unit 112 selects and transmits the sensing signals Y.sub.n and
Y.sub.m to the signal sensing unit 114 to perform the difference
comparison, wherein m is a positive integer, 1.ltoreq.m.ltoreq.p,
and m.noteq.n. Namely, the signal selecting unit 112 selects the
sensing signal Y.sub.m as the reference signal for measuring the
capacitance under test and outputs the sensing signal Y.sub.m to
the signal sensing unit 114 to be compared with the sensing signal
Y.sub.n. After the signal sensing unit 114 finishes the comparison,
it generates a difference signal Y.sub.D and outputs the difference
signal Y.sub.D to the control unit 130. The control unit 130
determines the touch position on the touch input interface 120
according to the difference signal Y.sub.D.
[0036] Thus, in the present embodiment, the signal selecting unit
112 selects the sensing signal Y.sub.m from the rest sensing
signals (excluding the sensing signal Y.sub.n) as the reference
signal for measuring the capacitance under test, i.e. the sensing
signal Y.sub.n, so that noises from the touch input interface 120
can be effectively reduced and the NSR of the sensing system can be
enhanced.
[0037] In other words, noises from the touch input interface 120
can be considered as common mode noises. Thus, by selecting at
least one sensing signal from the unselected sensing signals as the
reference signal for measuring the capacitance under test, common
mode noises in the sensing circuit can be reduced and the NSR of
the sensing system can be enhanced.
[0038] In the present embodiment, the signal sensing unit 114 may
be a comparator (not shown) that receives and compares the signal
under test and the reference signal received from the signal
selecting unit 112 to generate a corresponding difference signal
for the control unit 130. However, the disclosure is not limited
thereto. In another embodiment, the signal sensing unit 114 may be
a differential amplifier. In this case, the differential amplifier
compares and amplifies the voltage difference between the signal
under test and the reference signal and outputs the amplified
voltage difference to the control unit 130 to detect the touch
position precisely. In yet another embodiment, the signal sensing
unit 114 may also be an integrator. In this case, the integrator
integrates and amplifies the voltage difference between the signal
under test and the reference signal to output a corresponding
difference signal Y.sub.D to the control unit 130.
[0039] In the present embodiment, the difference signal Y.sub.D
generated by the signal sensing unit 114 may be an analog signal.
Thus, after receiving the analog signal, the ADC 132 converts it
into a digital signal. After that, the controller 134 performs a
digital operation on the digital signal to obtain the touch
position corresponding to the capacitance under test C(n)+.DELTA.C
on the touch input interface 120. Namely, the controller 134 can
determine the touch position on the touch input interface 120
according to the difference signal Y.sub.D.
[0040] It should be noted that even though the touch sensing system
100 is described as a mutual capacitance touch system in the
present embodiment, the disclosure is not limited thereto. In other
embodiments, the touch sensing system 100 may also be a self
capacitance touch system or any other type of touch system.
[0041] Additionally, in the present embodiment, the signal
selecting unit 112 selects one sensing signal among the unselected
sensing signals as a reference signal for measuring the capacitance
under test. In another embodiment, the signal selecting unit 112
may also selects two sensing signals among the unselected signal
under tests as reference signals for measuring the capacitance
under test.
[0042] FIG. 3 is a schematic diagram of a capacitance sensing
circuit according to an embodiment of the disclosure. Referring to
FIG. 3, in the present embodiment, a signal sensing unit, for
example, includes the capacitance sensing circuit in FIG. 3, which
senses voltages or capacitances corresponding to the signal under
test and the reference signal.
[0043] In the present embodiment, the capacitance sensing circuit
300 includes a first sensing channel 310, a second sensing channel
320, and a difference comparing unit 330. The first sensing channel
310 senses the signal under test (for example, the signal under
test Y.sub.n, in FIG. 1) corresponding to the capacitance under
test. The second sensing channel 320 senses the reference signal
(for example, the reference signal Y.sub.m in FIG. 1) corresponding
to the reference capacitance. The difference comparing unit 330 has
a first input terminal VX.sub.13 and a second input terminal
VX.sub.23. The first input terminal VX.sub.13 receives an output of
the first sensing channel 310, and the second input terminal
VX.sub.23 receives an output of the second sensing channel 320. The
difference comparing unit 330 outputs a difference signal Y.sub.D
according to the capacitance under test and the reference
capacitance.
[0044] FIG. 4 is a timing diagram of control signals of the
capacitance sensing circuit. Referring to FIG. 1, FIG. 3, and FIG.
