U.S. patent application number 12/847262 was filed with the patent office on 2010-12-09 for integrated circuit arrangement.
This patent application is currently assigned to Infineon Technologies AG. Invention is credited to Johann Peter Forstner.
Application Number | 20100312518 12/847262 |
Document ID | / |
Family ID | 39627987 |
Filed Date | 2010-12-09 |
United States Patent
Application |
20100312518 |
Kind Code |
A1 |
Forstner; Johann Peter |
December 9, 2010 |
Integrated Circuit Arrangement
Abstract
An integrated circuit arrangement has a signal input 20 and a
signal output 60, a signal processing unit 100 which is connected
to the signal input 20 and to the signal output 60, a noise source
50 for generating a noise signal, and a noise line 55 which
connects the noise source 50 to the signal input 20.
Inventors: |
Forstner; Johann Peter;
(Steinhoering, DE) |
Correspondence
Address: |
ESCHWEILER & ASSOCIATES LLC
629 EUCLID AVENUE, SUITE 1000, NATIONAL CITY BUILDING
CLEVELAND
OH
44114
US
|
Assignee: |
Infineon Technologies AG
Neubiberg
DE
|
Family ID: |
39627987 |
Appl. No.: |
12/847262 |
Filed: |
July 30, 2010 |
Related U.S. Patent Documents
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Application
Number |
Filing Date |
Patent Number |
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11680869 |
Mar 1, 2007 |
|
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12847262 |
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Current U.S.
Class: |
702/120 ;
327/100 |
Current CPC
Class: |
G01R 29/26 20130101 |
Class at
Publication: |
702/120 ;
327/100 |
International
Class: |
G01R 27/28 20060101
G01R027/28; H03K 5/01 20060101 H03K005/01 |
Foreign Application Data
Date |
Code |
Application Number |
Feb 14, 2007 |
DE |
10 2007 007 357.9 |
Claims
1. An integrated circuit arrangement having: a signal input and a
signal output; a signal processing unit which is connected to the
signal input and to the signal output; a noise source for
generating a noise signal and having a control input; and a noise
line which connects the noise source to the signal input, wherein
the components of the integrated circuit arrangement are integrated
on a single integrated circuit chip.
2. The integrated circuit arrangement according to claim 1,
comprising a first interruption unit which, in a first state,
allows the signal flow of the noise signal to the signal input and,
in a second state, interrupts the signal flow of the noise signal
to the signal input.
3. The integrated circuit arrangement according to claim 2, wherein
the interruption unit has a switching element, a fuse and/or an
antifuse.
4. The integrated circuit arrangement according to claim 2, wherein
the transition between the first and second states of the
interruption unit is able to be implemented by means of an
electrical current.
5. The integrated circuit arrangement according to claim 2, wherein
the transition between the first and second states of the
interruption unit is able to be implemented by means of
irradiation, in particular with a laser beam.
6. The integrated circuit arrangement according to claim 2, wherein
the signal input has a connection pad on the single integrated
circuit chip and an input signal line, and the interruption unit is
integrated on the single integrated circuit chip and is arranged in
the immediate vicinity of the connection pad.
7. The integrated circuit arrangement according to claim 1, wherein
the noise source has a resistor and/or an avalanche diode.
8. The integrated circuit arrangement according to claim 2, wherein
the noise source has a heating unit.
9. The integrated circuit arrangement according to claim 2, wherein
the noise source has an amplifier.
10. The integrated circuit arrangement according to claim 2,
wherein the signal processing unit has a mixer, a demodulator
and/or a filter.
11. The integrated circuit arrangement according to claim 2,
wherein the circuit arrangement has a signal source which is
connected to the signal processing unit by means of a signal
line.
12. The integrated circuit arrangement according to claim 11,
wherein the signal source is an RF oscillator, in particular a
voltage-controlled RF oscillator.
13. The integrated circuit arrangement according to claim 11,
comprising a second interruption unit which, in a first state,
allows the signal flow to the signal processing unit and, in a
second state, interrupts the signal flow to the signal processing
unit.
14. The integrated circuit arrangement according to claim 2,
wherein the circuit arrangement has at least two signal inputs for
receiving a symmetrical input signal, said signal inputs being
connected to a respective noise source by means of a respective
noise line.
