U.S. patent application number 13/324795 was filed with the patent office on 2013-06-13 for sensor and inspection system deploying an optical conduit.
This patent application is currently assigned to General Electric Company. The applicant listed for this patent is Boris Leonid Sheikman, Nathan Andrew Weller. Invention is credited to Boris Leonid Sheikman, Nathan Andrew Weller.
Application Number | 20130146753 13/324795 |
Document ID | / |
Family ID | 47678477 |
Filed Date | 2013-06-13 |
United States Patent
Application |
20130146753 |
Kind Code |
A1 |
Sheikman; Boris Leonid ; et
al. |
June 13, 2013 |
SENSOR AND INSPECTION SYSTEM DEPLOYING AN OPTICAL CONDUIT
Abstract
Embodiments of an inspection system comprise a conduit that can
transmit light between a sensor and a processing component. In one
embodiment, the sensor comprises an element that generates an
electromagnetic field in response to an input from the processing
component. The input comprises a light signal that traverses the
conduit to the sensor. The sensor converts the light signal to an
electrical signal to operate the element. In one example, the
sensor generates a plurality of light signals, which also traverse
the conduit to the diagnostic component where the lights signals
are processed to determine, in one example, proximity of an object
to the sensor.
Inventors: |
Sheikman; Boris Leonid;
(Minden, NV) ; Weller; Nathan Andrew;
(Gardnerville, NV) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Sheikman; Boris Leonid
Weller; Nathan Andrew |
Minden
Gardnerville |
NV
NV |
US
US |
|
|
Assignee: |
General Electric Company
Schenectady
NY
|
Family ID: |
47678477 |
Appl. No.: |
13/324795 |
Filed: |
December 13, 2011 |
Current U.S.
Class: |
250/227.11 |
Current CPC
Class: |
G01B 7/023 20130101;
G01B 15/00 20130101 |
Class at
Publication: |
250/227.11 |
International
Class: |
G01J 1/04 20060101
G01J001/04 |
Claims
1. A sensor assembly, comprising: a sensor; an optical data conduit
coupled to the sensor; and a sensor signal processing and control
component coupled to the optical data conduit, wherein the sensor
and the sensor signal processing and control component exchange
light signals via the optical data conduit, wherein the sensor
comprises a photo-detector that can generate an electrical driving
signal, a directional coupler that directs the electrical driving
signal to an element that can generate an electromagnetic field in
response to the electrical driving signal and to a light source,
wherein the light source can generate a reverse reflected optical
signal in response to reflection of the electrical driving signal
in the element and a forward reflected signal with properties based
on properties of the electrical driving signal, and wherein the
sensor signal processing and control component comprises a
photo-detector that can convert the reverse reflected optical
signal to a reverse reflected processing signal that can identify
the proximity of an object to the sensor.
2. The sensor assembly of claim 1, wherein the properties include
frequency, phase, and amplitude of the electrical driving
signal.
3. The sensor assembly of claim 2, wherein the light source
comprises a first light emitting diode that can generate the
forward reflected optical signal and a second light emitting diode
that can generate the reverse reflected optical signal.
4. The sensor assembly of claim 1, wherein the photo-detector
comprises a photo-diode.
5. The sensor assembly of claim 1, further comprising an optical
filter coupled to the optical data conduit, wherein the optical
filter can direct the reverse reflected optical signal and the
forward reflected optical signal to a pair of photo-diodes.
6. An inspection system, comprising: an optical data conduit
coupled to a sensor signal processing and control component; and a
sensor coupled to the optical data conduit, the sensor comprising
an element that can generate an electromagnetic field in response
to an optical driving signal from the sensor signal processing and
control component, wherein the sensor generates a plurality of
optical signals that traverse the optical conduit, and wherein the
sensor signal processing and control component can generate one or
more processing signals from the optical signals that identify the
proximity of an object to the sensor.
