U.S. patent application number 13/620813 was filed with the patent office on 2013-01-10 for booster circuit and display device.
This patent application is currently assigned to Renesas Electronics Corporation. Invention is credited to Kiyoshi Miyazaki.
Application Number | 20130009566 13/620813 |
Document ID | / |
Family ID | 42559475 |
Filed Date | 2013-01-10 |
United States Patent
Application |
20130009566 |
Kind Code |
A1 |
Miyazaki; Kiyoshi |
January 10, 2013 |
BOOSTER CIRCUIT AND DISPLAY DEVICE
Abstract
A display device includes a display panel having scan lines, and
a booster circuit configured to generate an output voltage and to
supply the output voltage as power source to the display panel. The
booster circuit includes a charge pump and a feedback circuit
section configured to control a booster operation of the charge
pump depending on the output voltage. A mode of the booster
operation includes a charge mode that charges the output capacitor
and a discharge mode that discharges the output capacitor. The mode
is switched depending on the output voltage. The feedback circuit
section includes a booster operation control section configured to
secure a period during which the mode is not switched between the
charge mode and the discharge mode in accordance with an external
synchronizing signal. The period includes a timing at which an
active scan line is switched among the plurality of scan lines.
Inventors: |
Miyazaki; Kiyoshi;
(Kanagawa, JP) |
Assignee: |
Renesas Electronics
Corporation
Kawasaki
JP
|
Family ID: |
42559475 |
Appl. No.: |
13/620813 |
Filed: |
September 15, 2012 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
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12656515 |
Feb 1, 2010 |
|
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13620813 |
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Current U.S.
Class: |
315/287 |
Current CPC
Class: |
G09G 3/3696
20130101 |
Class at
Publication: |
315/287 |
International
Class: |
H05B 37/00 20060101
H05B037/00 |
Foreign Application Data
Date |
Code |
Application Number |
Feb 4, 2009 |
JP |
2009-024211 |
Claims
1. A display device comprising: a display panel having a plurality
of scan lines; and a booster circuit configured to generate an
output voltage and to supply said output voltage as power source to
said display panel, wherein said booster circuit comprises: a
charge pump configured to perform a booster operation that boosts a
voltage supplied from an external power source and outputs the
boosted voltage as said output voltage through an output capacitor;
and a feedback circuit section configured to control said booster
operation of said charge pump depending on said output voltage,
wherein a mode of said booster operation includes: a charge mode
that charges said output capacitor with the voltage supplied from
said external power source; and a discharge mode that discharges
said output capacitor, wherein said mode of said booster operation
is switched between said charge mode and said discharge mode
depending on said output voltage, wherein said feedback circuit
section comprises a booster operation control section configured to
secure a period during which said mode is not switched between said
charge mode and said discharge mode in accordance with an external
synchronizing signal, and wherein said period includes a timing at
which an active scan line is switched among said plurality of scan
lines.
2. The display device according to claim 1, wherein said booster
operation control section comprises a voltage dividing circuit
section configured to voltage-divide said output voltage with a
voltage dividing ratio varying depending on said external
synchronizing signal and to output the divided voltage as a
feedback voltage, and wherein said feedback circuit section further
comprises: a reference voltage source section configured to output
a reference voltage; and a comparison circuit section configured to
make a comparison between said reference voltage and said feedback
voltage and to output a comparison result signal indicating the
result of said comparison for controlling said booster
operation.
3. The display device according to claim 1, wherein said booster
operation control section comprises a reference voltage source
section configured to output a reference voltage varying depending
on said external synchronizing signal, and wherein said feedback
circuit section further comprises: a voltage dividing circuit
section configured to voltage-divide said output voltage and to
output the divided voltage as a feedback voltage; and a comparison
circuit section configured to make a comparison between said
reference voltage and said feedback voltage and to output a
comparison result signal indicating the result of said comparison
for controlling said booster operation.
4. The display device according to claim 1, wherein said feedback
circuit section further comprises: a voltage dividing circuit
section configured to voltage-divide said output voltage and to
output the divided voltage as a feedback voltage; a reference
voltage source section configured to output a reference voltage;
and a comparison circuit section configured to make a comparison
between said reference voltage and said feedback voltage and to
output a comparison result signal indicating the result of said
comparison for controlling said booster operation, and wherein said
comparison circuit section comprises: a comparator configured to
make the comparison between said reference voltage and said
feedback voltage and to generate said comparison result signal; and
said booster operation control section that comprises a
synchronizing circuit configured to output said comparison result
signal after performing waveform modulation of said comparison
result signal in accordance with said external synchronizing
signal.
5. The display device according to claim 4, wherein said external
synchronizing signal comprises: a first external synchronizing
signal for stating said booster operation of said charge pump; and
a second external synchronizing signal for stopping said booster
operation of said charge pump, and wherein said booster operation
control section further comprises: a first external control signal
input section to which said first external synchronizing signal is
supplied; and a second external control signal input section to
which said second external synchronizing signal is supplied.
6. A method of driving a display panel comprising: generating, by
using a charge pump, a booster voltage from a voltage supplied from
an external power source; and supplying said booster voltage as
power source to said display panel, wherein said generating the
booster voltage comprises: activating, in a charge mode, said
charge pump to perform a booster operation that boosts the voltage
supplied from said external power source; deactivating, in a
discharge mode, said charge pump to stop said booster operation;
switching a mode between said charge mode and said discharge mode
depending on said booster voltage; and securing a period during
which said mode is not switched between said charge mode and said
discharge mode in accordance with an external synchronizing signal,
wherein said period includes a timing at which an active scan line
is switched among a plurality of scan lines of said display panel.
Description
INCORPORATION BY REFERENCE
[0001] The present application is a Divisional application of U.S.
patent application Ser. No. 12/656,515, filed on Feb. 1, 2010,
which is based on and claims priority from Japanese Patent
Application No. 2009-024211, filed on Feb. 4, 2009, the entire
contents of which is incorporated herein by reference.
BACKGROUND OF THE INVENTION
[0002] 1. Field of the Invention
[0003] The present invention relates to a booster circuit,
particularly to a booster circuit having a feedback circuit
section.
[0004] 2. Description of Related Art
[0005] In recent years, power consumption of a display device such
as a liquid crystal display device is getting lower. A booster
circuit is often used as a power source for such a display device.
Although a simple charge pump circuit that operates continuously
exists, a power source having a higher efficiency and lower power
consumption is used more frequently for a built-in power source of
the display device. Because of this situation, a charge pump
circuit that has a feedback circuit section and performs a booster
operation depending on load and output variation has been
increasingly used.
[0006] FIG. 1 and FIG. 2 are circuit diagrams showing a typical
feedback-type booster circuit. The typical feedback-type booster
circuit will be described below with reference to FIGS. 1 and
2.
