U.S. patent application number 13/478600 was filed with the patent office on 2013-08-08 for test system with hopper equipment.
The applicant listed for this patent is Peter G. Panagas. Invention is credited to Peter G. Panagas.
Application Number | 20130200917 13/478600 |
Document ID | / |
Family ID | 47891914 |
Filed Date | 2013-08-08 |
United States Patent
Application |
20130200917 |
Kind Code |
A1 |
Panagas; Peter G. |
August 8, 2013 |
Test System with Hopper Equipment
Abstract
A test system may be provided in which devices under test (DUTs)
are loaded into test trays. Test trays may be moved between test
stations using a test conveyor belt. The test system may include
loading equipment for placing test trays on the test conveyor belt
at desired intervals. The loading equipment may include a feed
conveyor belt, tray support structure, and at least one
computer-controlled grabber. Test trays may be placed on the feed
conveyor belt by test personnel or automated loader. The grabber
may be used to transport an incoming test tray from the feed
conveyor belt to the support structure. The test tray may be
temporarily docked at the support structure. The grabber may then
transport the test tray from the support structure to the test
conveyor belt so that the DUT on the test tray can be passed to the
various test stations for testing.
Inventors: |
Panagas; Peter G.; (Santa
Clara, CA) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Panagas; Peter G. |
Santa Clara |
CA |
US |
|
|
Family ID: |
47891914 |
Appl. No.: |
13/478600 |
Filed: |
May 23, 2012 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
61595572 |
Feb 6, 2012 |
|
|
|
Current U.S.
Class: |
324/757.01 |
Current CPC
Class: |
G06F 3/044 20130101;
H04M 1/24 20130101; H01L 2924/0002 20130101; G01R 31/01 20130101;
G06F 2203/04103 20130101; H01L 21/67727 20130101; G01R 1/0441
20130101; G01R 31/2893 20130101; H01L 2924/0002 20130101; H01L
2924/00 20130101 |
Class at
Publication: |
324/757.01 |
International
Class: |
G01R 31/20 20060101
G01R031/20 |
Claims
1. A method for operating a test system that is used to test a
plurality of electronic devices, wherein the test system includes a
first conveyor belt, a second conveyor belt, and a fixed support
structure, the method comprising: moving the plurality of
electronic devices from the first conveyor belt to the fixed
support structure at a first rate; moving the plurality of
electronic devices from the fixed support structure to the second
conveyor belt at a second rate that is at most equal to the first
rate; and with test equipment stationed along the second conveyor
belt, testing the plurality of electronic devices.
2. The method defined in claim 1, wherein the plurality of
electronic devices comprises a plurality of handheld electronic
devices.
3. The method defined in claim 1, wherein the second rate is less
than the first rate.
4. The method defined in claim 1, wherein the test system further
includes a computer-controlled loader, wherein moving the plurality
of electronic devices from the first conveyor belt to the fixed
support structure comprises moving the plurality of electronic
devices from the first conveyor belt to the fixed support structure
with the computer-controlled loader, and wherein moving the
plurality of electronic devices from the fixed support structure to
the second conveyor belt comprises moving the plurality of
electronic devices from the fixed support structure to the second
conveyor belt with the computer-controlled loader.
5. The method defined in claim 1, wherein the test system further
includes first and second computer-controlled loaders, wherein
moving the plurality of electronic devices from the first conveyor
belt to the fixed support structure comprises moving the plurality
of electronic devices from the first conveyor belt to the fixed
support structure with the first computer-controlled loader, and
wherein moving the plurality of electronic devices from the fixed
support structure to the second conveyor belt comprises moving the
plurality of electronic devices from the fixed support structure to
the second conveyor belt with the second computer-controlled
loader.
6. The method defined in claim 5, further comprising: installing
the plurality of electronic devices within respective test trays,
wherein the test trays include test tray engagement features, and
wherein the computer-controlled loader includes loader engagement
features configured to engage with the test tray engagement
features; with a first sensor associated with the first conveyor
belt, detecting whether an incoming electronic device in the
plurality of electronic devices is available to be moved from the
first conveyor belt to the fixed support structure by the first
computer-controlled loader; and with a second sensor, identifying a
serial number associated with each test tray that is being moved
from the first conveyor belt to the fixed support structure by the
second computer-controlled loader.
7. The method defined in claim 4, further comprising: installing
the plurality of electronic devices within respective test trays,
wherein the test trays include test tray engagement features, and
wherein the computer-controlled loader includes loader engagement
features configured to engage with the test tray engagement
features.
8. The method defined in claim 7, wherein the test tray engagement
features comprise holes, and wherein the loader engagement features
comprise pins.
9. The method defined in claim 1, further comprising: with sensors
associated with the fixed support structure, detecting whether or
not the fixed support structure is capable of receiving electronic
devices from the first conveyor belt.
10. The method defined in claim 1, further comprising: with a
sensor associated with the first conveyor belt, detecting whether
an incoming electronic device in the plurality of electronic
devices is available to be moved from the first conveyor belt to
the fixed support structure.
11. The method defined in claim 7, further comprising: with a
radio-frequency identification sensor, identifying a serial number
associated with each test tray that is being moved from the first
conveyor belt to the fixed support structure.
