U.S. patent application number 11/655416 was filed with the patent office on 2013-03-28 for high precision, rapid laser hole drilling.
This patent application is currently assigned to The Regents of the University of California. The applicant listed for this patent is Jim J. Chang, Brian J. Comaskey, Herbert W. Friedman. Invention is credited to Jim J. Chang, Brian J. Comaskey, Herbert W. Friedman.
Application Number | 20130075373 11/655416 |
Document ID | / |
Family ID | 25121595 |
Filed Date | 2013-03-28 |
United States Patent
Application |
20130075373 |
Kind Code |
A1 |
Chang; Jim J. ; et
al. |
March 28, 2013 |
High precision, rapid laser hole drilling
Abstract
A laser system produces a first laser beam for rapidly removing
the bulk of material in an area to form a ragged hole. The laser
system produces a second laser beam for accurately cleaning up the
ragged hole so that the final hole has dimensions of high
precision.
Inventors: |
Chang; Jim J.; (San Ramon,
CA) ; Friedman; Herbert W.; (Oakland, CA) ;
Comaskey; Brian J.; (Walnut Creek, CA) |
|
Applicant: |
Name |
City |
State |
Country |
Type |
Chang; Jim J.
Friedman; Herbert W.
Comaskey; Brian J. |
San Ramon
Oakland
Walnut Creek |
CA
CA
CA |
US
US
US |
|
|
Assignee: |
The Regents of the University of
California
|
Family ID: |
25121595 |
Appl. No.: |
11/655416 |
Filed: |
January 19, 2007 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
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11040588 |
Jan 20, 2005 |
7193175 |
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11655416 |
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09781073 |
Feb 8, 2001 |
6864459 |
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11040588 |
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Current U.S.
Class: |
219/121.7 |
Current CPC
Class: |
B23K 2103/04 20180801;
B23K 26/389 20151001; B23K 2103/52 20180801; B23K 2103/42 20180801;
B23K 26/382 20151001; B23K 2103/50 20180801; B23K 26/0613 20130101;
B23K 26/3576 20180801; B23K 26/40 20130101; B23K 2103/16
20180801 |
Class at
Publication: |
219/121.7 |
International
Class: |
B23K 26/38 20060101
B23K026/38 |
Goverment Interests
[0002] The United States Government has rights in this invention
pursuant to Contract No. W-7405-ENG-48 between the United States
Department of Energy and the University of California for the
operation of Lawrence Livermore National Laboratory.
Claims
1. Apparatus for drilling holes in a first material positioned on a
second material, wherein said first material has a bottom surface,
comprising, a laser system that produces a first laser beam for
rapidly removing the bulk of material in an area in said first
material to form a ragged hole in said first material, a control
connected to said laser system that controls said laser that
produces a first laser beam for rapidly removing the bulk of
material in an area in said first material to form a ragged hole in
said first material and stops said first laser beam in forming a
ragged hole before said ragged hole reaches said bottom surface
leaving a membrane between said ragged hole and said bottom
surface, and a second laser beam for accurately cleaning up said
ragged hole so that the final hole has dimensions of high
precision, wherein said control connected to said laser system
controls said second laser beam for accurately cleaning up said
ragged hole so that the final hole has dimensions of high precision
and for producing said final hole that has dimensions of high
precisions is produced through said membrane to said bottom surface
providing said final hole that has dimensions of high precisions
through the first material to the second material.
2. The apparatus of claim 1 wherein said first laser beam is an
infra-red laser beam.
3. The apparatus of claim 1 wherein said second laser beam is a low
power, short wavelength laser beam.
4. The apparatus of claim 1 wherein said first laser beam is an
infra-red laser beam and said second laser beam is a low power,
short wavelength laser beam.
5. The apparatus of claim 1 wherein said laser system has an
ablative mode for producing said first laser beam for rapidly
removing the bulk of material in an area to form a ragged hole.
6. The apparatus of claim 1 wherein said laser system has a
trepanning mode for producing said second laser beam for accurately
cleaning up said ragged hole so that the final hole has dimensions
of high precision.
7. The apparatus of claim 1 wherein said laser system has an
ablative mode for producing said first laser beam for rapidly
removing the bulk of material in an area to form a ragged hole and
a trepanning mode for producing said second laser beam for
accurately cleaning up said ragged hole so that the final hole has
dimensions of high precision.