[0007] As shown in FIGS. 1 and 2, the booster circuit has a charge
pump 10, a feedback circuit section 20 and a logic circuit section
30. The charge pump 10 has a DC/DC converter 11, a booster
capacitor (C1) 12 and an output capacitor (CL) 13. The DC/DC
converter 11 has a voltage input section 111, a clock signal input
section 113 and a booster voltage output section 112. The feedback
circuit section 20 has a voltage dividing circuit section 24, a
comparison circuit section 21 and a reference voltage source
section 22. The voltage dividing circuit section 24 has a first
fixed resistor (R1) 241, a voltage dividing node 240 and a second
fixed resistor (R2) 242. The comparison circuit section 21 has a
comparator 210. The reference voltage source section 22 has a
reference voltage source 220. The logic circuit section 30 has an
external clock signal input section 31.
[0008] The voltage input section 111 is connected to the DC/DC
converter 11. The DC/DC converter 11 is further connected to an
output section of the logic circuit section 30, both terminals of
the booster capacitor 12 and the booster voltage output section
112. The booster voltage output section 112 is further connected to
the output capacitor 13 and an input section of the feedback
circuit section 20. The output capacitor 13 is also connected to a
ground 19. An output section of the feedback circuit section 20 and
the external clock signal input section 31 are connected to two
input sections of the logic circuit section 30, respectively.
[0009] In the feedback circuit section 20, the input section is
connected to the second fixed resistor 242 in the voltage dividing
circuit section 24. The second fixed resistor 242 is also connected
to the voltage dividing node 240 at the other end thereof. The
voltage dividing node 240 is further connected to the first fixed
resistor 241 and an inverted side input section of the comparator
210. The first fixed resistor 241 is also connected to a ground 249
at the other side thereof. The reference voltage source 220 is
connected to a non-inverted side input section of the comparator
210. The reference voltage source 220 is also connected to a ground
229 at the other end thereof. An output section of the comparator
210 is connected to the output section of the feedback circuit
section 20.
[0010] A basic operation of the DC/DC converter 11 in the present
specification will be described below.
[0011] An operation mode of the DC/DC converter 11 in a case where
a clock signal CLKIN input to the clock signal input section 113 is
in the Low state is referred to as a "discharge mode".
[0012] In the discharge mode, the DC/DC converter 11 allows a
positive electrode of the booster capacitor 12 to be connected to
the voltage input section 111. In other words, the booster
capacitor 12 is charged with a voltage VIN supplied from the
voltage input section 111.
[0013] At the same time, the DC/DC converter 11 allows a positive
electrode of the output capacitor 13 to be connected to the booster
voltage output section 112. In other words, the output capacitor 13
discharges electric power to an arbitrary external device connected
to the booster voltage output section 112.
[0014] On the other hand, an operation mode of the DC/DC converter
11 in a case where the clock signal CLKIN input to the clock signal
input section 113 is in the High state is referred to as a "charge
mode".
[0015] In the charge mode, the DC/DC converter 11 allows a negative
electrode of the booster capacitor 12 to be connected to the
voltage input section 111. Also, the DC/DC converter 11 allows the
positive electrode of the booster capacitor 12 to be connected to
the positive electrode of the booster voltage output section 112.
At this time, the booster capacitor 12 has been already charged
with the voltage of the voltage input section 111 in the discharge
mode. Thus, the voltage input section 111 and the booster capacitor
12 that are serially connected charge the output capacitor 13. In
other words, electrical charges in the booster capacitor 12 are
shared with the output capacitor 13. As a result, the output
capacitor 13 is charged with a voltage which is twice as much as
the voltage of the voltage input section 111.
[0016] The DC/DC converter 11 which performs an operation in an
opposite phase to that in the example shown in FIG. 2 can be easily
realized by basically inverting the logic in this circuit.
Furthermore, a booster ratio, the number of the used various
capacitors and the type and total number of the operation modes can
be changed in many ways. Description of these changes can be easily
inferred and thus, is omitted.
[0017] Next, an operation of the feedback circuit section 20 shown
in FIG. 2 will be described.
[0018] First, the voltage dividing circuit section 24 divides a
voltage VOUT of the booster voltage output section 112 and outputs
the divided voltage from the voltage dividing node 240. The voltage
output from the voltage dividing node 240 is hereinafter referred
to as a "feedback voltage VFB". At this time, the booster voltage
output section 112, the second fixed resistor (R2) 242, the voltage
dividing node 240, the first fixed resistor (R1) 241 and the ground
249 are connected in series. The feedback voltage VFB is a voltage
between both nodes of the first fixed resistor 241. Therefore, the
feedback voltage VFB can be represented by the following Equation
(1).
VFB=VOUT.times.R1/(R1+R2) <Equation (1)>
[0019] A coefficient R1/(R1+R2) in the right side of the Equation
(1) is hereinafter referred to as a "voltage dividing ratio".
[0020] Next, the feedback voltage VFB is input to an inverted side
input section of the comparator 210 in the comparison circuit
section 21. The comparator 210 compares the feedback voltage VFB
with a reference voltage VREF of the reference voltage source 220
connected to the non-inverted side input section of the comparator
210. The comparison circuit section 21 outputs a result of the
comparison between the voltages as a feedback signal EN. For
example, the feedback signal EN is in the Low state in a case where
the feedback voltage VFB is higher than the reference voltage VREF
(VFB>VREF). In the other cases, the feedback signal EN is in the
High state.
[0021] The feedback signal EN is supplied to the logic circuit
section 30. An external clock signal CLK is further supplied from
the external clock signal input section 31 to the logic circuit
section 30. When the feedback signal EN is in the High state and
the external clock signal CLK is in the High state, the clock
signal CLKIN output from the logic circuit section 30 is in the
High state (charge mode). Electrical charges in the booster
capacitor 12 are supplied to the output capacitor 13. As a result,
the booster operation of the charge pump 10 is performed.
[0022] When the external clock signal CLK is in the Low state or
the feedback signal EN is in the Low state, the clock signal CLKIN
output from the logic circuit section 30 is in the Low state
(discharge mode). The booster operation is turned OFF, and the
output capacitor is discharged. Also, the booster capacitor 12 is
charged with the input voltage VIN supplied from the voltage input
section 111, in preparation for the next booster operation.
[0023] The feedback signal EN is output from the comparator 210
which compares the feedback voltage VFB with the reference voltage
VREF. In other words, timing when the feedback signal EN is
switched is determined by the operation of the comparator 210.
Specifically, the feedback signal EN is switched when a
relationship represented by the following Equation (2) is
satisfied. In other words, the comparator 210 operates so as to
keep a relationship represented by the following Equation (3).
VREF=VFB=VOUT.times.R1/(R1+R2) <Equation 2>
VOUT=VREF.times.(1+R2/R1) <Equation 3>
[0024] The value of the right side of the Equation (3) is
hereinafter referred to as a "set voltage".
[0025] In a case where the output voltage VOUT is higher than the
above-mentioned set voltage, the feedback signal EN is in the Low
state. When the feedback signal EN is in the Low state, the clock
signal CLKIN input to the DC/DC converter 11 is in the Low state,
irrespective of the external clock signal CLK. As a result, the
booster operation is stopped. At this time, in the case shown in
FIG. 2, the booster capacitor 12 is charged.