12. A method for operating a test system that is used to test a
plurality of electronic devices, wherein the test system includes a
test conveyor belt, a fixed support structure, and a loader, the
method comprising: with the fixed support structure, receiving the
plurality of electronic devices; with the loader, transferring the
plurality of electronic devices from the fixed support structure to
the test conveyor belt at predetermined time intervals; and with
test equipment stationed along the test conveyor belt, testing the
plurality of electronic devices.
13. The method defined in claim 12, wherein the test system further
includes a feed conveyor belt, the method further comprising: with
the feed conveyor belt, sequentially receiving the plurality of
electronic devices; and with the loader, transferring the received
plurality of electronic devices from the feed conveyor belt to the
fixed support structure one at a time.
14. The method defined in claim 12, wherein the test system further
includes an additional loader and a feed conveyor belt, the method
further comprising: with the feed conveyor belt, sequentially
receiving the plurality of electronic devices; and with the
additional loader, transferring the received plurality of
electronic devices from the feed conveyor belt to the fixed support
structure one at a time.
15. The method defined in claim 12, further comprising: installing
the plurality of electronic devices within respective test trays,
wherein the test trays include test tray engagement features.
16. The method defined in claim 15, wherein the loader comprises a
computer-controlled positioner that controls a grabber, and wherein
transferring the plurality of electronic devices from the fixed
support structure to the test conveyor belt comprises: with the
grabber, picking up a selected test tray from the fixed support
structure by engaging grabber engagement features of the grabber
with the test tray engagement features of the selected test tray;
while the grabber engagement features are engaged with the test
tray engagement features, transporting the selected test tray from
the fixed support structure to the test conveyor belt; and with the
grabber, depositing the selected test tray on the test conveyor
belt by disengaging the grabber engagement features of the grabber
from the test tray engagement features of the selected test
tray.
17. A test system, comprising: a first conveyor belt configured to
receive a plurality of devices under test; a fixed support
structure configured to receive the plurality of devices under test
from the first conveyor belt; a second conveyor belt; and a loader
that is configured to move the devices under test from the fixed
support structure to the second conveyor belt at fixed time
intervals.
18. The test system defined in claim 17, wherein the loader is
further configured to move the plurality of devices under test from
the first conveyor belt to the fixed support structure.
19. The test system defined in claim 17, further comprising: an
additional loader that is configured to move the plurality of
devices under test from the first conveyor belt to the fixed
support structure.
20. The test system defined in claim 17, further comprising: a
plurality of test trays each of which is configured to house a
device under tester in the plurality of devices under test; and a
safety wall positioned over the first conveyor belt, wherein the
safety wall is configured so that only a single test tray can pass
between an upper surface of first conveyor belt and a lower surface
of the safety wall at any given time.
Description
[0001] This application claims the benefit of provisional patent
application No. 61/595,572, filed Feb. 6, 2012, which is hereby
incorporated by reference herein in its entirety.
BACKGROUND
[0002] This relates generally to automation, and more particularly,
to automated equipment for use in manufacturing operations such as
testing.
[0003] Electronic devices are often tested following assembly to
ensure that device performance meets design specifications. For
example, a device may be tested at a series of test stations to
ensure that components and software in the device are operating
satisfactorily. At each test station, an operator may couple a
device to test equipment using a cable. Following successful
testing at all test stations, a device may be shipped to an end
user.
[0004] The process of attaching and detaching test cable connectors
and the manual operations associated with performing tests at test
stations can be cumbersome and burdensome to test system operators.
If care is not taken, tests may be less accurate and more time
consuming than desired.
[0005] It would therefore be desirable to be able to provide
improved ways of performing manufacturing operations such as
testing operations on electronic devices.
SUMMARY
[0006] A test system may be provided in which devices under test
are loaded into test trays. Test trays in the test system may be
tested at test stations. A test conveyor belt may be used to move
test trays from one test station to another. The test system may
include loading equipment for placing test trays onto the test
conveyor belt at predetermined intervals.
[0007] In one suitable arrangement, the loading equipment may
include a feed conveyor belt, a fixed support structure, and a
computer-controlled loader. A test operator or automated test tray
loader may provide test trays to the feed conveyor belt. A safety
wall may be placed above the feed conveyor belt so that only a
single test tray may pass between an upper surface of the feed
conveyor belt and a lower surface of the safety wall at any given
time. A first sensor associated with the feed conveyor belt may be
used to determine when an incoming test tray is available for
pickup.
[0008] The loader may be used to move an incoming test tray from
the feed conveyor belt to the fixed support structure. In
particular, the loader may include loader engagement features
configured to mate with corresponding test tray engagement features
in the test tray. A second sensor (e.g., a radio-frequency
identification sensor) may be used to identify a serial number
associated with each test tray being transferred from the feed
conveyor belt to the fixed support structure.
[0009] The test tray may be stored temporarily on the fixed support
structure. More than one test tray may be stored on the fixed
support structure. Sensors associated with the fixed support
structure may be used to determine whether the fixed support
structure is capable of receiving additional test trays from the
test conveyor belt (e.g., whether the fixed support structure has a
vacant test tray spot or whether the fixed support structure is
fully occupied by test trays).