8. An apparatus for drilling holes in a first material positioned
on a second material, wherein said first material has a bottom
surface, comprising, a laser system that produces a first laser
beam for rapidly removing the bulk of material in an area in said
first material to form a ragged hole in said first material, a
control connected to said laser system that controls said laser
that produces a first laser beam for rapidly removing the bulk of
material in an area in said first material to form a ragged hole in
said first material and stops said first laser beam in forming a
ragged hole before said ragged hole reaches said bottom surface
leaving a membrane between said ragged hole and said bottom
surface, and a second laser beam for accurately cleaning up said
ragged hole so that the final hole has dimensions of high
precision, wherein said control connected to said laser system
controls said second laser beam for accurately cleaning up said
ragged hole so that the final hole has dimensions of high precision
and for producing said final hole that has dimensions of high
precisions is produced through said membrane to said bottom surface
providing said final hole that has dimensions of high precisions
through the first material to the second material, wherein said
laser system comprises a single laser that produces said first
laser beam and said second laser beam.
9. An apparatus for drilling holes in a first material positioned
on a second material, wherein said first material has a bottom
surface, comprising, a laser system that produces a first laser
beam for rapidly removing the bulk of material in an area in said
first material to form a ragged hole in said first material, a
control connected to said laser system that controls said laser
that produces a first laser beam for rapidly removing the bulk of
material in an area in said first material to form a ragged hole in
said first material and stops said first laser beam in forming a
ragged hole before said ragged hole reaches said bottom surface
leaving a membrane between said ragged hole and said bottom
surface, and a second laser beam for accurately cleaning up said
ragged hole so that the final hole has dimensions of high
precision, wherein said control connected to said laser system
controls said second laser beam for accurately cleaning up said
ragged hole so that the final hole has dimensions of high precision
and for producing said final hole that has dimensions of high
precisions is produced through said membrane to said bottom surface
providing said final hole that has dimensions of high precisions
through the first material to the second material, wherein said
laser system comprises a first laser that produces said first laser
beam and a second laser that produces said second laser beam.
10. The apparatus of claim 9 wherein said control connected to said
laser system includes controls adapted to control said first laser
that produces said first laser beam for rapidly removing the bulk
of material in an area in said first material to form a ragged hole
in said first material and stops said first laser beam in forming a
ragged hole before said ragged hole reaches said bottom surface
leaving a membrane between said ragged hole and said bottom surface
so that the final hole does not extend entirely through said first
material.
11. (canceled)
12. The apparatus of claim 10 wherein said second laser beam breaks
through said thin membrane at the bottom of said hole.
Description
CROSS-REFERENCE TO RELATED APPLICATIONS
[0001] This application is a division of application Ser. No.
11/040,588 filed Jan. 20, 2005 entitled "High Precision, Rapid
Laser Hole Drilling" by inventors Jim J. Chang, Herbert W. Friedman
and Brian J. Comaskey.
BACKGROUND OF THE INVENTION
[0003] 1. Field of Endeavor
[0004] The present invention relates generally to laser drilling,
and more particularly to a method and apparatus for drilling a
hole.
[0005] 2. State of Technology
[0006] U. S. Pat. No. 6,172,331 for a method and apparatus for
laser drilling by Xiangli Chen, patented Jan. 9, 2001, states,
"Lasers are commonly used to drill holes in materials. In the
aerospace and power generation industries for example, lasers are
commonly used to drill air cooling holes in turbine airfoils such
as blades and vanes. A pulsed laser beam is directed at the
article, and molten material from the focus region of the laser
beam is expelled from the article. According to one known method, a
Nd:YAG laser generates pulses having a pulse energy of 10 joules, a
pulse duration of 1 millisecond, and a pulse repetition rate of 10
Hz, to drill holes in hollow turbine blades. The pulses are
generated in a `free running` mode in which the lamps are pulsed at
10 Hz to produce the pulsed laser beam."
[0007] The article, "Precision Micromachining with Pulsed Green
Lasers," by Jim J. Chang, Bruce E. Warner, Ernest P Dragon, and
Mark W. Martinez, Journal of Laser Applications, Vol. 10, No. 6,
pages 285-321, December 1998, states "Laser micromachining has
found expanded use in automobile, aerospace, and electronics
industries."
[0008] U. S. Pat. No. 4,870,244 for a method and device for
stand-off laser drilling and cutting, by John Q. Copley et al,
patented Sep. 26, 1989 shows a device for perforating material and
a method of stand-off drilling using a laser. In its basic form a
free-running laser beam creates a melt on the target and then a
Q-switched short duration pulse is used to remove the material
through the creation of a laser detonation wave. The advantage is a
drilling/cutting method capable of working a target at lengthy
stand-off distance. The device may employ 2 lasers or a single one
operated in a free-running/Q-switched dual mode. Applicants believe
that a disadvantage of this method is that with the high energy of
the free running laser which produces the melt zone, there may be a
large HAZ which may reduce the strength of the material surrounding
the hole. Also, the dimension precision of the hole is likely to be
poor.