7. The inspection system of claim 6, further comprising an
electrical signal oscillator, wherein the electrical signal
oscillator generates an electrical driving signal at a frequency
that can cause the electromagnetic field.
8. The inspection system of claim 7, wherein the frequency is 300
MHz or greater.
9. The inspection system of claim 6, wherein the optical signals
include a reverse reflected optical signal representative of
detuning of the element and a forward reflected optical signal with
properties based on properties of the electrical driving
signal.
10. The inspection system of claim 9, further comprising an optical
filter that receives the optical signals, wherein the optical
filter can separate the reverse reflected optical signal from a
forward reflected optical signal, wherein the forward reflected
optical signal has an amplitude and phase based on the electrical
driving signal.
11. The inspection system of claim 6, wherein the optical fiber
cable comprises a multimode cable that carries the optical signals
between the sensor and the sensor signal processing and control
component.
12. The inspection system of claim 6, further comprising a power
source coupled to the sensor.
13. The inspection system of claim 6, wherein the first light
source comprises a light emitting diode.
14. An inspection system, comprising: a plurality of light sources;
an optical fiber cable coupled to the plurality of light sources; a
plurality of photo-detectors coupled to the optical fiber cable;
and an element generating an electromagnetic field in response to
light that traverses the optical fiber cable from the light sources
to the photo-detectors, wherein the light sources generate a
forward reflected optical signal with properties based on an
electrical driving signal and a reverse reflected optical signal in
response to interference of an object with the electromagnetic
field, and wherein the photo-detectors convert the forward
reflected optical signal and the reverse reflected optical signal
to one or more processing signals that can quantify the proximity
of the object to the element.
15. The inspection system of claim 14, wherein the light sources
comprise light-emitting diodes.
16. The inspection system of claim 14, wherein the photo-detectors
comprise photo-diodes.
17. The inspection system of claim 14, further comprising an
oscillator coupled to one of the light sources, wherein the
oscillator can generate an electrical driving signal that can cause
the electromagnetic field.
18. The inspection system of claim 17, wherein the electrical
driving signal has frequency of about 300 Mhz or greater.
19. The inspection system of claim 14, further comprising a power
source coupled to the sensor.
20. The inspection system of claim 14, further comprising an
optical filter coupled to the optical fiber cable, wherein the
optical filter can direct light from a pair of the light sources to
a pair of the photo-detectors.
Description
BACKGROUND OF THE INVENTION
[0001] The subject matter disclosed herein relates to inspection
systems and, more particularly, to embodiments of inspection
systems that use light to operate a sensor.
[0002] Machines may exhibit abnormal behavior (e.g., excess
vibration) during operation. Inspection systems can measure this
abnormal behavior to provide an alarm or other indication of the
abnormal behavior. For example, these inspection systems may deploy
one or more sensors proximate the machine to determine an amount of
vibration, movement, or other operational characteristic of the
machine. The sensors provide signals to other components of the
inspection system, which can process the signals and, in one
example, display graphical representations of the data.
[0003] Many inspection systems use an electrical cable (e.g.,
copper cable, coaxial cable, etc.) to couple the sensor to
components that operate the sensor and/or receive and process
signals from the sensor. Signals that the electrical cables
transmit, however, are susceptible to noise, interference, and
other outside influences that can degrade and distort the signals.
Moreover, these problems become more pronounced as the length of
the electrical cable increases.
[0004] The discussion above is merely provided for general
background information and is not intended to be used as an aid in
determining the scope of the claimed subject matter.
BRIEF DESCRIPTION OF THE INVENTION
[0005] A proximity inspection system is disclosed, wherein the
proximity inspection system comprises a conduit that can transmit
light signals between a sensor and a signal processing and control
component. An advantage that may be realized in the practice of
some disclosed embodiments of the inspection system is the
reduction of distortion and other issues found in conventional
electrical cables, thereby increasing the possible separation
distance between the sensor and the diagnostic component.