[0010] The loader may be directed to move a selected test tray from
the fixed support structure to the test conveyor belt. The rate at
which test trays are deposited on the fixed support structure may
at most be equal to the rate at which test trays are transferred
from the fixed support structure to the test conveyor belt. In
another suitable arrangement, the test system may include an
additional computer-controlled loader that is used to move a
selected test tray from the fixed support structure to the test
conveyor belt.
[0011] Further features of the present invention, its nature and
various advantages will be more apparent from the accompanying
drawings and the following detailed description.
BRIEF DESCRIPTION OF THE DRAWINGS
[0012] FIG. 1 is a perspective view of an illustrative electronic
device such as a handheld device of the type that may be
manufactured using automated equipment in accordance with an
embodiment of the present invention.
[0013] FIG. 2 is a schematic diagram of an illustrative electronic
device with input/output devices and wireless communications
circuitry in accordance with an embodiment of the present
invention.
[0014] FIG. 3 is a diagram of manufacturing equipment of the type
that may be used in manufacturing an electronic device in
accordance with an embodiment of the present invention.
[0015] FIG. 4A is an exploded perspective view of an illustrative
device under test, pad extender, and test tray in accordance with
an embodiment of the present invention.
[0016] FIG. 4B is a perspective view of an illustrative device
under test, pad extender, and test tray in accordance with an
embodiment of the present invention.
[0017] FIG. 5A is a top perspective view of an illustrative test
tray in accordance with an embodiment of the present invention.
[0018] FIG. 5B is a bottom perspective view of an illustrative test
tray in accordance with an embodiment of the present invention.
[0019] FIG. 5C is a perspective view of an illustrative test tray
in which a device under test has been mounted in accordance with an
embodiment of the present invention.
[0020] FIG. 6 is a diagram of a portion of a test system in which
test trays are automatically moved from a first conveyor to a
pedestal and from the pedestal to a second conveyor in accordance
with an embodiment of the present invention.
[0021] FIG. 7 is a top view of the first conveyor belt in showing
how a test tray on the first conveyor belt may be picked up by a
first device under test grabber in accordance with an embodiment of
the present invention.
[0022] FIG. 8 is a cross-sectional side view of a device under test
grabber arm that has engaged a mating test tray in accordance with
an embodiment of the present invention.
[0023] FIG. 9 is a perspective view of a device under test grabber
arm that is holding a test tray in accordance with an embodiment of
the present invention.
[0024] FIGS. 10 and 11 are perspective views of a test system in
which a first loader is being used to load test trays onto a
pedestal while a second loader is being used to load test trays
onto a conveyor from the pedestal in accordance with an embodiment
of the present invention.
[0025] FIGS. 12-14 are perspective views of a test system in which
a single loader is used to load test trays onto a pedestal and to
load test trays onto a conveyor from the pedestal in accordance
with an embodiment of the present invention.
[0026] FIG. 15 is a flow chart of illustrative steps involved in
operating the test system of FIG. 6 in accordance with an
embodiment of the present invention.
DETAILED DESCRIPTION
[0027] Electronic devices such as electronic device 10 of FIG. 1
may be manufactured using automated manufacturing equipment. The
automated manufacturing equipment may include equipment for
assembling device components together to form an electronic device.
The automated manufacturing equipment may also include testing
systems for evaluating whether devices have been properly assembled
and are functioning properly.
[0028] Devices such as device 10 of FIG. 1 may be assembled and
tested using an automated manufacturing system. The manufacturing
system may include one or more stations such as one or more test
stations for performing testing operations.
[0029] Devices that are being tested in a test system may sometimes
be referred to as devices under test (DUTs). Devices under test may
be provided to the test stations using a conveyor belt, using
robotic arms, or using other loading equipment.
[0030] Any suitable device may be tested using test equipment. As
an example, device 10 of FIG. 1 may be tested. Device 10 may be a
computer monitor with an integrated computer, a desktop computer, a
television, a notebook computer, other portable electronic
equipment such as a cellular telephone, a tablet computer, a media
player, a wrist-watch device, a pendant device, an earpiece device,
other compact portable devices, or other electronic equipment. In
the configuration shown in FIG. 1, device 10 is a handheld
electronic device such as a cellular telephone, media player,
navigation system device, or gaming device.
[0031] As shown in FIG. 1, device 10 may include a housing such as
housing 12. Housing 12, which may sometimes be referred to as a
case, may be formed of plastic, glass, ceramics, fiber composites,
metal (e.g., stainless steel, aluminum, etc.), other suitable
materials, or a combination of these materials. In some situations,
parts of housing 12 may be formed from dielectric or other
low-conductivity material. In other situations, housing 12 or at
least some of the structures that make up housing 12 may be formed
from metal elements.
[0032] Device 10 may, if desired, have a display such as display
14. Display 14 may be a touch screen that incorporates capacitive
touch electrodes or may be insensitive to touch. Display 14 may
include image pixels formed from light-emitting diodes (LEDs),
organic LEDs (OLEDs), plasma cells, electrophoretic display
elements, electrowetting display elements, liquid crystal display
(LCD) components, or other suitable image pixel structures. A cover
glass layer may cover the surface of display 14. Openings for
buttons such as button 20, openings for speaker ports such as
speaker port 22, and other openings may be formed in the cover
layer of display 14, if desired.