[0009] U.S. Pat. No. 5,741,096 for a line-laser assisted alignment
apparatus, by Stephen P. Olds, patented Apr. 21, 1998 shows a line
laser assisted alignment apparatus that uses two laser line
generators to define a reference axis that is aligned to coincide
with an axis of a drill bit or other rotational tool. The reference
axis of the alignment apparatus is matched with a marked position
on a lower surface of an object that is to be worked by the drill
bit or other rotational tool. Applicants believe that this
technique improves the dimensional tolerance of the holes by aiding
in the alignment process but is not involved with the other
important features of precision hole drilling such as deep aspect
ratios and minimal HAZ.
SUMMARY OF THE INVENTION
[0010] The present invention provides a system for drilling holes
in a material. In one embodiment of the invention an apparatus
includes a laser system that produces a first laser beam for
rapidly removing the bulk of material in an area to form a ragged
hole and a second laser beam for accurately cleaning up the ragged
hole so that the final hole has dimensions of high precision. In
another embodiment of the invention the first laser beam is an
infra-red laser beam. The second laser beam is a low power, short
wavelength laser beam.
[0011] An embodiment of the present invention provides a method
producing a hole in a material using a first laser beam for rapidly
removing the bulk of material in an area to form a ragged hole and
a second laser beam for accurately cleaning up the ragged hole so
that the final hole has dimensions of high precision. The method
begins by the first laser operated in the ablative mode generating
a first laser beam. The first laser beam is directed at the
material where the hole is desired. The first laser beam removes
the bulk of the material and begins the process of forming a hole.
Subsequently a laser, operated in the trepanning mode, generates a
second laser beam. The second laser beam is directed into the hole
being formed to clean up the hole so that the resulting hole has
dimensions of high precision.
[0012] An embodiment of the present invention provides a piece with
a hole therein produced by the method of: generating a first laser
beam, directing the first laser beam at the piece to remove the
bulk of material in an area to form a ragged hole and begin forming
the hole, generating a second laser beam, and directing the second
laser beam at the hole being formed for accurately cleaning up the
ragged hole so that the final hole has dimensions of high
precision.
[0013] In an embodiment of the present invention provides a system
for drilling a hole in a material using a laser system that
produces a first laser beam for rapidly removing the bulk of
material in an area to form a ragged hole and a second laser beam
for accurately cleaning up the ragged hole so that the final hole
has dimensions of high precision. The first laser beam is
controlled so that the hole does not extend entirely through the
material. A thin membrane is left at the bottom of the hole. The
second laser beam breaks through the thin membrane at the bottom of
the hole.
[0014] Other features and advantages of the present invention will
become apparent from the following detailed description. It should
be understood, however, that the detailed description and the
specific examples, while indicating specific embodiments of the
invention, are given by way of illustration only, since various
changes and modifications within the spirit and scope of the
invention will become apparent to those skilled in the art from
this detailed description and by practice of the invention.
BRIEF DESCRIPTION OF THE DRAWINGS
[0015] The accompanying drawings, which are incorporated into and
constitute a part of the specification, illustrate specific
embodiments of the invention and, together with the general
description of the invention given above, and the detailed
description of the specific embodiments, serve to explain the
principles of the invention.
[0016] FIG. 1 illustrates the beginning of the process of drilling
of a hole with the use of 250 .mu.m percussive laser.
[0017] FIG. 2 illustrates an intermediate step in the drilling of a
hole with the use of a 250 .mu.m percussive laser.
[0018] FIG. 3 illustrates an intermediate step in the drilling of
hole with the use of a trepanning laser.
[0019] FIG. 4 illustrates the final step in the drilling of hole
with the use of a trepanning laser.
[0020] FIG. 5 illustrates the beginning of the process of drilling
of a hole with the feature of leaving a membrane at the bottom of
the hole to reduce transmitted laser energy.
[0021] FIG. 6 illustrates an intermediate step in the drilling of a
hole with the feature of leaving a membrane at the bottom of the
hole to reduce transmitted laser energy.
[0022] FIG. 7 illustrates an intermediate step in the drilling of a
hole with the feature of leaving a membrane at the bottom of the
hole to reduce transmitted laser energy.
