U.S. patent application number 12/580032 was filed with the patent office on 2011-04-21 for time-interleaved-dual channel adc with mismatch compensation.
This patent application is currently assigned to Texas Instruments Incorporated. Invention is credited to Fernando A. Mujica, Charles K. Sestok, Zigang Yang.
Application Number | 20110090107 12/580032 |
Document ID | / |
Family ID | 43769885 |
Filed Date | 2011-04-21 |
United States Patent
Application |
20110090107 |
Kind Code |
A1 |
Mujica; Fernando A. ; et
al. |
April 21, 2011 |
TIME-INTERLEAVED-DUAL CHANNEL ADC WITH MISMATCH COMPENSATION
Abstract
Previously, when designing receivers for radio frequency (RF) or
wireless communications, designers chose between time-interleaved
(TI) analog-to-digital converters (ADCs) for intermediate frequency
architectures and dual channel ADCs for direct conversion
architectures. Here, similarities between TI ADCs and dual channel
ADC were recognized, and an ADC that has the capability of
operating as a TI ADCs and dual channel ADC is provided. This
allows designer to have greatly increased flexibility during the
design process which can greatly reduce design costs, while also
allowing the manufacturer of the ADC to realize a reduction in its
operating costs.
Inventors: |
Mujica; Fernando A.; (Allen,
TX) ; Sestok; Charles K.; (Dallas, TX) ; Yang;
Zigang; (Plano, TX) |
Assignee: |
Texas Instruments
Incorporated
Dallas
TX
|
Family ID: |
43769885 |
Appl. No.: |
12/580032 |
Filed: |
October 15, 2009 |
Current U.S.
Class: |
341/155 |
Current CPC
Class: |
H03M 1/004 20130101;
H03M 1/123 20130101; H03M 1/1215 20130101 |
Class at
Publication: |
341/155 |
International
Class: |
H03M 1/12 20060101
H03M001/12 |
Claims
1. An apparatus comprising: a first analog-to-digital converter
(ADC) that receives a first input signal; a switch that receives
the first input signal and that is adapted to receive a second
input signal; a second ADC that is coupled to the switch so as to
receive at least one of the first and second input signals;
clocking circuitry that is coupled to each of the first and second
ADCs so as to provide a first clock signal to the first ADC and a
second clock signal to the second ADC; and mismatch circuitry that
is coupled to the first ADC, the second ADC, and the clocking
circuitry so as to operate in at least one of in-phase/quadrature
(IQ) mismatch correction mode if the second ADC receives the second
input signal and timing skew correction mode if the second ADC
receives the first input signal.
2. The apparatus of claim 1, wherein the clocking circuitry further
comprises: a clock buffer that receives a sample clock signal and
that generates the first clock signal and the second clock signal;
a first adjustable delay element that is coupled between the clock
buffer and the first ADC and that is coupled to the mismatch
circuitry; and a second adjustable delay element that is coupled
between the clock buffer and the second ADC and that is coupled to
the mismatch circuitry, wherein the mismatch circuitry adjusts at
least one of the first and second delay adjustable elements during
timing skew correction mode.
3. The apparatus of claim 2, wherein the first clock signal is
substantially the same as the sample clock signal during time skew
correction mode, and wherein the second clock signal is
substantially the same as an inverse of the sample clock signal
during timing skew correction mode.
4. The apparatus of claim 2, wherein each of the first and second
clock signals is substantially the same as the sample clock signal
during IQ mismatch correction mode.
5. The apparatus of claim 1, wherein the mismatch correction
circuitry further comprises: a DC offset circuit that is coupled to
each of the first and second ADCs so as to provide DC offset
correction for each of the first and second ADCs; a gain mismatch
circuit that is coupled to each of the first and second ADCs so as
to provide gain correction for each of the first and second ADCs;
and an IQ and timing skew mismatch circuit that is coupled to the
first ADC, the second ADC, and the clocking circuitry so as to
provide IQ correction for each of the first and second ADCs during
IQ mismatch correction mode and to provide timing skew correction
for each of the first and second ADCs during timing skew correction
mode.