[0033] The central portion of display 14 (i.e., active region 16)
may include active image pixel structures. The surrounding
rectangular ring-shaped inactive region (region 18) may be devoid
of active image pixel structures. If desired, the width of inactive
region 18 may be minimized (e.g., to produce a borderless
display).
[0034] Device 10 may include components such as front-facing camera
24. Camera 24 may be oriented to acquire images of a user during
operation of device 10. Device 10 may include sensors in portion 26
of inactive region 18. These sensors may include, for example, an
infrared-light-based proximity sensor that includes an
infrared-light emitter and a corresponding light detector to emit
and detect reflected light from nearby objects. The sensors in
portion 26 may also include an ambient light sensor for detecting
the amount of light that is in the ambient environment for device
10. Other types of sensors may be used in device 10 if desired. The
example of FIG. 1 is merely illustrative.
[0035] Device 10 may include input-output ports such as port 28.
Port 28 may include audio input-output ports, analog input-output
ports, digital data input-output ports, or other ports.
[0036] Sensors such as the sensors associated with region 26 of
FIG. 1, cameras such as camera 24, buttons such as button 20, and
ports such as port 28 may be located on any suitable portion of
device housing 12 (e.g., a front housing face such as a display
cover glass portion, a rear housing face such as a rear planar
housing wall, sidewall structures, etc.). For example, buttons such
as button 21 may be located on a sidewall portion of housing
12.
[0037] A schematic diagram of an electronic device such as
electronic device 10 is shown in FIG. 2. As shown in FIG. 2,
electronic device 10 may include storage and processing circuitry
27. Storage and processing circuitry 27 may include storage such as
hard disk drive storage, nonvolatile memory (e.g., flash memory or
other electrically-programmable-read-only memory configured to form
a solid state drive), volatile memory (e.g., static or dynamic
random-access-memory), etc. Processing circuitry may be based on
one or more microprocessors, microcontrollers, digital signal
processors, baseband processors, power management units, audio
codec chips, application specific integrated circuits, etc.
[0038] Storage and processing circuitry 27 may be used to run
software on device 10, such as internet browsing applications,
voice-over-internet-protocol (VOIP) telephone call applications,
email applications, media playback applications, operating system
functions, etc. To support interactions with external equipment,
storage and processing circuitry 27 may be used in implementing
communications protocols. Communications protocols that may be
implemented using storage and processing circuitry 27 include
internet protocols, wireless local area network (WLAN) protocols
(e.g., IEEE 802.11 protocols--sometimes referred to as WiFi.RTM.),
protocols for other short-range wireless communications links such
as the Bluetooth.RTM. protocol, cellular telephone protocols,
etc.
[0039] Circuitry 27 may be configured to implement control
algorithms that control the use of antennas in device 10. For
example, to support antenna diversity schemes and MIMO schemes or
beam forming or other multi-antenna schemes, circuitry 27 may
perform signal quality monitoring operations, sensor monitoring
operations, and other data gathering operations and may, in
response to the gathered data, control which antenna structures
within device 10 are being used to receive and process data. As an
example, circuitry 27 may control which of two or more antennas is
being used to receive incoming radio-frequency signals, may control
which of two or more antennas is being used to transmit
radio-frequency signals, may control the process of routing
incoming data streams over two or more antennas in device 10 in
parallel, etc.
[0040] Input/output circuitry 29 may be used to allow data to be
supplied to device 10 and to allow data to be provided from device
10 to external devices. Input/output circuitry 29 may include
input/output devices 31. Input/output devices 31 may include touch
screens, displays without touch sensor capabilities, buttons,
joysticks, click wheels, scrolling wheels, touch pads, key pads,
keyboards, microphones, speakers, tone generators, vibrators,
cameras, sensors, light-emitting diodes and other status
indicators, light sources, audio jacks and other audio port
components, data ports, light sensors, motion sensors
(accelerometers), capacitance sensors, proximity sensors, etc. A
user can control the operation of device 10 by supplying commands
through input/output devices 31 and may receive status information
and other output from device 10 using the output resources of
input/output devices 31.
[0041] Wireless communications circuitry 33 may include
radio-frequency (RF) transceiver circuitry formed from one or more
integrated circuits, power amplifier circuitry, low-noise input
amplifiers, passive RF components, one or more antennas,
transmission lines, and other circuitry for handling RF wireless
signals. Wireless signals can also be sent using light (e.g., using
infrared communications).
[0042] Wireless communications circuitry 33 may include satellite
navigation system receiver circuitry 35, transceiver circuitry such
as transceiver circuitry 37 and 39, and antenna circuitry such as
antenna circuitry 41. Satellite navigation system receiver
circuitry 35 may be used to support satellite navigation services
such as United States' Global Positioning System (GPS) (e.g., for
receiving satellite positioning signals at 1575 MHz) and/or other
satellite navigation systems.
[0043] Transceiver circuitry 37 may handle 2.4 GHz and 5 GHz bands
for WiFi.RTM. (IEEE 802.11) communications and may handle the 2.4
Bluetooth.RTM. communications band. Circuitry 37 may sometimes be
referred to as wireless local area network (WLAN) transceiver
circuitry (to support WiFi.RTM. communications) and Bluetooth.RTM.
transceiver circuitry. Circuitry 33 may use cellular telephone
transceiver circuitry (sometimes referred to as cellular radio) 39
for handling wireless communications in cellular telephone bands
such as bands at 850 MHz, 900 MHz, 1800 MHz, 1900 MHz, and 2100 MHz
or other cellular telephone bands of interest.