[0023] FIG. 8 illustrates the final step in the drilling of hole
with the feature of leaving a membrane at the bottom of the hole to
reduce transmitted laser energy.
[0024] FIG. 9 shows a system of combining two lasers for hole
drilling.
[0025] FIG. 10 shows a system utilizing a single laser for hole
drilling.
DETAILED DESCRIPTION OF THE INVENTION
[0026] Referring now to the drawings, specific embodiments of the
invention are shown. The detailed description of the specific
embodiments, together with the general description of the
invention, serve to explain the principles of the invention. The
present invention provides a system for drilling holes in a
material. A laser system produces a first laser beam for rapidly
removing the bulk of material in an area to form a ragged hole. The
hole is "ragged" in the sense that some material ablated from the
bottom of the hole condenses on the sides of the hole. It is this
recast layer which gives the hole its ragged appearance. The laser
system produces a second laser beam for accurately cleaning up the
ragged hole so that the final hole has dimensions of high
precision.
[0027] In an embodiment of the invention the first laser is a high
power infra-red laser with moderate beam quality, on the order of
10 times the diffraction limit. The infrared laser is focused to a
diameter slightly smaller than the diameter of the hole to be
drilled. The second laser is a low power, short wavelength laser
with near diffraction limited beam quality. This short wavelength
laser is focused to a spot diameter which is about 10 times smaller
than the hole diameter. The drilling system begins by operating the
first laser at a peak power sufficiently high to be in the ablative
mode. The first laser beam is focused to slightly smaller than the
finished hole size and is directed at the material where the hole
is desired. The first laser beam removes the bulk of the material
and begins the process of forming a hole. Subsequently a second
laser, operated in the trepanning mode, generates a second laser
beam. This second laser is also operated at a peak power
sufficiently high be in the ablative mode but since the spot
diameter of this beam is approximately 10 times smaller than the
hole, the peak power can be 100 times lower. The second laser beam
is directed into the hole being formed to clean up the hole so that
the resulting hole has dimensions of high precision.
[0028] In an embodiment of the invention piece with a hole therein
is produced by the method of: generating a first laser beam,
directing the first laser beam at the piece to remove the bulk of
material in an area to form a ragged hole and begin forming the
hole, generating a second laser beam, and directing the second
laser beam at the hole being formed for accurately cleaning up the
ragged hole so that the final hole has dimensions of high
precision. In another embodiment of this invention, the first laser
is stopped just before the beam penetrates through the material
leaving a thin membrane at the bottom of the hole. This can be
easily accomplished by counting the number of pulses needed to
break through the substrate and ceasing lasing just prior to that
point. The trepanning laser is then used to clean up the sides of
the hole and improve dimensional precision as before but the thin
membrane acts as a beam stop preventing laser energy from being
transmitted through the hole. At the end of the trepanning step the
short wavelength laser breaks through the membrane and cleans up
the bottom of the hole. With this technique, the amount of laser
energy transmitted through the hole is minimized. This feature is
of great importance to many industrial applications where sensitive
material is located at the back side of the substrate.
[0029] Background Information--It is important in many applications
to drill small holes in thick materials with high precision and
high throughput. Another important requirement is that the Heat
Affected Zone (HAZ) be kept to a minimum. These requirements have
led workers to operate lasers at the threshold of the ablative mode
wherein a plasma formed at the surface carries material away but
the heat transferred to the surface is kept to a minimum.
[0030] "Ablative" processing occurs when the thermal diffusion time
of the material is long compared to the laser pulse duration
leading to an accumulation of energy which if sufficiently large,
can be partially released by the ablation of some material. There
are essentially two regimes in which to operate lasers in the
ablative mode: bulk hole drilling, which in the ablative mode is
referred to "percussion drilling" and trepanning.
[0031] In percussion drilling, the shape of the laser spot is
essentially the same as the hole to be drilled, i.e., a round laser
beam spot for round holes, square for square holes, etc. Material
is removed by ablation which imposes thresholds and limits on the
laser flux. Deep holes with high aspect ratios pose a problem
because the ablative material can redeposit on the walls of the
hole causing a taper or other irregularities. The beneficial
feature of this method is that material removal is rapid and with
little HAZ.
[0032] To obtain precise holes, i.e., with less taper and higher
dimensional precision, trepanning is often used. In this method,
the laser is focused to a spot much smaller than the diameter of
the hole. The laser beam is then traced around the outline of the
hole usually many times until the hole is finally cut through the
material. There is little recast material on the sides of the hole
and the laser can be used to polish the sides of the hole to obtain
high dimensional precision. Holes of arbitrary shape can be drilled
in this manner with x-y control of the beam path.