4, in the present embodiment, the first sensing channel 310
includes a first charge-to-voltage converting unit 312, the second
sensing channel 320 includes a second charge-to-voltage converting
unit 322, and the difference comparing unit 330 includes an
operational amplifier 332. Herein the difference comparing unit 330
is implemented with an integrator. However, the disclosure is not
limited thereto.
[0045] Taking the first sensing channel 310 as an example, during
each period P of a sensing period T, a driving signal X.sub.m is
supplied to the driving line 122 and transmitted to the sensing
line 124 crossing the driving line 122 through the capacitance
under test C(n)+.DELTA.C, so that a signal under test Y.sub.n, is
generated. Then, the first sensing channel 310 receives the signal
under test Y.sub.n through a pad VX.sub.1 to sense the signal under
test Y.sub.n corresponding to the capacitance under test.
[0046] During the first period P, the charges corresponding to the
capacitance under test are stored in a storage capacitor C.sub.1N
when the timing signal .PHI..sub.2 is at a high level. When the
timing signal .PHI..sub.1 is at the high level, the charges stored
in the storage capacitor C.sub.1N are transmitted to the difference
comparing unit 330 through the first input terminal VX.sub.13 and
stored in an integrated capacitor C.sub.2N. Namely, through the
storage capacitor C.sub.1N, the first charge-to-voltage converting
unit 312 can convert the charges it receives into a voltage under
test and transmits the voltage under test to the difference
comparing unit 330.
[0047] Meanwhile, the second sensing channel 320 receives the
reference signal Y.sub.m through the pad VX.sub.2 to sense the
reference signal Y.sub.1 corresponding to the reference
capacitance. Then, the second charge-to-voltage converting unit 322
converts the charges it receives into a reference voltage and
transmits the reference voltage to the difference comparing unit
330.
[0048] Through the operational amplifier 332 and the integrated
capacitors C.sub.2N and C.sub.2P, the difference comparing unit 330
integrates and amplifies the voltage difference between the signal
under test and the reference signal, wherein the gains are
respectively C.sub.1N/C.sub.2N and C.sub.1P/C.sub.2P. Herein it is
assumed that C.sub.1N=C.sub.1P and C.sub.2N=C.sub.2P. However, the
disclosure is not limited thereto.
[0049] In the present embodiment, the sensing period T contains
four periods P. The difference comparing unit 330 integrates and
amplifies the voltage difference between the signal under test and
the reference signal during each period P. Thus, when the timing
signal .PHI..sub.0 is at the high level, the voltage difference
integrated and amplified during each period P is stored into the
capacitors C.sub.0N and C.sub.0P, and the corresponding difference
signal Y.sub.D is output from the pads V.sub.ON and V.sub.OP.
Thereby, the difference comparing unit 330 outputs the difference
signal Y.sub.D corresponding to the voltage difference according to
the voltage under test and the reference voltage.
[0050] The present embodiment is described with the sensing period
T containing four periods P. However, the disclosure is not limited
thereto, and in another embodiment, the sensing period T may
contain only one period P.
[0051] It should be noted that in the present embodiment, two
sensing channels respectively sensing the capacitance under test
and the reference capacitance are described as an example. However,
in other embodiments, the capacitance sensing circuit may also
include three or more sensing channels, wherein one of the sensing
channels senses the capacitance under test, and other sensing
channels sense the reference capacitances. Namely, the signal
selecting unit selects two sensing signals among the unselected
sensing signals as reference signals for measuring the capacitance
under test.
[0052] Additionally, the difference comparing unit 330 is
implemented with an integrator in the present embodiment. However,
the disclosure is not limited thereto, and in another embodiment,
the difference comparing unit 330 may also be implemented with a
differential amplifier or a comparator.
[0053] FIG. 5 is a schematic diagram of a capacitance sensing
circuit according to another embodiment of the disclosure. FIG. 6
is a timing diagram of control signals of the capacitance sensing
circuit. Referring to FIG. 5 and FIG. 6, in the present embodiment,
the capacitance sensing circuit 500 includes a first sensing
channel 510, a second sensing channel 520, a difference comparing
unit 530, and a swap unit 540. The first sensing channel 510 senses
a capacitance under test or a reference capacitance, and the second
sensing channel 520 senses the capacitance under test or the
reference capacitance.
[0054] It should be noted that in the present embodiment, during a
first period P.sub.1 of the sensing period T, the first sensing
channel 510 senses the capacitance under test and the second
sensing channel 520 senses the reference capacitance, and during a
second period P.sub.2 of the sensing period T, the first sensing
channel 510 senses the reference capacitance and the second sensing
channel 520 senses the capacitance under test. The swap unit 540
switches the first sensing channel 510 to sense the capacitance
under test or the reference capacitance and switches the second
sensing channel 520 to sense the capacitance under test or the
reference capacitance.