[0044] Examples of cellular telephone standards that may be
supported by wireless circuitry 33 and device 10 include: the
Global System for Mobile Communications (GSM) "2G" cellular
telephone standard, the Evolution-Data Optimized (EVDO) cellular
telephone standard, the "3G" Universal Mobile Telecommunications
System (UMTS) cellular telephone standard, the "3G" Code Division
Multiple Access 2000 (CDMA 2000) cellular telephone standard, and
the "4G" Long Term Evolution (LTE) cellular telephone standard.
Other cellular telephone standards may be used if desired. These
cellular telephone standards are merely illustrative.
[0045] Wireless communications circuitry 33 may include circuitry
for other short-range and long-range wireless links if desired. For
example, wireless communications circuitry 33 may include wireless
circuitry for receiving radio and television signals, paging
circuits, etc. In WiFi.RTM. and Bluetooth.RTM. links and other
short-range wireless links, wireless signals are typically used to
convey data over tens of hundreds of feet. In cellular telephone
links and other long-range links, wireless signals are typically
used to convey data over thousands of feet or miles.
[0046] Wireless communications circuitry 33 may include one or more
antennas 41. Antennas 41 may be formed using any suitable antenna
type. For example, antennas 41 may include antennas with resonating
elements that are formed from loop antenna structures, patch
antenna structures, inverted-F antenna structures, slot antenna
structures, planar inverted-F antenna structures, helical antenna
structures, hybrids of these designs, etc. Different types of
antennas may be used for different bands and combinations of bands.
For example, one type of antenna may be used in forming a local
wireless link antenna and another type of antenna may be used in
forming a remote wireless link antenna.
[0047] FIG. 3 is a diagram of an illustrative system of the type
that may be used for manufacturing operations such as device
testing. As shown in FIG. 3, system 30 may include one or more
stations such as test stations 36. In general, test system 30 may
include automated equipment that is used in loading and unloading
devices under test, in conveying devices under test between test
stations, and in performing tests and maintaining a database of
test results. Each test station 36 may, for example, include test
equipment for performing one or more tests on device under test 10.
For example, a first type of test station 36 may have equipment for
testing a display in DUT 10. A second type of test station 36 may
have equipment for testing an audio component in DUT 10. Yet
another type of test station 36 may have equipment for testing
light sensors in DUT 10. Yet another type of test station 36 may
have equipment for testing wireless communications circuitry in DUT
10. If desired, test system 30 may include more than one test
station of the same type arranged along conveyor belt 38 so that
multiple DUTs can be tested in parallel.
[0048] Device under test 10 may, if desired, be installed in a test
tray such as tray 32. Tray 32 may be configured to receive one or
more devices under test. For example, tray 32 may have multiple
slots, each of which is configured to receive a corresponding
device under test. If desired, tray 32 may be configured to receive
only a single device under test.
[0049] Device 10 may be installed in test tray 32 manually or using
automated equipment. To facilitate manual installation, test tray
32 may include features to facilitate human manipulation. For
example, test tray 32 may include features that help an operator
open and close clamps or other device holding features in test tray
32. Device under test 10 that is mounted in test tray 32 may be
conveyed between test stations 36 using a conveyor belt such as
conveyor belt 38 (e.g., a belt that moves in direction 40). DUT 10
may be tested using at least some of test stations 36 as DUT 10
travels down conveyor belt 38.
[0050] It may be desirable to regulate the rate at which devices
under test are placed on conveyor 38 in system 30. Test system 30
may include loading equipment such as loading equipment 200
configured to place test trays 32 on conveyor belt 38 so that test
trays 32 are not spaced too closely or too far apart from one
another. With this type of arrangement, test tray 32 may serve as
an interface between DUT 10 and loading equipment 200. Test tray 32
may, for example, be more robust than DUT 10, may have engagement
features that are configured to mate with loading equipment 200,
may have an identification number that facilitates tracking, and
may have other features that facilitate loading of DUT 10 onto
conveyor belt 38.
[0051] For example, loading equipment 200 may be provided with one
or more computer-controlled positioning arms. The positioning arms
in loading equipment 200 may be used in picking up a test tray
(i.e., a test tray that is loaded with DUT 10) that is provided
from a test operator, placing the test tray on a temporary test
tray dock, picking up the test tray from the temporary test tray
dock at a later point in time, and then placing the test tray on
conveyor belt 38 for testing. Handling test trays 32 in this way
serves to synchronize the rate at which the test operator provides
test trays 32 to loading equipment 200 with the rate at which the
automated positioning arms in loading equipment 200 place test
trays 32 on conveyor belt 38 for optimal test throughput.
[0052] Using the system of FIG. 3, an operator may place test trays
32 on a feed conveyor belt that is part of loading equipment 200.