[0033] The problem with conventional trepanning is that the
drilling speed is low. This is because the central plug must be
heated and extracted by melting and vaporization; this process is
energy intensive and therefore drilling times are long. The
remaining recast layer formed on the edges of the hole are then
removed by ablative laser trimming during the later portions of the
trepanning process. For many applications where precision holes are
required, the slow drilling speed can be tolerated.
[0034] In certain application it is important that the first laser
is stopped just before the beam penetrates through the material
leaving a thin membrane at the bottom of the hole. This can be
easily accomplished by counting the number of pulses needed to
break through the substrate and ceasing lasing just prior to that
point. The trepanning laser is then used to clean up the sides of
the hole and improve dimensional precision as before but the thin
membrane acts as a beam stop preventing laser energy from being
transmitted through the hole. At the end of the trepanning step the
short wavelength laser breaks through the membrane and cleans up
the bottom of the hole.
[0035] With this technique, the amount of laser energy transmitted
through the hole is minimized. This feature is of great importance
to many industrial applications where sensitive material is located
at the back side of the substrate. For example, sensitive materials
are used for the formation of thin film transistors on inexpensive
plastic substrates. Lower processing temperatures are required so
that inexpensive flexible plastic substrates may be used. The
so-called low-temperature plastic substrates have several
advantages over conventionally used substrates such as glass,
quartz, and silicon. Processing temperatures are such that
sustained temperatures are below a temperature of 120.degree. C.
Plastic substrates have several advantages over conventional
substrates, such as glass or silicon in that plastic can be much
less expensive, lighter, more durable, rugged, and flexible. They
have many and varied uses. For example, plastic displays and
microelectronic circuits on flexible, rugged plastic substrates
constructed in accordance with the present invention have multiple
uses such as in field-deployable portable electronics, battlefield
operations facilities, and the interior of ships, tanks and
aircraft. Large area plastic displays are in need for high
resolution large area flight simulators. Flexible detector arrays
have use in radiation (X-ray, gamma-ray) detection.
Silicon-on-insulator films may be used in radiation-hardened IC
circuits. Many other uses exist and the development of the
invention will produce additional uses.
[0036] Referring to FIGS. 1, 2, 3, and 4 the drilling of a hole in
a material using the percussive-trepanning method is illustrated.
Small holes with precise shapes and precision dimensions are
quickly drilled in many materials using the combination of an
infra-red laser with relatively moderate beam quality and a low
power, short wavelength laser with relatively high beam quality.
The infra-red laser operates in the ablative mode and removes the
bulk of the material quickly with little regard to the precise
dimensions of the hole. The hole is described as "ragged" in the
sense that some material ablated from the bottom of the hole
condenses on the sides of the hole. It is this recast layer which
gives the hole its ragged appearance. The short wavelength laser is
operated in the trepanning mode to complete the hole in rapid time.
The resulting hole has dimensions of high precision, along with
high aspect ratio as necessary. Some of the important features of
the hole drilling methodology of the present invention are the
dimensional precision of the holes, the ability to drill high
aspect ratio holes (aspect ratio being defined as the ratio of
depth to diameter) and the minimization of the Heat Affected Zone
(HAZ) surrounding the hole.
[0037] In order to provide for high precision holes with high
drilling speed, the present invention provides a combination of
percussive and trepanning modes. A pulsed IR laser is operated at a
flux sufficient to exceed the ablative threshold but only slightly
above that limit order to avoid a large HAZ. It should be noted
that a larger HAZ can be tolerated in the first step of this
process in the present invention than if percussive drilling were
the sole agent. The percussive laser need not be operated at short
wavelength and with high wavefront quality because the subsequent
trepanning step can correct drilling errors caused by these laser
characteristics. The use of such an IR laser significantly reduces
the cost and complexity of the laser equipment which again is an
advantage for commercial applications.
[0038] With the central part of the hole removed, the laser system
switches to a visible wavelength with high wavefront quality but at
significantly lower average power and the recast material is
removed by a trepanning process. Irregularities in the dimensional
precision left over from the percussive process are removed by this
trepanning process. In order to maintain the laser flux above the
ablative threshold, the beam size is reduced (assuming the pulse
duration remains fixed) and this is possible because the wavelength
is reduced and the wavefront quality is increased.