6. A system comprising: input circuitry that receives an analog
input signal; and an dual channel ADC that is coupled to input
circuitry, the dual channel ADC including: a first ADC that
receives a first input signal from the input circuitry; a switch
that receives the first input signal and that is adapted to receive
a second input signal from the input circuitry; a second ADC that
is coupled to the switch so as to receive at least one of the first
and second input signals; clocking circuitry that is coupled to
each of the first and second ADCs so as to provide a first clock
signal to the first ADC and a second clock signal to the second
ADC; and mismatch circuitry that is coupled to the first ADC, the
second ADC, and the clocking circuitry so as to operate in at least
one of IQ mismatch correction mode if the second ADC receives the
second input signal and timing skew correction mode if the second
ADC receives the first input signal.
7. The system of claim 6, wherein the clocking circuitry further
comprises: a clock buffer that receives a sample clock signal and
that generates the first clock signal and the second clock signal;
a first adjustable delay element that is coupled between the clock
buffer and the first ADC and that is coupled to the mismatch
circuitry; and a second adjustable delay element that is coupled
between the clock buffer and the second ADC and that is coupled to
the mismatch circuitry, wherein the mismatch circuitry adjusts at
least one of the first and second adjustable delay elements during
timing skew correction mode.
8. The system of claim 7, wherein the first clock signal is
substantially the same as the sample clock signal during time skew
correction mode, and wherein the second clock signal is
substantially the same as an inverse of the sample clock signal
during timing skew correction mode.
9. The system of claim 7, wherein each of the first and second
clock signals is substantially the same as the sample clock signal
during IQ mismatch correction mode.
10. The system of claim 6, wherein the mismatch correction
circuitry further comprises: a DC offset circuit that is coupled to
each of the first and second ADCs so as to provide DC offset
correction for each of the first and second ADCs; a gain mismatch
circuit that is coupled to each of the first and second ADCs so as
to provide gain correction for each of the first and second ADCs;
and an IQ and timing skew mismatch circuit that is coupled to the
first ADC, the second ADC, and the clocking circuitry so as to
provide IQ correction for each of the first and second ADCs during
IQ mismatch correction mode and to provide timing skew correction
for each of the first and second ADCs during timing skew correction
mode.
11. The system of claim 6, wherein the input circuitry further
comprises: an oscillator; and a mixer that is coupled to the
oscillator, the first ADC, and the switch, and that receives the RF
input signal.
12. The system of claim 6, wherein the input circuitry further
comprises: a first oscillator; a second oscillator; a first mixer
that receives the RF input signal and that is coupled to the first
oscillator and the first ADC; and a second mixer that receives the
RF input signal and that is coupled to the second oscillator and
the switch.
13. An apparatus comprising: a first ADC that receives a first
input signal; a second ADC; a switch that is coupled to the second
ADC, wherein the switch provides the first input signal to the
second ADC during a timing skew correction mode, and wherein the
switch provides a second input signal to the second ADC during an
IQ correction mode; a clock buffer that receives a sample clock
signal and that generates a first clock signal and a second clock
signal, wherein the first clock signal is substantially the same as
the sample clock signal, and wherein the second clock signal is
substantially the same as an inverse of the sample clock signal
during the timing skew correction mode, and wherein the second
clock signal is substantially the same as the sample clock signal
during the IQ correction mode; a first adjustable delay element
that is coupled between the clock buffer and the first ADC; and a
second adjustable delay element that is coupled between the clock
buffer and the second ADC; a DC offset circuit that is coupled to
each of the first and second ADCs so as to provide DC offset
correction for each of the first and second ADCs; a gain mismatch
circuit that is coupled to each of the first and second ADCs so as
to provide gain correction for each of the first and second ADCs;
and an IQ and timing skew mismatch circuit to the first ADC, the
second ADC, the first adjustable delay element, and the second
adjustable delay element, wherein the IQ and timing skew mismatch
circuit adjusts at least one of the first and second delay elements
during timing skew correction mode, and wherein the IQ and timing
skew mismatch circuit provides IQ correction for each of the first
and second ADCs during IQ mismatch correction mode.