Test trays 32 may be sequentially loaded onto conveyor belt 38 at
predetermined time intervals so that DUT 10 on each test tray 32
can be tested using test stations 36. After testing, test trays 32
may be picked up at the end of conveyor 38 by another operator. The
test trays that are retrieved from the end of conveyor 38 may, as
an example, be placed in a test tray cart or may be fed into
additional systems.
[0053] Test stations 36 may provide test results to computing
equipment such as test host 42 (e.g., one or more networked
computers) for processing. Test host 42 may maintain a database of
test results, may be used in controlling the rate at which loading
equipment 200 loads test trays onto conveyor belt 38 (e.g., by
sending commands via path 41), may be used in sending test commands
to test stations 36 (e.g., by sending commands via path 43), may
track individual trays and devices under test as the trays and
devices pass through system 30, and may perform other control
operations.
[0054] FIG. 4A is a diagram showing how device under test 10 may be
received within test tray 32. As shown in FIG. 4A, test tray 32 may
have sidewalls 100 that are configured to receive a device under
test such as DUT 10. Device under test 10 may have one or more
connector ports such as port 28 (see, e.g., FIG. 1).
A pad extender such as pad extender 144 may have a mating connector
such as plug 146. Plug 146 may be configured to mate with a
connector in port 28 when DUT 10 has been mounted in test tray 32
and when pad extender 144 has been moved towards DUT 10 in
direction 148.
[0055] Following insertion of DUT 10 into test tray 32 and
following insertion of plug connector 146 of pad extender 144 into
connector 28 of DUT 10, test tray 32 of FIG. 4A may appear as shown
in FIG. 4B. Pad extender 144 may contain signal paths that connect
pins in connector 28 to corresponding contacts 62 on pad extender
144. Contacts 62 may be configured to mate with corresponding
contacts coupled to tester 44 and/or test host 42 during testing in
system 30.
[0056] Because DUT 10 is connected to test contacts 62 in test tray
32 using pad extender 144 associated with test tray 32, it is not
necessary to repeatedly connect and disconnect device under test 10
from cabling at each test station 36. Rather, connections between
DUT 10 and the test equipment at each test station 36 by may be
formed by coupling contacts 62 in test tray 32 to corresponding
contacts (e.g., spring-loaded pins) in each test station 36. By
minimizing the number of times that cables need to be connected and
disconnected from each device under test, the life of tester cables
and connectors may be extended.
[0057] The use of test tray 32 and loader 46 may allow DUT 10 to be
placed accurately within test stations 36 (e.g., with an accuracy
of +/-0.1 mm or better, as an example). Test tray 32 may shield
device under test 10 from scratches and other damage during
testing. In general, DUT 10 may be received within test tray 32 in
either an upwards facing configuration in which display 14 faces
outwards away from tray 32 or a downwards facing configuration in
which display 14 faces downwards onto the base of test tray 32.
[0058] FIG. 5A is a perspective view of one suitable embodiment of
test tray 32. Tray 32 may be formed using non-marring material such
as acetyl plastic, Delrin.RTM. (a polyoxymethylene plastic), other
plastics, or other suitable non-marring materials. The use of
non-marring materials may help avoid scratches or other damage to
DUT 10 when DUT 10 is placed within test tray 32. In the example of
FIG. 5A, a layer of material 156 may be formed to line the base of
recess 154. As an example, material 156 may be formed using the
same material that is used to form tray 32. As another example,
material 156 may be formed using elastomeric material such as
rubberized foam. Material 156 may, in general, be formed using any
suitable non-marring material.
[0059] Test tray 32 may be provided with guide structures
configured to accurately place device under test 10 in a desired
location within a recess 154 in tray 32. As shown in FIG. 5A, a
guide structure on the end of tray 32 may have an exposed end guide
surface such as guide surface 152. Guide structures on the side of
tray 32 may have exposed side guide surfaces such as guide surfaces
150.
[0060] FIG. 5C is a perspective view of test tray 32 after a device
under test has been inserted into test tray 32. As shown in FIG.
5C, test tray 32 may have clamps 162 for holding device under test
10 within test tray 32. The inner surfaces of clamps 162 may serve
as guide surfaces 150 (FIG. 5A).
[0061] Test tray 32 may also include engagement features such as
holes 160 formed on both ends of tray 32 (see, e.g., top
perspective view of tray 32 in FIG. 5A and bottom perspective view
of tray 32 in FIG. 5B). Holes such as holes 160 in test tray 32 or
other engagement features may be configured to mate with
corresponding engagement features on automated loading equipment
such as equipment 200 for loading test trays onto conveyor belt 38
and loading equipment in each test station 36 for picking up an
incoming test tray for testing. For example, holes 160 may be
configured to receive corresponding pins from at least one robotic
arm in loading equipment 200. The example of FIG. 5A, 5B, and 5C in
which tray 32 includes eight holes for engaging with automated
loading equipment is merely illustrative. If desired, tray 32 may
include at least four holes, at least six holes, at least ten
holes, etc.
[0062] FIG. 6 is a diagram showing one suitable configuration of
loading equipment 200. As shown in FIG. 6, loading equipment 200
may include a feed conveyor belt 270, a fixed test tray support
fixture (sometimes referred to herein as a temporary test tray dock
or "pedestal") 282, and loaders such as loaders 280 and 284.