[0026] In a case where the output voltage VOUT is lower than the
above-mentioned set voltage, the feedback signal EN is in the High
state. Furthermore, when the external clock signal CLK which
operates the booster circuit is in the High state, the booster
operation is performed. In other words, charging and discharging of
each capacitor are repeated.
[0027] In the case shown in FIG. 2, since a logical operation of
the external clock signal CLK and the feedback signal EN is
performed, the DC/DC converter 11 does not necessarily operate in
synchronization with the external clock signal CLK. For example,
let us consider a case where a period during which the feedback
signal EN is in the High state is a half of a period during which
the external clock signal CLK is in the High state. In this case,
the discharge operation of the booster capacitor 12 is performed
for a half of the period during which the external clock signal CLK
is in the High state.
[0028] However, a current at the time when electrical charges in
the booster capacitor 12 are discharged to the output capacitor 13
may not correspond to a current at the time when electrical charges
in the output capacitor 13 are discharged to the external load.
Furthermore, since a reaction speed of the feedback circuit section
20 including the comparator 210 is limited, a waveform of the
output voltage VOUT includes ripple noise which fluctuates across
the above-mentioned set voltage.
[0029] FIG. 3 is a waveform diagram for explaining the waveform of
the output voltage VOUT including the ripple noise and influence of
the ripple noise on a display waveform of a display device. In FIG.
3, the horizontal axis represents time and the vertical axis
represents voltage. The set voltage is indicated by a broken line.
The details will be described later.
[0030] Japanese Patent Publication JP-2005-278383A discloses a
power supply circuit. In the power supply circuit, a comparator
makes a comparison between a reference voltage and a voltage
depending on an output of a charge pump which performs the booster
operation in accordance with a clock signal. A pulse of the clock
signal is skipped by the output of the comparator at the time when
the voltage exceeds the reference voltage to stop the booster
operation. The skip of the pulse of the clock signal is stopped by
the output of the comparator at the time when the voltage falls
below the reference voltage to restart the booster operation,
thereby outputting a regulated voltage from the charge pump. Here,
a speed of the comparator is controlled so as to be high from the
time when the voltage depending on the output of the charge pump
exceeds the reference voltage to the time when the output of the
comparator is inverted. Also, the speed of the comparator is
controlled so as to be low from the time when the voltage depending
on the output of the charge pump falls below the reference voltage
to the time when the output of the comparator is inverted.
[0031] The inventor of the present application has recognized the
following points.
[0032] As mentioned above, the output voltage VOUT of the
feedback-control-type booster circuit has the ripple waveform. A
negative effect of this phenomenon on an actual display panel will
be described below.
[0033] FIG. 4 is a circuit diagram showing a liquid crystal display
panel system using the booster circuit shown in FIG. 2. The liquid
crystal display panel system in FIG. 4 has an LCD (Liquid Crystal
Display) driver and a liquid crystal display panel. As shown in
FIG. 4, the voltage output from the booster circuit is used as
power source for the LCD driver in the liquid crystal display panel
system. The LCD driver has amplifying buffers for driving a
predetermined voltage to the liquid crystal display panel.
[0034] The liquid crystal display panel shown in FIG. 4 has a
plurality of pixels. Each of the plurality of pixels has an FET
(Field Effect Transistor). Scan signal lines G1, G2, . . . used for
transmitting a gate control signal are connected to gates of the
plurality of FETs, respectively. Data lines S1, S2, . . . for
transmitting a source line signal are connected to sources of the
plurality of FETs, respectively. Here, the gate control signal is
used for driving each pixel of the liquid crystal display panel.
The source line signal is used for applying a voltage corresponding
to data displayed at each pixel of the liquid crystal display
panel.
[0035] The (A) part of FIG. 3 is a waveform diagram showing the
gate control signals of the scan signal lines G1, G2 and G3, the
source line signal of the data line S1, and the output voltage VOUT
of the booster circuit for driving the liquid crystal display
panel. Here, the gate control signal is in synchronization with the
source line signal. The (B) part of FIG. 3 is a magnified diagram
of a part of the (A) part, which illustrates in more detail the
gate control signal of the scan signal line G1, the source line
signal of the data line S1, and the output voltage VOUT of the
booster circuit.
[0036] FIG. 5 is a diagram for explaining an influence of the noise
of the driver power source on the liquid crystal display device.
The plurality of scan signal lines G1, G2, . . . are activated one
by one in order. When a scan signal line is activated, all pixels
connected to the activated scan signal lines are activated. An
analog value output from the source driver is written to the
activated pixels through the data lines.
[0037] The transistor of each pixel is turned ON in synchronization
with the gate control signal. When the transistor of each pixel is
turned ON, a load capacitor of the each pixel is charged. Thus, a
load current of each pixel is in synchronization with the gate
control signal. However, electrical charges charged to each pixel
vary depending on an image displayed at this time. That is to say,
the load current varies for each display line and the amount of
charge consumption is irregular.
[0038] Therefore, a timing of starting the booster operation for
boosting the output voltage VOUT that has been decreased due to the
load driving also is irregular and, in many cases, not in
synchronization with the display operation. The waveform shown in
FIG. 3 is an example. The rising waveform is steep. In order to
increase the electrical charges stored in the booster capacitor 12,
the negative electrode terminal is switched to the voltage input
section 111. Since the switching operation is performed for sharing
the electrical charges with the booster voltage output section 112,
the voltage waveform becomes steep in the AC manner. In addition, a
low impedance of a booster SW also contributes to the steep voltage
waveform.
[0039] On the other hand, the discharging is averagely performed
through the output capacitor 13 which operates as a bypass
capacitor. Furthermore, the discharging is performed with a current
limited by an amplifier output impedance and the liquid crystal
display panel load. The discharging charges are less than that in
the booster capacitor. For these reasons, the waveform is averagely
smooth.
[0040] Due to the above-described asynchronous and steep rising, a
steep rising ripple noise occurs in the output voltage VOUT if the
booster operation based on the discharging of the booster capacitor
12 starts immediately before switching of the scan signal lines.
Moreover, the noise is transmitted to the output of the amplifier
that uses the output voltage VOUT output from the booster voltage
output section 112 as the power source. Especially when this occurs
immediately before completion of scanning as shown in FIG. 3, it is
difficult to return the voltage to a predetermined voltage by the
amplifier, which results in that a voltage shifted from the
predetermined voltage is applied to the source line.
[0041] FIG. 5 shows a state where the power source noise affects
the pixels of the liquid crystal display panel. In fact, not all
the power source noise is applied to the driver outputs (S1, S2, .
. . ), and a part thereof depending on
power-source-noise-removal-ratio of the amplifier appears as the
output. Accordingly, the noise applied to the source line is
generally smaller than the actual power source noise by about one
digit.
[0042] However, the higher-definition and higher-contrast liquid
crystal display panel in recent years requires further precision
for the LCD driver amplifier. Therefore, the influence of the
above-mentioned noise cannot be ignored. Specifically, the
above-mentioned noise is irregularly applied and hence the voltage
is irregularly shifted from the predetermined voltage, which causes
line flicker in screen during display.