[0006] This brief description of the invention is intended only to
provide an overview of subject matter disclosed herein according to
one or more illustrative embodiments, and does not serve as a guide
to interpreting the claims or to define or limit the scope of the
invention, which is defined only by the appended claims. This brief
description is provided to introduce an illustrative selection of
concepts in a simplified form that are further described below in
the detailed description. This brief description is not intended to
identify key features or essential features of the claimed subject
matter, nor is it intended to be used as an aid in determining the
scope of the claimed subject matter. The claimed subject matter is
not limited to implementations that solve any or all disadvantages
noted in the background.
BRIEF DESCRIPTION OF THE DRAWINGS
[0007] So that the manner in which the features of the invention
can be understood, a detailed description of the invention may be
had by reference to certain embodiments, some of which are
illustrated in the accompanying drawings. It is to be noted,
however, that the drawings illustrate only certain embodiments of
this invention and are therefore not to be considered limiting of
its scope, for the scope of the invention encompasses other equally
effective embodiments. The drawings are not necessarily to scale,
emphasis generally being placed upon illustrating the features of
certain embodiments of invention. In the drawings, like numerals
are used to indicate like parts throughout the various views. Thus,
for further understanding of the invention, reference can be made
to the following detailed description, read in connection with the
drawings in which:
[0008] FIG. 1 is a schematic diagram of an exemplary embodiment of
an inspection system; and
[0009] FIG. 2 is a schematic diagram of another exemplary
embodiment of an inspection system.
DETAILED DESCRIPTION OF THE INVENTION
[0010] FIG. 1 illustrates an exemplary embodiment of an inspection
system 100 that can measure, monitor, and inspect an object 102.
The inspection system 100 comprises a sensor 104 that can generate
an electromagnetic field 106 and a diagnostic component 108 with a
control component 110 and a processing component 112. The
inspection system 100 also comprises a power supply 114, which
supplies power (e.g., +5V DC) to the sensor 104, and one or more
peripheral devices such as a display 116 and/or a computing device
118. The inspection system 100 can be part of a network system 120,
which comprises a network 122 and one or more external servers
124.
[0011] The inspection system 100 also includes a first data conduit
125, which couples the sensor 104 to a signal processing and
control component 126. In one example, the sensor 104 and the
signal processing and control component 126 can be considered a
sensor assembly. The inspection system 100 also includes a second
data conduit 127 to couple the signal processing and control
component 126 to the diagnostic component 108. The first data
conduit 125 can transmit light and/or light signals to the sensor
104 and to the signal processing and control component 126. The
light signals are identified in the present example as a driving
light signal 128 and a receiving light signal 130.
[0012] Embodiments of the inspection system 100 convert electrical
signals to light signals (e.g., the driving light signal 128 and
the receiving light signal 130), and vice versa. The light signals
facilitate communication between the sensor 104 and the signal
processing and control component 126. Using light as the medium of
communication allows for greater separation between the sensor 104
and the signal processing and control component 126. Light is less
susceptible to, and generally unaffected by, noise and electrical
interference. These problems can distort signals that travel over
conventional electrical cables (e.g., copper cables). By
effectively eliminating distortion, embodiments of the inspection
system 100 permit separation of the sensor 104 from the signal
processing and control component 126 of at least about 8230 mm (27
feet) and greater allowing for the length of the first data conduit
125 to be greater than the length of equivalent electrical cable.
Moreover, the lack of distortion using light signals permits the
use of higher frequency devices (e.g., the sensor 104), which
provide more accurate and effective measurement and which are
particularly useful for measuring in the near field region.
[0013] The sensor 104 can substitute for known eddy current
sensors, magnetic pickup sensors, and capacitive sensors. Examples
of the sensor 104 can measure the proximity and/or distance to the
object 102. Other examples can find use in any number of
applications. Some applications may entail static detection where,
for example, the sensor 104 detects the proximity of the object 102
to measure expansion and/or contraction, e.g., of the object 102.
