U.S. patent application number 13/287065 was filed with the patent office on 2012-02-23 for wafer-level package using stud bump coated with solder.
This patent application is currently assigned to Carsem (M) Sdn. Bhd.. Invention is credited to Lau Choong Keong, Lily Khor, Yong Lam Wai.
Application Number | 20120043655 13/287065 |
Document ID | / |
Family ID | 41479103 |
Filed Date | 2012-02-23 |
United States Patent
Application |
20120043655 |
Kind Code |
A1 |
Khor; Lily ; et al. |
February 23, 2012 |
WAFER-LEVEL PACKAGE USING STUD BUMP COATED WITH SOLDER
Abstract
A method of fabricated a wafer level package is described. In
one embodiment, the method includes fabricating at least one active
device on a semiconductor wafer that has not been singulated, with
the active device having a plurality of bonding pads exposed at an
upper surface of the wafer. Prior to singulating the semiconductor
wafer, a plurality of corresponding stud bumps on the plurality of
bonding pads with a wire bonding tool are formed. Thereafter, a
molding encapsulation layer is applied over the semiconductor wafer
leaving an upper portion of each of the plurality of stud bumps
exposed.
Inventors: |
Khor; Lily; (Perak, MY)
; Wai; Yong Lam; (Perak, MY) ; Keong; Lau
Choong; (Perak, MY) |
Assignee: |
Carsem (M) Sdn. Bhd.
Perak Darul Ridzuan
MY
|
Family ID: |
41479103 |
Appl. No.: |
13/287065 |
Filed: |
November 1, 2011 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
|
12475362 |
May 29, 2009 |
8071470 |
|
|
13287065 |
|
|
|
|
Current U.S.
Class: |
257/738 ;
257/E21.159; 257/E23.021; 438/614 |
Current CPC
Class: |
H01L 2224/11849
20130101; H01L 2224/13147 20130101; H01L 2224/11822 20130101; H01L
2224/1184 20130101; H01L 2924/01082 20130101; H01L 2224/0401
20130101; H01L 2224/0612 20130101; H01L 2224/45015 20130101; H01L
2224/45124 20130101; H01L 2924/01015 20130101; H01L 2924/14
20130101; H01L 2224/1191 20130101; H01L 2224/04042 20130101; H01L
2224/13022 20130101; H01L 2224/48624 20130101; H01L 2224/85
20130101; H01L 2224/45124 20130101; H01L 2224/05573 20130101; H01L
2224/11901 20130101; H01L 2924/01029 20130101; H01L 24/11 20130101;
H01L 2224/04042 20130101; H01L 2224/45144 20130101; H01L 2224/78303
20130101; H01L 2224/05624 20130101; H01L 2224/1181 20130101; H01L
2224/274 20130101; H01L 2924/12042 20130101; H01L 2224/13082
20130101; H01L 2224/85207 20130101; H01L 24/74 20130101; H01L
2224/13111 20130101; H01L 2924/01023 20130101; H01L 2224/45015
20130101; H01L 2224/45147 20130101; H01L 2224/742 20130101; H01L
2924/00013 20130101; H01L 2224/1132 20130101; H01L 2224/48624
20130101; H01L 2224/78611 20130101; H01L 2224/48824 20130101; H01L
2924/01015 20130101; H01L 2924/0105 20130101; H01L 2924/01079
20130101; H01L 24/13 20130101; H01L 2224/48824 20130101; H01L
2224/78267 20130101; H01L 2224/11901 20130101; H01L 2224/13083
20130101; H01L 2224/0558 20130101; H01L 2224/1134 20130101; H01L
2224/13007 20130101; H01L 2224/13562 20130101; H01L 2224/0558
20130101; H01L 24/05 20130101; H01L 2224/13611 20130101; H01L 24/45
20130101; H01L 2224/48724 20130101; H01L 2924/014 20130101; H01L
2924/12042 20130101; H01L 24/78 20130101; H01L 2224/45144 20130101;
H01L 2224/1357 20130101; H01L 2224/16 20130101; H01L 2224/48724
20130101; H01L 2224/1308 20130101; H01L 2224/1308 20130101; H01L