15. A method for testing an integrated circuit arrangement having a
signal processing unit, which is connected to a signal input and to
a signal output, and a noise source, wherein the components of the
integrated circuit arrangement are integrated on a single
integrated circuit chip, said method having the following steps: a)
providing the integrated circuit arrangement and contact-connecting
the integrated circuit arrangement to a measuring device at the
signal output; b) measuring the output signal from the signal
processing unit at the signal output with respect to a noise signal
having a first noise level; and c) measuring the output signal from
the signal processing unit at the signal output with respect to a
noise signal having a second noise level that is different than the
first noise level.
16. A method for testing an integrated circuit arrangement having a
signal processing unit, which is connected to a signal input and to
a signal output, a noise source and a first interruption unit,
wherein the components of the integrated circuit arrangement are
integrated on a single integrated circuit chip, said method having
the following steps: a) providing the integrated circuit
arrangement with the interruption unit in a first state in which
the signal flow of the noise signal from the noise source to the
signal processing unit is allowed, and contact-connected the
integrated circuit arrangement to a measuring device at the signal
output; b) measuring the output signal from the signal processing
unit at the signal output with respect to the noise signal; and c)
after the measurement has been concluded, changing the first
interruption unit to a second state in which the signal flow of the
noise signal from the noise source to the signal processing unit is
interrupted; wherein the measurement is carried out with at least
two different noise levels.
17. The method according to claim 16, wherein the first
interruption unit is changed to a second state in an irreversible
manner.
18. The method according to claim 16, wherein the first
interruption unit is changed to the second state by means of
irradiation, in particular with a laser.
19. The method according to claim 16, wherein the measurement is
carried out while a signal is passed from a signal source of the
circuit arrangement to the signal processing unit.
20. The method according to claim 19, wherein a second interruption
unit is changed, after the measurement has been concluded, to a
second state in which the signal flow from the signal source to the
signal processing unit is interrupted.
21. The method according to claim 20, wherein the second
interruption unit is changed to a second state in an irreversible
manner.
22. The method according to claim 15, wherein the characteristics
of the noise source is determined by means of process control
measurements during the production process used.
23. An integrated circuit arrangement having: a signal input and a
signal output; a signal processing unit which is connected to the
signal input and to the signal output; a noise source for
generating a noise signal; a noise line which connects the noise
source to the signal input; and a first interruption unit which, in
a first state, allows the signal flow of the noise signal to the
signal input and, in a second state, interrupts the signal flow of
the noise signal to the signal input, wherein the components of the
integrated circuit arrangement are integrated on a single
integrated circuit chip.
Description
RELATED APPLICATION
[0001] This application is a Continuation of U.S. patent
application Ser. No. 11/680,869 filed on Mar. 1, 2007 that claims
priority from German Patent Application No. DE 10 2007 007 357.9,
which was filed on Feb. 14, 2007, which is incorporated herein by
reference in its entirety.
TECHNICAL FIELD
[0002] Electronic components and chips are tested during production
or following production. Automatic test apparatuses (automatic test
equipment, ATE) may be used, for example, to subject chips or
electronic components to marginal tests, parameter tests or
functional tests.
BACKGROUND
[0003] In this context, measurements of the noise behavior of
integrated circuits are very important since integrated circuits
are generally exposed to various noise signals during operation.
Therefore, against the background of continually increasing quality
demands of consumers, cost-effective test methods which make it
possible to characterize the noise behavior of integrated circuits
in a simple and accurate manner are desirable.
SUMMARY
[0004] According to an embodiment, an integrated circuit
arrangement may have a signal input and a signal output, a signal
processing unit which is connected to the signal input and to the
signal output, a noise source for generating a noise signal, and a
noise line which connects the noise source to the signal input.
BRIEF DESCRIPTION OF THE DRAWINGS
[0005] Embodiments will be described below with reference to
exemplary embodiments which are shown in the appended figures.
However, the invention is not restricted to the specifically
described exemplary embodiments but rather may be modified and
varied in a suitable manner. It is within the scope of the
invention to combine individual features and combinations of
features of one exemplary embodiment with features and combinations
of features of another exemplary embodiment.
[0006] FIG. 1 shows a first embodiment;
[0007] FIG. 2 shows a second embodiment;
[0008] FIG. 3 shows a third embodiment;
[0009] FIG. 4 shows an integrated noise source for use in an
integrated circuit arrangement;
[0010] FIG. 5 shows a further integrated noise source for use in an
integrated circuit arrangement;
[0011] FIG. 6 shows a further integrated noise source for use in an
integrated circuit arrangement;
[0012] FIG. 7 shows a further embodiment for processing
differential input signals;
[0013] FIG. 8 shows integrated noise sources for use in the
integrated circuit arrangement shown in FIG. 7; and
[0014] FIG. 9 shows a further embodiment for processing
differential input signals.