[0055] To be specific, the swap unit 540 includes a first switch
unit 542 and a second switch unit 544. The first switch unit 542
controls the first sensing channel 510 to receive the capacitance
under test and controls the second sensing channel 520 to receive
the reference capacitance during the first period P.sub.1, and the
first switch unit 542 controls the first sensing channel 510 to
receive the reference capacitance and controls the second sensing
channel 520 to receive the capacitance under test during the second
period P.sub.2. The second switch unit 544 transmits the output of
the first sensing channel 510 to the input terminal VX.sub.13 of
the difference comparing unit 530 and transmits the output of the
second sensing channel 520 to the input terminal VX.sub.23 of the
difference comparing unit 530 during the first period P.sub.1, and
the second switch unit 544 transmits the output of the first
sensing channel 510 to the input terminal VX.sub.23 of the
difference comparing unit 530 and transmits the output of the
second sensing channel 520 to the input terminal VX.sub.13 of the
difference comparing unit 530 during the second period P.sub.2.
[0056] Taking the sensing channel 510 as an example, the sensing
channel 510 includes a charge-to-voltage converting unit 512.
During each period P.sub.1 of the sensing period T, the sensing
channel 510 receives the signal under test Y.sub.r, through the pad
VX.sub.1 to sense the signal under test Y.sub.n corresponding to
the capacitance under test.
[0057] During the period P.sub.1, when the timing signal
.PHI..sub.2 is at a high level, the timing signal .PHI..sub.21 is
also at a high level so that the charges corresponding to the
capacitance under test are stored in a storage capacitor C.sub.1N.
Subsequently, when the timing signal .PHI..sub.1 is at a high
level, the timing signal .PHI..sub.11 is also at a high level so
that the charges stored in the storage capacitor C.sub.1N are
transmitted to the difference comparing unit 530 through the input
terminal VX.sub.13 and stored in the integrated capacitor
C.sub.2N.
[0058] On the other hand, the second sensing channel 520 includes a
charge-to-voltage converting unit 522. During each period P.sub.1
of the sensing period T, the second sensing channel 520 receives
the reference signal Y.sub.m through the pad VX.sub.2 to sense the
reference signal Y.sub.m corresponding to the reference
capacitance.
[0059] During the period P.sub.1, the charges corresponding to the
reference capacitance are stored in a storage capacitor C.sub.1P
when the timing signals .phi..sub.2 and .phi..sub.21 are at a high
level. Subsequently, when the timing signals .phi..sub.1 and
.phi..sub.11 are at a high level, the charges stored in the storage
capacitor C.sub.1P are transmitted to the difference comparing unit
530 through the input terminal VX.sub.23 and stored in the
integrated capacitor C.sub.2P.
[0060] Thus, through the operational amplifier 532 and the
integrated capacitors C.sub.2N and C.sub.2P, the difference
comparing unit 530 integrates and simplifies the voltage difference
between the signal under test and the reference signal, wherein the
gains are respectively C.sub.1N/C.sub.2N and C.sub.1P/C.sub.2P.
Herein it is assumed that C.sub.1N=C.sub.1P and C.sub.2N=C.sub.2P.
However, the disclosure is not limited thereto.
[0061] Thereafter, during the period P.sub.2, the timing signal
.phi..sub.22 is also at a high level when the timing signal
.phi..sub.2 is at a high level. It should be noted that the charges
corresponding to the capacitance under test are stored in the
storage capacitor C.sub.1P of the second sensing channel 520 at
this time. Subsequently, when the timing signal .phi..sub.1 is at a
high level, the timing signal .phi..sub.12 is also at a high level
so that the charges stored in the storage capacitor C.sub.1P are
transmitted to the difference comparing unit 530 through the input
terminal VX.sub.13 and stored in the integrated capacitor
C.sub.2N.
[0062] On the other hand, regarding the reference capacitance,
during the period P.sub.2, the charges corresponding to the
reference capacitance are stored in the storage capacitor C.sub.1N
of the first sensing channel 510 when the timing signals
.phi..sub.2 and .phi..sub.22 are at a high level. Subsequently,
when the timing signals .phi..sub.1 and .phi..sub.12 are at a high
level, the charges stored in the storage capacitor C.sub.1N are
transmitted to the difference comparing unit 530 through the input
terminal VX.sub.23 and stored in the integrated capacitor
C.sub.2P.
[0063] Namely, in the present embodiment, the first switch unit 542
controls the first sensing channel 510 to receive the capacitance
under test and controls the second sensing channel 520 to receive
the reference capacitance during the first period P.sub.1.