2224/85207 20130101; H01L 2224/1134 20130101; H01L 2924/00014
20130101; H01L 2924/00 20130101; H01L 2224/1134 20130101; H01L
2924/00 20130101; H01L 2224/05624 20130101; H01L 2924/00 20130101;
H01L 2924/00014 20130101; H01L 2924/00 20130101; H01L 2924/00014
20130101; H01L 2924/00 20130101; H01L 2224/13099 20130101; H01L
2924/00 20130101; H01L 2224/119 20130101; H01L 2224/45147 20130101;
H01L 2924/01005 20130101; H01L 2924/01013 20130101; H01L 21/561
20130101; H01L 2224/13124 20130101; H01L 2224/13144 20130101; H01L
2924/00013 20130101; H01L 2924/01006 20130101; H01L 23/291
20130101; H01L 23/293 20130101; H01L 2924/01033 20130101; H01L
2924/01074 20130101; H01L 2924/01074 20130101; H01L 2924/00011
20130101; H01L 2924/00 20130101; H01L 2924/00 20130101 |
Class at
Publication: |
257/738 ;
438/614; 257/E23.021; 257/E21.159 |
International
Class: |
H01L 23/485 20060101
H01L023/485; H01L 21/283 20060101 H01L021/283 |
Foreign Application Data
Date |
Code |
Application Number |
Oct 23, 2008 |
MY |
PI 20084228 |
Claims
1. A semiconductor wafer package comprising: a semiconductor die
having an upper surface; a plurality of bonding pads formed on the
semiconductor die; a plurality of copper stud bumps corresponding
to the plurality of bonding pads, each copper stud bumps being
directly coupled to a bonding pad without under bump metallization
between the stud bump and the bonding pad; and an encapsulation
layer overlying the semiconductor die while leaving an upper
portion of each of the plurality of stud bumps exposed.
2. The semiconductor wafer package set forth in claim 1 further
comprising a plurality of solder balls corresponding to the
plurality of copper stud bumps, wherein each solder ball is
attached to a respective one of the copper stud bumps.
3. The semiconductor wafer package set forth in claim 1 wherein
each of the plurality of the stud bumps is a stacked stud bump
comprising a plurality of copper bumps stacked on top of each
other.
4. The semiconductor wafer package set forth in claim 1 wherein the
package does not include underfill and has sufficient structural
strength to meet standard board-level reliability metrics for a
wafer-level package.
5. A method of forming a stud bump on a semiconductor die using a
wire bonding tool including a capillary having a feed hole for
dispensing a wire, a bottom face and a chamfer surrounding the fee
hole at the bottom face, the method comprising: providing a
semiconductor wafer upon which the semiconductor die is formed;
prior to singulating the semiconductor wafer: (a) lowering the
capillary towards the semiconductor wafer to allow an extruded
portion of the wire from the feed hole to contact and form a first
bond with a corresponding bond pad without breaking the wire; (b)
raising the capillary away from the semiconductor wafer while
allowing the extruded portion of the wire to stay in contact with
the bond pad without breaking the wire; (c) offsetting the
capillary from the first bond in a direction parallel to the upper
surface of the semiconductor wafer; (d) lowering the capillary so
that the bottom face of the capillary contacts the stud bump and
flattens a top surface of the stud bump; and (e) moving the
capillary away from the semiconductor die to separate the wire from
the stud bump.