Description
TECHNICAL FIELD
[0001] The invention relates generally to analog-to-digital
converters (ADCs) and, more particularly, to a dual channel ADC
with mismatch compensation.
BACKGROUND
[0002] In Radio Frequency (RF) or wireless communication networks,
transmitters and receivers are employed to communicate data.
Looking specifically, however, to RF receivers, these devices
generally operate in one of two modes: direct conversion or
intermediate frequency. Each of the different modes offers
different sets of benefits and drawback, which are taken into
consideration when a particular receiver is designed.
[0003] Turning first to FIGS. 1A and 1B, a receiver 100 for an
intermediate frequency architecture can be seen. With this
intermediate frequency architecture, the analog input signal AIN is
centered at an intermediate frequency by input circuitry (mixer 104
and oscillator 102, for example) and provided to analog-to-digital
converter (ADC) 106. ADC 106 operates as a time-interleaved (TI)
ADC with sampling rate of twice the bandwidth of the signal of
interest (x(t), for example). Constructing such a TI ADC, such as
ADC 106, however, generally requires compensation circuitry to
correct for different mismatches that are often present in TI
ADCs.
[0004] As can be seen in FIG. 1B, ADC 106 includes several mismatch
correction circuits. As shown, ADC 106 is a dual channel ADC,
meaning that two ADCs 108 and 110 are employed. Each of these ADCs
108 and 110 are clocked by clocking circuitry (buffer 116 and
adjustable delay elements 112 and 114, for example). In this
configuration, the clock signal provided to ADC 108 is
substantially the same as the sample clock signal CLK, while the
clock signal provided to ADC 110 is substantially the same as the
inverse of the clock signal CLK. Direct Current (DC) offset circuit
(adders 128 and 124 and DC offset estimation circuit 118, for
example) and gain mismatch circuit (adders 126 and 130 and gain
mismatch correction circuit 120, for example) provide gain and DC
offset correction. Additionally, timing skew estimation circuit 122
provides adjustments to delay elements 112 and 114 to provide
timing skew correction.
[0005] Turning now to FIGS. 2A and 2B, a receiver 200 with a direct
conversion architecture can be seen. With this architecture, ADC
106 operates at baseband with the signal centered at 0 Hz. In
particular, input circuitry (oscillators 202 and 208 and mixers 204
and 206, for example) provides in-phase (I) and quadrature (Q)
signals to ADC 210. As with ADC 106, ADC 210 also employs circuitry
to correct for different mismatches. Some difference, though,
between ADCs 106 and 210 are that each of the ADCs 108 and 110 of
ADC 210 use the same clock signal (the sample signal CLK, for
example) and that the time skew estimation circuit 122 is replaced
with the IQ correction circuitry (IQ mismatch estimation circuit
220, multipliers 222 and 224, and adders 214 and 218, for example)
to correct for IQ mismatch.
[0006] Some other conventional circuits are: U.S. Pat. No.
7,002,505; U.S. Pat. No. 7,277,040; and U.S. Pat. No.
7,352,316.
SUMMARY
[0007] A preferred embodiment of the present invention,
accordingly, provides an apparatus. The apparatus comprises a first
analog-to-digital converter (ADC) that receives a first input
signal; a switch that receives the first input signal and that is
adapted to receive a second input signal; a second ADC that is
coupled to the switch so as to receive at least one of the first
and second input signals; clocking circuitry that is coupled to
each of the first and second ADCs so as to provide a first clock
signal to the first ADC and a second clock signal to the second
ADC; and mismatch circuitry that is coupled to the first ADC, the
second ADC, and the clocking circuitry so as to operate in at least
one of in-phase/quadrature (IQ) mismatch correction mode if the
second ADC receives the second input signal and timing skew
correction mode if the second ADC receives the first input
signal.
[0008] In accordance with a preferred embodiment of the present
invention, the clocking circuitry further comprises: a clock buffer
that receives a sample clock signal and that generates the first
clock signal and the second clock signal; a first adjustable delay
element that is coupled between the clock buffer and the first ADC
and that is coupled to the mismatch circuitry; and a second
adjustable delay element that is coupled between the clock buffer
and the second ADC and that is coupled to the mismatch circuitry,
wherein the mismatch circuitry adjusts at least one of the first
and second delay adjustable elements during timing skew correction
mode.