Contrarily, the first switch unit 542 controls the first sensing
channel 510 to receive the reference capacitance and controls the
second sensing channel 520 to receive the capacitance under test
during the second period P.sub.2.
[0064] It should be noted that in the present embodiment, the
second switch unit 544 transmits the output of the first sensing
channel 510 to the input terminal VX.sub.13 of the difference
comparing unit 530 and transmits the output of the second sensing
channel 520 to the input terminal VX.sub.23 of the difference
comparing unit 530 during the first period P.sub.1, and the second
switch unit 544 transmits the output of the first sensing channel
510 to the input terminal VX.sub.23 of the difference comparing
unit 530 and transmits the output of the second sensing channel 520
to the input terminal VX.sub.13 of the difference comparing unit
530 during the second period P.sub.2. Namely, the input terminal
VX.sub.13 of the difference comparing unit 530 always receives the
voltage under test while the input terminal VX.sub.23 thereof
always receives the reference voltage regardless of whether it is
during the first period P.sub.1 or the second period P.sub.2.
[0065] Thereafter, through the operational amplifier 532 and the
integrated capacitors C.sub.2N and C.sub.2P, the difference
comparing unit 530 integrates and amplifies the voltage difference
between the signal under test and the reference signal, wherein the
gains are respectively C.sub.1N/C.sub.2N and C.sub.1P/C.sub.2P.
Herein it is assumed that C.sub.1N=C.sub.1P and C.sub.2N=C.sub.2P.
However, the disclosure is not limited herein.
[0066] During each period of the sensing period T, the difference
comparing unit 530 integrates and amplifies the voltage difference
between the signal under test and the reference signal. Thus, when
the timing signal .phi..sub.0 is at a high level, the voltage
difference integrated and amplified during each period P is stored
into the capacitors C.sub.0N and C.sub.0P, and the corresponding
difference signal is output from the pads V.sub.0N and V.sub.OP.
Thus, the difference comparing unit 530 can output a difference
signal Y.sub.D corresponding to the voltage difference according to
the voltage under test and the reference voltage.
[0067] In the present embodiment, because the sensing period T
contains a plurality of periods P.sub.1 and P.sub.2 which are
alternately arranged, the capacitance sensing circuit 500 senses
the capacitance under test and the reference capacitance through
different sensing channels during each period of the sensing period
T, so that the device and wiring asymmetry in the capacitance
sensing circuit 500 is overcome.
[0068] The present embodiment is described by taking a sensing
period T containing a plurality of periods P.sub.1 and P.sub.2
which ate alternately arranged as an example. However, the
disclosure is not limited thereto, and in another embodiment, the
sensing period T may also contain only one period P.sub.1 and one
period P.sub.2.
[0069] FIG. 7 is a flowchart of a capacitance sensing method
according to an embodiment of the disclosure. Referring to FIGS.
5-7, the capacitance sensing method in the present embodiment
includes following steps. First, in step S700, during a first
period P.sub.1, a capacitance under test and a reference
capacitance are respectively sensed through a first sensing channel
510 and a second sensing channel 520. Then, in step S702, during a
second period P.sub.2, the reference capacitance and the
capacitance under test are respectively sensed through the first
sensing channel 510 and the second sensing channel 520. Next, in
step S704, steps S700 and S702 are repeated during the sensing
period T. Thereafter, in step S706, a corresponding difference is
generated according to the capacitance under test and the reference
capacitance.
[0070] Besides, the capacitance sensing method described in this
embodiment of the disclosure is sufficiently taught, suggested, and
embodied in the embodiments illustrated in FIG. 1 to FIG. 6, and
therefore no further description is provided herein.
[0071] Furthermore, in the embodiments of the disclosure, even
though a touch sensing system is described as an example of object
sensing apparatuses, the disclosure is not limited thereto, and any
object sensing apparatus that can sense and determine the touch
position of an object is within the scope of the disclosure.
[0072] As described above, in the embodiments of the disclosure,
the capacitance sensing circuit adopts a reference signal as a
reference for measuring the signal under test such that external
noises are reduced and accordingly the NSR of the capacitance
sensing circuit is effectively enhanced. In addition, during
different periods of the sensing period, the capacitance sensing
circuit senses the capacitance under test and the reference
capacitance through different sensing channels so that device and
wiring asymmetry in the capacitance sensing circuit is
overcome.
[0073] It will be apparent to those skilled in the art that various
modifications and variations can be made to the structure of the
disclosure without departing from the scope or spirit of the
disclosure. In view of the foregoing, it is intended that the
disclosure cover modifications and variations of this disclosure
provided they fall within the scope of the following claims and
their equivalents.
* * * * *