6. The method of forming a stud bump as recited in claim 5 wherein
the step of lowering the capillary towards the semiconductor die
further comprises applying mechanical force, heat, or ultrasonic
energy to improve the bond between the extruded portion of the wire
and the bond pad; wherein the step of offsetting the capillary
comprises displacing a table upon which the semiconductor wafer is
positioned during the wire bonding process; and wherein the step of
lowering the capillary to flatten a top surface of the stud bump
further comprises allowing an extended portion of the wire to form
a second bond adjacent to the first bond where the stud bump is
made up of the first and second bonds.
Description
CROSS-REFERENCES TO RELATED APPLICATIONS
[0001] This application is a division of U.S. patent application
Ser. No. 12/475,362, filed May 29, 2009; which claims priority to
Malaysian Patent Application No. PI 20084228, filed on Oct. 23,
2008, the disclosure of which are hereby incorporated by reference
in their entirety for all purposes.
BACKGROUND OF THE INVENTION
[0002] The present invention relates to generally to integrated
circuit packaging technology. More specifically, embodiments of the
invention pertain to the use of wire bonding techniques to form
stud bumps for wafer-level packages.
[0003] Integrated circuits are typically packaged before being used
in electronic systems. Integrated circuit (IC) packages protect the
integrated circuits from the surrounding environment and provide
electrical connections to other components of the electronic
systems. In a conventional packaging arrangement, a wafer
containing integrated circuits is first singulated into individual
chips and then packaged for testing and delivery. This normally
includes transporting the wafer (or singulated chips) from a
semiconductor manufacturing facility where front-end processes are
performed to a separate packaging facility where back-end process
are performed to assemble and package the IC.
[0004] In contrast, in a wafer-level packaging approach. IC
packaging is formed at the wafer level on the wafer prior to
singulation. The packages can be manufactured at chip size and at
reduced cost compared to standard IC packages. Typical wafer level
packages use solder bumps to form electrical connections between
the packaged semiconductor die and external devices. Under bump
metallurgy (UMB) is formed underneath the solder bumps to minimize
metallurgical reactions with the solder and improve the
connection.
[0005] While a number of commercially successful wafer-level
packaging processes have been developed, improved waver level
packages are desirable.
BRIEF SUMMARY OF THE INVENTION
[0006] The present invention relates to generally to wafer level
packaging technology. More specifically, embodiments of the
invention pertain to the use of wire bonding techniques to form
stud bumps for wafer-level packages.
[0007] In one embodiment of the present invention, a method of
fabricating a wafer level package is described. The method includes
fabricating at least one active device on a semiconductor wafer
that has not been singulated where the active device having a
plurality of bonding pads exposed at an upper surface of the wafer.
Prior to singulating the semiconductor wafer, a plurality of
corresponding stud bumps are formed on the plurality of bonding
pads with a wire bonding tool. Thereafter, a molding encapsulation
layer is applied over the semiconductor wafer leaving an upper
portion of each of the plurality of stud bumps exposed.
[0008] In some embodiments, the stud bumps are formed by lowering
the capillary of the wire bonding tool towards the semiconductor
wafer to allow an extruded portion of the wire from the feed hole
to contact and form a first bond with a corresponding bond pad
without breaking the wire; raising the capillary away from the
semiconductor wafer while allowing the extruded portion of the wire
to stay in contact with the bond pad without breaking the wire;
offsetting the capillary from the first bond in a direction
parallel to the upper surface of the semiconductor wafer; lowering
the capillary so that the bottom face of the capillary contacts the
stud bump and flattens a top surface of the stud bump; and moving
the capillary away from the semiconductor die to separate the wire
from the stud bump.
[0009] In another embodiment of the present invention, a method of
fabricating a plurality of wafer-level packages is described. The
method includes fabricating a plurality of active devices on a
semiconductor wafer that has not been singulated. Each of the
active devices has a plurality of bonding pads exposed at an upper
surface of the wafer. Prior to singulating the semiconductor wafer
to separate the plurality of active devices, for each of the
plurality of active devices the method includes: forming a
plurality of stud bumps corresponding to the plurality of bonding
pads associated with the active device using a wire bonding tool;
applying a molding encapsulation layer over the semiconductor wafer
leaving an upper portion of each of the plurality of stud bumps
formed on each of the active devices exposed; applying solder paste
over each of the exposed of stud bumps; reflowing the solder paste;
and cleaning the substrate with flux. In some specific embodiments
the plurality of stud bumps are copper stud bumps.