Other applications may deploy the sensor 104 for dynamic detection
in which the sensor 104 measures the proximity of the object 102 to
detect movement, e.g., vibration of a rotating turbine shaft.
[0014] The first data conduit 125 can comprise fiber optic and/or
optical fiber cable with one or more fiber elements that can
transmit light. Embodiments of the inspection system 100 can deploy
any number of optical fiber cables, e.g., an optical fiber cable
for the driving light signal 128 and, separately, an optical fiber
cable for the receiving light signal 130. In one embodiment, the
first data conduit 125 comprises a single optical fiber cable that
can transmit a plurality of different light signals between the
sensor 104 and the sensor signal processing and control component
126. A power cable can run co-extensively with (or as part of) the
optical fiber cable to transmit power from the power supply 114 to
the sensor 104.
[0015] Examples of the diagnostic component 108 can be an
independent component that receives signals which are
representative of the operating state of equipment in an industrial
setting. These signals can represent various operating conditions
such as temperature, speed, vibration, position, etc., of equipment
and assets in the industrial setting. The diagnostic component 108
can process these signals, generating in one example one or more
output signals, which is transmitted to additional components such
as a display, a supervisory control and data acquisition (SCADA)
system, etc.
[0016] In one embodiment, the control component 110 generates an
electrical signal at variable frequencies and states that can
control the operation and function of various plant assets. For
example, the control component 110 may vary the level of a DC
voltage which is used to control a valve that regulates the amount
of steam entering a turbine. Examples of the control component 110
include oscillators, relays, and voltage outputs. The processing
component 112 processes electrical signals and, in one example, can
compare two electrical signals to determine the difference there
between. Results of the comparison are expressed as a processed
signal and/or other electrical output.
[0017] The display 116 and the computing device 118 can display the
processed signal as a graphical representation of the data and/or
information encoded by the processed signal. Examples of the
devices can include an oscilloscope or related test instrument.
Other examples can also provide a graphical user interface (GUI) or
other display by which an end user can interface with the
diagnostic component 108, as well as other parts of the network
system 120. In one embodiment, the end user can manipulate the
processed signal such as by selecting and/or choosing different
settings, e.g., sampling rate of the data, sampling time periods,
variable frequency, variable voltage, etc.
[0018] The sensor signal processing and control component 126 can
generate the driving light signal 128. The sensor 104 uses the
driving light signal 128 to generate an electrical driving signal
(not shown), which causes the electromagnetic field 106 to form.
When object 102 interferes with the electromagnetic field 106, a
distortion is induced in the electromagnetic field 106, which is
sensed by the sensor 104. In one embodiment, the sensor 104 can
generate the receiving light signal 130 of a different wavelength
of light. The different wavelength differentiates the receiving
light signal 130 from the driving light signal 128. The receiving
light signal 130 is representative of the distortion, which is
created by the impedance mismatch when object 102 interferes with
the electromagnetic field 106.
[0019] FIG. 2 illustrates another embodiment of an inspection
system 200 to monitor an object 202 with an electromagnetic field
206. The inspection system 200 includes a first data conduit 225
and a second data conduit 227. The inspection system 200 also
includes a first light source 232, which is coupled to an
electrical signal oscillator 234, an optical filter 236, a first
photo-detector 238, a second light source 240, and a third light
source 242. The inspection system 200 also includes an element 244
that generates the electromagnetic field 206. A directional coupler
246 couples the first photo-detector 238, the second light source
240, and the third light source 242 to the element 244. The
inspection system 200 also includes a second photo-detector 248 and
a third photo-detector 250.
[0020] Also shown in FIG. 2 are a variety of signals (or "inputs
and outputs") that the inspection system 200 can generate. These
signals include electrical signals and light signals. Details of
the signals follow below in connection with a discussion of an
exemplary operation of the inspection system 200.
