U.S. patent application number 13/163563 was filed with the patent office on 2011-10-06 for test plate for electronic component handler.
This patent application is currently assigned to ELECTRO SCIENTIFIC INDUSTRIES, INC.. Invention is credited to Gerald F. Boe.
Application Number | 20110241718 13/163563 |
Document ID | / |
Family ID | 39885700 |
Filed Date | 2011-10-06 |
United States Patent
Application |
20110241718 |
Kind Code |
A1 |
Boe; Gerald F. |
October 6, 2011 |
Test Plate for Electronic Component Handler
Abstract
Test plates with improved test pockets are described herein. One
embodiment is a circular test plate comprising a plurality of test
pockets, each test pocket being a quadrilateral hole in the test
plate, and each quadrilateral hole having four sides and four
corners located at the intersections of the sides. Each of the four
corners comprises at least one corner having a corner relief that
extends from and intersects each of the at least one corner's two
intersecting sides, and any remaining corners not having a corner
relief. The test plate can be incorporated into a component
handler.
Inventors: |
Boe; Gerald F.; (Newberg,
OR) |
Assignee: |
ELECTRO SCIENTIFIC INDUSTRIES,
INC.
Portland
OR
|
Family ID: |
39885700 |
Appl. No.: |
13/163563 |
Filed: |
June 17, 2011 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
|
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11741921 |
Apr 30, 2007 |
7965091 |
|
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13163563 |
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Current U.S.
Class: |
324/756.07 |
Current CPC
Class: |
G01R 31/01 20130101;
G01R 31/2893 20130101; G01R 31/2808 20130101 |
Class at
Publication: |
324/756.07 |
International
Class: |
G01R 31/00 20060101
G01R031/00 |
Claims
1. A circular test plate comprising: a plurality of test pockets,
each test pocket being a quadrilateral hole in the test plate, each
quadrilateral hole having four sides and four corners located at
the intersections of the sides, each of the four corners
comprising: at least one corner having a corner relief that extends
from and intersects each of the at least one corner's two
intersecting sides, and any remaining corners not having a corner
relief.
2. The test plate of claim 1, wherein the test plate is installed
in an electronic component handler at an inclined angle.
3. The test plate of claim 2 wherein each test plate has a loading
efficiency, whereby the loading efficiency of the test plate having
test pockets with corner reliefs is greater than a test plate
having test pockets without corner reliefs, due to the addition of
the corner reliefs.
4. The test plate of claim 1 wherein at least one corner relief
comprises an arcuate hole extending from a top surface of the test
plate to a bottom surface of the test plate beyond the intersecting
sides of the corner relief's corner.
5. The test plate of claim 1 wherein: the test plate has a
thickness, a top surface and a bottom surface; each of the test
pockets includes side walls that are contiguous and flat between
the top surface and the bottom surface of the test plate and the
corners of its test pocket; and each side wall is perpendicular to
at least one of the top surface or the bottom surface of the test
plate.
6. The test plate of claim 5 wherein each corner relief includes at
least one side wall, the at least one side wall being contiguous
between the top surface of the test plate, the bottom surface of
the test plate, and the intersections between the corner relief and
the intersecting sides of the corner relief's corner.
7. The test plate of claim 1 wherein the at least one test pocket
includes two corners having a corner relief and two corners not
having a corner relief.
8. The test plate of claim 7 wherein the test plate is installed in
an electronic component handler about an axis of rotation and
wherein the two corner reliefs are situated at radially-outer
corners of a test pocket.
9. The test plate of claim 1 wherein the plurality of test pockets
are arranged in a plurality of concentric rings on the surface of
the test plate.
10. A test plate including a plurality of test pockets wherein: the
test plate is circular, has a thickness, a top surface and a bottom
surface; each of the plurality of test pockets is a quadrilateral
hole through the test plate having a radially-inner surface, a
radially-outer surface and two side surfaces; the surfaces of each
test pocket are perpendicular to at least one of the top surface or
the bottom surface of the test plate; the surfaces of each test
pocket meet to form four interior edges at corners of the test
pocket; the surfaces of each test pocket are each contiguous
between the top surface and the bottom surface of the test plate;
and each test pocket includes at least one corner relief at an
interior edge thereof, each corner relief extending the test pocket
beyond at least one of the surfaces of the test pocket.
11. The test plate of claim 10 wherein the at least one corner
relief comprises an arcuate hole extending from one of the side
surfaces and one of the radially-inner or the radially-outer
surface.
12. The test plate of claim 10 wherein: the surfaces of each test
pocket extends between one of two of the interior edges, one of the
interior edges and a corner relief, or two corner reliefs; and each
test pocket is contiguous between those extents.
13. The test plate of claim 10 wherein: the test pocket includes
two corner reliefs adjacent a respective one of the interior edges;
and the test pocket includes rounded corners at the remaining
interior edges.