[0010] In yet another specific embodiment of the present invention
a semiconductor wafer package is provided. The package includes a
semiconductor die having an upper surface, a plurality of bonding
pads formed on the semiconductor die, and a plurality of stud bumps
corresponding to the plurality of bonding pads. Each stud bump is
directly coupled to a bonding pad without under bump metallization
between the stud bump and the bonding pad. The package additionally
includes an encapsulation layer overlying the semiconductor die
which leaves an upper portion of each of the plurality of stud
bumps exposed. In some specific embodiments the plurality of stud
bumps are copper stud bumps.
[0011] These and other embodiments of the present invention, as
well its advantages and features, are described in more detail in
conjunction with the description below and attached figures.
BRIEF DESCRIPTION OF THE DRAWINGS
[0012] FIG. 1 is a simplified cross-sectional drawing of a
wafer-level package incorporating stud bumps according to one
embodiment of the invention;
[0013] FIG. 2 is a flowchart illustrating steps employed in the
formation and singulation of a wafer-level package according to an
embodiment of the present invention;
[0014] FIG. 3 is a simplified process flow showing the formation
and singulation of a wafer-level package according to the steps
recited in the flowchart of FIG. 2;
[0015] FIGS. 4A-4D are simplified cross-sectional drawings of a
wafer level package at various stages of formation as set forth in
FIGS. 2 and 3;
[0016] FIG. 5 is a flowchart illustrating steps employed in a stud
bumping process according to one embodiment of the invention;
[0017] FIGS. 6A-6E are simplified cross-sectional drawings of the
formation of a wafer-level package incorporating stud bumps
according to an embodiment of the present invention;
[0018] FIGS. 7A-7C are diagrams showing the selection of angles
used to form bumps of varying heights according to embodiments of
the present invention;
[0019] FIG. 8 is a simplified cross-sectional drawing of a
wafer-level package incorporating stacked stud bumps according to
another embodiment of the invention.
DETAILED DESCRIPTION OF THE INVENTION
[0020] The present invention relates to generally to wafer level
packaging technology. More specifically, embodiments of the
invention pertain to the use of wire bonding techniques used to
form stud bumps for wafer-level packages.
[0021] FIG. 1 is a simplified cross-sectional drawing of a
wafer-level package 100 according to an embodiment of the present
invention. Package 100 includes a semiconductor die 102 having one
or more active devices (not shown) formed thereon using
conventional semiconductor manufacturing processes during front-end
processing. The active devices include bond pads 104 which may be
made from aluminum or other suitable materials and a passivation
layer 112. Passivation layer electrically isolates bond pads 104
from each other to prevent short-circuiting of the active devices
and may be, for example, a nitride layer or other suitable
material. Bond pads 104 can be designed and fabricated in a
peripheral format, array format or any other suitable
arrangement.
[0022] Wafer-level package 100 further includes stud bumps 106
coated with solder 110 as interconnects for the package. Stud bumps
106 are formed using wire bonding techniques as described in detail
below directly over bond pads 104 without an intermediate
under-bump metallization layer used in conventional wafer level
packages. In one embodiment, stud bumps 106 are made from copper
wire but other embodiments of the invention can use wire made from
other suitable materials to form the stud bumps.
[0023] A mold encapsulation layer 108 surrounds the outside surface
of stud bumps 106 providing stability and environmental protection
to wafer-level package 100. Mold encapsulation layer 108 may be
formed from plastic or epoxy and does not cover the entirety of
stud bumps 106. The protrusion of stud bumps 106 from mold
encapsulation layer 108 allows electrical connection between the
active devices within semiconductor die 102 and an exterior portion
of the package.