DETAILED DESCRIPTION
[0015] According to another embodiment, a method for testing an
integrated circuit arrangement having a signal processing unit,
which is connected to a signal input and to a signal output, a
noise source and a first interruption unit, may comprises the
following steps:
[0016] a) the integrated circuit arrangement is provided and is
contact-connected to a measuring device at the signal output;
[0017] b) the output signal from the signal processing unit is
measured at the signal output with respect to a noise signal having
a first noise level; and
[0018] c) the output signal from the signal processing unit is
measured at the signal output with respect to a noise signal having
a second noise level.
[0019] According to another embodiment, a method for testing an
integrated circuit arrangement having a signal processing unit,
which is connected to a signal input and to a signal output, a
noise source and a first interruption unit, may comprise the
following steps:
[0020] a) the integrated circuit arrangement is provided with the
interruption unit in a first state in which the signal flow of the
noise signal from the noise source to the signal processing unit is
allowed, and is contact-connected to a measuring device at the
signal output;
[0021] b) the output signal from the signal processing unit is
measured at the signal output with respect to the noise signal;
and
[0022] c) after the measurement has been concluded, the first
interruption unit is changed to a second state in which the signal
flow of the noise signal from the noise source to the signal
processing unit is interrupted.
[0023] As a result of the use of a noise source which is integrated
in the chip of the circuit arrangement, the embodiment has the
advantage that it is possible to characterize the noise behavior of
the integrated circuit arrangement with a considerably lower degree
of complexity.
[0024] In order to simplify understanding of the description,
identical reference numbers are used below when identical elements
which are used together in the figures are involved. Elements in
one embodiment may also be used in another embodiment without this
being individually mentioned in each case.
[0025] FIG. 1 shows a first embodiment. FIG. 1 shows an integrated
circuit arrangement having a signal input 20 and a signal output 60
as well as a signal processing unit 100 which is connected to the
signal input 20 and to the signal output 60.
[0026] The integrated circuit arrangement also has a noise source
50 for generating a noise signal, said noise source being connected
to the signal input 20 by means of a noise line 55. In this case,
the signal input 20 comprises the connection pad 21 and the input
signal line 22, and the signal output 60 comprises the connection
pad 61 and the output signal line 62.
[0027] Hence, the practice of carrying out noise measurements on
integrated circuits, for example "Microwave Monolithic Integrated
Circuits", so-called MMICs can be performed. In general, noise
measurements on integrated circuits, in particular radio-frequency
characterization of MMICs, are very costly since the measuring tips
used in this case are very expensive and additionally have only a
limited service life. It is also difficult to reproduce noise
measurements, in particular RF measurements, for example in the mm
wavelength range (for example at 77 GHz), since mechanical
tolerances may frequently pass into the wavelength range of the
test signals.
[0028] As a result of the use of a noise source which is integrated
in the chip of the circuit arrangement, the embodiment has the
advantage that it is possible to characterize the integrated
circuit arrangement with a considerably lower degree of complexity.
If a noise measurement is carried out using a noise source which is
accommodated on the chip to be tested, the measuring tip which was
usually used to apply the noise signal to the integrated circuit
arrangement from the outside can be omitted.
[0029] In this case, the internal noise source serves the same
purpose as an external noise source. The reproducibility of the
noise source on the chip is very good. In addition, process control
measurements (PCM) which take place anyway can be used to predict
the characteristics of the noise source in a relatively accurate
manner by means of correlation to the PCM measurements.
[0030] FIG. 2 shows a second embodiment. FIG. 2 likewise shows an
integrated circuit arrangement having a signal input 20 and a
signal output 60 as well as a signal processing unit 100 which is
connected to the signal input 20 and to the signal output 60.
[0031] The integrated circuit arrangement also has a noise source
50 for generating a noise signal and a first interruption unit 80
which, in a first state, allows the signal flow of the noise signal
from the noise source 50 to the signal processing unit 100 and, in
a second state, interrupts the signal flow of the noise signal from
the noise source 50 to the signal processing unit 100.
[0032] The following method for measuring noise can be carried out
using the integrated circuit arrangement shown in FIG. 2. In this
case, in a first step a), the integrated circuit arrangement is
provided with the interruption unit in a first state in which the
signal flow of the noise signal from the noise source to the signal
processing unit is allowed.