[0063] Initially, a test system operator or automated loading
equipment may place devices in test trays 32 onto conveyor belt 270
at location 290. Safety wall 268 may prevent the operator or
automated loading equipment from placing test tray 32 farther along
conveyor 270. The height H of safety wall 268 may be configured so
that only a single test tray 32 can pass between the upper surface
of conveyor belt 270 and the lower surface of safety wall 268 at a
time. The presence of safety wall 268 may therefore be used to
ensure that there is only one layer of test trays 32 on conveyor
270. The speed of conveyor 270 may be computer controlled (if
desired). Light sensor 272 may be used to monitor the flow of test
trays 32 on conveyor 270. For example, conveyor 270 may run
continuously until sensor 272 detects the presence of a test tray,
at which point conveyor 270 may be temporarily halted to await
unloading using loader 280. If desired, a tray stop structure such
as tray stop structure 400 may be placed at an end of conveyor 270
for guiding the test tray to a desired position for pickup.
[0064] Loader 280 may be used to pick up test tray 32 from conveyor
270. Loader 280 may include a computer-controlled positioner such
as positioner 274 and a grabber head such as grabber 276 that is
positioned by positioner 274. Positioner 274 may be controlled
using commands sent from test host 42 over path 41. Grabber 276 may
contain computer-controlled actuators and engagement features such
as pins that mate with corresponding engagement features such as
holes 160 in test tray 32. Loader 280 may be used to move test
trays 32 from conveyor belt 270 to pedestal 282.
[0065] As test tray 32 is being moved from conveyor 270 to pedestal
282, a sensor such as sensor 273 may be used to identify the test
tray. For example, sensor 202 may be a radio-frequency
identification (RFID) sensor configured to identify a serial number
associated with the incoming tray 32 and may forward the identified
serial number to test host 42 via path 41. Operated in this way,
test host 42 may be used to keep track of each test tray 32 that is
provided to test system 30 for testing.
[0066] Loader 280 may be configured to place an incoming test tray
onto one of multiple possible locations on pedestal 282. In the
example of FIG. 6, pedestal 282 includes first, second, and third
regions on which test trays 32 may be placed. Light-based sensors
such as sensors 283-1, 283-2, and 283-3 may be used to detect
whether each of the three regions is currently vacant. In
particular, sensor 283-1 may be used to determine whether a test
tray is currently placed on the first region of pedestal 282;
sensor 283-2 may be used to determine whether a test tray is
currently placed on the second region of pedestal 282; and sensor
283-3 may be used to determine whether a test tray is currently
placed on the third region of pedestal 282. Loader 280 may be
configured to place the incoming test tray onto a vacant region on
pedestal 282. If all the regions on pedestal 282 are occupied,
loader 280 may wait until at least one region on pedestal 282
becomes available.
[0067] Loader 284 may be used to unload pedestal 282 (e.g., to move
test trays 32 from pedestal 282 to conveyor 38). Loader 284 may
include computer-controlled positioner 286 and a grabber head such
as grabber 288 that is positioned by positioner 286. Positioner 286
may be controlled using commands sent from test host 42 over path
41. Grabber 288 may also contain computer-controlled actuators for
grasping test trays 32 (e.g., grabber 288 may also include
engagement features such as pins that mate with corresponding holes
160 in test tray 32).
[0068] The speed of conveyor 38 is preferably fixed. At even time
intervals (e.g., every 15 seconds plus or minus an allowed
variation of a few seconds), loader 284 may move a selected one of
test trays 32 from pedestal 282 to end position 292 of conveyor
belt 38, thereby ensuring that test trays 32 are evenly spaced at a
desired distance D from each other along the surface of conveyor
belt 38. Conveyor belt 38 may be used to convey test trays 32 to
test stations 36 in test system 30 for testing.
[0069] Pedestal 282 used as such may therefore serve as an input
buffer for test system 30. In general, the rate at which test trays
are being transferred from conveyor 270 to pedestal 282 is at least
equal to or greater than the rate at which test trays are being
transferred from pedestal 282 onto conveyor 38. This ensures that
there is at least one test tray on pedestal 282 at any given point
in time available to be moved onto conveyor 38 for optimal test
throughput. The example of FIG. 6 in which pedestal 282 provides
three possible regions on which test trays can be placed is merely
illustrative. In other suitable arrangements, pedestal 282 may
provide at least one test tray region, at least two test tray
regions, at least four test tray regions, etc. Any suitable number
of light-based sensors may be used to facilitate detection of test
trays on the different test tray regions.
[0070] Each of grabbers 276 and 288 may include a contractible
member such as member 402 that can be actuated using air-driven or
motor-driven actuators. FIG. 7 is a top view of an end portion of
conveyor 270 in test system 30. Initially, DUT 10 and test tray 32
may be located on the left hand side of conveyor belt 270. As
conveyor belt 270 moves to the right, DUT 10 and test tray 32 may
make physical contact with corresponding guide surfaces of tray
stop structure 400 (e.g., tray stop structure 400 may help
horizontally situate test tray 32 on the top surface of conveyor
270 so that grabber 276 can properly engage with test tray 32).
Grabber 276 may have engagement features such as pins 404 for
mating with holes 160 in test tray 32.