[0024] FIG. 2 is a flow chart illustrating steps used in the
formation and singulation of a wafer-level package according to an
embodiment of the present invention. To better understand the
invention, FIG. 2 may be viewed in conjunction with FIG. 3, a
simplified process flow showing the formation and singulation of a
wafer-level package according to an embodiment of the present
invention.
[0025] Referring to FIGS. 2 and 3, a wafer 300 is provided (Step
202). Wafer 300 includes a semiconductor die 302 having active
devices formed thereon and bond pads overlying the semiconductor
die. Stud bumps are then formed overlying the bond pads (Step 204).
The result of this process is shown as partially completed package
in 304. A molding encapsulation process is then performed (Step
206) that leaves an upper portion of the stud bumps exposed in a
partially completed package in 306.
[0026] In a specific embodiment of the present invention, the
molding encapsulates 1/2-3/4 of the total bump height of the stud
bumps. In another embodiment, the molding layer completely
encapsulates the stud bumps when initially deposited but is then
opened to expose the stud bumps using a laser, back grinding or
other technique. The protrusion of stud bumps 106 (FIG. 1) from
mold encapsulation layer 108 provides for leads between the active
devices within semiconductor die 102 and an exterior portion of the
package. In addition, the use of mold encapsulation layer 108
obviates the need for an underfill layer, thus reducing the number
of processes needed to fully package the devices for shipment. In
another embodiment of the present invention, over molding can be
used to completely encapsulate package 100, with an etching, laser
etching, or grinding process then used to expose the stud
bumps.
[0027] A screen printing or solder dipping process is then used to
deposit a layer of solder paste on top of the stud bumps (Step 208)
forming partially completed package 308, and a reflow process (Step
210) is used to form the solder into ball interconnects better
suited for electrical interconnection as shown in partially
completed package in 310. In one embodiment, tin may be used as the
solder material but other appropriate solders may be used as
well.
[0028] The wafer is then cleaned using a flux cleaning process as
known to those of skill in the art to remove oxidation from the
solder overlying the stud bumps (Step 212). In addition to removal
of potential oxidation from the solder, the flux cleaning process
also serves to improve wetting characteristics of the solder for
improved bonds between the balls and a printed circuit board or
other device. The result of this process is shown as partially
completed package 312.
[0029] The wafer is then singulated into individual packaged IC
integrated circuits 314 (Step 214), which can be packaged onto tape
and reel or waffle packs for shipment as a finished product to
customers. Each wafer-level package 314 formed after singulation
includes one or more active devices. In some embodiments
wafer-level test and burn-in of the chips is performed prior to
singulation. This offers cost-savings as compared to individually
performing similar processes upon each chip package after
singulation.
[0030] FIGS. 4A-4D represent simplified cross-sectional views of a
wafer-level package 100 at the various steps of formation described
in FIGS. 2 and 3. Specifically, FIG. 4A shows package 100 at step
202 of FIG. 2; FIG. 4B shows package 100 at step 204; FIG. 4C shows
the package at step 206 and FIG. 4D shows the package at step
208.
[0031] A wafer-level package formed according to the steps set
forth in FIG. 2 can be formed at a lower cost than conventional
implementations. The use of wire-bonding to form the stud bump
obviates the need to use an under-bump metallization layer, while
still maintaining a reliable interconnection between the stud bump
and the underlying bond pad. This, in turn, reduces the need for
masking, etching, or plating processes that are normally used to
form the under-bump metallization layer. In addition, the completed
wafer package 100 has sufficient structural strength that it meets
the standard board-level reliability metrics for wafer-level
packaging without employing an underfill layer for board mounting
in some embodiments of the invention.