[0033] Then, in step b), the output signal from the signal
processing unit is measured at the signal output with respect to
the noise signal, and, in a step c), after the measurement has been
concluded, the first interruption unit is changed to a second state
in which the signal flow of the noise signal from the noise source
to the signal processing unit is interrupted.
[0034] Using the interruption unit makes it possible to isolate the
noise source from the signal processing unit after measurement has
been carried out, thus largely preventing the integrated noise
source from influencing subsequent operation of the signal
processing unit. The noise source thus does not interfere with
subsequent operation of the signal processing unit.
[0035] According to one preferred embodiment, the interruption unit
has a switching element, a fuse and/or an antifuse. In this case,
it is preferred for the transition between the first and second
states of the interruption unit to be able to be implemented by
means of an electrical current. Alternatively, the transition
between the first and second states of the interruption unit can be
implemented by means of a laser beam. Depending on the application,
it may be preferred in this case for the first interruption unit to
be changed to the second state in an irreversible manner.
[0036] If recurrent tests are intended to be allowed during
operation of the signal processing unit in a system, it is
preferred for the first interruption unit to be changed to the
second state in a reversible manner.
[0037] The noise source 50 also has a control input 51 which can be
used to control the noise source for the purpose of generating at
least two different noise levels. Accordingly, the following method
for measuring noise can also be carried out using the integrated
circuit arrangement shown in FIG. 2. In this case, in a first step:
a) the integrated circuit arrangement is provided and is
contact-connected to a measuring device at the signal output.
[0038] Then, in step b), the output signal from the signal
processing unit is measured at the signal output with respect to a
noise signal having a first noise level, and, in a step c), the
output signal from the signal processing unit is measured at the
signal output with respect to a noise signal having a second noise
level.
[0039] For example, only the noise source 50 is thus activated and
the noise power is measured at the output. The noise source 50 is
then deactivated (switched off but not yet disconnected) and the
noise power is measured again at the output. Finally, after a
successful test, the noise source 50 can be disconnected by the
interruption unit 80.
[0040] According to this preferred embodiment, the measurement is
carried out using at least two different noise levels. If, for
example, the noise source is connected between two different ENRs
via a control input 51, two different noise levels are established
at the IF output in the case of a mixer, for example. The noise
properties of the signal processing unit 100 can be accurately
determined on the basis of said noise levels.
[0041] In this case, the integrated noise source 50 behaves, on the
input side, like an external calibrated noise source, which is
pulsed, and provides two defined and different noise levels (ENRs)
when switched on and switched off. On the output side, a so-called
"Noise Figure Meter" can then be used to measure the change in the
noise level for these two different input noise levels, from which
the noise properties of the test object (DUT) can be derived. In
the case of radio-frequency measurements, the measurement object
need only be contact-connected to an RF measuring tip at a signal
input LO in this case.
[0042] FIG. 3 shows a third embodiment. FIG. 3 likewise shows an
integrated circuit arrangement having a signal input 20 and a
signal output 60 as well as a signal processing unit 100 which is
connected to the signal input 20 and to the signal output 60.
[0043] The integrated circuit arrangement also has a noise source
50 for generating a noise signal and a first interruption unit 80
which, in a first state, allows the signal flow of the noise signal
from the noise source 50 to the signal processing unit 100 and, in
a second state, interrupts the signal flow of the noise signal from
the noise source 50 to the signal processing unit 100.
[0044] In this case, the signal input 20 has a connection pad 21
and an input signal line 22 and the interruption unit 80 is
arranged in the immediate vicinity of the connection pad 21. As can
be seen from the enlarged view in FIG. 3, the interruption unit 80
according to this embodiment is provided with a desired separation
point 81 which is also referred to as a fuse 81. The fuse 81 may be
designed in such a manner that the noise line 55 may be easily cut
at this point by means of irradiation and/or a flow of current, for
instance by providing a locally reduced thickness or width of the
line. A laser is preferably used during the separating
operation.
[0045] If recurrent tests are intended to be allowed during
operation of the signal processing unit in a system, it is
preferred for a switching element 82 for the interruption unit 80
to be provided instead of a fuse 81. In this case, the switching
element 82 is preferably likewise arranged in the vicinity of the
connection pad 21 (FIG. 3a). Contact between the noise source 50
and the signal processing unit 100 can thus now be made/broken in a
reversible manner.
[0046] FIG. 4 shows the internal structure of one embodiment of an
integrated noise source. The noise source has a resistor 52 and a
heating unit 53, the temperature of the resistor 52 being able to
be set to different values with the aid of the heating unit 53. The
resistor 52 is connected to the signal processing unit 100 by means
of the noise line 55. Furthermore, the other connection of the
resistor 52 can be connected to a fixed potential, for example to
the ground potential.