[0039] FIGS. 9 and 10 show two laser systems that can be used to
combine both the percussive and trepanning laser. In FIG. 9 a
percussive laser 30 produces a percussive laser beam 32 and a
trepanning laser 31 produces a laser trepanning beam 33. The
percussive laser beam 32 passes through the dichroic beam combining
optic 34 and is focused onto the substrate 36 by focusing lenses
35. The trepanning laser beam 33 passes through a pair of wedges 37
which give the beam an angular offset which can be adjusted by
rotating one wedge with respect to the other. In the diagram, the
wedges are adjusted to give zero angular offset but a slight
translational offset. The translational offset is corrected by the
"Pointing and Centering" mirror pair 39 to bring the trepanning
beam back on line with the percussive laser beam after reflecting
off the dichroic beam combining optic 34. The turning mirror 38 and
dichroic optics 34 could be used as a P&C leg but for clarity,
separate mirrors are chosen for this purpose.
[0040] With zero angular offset, the trepanning laser beam falls
into the center of the hole drilled by the percussive laser and
there is no cleanup of the sidewalls. By rotating the wedges with
respect to each other and angular offset is introduced which
results in a translational offset at the location of the hole by
the action of the focusing optic. The wedges are adjusted until the
offset is the radius of the desired hole and the entire wedge
assembly is rotated by a small motor until the trepanning action
has accomplished its task. This optical setup is not unique nor
original to this invention but serves to illustrate how the
percussive--trepanning technique might be accomplished.
[0041] In FIG. 10 the percussive laser beam and the trepanning
laser beam are produced by a single laser system 40. A control
system 43 provides information to laser system 40. Laser system 40
produces a first laser beam for rapidly removing the bulk of
material in an area to form a ragged hole and a second laser beam
for accurately cleaning up the ragged hole so that the final hole
has dimensions of high precision. The laser beams are focused onto
the substrate material 42 by focusing lenses 41.
[0042] An illustrative representation of this process is shown in
FIGS. 1, 2, 3, and 4. FIG. 1 illustrates the beginning of the
process of drilling of a hole 10 with the use of 250 .mu.m
percussive laser. FIG. 2 illustrates an intermediate step in the
drilling of the hole 10. FIG. 3 illustrates an intermediate step in
the drilling of hole 10 with the use of a trepanning laser. FIG. 4
illustrates the final step in the drilling of hole 10 with the use
of a trepanning laser.
[0043] For specificity, a 300 .mu.m hole 10 is depicted in a 1 mm
thick material 11 using a 250 .mu.m percussive laser at 1.06 .mu.m
as shown in FIGS. 1 and 2 followed by a trepanning laser with a
beam diameter of 25 .mu.m at 532 nm as show in FIGS. 3 and 4. The
percussive laser beam is designated by the reference numeral 12 and
the trepanning laser beam is designated by the reference numeral
13. For very fine scale trepanning such as might be needed to cut
corners in square or other shaped holes, an even shorter wavelength
might be used. For example, the 1.06 .mu.m percussive laser can be
the fundamental of Diode Pumped Solid State Laser using a Nd:YAG
gain media, the trepanning laser can be the second or third
harmonic of that laser at 532 nm or 355 nm. Many such lasers exist
but the highest power and most efficient unit is a Diode Pumped
Solid State Laser (DPSSL) which uses a Compound Parabolic
Concentrator (CPC). This laser is described in U.S. Pat. No.
5,978,407, Compact and Highly Efficient Laser Pump Cavity, J. J.
Chang, I. L. Bass and L. E. Zapata, Nov. 2, 1999 and further
improved in U.S. Provisional Patent Application Ser. No.
60/166,464, Diode-Pumped Laser Apparatus with Improved Pumping
Design, J. J. Chang, filed Nov. 19, 1999.
[0044] At the ablative threshold, a 500 W average power IR laser is
sufficient to cut through a millimeter thick sample of steel in a
fraction of a second assuming a pulse duration of 100 ns. The
trepanning laser need only have 1/100 the average power for the
same laser conditions assuming a beam diameter of 25 .mu.m or
.apprxeq.10 times smaller than the hole diameter. The entire
process should take no more than a few seconds and result in high
aspect ratio holes with high precision and negligibly small
HAZ.
[0045] Characteristics of the Percussive Laser System--It has been
shown by Chang, Warner, Dragon and Martinez, Ibid, that the optimum
flux for the percussive drilling technique are of the order of a
GW/cm.sup.2. Too low a flux results in pure heating of the
substrate with no ablation and hence low material removal rates.