SUMMARY OF THE INVENTION
[0043] In one embodiment of the present invention, a booster
circuit is provided. The booster circuit has: a charge pump
configured to perform a booster operation that boosts a voltage
supplied from an external power source and outputs the boosted
voltage as an output voltage through an output capacitor; and a
feedback circuit section configured to control the booster
operation of the charge pump depending on the output voltage. A
mode of the booster operation includes: a charge mode that charges
the output capacitor with the voltage supplied from the external
power source; and a discharge mode that discharges the output
capacitor. The mode of the booster operation is switched between
the charge mode and the discharge mode depending on the output
voltage. The feedback circuit section comprises a booster operation
control section configured to secure a period during which the mode
is not switched between the charge mode and the discharge mode in
accordance with an external synchronizing signal.
[0044] In another embodiment of the present invention, a display
panel is provided. The display device has: a display panel having a
plurality of scan lines; and a booster circuit configured to
generate an output voltage and to supply the output voltage as
power source to the display panel. The booster circuit has: a
charge pump configured to perform a booster operation that boosts a
voltage supplied from an external power source and outputs the
boosted voltage as the output voltage through an output capacitor;
and a feedback circuit section configured to control the booster
operation of the charge pump depending on the output voltage. A
mode of the booster operation includes: a charge mode that charges
the output capacitor with the voltage supplied from the external
power source; and a discharge mode that discharges the output
capacitor. The mode of the booster operation is switched between
the charge mode and the discharge mode depending on the output
voltage. The feedback circuit section comprises a booster operation
control section configured to secure a period during which the mode
is not switched between the charge mode and the discharge mode in
accordance with an external synchronizing signal. The period
includes a timing at which an active scan line is switched among
the plurality of scan lines.
[0045] In still another embodiment of the present invention, a
method of driving a display panel is provided. The method includes:
generating, by using a charge pump, a booster voltage from a
voltage supplied from an external power source; and supplying the
booster voltage as power source to the display panel. The
generating the booster voltage comprises: activating, in a charge
mode, the charge pump to perform a booster operation that boosts
the voltage supplied from the external power source; deactivating,
in a discharge mode, the charge pump to stop the booster operation;
switching a mode between the charge mode and the discharge mode
depending on the booster voltage; and securing a period during
which the mode is not switched between the charge mode and the
discharge mode in accordance with an external synchronizing signal.
The period includes a timing at which an active scan line is
switched among a plurality of scan lines of the display panel.
[0046] A booster circuit according to the present invention shifts
a feedback voltage in accordance with an external synchronizing
signal. That is, the booster circuit controls a timing of the
feedback control operation by using a plurality of threshold
values. When the booster circuit of the present invention is used
as a power supply circuit for a display device, the booster
operation is restricted in the vicinity of a switching timing of
the scan signal of the display device. Since a point at which the
output of the booster circuit steeply rises can be shifted away
from a timing at which a display signal is written to a pixel, it
is possible to prevent the display from being influenced by the
noise due to the operation of the booster circuit. Note that the
plurality of threshold values used here can be achieved by
previously setting an arbitrary voltage.
BRIEF DESCRIPTION OF THE DRAWINGS
[0047] The above and other objects, advantages and features of the
present invention will be more apparent from the following
description of certain preferred embodiments taken in conjunction
with the accompanying drawings, in which:
[0048] FIG. 1 is a circuit diagram showing a typical feedback-type
booster circuit;
[0049] FIG. 2 is a circuit diagram showing the typical
feedback-type booster circuit;
[0050] FIG. 3 is a waveform diagram for explaining a waveform of an
output voltage VOUT including a ripple waveform and an influence of
the ripple waveform on a display waveform. The (A) part is a
waveform diagram showing gate control signals of scan signal lines
G1, G2 and G3, a source line signal of a data line S1, and the
output voltage VOUT of the booster circuit. The (B) part is a
magnified diagram which illustrates in more detail the gate control
signal of the scan signal line G1, the source line signal of the
data line S1, and the output voltage VOUT of the booster
circuit;
[0051] FIG. 4 is a circuit diagram of a display system using the
booster circuit shown in FIG. 2;
[0052] FIG. 5 is a diagram for explaining influence of noise of a
driver power source on a liquid crystal display device;
[0053] FIG. 6A is a circuit diagram showing a booster circuit
according to a first embodiment of the present invention;
[0054] FIG. 6B is a detailed circuit diagram showing a voltage
dividing circuit section 24 in the booster circuit according to the
first embodiment;
[0055] FIG. 7 is a diagram for explaining various signals in the
booster circuit according to the first embodiment of the present
invention;
[0056] FIG. 8A is a circuit diagram showing a booster circuit
according to a second embodiment of the present invention;
[0057] FIG. 8B is a detailed circuit diagram showing a voltage
dividing circuit section 24 in the booster circuit according to the
second embodiment;
[0058] FIG. 9 is a diagram for explaining various signals in the
booster circuit according to the second embodiment of the present
invention;
[0059] FIG. 10 is a circuit diagram showing a booster circuit
according to a third embodiment of the present invention;
[0060] FIG. 11 is a circuit diagram showing a booster circuit
according to a fourth embodiment of the present invention;
[0061] FIG. 12 is a configuration diagram showing a driver in a
low-temperature polysilicon type liquid crystal display panel;
and
[0062] FIG. 13 is a diagram for explaining various signals in the
booster circuit according to the fourth embodiment of the present
invention.
DESCRIPTION OF PREFERRED EMBODIMENTS
[0063] The invention will be now described herein with reference to
illustrative embodiments. Those skilled in the art will recognize
that many alternative embodiments can be accomplished using the
teachings of the present invention and that the invention is not
limited to the embodiments illustrated for explanatory
purposed.
First Embodiment
[0064] FIG. 6A is a circuit diagram showing the booster circuit
according to a first embodiment of the present invention. FIG. 6B
is a detailed circuit diagram showing a voltage dividing circuit
section 24 in the booster circuit according to the first
embodiment.
[0065] The booster circuit according to the present embodiment has
a charge pump 10, a feedback circuit section 20 and a logic circuit
section 30. The charge pump 10 has a DC/DC converter 11, a booster
capacitor (C1) 12 and an output capacitor (CL) 13, The DC/DC
converter 11 has a voltage input section 111, a clock input section
112 and a booster voltage output section 112. The feedback circuit
section 20 has a voltage dividing circuit section 24, a comparison
circuit section 21, a reference voltage source section 22 and an
external synchronizing signal input section 25 and a booster
operation control section 200. The booster operation control
section 200 in the present embodiment has the voltage dividing
circuit section 24 and the external synchronizing signal input
section 25. The comparison circuit section 21 has a comparator 210.
The voltage dividing circuit section 24 has a variable resistor
(R1) 243 and a fixed resistor (R2) 242. The variable resistor 243
includes two fixed resistor 245 (R1a) and 246 (Rib) and a switch
(SW1) 247. The switch 247 is a Low active type. In other words,
when an external synchronizing signal VDWN supplied from an
external synchronizing signal output section is in the Low state
(activated state), the switch is in a conductive state and the
fixed resistor 246 is short-circuited, resulting in R1=R1a.