[0047] If the resistor 52 is heated by the heating unit 53, a
corresponding noise signal is transmitted to the signal processing
unit 100 by means of the noise line 55 and the noise behavior of
said signal processing unit can be determined.
[0048] FIG. 5 shows the internal structure of a further embodiment
of an integrated noise source 50. In this case, provision is made
of an avalanche diode 54 which is connected to the noise line 55
via a capacitor. If a control signal is applied to the control
input 51, the avalanche breakdown of the avalanche diode 54 can be
used to generate a noise signal on the noise line 55.
[0049] FIG. 6 likewise shows the internal structure of a further
embodiment of an integrated noise source 50. In this case,
provision is made of an amplifier 56 which amplifies the thermal
noise of the resistor 52 and outputs it on the noise line 55. A
control signal at the control input 51 can be used to set the gain
of the amplifier 56, with the result that different noise levels
can be generated.
[0050] FIG. 7 shows a further embodiment for processing symmetrical
(differential) input signals. In this case, the signal processing
unit 100 has a mixer 110 and a filter 140. The mixer 110 reduces
the signal RF, which is applied to the signal inputs 20, 30, to an
intermediate frequency IF using a signal LO from a local oscillator
(not shown), which is applied to the further signal inputs 120,
130, said intermediate frequency being output at the signal outputs
60, 70 by means of the filter 120. If, instead of an input signal,
a noise signal is then passed from the noise sources 50, 90 to the
mixer 110, the noise behavior of the mixer 110 can be measured.
[0051] In this case, FIG. 8 shows the integrated noise sources 50,
90 for use in the integrated circuit arrangement shown in FIG. 7.
The noise sources 50 and 90 each have a resistor 52 and 92. These
resistors 52 and 92 are each connected to the noise lines 55 and
95, respectively, via cascode amplifiers 58 and 98. A control
signal at the control input 51 can be used to set the gain of the
amplifiers 58, 98, with the result that different noise levels can
be generated.
[0052] FIG. 9 shows a further embodiment. In the embodiment shown
in FIG. 9, the signal processing unit 100 is again in the form of a
mixer and a local signal source 150 which is in the form of a local
oscillator is additionally provided. In this case, it is preferred
for the signal source 150 to be in the form of a voltage-controlled
oscillator (VCO).
[0053] The local signal source 150 is connected to the signal
processing unit 100 by means of a transmission line 150. Therefore,
it is possible to dispense with applying signals to the signal
inputs 120, 130 when measuring noise in this embodiment.
[0054] The embodiment shown in FIG. 9 additionally has a second
interruption unit 180 which, in a first state, allows the signal
flow of the signal from the signal source 150 to the signal
processing unit 100 and, in a second state, interrupts the signal
flow of the signal from the signal source 150 to the signal
processing unit 100.
[0055] According to one preferred embodiment, the interruption unit
has a switching element, a fuse and/or an antifuse. In this case,
it is preferred for the transition between the first and second
states of the interruption unit to be able to be implemented by
means of an electrical current. Alternatively, the transition
between the first and second states of the interruption unit can be
implemented by means of a laser beam. Depending on the application,
it may be preferred in this case for the second interruption unit
to be changed to the second state in an irreversible manner.
[0056] If recurrent tests are intended to be allowed during
operation of the signal processing unit in a system, it is
preferred for the second interruption unit to be changed to the
second state in a reversible manner.
[0057] Using the second interruption unit 180 makes it possible to
isolate the signal source 150 from the signal processing unit 100
after measurement has been carried out, thus largely preventing the
integrated signal source from influencing subsequent operation of
the signal processing unit. The signal source thus does not
interfere with subsequent operation of the signal processing
unit.
[0058] If the embodiment shown in FIG. 9 is operated as a so-called
"Direct Conversion" mixer, the contact-connections to RF signals
may be completely dispensed with when measuring noise and only LF
signals need to be measured at the signal output.
[0059] In the case of a 77 GHz direct conversion mixer, as is used
in automotive radar front ends, for example, the input-side noise
source provides two defined noise levels. The on-chip local
oscillator is activated and provides a 77 GHz signal which is used
by the mixer to down-convert the RF noise spectrum into a signal
around DC at the IF output. After a successful test, the noise
source and the local oscillator are disconnected from the mixer by
the interruption units and do not impair the actual function of the
mixer.
* * * * *