Too high a flux and the ablated material begins to photoionize,
absorb the laser beam and otherwise reduce the laser flux at the
substrate. Essentially, the optimum operating point is just above
the ablation threshold.
[0046] For a repetitively pulsed laser, the flux at the substrate,
.PHI. is given [0047] by:
.PHI.=<P>/[(PRF)(.GAMMA..sub.p)(.pi.d.sup.2/4)] [0048] where:
<P>=the average power
[0049] .GAMMA..sub.p=pulse duration
[0050] d=hole diameter
[0051] For a typical DPSSL, PRF=10 kHz and .GAMMA..sub.p-==80 ns.
Under these conditions and the requirement of 1 GW/cm.sup.2,, the
average power of the laser required for a 300.mu. diameter hole is
.apprxeq.500 W. For the observed removal rate observed of 1
.mu.m/pulse, a 1 mm hole with be drilled in .apprxeq.1000 pulses or
0.1 s. This rapid drilling out of the core hole allows a thorough
and careful finishing process with the trepanning laser while still
maintaining a high production throughput.
[0052] Although DPSSL's of this power level do exit, their beam
quality is not sufficient to produce "reasonable" quality holes,
even with the trepanning step to follow. A beam quality of
M.sup.2.apprxeq.10-15 is needed as opposed to the 50-100 which has
been measured for these lasers. This requirement for the beam
quality is as result of the observation that the spot diameter of
the laser is given by:
Spot diameter.apprxeq.(XDL)F.sub.# .lamda.
[0053] Where (XDL) is the beam quality is normalized to the
Diffraction Limited performance, F.sub.# is the "F number" of the
optical focusing system and is the wavelength of the laser. For a
300 .mu.m diameter and F.sub.#=20 (to insure a reasonable standoff
distance and a long depth of focus) the XDL required at 1.06 .mu.m
is 15.
[0054] A common technique to improve the beam quality is to place a
polarization rotator in between two of these lasers to cancel out
birefringence effects induced by the thermal gradients in the rods.
Although this technique alone is not sufficient to produce near
diffraction limited wavefronts due to the simultaneous presence of
thermal lensing, the goal here is only 10-15 times diffraction
limited and the polarization rotation technique will be
sufficient.
[0055] Characteristics of the Trepanning Laser System--Although it
would be possible to use the IR wavelength for the trepanning
laser, the benefits of the shorter wavelength obtained by SHG to
the green or Third Harmonic Generation to the UV far outweigh the
difficulties encountered to produce these wavelengths. The shorter
wavelength has higher machining precision (if the wavefront quality
is comparable to that in the IR and even better if the wavefront
can be improved) and increased coupling to the substrate, all
resulting in a superior trepanning device. Further, since only a
few tens of watts of average power are required, it is relatively
easy to use apertures to improve the wavefront quality to a figure
of about 2 times the diffraction limit at the ten watt level.
[0056] Efficient and powerful DPSSL's with SHG to the green have
been developed as described in "315 W Pulsed--Green Generation with
a Diode--Pumped Nd:YAG Laser" Chang, J. J., Dragon, E. P., Bass, I.
L., CLEO'98. Using apertures to restrict the lasing portion of the
YAG rod, wavefront qualities of .apprxeq.2 times diffraction
limited have been achieved at levels of a few tens of watts.
Various resonator cavity configurations have been developed for
these lasers including those characterized by "L", "Z" and "V"
geometries, each suited to improve a specific laser characteristic,
e.g., short pulse duration, good wavefront quality or high average
power.
[0057] The use of two wavelengths and two modes of drilling can
produce high precision holes with large aspect ratios and high
drilling rates. A long wavelength laser in the IR is operated in
the percussive mode and achieves material removal rates of
.apprxeq.1 .mu.pulse. This process leaves a hole with irregular
edges caused by material recast. The recast layer is removed and
the sides of the hole polished using a short wavelength laser
operated in the trepanning mode. The combination of these two modes
is superior to either mode used separately.
[0058] For example if it is required to drill a hole 300 microns in
diameter, 1 mm deep in an aerospace alloy and that must be
straight, i.e., no taper, to 2%, and round to 2%, a relatively
inexpensive, commercially available, near IR laser operating at a
few hundred watts can percussion drill this hole in less than a
second. However, the quality of the hole is far from the
requirements specified. Splatter and recast material make the hole
irregular and tapered. A visible laser with good beam quality
operating at tens of watts could cut the hole to the level of
precision desired by trepanning (see reference Chang, Warner,
Dragon and Martinez, Ibid) but would require over a hundred seconds
to complete because of the slow removal rate and the need to melt
out the middle of the hole. By using the lasers together in the
percussion-trepanning modes, the near IR laser can remove most of
the hole material and the visible laser can do the finishing
operation in a total of a few seconds.