Conversely, when the external synchronizing signal VDWN is in the
High state (deactivated state), the switch 247 is in a
non-conductive state, resulting in R1=R1a+R1b.
[0066] The charge pump 10 is connected to an external voltage
source at the voltage input section 111. The charge pump 10 is
further connected to an input section of the feedback circuit
section 20 at the booster voltage output section 112. The charge
pump 10 is further connected to an output section of the logic
circuit section 30 at the clock input section 113. The feedback
circuit section 20 is connected to an input section of the logic
circuit 30 at an output thereof. The feedback circuit section 20 is
also connected to the external synchronizing signal output section.
The logic circuit section 30 is further connected to an external
clock signal output section at the external clock signal input
section 31.
[0067] A configuration of the charge pump 10 will be described
below. A voltage input section of the charge pump 10 is connected
to a voltage input section of the DC/DC converter 11. The DC/DC
converter 11 is further connected to both ends of the booster
capacitor 12. The DC/DC converter 11 is further connected to the
booster voltage output section 112 at a voltage output section
thereof. The DC/DC converter 11 is further connected, to the output
section of the logic circuit section 30 at the clock signal input
section 113. One end of the output capacitor 13 is connected to the
booster voltage output section 112. The other end of the output
capacitor 13 is connected to a ground 19.
[0068] A configuration of the feedback circuit section 20 will be
described below. The voltage dividing circuit section 24 is
connected to an input section of the feedback circuit section 20.
The voltage dividing circuit section 24 is further connected to one
input section of the comparison circuit section 21 at the voltage
dividing node 240. The reference voltage source section 22 is
connected to the other input section of the comparison circuit
section 21. An output section of the comparison circuit section 21
is connected to an output section of the feedback circuit section
20.
[0069] A configuration of the logic circuit section 30 will be
described below. The output section of the feedback circuit section
20 is connected to the input section of the logic circuit section
30. The external clock signal output section is connected to the
external clock signal input section 31 of the logic circuit section
30. The clock input section 113 of the charge pump 10 is connected
to the output section of the logic circuit section 30.
[0070] A configuration of the voltage dividing circuit section 24
will be described below. A ground 249, the variable resistor (R1)
243, the voltage dividing node 240, the fixed resistor (R2) 242 and
the booster voltage output section 112 of the charge pump 10 are
serially connected in this order. The input section of the
comparison circuit section 21 is connected to the voltage dividing
node 240. The voltage at the voltage dividing node 240 is referred
to as the "feedback voltage VFB".
[0071] A configuration of the variable resistor (R1) 243 will be
described below with reference to FIG. 6B. The fixed resistor (R1a)
245 and the fixed resistor (R1B) 246 are connected in series. The
switch 247 is connected to the fixed resistor 246 in parallel. The
switch 247 is further connected to the external synchronizing
signal input section 25 at a control section thereof. Accordingly,
the voltage dividing ratio of the voltage dividing circuit section
24 varies in response to change in the external synchronizing
signal VDWN. It should be noted that the configuration of the
voltage dividing circuit section 24 shown in FIGS. 6A and 6B is
merely an example, and the other configuration is also possible as
long as the voltage dividing ratio varies depending on the external
synchronizing signal VDWN.
[0072] A configuration of the comparison circuit section 21 will be
described below. The comparator 210 is connected to the voltage
dividing node 240 at an inverted input section thereof. The
comparator 210 is further connected to the reference voltage source
section 22 at an non-inverted input section thereof. The comparator
210 is further connected to one input section of the logic circuit
section 30 at an output section thereof.
[0073] A configuration of the reference voltage source section 22
will be described below. The non-inverted input section of the
comparator 210 and the ground are connected to a positive electrode
and a negative electrode of the reference voltage source (VREF)
220, respectively.
[0074] An operation of the booster circuit according to the present
embodiment will be described below.
[0075] FIG. 7 is a diagram for explaining various signals in the
booster circuit according to the present embodiment. Graphs of G1,
G2 and G3 represent time variations of first, second and third gate
control signals. A graph of VDWN represents time variation of the
external synchronizing signal VDWN. The feedback voltage VFB and
the output voltage VOUT are the voltages at the voltage dividing
node 240 and the booster voltage output section 112, respectively.
S1 represents time variation of the source line signal. Although
gate lines other than the G1 to G3 and source lines other than S1
are not shown in FIG. 7, an arbitrary number of the gate lines and
source lines can be used.
[0076] The operation of the booster circuit according to the
present embodiment will be described with reference to FIG. 7. In a
period from T0 to T1, the gate control signal G1 is in the High
state, and G2 and G3 are in the Low state. The external
synchronizing signal VDWN is in the Low state. As for the S1, the
voltage transitionally increases in accordance with the booster
operation of the booster circuit. In addition, in S1, the voltage
suddenly changes many times. This is due to an influence of a
high-frequency signal caused by the switching operation in the
booster operation of the DC/DC converter 11.
[0077] In this state, the output voltage VOUT increases and
decreases in accordance with the booster operation in the booster
circuit. Hereinafter, the operation of the booster circuit is
classified into two modes; a period during which the output voltage
VOUT increases is referred to as a "charge mode", and a period
during which the output voltage VOUT decreases is referred to as a
"discharge mode".
[0078] First, the "discharge mode" of the charge pump 10 will be
described in detail. The external clock signal CLK repeatedly
changes between the High state and the Low state. Although the
change in the external clock signal CLK is generally periodical, it
is not necessarily periodical. When the external clock signal CLK
is in the Low state or the output (EN) of the feedback circuit
section 20 is in the Low state, the output (CLKIN) of the logic
circuit section 30 is in the Low state. That is, the clock signal
(booster operation control signal) CLKIN supplied to the clock
signal input section 113 of the DC/DC converter 11 also is in the
Low state. When the clock signal (booster operation control signal)
CLKIN is in the Low state, the DC/DC converter 11 charges
electrical charges supplied from the voltage input section 111 into
the booster capacitor 12. At this time, the DC/DC converter 11
connects the positive electrode and the negative electrode of the
booster capacitor 12 to the voltage input section 111 and the
ground 19, respectively.
[0079] Meanwhile, the output capacitor 13 is discharging. In the
charge mode of the charge pump 10 described later, the output
capacitor 13 stores electrical charges therein. As the output
capacitor 13 supplies electrical power to an arbitrary external
circuit connected to the booster voltage output section 112 of the
booster circuit, the voltage of the output capacitor 13 gradually
decreases.
[0080] The voltage of the output capacitor 13 is divided by the
voltage dividing circuit section 24, and the feedback voltage VFB
is output from the voltage dividing node 240. The feedback voltage
VFB is input to the comparison circuit section 21 and compared with
the reference voltage VREF. The reference voltage VREF is designed
such that the reference voltage VREF is equal to the feedback
voltage VFB when the output capacitor 13 discharges and needs to be
recharged. When the voltage of the output capacitor 13 decreases
and the feedback voltage VFB becomes equal to or smaller than the
reference voltage VREF, the output (EN) of the comparison circuit
section 21 changes from the Low state to the High state. As a
result, the operation mode of the charge pump 10 changes from the
discharge mode to the charge mode.