14. The test plate of claim 13 wherein: the test plate is rotatably
mounted in a electronic component handler; and the each of the two
corner reliefs is situated about the interior edge at the
intersection between the radially-outer surface and a respective
one of the two side surfaces.
15. In a method of testing electronic components using a rotatable
test plate installed in an electronic component handler at an
inclined angle and having a plurality of test pockets extending
through the rotatable test plate, the improvement comprising:
rotating the test plate so that each of a plurality of electronic
components resting on a top surface of the rotatable test plate is
guided into a respective test pocket of the plurality of test
pockets by a corner relief, each test pocket being a quadrilateral
hole in the rotatable test plate, each quadrilateral hole having
four sides and four corners located at the intersections of the
sides, at least one corner of the four corners having the corner
relief that extends from and intersects each of the at least one
corner's two intersecting sides, and any remaining corners of the
four corners not having a corner relief
16. The method of testing electronic components of claim 15,
further comprising: arranging the corner relief so that a loading
efficiency of the electronic component handler is greater than a
loading efficiency of the electronic component handler without the
corner relief.
17. The method of claim 15 wherein the corner relief comprises at
least two corner reliefs, one corner relief situated at a first
radially-outer corner of the test pocket and another corner relief
situated at a second radially-outer corner of the test pocket.
Description
CROSS-REFERENCE TO RELATED APPLICATION
[0001] This application is a continuation of U.S. patent
application Ser. No. 11/741,921, filed Apr. 30, 2007.
FIELD OF THE INVENTION
[0002] This invention relates to a test plate including pockets
that increase the loading efficiency for an electronic component
handler.
BACKGROUND
[0003] Electronic components are handled by a variety of different
electronic component handlers. These different handlers include but
are not limited to products sold by Electro Scientific Industries,
Inc. of Portland, Oreg., the assignee of the present patent
application. Electro Scientific Industries, Inc. sells a variety of
electronic component handlers including but not limited to a high
volume multi-layer ceramic chip (MLCC) capacitor tester sold as the
Model 3300.
[0004] Commonly-assigned U.S. Pat. No. 5,842,579 entitled
Electrical Circuit Component Handler describes an electronic
component handler. With reference to FIG. 2 there is shown an
overall pictorial view of the electronic component handler of U.S.
Pat. No. 5,842,579, the entirety of which is incorporated herein by
reference. FIG. 2 illustrates handler 10 including a loading frame
12 defining loading zone 13, a plurality of test modules 14
defining a test zone 15 and a blow-off module 16 defining a
blow-off zone 17. In operation, electronic components pass through
loading frame 12 and are individually drawn into test seats or
pockets 22 formed as apertures and organized about a test plate.
Typically, a stationary vacuum plate underlies the test plate and
includes a plurality of vacuum channels used to create vacuum
pressure in pockets 22. Different component types may require
different pocket shapes and/or different pocket depths.
[0005] With continued reference to FIG. 2 it is seen that the test
plate is positioned at an angle relative to vertical. By example,
this angle may be a forty five degree angle. MLCC components pass
through loading frame 12 and are directed by fences of the loading
zone 13 toward test pockets 22. One component is received in one
test pocket. In operation, the test plate indexes the loaded
components toward testing modules 14 (in the direction of arrow B)
where those components are tested. As the test plate continues to
index, the components are presented to blow-off zone 17, where the
components are removed from the handler 10 and organized based on
test data from the test modules 14.
[0006] With reference to FIG. 2A there is shown a representative
prior art electronic component 27 that includes electrode layers
27A. The size of component 27 is defined by a length 27B, a width
27C and a thickness 27D. The ratio between length 27B and width 27C
define the aspect ratio of component 27.
[0007] Each test pocket 22 includes a loading area 26 as shown in
FIG. 2B. In the example where the test plate is positioned at a 45
degree angle, gravity results in the loading area 26 comprising
approximately 80% of the pocket width and the full pocket length.
When the test plate is positioned at a 45 degree angle, a small
part of the upper portion of the test pocket width is not
substantially involved in loading but rather that small part merely
operates to contain the component after loading.
[0008] With reference to FIG. 2C, one example of how a component is
loaded into a test pocket 22 is shown. In particular, it is not
uncommon for a component to pitch into pocket 22. A leading edge 28
of component 27 first enters pocket 22 and a trailing edge then
falls into pocket 22 as illustrated by arrow 29.
BRIEF SUMMARY
[0009] A need has arisen to increase the loading efficiency of
electronic components into test pockets on electronic component
handlers. A test plate for use such a handler is provided where the
test plate includes a plurality of test pockets wherein at least
one of the test pockets includes at least one corner relief. In one
embodiment the test pocket may include multiple corner reliefs that
may be circular in their configuration.
[0010] Other applications of the present invention will become
apparent to those skilled in the art when the following description
is read in conjunction with the accompanying drawings.