[0009] In accordance with a preferred embodiment of the present
invention, the first clock signal is substantially the same as the
sample clock signal during time skew correction mode, and wherein
the second clock signal is substantially the same as an inverse of
the sample clock signal during timing skew correction mode.
[0010] In accordance with a preferred embodiment of the present
invention, each of the first and second clock signals is
substantially the same as the sample clock signal during IQ
mismatch correction mode.
[0011] In accordance with a preferred embodiment of the present
invention, the mismatch correction circuitry further comprises: a
DC offset circuit that is coupled to each of the first and second
ADCs so as to provide DC offset correction for each of the first
and second ADCs; a gain mismatch circuit that is coupled to each of
the first and second ADCs so as to provide gain correction for each
of the first and second ADCs; and an IQ and timing skew mismatch
circuit that is coupled to the first ADC, the second ADC, and the
clocking circuitry so as to provide IQ correction for each of the
first and second ADCs during IQ mismatch correction mode and to
provide timing skew correction for each of the first and second
ADCs during timing skew correction mode.
[0012] In accordance with a preferred embodiment of the present
invention, a system is provided. The system comprising input
circuitry that receives an analog input signal; and an dual channel
ADC that is coupled to input circuitry, the dual channel ADC
including: a first ADC that receives a first input signal from the
input circuitry; a switch that receives the first input signal and
that is adapted to receive a second input signal from the input
circuitry; a second ADC that is coupled to the switch so as to
receive at least one of the first and second input signals;
clocking circuitry that is coupled to each of the first and second
ADCs so as to provide a first clock signal to the first ADC and a
second clock signal to the second ADC; and mismatch circuitry that
is coupled to the first ADC, the second ADC, and the clocking
circuitry so as to operate in at least one of IQ mismatch
correction mode if the second ADC receives the second input signal
and timing skew correction mode if the second ADC receives the
first input signal.
[0013] In accordance with a preferred embodiment of the present
invention, the input circuitry further comprises: an oscillator;
and a mixer that is coupled to the oscillator, the first ADC, and
the switch, and that receives the RF input signal.
[0014] In accordance with a preferred embodiment of the present
invention, the input circuitry further comprises: a first
oscillator; a second oscillator; a first mixer that receives the RF
input signal and that is coupled to the first oscillator and the
first ADC; and a second mixer that receives the RF input signal and
that is coupled to the second oscillator and the switch.
[0015] In accordance with a preferred embodiment of the present
invention, an apparatus is provided. The apparatus comprises a
first ADC that receives a first input signal; a second ADC; a
switch that is coupled to the second ADC, wherein the switch
provides the first input signal to the second ADC during a timing
skew correction mode, and wherein the switch provides a second
input signal to the second ADC during an IQ correction mode; a
clock buffer that receives a sample clock signal and that generates
a first clock signal and a second clock signal, wherein the first
clock signal is substantially the same as the sample clock signal,
and wherein the second clock signal is substantially the same as an
inverse of the sample clock signal during the timing skew
correction mode, and wherein the second clock signal is
substantially the same as the sample clock signal during the IQ
correction mode; a first adjustable delay element that is coupled
between the clock buffer and the first ADC; and a second adjustable
delay element that is coupled between the clock buffer and the
second ADC; a DC offset circuit that is coupled to each of the
first and second ADCs so as to provide DC offset correction for
each of the first and second ADCs; a gain mismatch circuit that is
coupled to each of the first and second ADCs so as to provide gain
correction for each of the first and second ADCs; and an IQ and
timing skew mismatch circuit to the first ADC, the second ADC, the
first adjustable delay element, and the second adjustable delay
element, wherein the IQ and timing skew mismatch circuit adjusts at
least one of the first and second delay elements during timing skew
correction mode, and wherein the IQ and timing skew mismatch
circuit provides IQ correction for each of the first and second
ADCs during IQ mismatch correction mode.