[0032] FIG. 5 is a flowchart illustrating the steps used to form
stud bumps 106 according to one embodiment of the invention. FIG. 5
may be viewed in conjunction with FIGS. 6A-6E, which are simplified
cross-sectional drawings of a wire bonding tool at various stages
of the stud bump formation process according to an embodiment of
the invention.
[0033] As shown in FIG. 5, a semiconductor wafer, such as wafer 300
shown in FIG. 3, is positioned on a table associated with an
appropriate wire bonding tool (step 502). Wafer 300 has formed
thereon a plurality of integrated circuits, each of which includes
a plurality of bonding pads (represented in FIGS. 6A-6E as bonding
surfaces 612). The wire bonding tool includes a capillary 602 with
a bottom face 606 that is positioned above bonding surface 612
during the wire bonding operation. Wire bonding tool also includes
a feed hole (not labeled) for receiving a wire 608 and a chamfer
604 surrounding the feed hole at the bottom face 606.
[0034] Capillary 602 contains a wire 608 that can be gradually
extruded from feed hole 614 in capillary 602. For example, wire 608
may be housed within a threaded capillary used for precise control
over the amount of wire 608 extended from capillary 602. An
electric flame-off tool (not shown) may be used to form the end of
wire 608 into a free air ball (not shown) for optimal deposition.
The free air ball can then be captured by the capillary 602 within
the chamfer area 604 and then lowered to the bond surface 612 to
form stud bump 610.
[0035] During the bond formation process capillary 602 is lowered
so that the extruded portion of wire 608 is contacts and forms a
bond on bond surface 612 (step 504). A number of different wire
bonding techniques may be utilized to form and bond stud bump 610
to bond surface 612 including compression bonding,
thermo-compression bonding, thermosonic bonding and ultrasonic
bonding. Through the application of mechanical force, heat, and/or
ultrasonic energy, a bond is formed between stud bump 610 and bond
surface 612. Bond surface 612 may be for example, a bond pad
overlying a semiconductor die, which includes one or more active
devices. The initial formation of stud bump 610 at this stage is
shown in FIG. 6A.
[0036] Capillary 602 is then raised from bond surface 612 while
allowing stud bump 610 to stay in contact with bond surface 612
without breaking wire 608 (step 506). Thus, stud bump 610 is still
coupled with wire 608 during process 506. The result of this
process is shown in FIG. 6B. Next, bond surface 612 and stud bump
610 are offset from capillary 602 by an width W (step 508) while
the wire is still attached to the top of the stud bump. The offset
may be accomplished by displacing a table removably coupled with
the semiconductor die thus translating bond surface 612 and stud
bump 610 in a lateral direction. Alternatively, capillary 602 may
also be moved while keeping bond surface 612 and stud bump 610
stationary. The effect of the lateral offset is that capillary 602
is shifted a width W from the bond surface 612 and stud bump 610.
In some embodiments, width W is in the range of 1.0-2.0 times the
diameter of the wire size. The result of this process is shown in
FIG. 6C.
[0037] Capillary 602 is then lowered downward so that the bottom
face 606 of capillary 602 contacts stud bump 610 pressing the
pulled portion of the wire (still connected to the top of the stud
bump) downwards onto the top surface of the stud bump (step 510).
This step flattens the top of stud bump 610 and forms what is
referred to herein as a second bond. The flattened surface on stud
bump 610 allows for easier deposition and adhesion of the solder
paste onto the stud bump as a result of the increased amount of
sidewall surface as compared to a more vertical surface. The result
of this process is shown in FIG. 6D.
[0038] Next, capillary 602 is moved upwards to separate wire 608
from stud bump 610 (step 512). The upwards movement of the entire
capillary serves to break wire 608 away from stud bump 610, which
remains bonded to bond surface 612. Because of the strong bond
created by the previous steps, the pulling up and breaking of the
wire does not affect the flattened profile of the top of stud bump
610. The result of this process is shown in FIG. 6E. By utilizing
this process, a clean break between wire 608 and bond surface 612
can be obtained so that the process flow 500 can be repeated to
form additional stud bumps on the remaining bond pads. Examples of
the height and width of typical stud bumps formed using the
processes described in FIGS. 6A-6E is set forth in Table 1
below.