[0081] Note that the above-mentioned combination of the High state
and the Low state is merely an example. In other words, the High
state and the Low state of each of the external clock signal CLK,
the output (EN) of the feedback circuit section 20 and the clock
signal CLKIN may be reversed. In this case, as a matter of course,
it is necessary to appropriately change and reinterpret the
operation or a truth table of the logic circuit section 30.
[0082] Next, the "charge mode" of the charge pump 10 will be
described below. When the external clock signal CLK is in the High
state and the output (EN) of the feedback circuit section 20 is in
the High state, the output (CLKIN) of the logic circuit section 30
is in the High state. The clock signal CLKIN supplied to the clock
signal input section 113 of the DC/DC converter 11 is in the High
state. When the clock signal CLKIN is in the High state, the DC/DC
converter 11 shares electrical charges in the booster capacitor 12
with the output capacitor 13. In other words, as opposed to the
case of the discharge mode, the DC/DC converter 11 connects the
negative electrode of the booster capacitor 12 to the voltage input
section 111. Furthermore, the DC/DC converter 11 connects the
positive electrode of the booster capacitor 12 to the booster
voltage output section 112 The serially-connected booster capacitor
12 and voltage input section charge the output capacitor 13
connected to the booster voltage output section 112. At this time,
the switching operation of switching various connections may
generate high-frequency noise, which may affect an external circuit
connected to the booster voltage output section 112.
[0083] In the charge mode, the booster capacitor 12 discharges and
the output voltage VOUT rises. At the same time, the feedback
voltage VFB also rises. When the feedback voltage VFB exceeds the
reference voltage VREF, the output (EN) of the comparison circuit
section 21 is changed to the Low state. Therefore, the operation
mode of the charge pump 10 changes from the charge mode to the
discharge mode.
[0084] It should be noted that, in general, charging of the output
capacitor 13 completes almost instantly.
[0085] The reduction rate of the voltage of the output capacitor 13
depends on power consumption of the external circuit to which
electric power is supplied from the output capacitor 13. Therefore,
if the power consumption of the external circuit varies, the cycle
of switching between the charge mode and the discharge mode of the
charge pump 10 also varies. In other words, when the load of the
external circuit increases, the switching cycle becomes shorter.
Conversely, when the load of the external circuit decreases, the
switching cycle becomes longer.
[0086] Next, a period from T1 to T3 will be described with
reference to FIG. 7. In the period from T1 to T3, the external
synchronizing signal VDWN shifts from the Low state to the High
state. When the external synchronizing signal VDWN is in the High
state, the switch 247 is turned OFF. Therefore, the resistance
value (R1) of the variable resistor 243 is increased and the
voltage dividing ratio of the voltage dividing circuit section 24
is changed. As a result, the feedback voltage VFB is lowered as
compared with the case where the external synchronizing signal VDWN
is in the Low state.
[0087] At a time T2 within the period from T1 to T3, the gate
control signal G1 is switched from the High state to the Low state,
and instead, the gate control signal G2 is switched from the Low
state to the High state. This means that the active scan line in a
display device is switched from G1 to G2.
[0088] In FIG. 7, a time from T1 to T2 and a time from T2 to T3 are
equal to each other, which is hereinafter referred to as "T". The
time T corresponds to a time required for stabilizing the voltage
to a predetermined voltage if the booster operation occurs in a
period other than the period from T1 to T3. When the power source
noise removal ratio is considered, an amount of noise on the
booster voltage output section is empirically smaller than a normal
signal driving amplitude by one digit or more. Therefore, the
period T may be designed to be 10% of one scan period or more.
[0089] Moreover, the variation amount of the resistance value of
the variable resistor 243 is designed such that a voltage applied
to both ends of the variable resistor 243 becomes about twice as
much as an output ripple voltage. The reason is as follows: when
there is a larger difference between the voltages, a ripple
difference between the higher set voltage and the lower set voltage
becomes large, which affects an average output voltage. Therefore,
it is generally desirable that the difference between the two set
voltages due to difference of the external synchronizing signal
VDWN is designed to be within about a few 100 mV.
[0090] According to the present embodiment, as shown in FIG. 7, the
set voltage is lowered during the period when the external
synchronizing signal VDWN is in the Low state, as indicated by a
broken line. In other words, the set voltage is lowered in the
period around the switching timing (T2) of the active scan line.
Therefore, the output voltage VOUT hardly becomes lower than the
lowered set voltage during this period, even with voltage drop due
to the load connected to the booster voltage output section 112.
Thus, during this period, the feedback signal (comparison result
signal) EN output from the comparison circuit section 21 of the
feedback circuit section 20 is likely to be in the Low state. As a
result, the booster operation (charging operation) of the booster
circuit hardly occurs during this period.
[0091] According to the present embodiment, as described above,
variation in the output voltage VOUT due to the booster operation
is small during the period in the vicinity of switching of the
active scan line. Since the booster operation of the DC/DC
converter 11 causes ripple noise at the time of the switching, the
ripple noise may be imposed on the output booster voltage. This is
apparent from the waveform S1 of the source line shown in FIG. 7.
However, since the source line is under being driven, even when the
voltage shifts due to the ripple noise, the voltage can be
stabilized to a predetermined voltage as long as the driving period
remains for the time "T" or more. In the last period "T" during the
driving period of the source line, the threshold value of the
booster operation is changed because the resistance value R1 of the
variable resistor 243 is changed. Since the DC/DC converter 11 does
not perform the booster operation in accordance with the control by
the feedback circuit section 20, display is not affected.
[0092] As another possible problem, overdischarge in the booster
voltage output section 112 can be caused for artificial reasons
such as contact of the liquid crystal display panel with an
external environment. A malfunction that the above-mentioned
switching period (T) becomes longer can occur by a malfunction of a
display control signal due to an effect of noise and the like.
However, since the set voltage is changed according to the present
embodiment, the DC/DC converter 11 restarts the booster operation
when the feedback voltage VFB becomes lower than the lower set
voltage. In other words, the booster circuit in the present
embodiment has a recovery function with respect to various
malfunctions.
[0093] As described above, the switching timing of the feedback
signal (comparison result signal) EN output from the feedback
circuit section 20 can be controlled by using the plurality of set
voltages in the comparator 210. The voltage input to the feedback
circuit section 20 is adjusted in synchronization with the external
synchronizing signal VDWN from the display device, and thereby the
booster operation is constricted in a period immediately before the
switching of the scan line. As a result, feedback control which
does not affect display of the display device can be achieved.
Second Embodiment
[0094] FIG. 8A is a circuit diagram showing the booster circuit
according to a second embodiment of the present invention. FIG. 8B
is a detailed circuit diagram showing the voltage dividing circuit
section 24 in the booster circuit according to the second
embodiment.