[0016] The foregoing has outlined rather broadly the features and
technical advantages of the present invention in order that the
detailed description of the invention that follows may be better
understood. Additional features and advantages of the invention
will be described hereinafter which form the subject of the claims
of the invention. It should be appreciated by those skilled in the
art that the conception and the specific embodiment disclosed may
be readily utilized as a basis for modifying or designing other
structures for carrying out the same purposes of the present
invention. It should also be realized by those skilled in the art
that such equivalent constructions do not depart from the spirit
and scope of the invention as set forth in the appended claims.
BRIEF DESCRIPTION OF THE DRAWINGS
[0017] For a more complete understanding of the present invention,
and the advantages thereof, reference is now made to the following
descriptions taken in conjunction with the accompanying drawings,
in which:
[0018] FIG. 1A is a block diagram of a conventional receiver having
an intermediate frequency architecture;
[0019] FIG. 1B is a block diagram of the time-interleaved (TI)
analog-to-digital converter (ADC) of FIG. 1A;
[0020] FIG. 2A is a block diagram of a conventional receiver having
a direct conversion architecture;
[0021] FIG. 2B is a block diagram of the ADC of FIG. 2A; and
[0022] FIG. 3 is an example of a TI-dual channel ADC in accordance
with a preferred embodiment of the present invention.
DETAILED DESCRIPTION
[0023] Refer now to the drawings wherein depicted elements are, for
the sake of clarity, not necessarily shown to scale and wherein
like or similar elements are designated by the same reference
numeral through the several views.
[0024] Referring to FIG. 3 of the drawings, a time-interleaved
(TI)-dual channel analog-to-digital converter (ADC) 300 can be
seen. ADC 300 generally comprises switch S1, ADCs 108 and 110,
clocking circuitry, a direct current (DC) offset circuit, a gain
mismatch circuit, and an in-phase/quadrature (IQ) and timing skew
mismatch circuit. The clocking circuitry generally comprises
adjustable delay elements 112 and 114 and buffer 116. The DC offset
circuit generally comprises adders 124 and 128 and DC offset
estimation circuit 118. The gain mismatch circuit generally
comprises multipliers 126 and 130 and gain mismatch estimation
circuit 120, and IQ and timing skew mismatch circuit generally
comprises adders 214 and 218, multipliers 224 and 220, and IQ and
timing skew mismatch estimation circuit 302.
[0025] While the overall construction of ADC 300 is similar to a
combination of ADCs 106 and 210, a difference lies in the IQ and
timing skew mismatch estimation circuit 302. Circuit 302 enables
ADC 300 to operate in two different modes: IQ mismatch correction
mode and timing skew correction mode. It was previously unrealized
with prior art implementations that, with appropriate
approximations, timing skew calculations and IQ mismatch
estimations have similar expressions, allowing for overlapping
circuitry. Looking first the DC offset correction, the DC offset
estimation circuit 118 employs the following iterative calculations
for ADCs 108 and 110, respectively:
DC.sub.1(n+1)=DC.sub.1(n)+.lamda..sub.0E[x'.sub.1(n)] (1)
DC.sub.2(n+1)=DC.sub.2(n)+.lamda..sub.0E[x'.sub.2(n)] (2)
[0026] where .lamda..sub.0 is a constant coefficient and E[ ] is an
expectation operator. Additionally, the gain mismatch estimation
circuit employs the following iterative calculations for ADCs 108
and 110, respectively:
g.sub.1(n+1)=g.sub.1(n)-.lamda..sub.g(E[x''.sub.1.sup.2(n)]-E[x''.sub.2.-
sup.2(n)]-E[x''.sub.1(n)].sup.2+E[x''.sub.2(n)].sup.2) (3)
g.sub.2(n+1)=g.sub.2(n)-.lamda..sub.g(E[x''.sub.1.sup.2(n)]-E[x''.sub.2.-
sup.2(n)]-E[x''.sub.1(n)].sup.2+E[x''.sub.2(n)].sup.2) (4)
where .lamda..sub.g is a constant coefficient. Since the estimation
of equations (1) and (2) approximately ensure that the expected
value of each ADC 108 and 110 output is close to zero, equations
(3) and (4) can be approximated as follows:
g.sub.1(n+1).apprxeq.g.sub.1(n)-.lamda..sub.g(E[x''.sub.1.sup.2(n)]-E[x'-
'.sub.2.sup.2(n)]) (5)
g.sub.2(n+1).apprxeq.g.sub.2(n)-.lamda..sub.g(E[x''.sub.1.sup.2(n)]-E[x'-
'.sub.2.sup.2(n)]) (6)
Bearing equations (1), (2), (5), and (6) in mind, timing skews and
IQ mismatches can be determined.