[0021] In one embodiment, the electrical signal oscillator 234
generates an electrical driving signal 252, which the first light
source 232 converts to an optical driving signal 254. This signal
traverses the first data conduit 225 to the first photo-detector
238, which converts the optical driving signal 254 back to an
electrical signal, shown as a restored driving signal 256. In one
example, the directional coupler 246 directs a portion of the
restored driving signal 256 as a forward reflected electrical
signal 258. The forward reflected electrical signal 258 has
properties (e.g., phase and frequency) consistent with and/or
proportional to and/or based on the properties of the restored
driving signal 256. In one example, the forward reflected
electrical signal 258 has the same frequency and phase properties
as the restored driving signal 256, but at a smaller amplitude.
[0022] The direction coupler 246 will also direct a portion of the
restored driving signal 256 to the element 244, which electrically
excites the element 244 and creates the electromagnetic field 206.
In one example, capacitive and/or inductive coupling of the object
202 to the electromagnetic field 206 "detunes" or changes the
resonant response of the element 244. These changes induce a
loading in the element 244, which causes the restored driving
signal 256 to reflect in the element 244 and out of the element 244
as a reverse reflected electrical signal 260.
[0023] The second light source 240 and the third light source 242
convert the forward reflected electrical signal 258 and the reverse
reflected electrical signal 260 to light signals and, more
particularly, to a forward reflected optical signal 262 and a
reverse reflected optical signal 264. These light signals traverse
the conduit 225. The forward reflected optical signal 262 and the
reverse reflected optical signal 264 may traverse the same cable
or, in another example, the conduit 225 may comprise separate
cables for the forward reflected optical signal 262 and the reverse
reflected optical signal 264. Likewise the optical driving signal
254, the forward reflected optical signal 262, and the reverse
reflected optical signal 264 may traverse the same and/or separate
cables, as desired.
[0024] Exemplary configurations of the optical filter circuit 236
can separate light of different wavelengths. This feature is
useful, for example, to separate light from the second light source
240 (e.g., the forward reflected optical signal 262) and light from
the third light source 242 (e.g., the reverse reflected optical
signal 264) particularly when this light traverses a single optical
fiber conduit. Prisms and similar optically arranged devices are
illustrative of the optical filter 238.
[0025] The second photo-detector 248 and the third photo-detector
250 can convert the forward reflected optical signal 262 and the
reverse reflected optical signal 264 to electrical signals such as
a forward reflected processing signal 266 and a reverse reflected
processing signal 268. Further processing of these electrical
signals can occur, e.g., at a processing component 212, which can
generate a difference signal (not shown). This signal defines the
characteristics, properties, relationship, and other aspects of the
object 202 that the inspection system 200 is to measure. In one
example, the difference signal is representative of the proximity
(mV/mm) of the object 202 relative to the sensor 204.
[0026] Embodiments of the inspection system 200 compare the forward
reflected processing signal 266 to the reverse reflected processing
signal 268, e.g., to determine changes in the position of the
object 202 relative to the element 244. The difference signal can
be displayed on a screen or other device (e.g., the display 116
and/or the computing device 118 of FIG. 1). Likewise the
information stored in the difference signal can be stored on memory
within a diagnostic component 208 or other locations (e.g., the
computing device 118 and the external servers 124 of FIG. 1) or
maintained for future use.
[0027] In one embodiment, one or more of the electrical signals are
microwave signals. As used herein, the term "microwave" refers to
signals with frequencies of about 300 MHz or greater and, in one
example, from about 300 MHz to about 300 GHz. In one embodiment,
the frequency of the electrical driving signal 252 is from about 3
MHz to about 6 GHz, although the frequency can vary in accordance
with the construction of the sensor 204 as discussed and
contemplated herein. Exemplary elements and materials for the
construction of the element 244 are generally recognized by
artisans having skill in the relevant sensor arts. In one example,
the frequency of the restored driving signal 256 is the same, or
substantially same, as the frequency of the electrical driving
signal 252 that the electrical signal oscillator 234 generates.