[0095] A configuration of the booster circuit in the present
embodiment is the same as the configuration in the first embodiment
except for the following one point. The difference in the
configuration of the booster circuit between the present embodiment
and the first embodiment is the switch in the variable resistor. In
the foregoing first embodiment, the switch (SW1) 247 that is the
Low-active type is used in the variable resistor 243. In the
present embodiment, however, a switch (SW2) 248 that is a High
active type is used in a variable resistor 244. In other words,
when the external synchronizing signal VDWN supplied to the
external synchronizing signal input section 25 is in the High state
(activated state), the switch 248 is short-circuited. Conversely,
when the external synchronizing signal is in the Low state
(deactivated state), the switch 248 is turned into a non-conductive
state.
[0096] Since the other configuration of the booster circuit in the
present embodiment is the same as in the first embodiment,
description thereof is omitted.
[0097] FIG. 9 is a diagram for explaining various signals in the
booster circuit according to the present embodiment.
[0098] According to the foregoing first embodiment, the set voltage
before and after the switching of the scan line is decreased by
increasing the resistance value (R1) of the variable resistor 243
in the feedback circuit section 20. Conversely, according to the
present embodiment, the set voltage before and after the switching
of the scan line is increased by decreasing the resistance value
(R1') of the variable resistor 244 in the feedback circuit section
20.
[0099] According to the present embodiment, as shown in FIG. 9, the
external synchronizing signal VDWN is in the High state for a
certain period before a timing that is the time "T" before the
switching of the scan line. In other words, the set voltage is
increased for a certain period before a timing that is the time "T"
before the switching of the scan line. This induces the booster
operation during the certain period before the switching of the
scan signal, which prevents occurrence of the booster operation in
a period immediately before and after the switching of the scan
line as in the first embodiment.
[0100] An object of the present embodiment also is to prevent
occurrence of the booster operation in the same predetermined
period as set in the first embodiment. As a method for achieving
this, the set voltage is increased in the above-mentioned certain
period before the switching of the scan line, in order to
intentionally cause the booster operation beforehand. The output
voltage VOUT is increased beforehand in this manner, and thus the
feedback circuit section 20 does not operate in the vicinity of the
switching of the scan line even if the output voltage VOUT is
decreased due to the external load.
[0101] In general, as described above, the capacity (C1) of the
booster capacitor 12 is larger than a load of one scan line as a
whole in the liquid crystal display panel. Therefore, there is no
possibility that the voltage has to be boosted again in the period
T after the booster operation.
[0102] The present embodiment is effective in a case where when two
set values are set, a margin of the lower limit value of the output
voltage VOUT cannot be secured. For example, when a basic set
voltage is 5 V and an output voltage of an amplifier driver is 4.7
V, it is necessary to set the set voltage on the lower side in a
range from 4.7 to 5 V. Considering the influence of the ripple
noise and voltage drop in the period T due to the load, there is a
high possibility that the booster operation occurs in the period T.
In such a case, the method according to the present embodiment is
especially effective. For example, in the above-mentioned case, the
problem can be solved by setting the basic set voltage to 5 V and
the set voltage on the higher side to 5.5 V.
[0103] As described above, the switching timing of the feedback
signal (comparison result signal) EN output from the feedback
circuit section 20 can be controlled by using the plurality of set
voltages in the comparator 210. The voltage input to the feedback
circuit section 20 is adjusted in synchronization with the external
synchronizing signal VDWN from the display device, and thereby the
booster operation is caused in the above-mentioned certain period
before a timing that is the time "T" before the switching of the
scan line. As a result, feedback control which does not affect
display of the display device can be achieved.
Third Embodiment
[0104] FIG. 10 is a circuit diagram showing the booster circuit
according to the present embodiment.
[0105] A configuration of the booster circuit in the present
embodiment is the same as the configuration of the booster circuit
in the first embodiment or the second embodiment except for the
following two points. The differences in the configuration of the
booster circuit between the present embodiment and the first
embodiment or the second embodiment are in the voltage dividing
circuit section 24 and the reference voltage source section 22. The
booster operation control section 200 according to the present
embodiment includes the external synchronizing signal input section
25 and the reference voltage source section 22.
[0106] The voltage dividing circuit section 24 of the booster
circuit in the first embodiment or the second embodiment includes
the variable resistor 243 (R1) or 244 (R1') and the fixed resistor
(R2) 242. However, the voltage dividing circuit section 24 of the
booster circuit in the present embodiment includes two fixed
resistors 241 (R1) and 242 (R2). The fixed resistor 241 in the
present embodiment is not connected to the external synchronizing
signal input section 25.
[0107] The reference voltage source section 22 in the first
embodiment or the second embodiment includes the single reference
voltage source 220. However, the reference voltage source section
22 in the present embodiment includes two reference voltage sources
221 (VREF1) and 222 (VREF2) and a reference voltage source
selection switch 223. Here, the reference voltage source selection
switch 223 electrically connects any one of the reference voltage
sources 221 (VREF1) and 222 (VREF2) to the non-inverted node of the
comparator 210. The reference voltage source selection switch 223
is connected to the external synchronizing signal input section 25
and switches the connection in accordance with the external
synchronizing signal VDWN. The two reference voltage sources 221
and 222 are connected to the ground at the opposite side of the
reference voltage source selection switch 223.
[0108] Since the other configuration of the booster circuit in the
present embodiment is the same as in the first embodiment or the
second embodiment, description thereof is omitted.
[0109] In the first embodiment or the second embodiment, the timing
at which the output of the comparison circuit section 21 changes is
changed by switching the ratio of the variable resistor 243 (R1) or
244 (R1') to the fixed resistor 242 (R2) in the feedback circuit
section 20. In the present embodiment, various resistance values in
the voltage dividing circuit section 24 are fixed. Instead, the
timing at which the output (EN) of the comparison circuit section
21 changes is changed by switching the value of the reference
voltage VREF in accordance with the external synchronizing signal
VDWN. In other words, either one of the reference voltage source
221 (VREF1) or 222 (VREF2) is connected to the non-inverted node of
the comparator 210 in accordance with the external synchronizing
signal VDWN.
[0110] Two kinds of operating pattern are obtained depending on
whether the external synchronizing signal VDWN is in the High state
or the Low state, and whether the reference voltage VREF output
from the reference voltage source section 22 connected to the
comparator 210 is higher or lower than the set voltage. In either
case, the timing chart of various signals is the same as that in
FIG. 7 or FIG. 9, and detailed description of operation is
omitted.
[0111] In the present embodiment, a total resistance value (=R1+R2)
of the voltage dividing circuit section 24 is fixed. Accordingly,
influence on the output voltage VOUT can be suppressed. In other
words, since a feedback resistance load connected to the booster
voltage output section 112 at all times is constant, variation in
the output voltage VOUT due to the operation of the feedback
circuit section 20 is advantageously small.