[0027] In a timing skew correction mode, switch 51 is actuated such
that ADC 110 receives the same signal as ADC 108. The use of the
timing skew correction mode generally corresponds to the receiver
configuration seen in FIG. 1A, where ADC 108 receives a clock
signal that is substantially the same as the sample clock signal
CLK, while the clock signal provided to ADC 110 is substantially
the same as the inverse of the clock signal CLK. In this
configuration, circuit 302 sets the delay for the delay element 112
to 0, and estimates the delay for delay element 114 as follows:
delay.sub.2(n+1)=delay.sub.2(n)+.lamda..sub.t(E[y.sub.1(n)(y.sub.2(n)-y.-
sub.2(n-1))]) (7)
where .lamda..sub.t is a constant coefficient.
[0028] In the IQ correction mode, switch S1 is actuated such that
ADC 110 receives a different signal from ADC 108. The use of the IQ
correction mode generally corresponds to the receiver configuration
seen in FIG. 2A, where ADCs 108 and 110 use the same clock signal
and receive I and Q signals, respectively. In this configuration,
circuit 302 estimates the IQ mismatch for ADCs 108 and 110,
respectively, as follows:
g.sub.12(n+1)=g.sub.12(n)-.lamda..sub.c(E[y.sub.1(n)y.sub.2(n)]-E[y.sub.-
1(n)]E[y.sub.2(n)]) (8)
g.sub.21(n+1)=g.sub.21(n)-.lamda..sub.c(E[y.sub.1(n)y.sub.2(n)]-E[y.sub.-
1(n)]E[y.sub.2(n)]) (9)
where .lamda..sub.c is a constant coefficient. Since, again, the
estimation of equations (1) and (2) approximately ensure that the
expected value of each ADC 108 and 110 output is close to zero,
equations (8) and (9) can be approximated as follows:
g.sub.12(n+1).apprxeq.g.sub.12(n)-.lamda..sub.cE[y.sub.1(n)
y.sub.2(n)] (10)
g.sub.21(n+1).apprxeq.g.sub.21(n)-.lamda..sub.cE[y.sub.1(n)y.sub.2(n)]
(11)
[0029] As can clearly be seen, equations (7), (10), and (11) are
very similar calculations, allowing for the use overlapping
circuitry. Thus, selection of an appropriate expectation operator
E[ ] would allow for simple calculation of equations (7), (10), and
(11). For example, the expectation operator E[ ] can be selected to
be:
Ex ( n ) 1 P P 0 P 1 xnp ( 12 ) ##EQU00001##
where equation (12) is essentially an average of the input signal
x(n). Other expectation operators may also be used. Moreover,
circuit 302 can be implement in either hardware or through software
via a (for example) digital signals processor (DSP).
[0030] By having ADC 300, several advantages can be realized. For
the manufacturer of the ADC 300, it allows the manufacturer to
produce a single part that can satisfy two different applications,
allowing for a reduction in operating costs. Additionally, for
designers of RF or wireless communications equipment, flexibility
during the design process is greatly increased because the designer
does not have to choose a particular architecture at the onset of
the design process, which can greatly reduce design costs.
[0031] Having thus described the present invention by reference to
certain of its preferred embodiments, it is noted that the
embodiments disclosed are illustrative rather than limiting in
nature and that a wide range of variations, modifications, changes,
and substitutions are contemplated in the foregoing disclosure and,
in some instances, some features of the present invention may be
employed without a corresponding use of the other features.
Accordingly, it is appropriate that the appended claims be
construed broadly and in a manner consistent with the scope of the
invention.
* * * * *