[0028] The light sources (e.g., the first light source 232, the
second light source 240, the third light source 242) can comprise
light emitting diodes (LEDs) as well as other light-emitting,
light-generating devices. The photo-detectors (e.g., the first
photo-detector 238, the second photo-detector 248, the third
photo-detector 250) can comprise photodiodes and/or other devices
that can convert light into an electrical signal, e.g., a voltage
or current. In context of the present example, and the present
disclosure as a whole, the photodiodes can receive light signals
from the LEDs and convert the light signals into electrical
signals. In one embodiment, the inspection system 200 deploy LEDs
with different wavelengths. Suitable wavelengths can vary from
about 700 nm to about 1600 nm, and are generally greater than about
850 nm. In one example, the LED for the first light source 232
generates light at 800 nm, the LED for the second light source 240
generates light at 1000 nm, and the third light source 242
generates light at 1300 nm.
[0029] Referring still to FIG. 2, embodiments of the inspection
systems 200 can also comprise a mixer 270, a processing filter 272,
and a signal linearizer 274, which takes the final voltage output
and makes it linear (rather than logarithmic or exponential). The
diagnostic component 208 can receive the resulting "linearized"
output, e.g., via the second data conduit 227.
[0030] Examples of the mixer 270 and the processing filter 272
facilitate signal processing functions such as functions that
compare the reference signal and the detuned signal (discussed
above and shown in FIG. 2). Artisans having skill in the relevant
signal processing and sensor arts will recognize the various
illustrative circuits, devices, and elements that the inspection
system can use to provide such comparative functionality, as well
as other functions that the present disclosure contemplates.
[0031] Although the present disclosure contemplates various
configurations of the components shown in FIGS. 1 and 2, in one
example, the sensor 204 can comprise the first photo-detector 238,
the second light source 240, the third light source 242, the
element 244, and the directional coupler 246. The signal processing
and control component 226 can comprise the first light source 232,
the electrical signal oscillator 234, the optical filter 236, the
second photo-detector 248, and the third photo-detector 250. In
still other embodiments, the signal processing and control
component 226 may include other components, e.g., the processing
component 212 and/or its components.
[0032] In addition to the components shown and described above, the
inspection system of the present disclosure can comprise one or
more processor(s), memory(s), and other auxiliary elements that
facilitate the functions and operations disclosed herein.
Processors can include one or more microcontrollers,
microprocessors, reduced instruction set circuits (RISC),
application specific integration circuits (ASIC), programmable
logic circuits (PLC), and field programmable gate arrays (FPGA).
The processors can also include state machine circuitry or other
suitable components capable of receiving inputs and generating
outputs. Memory can comprise volatile and non-volatile memory and
can be used for storage of executable instructions (e.g., software
and/or firmware) and configuration settings. In some embodiments,
the processors, the memory, and other circuitry can be contained in
a single integrated circuit (IC) or other component. As another
example, the processors can include integral program memory such as
RAM and/or ROM. Similarly, any one or more functions of these
components can be distributed across additional components (e.g.,
multiple processors or other components).
[0033] As used herein, an element or function recited in the
singular and proceeded with the word "a" or "an" should be
understood as not excluding plural said elements or functions,
unless such exclusion is explicitly recited. Furthermore,
references to "one embodiment" of the claimed invention should not
be interpreted as excluding the existence of additional embodiments
that also incorporate the recited features.
[0034] This written description uses examples to disclose the
invention, including the best mode, and also to enable any person
skilled in the art to practice the invention, including making and
using any devices or systems and performing any incorporated
methods. The patentable scope of the invention is defined by the
claims, and may include other examples that occur to those skilled
in the art. Such other examples are intended to be within the scope
of the claims if they have structural elements that do not differ
from the literal language of the claims, or if they include
equivalent structural elements with insubstantial differences from
the literal language of the claims.
* * * * *