[0059] There are other applications where more than one laser would
be an advantage. Some materials, ceramics for instance, are
difficult to cut with near IR lasers. By combining a low power UV
laser with the more powerful IR laser we propose that this problem
can be solved in an economic and efficient manner. The UV laser
could provide the necessary high energy photons to break down the
ceramic and a visible o IR laser could provide the removal
mechanism.
[0060] There may be applications where three lasers would be an
advantage. Composites may be readily cut with a laser trio. A UV
laser to decompose the polymer, a visible laser for trepanning, and
near IR laser for bulk removal. Other applications could readily be
explored.
[0061] Referring to FIGS. 5, 6, 7, and 8 the process by which a
thin membrane 25 is left at the bottom of the hole 20 is shown. The
infrared laser beam 22 can remove almost all of the interior of the
hole 20 leaving only a thin membrane 25 at the bottom. The lower
power short wavelength laser beam 23 can then trepan the hole
cleaning up the edge and removing the membrane 25 at the same time
thereby reducing the amount of laser light which exits the hole 20.
In some industrial applications, there are critical elements behind
the hole 20 which cannot be exposed to high power laser light. FIG.
5 illustrates the beginning of the process of drilling of the hole
20. FIG. 6 illustrates an intermediate step in the drilling of a
hole leaving a membrane 25 at the bottom of the hole 20 to reduce
transmitted laser energy. FIG. 7 illustrates an intermediate step
in the drilling of the hole 20. FIG. 8 illustrates the final step
in the drilling of hole 10.
[0062] After drilling by the percussive laser, the trepanning laser
then cleans up the sides of the hole before breaking through the
membrane 25. A 300 .mu.m hole 20 is depicted in a 1 mm thick
material 11 using a 250 .mu.m percussive laser at 1.06 .mu.m as
shown in FIGS. 5 and 6 followed by a trepanning laser with a beam
diameter of 25 .mu.m at 532 nm as show in FIGS. 7 and 8. The
percussive laser beam is designated by the reference numeral 22 and
the trepanning laser beam is designated by the reference numeral
23.
[0063] In certain applications it is important that the first laser
beam 22 is stopped just before the beam penetrates through the
material 21 leaving a thin membrane 25 at the bottom of the hole
20. This can be easily accomplished by counting the number of pulse
needed to break through the substrate material 21 and ceasing
lasing just prior to that point. The trepanning laser is then used
to clean up the sides of the hole 20 and improve dimensional
precision as before but the thin membrane 25 acts as a beam stop
preventing laser energy from being transmitted through the hole 20.
At the end of the trepanning step the short wavelength laser breaks
through the membrane 25 and cleans up the bottom of the hole
20.
[0064] With this technique, the amount of laser energy transmitted
through the hole is minimized. This feature is of great importance
to many industrial applications where sensitive material 24 is
located at the back side of the substrate material 21. For example,
sensitive materials are used for the formation of thin film
transistors on inexpensive plastic substrates. Lower processing
temperatures are required so that inexpensive flexible plastic
substrates may be used. The so-called low-temperature plastic
substrates have several advantages over conventionally used
substrates such as glass, quartz, and silicon. Processing
temperatures are such that sustained temperatures are below a
temperature of 120.degree. C. Plastic substrates have several
advantages over conventional substrates, such as glass or silicon
in that plastic can be much less expensive, lighter, more durable,
rugged, and flexible. They have many and varied uses. For example,
plastic displays and microelectronic circuits on flexible, rugged
plastic substrates constructed in accordance with the present
invention have multiple uses such as in field-deployable portable
electronics, battlefield operations facilities, and the interior of
ships, tanks and aircraft. Large area plastic displays are in need
for high resolution large area flight simulators. Flexible detector
arrays have use in radiation (X-ray, gamma-ray) detection.
Silicon-on-insulator films may be used in radiation-hardened IC
circuits. Many other uses exist and the development of the
invention will produce additional uses.
[0065] While the invention may be susceptible to various
modifications and alternative forms, specific embodiments have been
shown by way of example in the drawings and have been described in
detail herein. However, it should be understood that the invention
is not intended to be limited to the particular forms disclosed.
Rather, the invention is to cover all modifications, equivalents,
and alternatives falling within the spirit and scope of the
invention as defined by the following appended claims.
* * * * *