TABLE-US-00001 TABLE 1 Wire Size Bump Type Bump Height Bump Size
1.0 mil Single bump 50 .+-. 10 .mu.m 85 .+-. 10 .mu.m 1.0 mil Two
stack bump 90 .+-. 10 .mu.m 90 .+-. 10 .mu.m 1.0 mil Three stack
bump 125 .+-. 10 .mu.m 95 .+-. 10 .mu.m 2.0 mil Single bump 101
.+-. 10 .mu.m 140 .+-. 10 .mu.m 4.0 mil Single bump 150 .+-. 10
.mu.m 317 .+-. 20 .mu.m
[0039] FIGS. 7A-7C are diagrams showing different capillary designs
that can be used to form bumps of varying heights according to an
embodiments of the present invention. For example, the angles and
dimensions described shown in FIG. 7A may be used by one of skill
in the art to design a capillary where ball height is 70% of the
eventually desired overall bump height. Similarly, FIGS. 7B and 7C
show angles and dimensions that may be used to design capillaries
with different internal chamfer angles to form a desired bump size.
The use of different angle selection parameters allows for
increased flexibility as all that is needed to change the
wire-bonding device is a change in the bumping parameters used in
the capillary.
[0040] In some embodiments of the invention, stacked stud bumps can
be formed to increase the height of the stud bump for particular
packages. An example of such a package is illustrated in FIG. 8,
which is a simplified cross-sectional drawing of a wafer-level
package incorporating a stacked stud bump design according to an
embodiment of the present invention. Wafer-level package 800 shown
in FIG. 8 may be used if an increased height of the stud bumps is
required to couple wafer-level package 800 with a printed circuit
device or other device. FIG. 8 shares many similar elements with
FIG. 1, such as semiconductor die 102, bond pads 104, passivation
layer 112, encapsulation layer 108, and solder 110. The primary
difference between package 100 and package 800 is that package 800
includes stacked stud bumps formed by stacking stud bumps 814
directly on top of stud bumps 106. Stud bump 814 is essentially
formed by repeating the stud bump formation process described in
FIGS. 5 and 6A-6E a second time. Stud bump 806 is formed directly
overlying first stud bump 106 and provides additional height to the
package 800 for improved interconnections. Thus, stacked stud bumps
comprising two, three, or more stud bumps are possible, depending
upon the specific bump height requirements of the package. For
example, a typical height of the stacked stud bump 106, 806 is
between 3-6 mm, about twice the height of the stud bumps formed in
package 100. The use of a stacked bump design allows for an
increased bump height without increasing the bump diameter, as
often required by area-array packages. Typically, the same material
(e.g., copper) is used to form the all of the multiple stud bumps
in a stacked stud bump configuration.
[0041] An alternate method of increasing the bump height is to use
wire of a greater diameter, as the eventual bump height following
formation is correlated with the diameter of the wire used. By
using thicker wire and appropriate parameters, the bump height
obtained may be comparable to that obtained using a stacked bump
process. For example, copper wire with a diameter between 1-4 mm
can be used to form the stud bumps.
[0042] The description above has been given to help illustrate the
principles of this invention. It is not intended to limit the scope
of this invention in any way. A large variety of variants are
apparent, which are encompassed within the scope of this
invention.
[0043] While the stud bumps 104 have been described as being formed
using a copper process, other suitable wire materials that can be
used for ball bonding can be used instead of copper to form the
stud bumps. As an example, the stud bumps can be made out of gold
or aluminum wires in other embodiments. Also, while the invention
has been described in detail and with reference to specific
examples thereof, it will be apparent to one skilled in the art
that various changes and modifications can be made therein without
departing from the spirit and scope thereof.
* * * * *