[0071] When test tray 32 is ready to be picked up, grabber 276 may
be lowered to a pick-up position so that pins 404 are aligned with
test tray holes 160. Initially, pins 404 may be held in a retracted
position. After pins 404 and holes 160 are aligned, actuators such
as actuators 406 may be used to extend pins 404 into holes 160
(see, e.g., perspective view of FIG. 9). Once grabber 276 has
grasped test tray 32 in this way, grabber 276 may deliver test tray
32 to pedestal 282.
[0072] FIG. 8 is a cross-sectional end view of grabber 276 showing
how actuators may insert pins 404 into holes 160 in test tray 32 so
that test tray 32 may be picked up from conveyor belt 270. As with
grabber 276, grabber 288 may similarly be configured to grasp test
tray 32 when transporting test tray 32 from pedestal 282 to
conveyor belt (e.g., using actuator-driven pins 404 to engage with
holes 160 on test tray 32).
[0073] As shown in FIG. 10, loader 280 may include a horizontally
extending rail such as rail 300 and a vertically extending rail
such as rail 302. Grabber 276 may travel up and down vertical rail
302 along vertical axis Y. Vertical rail 302 may move laterally
along rail 300 along horizontal axis X. Loader 284 may likewise
include horizontal and vertical rails. Grabber 288 may move up and
down vertical rail 306. Rail 306 may move laterally along rail
304.
[0074] In the configuration shown in FIG. 10, loader 280 is being
used to pick up a test tray from conveyor 270 to deposit on
pedestal 282, whereas loader 284 is being used to deposit a test
tray that was picked up from pedestal 282 on conveyor 38. In the
configuration shown in FIG. 11, loader 280 is using grabber 276 to
deposit a test tray on pedestal 282, whereas loader 284 is being
used to pick up a test tray from pedestal 282 that is to be moved
to conveyor 38.
[0075] The arrangement of FIGS. 6, 10, and 11 in which loading
equipment 200 includes two loaders 280 and 284 is merely
illustrative and does not serve to limit the scope of the present
invention. If desired, loading equipment 200 may include a single
loader 280 that can be used to transport test trays from conveyor
270 to pedestal 282 and to transport test trays from pedestal 282
to conveyor 38 (see, e.g., FIGS. 12, 13, and 14). As shown in FIG.
12, loader 280 may include a horizontal rail such as rail 300 that
extends from the end portion of feed conveyor 270 to a leading
portion of conveyor 38. Loader 280 may also include a vertically
extending rail such as rail 302 that can travel along rail 300
(parallel to axis X). Grabber 276 may travel up and down vertical
rail 302 along vertical axis Y.
[0076] In the configuration shown in FIG. 12, loader 280 is being
used to pick up a test tray from conveyor 270 to deposit on
pedestal 282. In the configuration shown in FIG. 13, loader 280 is
using grabber 276 to deposit a test tray on pedestal 282. In the
configuration shown in FIG. 14, loader 280 is using grabber 276 to
deposit a test tray that has been picked up from pedestal 282 on
conveyor 38.
[0077] Pedestal 282 as shown in FIGS. 10-14 having five possible
regions for receiving test trays is merely illustrative. In
general, pedestal 282 may include any number of test tray receiving
regions, and any number of loaders and associated grabbers may be
used to transport test trays from feed conveyor 270 to pedestal 282
and from pedestal 282 to test conveyor 38.
[0078] A flow chart of illustrative steps involved in using system
30 of FIG. 6 is shown in FIG. 15. At step 310, an operator or
automated loading equipment may place one of test trays 32 on feed
conveyor 270. Conveyor 270 may move test tray 32 until sensor 272
detects the presence of test tray 32. Once sensor 272 detects test
tray 32 (step 312), conveyor 270 may be momentarily halted.
[0079] At step 314, grabber head 276 of loader 280 may be
positioned over test tray 32. At step 316, grabber head 276 may be
used to grab test tray 32.
[0080] At step 318, positioner 280 may move test tray 32 from
conveyor 270 to pedestal 282. At step 320, positioner 280 may
release test tray 32 on pedestal 282. Once the test tray has been
transferred from conveyor 270 to pedestal 282 in this way, another
test tray may be moved into position under sensor 272 using
conveyor 270 (step 322).
[0081] As the test tray loading process of steps 310, 312, 314,
316, 318, 320, and 322 is being performed to load test trays onto
pedestal 282, loader 284 may be independently used to transfer test
trays 32 from pedestal 282 to conveyor 38 (step 324). In
particular, loader 284 may, in response to control commands from a
computer, move test trays 32 one at a time from pedestal 282 and to
conveyor 38, depositing test trays 32 on conveyor 38 at desired
time intervals (e.g., at a fixed time period of about 3 seconds).
By loading test trays 32 onto conveyor 38 at fixed time intervals,
the spacing D between adjacent test trays may be controlled (e.g.,
so that D has a fixed value of about 1 m). If desired, loader 280
may also be used to move test trays 32 from pedestal 282 to
conveyor 38 in response to control commands from test host 42
(e.g., second loader 284 need not be used).
[0082] The foregoing is merely illustrative of the principles of
this invention and various modifications can be made by those
skilled in the art without departing from the scope and spirit of
the invention. The foregoing embodiments may be implemented
individually or in any combination.
* * * * *