[0112] As described above, the switching timing of the feedback
signal (comparison result signal) EN output from the feedback
circuit section 20 can be controlled by using the plurality of set
voltages in the comparator 210. The reference voltage VREF output
from the reference voltage source section 200 and input to the
comparator 210 is adjusted in synchronization with the external
synchronizing signal VDWN from the display device. Thereby, the
booster operation is constricted in a period immediately before the
switching of the scan line. Alternatively, the booster operation is
caused in the above-mentioned certain period before a timing that
is the time "T" before the switching of the scan line. As a result,
feedback control which does not affect display of the display
device can be achieved.
Fourth Embodiment
[0113] FIG. 11 is a circuit diagram showing a booster circuit
according to the fourth embodiment.
[0114] A configuration of the booster circuit in the present
embodiment is the same as the configuration of the booster circuit
in the first embodiment or the second embodiment except for the
following two points. The differences in the configuration of the
booster circuit between the present embodiment and the first
embodiment or the second embodiment are in the voltage dividing
circuit section 24 and the comparison circuit section 21.
[0115] The voltage dividing circuit section 24 of the booster
circuit according to the present embodiment has two
serially-connected fixed resistors 241 (R1) and 242 (R2). This
configuration is the same as in the third embodiment, and detailed
description thereof is omitted.
[0116] The comparison circuit section 21 of the booster circuit
according to the present embodiment is obtained by adding a
synchronizing circuit 26 to the comparison circuit section 21 in
the first embodiment or the second embodiment. The output section
of the comparator 210 and the external synchronizing signal input
section 25 are connected to an input section of the synchronizing
circuit 26. An output section of the synchronizing circuit 26 is
connected to one input section of the logic circuit section 30.
[0117] In the foregoing first to third embodiments, the booster
operation is controlled by making an operation reference point of
the comparator 210 tunable and varying the point in synchronization
with the external synchronizing signal VDWN. In the present
embodiment, a plurality of external synchronizing signals are used
in place of a plurality of set voltages. More specifically, the
external synchronizing signal input section 25 includes a first
external synchronizing signal input section 251 and a second
external synchronizing signal input section 252. The plurality of
external synchronizing signals include two kinds of external
synchronizing signals EN_ON and EN_OFF which is, for example,
display synchronizing signals output from the display device. The
externally synchronizing signals EN_ON and EN_OFF are input to the
first and second external synchronizing signal input sections 251
and 252, respectively. The two external synchronizing signals EN_ON
and EN_OFF are used for setting a valid period and an invalid
period of the feedback operation, respectively.
[0118] The synchronizing circuit 26 is realized by using, for
example, a latch circuit or a delay flip flop (hereinafter referred
to as "DFF"). In an example shown in FIG. 11, the output section of
the comparator 210 is connected to a data signal input section ("D"
in this figure) of the DFF. The first external synchronizing signal
EN_ON for making the feedback operation valid is supplied to a
clock signal input section ("CLK" in this figure) of the DFF. The
second external synchronizing signal EN_OFF for making the feedback
operation invalid is supplied to a reset signal input section
("RES" in this figure) of the DFF. The DFF delays outputting of the
signal input to the data signal input section to timing
corresponding to each state of the two external synchronizing
signals EN_ON and EN_OFF. It is thus possible to secure a period
during which the charge pump does not perform the booster
operation, depending on the state of the display device.
[0119] In other words, the synchronizing circuit 26 in the present
embodiment modulation-sets an output enable period in the valid
period and the invalid period of the feedback operation. Describing
more specifically, the synchronizing circuit 26 modulates the
output waveform of the comparator 210 to provide a non-responsive
period.
[0120] The feedback circuit section 20 in the present embodiment
achieves a normal feedback operation except for the above-mentioned
operation, and detailed description is omitted.
[0121] FIG. 12 is a configuration diagram showing a driver in a
low-temperature polysilicon type liquid crystal display panel
(hereinafter referred to as a "low-temperature
polysili-panel").
[0122] Description is made that the booster circuit according to
the present embodiment is especially effective when used as a power
source for the low-temperature polysili-panel.
[0123] The low-temperature polysili-panel includes a plurality of
switches for time-shared driving mainly on a liquid crystal display
panel side and partly on a driver side. By using these time-shared
driving switches, with a small number of amplifier drivers, the
low-temperature polysili-panel enables driving of a large number of
data lines.
[0124] For example, in the case of three time-shared driving in the
example shown in FIG. 12, three source lines S1, S2 and S3 are
driven by one amplifier. However, this requires three control
signals SR, SG and SB for switching time-shared driving switches to
which the amplifier is connected. In this case, the signals SR, SG
and SB for switching the time-shared driving switches need to be
regarded as being equivalent to a normal scan signal. The reason is
as follows: until the source line switch signals SR, SG and SB are
put into an OFF state, the output of the source line must be
secured to a predetermined voltage, which is directly connected to
the load of the liquid crystal display panel.
[0125] FIG. 13 is a diagram for describing various signals in the
booster circuit in the present embodiment. A horizontal axis
represents time passage and a vertical axis represents various
signals or voltages. Graphs of G1 and G2 represent changes in the
first and second gate control signals with time, respectively. SR,
SG and SB represent changes in the source line switch signals with
time. EN_ON and EN_OFF represent changes in the two kinds of
display signals with time. CMOUT represents a change in a signal
which is output from the comparator 210 and supplied to the
synchronizing circuit 26 with time. The feedback signal EN
represents a change in a signal which is output from the
synchronizing circuit 26 and supplied to the logic circuit section
30 with time. VOUT represents a change in the voltage at the
booster voltage output section with time. S1 represents a change in
the source line signal with time. Although gate lines other than G1
or G2 and source lines other than S1 are not shown in FIG. 13, any
number of gate lines and source lines may be provided.
[0126] In FIG. 13, a region surrounded by a broken line represents
timing at which driving of the source line is switched. Each time
the gate lines G1, G2 become active, switching of the source line
occurs three times. Since the frequency of switching driving
becomes three times as much as conventional, it is difficult to
change the set voltage in sync with switching of driving. Thus, the
output of the feedback circuit section 20 is controlled by using
the two external synchronizing signals EN_ON and EN_OFF and the
synchronizing circuit 26. In this manner, the booster operation can
be turned off in the vicinity of the timing at which the source
line switch signals SR, SG and SB are put into the OFF state.
[0127] As described above, the switching timing of the feedback
signal (comparison result signal) EN output from the feedback
circuit section 20 can be controlled by using two signals in
synchronization with the external synchronizing signal of the
display device. Furthermore, a delay difference or a phase
difference can be added to the feedback signal. In other words,
feedback control which does not affect display of the display
device can be achieved by using the booster circuit in the present
embodiment as a power source for the liquid crystal display
device.
[0128] The booster circuit especially suited to combine with the
liquid crystal display device has been described. However, an
intended purpose of the booster circuit of the present invention is
not limited to combining with the liquid crystal display device. A
main feature of the booster circuit of the present invention is
that timing for performing the booster operation can be controlled
by an external signal. As a result, the period when the booster
operation is not performed can be secured. Therefore, it is
expected that the booster circuit of the present invention is used
in various ways other than in the liquid crystal display
device.
[0129] It is apparent that the present invention is not limited to
the above embodiments and may be modified and changed without
departing from the scope and spirit of the invention.
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