BRIEF DESCRIPTION OF THE DRAWINGS
[0011] The description herein makes reference to the accompanying
drawings wherein like reference numerals refer to like parts
throughout the several views, and wherein:
[0012] FIG. 1 is a perspective view of an individual electronic
component being loaded into a test seat/pocket according to an
embodiment of the invention;
[0013] FIG. 2 is an overall pictorial view of a known electronic
component handling machine;
[0014] FIG. 2A is a perspective view of an example electronic
component;
[0015] FIG. 2B is a top plan view of an electronic component
captured by a single test pocket;
[0016] FIG. 2C illustrates a perspective view of a prior art
electronic component being loaded into a test pocket;
[0017] FIG. 3 is a plan view of an electronic component captured by
a test pocket according to a first embodiment;
[0018] FIG. 4A is a plan view of a test pocket according to a
second embodiment;
[0019] FIG. 4B is a plan view of a test pocket of a third
embodiment;
[0020] FIG. 4C is a plan view of a test pocket of a fourth
embodiment;
[0021] FIG. 4D is a plan view of a test pocket of a fifth
embodiment;
[0022] FIG. 4E is a plan view of a test pocket of a sixth
embodiment;
[0023] FIG. 4F is a plan view of a test pocket of a seventh
embodiment; and
[0024] FIG. 5 is a perspective view of one test plate incorporating
test pockets according to one embodiment of the invention.
DETAILED DESCRIPTION
[0025] A test plate for an electronic component handler is provided
that includes test pockets. The test pockets are apertures in the
test plate. Electronic components are delivered to an area near the
test pockets and fall into or are pulled into the test pocket. At
least one corner relief is provided for a test pocket to increase
loading efficiency.
[0026] With reference to FIGS. 3-5, there is shown a pocket for use
with a test plate in an electronic component handler. Electronic
components such as MLCC's and those shown in FIG. 2A come in a
variety of sizes, weights and aspect ratios. Certain types of
components may be more difficult to load into a test pocket on a
test plate. For example, components having an aspect ratio of 1:1
and of comparatively higher mass may have a lower loading
efficiency.
[0027] With reference to FIGS. 1 and 3 there is shown a test pocket
30 including corner reliefs 32, 32A. Each corner relief 32, 32A
represents an expanded area in a respective corner of test pocket
30. Corner reliefs 32, 32A may extend the full depth of test pocket
30. By creating corner reliefs 32, 32A, electronic component 27 can
drop into pocket 30 with a reduced likelihood of being trapped,
captured or otherwise obstructed. Sidewalls 33 and 34 of test
pocket 30 may then capture component 27 so that component 27 can
pass to a testing module 14 on machine 10. For example, with regard
to a conventional 1210 chip, inclusion of corner reliefs 32, 32A of
the type shown in FIGS. 1 and 3 have improved loading efficiency
from approximately 85% to approximately 95%.
[0028] Corner reliefs may be positioned in a number of different
fashions in order to improve the loading efficiency of components
into a testing machine. These alternate embodiments are shown in
FIGS. 4A-4F
[0029] FIG. 4A illustrates a test pocket 36 having corner pockets
or reliefs 37 and 37A. Relief 37 extends in a direction lengthwise
of the test pocket 36, while relief 37A projects in a direction
widthwise of pocket 36. In FIG. 4B, test pocket 38 includes corner
reliefs 39 and 39A extending in a direction offset from the length
and width of pocket 38. FIG. 4C includes four corner reliefs 41,
41A, 41B and 41C in test pocket 40. The corner reliefs illustrated
in FIG. 4C all extend at an angle offset from the width and length
of pocket 40.
[0030] FIG. 4D illustrates test pocket 42 having four corner
reliefs 43, 43A, 43B, 43C all extending in the length direction of
pocket 42, while FIG. 4F shows a test pocket 46 where the reliefs
47, 47A, 47B, 47C all extend widthwise with respect to test pocket
46. FIG. 4E shows a test pocket 44 with two corner reliefs 45, 45A
extending widthwise from test pocket 44.
[0031] Test pockets taught herein, including pockets 30 in the
example of FIG. 5, can be organized in concentric rings 24
continuous about test plate 20. Test plate 20 is then mounted on
the handler 10 for operation as described previously, replacing a
conventional test plate with pockets as shown in FIGS. 2B and 2C.
(In FIG. 5, only some of the pockets 30 are shown in detail due to
size. The corner reliefs of these pockets 30 are exaggerated for
clarity.)
[0032] Corner reliefs may be drilled out using known micro drilling
techniques. While the corner reliefs have been illustrated as being
semi-circular, the corner reliefs may be any number of different
shapes including any polygon.
[0033] While the invention has been described in connection with
certain embodiments, it is to be understood that the invention is
not to be limited to the disclosed embodiments but, on the
contrary, is intended to cover various modifications and equivalent
arrangements included within the spirit and scope of the appended
claims, which scope is to be accorded the broadest interpretation
so as to encompass all such modifications and equivalent structures
as is permitted under the law.
* * * * *